阅读说明：本技术 裂隙灯显微镜 (Slit-lamp microscope ) 是由 清水仁 大森和宏 于 2020-03-05 设计创作，主要内容包括：一种例示性方式的裂隙灯显微镜,包括照明系统和拍摄系统。照明系统向被检眼的前眼部投射裂隙光。拍摄系统包括对来自投射有裂隙光的前眼部的光进行引导的光学系统和用摄像平面接收被该光学系统引导的光的摄像元件。配置为包括因前眼部的组织的折射率而位移的照明系统的焦点在内的物平面、光学系统的主面和摄像平面满足沙姆条件。(An exemplary mode of a slit-lamp microscope includes an illumination system and a capture system. The illumination system projects slit light to the anterior eye of the eye to be examined. The imaging system includes an optical system that guides light from the anterior segment on which the slit light is projected, and an imaging element that receives the light guided by the optical system with an imaging plane. The object plane including the focal point of the illumination system displaced by the refractive index of the tissue of the anterior eye, the main surface of the optical system, and the imaging plane are arranged so as to satisfy the Schlemm condition.)

1. A slit-lamp microscope, comprising:

an illumination system that projects slit light to an anterior eye of an eye to be examined; and

an imaging system including an optical system that guides light from the anterior ocular segment on which the slit light is projected, and an imaging element that receives the light guided by the optical system with an imaging plane,

an object plane including a focal point of the illumination system displaced by a refractive index of a tissue of the anterior eye portion, a main surface of the optical system, and the image pickup plane are arranged to satisfy a schemer condition.

2. The slit-lamp microscope of claim 1,

the slit-lamp microscope further comprises a moving mechanism for moving the illumination system and the shooting system,

the imaging system repeatedly performs imaging in parallel with the movement of the illumination system and the imaging system by the moving mechanism, thereby obtaining a plurality of images of the anterior segment.

3. The slit-lamp microscope of claim 2,

the slit-lamp microscope further includes a three-dimensional image constructing section that constructs a three-dimensional image based on the plurality of images.

4. The slit-lamp microscope of claim 3,

the slit-lamp microscope further includes a rendering section that renders the three-dimensional image to construct a rendered image.

5. The slit-lamp microscope of any one of claims 2 to 4,

the slit-lamp microscope includes an analyzing section that applies a predetermined analysis process to at least one of the plurality of images or an image obtained by processing the at least one of the plurality of images.

6. The slit-lamp microscope of any one of claims 1 to 5,

the deflection angle of the object plane caused by the refractive index is in the range of 3-13 degrees.

7. The slit-lamp microscope of claim 6,

the deflection angle of the object plane caused by the refractive index is in the range of 6-10 degrees.

8. The slit-lamp microscope of any one of claims 1 to 7,

the deviation angle of the object plane caused by the refractive index is determined based on at least the value of the corneal radius of curvature in a predetermined model eye and the value of the refractive index of the eye.

9. The slit-lamp microscope of any one of claims 1 to 5,

the deflection angle of the object plane caused by the refractive index is determined based on at least an angle formed by an optical axis of the illumination system and an optical axis of the photographing system.

10. The slit-lamp microscope of claim 9,

the angle is set to a value in a range of more than 0 degrees and 60 degrees or less.

11. The slit-lamp microscope of claim 9 or 10,

the deviation angle of the object plane caused by the refractive index is determined based on at least the angle and the corneal radius of curvature.

12. The slit-lamp microscope of claim 11,

the value of the corneal radius of curvature is set based on a predetermined model eye.

13. The slit-lamp microscope of claim 12,

the value of the corneal radius of curvature is set to a value within a range of 7.7mm + -0.5 mm based on the Gu's model eye.

14. The slit-lamp microscope of claim 9 or 10,

the deviation angle of the object plane caused by the refractive index is determined based on at least the angle and the eyeball refractive index.

15. The slit-lamp microscope of claim 14,

the eyeball refractive index value is set based on a predetermined model eye.

16. The slit-lamp microscope of claim 15,

the value of the eyeball refractive index is set to a value in the range of 1.336 + -0.001 based on the gooch model eye.

17. The slit-lamp microscope of claim 9 or 10,

the deviation angle of the object plane caused by the refractive index is determined based on at least the angle, the corneal radius of curvature, and the refractive index of the eyeball.

18. The slit-lamp microscope of claim 17,

the value of the corneal radius of curvature and the value of the eyeball refractive index are respectively set based on a predetermined model eye.

19. The slit-lamp microscope of claim 18,

based on the Gu's model eye, the value of the corneal radius of curvature is set to a value in the range of 7.7 mm. + -. 0.5mm, and the value of the eyeball refractive index is set to a value in the range of 1.336. + -. 0.001.

20. The slit-lamp microscope of claim 19,

the deflection angle is set to a value in a range of more than 0 degrees and 11.09 degrees or less.

21. The slit-lamp microscope of any one of claims 1 to 20,

the slit-lamp microscope further includes a first deflection mechanism that changes an orientation of an optical axis of the imaging system.

22. The slit-lamp microscope of claim 21,

the first deflection mechanism rotates an optical axis of the imaging system substantially around an intersection of the object plane and the optical axis of the imaging system.

23. The slit-lamp microscope of claim 21 or 22,

the slit-lamp microscope further comprises:

an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system and evaluates image quality; and

and a first deflection control unit that controls the first deflection mechanism based on at least the evaluation result of the image quality evaluation unit.

24. The slit-lamp microscope of any one of claims 21-23,

the slit-lamp microscope further comprises:

a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system to measure a corneal curvature radius; and

a first determination unit that determines a target direction of an optical axis of the imaging system based on at least a measurement result of the measurement unit,

the first deflecting mechanism changes the orientation of the optical axis of the imaging system to the target orientation.

25. The slit-lamp microscope of any one of claims 21-23,

the slit-lamp microscope further comprises:

a data receiving unit configured to receive measurement data of a corneal curvature radius of the eye to be examined acquired in advance; and

a second determination unit configured to determine a target orientation of an optical axis of the imaging system based on at least the measurement data,

the first deflecting mechanism changes the orientation of the optical axis of the imaging system to the target orientation.

26. The slit-lamp microscope of any one of claims 21-25,

the imaging system starts imaging of the anterior segment in accordance with a change in the direction of the optical axis of the imaging system by the first deflecting mechanism.

27. The slit-lamp microscope of any one of claims 1 to 20,

the slit-lamp microscope further includes a second deflection mechanism that changes an orientation of an optical axis of the illumination system.

28. The slit-lamp microscope of claim 27,

the second deflecting mechanism rotates the optical axis of the illumination system around an intersection point of the cornea of the eye to be inspected and the optical axis of the illumination system.

29. The slit-lamp microscope of claim 27 or 28,

the slit-lamp microscope further comprises:

an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system and evaluates image quality; and

and a second deflection control unit that controls the second deflection mechanism based on at least the evaluation result of the image quality evaluation unit.

30. The slit-lamp microscope of any one of claims 27-29,

the slit-lamp microscope further comprises:

a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system to measure a corneal curvature radius; and

a third determination unit that determines a target orientation of the optical axis of the illumination system based on at least a measurement result of the measurement unit,

the second deflecting mechanism changes the orientation of the optical axis of the illumination system to the target orientation.

31. The slit-lamp microscope of any one of claims 27-29,

the slit-lamp microscope further comprises:

a data receiving unit configured to receive measurement data of a corneal curvature radius of the eye to be examined acquired in advance; and

a fourth determination unit configured to determine a target orientation of an optical axis of the illumination system based on at least the measurement data,

the second deflecting mechanism changes the orientation of the optical axis of the illumination system to the target orientation.

32. The slit-lamp microscope of any one of claims 27-31,

the imaging system starts imaging of the anterior segment in accordance with a change in the orientation of the optical axis of the illumination system by the second deflection mechanism.

Technical Field

The invention relates to a slit-lamp microscope.

Background

In the field of ophthalmology, image diagnosis occupies an important place. In image diagnosis, various ophthalmic imaging apparatuses are used. The ophthalmologic imaging apparatus includes a slit-lamp microscope, a fundus camera, a Scanning Laser Ophthalmoscope (SLO), an Optical Coherence Tomography (OCT), and the like. Various examination devices and measurement devices such as a refractometer, a keratometer, a tonometer, a mirror microscope, a wavefront analyzer, and a macular microperimeter are also equipped with a function of imaging the anterior segment or fundus oculi.

One of the most widely and frequently used of these various ophthalmic devices is the slit-lamp microscope. A slit-lamp microscope is an ophthalmologic apparatus for illuminating an eye to be examined with slit light and observing or imaging the illuminated cross section from the side with a microscope.

For example, patent document 1 discloses a slit-lamp microscope capable of performing anterior segment imaging while performing a combination of movement of an illumination system and an imaging system and focus movement thereof. In this way, a focused three-dimensional image can be obtained over a wide range of the anterior segment, and it takes time and effort to perform scanning in the optical axis direction of the optical system (movement of the focal point) and scanning in the direction orthogonal thereto (movement of the optical system).

On the other hand, patent documents 2 and 3 disclose techniques for performing anterior segment imaging using the schemer's law. The schem's law is a geometrical rule concerning the orientation of the focal plane of an optical system when the lens surface and the image plane are not parallel, and it is claimed that when the principal surface of the lens (optical system) and the image plane of the image pickup element intersect on a certain straight line, the object plane in focus also intersects on the same straight line.

According to this principle, if the slit-lamp microscope is configured such that a plane (including an object plane) passing through the optical axis of the illumination system, a main surface of the imaging system, and an imaging plane of the imaging element intersect on the same straight line, a focused image can be obtained on the entire object plane.

According to such a conventional samm slit lamp microscope, when the anterior segment is observed from a direction inclined with respect to the optical axis of the eye to be examined, the light beam is refracted by the difference between the refractive index inside the eye to be examined and the refractive index outside the eye to be examined, and the arrangement to achieve the samm's law is broken. In addition, since the shape and characteristics of the tissue of the eye to be inspected have individual differences, the destruction of the arrangement also produces individual differences. For example, the influence of individual differences in the shape (curvature) of the cornea and the refractive index of anterior ocular tissue is conceivable.

Patent document 1: japanese patent laid-open publication No. 2016-159073

Patent document 2: japanese laid-open patent publication No. 2000-197607

Patent document 3: japanese laid-open patent publication No. 2015-533322

Disclosure of Invention

The invention aims to solve the problem of a Schlemm-type slit-lamp microscope caused by different refractive indexes inside and outside a detected eye.

An exemplary first mode is a slit-lamp microscope, comprising: an illumination system that projects slit light to an anterior eye of an eye to be examined; and an imaging system including an optical system that guides light from the anterior eye portion on which the slit light is projected, and an imaging element that receives the light guided by the optical system with an imaging plane, and being arranged such that an object plane including a focal point of the illumination system displaced by a refractive index of a tissue of the anterior eye portion, a main surface of the optical system, and the imaging plane satisfy a schem condition.

With regard to a second exemplary aspect, in the slit-lamp microscope of the first exemplary aspect, the slit-lamp microscope further includes a moving mechanism that moves the illumination system and the imaging system, and the imaging system repeatedly performs imaging in parallel with the movement of the illumination system and the imaging system by the moving mechanism, thereby obtaining a plurality of images of the anterior segment.

With regard to an illustrative third aspect, in the slit-lamp microscope of the second aspect, the slit-lamp microscope further includes a three-dimensional image constructing section that constructs a three-dimensional image based on the plurality of images.

With regard to an exemplary fourth aspect, in the slit-lamp microscope of the third aspect, the slit-lamp microscope further includes a rendering section that renders the three-dimensional image to construct a rendered image.

As for an exemplary fifth aspect, in the slit-lamp microscope according to any one of the second to fourth aspects, the slit-lamp microscope includes an analysis unit that applies a predetermined analysis process to at least one of the plurality of images or an image obtained by processing the at least one of the plurality of images.

With regard to an exemplary sixth aspect, in the slit-lamp microscope according to any one of the first to fifth aspects, a deflection angle of the object plane due to the refractive index is in a range of 3 to 13 degrees.

With regard to an exemplary seventh aspect, in the slit-lamp microscope of the sixth aspect, a deflection angle of the object plane due to the refractive index is in a range of 6 to 10 degrees.

With regard to an exemplary eighth aspect, in the slit-lamp microscope according to any one of the first to seventh aspects, a deflection angle of the object plane due to the refractive index is determined based on at least a value of a corneal radius of curvature in a predetermined model eye and a value of a refractive index of the eye.

With regard to an exemplary ninth aspect, in the slit-lamp microscope according to any one of the first to fifth aspects, a deflection angle of the object plane due to the refractive index is determined based on at least an angle formed by an optical axis of the illumination system and an optical axis of the imaging system.

With regard to an exemplary tenth aspect, in the slit-lamp microscope of the ninth aspect, the angle is set to a value in a range of more than 0 degrees and 60 degrees or less.

With regard to an exemplary eleventh aspect, in the slit-lamp microscope of the ninth or tenth aspect, a deflection angle of the object plane caused by the refractive index is determined based on at least the angle and a corneal radius of curvature.

With regard to an exemplary twelfth mode, in the slit-lamp microscope of the eleventh mode, the value of the corneal radius of curvature is set based on a predetermined model eye.

With regard to the exemplary thirteenth aspect, in the slit-lamp microscope of the twelfth aspect, the value of the corneal radius of curvature is set to a value in a range of 7.7 millimeters (mm) ± 0.5mm based on the gooch model eye.

With regard to an exemplary fourteenth aspect, in the slit-lamp microscope of the ninth or tenth aspect, a deflection angle of the object plane caused by the refractive index is determined based on at least the angle and an eyeball refractive index.

With regard to an exemplary fifteenth aspect, in the slit-lamp microscope of the fourteenth aspect, the value of the eyeball refractive index is set based on a predetermined model eye.

With regard to an exemplary sixteenth aspect, in the slit-lamp microscope of the fifteenth aspect, the value of the eyeball refractive index is set to a value in a range of 1.336 ± 0.001 based on the googles model eye.

With regard to an exemplary seventeenth aspect, in the slit-lamp microscope of the ninth or tenth aspect, a deviation angle of the object plane due to the refractive index is determined based on at least the angle, a corneal radius of curvature, and an eyeball refractive index.

With regard to an exemplary eighteenth aspect, in the slit-lamp microscope of the seventeenth aspect, the value of the corneal radius of curvature and the value of the eyeball refractive index are respectively set based on a predetermined model eye.

With regard to an exemplary nineteenth mode, in the slit-lamp microscope of the eighteenth mode, based on the googles model eye, the value of the corneal curvature radius is set to a value within a range of 7.7mm ± 0.5mm, and the value of the eyeball refractive index is set to a value within a range of 1.336 ± 0.001.

With regard to an exemplary twentieth aspect, in the slit-lamp microscope of the nineteenth aspect, the deflection angle is set to a value in a range of greater than 0 degrees and 11.09 degrees or less.

A twenty-first exemplary aspect of the slit-lamp microscope according to any one of the first to twentieth aspects further includes a first deflecting mechanism for changing an orientation of an optical axis of the imaging system.

With regard to an exemplary twenty-second aspect, in the slit-lamp microscope of the twenty-first aspect, the first deflecting mechanism rotates the optical axis of the imaging system substantially around an intersection point of the object plane and the optical axis of the imaging system.

With regard to an exemplary twenty-third aspect, in the slit-lamp microscope of the twenty-first or twenty-second aspect, the slit-lamp microscope further includes: an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system and evaluates image quality; and a first deflection control unit that controls the first deflection mechanism based on at least an evaluation result of the image quality evaluation unit.

With regard to an exemplary twenty-fourth aspect, in the slit-lamp microscope of any one of the twenty-first to twenty-third aspects, the slit-lamp microscope further includes: a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system and measures a corneal curvature radius; and a first determination unit configured to determine a target orientation of an optical axis of the imaging system based on at least a measurement result of the measurement unit, wherein the first deflection unit changes the orientation of the optical axis of the imaging system to the target orientation.

With respect to an exemplary twenty-fifth aspect, in the slit-lamp microscope of any one of the twenty-first to twenty-third aspects, the slit-lamp microscope further includes: a data receiving unit configured to receive measurement data of a corneal curvature radius of the eye to be examined acquired in advance; and a second determination unit configured to determine a target orientation of an optical axis of the imaging system based on at least the measurement data, wherein the first deflection unit changes the orientation of the optical axis of the imaging system to the target orientation.

In an exemplary twenty-sixth aspect, in the slit-lamp microscope according to any one of the twenty-first to twenty-fifth aspects, the imaging system starts imaging of the anterior segment in accordance with a change in an orientation of an optical axis of the imaging system by the first deflecting mechanism.

A twenty-seventh exemplary aspect is the slit-lamp microscope according to any one of the first to twentieth aspects, further comprising a second deflecting mechanism for changing an orientation of an optical axis of the illumination system.

With regard to an exemplary twenty-eighth aspect, in the slit-lamp microscope of the twenty-seventh aspect, the second deflecting mechanism rotates the optical axis of the illumination system around an intersection of the cornea of the eye to be examined and the optical axis of the illumination system.

With regard to an exemplary twenty-ninth aspect, in the slit-lamp microscope of the twenty-seventh or twenty-eighth aspect, the slit-lamp microscope further includes: an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system and evaluates image quality; and a second deflection control unit that controls the second deflection mechanism based on at least the evaluation result of the image quality evaluation unit.

With respect to the exemplary thirtieth mode は, in the slit-lamp microscope of any one of the twenty-seventh to twenty-ninth modes, the slit-lamp microscope further includes: a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system to measure a corneal curvature radius; and a third determination unit configured to determine a target orientation of the optical axis of the illumination system based on at least a measurement result of the measurement unit, wherein the second deflection unit changes the orientation of the optical axis of the illumination system to the target orientation.

With respect to an exemplary thirty-first mode, in the slit-lamp microscope of any one of the twenty-seventh to twenty-ninth modes, the slit-lamp microscope further includes: a data receiving unit configured to receive measurement data of a corneal curvature radius of the eye to be examined acquired in advance; and a fourth determination unit configured to determine a target orientation of the optical axis of the illumination system based on at least the measurement data, wherein the second deflection unit changes the orientation of the optical axis of the illumination system to the target orientation.

With regard to an exemplary thirty-second aspect, in the slit-lamp microscope according to any one of the twenty-seventh to thirty-first aspects, the imaging system starts imaging of the anterior segment in accordance with a change in the orientation of the optical axis of the illumination system by the second deflecting mechanism.

According to exemplary embodiments, non-compliance with the Schlemm condition caused by differences in refractive index between the inside and outside of the eye being examined can be avoided.

Drawings

Fig. 1A is a schematic diagram for explaining the background of an exemplary embodiment.

Fig. 1B is a diagrammatic view of the background for illustrating an exemplary embodiment.

Fig. 1C is a diagrammatic view of the background for illustrating an exemplary embodiment.

Fig. 1D is a schematic diagram for explaining the background of the exemplary embodiment.

Fig. 1E is a schematic diagram of a background for illustrating an exemplary embodiment.

Fig. 2 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 3 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 4 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 5 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 6 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 7 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 8 is a flow chart showing the actions of a slit-lamp microscope in an illustrative manner.

Fig. 9 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 10 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 11 is a flow chart showing the action of a slit-lamp microscope in an illustrative manner.

Fig. 12 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 13 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 14 is a flow chart showing the actions of a slit-lamp microscope in an illustrative manner.

Fig. 15 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 16 is a schematic diagram showing the structure of a slit-lamp microscope in an exemplary manner.

Fig. 17 is a flow chart showing the action of a slit-lamp microscope in an illustrative manner.

Fig. 18 is a diagrammatic view of a slit lamp microscope used to illustrate an exemplary approach.

Fig. 19 is a diagrammatic view of a slit lamp microscope used to illustrate an exemplary approach.

Fig. 20 is a diagrammatic view of a slit lamp microscope for illustrating an exemplary manner.

Fig. 21 is a diagrammatic view of a slit-lamp microscope used to illustrate an exemplary approach.

Fig. 22 is a diagrammatic view of a slit lamp microscope used to illustrate an exemplary approach.

Detailed Description

Exemplary embodiments will be described in detail with reference to the accompanying drawings. Further, the disclosure of the documents cited in the present specification and other known techniques can be combined with the embodiments. Hereinafter, the background and outline of the embodiments will be briefly described, and then several exemplary embodiments will be described.

< background and summary >

As shown in fig. 1A, an object Plane (Subject Plane) SP on which the lens LN is focused is known as an Image Plane (Image Plane) IP imaging (newton imaging formula) at a position calculated from the position to the lens LN and the focal length of the lens LN. Further, as shown in fig. 1B, it is known that when the object plane SP is displaced by a distance Δ in a certain direction, the image plane IP is also displaced by a distance (Δ × β) obtained by multiplying the distance Δ in the same direction by the square of the lateral magnification β of the optical system (i.e., the longitudinal magnification)²)。

If the case where the object plane SP is inclined with respect to the optical axis of the lens LN is considered based on the newton imaging formula in which the case where the displacement of the object plane is considered, schem's law, as shown in fig. 1C, proposes that the plane PL1 including the object plane SP, the main surface PL2 (main surface) of the lens LN, and the plane PL3 including the image plane IP intersect on the same straight line CL.

Therefore, when the condition shown in fig. 1C is satisfied, as shown in fig. 1D, theoretically, by making the eyeball optical axis Eax of the eye E coincide with the object plane SP, that is, by making the slit light SL enter the eye E along the plane PL1 intersecting the main surface PL2 and the plane PL3 on the same straight line CL, a slit lamp microscope that performs focusing and imaging on the entire object plane SP is realized.

However, since the slit light SL is refracted by a difference in refractive index between the inside and outside of the eye E (a difference in refractive index between air and the cornea, a difference in refractive index at an eyeball tissue boundary, or the like), the object plane SP is incorrect when the refraction of the slit light SL is ignored, and thus does not satisfy the schem condition.

For example, as shown in fig. 1E, when imaging is performed by tilting the imaging angle α with respect to the incident direction of the slit light SL (indicated by the same reference numeral SL) that coincides with the eyeball optical axis Eax, the focal position FP1 of the lens LN located at the corneal vertex is not displaced in consideration of refraction at the corneal anterior surface, but the (exemplary) focal positions FP2, FP3 located inside the eye to be inspected E are moved to positions indicated by reference numerals FP2 ', FP 3', respectively. Therefore, as an object plane satisfying the schemer condition, an object plane SP ' located on a plane passing through a plurality of focal positions FP1, FP2 ', FP3 ' in consideration of refraction is used instead of the original object plane SP coinciding with the eyeball optical axis Eax.

In order to realize the object plane SP ', it is understood that when the angle between the object plane SP ' and the object plane SP (the eyeball optical axis Eax) and refraction at least at the anterior surface of the cornea are taken into consideration, slit light may be made incident from a direction SL ' inclined at an angle Δ θ from the original incident direction SL. As an example, when the eye to be examined is assumed to be a sphere and is calculated using an imaging angle α of 30 degrees, a corneal curvature radius of a gullsland model eye of 7.7mm, and an eyeball refractive index of 1.336, an inclination angle of the object plane SP 'with respect to the object plane SP is about 6 degrees, and an angle of the incident direction SL' with respect to the incident direction SL is about 8 degrees.

In addition, when the range of individual differences of these parameters, the type of model eye to be referred to, and the like are taken into consideration, the deviation angle Δ θ of the object plane due to the refractive index of the eye E to be examined may be in the range of 3 to 13 degrees, and further in the range of 6 to 10 degrees. The type of model eye to be referred to for determining the deflection angle Δ θ is arbitrary, and may be any of the gullsland model eye, navaro model eye, Liou-Brennan model eye, Badal model eye, Arizona model eye, Indiana model eye, arbitrary standardized model eye, and model eyes equivalent to any of these, which are disclosed in japanese patent laid-open No. 2012-93522 and japanese patent publication No. 2017-526517, for example.

In the above example, the deflection angle Δ θ is determined based on at least the corneal curvature radius value of the predetermined model eye and the refractive index value of the eye, but the method of determining the deflection angle Δ θ is not limited to this. For example, the deviation angle Δ θ can be determined using the corneal radius of curvature plus another parameter value, or using another parameter value instead of the corneal radius of curvature. Alternatively, information other than the model eye can be used. For example, the deflection angle Δ θ can be determined using measurement data of the eye E. Several examples are described later.

< related to slit-lamp microscope >

In general, slit-lamp microscopes are widely used in various medical facilities. The slit-lamp microscope of the embodiment is not limited to medical facilities, and may be used in situations and environments where a professional technical holder of the same apparatus is not in the vicinity, or situations and environments where the professional technical holder can remotely monitor, indicate, and operate. Additionally, the slit-lamp microscope of an embodiment may be portable. Examples of facilities in which the slit-lamp microscope of the embodiment is installed include, in addition to medical facilities, an eyeglass shop, an optometry place, a health diagnosis place, an examination and diagnosis place, a patient's home, a welfare facility, a public facility, and an examination and diagnosis vehicle.

The slit-lamp microscope according to the embodiment is an ophthalmologic imaging apparatus (or, more generally, a medical apparatus) having at least an observation and imaging function (slit-lamp microscope function) using slit light, and may further have another imaging function (mode). Examples of the other modes include a fundus camera, SLO, OCT, and the like.

The slit-lamp microscope according to the embodiment may further include a function of measuring a characteristic of the eye to be examined. Examples of the measurement function include optometry, dioptric measurement, intraocular pressure measurement, corneal endothelial cell measurement, aberration measurement, and visual field measurement.

The slit-lamp microscope of the embodiment may further include an application program for analyzing the captured image and the measurement data. In addition, the slit-lamp microscope of an embodiment may also have functions for treatment and surgery. As examples thereof, photocoagulation therapy and photodynamic therapy are given.

Several exemplary embodiments of the embodiments are described below. Any two or more of these illustrative means can be combined. In addition, each of these exemplary embodiments or a combination of two or more of these exemplary embodiments can be combined with any known technique or can be modified (added, replaced, or the like) based on any known technique.

In the following exemplary embodiments, a "processor" refers to, for example, a CPU (Central Processing Unit), a GPU (Graphics Processing Unit), an ASIC (Application Specific Integrated Circuit), a Programmable Logic Device (e.g., SPLD (Simple Programmable Logic Device), a CPLD (Complex Programmable Logic Device), an FPGA (Field Programmable Gate Array)), and the like. The processor realizes the functions of the embodiments thereof, for example, by reading and executing programs and data stored in a memory circuit or a storage device.

The structure of a slit-lamp microscope is illustrated in an exemplary manner. First, the direction is defined as follows. When the optical system of the slit-lamp microscope is disposed on the front surface (intermediate position) of the eye to be examined, the direction from the lens (objective lens) on the side closest to the eye to be examined in the optical system toward the eye to be examined is defined as the anterior direction (or depth direction, Z direction), and the opposite direction is defined as the posterior direction (-Z direction). The horizontal direction orthogonal to the Z direction is defined as the left-right direction (or lateral direction, ± X direction). The direction orthogonal to both the Z direction and the X direction is referred to as the vertical direction (or the longitudinal direction, ± Y direction). The XYZ coordinate system is, for example, a three-dimensional orthogonal coordinate system defined as a right-handed coordinate system (or, a left-handed coordinate system).

The observation and imaging system of the slit-lamp microscope is rotatable at least in the horizontal direction, and the movement radial direction, which is the direction along the optical axis of the observation and imaging system (observation and imaging optical axis), is defined as r₁Direction, let the direction of rotation be θ₁And (4) direction. Similarly, the illumination system of the slit-lamp microscope is rotatable, and the direction along the optical axis of the illumination system (illumination optical axis), i.e., the movement radial direction, is r₂Direction, let the direction of rotation be θ₂And (4) direction. For example, the positive direction of the movement radial direction is a direction from the objective lens toward the eye to be inspected, and the positive direction of the rotation direction is a counterclockwise direction when viewed from above. The rotation direction is defined, for example, with reference to the Z direction (that is, the Z direction is defined as a rotation angle of 0 degrees). When the observation and photographing system is disposed at the intermediate position (that is, θ)₁When equal to 0 degree), r₁The direction coincides with the Z direction. Likewise, when the illumination system is disposed at the intermediate position (that is, θ)₂When equal to 0 degree), r₂The direction coincides with the Z direction. At least one of the lighting system and the observation and photographing system can be rotated in the vertical direction. The radial and rotational directions of movement are likewise defined in this case.

The external appearance of a slit-lamp microscope is shown in an exemplary manner in fig. 2. The slit-lamp microscope 1 is connected with a computer 100. The computer 100 performs various information processes (control process, arithmetic process, and the like). The computer 100 may be connected to the slit-lamp microscope 1 by means of a communication line, for example, a server on a network or the like. Alternatively, the computer 100 may also be part of the slit-lamp microscope 1.

The slit-lamp microscope 1 is mounted on a table 2. The base 4 is configured to be movable three-dimensionally by the movement mechanism 3, for example. The base 4 is moved by tilting the operation handle 5. Alternatively, the moving mechanism portion 3 includes an actuator.

A support portion 15 for supporting the observation imaging system 6 and the illumination system 8 is provided on the upper surface of the base 4. A support arm 16 that supports the observation and imaging system 6 is attached to the support portion 15 so as to be rotatable in the left-right direction. A support arm 17 for supporting the lighting system 8 is attached to an upper portion of the support arm 16 so as to be rotatable in the left-right direction. The support arms 16, 17 are rotatable independently of each other and coaxially with each other.

The observation and photographing system 6 is moved by rotating the support arm 16. By rotating the supporting arm 17, the lighting system 8 is moved. The support arms 16, 17 are rotated by electric mechanisms, respectively. The moving mechanism 3 is provided with a mechanism for rotating the support arm 16 and a mechanism for rotating the support arm 17. Further, the observation and imaging system 6 can be moved by manually rotating the support arm 16. Similarly, the lighting system 8 can be moved by manually rotating the support arm 17.

The illumination system 8 irradiates illumination light to the eye E. As described above, the lighting system 8 can be rotated in the left-right direction. Further, the illumination system 8 may be configured to be rotatable in the vertical direction. That is, the elevation angle and depression angle of the illumination system 8 may be configured to be changeable. By the swinging operation of the illumination system 8, the projection direction of the illumination light to the eye E is changed.

The observation imaging system 6 includes a pair of right and left optical systems that guide return light of the illumination light projected to the eye E. The optical system is housed in the barrel body 9. The lens barrel body 9 has an eye portion 9a at its distal end. The examiner looks at the eye-receiving portion 9a and observes the eye E. As described above, the lens barrel main body 9 can be rotated in the left-right direction by rotating the support arm 16. The observation and imaging system 6 may be configured to be rotatable in the vertical direction. That is, the elevation angle and the depression angle of the observation imaging system 6 may be changeable. By such a swing operation of the observation and imaging system 6, the direction in which the eye E is observed and the direction in which the eye E is imaged can be changed.

A jaw holder 10 is disposed at a position facing the lens barrel body 9. The jaw rest base 10 is provided with a jaw rest portion 10a and a forehead rest 10b for stably placing the face of the subject.

A magnification operation knob 11 for changing the magnification is disposed on a side surface of the barrel body 9. An imaging device 13 for imaging the eye E is connected to the lens barrel body 9. The imaging device 13 includes an imaging element. The image pickup device is a photoelectric conversion device that detects light and outputs an image signal (electric signal). The image signal is input to the computer 100. As the image pickup Device, for example, a CCD (Charge Coupled Device) image sensor, a CMOS (Complementary Metal-Oxide-Semiconductor) image sensor, or the like is used.

A mirror 12 that reflects the illumination light beam output from the illumination system 8 toward the eye E to be inspected is arranged below the illumination system 8.

Fig. 3 shows an example of the configuration of the optical system of the slit-lamp microscope 1. As described above, the slit-lamp microscope 1 includes the observation and imaging system 6 and the illumination system 8.

The observation and imaging system 6 includes a pair of left and right optical systems. The left and right optical systems have substantially the same configuration, and the eye E can be observed with both eyes. Fig. 3 shows only one of the left and right optical systems of the observation and photographing system 6. The observation and photographing system 6 is not limited to the binocular optical system, and may be a monocular optical system. Reference numeral O1 denotes the optical axis of the observation and photographing system 6.

The left and right optical systems of the observation and photographing system 6 each include an objective lens 31, a variable magnification optical system 32, a beam splitter 34, an imaging lens 35, a prism 36, and an eyepiece 37. Here, the beam splitter 34 is provided in one or both of the left and right optical systems. The eyepiece 37 is provided in the eyepiece portion 9 a. Reference numeral P denotes an imaging position of the light guided to the eyepiece 37. Reference symbol Ec denotes the cornea of the eye E to be examined. Reference numeral Eo denotes the examiner's eye.

The variable magnification optical system 32 includes a plurality of (e.g., three) variable magnification lenses 32a, 32b, 32 c. In the present embodiment, a plurality of variable magnification lens groups are provided which can be selectively inserted into the optical path of the observation and photographing system 6. These variable power lens groups correspond to different magnifications, respectively. As the variable magnification optical system 32, a variable magnification lens group disposed on the optical path of the observation and imaging system 6 is used. By selectively inserting such a variable magnification lens group, the magnification (angle of view) of the observed image and the captured image of the eye E can be changed. The magnification is changed, that is, the magnification-varying lens group disposed on the optical path of the observation and imaging system 6 is switched by operating the magnification operation knob 11. Further, the magnification can be electrically changed by using a switch not shown.

The beam splitter 34 divides the optical path of the light propagating along the optical axis O1 into an optical path located on an extension of the optical axis O1 and an optical path orthogonal to the optical axis O1. The light incident on the optical path located on the extension of the optical axis O1 is guided to the examiner's eye Eo via the imaging lens 35, the prism 36, and the eyepiece 37. The prism 36 moves the propagation direction of light upward in parallel.

On the other hand, the light incident on the optical path orthogonal to the optical axis O1 is guided to the image pickup device 43 of the image pickup device 13 via the condenser lens 41 and the mirror 42. That is, the observation and imaging system 6 guides the return light from the eye E to the imaging device 13. The imaging element 43 detects the return light to generate an image signal GS. The imaging device 13 is provided in one or both of the left and right optical systems.

The observation and photographing system 6 includes a focusing mechanism 40 for changing a focal position (focus) thereof. The focusing mechanism 40 moves the objective lens 31 along the optical axis O1. The movement of the objective lens 31 is performed automatically and/or manually. When the objective lens 31 is automatically moved, the computer 100 can determine the focal position based on the return light from the eye E using a known focus adjustment method (for example, a phase difference detection method, a contrast detection method, or the like), for example. Further, the computer 100 can control the actuator to move the objective lens 31 to the obtained focal position along the optical axis O1. On the other hand, when the objective lens 31 is manually moved, the actuator moves the objective lens 31 along the optical axis O1 in accordance with the user's operation.

Further, the observation and photographing system 6 may include a first focus lens disposed at a position on the optical axis O1 between the objective lens 31 and the image pickup element 43. In this case, the focusing mechanism 40 changes the focal position of the observation imaging system 6 by moving the first focusing lens along the optical axis O1. The entire observation imaging system 6 (or a part thereof) may be configured to be movable along the optical axis O1. In this case, the focusing mechanism 40 changes the focal position of the observation imaging system 6 by moving the entire observation imaging system 6 along the optical axis O1. The first focusing lens or the observation imaging system 6 is automatically or manually moved by the focusing mechanism 40, as in the case of moving the objective lens 31.

In this illustrative embodiment, an observation imaging system 6 capable of performing both observation through an eyepiece and imaging by an imaging element is used. However, the slit-lamp microscope of some exemplary embodiments may be provided with an imaging system capable of imaging only with an imaging element.

The illumination system 8 includes an illumination light source 51, a condenser lens 52, a slit forming section 53, and an objective lens 54. Reference numeral O2 denotes the optical axis of the illumination system 8.

The illumination light source 51 outputs illumination light. A plurality of light sources may be arranged on the illumination system 8. For example, both a light source (e.g., a halogen lamp, a Light Emitting Diode (LED), or the like) that outputs steady light and a light source (e.g., a xenon lamp, an LED, or the like) that outputs flickering light can be provided as the illumination light source 51. Further, a light source for anterior eye observation and a light source for posterior eye observation may be provided separately. For example, the illumination light source 51 includes a visible light source that outputs visible light. The illumination light source 51 may include an infrared light source that outputs infrared light (e.g., light having a center wavelength of 800nm to 1000 nm).

The slit forming section 53 generates slit light. The slit forming portion 53 has a pair of slit edges. By changing the interval between the slit edges (slit width), the width of the generated slit light can be changed. Further, the direction of the slit light can be changed by the integral rotation of the pair of slit blades. The structure of the slit forming portion 53 is not limited to the form including the pair of slit edges, and may be any other form.

The illumination system 8 includes a focusing mechanism 50 for changing a focal position (focal point) thereof. The focusing mechanism 50 moves the objective lens 54 along the optical axis O2. The movement of the objective lens 54 is performed automatically and/or manually. When the objective lens 54 is automatically moved, the computer 100 can determine the focal position by analyzing an image that depicts an image based on return light from the eye E, for example. Further, the computer 100 can control the actuator so that the objective lens 54 moves to the found focal position along the optical axis O2. On the other hand, in the case of manually moving the objective lens 54, the actuator moves the objective lens 54 along the optical axis O2 in accordance with the user's operation.

Further, the illumination system 8 may include a second focus lens disposed at a position on the optical axis O2 between the objective lens 54 and the slit forming part 53. In this case, the focusing mechanism 50 changes the focal position of the slit light by moving the second focus lens along the optical axis O2. Further, the entire (or a part of) the illumination system 8 may be configured to be movable along the optical axis O2. In this case, the focusing mechanism 50 moves the entire illumination system 8 along the optical axis O2, thereby changing the focal position of the slit light. The movement of the second focusing lens or the illumination system 8 by the focusing mechanism 50 is performed automatically or manually, as in the case of moving the objective lens 54.

Although not shown in fig. 3, a mirror 12 that reflects the illumination light flux output from the illumination system 8 toward the eye E is disposed on the optical axis O2. Typically, the illumination system 8 and the reflector 12 are configured to rotate integrally.

In some exemplary embodiments described below, the description is made with reference to the slit-lamp microscope 1 unless otherwise mentioned. However, these illustrative slit-lamp microscopes or slit-lamp microscopes that can be adapted for other modes are not limited thereto.

< first mode >

A slit-lamp microscope of a first mode is explained. Fig. 4 and 5 show a configuration example of a slit-lamp microscope 200 according to the present embodiment.

As shown in fig. 4, the slit-lamp microscope 200 includes a moving mechanism 60, in addition to an imaging system (observation and imaging system) 6, an illumination system 8, and a computer 100, which are similar to the slit-lamp microscope 1. The computer 100 includes a control section 110 and a data processing section 120. The data processing unit 120A shown in fig. 5 shows an example of the data processing unit 120. The data processing unit 120(120A) includes a three-dimensional image constructing unit 121, a rendering unit 122, and an analyzing unit 123.

The slit-lamp microscope 200 may be a single device or a system including more than two devices. For example, in several ways, the slit-lamp microscope 200 includes: a main body device including an illumination system 8, an imaging system 6, and a moving mechanism 60; a computer 100; and a communication device for performing communication between the main apparatus and the computer 100. In addition, in several ways, the slit-lamp microscope 200 includes a remote operation computer that can access the main body apparatus (or the computer 100) via a communication line, in addition to the same main body apparatus (and the computer 100).

The illumination system 8 irradiates slit light to the anterior segment of the eye E to be inspected. Reference numeral O2 denotes an optical axis (illumination optical axis) of the illumination system 8. The illumination system 8 can change the width, length, and orientation of the slit light, for example. The length of the slit light is a cross-sectional dimension of the slit light in a direction orthogonal to a cross-sectional width direction of the slit light corresponding to the width of the slit. The slit width and slit length are typically expressed as the size of a projection image of slit light projected on the anterior eye, or the size of a slit formed by the slit forming section 53.

The photographing system 6 photographs the anterior segment irradiated with the slit light from the illumination system 8. Reference numeral O1 denotes the optical axis (shooting optical axis) of the shooting system 6. The imaging system 6 includes an optical system 6a and an imaging element 43.

The optical system 6a guides light from the anterior segment of the eye E irradiated with the slit light to the image pickup device 43. The image pickup element 43 receives light guided by the optical system 6a with an image pickup plane.

The light guided by the optical system 6a (that is, light from the anterior eye portion of the eye E to be inspected) includes return light of the slit light irradiated to the anterior eye portion, and may further include other light. Examples of the return light include reflected light, scattered light, and fluorescence. Examples of the other light include light (indoor light, sunlight, and the like) from the installation environment of the slit-lamp microscope 200.

The lighting system 8 and the imaging system 6 of the present embodiment function as a scham camera. That is, the configuration and arrangement of the illumination system 8 and the imaging system 6 are determined such that the object plane SP, the main surface of the optical system 6a, and the imaging plane of the imaging element 43 determined by the illumination system 8 satisfy the so-called "samm" condition.

More specifically, as shown in fig. 1E, the configuration and arrangement of the illumination system 8 and the imaging system 6 are determined such that an object plane SP including the focal point of the illumination system 8 displaced by the refractive index of the anterior segment tissue, the principal surface of the optical system 6a, and the imaging plane of the imaging device 43 intersect on the same straight line. This enables shooting to be performed in focus on the entire object plane SP. As described above, in the conventional schemer slit lamp microscope, since the displacement of the focal point of the illumination system due to the refractive index of the tissue of the anterior segment is not considered, it is impossible to take an image in focus on the entire object plane SP.

The range of the object plane SP is set larger than the range from the cornea anterior surface to the crystalline lens (typically the posterior surface thereof), for example. However, the range of the object plane SP is not limited thereto. The object plane SP can be positioned with respect to a predetermined imaging target range (for example, a range from the anterior surface of the cornea to the posterior surface of the crystalline lens) of the eye E. The action for this alignment may include, for example, a known alignment action.

In order to satisfy the schem condition, typically, design, adjustment, processing, and the like are performed with respect to the configuration and arrangement of elements included in the illumination system 8, the configuration and arrangement of elements included in the imaging system 6, and the relative position of the illumination system 8 and the imaging system 6.

The parameter indicating the relative position between the illumination system 8 and the imaging system 6 includes, for example, an angle (imaging angle) formed by the illumination optical axis O2 and the imaging optical axis O1. In the conventional slit-lamp microscope of the schemer type, the illumination optical axis O2 coincides with the eyeball optical axis Eax, but in the slit-lamp microscope 200 of the present embodiment, the eyeball optical axis Eax and the illumination optical axis O2 form an angle (deflection angle) Δ θ.

The deflection angle Δ θ is determined based on at least the refractive index of the anterior segment. The refractive index may be a measured value or a standard value of the refractive index of the eye E. As an example of the standard value, there is the value of the aforementioned model eye.

The deviation angle Δ θ may also be determined based on other eye parameters. For example, with a corneal radius of curvature, corneal thickness, anterior capsule depth, radius of curvature of the anterior surface of the lens, lens thickness, radius of curvature of the posterior surface of the lens, and the like. In addition, the deflection angle Δ θ may depend on the photographing angle made by the illumination optical axis O2 and the photographing optical axis O1.

In this way, the deflection angle Δ θ can be set to a value within a range of 3 to 13 degrees, and further within a range of 6 to 10 degrees, depending on individual differences in eyeball parameters, the type of model eye to be referred to, the shooting angle, and the like. Further, the value of the deviation angle Δ θ is not limited to these.

The moving mechanism 60 moves the illumination system 8 and the imaging system 6. In this embodiment, the moving mechanism 60 can move the illumination system 8 and the imaging system 6 in the left-right direction integrally. When the illumination system 8 and the imaging system 6 are moved in the left-right direction integrally, the longitudinal direction of the slit light is typically along the up-down direction. That is, in a typical control example, the direction (longitudinal direction) of the slit light and the moving direction of the illumination system 8 and the imaging system 6 are orthogonal to each other. This enables the eye E to be scanned with slit light.

In addition, the moving mechanism 60 can move the illumination system 8 and the imaging system 6 independently of each other. For example, the moving mechanism 60 can perform the horizontal rotational movement of the illumination system 8 and the horizontal rotational movement of the imaging system 6 independently of each other. This allows the imaging angle formed by the illumination optical axis O2 and the imaging optical axis O1 to be changed.

In the case of adopting the structure illustrated in fig. 2, the moving mechanism 60 includes an actuator that rotates the support arm 16 supporting the imaging system (observation imaging system) 6 in the left-right direction and an actuator that rotates the support arm 17 supporting the illumination system 8 in the left-right direction. Thereby, the illumination system 8 and the photographing system 6 can be rotated independently of each other and coaxially with each other.

The manner in which the moving mechanism 60 moves the illumination system 8 is not limited to the above-described example, and the manner in which the imaging system 6 moves is not limited to the above-described example. For example, the moving mechanism 60 may be configured to integrally move the illumination system 8 and the imaging system 6 in any direction. The moving mechanism 60 may be configured to be able to arbitrarily change the relative position between the illumination system 8 and the imaging system 6.

The control unit 110 provided in the computer 100 controls each part of the slit-lamp microscope 200. For example, the control unit 110 controls elements of the lighting system 8, elements of the imaging system 6, the movement mechanism 60, the data processing unit 120, and the like.

The control section 110 includes one or more processors, one or more main storage devices, one or more auxiliary storage devices, and the like. The auxiliary storage device stores a control program and the like. The control program or the like may also be stored in a computer or storage device accessible to the slit-lamp microscope 200. The function of the control unit 110 is realized by the cooperative operation of software such as a control program and hardware such as a processor.

The control unit 110 can apply the following control to the illumination system 8, the imaging system 6, and the moving mechanism 60 in order to scan a three-dimensional region of the eye E with slit light.

First, the control unit 110 executes control (alignment control) of the moving mechanism 60 for disposing the illumination system 8 and the imaging system 6 at predetermined scanning start positions. The scanning start position is, for example, a position corresponding to an end portion (first end portion) of the cornea of the eye E to be inspected or a position farther from the eyeball optical axis Eax than the position in the left-right direction. In the following, several exemplary ways of alignment control are described, but the alignment control is not limited to these.

The alignment control includes, for example: control for configuring the illumination system 8 such that the angle of the illumination optical axis O2 with respect to the eyeball optical axis Eax of the eye E to be inspected is equal to a predetermined deviation angle (Δ θ); control of configuring the photographing system 6 such that the angle of the photographing optical axis O1 with respect to the illumination optical axis O2 of the illumination system 8 thus configured is equal to a predetermined photographing angle (α - Δ θ); and control for integrally moving the illumination system 8 and the imaging system 6 arranged in this manner to a predetermined scanning start position.

In other examples, the alignment control includes: control for configuring the illumination system 8 and the photographing system 6 so that the angle formed by the illumination optical axis O2 and the photographing optical axis O1 is equal to a predetermined photographing angle (α - Δ θ); control in which the illumination system 8 is disposed such that the illumination optical axis O2 of the illumination system 8 disposed at such a relative position with respect to the imaging system 6 is at a predetermined deflection angle Δ θ with respect to the eyeball optical axis Eax of the eye E; and control for integrally moving the illumination system 8 and the imaging system 6 arranged in this manner to a predetermined scanning start position.

In still other examples, the alignment control includes: control for configuring the illumination system 8 and the photographing system 6 so that the angle formed by the illumination optical axis O2 and the photographing optical axis O1 is equal to a predetermined photographing angle (α); control of integrally moving the illumination system 8 and the imaging system 6 thus configured to a predetermined scanning start position to make the illumination optical axis O2 coincide with the eyeball optical axis Eax of the eye E to be inspected; and control of moving the illumination system 8 to rotate the illumination optical axis O2 arranged to coincide with the eyeball optical axis Eax by a predetermined deviation angle Δ θ.

After the illumination system 8 and the imaging system 6 are disposed at the scanning start position, the control unit 110 controls the illumination system 8 to start irradiation of the eye E with the slit light (slit light irradiation control). Further, the slit light irradiation control may be performed before or during execution of the alignment control. The illumination system 8 typically irradiates continuous light as slit light, but may also irradiate intermittent light (pulsed light) as slit light. In addition, the illumination system 8 typically irradiates visible light as slit light, but may also irradiate infrared light as slit light.

The control unit 110 controls the imaging system 6 to start video imaging (imaging control) of the eye E at any timing before or after the start of irradiation of the slit light or irradiation of the slit light. That is, the imaging system 6 repeatedly performs imaging in parallel with the movement of the illumination system 8 and the imaging system 6 by the moving mechanism 60, thereby acquiring a plurality of images of the anterior segment of the eye E. Video capture is performed at a predetermined repetition rate.

After the alignment control, the slit light irradiation control, and the imaging control are executed, the control unit 110 controls the moving mechanism 60 to start the movement (movement control) of the illumination system 8 and the imaging system 6. By the movement control, the lighting system 8 and the imaging system 6 move integrally. That is, the illumination system 8 and the imaging system 6 are moved while maintaining the relative positions of the illumination system 8 and the imaging system 6 (for example, the imaging angle α - Δ θ). The movement of the illumination system 8 and the imaging system 6 is moved from the scanning start position to a predetermined scanning end position. The scanning end position is, for example, a position corresponding to an end portion (second end portion) of the cornea on the opposite side of the first end portion in the left-right direction, or a position farther from the eyeball optical axis Eax than the position, as in the scanning start position. The range from the scanning start position to the scanning end position is a scanning range.

In an exemplary mode of scanning by slit light, image capturing by the imaging system 6 is performed while slit light having a horizontal direction as a width direction and a vertical direction as a length direction is irradiated to the eye E, and the illumination system 8 and the imaging system 6 are moved in the horizontal direction.

Here, the length of the slit light (that is, the size of the slit light in the vertical direction) is set to be equal to or larger than the diameter of the cornea, for example. That is, the length of the slit light is set to be equal to or greater than the corneal diameter. As described above, the movement distance (that is, the scanning range) of the illumination system 8 and the imaging system 6 is set to be equal to or larger than the corneal diameter in the left-right direction. Thereby, at least the entire cornea of the eye E to be inspected can be scanned by the slit light. In addition, a wider scanning range can be applied to the case where the sclera is scanned, the iris is scanned, the angle of the room is scanned, and the like. The scanning range is not limited to these illustrative embodiments, and can be arbitrarily set according to the imaging target region and the like.

By such scanning, a plurality of sectional images different in irradiation position of the slit light are obtained. In other words, a dynamic image depicting a case where the irradiation position of the slit light moves in the horizontal direction is obtained. The cross-section shown in each cross-sectional image includes the object plane SP shown in fig. 4. The focus of the camera system 6 is focused on the entire object plane SP. The object plane SP includes, for example, the range from the anterior surface of the cornea to the posterior surface of the lens. In this case, a clear (in-focus, high-quality, high-definition) image of a three-dimensional region from the anterior surface of the cornea to the posterior surface of the lens is obtained.

The data processing section 120 performs various data processes. The processed data may be any of data acquired by the slit-lamp microscope 200 and data input from the outside. For example, the data processing unit 120 can process images acquired by the illumination system 8 and the imaging system 6.

The data processing unit 120 includes one or more processors, one or more main storage devices, one or more auxiliary storage devices, and the like. The auxiliary storage device stores a data processing program and the like. The data processing program or the like may be stored in a computer or storage device accessible to the slit-lamp microscope 200. The function of the data processing unit 120 is realized by cooperation of software such as a data processing program and hardware such as a processor.

As described above, the data processing unit 120A as an exemplary form of the data processing unit 120 includes the three-dimensional image constructing unit 121, the rendering unit 122, and the analyzing unit 123 (see fig. 5).

The three-dimensional image constructing unit 121 constructs a three-dimensional image based on a plurality of images of the eye E acquired using the illumination system 8 and the imaging system 6. In this embodiment, the three-dimensional image constructing unit 121 can construct a three-dimensional image based on a plurality of sectional images collected by scanning the eye E with slit light.

The three-dimensional image is an image (image data) in which the positions of pixels are defined by a three-dimensional coordinate system. As an example of the three-dimensional image, there are stack data and volume data. The stack data is constructed by embedding a plurality of two-dimensional images (e.g., a plurality of sectional images) into a single three-dimensional coordinate system according to their positional relationship. The volume data is also referred to as voxel data, and is constructed by applying a voxelization process to the stack data, for example.

An example of a process of constructing a three-dimensional image is described. The three-dimensional image constructing unit 121 can extract partial images from the plurality of images, and construct a three-dimensional image from the plurality of extracted partial images. Here, the partial image is, for example, an image corresponding to the object plane SP (object plane image) or an image including at least a part of the object plane image. According to the present example, for example, a clear (in-focus, high-quality, high-definition) three-dimensional image from the anterior surface of the cornea to the posterior surface of the lens can be constructed.

The rendering unit 122 creates a new image (rendered image) by rendering the three-dimensional image created by the three-dimensional image creating unit 121.

Rendering may be any process, including, for example, three-dimensional computer graphics. Three-dimensional computer graphics is an arithmetic method for creating an image having a three-dimensional effect by converting a virtual three-dimensional object (three-dimensional image such as stack data and volume data) in a three-dimensional space defined by a three-dimensional coordinate system into two-dimensional information.

Examples of rendering include volume rendering, maximum projection (MIP), minimum projection (MinIP), surface rendering, multi-slice reconstruction (MPR), projection image construction, shadow construction, and reproduction of a slice image obtained with a slit-lamp microscope. The rendering unit 122 may perform any processing together with such rendering.

The rendering unit 122 can specify a region corresponding to a predetermined portion of the eye E in the three-dimensional image. For example, the rendering unit 122 can specify a region corresponding to the cornea, a region corresponding to the anterior surface of the cornea, a region corresponding to the posterior surface of the cornea, a region corresponding to the crystalline lens, a region corresponding to the anterior surface of the crystalline lens, a region corresponding to the posterior surface of the crystalline lens, a region corresponding to the iris, a region corresponding to the angle of the room, and the like. For such image area determination, known image processing such as segmentation, edge detection, thresholding, filtering, and labeling is applied. Further, the image region may be specified by machine learning using a convolutional neural network.

The three-dimensional image is typically stack data or volume data. The designation of the cross section of the three-dimensional image is performed manually or automatically. The automatic designation of the cross-section applies, for example, the aforementioned image area determination.

On the other hand, when the cross section of the three-dimensional image is manually designated, the rendering unit 122 renders the three-dimensional image to construct a display image for manually designating the cross section. The display image is typically an image showing the entire region to be observed, for example, a region from the anterior surface of the cornea to the posterior surface of the crystalline lens. The rendering used to construct the display image is typically either a volume rendering or a surface rendering.

The control unit 110 causes the display image created by the rendering unit 122 to be displayed on a display device not shown. The user designates a desired cross section on the display image using an operation device such as a pointing device. Position information of a cross section designated on the display image is input to the rendering unit 122.

The display image is a rendered image of the three-dimensional image, so that the display image and the three-dimensional image have an obvious positional correspondence. The rendering unit 122 specifies the position of the cross section in the three-dimensional image corresponding to the position of the cross section designated on the display image, based on the positional correspondence. That is, the rendering unit 122 specifies a cross section on the three-dimensional image.

Further, the rendering unit 122 can construct a three-dimensional partial image by cutting the three-dimensional image with the cross section. The rendering unit 122 can render the three-dimensional partial image to construct an image for display.

The analysis unit 123 applies analysis processing to the image of the eye E. The image to which the analytical processing is applied may be, for example, at least one of a plurality of images collected by scanning of the slit light, or an image obtained by processing the at least one image. Examples of the latter include a three-dimensional image constructed by the three-dimensional image constructing unit 121, a rendered image constructed by the rendering unit 122, and other processed images.

The analysis processing includes, for example, measurement related to a predetermined parameter. The measurement may be any of processing for obtaining measurement data relating to parameters (thickness, diameter, area, volume, angle, shape, and the like) indicating the form of the tissue and processing for obtaining data relating to parameters (distance, direction, and the like) indicating the relationship between the tissues, for example. Examples of the measured parameters include anterior corneal surface curvature, anterior corneal surface radius of curvature, posterior corneal surface radius of curvature, corneal diameter, corneal thickness, corneal topography, anterior capsule depth, angle of the atrium, anterior lens surface curvature, anterior lens surface radius of curvature, posterior lens surface radius of curvature, and lens thickness. The measurement data may be distribution data of measurement parameters.

The analysis process may further include evaluation of the measurement data. The evaluation includes, for example, comparison with standard data (reference data). The standard data may be, for example, normal eye data (normal eye database) or diseased eye data (diseased eye database) related to a predetermined disease. Examples of the evaluation include evaluation of corneal shape (radius of curvature, distribution of radius of curvature, topographic map, and the like), evaluation of corneal thickness (distribution), evaluation of anterior capsule depth, evaluation of angle of chamber (distribution), evaluation of lens shape (radius of curvature, distribution of radius of curvature, topographic map, and the like), evaluation of lens thickness (distribution), evaluation of cataract (opacification), and the like.

The slit-lamp microscope 200 may also include a communication section that performs data communication with other devices. The communication unit transmits data to and receives data transmitted from another device. The data communication method performed by the communication unit is arbitrary. For example, the communication unit includes one or more of various communication interfaces such as a communication interface conforming to the internet, a communication interface conforming to a dedicated line, a communication interface conforming to a LAN, and a communication interface conforming to near field communication. The data communication may be wired communication or wireless communication. The data transmitted and/or received by the communication section may be encrypted. In this case, for example, the control unit 110 and/or the data processing unit 120 includes an encryption processing unit that encrypts data transmitted by the communication unit and/or a decryption processing unit that decrypts data received by the communication unit 9.

The slit-lamp microscope 200 may be provided with a display device and an operating device. Alternatively, the display device and the operation device may be peripheral devices of the slit-lamp microscope 200. The display device receives control of the control section 110 and displays various kinds of information. The display device may include a flat panel display such as a Liquid Crystal Display (LCD). The operating means comprise means for operating the slit-lamp microscope 200 and means for inputting information. The operation devices include, for example, buttons, switches, levers, dials, knobs, mice, keyboards, trackballs, operation panels, and the like. A device in which a display device and an operation device are integrated, such as a touch panel, may also be used.

< second mode >

A slit-lamp microscope of a second mode is explained. Fig. 6 and 7 show a configuration example of a slit-lamp microscope 200A according to the present embodiment.

As shown in fig. 6, the slit-lamp microscope 200A includes the imaging system 6, the illumination system 8, the moving mechanism 60, and the computer 100, as in the slit-lamp microscope 200 of the first embodiment. The moving mechanism 60 of the present embodiment functions as a first deflecting mechanism 70.

The computer 100 includes a control section 110 and a data processing section 120. The control unit 110B and the data processing unit 120B shown in fig. 7 are an example of the control unit 110 and an example of the data processing unit 120 according to the present embodiment, respectively. The control section 110B includes a first deflection control section 111. The data processing unit 120B includes an image quality evaluation unit 124, a measurement unit 125, and a first determination unit 126. The data processing unit 120(120B) of the present embodiment may further include any one of the three-dimensional image constructing unit 121, the rendering unit 122, and the analysis unit 123.

The first deflecting mechanism 70 changes the direction of the optical axis (imaging optical axis O1) of the imaging system 6. That is, the first deflecting mechanism 70 changes the orientation of the imaging system 6, in other words, rotates the imaging system 6. For example, in the aligned state described above, the first deflecting mechanism 70 substantially rotates the imaging system 6 around the intersection of the object plane SP and the imaging optical axis O1. Reference numeral Spa in fig. 6 denotes a virtual rotational axis of the imaging system 6, which is substantially located at an intersection of the object plane SP and the imaging optical axis O1. The first deflection mechanism 70 operates under the control of the first deflection control unit 111. The first deviation mechanism 70 includes, for example, an actuator that generates a rotational driving force, or an actuator that generates a linear driving force and a mechanism that converts the linear driving force into a rotational driving force.

The image quality evaluation unit 124 analyzes the image of the eye E acquired by the imaging system 6 to evaluate the image quality. The image quality evaluation parameter may be, for example, an edge intensity (gradient size, differential value size) or another parameter. The image quality evaluation unit 124 analyzes the image of the eye E to calculate an image quality evaluation parameter value, and compares the calculated parameter value with a predetermined threshold value to evaluate the image quality.

The first deflection control unit 111 can control the first deflection mechanism 70 based on the evaluation result of the image quality evaluation unit 124. For example, when the image quality evaluation unit 124 determines that the parameter value is smaller than the threshold value, the first deflection control unit 111 can control the first deflection mechanism 70 so as to change the orientation of the imaging system 6.

The measurement unit 125 and the first determination unit 126 generate information for changing the orientation of the imaging system 6 to an appropriate orientation (target orientation) based on the current orientation. The information generation by the measurement unit 125 and the first determination unit 126 and the image quality evaluation by the image quality evaluation unit 124 may be combined, or only one of them may be used.

The measurement unit 125 analyzes the image of the eye E acquired by the imaging system 6 to measure the corneal curvature radius. The image analyzed by the measurement unit 125 may be, for example, one or two or more cross-sectional images acquired by the slit light, or may be a three-dimensional image constructed by scanning the slit light. The measurement unit 125 may be configured as the analysis unit 123 of the first embodiment or a part thereof.

For example, the measurement unit 125 analyzes the image of the eye E acquired by the imaging system 6 to identify an image region corresponding to the anterior surface of the cornea. This image region determination may include, for example, any of segmentation, edge detection, thresholding, filtering, labeling, and machine learning using a convolutional neural network.

The measurement unit 125 can perform measurement of parameters other than the corneal radius of curvature. The measurement parameter may be any parameter that can be used to change the orientation of the imaging system 6.

The first determination unit 126 determines the target orientation of the imaging system 6 (imaging optical axis O1) based on at least the measurement result of the measurement unit 125. The target orientation is the orientation (the orientation of the main surface and the orientation of the image plane) of the imaging system 6 such that a predetermined object plane SP (for example, the object plane SP coinciding with the eyeball optical axis Eax), a predetermined main surface of the optical system 6a, and the image plane (image plane) of the imaging element 43 satisfy the schemer condition.

The parameters usable for the calculation for determining the target orientation may include, for example, any parameters related to the slit-lamp microscope 200A, such as the relative position (for example, an imaging angle) between the illumination system 8 and the imaging system 6, the relative position (for example, a deflection angle of the illumination optical axis O2 with respect to the eye optical axis Eax) of the illumination system 8 with respect to the eye to be inspected E, the relative position of the imaging system 6 with respect to the eye to be inspected E, settings (for example, a slit width, a slit length, and the like) of elements of the illumination system 6, and settings (for example, a focal length, an aperture, and the like) of elements of the imaging system 6. The parameters usable for the calculation for determining the target orientation may include any parameters related to the eye, such as the refractive index of the cornea, the refractive index of aqueous humor, the refractive index of the lens, the corneal thickness, the anterior capsule depth, the radius of curvature of the anterior surface of the lens, the lens thickness, and the radius of curvature of the posterior surface of the lens, in addition to the corneal radius of curvature. The value of the parameter relating to the eye may be a standard value or may be a measured value of the eye E to be examined.

The calculation for determining the target orientation may be performed, for example, based on a predetermined operation equation including any of these parameters and/or based on a map or table relating to any of these parameters. The calculation for determining the target direction may include, for example, processing using ray tracing, machine learning, and the like.

The first deflection control unit 111 can control the first deflection mechanism 70 so that the orientation of the imaging system 6 (the imaging optical axis O1) is changed to the target orientation determined by the first determination unit 126.

When the information generation by the measurement unit 125 and the first determination unit 126 and the image quality evaluation by the image quality evaluation unit 124 are combined, for example, when the image quality evaluation unit 124 determines that the image quality is insufficient, the measurement unit 125 and the first determination unit 126 can determine the target orientation and change the orientation of the imaging system 6 (the imaging optical axis O1) based on the target orientation.

An example of the operation of the slit-lamp microscope 200A according to the present embodiment will be described. Fig. 8 shows an example of the operation of the slit-lamp microscope 200A. Further, it is assumed that preparation processing such as alignment has been performed.

(S1: photograph anterior eye)

First, the slit-lamp microscope 200A photographs the anterior segment of the eye E to be examined. The anterior segment photographing is performed using slit light, and includes, for example, more than one photographing.

(S2: evaluation image quality)

The image quality evaluation unit 124 analyzes the image of the anterior segment acquired in step S1, and evaluates the image quality. For example, the image quality evaluation unit 124 calculates the edge intensity of the image of the anterior segment, and compares the calculated edge intensity with a threshold value. An edge intensity of more than or equal to the threshold value is sufficient for image quality, and an edge intensity of less than the threshold value is insufficient for image quality.

(S3: sufficient picture quality

If it is determined in step S2 that the image quality is sufficient (yes in S3), the process proceeds to step S7. On the other hand, if it is determined in step S2 that the image quality is insufficient (S3: NO), the process proceeds to step S4.

(S4: calculating corneal radius of curvature)

If it is determined that the anterior segment image acquired in step S1 is insufficient in image quality (no in S3), the measurement unit 125 analyzes the image of the eye E and calculates the corneal radius of curvature. The image of the eye E may be the anterior segment image acquired in step S1, or may be another image.

An example of processing performed when the corneal curvature radius is calculated from an image other than the anterior segment image acquired in step S1 will be described. If it is determined that the image quality of the anterior segment image acquired in step S1 is insufficient (S3: no), the slit-lamp microscope 200A again takes an image of the anterior segment of the eye E. The anterior segment photographing takes at least the anterior surface of the cornea as a photographing object. The measurement unit 125 analyzes the image acquired by the anterior segment image to determine the corneal radius of curvature.

(S5: determining the target orientation of the shooting optical axis)

The first determination unit 126 determines the target orientation of the imaging system 6 (imaging optical axis O1) based on at least the corneal curvature radius calculated in step S4.

(S6: changing the orientation of the imaging System)

The first deflection control unit 111 controls the first deflection mechanism 70 so that the orientation of the imaging system 6 (the imaging optical axis O1) matches the target orientation determined in step S5.

(S7: scanning anterior eye with slit light)

In response to completion of the deflection of the imaging system 6 in step S6, the slit-lamp microscope 200A applies scanning with slit light to the anterior segment of the eye E to be examined. Thereby, for example, a clear image set from the anterior surface of the cornea to the posterior surface of the lens is obtained.

The data processing unit 120B (three-dimensional image constructing unit 121) can construct a three-dimensional image based on the image group. Thereby, for example, a three-dimensional image is obtained which highly clearly represents a three-dimensional region from the anterior surface of the cornea to the posterior surface of the lens.

The data processing unit 120B (rendering unit 122) can construct an arbitrary rendered image from the three-dimensional image. This enables the user to observe a high-quality image of a desired portion of the eye E.

The data processing unit 120B (the analysis unit 123) can apply a predetermined analysis process to at least one of the plurality of images acquired in step S7 or an image obtained by processing the at least one of the plurality of images. This enables arbitrary analysis data on the eye E to be obtained.

In this example, the completion of the deflection (S6) of the imaging system 6 is a trigger for scanning with slit light (S7), but the trigger for scanning with slit light is not limited to this. For example, scanning with slit light may be started corresponding to an instruction of the user. In response to completion of the deflection (S6) of the imaging system 6, the process returns to step S1, and the anterior segment is imaged, the image quality is evaluated, the corneal curvature radius is measured, the target orientation is determined, and the orientation of the imaging system 6 is changed again.

< third mode >

A slit-lamp microscope of a third mode is explained. Fig. 9 and 10 show a configuration example of a slit-lamp microscope 200B according to the present embodiment.

As shown in fig. 9, the slit-lamp microscope 200B includes the imaging system 6, the illumination system 8, the moving mechanism 60 functioning as the first deflecting mechanism 70, and the computer 100, as in the slit-lamp microscope 200A of the second embodiment.

The computer 100 includes a control section 110, a data processing section 120, and a data receiving section 130. The control unit 110B and the data processing unit 120C shown in fig. 10 are an example of the control unit 110 and an example of the data processing unit 120 according to the present embodiment, respectively. The control unit 110B includes a first deflection control unit 111 similar to the second embodiment. The data processing unit 120C includes not only the image quality evaluation unit 124 similar to that of the second embodiment but also the second determination unit 127. The data processing unit 120(120C) of the present embodiment may further include any of the three-dimensional image constructing unit 121, the rendering unit 122, the analyzing unit 123, the measuring unit 125, and the first determining unit 126. The matters described in the first and/or second aspect can be applied to these arbitrary elements.

As in the second embodiment, the first deflection control unit 111 can control the first deflection mechanism 70 based on the evaluation result of the image quality evaluation unit 124.

The data receiving unit 130 receives measurement data of the corneal curvature radius of the eye to be examined E acquired in advance. The data receiving unit 130 of one aspect may include at least a part of the communication unit described above, for example. In this case, the data receiving unit 130 receives measurement data of the corneal curvature radius of the eye E from an archive system such as an electronic medical record system. The data receiving unit 130 according to another embodiment includes a device (a drive device, a data reader, a data scanner, or the like) for acquiring data stored in a storage medium. In this case, the data receiving unit 130 (a drive device or the like) reads the measurement data of the corneal curvature radius of the eye E to be inspected, which is stored in a computer-readable non-transitory storage medium (a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory or the like), for example. Alternatively, the data receiving unit 130 (e.g., a data scanner) reads measurement data of the corneal curvature radius of the eye E printed on a sheet.

The second determination unit 127 determines the target orientation of the imaging system 6 (the imaging optical axis O1) based on at least the measurement data of the corneal curvature radius of the eye to be examined E acquired by the data reception unit 130. The target direction and the determination method (calculation method, etc.) thereof may be the same as those of the first determination unit 126 of the second embodiment.

When the information generation by the second determination unit 127 and the image quality evaluation by the image quality evaluation unit 124 are combined, for example, when the image quality evaluation unit 124 determines that the image quality is insufficient, the second determination unit 127 can determine a target orientation, and the orientation of the imaging system 6 can be changed based on the target orientation.

An example of the operation of the slit-lamp microscope 200B according to the present embodiment will be described. Fig. 11 shows an example of the operation of the slit-lamp microscope 200B. Further, preparation processing such as alignment has been performed.

(S11: photograph anterior eye)

First, for example, in the same manner as in step S1 of the second embodiment, the slit-lamp microscope 200B images the anterior segment of the eye E.

(S12: evaluation image quality)

For example, in the same manner as in step S2 of the second embodiment, the image quality evaluation unit 124 analyzes the image of the anterior segment acquired in step S11 to evaluate the image quality.

(S13: sufficient picture quality

If it is determined in step S12 that the image quality is sufficient (yes in S13), the process proceeds to step S17. On the other hand, if it is determined in step S12 that the image quality is insufficient (NO in S13), the process proceeds to step S14.

(S14: obtaining measurement data of corneal curvature radius)

When it is determined that the image quality of the anterior segment image acquired in step S11 is insufficient (S13: no), the data receiving unit 130 receives the measurement data of the corneal curvature radius of the eye E to be examined acquired in advance.

(S15: determining the target orientation of the shooting optical axis)

The second determination unit 127 determines the target orientation of the imaging system 6 (imaging optical axis O1) based on at least the measurement data of the corneal curvature radius acquired in step S14. This operation is performed in the same manner as in step S5 of the second embodiment, for example.

(S16: changing the orientation of the imaging System)

For example, in the same manner as in step S6 of the second embodiment, the first deflection control unit 111 controls the first deflection mechanism 70 so that the orientation of the imaging system 6 (imaging optical axis O1) matches the target orientation determined in step S15.

(S17: scanning anterior eye with slit light)

In response to completion of the deflection of the imaging system 6 in step S16, the slit-lamp microscope 200B applies scanning with slit light to the anterior segment of the eye E to be examined, for example, in the same manner as in step S7 of the second embodiment. Thereby, for example, a clear image set from the anterior surface of the cornea to the posterior surface of the lens is obtained.

The data processing unit 120C (three-dimensional image constructing unit 121) can construct a three-dimensional image based on the image group. Thereby, for example, a three-dimensional image is obtained which highly clearly represents a three-dimensional region from the anterior surface of the cornea to the posterior surface of the lens.

The data processing unit 120C (rendering unit 122) can construct an arbitrary rendered image based on the three-dimensional image. This enables the user to observe a high-quality image of a desired portion of the eye E.

The data processing unit 120C (the analysis unit 123) can apply a predetermined analysis process to at least one of the plurality of images acquired in step S17 or an image obtained by processing the at least one of the plurality of images. This enables arbitrary analysis data on the eye E to be obtained.

For example, when the image quality of the image of the eye E acquired in step S17 is insufficient, the data processing unit 120C (measurement unit 125) can measure the corneal curvature radius of the eye E by analyzing at least one of the plurality of images acquired in step S17 or an image obtained by processing the at least one image, or by analyzing an image acquired by newly capturing an image after step S17 or an image obtained by processing the image. Thus, the data processing unit 120C (first determination unit 126) can determine a new target orientation of the imaging system 6 (imaging optical axis O1) based on at least the acquired measurement data of the corneal curvature radius. The first deflection control unit 111 can control the first deflection mechanism 70 so that the orientation of the imaging system 6 (the imaging optical axis O1) is changed to the new target orientation. This series of processing is effective, for example, when there is a substantial difference between measurement data of a corneal radius of curvature acquired in the past and the current corneal radius of curvature.

In this example, the completion of the deflection (S16) of the imaging system 6 is a trigger for scanning with slit light (S17), but the trigger for scanning with slit light is not limited to this. For example, scanning with slit light may be started corresponding to an instruction of the user. In response to completion of the deviation (S16) of the imaging system 6, the process may return to step S11. At this time, imaging of the anterior segment, evaluation of the image quality, change of the orientation of the imaging system 6, and the like may be performed again. Alternatively, as in the second embodiment, the anterior segment may be imaged, the image quality may be evaluated, the corneal curvature radius may be measured, the target orientation may be determined, the orientation of the imaging system 6 may be changed, and the like.

< fourth mode >

A slit-lamp microscope of a fourth mode will be explained. Fig. 12 and 13 show a configuration example of a slit-lamp microscope 200C according to the present embodiment.

As shown in fig. 12, the slit-lamp microscope 200C includes the imaging system 6, the illumination system 8, and the computer 100, as in the slit-lamp microscope 200 of the first embodiment. The slit-lamp microscope 200C further includes a moving mechanism 60A including a second deflecting mechanism 61.

The computer 100 includes a control section 110 and a data processing section 120. The control unit 110C and the data processing unit 120D shown in fig. 13 are an example of the control unit 110 and an example of the data processing unit 120 according to the present embodiment, respectively. The control section 110C includes a second deviation control section 112. The data processing unit 120D includes an image quality evaluation unit 124, a measurement unit 125, and a third determination unit 128. The data processing unit 120(120D) of the present embodiment may further include any of the three-dimensional image constructing unit 121, the rendering unit 122, the analyzing unit 123, the first determining unit 126, and the second determining unit 127. In addition, the slit-lamp microscope 200C may include the first deflection mechanism 70, and may further include the first deflection control section 111.

The second deflecting mechanism 61 changes the orientation of the optical axis (illumination optical axis O2) of the illumination system 8. That is, the second deflecting mechanism 61 changes the orientation of the illumination system 8, in other words, rotates the illumination system 8. For example, the second deflecting mechanism 61 rotates the illumination optical axis O2 around the intersection of the cornea of the eye E and the illumination optical axis O2 in the state where the above-described alignment is performed (see fig. 12). The second deflection mechanism 61 operates under the control of the second deflection control unit 112. The second deviation mechanism 61 includes, for example, an actuator that generates a rotational driving force, or an actuator that generates a linear driving force and a mechanism that converts the linear driving force into a rotational driving force.

In the present embodiment, the second deflecting mechanism 61 belongs to the moving mechanism 60A. The moving mechanism 60A is the same element as the moving mechanism 60 of the first embodiment, and includes at least a mechanism (second deflecting mechanism 61) for rotating the illumination optical axis O2.

As in the second embodiment, the image quality evaluation unit 124 analyzes the image of the eye E acquired by the imaging system 6 and evaluates the image quality. The second deviation control unit 112 can control the second deviation mechanism 61 based on the evaluation result of the image quality evaluation unit 124. For example, when the image quality evaluation unit 124 determines that the parameter value is smaller than the threshold value, the second deflection control unit 112 can control the second deflection mechanism 61 so as to change the orientation of the illumination optical axis O2.

The measurement unit 125 and the third determination unit 128 generate information for changing the orientation of the illumination optical axis O2 to an appropriate orientation (target orientation) in accordance with the current orientation. The information generation by the measurement unit 125 and the third determination unit 128 and the image quality evaluation by the image quality evaluation unit 124 may be combined, or only one of them may be performed.

As in the second embodiment, the measurement unit 125 analyzes the image of the eye E acquired by the imaging system 6, and measures the corneal curvature radius. The measurement unit 125 can perform measurement of parameters other than the corneal radius of curvature. The measurement parameter may be any parameter that can be used to change the orientation of the illumination optical axis O2.

The third determination unit 128 determines the target orientation of the illumination optical axis O2 based on at least the measurement result of the measurement unit 125. The target orientation is an orientation of the illumination optical axis O2 (an orientation of the object plane SP) such that the object plane SP, a predetermined principal surface of the optical system 6a, and an imaging plane (a predetermined image plane) of the imaging element 43 satisfy the schemer condition.

The parameters usable for calculation for determining the target orientation may include, for example, any parameters related to the slit-lamp microscope 200C, such as the relative position (for example, an imaging angle) between the illumination system 8 and the imaging system 6, the relative position (for example, a deflection angle of the illumination optical axis O2 with respect to the eye optical axis Eax) of the illumination system 8 with respect to the eye E to be inspected, the relative position of the imaging system 6 with respect to the eye E to be inspected, settings (for example, a slit width, a slit length, and the like) of elements of the illumination system 6, and settings (for example, a focal length, an aperture, and the like) of elements of the imaging system 6. The parameters usable for calculation for determining the target orientation may include, in addition to the corneal radius of curvature, any parameters relating to the eye, such as the refractive index of the cornea, the refractive index of aqueous humor, the refractive index of the lens, the corneal thickness, the anterior capsule depth, the radius of curvature of the anterior surface of the lens, the lens thickness, and the radius of curvature of the posterior surface of the lens. The value of the parameter relating to the eye may be a standard value or may be a measured value of the eye E to be examined.

The calculation for determining the target orientation may be performed, for example, based on a predetermined operation formula including any of these parameters and/or based on a map or table relating to any of these parameters. The calculation for determining the target direction may include, for example, processing using ray tracing, machine learning, and the like.

The second deflection control unit 112 can control the second deflection mechanism 61 so that the orientation of the illumination optical axis O2 is changed to the target orientation (the rotation of the angle Δ θ of the illumination optical axis O2 shown in fig. 12) determined by the third determination unit 128. Thereby, the object plane SP satisfying the schemer condition in the relationship between the main surface of the optical system 6a and the imaging plane (image plane) of the imaging element 43 can be realized.

When the information generation by the measurement unit 125 and the third determination unit 128 and the image quality evaluation by the image quality evaluation unit 124 are combined, for example, when the image quality evaluation unit 124 determines that the image quality is insufficient, the measurement unit 125 and the third determination unit 128 determine a target orientation, and the orientation of the illumination optical axis O2 can be changed based on the target orientation.

An example of the operation of the slit-lamp microscope 200C according to the present embodiment will be described. Fig. 14 shows an example of the operation of the slit-lamp microscope 200C. Further, preparation processing such as alignment has been performed.

(S21: photograph anterior eye)

First, for example, in the same manner as in step S1 of the second embodiment, the slit-lamp microscope 200C images the anterior segment of the eye E.

(S22: evaluation image quality)

The image quality evaluation unit 124 analyzes the image of the anterior segment acquired in step S21 and evaluates the image quality, for example, in the same manner as in step S2 of the second embodiment.

(S23: sufficient picture quality

If it is determined in step S22 that the image quality is sufficient (yes in S23), the process proceeds to step S27. On the other hand, if it is determined in step S22 that the image quality is insufficient (NO in S23), the process proceeds to step S24.

(S24: calculating corneal radius of curvature)

If it is determined that the anterior segment image acquired in step S21 is insufficient in image quality (no in S23), the measurement unit 125 analyzes the image of the eye E to be examined and measures the corneal curvature radius, for example, in the same manner as in step S4 of the second embodiment.

(S25: determining the target orientation of the illumination optical axis)

The third determination unit 128 determines the target orientation of the illumination optical axis O2 based on at least the corneal curvature radius calculated in step S24.

(S26: changing the orientation of the lighting system)

The second deflection control unit 112 controls the second deflection mechanism 61 to change the orientation of the illumination system 8 so that the orientation of the illumination optical axis O2 matches the target orientation determined in step S25.

(S27: scanning anterior eye with slit light)

In response to completion of the deflection of the illumination system 8 at step S26, the slit-lamp microscope 200C applies scanning with slit light to the anterior segment of the eye E to be examined. Thereby, for example, a clear image set from the anterior surface of the cornea to the posterior surface of the lens is obtained.

The data processing unit 120D (three-dimensional image constructing unit 121) can construct a three-dimensional image based on the image group. Thereby, for example, a three-dimensional image is obtained which highly clearly represents a three-dimensional region from the anterior surface of the cornea to the posterior surface of the lens.

The data processing unit 120D (rendering unit 122) can construct an arbitrary rendered image from the three-dimensional image. This enables the user to observe a high-quality image of a desired portion of the eye E.

The data processing unit 120D (the analysis unit 123) can apply a predetermined analysis process to at least one of the plurality of images acquired in step S27 or an image obtained by processing the at least one of the plurality of images. This enables arbitrary analysis data on the eye E to be obtained.

In this example, completion of the deflection (S26) of the illumination system 8 is a trigger of the scanning by the slit light (S27), but the trigger of the scanning by the slit light is not limited to this. For example, scanning with slit light may be started corresponding to an instruction of a user. In response to completion of the deflection of the illumination system 8 (S26), the process may return to step S21, and the anterior segment image may be captured, the image quality may be evaluated, the corneal curvature radius may be measured, the target orientation may be determined, the orientation of the illumination system 8 may be changed, and the like.

< fifth mode >

A slit-lamp microscope of a fifth mode is explained. Fig. 15 and 16 show a configuration example of a slit-lamp microscope 200D according to the present embodiment.

As shown in fig. 15, the slit-lamp microscope 200D includes the imaging system 6, the illumination system 8, the moving mechanism 60A including the second deflecting mechanism 61, and the computer 100, as in the slit-lamp microscope 200C of the fourth embodiment.

The computer 100 includes a control section 110, a data processing section 120, and a data receiving section 130. The control unit 110C and the data processing unit 120E shown in fig. 16 are an example of the control unit 110 and an example of the data processing unit 120 according to the present embodiment, respectively. The control section 110C includes a second deviation control section 112 similar to the fourth embodiment. The data processing unit 120E includes not only the image quality evaluation unit 124 similar to that of the second embodiment but also the fourth determination unit 129. The data processing unit 120(120E) of the present embodiment may further include any of the three-dimensional image constructing unit 121, the rendering unit 122, the analyzing unit 123, the measuring unit 125, the first determining unit 126, the second determining unit 127, and the third determining unit 128. In addition, the slit-lamp microscope 200D may include the first deflection mechanism 70, and may further include the first deflection control section 111. The data receiving unit 130 receives measurement data of the corneal curvature radius of the eye E to be examined acquired in advance, as in the third embodiment.

The fourth determination unit 129 determines the target orientation of the illumination optical axis O2 based on at least the measurement data of the corneal curvature radius of the eye to be examined E acquired by the data reception unit 130. The target direction and the determination method (calculation method, etc.) thereof may be the same as those of the third determination unit 128 of the fourth embodiment.

When the information generation by the fourth determination unit 129 and the image quality evaluation by the image quality evaluation unit 124 are combined, for example, when the image quality evaluation unit 124 determines that the image quality is insufficient, the fourth determination unit 129 can determine a target orientation and change the orientation of the illumination system 8 based on the target orientation.

An operation example of the slit-lamp microscope 200D of the present embodiment will be described. Fig. 17 shows an example of the operation of the slit-lamp microscope 200D. Further, preparation processing such as alignment has been performed.

(S31: photograph anterior eye)

First, for example, in the same manner as in step S1 of the second embodiment, the slit-lamp microscope 200D images the anterior segment of the eye E.

(S32: evaluation image quality)

For example, in the same manner as in step S2 of the second embodiment, the image quality evaluation unit 124 analyzes the image of the anterior segment acquired in step S31, and evaluates the image quality thereof.

(S33: sufficient picture quality

If it is determined in step S32 that the image quality is sufficient (yes in S33), the process proceeds to step S37. On the other hand, if it is determined in step S32 that the image quality is insufficient (NO in S33), the process proceeds to step S34.

(S34: obtaining measurement data of corneal curvature radius)

When it is determined that the image quality of the anterior segment image acquired in step S31 is insufficient (S33: no), the data receiving unit 130 receives the measurement data of the corneal curvature radius of the eye E to be examined, which has been acquired in advance.

(S35: determining the target orientation of the illumination optical axis)

The fourth determination unit 129 determines the target orientation of the illumination optical axis O2 based on at least the measurement data of the corneal curvature radius acquired in step S34. This operation is performed in the same manner as in step S25 of the fourth embodiment, for example.

(S36: changing the orientation of the lighting system)

For example, in the same manner as in step S26 of the fourth embodiment, the second deflection control unit 112 controls the second deflection mechanism 61 to change the orientation of the illumination system 8 so that the orientation of the illumination optical axis O2 matches the target orientation determined in step S35.

(S37: scanning anterior eye with slit light)

In response to completion of the deflection of the illumination system 8 in step S36, the slit-lamp microscope 200D applies scanning with slit light to the anterior segment of the eye E to be examined, for example, in the same manner as in step S7 of the second embodiment. Thereby, for example, a clear image set from the anterior surface of the cornea to the posterior surface of the lens is obtained.

The data processing unit 120E (three-dimensional image constructing unit 121) can construct a three-dimensional image based on the image group. Thereby, for example, a three-dimensional image is obtained which highly clearly represents a three-dimensional region from the anterior surface of the cornea to the posterior surface of the lens.

The data processing unit 120E (rendering unit 122) can construct an arbitrary rendered image from the three-dimensional image. This enables the user to observe a high-quality image of a desired portion of the eye E.

The data processing unit 120E (the analysis unit 123) can apply a predetermined analysis process to at least one of the plurality of images acquired in step S37 or an image obtained by processing the at least one of the plurality of images. This enables arbitrary analysis data on the eye E to be obtained.

For example, in the case where the image quality of the image of the eye E acquired in step S37 is insufficient, the data processing unit 120E (measurement unit 125) can measure the corneal curvature radius of the eye E by analyzing at least one of the plurality of images acquired in step S37 or an image obtained by processing the at least one image, or by analyzing an image acquired by new imaging performed after step S37 or an image obtained by processing the image. Thus, the data processing unit 120E (third determination unit 128) can determine a new target orientation of the illumination optical axis O2 based on at least the acquired measurement data of the corneal curvature radius. Further, the second deflection control unit 112 can control the second deflection mechanism 61 to deflect the illumination system 8 so that the orientation of the illumination optical axis O2 is changed to the new target orientation. This series of processing is effective, for example, when there is a substantial difference between measurement data of a corneal radius of curvature acquired in the past and the current corneal radius of curvature.

In this example, completion of the deflection (S36) of the illumination system 8 becomes a trigger of the scanning with the slit light (S37), but the trigger of the scanning with the slit light is not limited thereto. For example, scanning with slit light may be started corresponding to an instruction of a user. In addition, it is possible to return to step S31 corresponding to the completion of the biasing (S36) of the lighting system 8. At this time, the photographing of the anterior segment, the evaluation of the image quality, the change of the orientation of the illumination system 8, and the like may be performed again. Alternatively, as in the fourth embodiment, the photographing of the anterior segment, the evaluation of the image quality, the measurement of the corneal curvature radius, the determination of the target orientation, the change of the orientation of the illumination system 8, and the like may be performed again.

< Effect >

The effect of the slit-lamp microscope of the embodiment is explained.

Several versions of a slit-lamp microscope include an illumination system and a camera system. The illumination system projects slit light to the anterior eye of the eye to be examined. The imaging system includes an optical system that guides light from the anterior segment on which the slit light is projected, and an imaging element that receives the light guided by the optical system with an imaging plane. Further, the object plane including the focal point of the illumination system displaced by the refractive index of the tissue of the anterior segment, the main surface of the optical system, and the imaging plane are arranged so as to satisfy the schemer condition.

For example, the slit-lamp microscope 200 includes an illumination system 8 and a photographing system 6. The illumination system 8 projects slit light to the anterior eye of the eye to be inspected E. The imaging system 6 includes an optical system 6a that guides light from the anterior segment on which the slit light is projected, and an imaging element 43 that receives the light guided by the optical system 6a with an imaging plane. Further, the object plane SP including the focal point of the illumination system 8 displaced by the refractive index of the tissue of the anterior segment, the main surface of the optical system 6a, and the imaging plane of the imaging element 43 are arranged so as to satisfy the schemer condition.

According to such a slit-lamp microscope, the object plane, the main surface of the optical system, and the imaging plane satisfy the schemer condition in consideration of the displacement of the focal point of the illumination system due to the refractive index of the tissue of the anterior segment, and therefore, an in-focus image can be acquired for the region of the eye to be examined corresponding to the object plane.

In some embodiments, the deflection angle of the object plane due to the refractive index of the tissue of the anterior segment may be in a range of 3 to 13 degrees, and further in a range of 6 to 10 degrees. In some embodiments, the deviation angle of the object plane due to the refractive index of the tissue of the anterior segment may be determined based on at least a value of the corneal radius of curvature in a predetermined model eye and a value of the refractive index of the eye.

In several aspects, the slit-lamp microscope may further include a moving mechanism that moves the illumination system and the photographing system. The imaging system may be configured to acquire a plurality of images of the anterior segment by repeatedly performing imaging in parallel with the movement of the illumination system and the imaging system by the moving mechanism.

For example, the slit-lamp microscope 200 includes a moving mechanism 60 that moves the illumination system 8 and the photographing system 6. The imaging system 6 can acquire a plurality of images of the anterior segment by repeatedly performing imaging in parallel with the movement of the illumination system 8 and the imaging system 6 by the moving mechanism 60. The imaging system may repeat the imaging in parallel with the movement of the lighting system 8 and the imaging system 6. In one example, imaging can be repeated in parallel with the continuous movement of the illumination system 8 and the imaging system 6. In another example, the movement and the imaging of the lighting system 8 and the imaging system 6 can be performed alternately.

According to such a slit-lamp microscope, since imaging can be repeated in parallel with the movement of the object plane, an in-focus image can be acquired for a region of the eye to be inspected corresponding to the movement range of the object plane.

In several aspects, the slit-lamp microscope may further include a three-dimensional image constructing section that constructs a three-dimensional image based on a plurality of images of the anterior segment acquired by repeated photographing in parallel with the movement of the illumination system and the photographing system.

For example, the slit-lamp microscope 200 can construct a three-dimensional image from a plurality of images of the anterior segment acquired by repeated imaging in parallel with the movement of the illumination system 8 and the imaging system 6 by the three-dimensional image constructing unit 121.

According to such a slit-lamp microscope, a focused three-dimensional image can be acquired for a three-dimensional region of the eye to be inspected corresponding to the movement range of the object plane.

In several ways, the slit-lamp microscope may further include a rendering section that renders the three-dimensional image constructed by the three-dimensional image construction section to construct a rendered image.

For example, the slit-lamp microscope 200 can construct a rendered image by rendering the three-dimensional image constructed by the three-dimensional image constructing section 121 by the rendering section 122.

According to such a slit-lamp microscope, a desired rendered image can be constructed from a focused three-dimensional image for a three-dimensional region of an eye to be inspected, and observation can be performed.

In some aspects, the slit-lamp microscope may further include an analysis unit that applies predetermined analysis processing to at least one of a plurality of images of the anterior segment acquired by repeated imaging in parallel with movement of the illumination system and the imaging system, or an image (a three-dimensional image, a rendered image, another processed image, or the like) obtained by processing the at least one image.

For example, the slit-lamp microscope 200 can apply a predetermined analysis process to at least one of a plurality of images of the anterior segment acquired by repeatedly capturing images in parallel with the movement of the illumination system and the imaging system or an image obtained by processing the at least one image by the analysis unit 123.

According to such a slit-lamp microscope, since a high-quality image focused on an object plane can be analyzed, highly accurate and highly precise analysis data can be acquired.

In some aspects, the slit-lamp microscope may further include a first deflecting mechanism that changes an orientation of an optical axis of the imaging system.

For example, the slit-lamp microscope 200A (or 200B) includes the first deflecting mechanism 70 that changes the orientation of the optical axis (imaging optical axis) O1 of the imaging system 6.

According to such a slit-lamp microscope, the orientation of the optical axis of the imaging system 6 can be adjusted so that the object plane, the principal surface of the optical system, and the imaging plane of the imaging element satisfy the schemer condition, according to individual differences in the tissue shape and characteristics of the eye to be examined.

In some aspects, the first deflecting unit may be configured to rotate the imaging system substantially around an intersection point of the object plane and the optical axis of the imaging system.

For example, the first deflecting mechanism 70 of the slit-lamp microscope 200A (or 200B) is configured to rotate the imaging system 6 substantially around a virtual rotation axis Spa located at an intersection of the object plane SP and an optical axis (imaging optical axis) O1 of the imaging system 6.

According to such a slit-lamp microscope, the orientation of the imaging system for satisfying the schemer condition can be adjusted without changing the position of the illumination system with respect to the cornea of the eye to be examined.

In some aspects, the slit-lamp microscope may further include an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system to evaluate the image quality, and a first deflection control unit that controls the first deflection mechanism based on at least an evaluation result of the image quality evaluation unit.

For example, the slit-lamp microscope 200A (or 200B) further includes an image quality evaluation unit 124 that analyzes the image of the eye E acquired by the imaging system 6 to evaluate the image quality, and a first deflection control unit 111 that controls the first deflection mechanism 70 based on at least the evaluation result of the image quality evaluation unit 124.

According to such a slit-lamp microscope, the orientation of the imaging system for satisfying the schemer condition can be adjusted according to the image quality of the image actually acquired. For example, an image of low quality is obtained in a state where the lamb condition is not satisfied. In such a case, according to the present embodiment, the adjustment of the orientation of the imaging system can be automatically performed.

In some aspects, the slit-lamp microscope may further include a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system to measure a corneal curvature radius, and a first determination unit that determines a target orientation of an optical axis of the imaging system based on at least a measurement result of the measurement unit. In the slit-lamp microscope of this aspect, the orientation of the imaging system may be changed to the target orientation by the first deflecting mechanism.

For example, the slit-lamp microscope 200A further includes a measurement unit 125 that analyzes the image of the eye E acquired by the imaging system 6 to measure the corneal curvature radius, and a first determination unit 126 that determines the target orientation of the optical axis (imaging optical axis) O1 of the imaging system 6 based on at least the measurement result of the measurement unit 125. The slit-lamp microscope 200A can change the orientation of the imaging system 6 to the target orientation determined by the first determination unit 126 by the first deflection mechanism 70.

According to such a slit-lamp microscope, the corneal curvature radius of the eye to be examined can be actually measured, the target orientation of the optical axis of the imaging system is determined based on the obtained data, and the orientation of the imaging system can be adjusted so as to satisfy the schemer condition. This makes it possible to adjust the orientation of the imaging system with high accuracy and high precision.

In some aspects, the slit-lamp microscope may further include a data receiving unit that receives measurement data of a corneal curvature radius of the eye to be examined acquired in advance, and a second determining unit that determines a target orientation of an optical axis of the imaging system based on at least the measurement data. In the slit-lamp microscope of this aspect, the orientation of the optical axis of the imaging system may be changed to the target orientation by the first deflecting mechanism.

For example, the slit-lamp microscope 200B further includes a data receiving unit 130 that receives measurement data of the corneal curvature radius of the eye to be examined E acquired in advance, and a second determining unit 127 that determines the target orientation of the optical axis (imaging optical axis) O1 of the imaging system 6 based on at least the measurement data. The slit-lamp microscope 200B can change the orientation of the optical axis (imaging optical axis) O1 of the imaging system 6 to the target orientation determined by the second determination unit 127 by the first deflection mechanism 70.

According to such a slit-lamp microscope, the target orientation of the optical axis of the imaging system can be determined based on the actual measurement data of the corneal curvature radius of the eye to be examined, and the orientation of the imaging system can be adjusted to satisfy the schemer condition. This makes it possible to adjust the orientation of the imaging system with high accuracy and high precision.

In some aspects, the imaging system may be configured to start imaging of the anterior segment in accordance with a change in the orientation of the optical axis of the imaging system by the first deflecting mechanism.

For example, the slit-lamp microscope 200A (or 200B) can start imaging the anterior segment by the illumination system 8 and the imaging system 6 in accordance with the first deflecting mechanism 70 changing the orientation of the optical axis (imaging optical axis) O1 of the imaging system 6.

According to such a slit-lamp microscope, it is possible to automatically perform anterior segment imaging after the orientation of the imaging system is adjusted, and it is possible to avoid a situation where anterior segment imaging is performed in a state where the schem condition is not satisfied.

In some aspects, the slit-lamp microscope may further include a second deflection mechanism that changes an orientation of an optical axis of the illumination system.

For example, the slit-lamp microscope 200C (or 200D) further includes a second deflecting mechanism 61 that changes the orientation of the optical axis (illumination optical axis) O2 of the illumination system 8.

According to such a slit-lamp microscope, the orientation of the illumination system can be adjusted so that the object plane, the principal surface of the optical system, and the imaging plane of the imaging element satisfy the schemer condition, in accordance with individual differences in the tissue shape and characteristics of the eye to be examined.

In some aspects, the second deflecting unit may be configured to rotate the illumination optical axis around an intersection of the cornea of the eye to be examined and the illumination optical axis.

For example, the second deflecting mechanism 61 of the slit-lamp microscope 200C (or 200D) is configured to rotate the illumination optical axis O2 (illumination system 8) about an intersection of the cornea of the eye E and the illumination optical axis O2.

According to such a slit-lamp microscope, the orientation of the illumination system can be adjusted to satisfy the schemer condition without changing the position of the imaging system with respect to the cornea of the eye to be examined.

In some aspects, the slit-lamp microscope may further include an image quality evaluation unit that analyzes the image of the eye to be inspected acquired by the imaging system and evaluates image quality, and a second deflection control unit that controls the second deflection mechanism based on at least an evaluation result of the image quality evaluation unit.

For example, the slit-lamp microscope 200C (or 200D) further includes an image quality evaluation unit 124 that analyzes the image of the eye E acquired by the imaging system 6 to evaluate the image quality, and a second deflection control unit 112 that controls the second deflection mechanism 61 based on at least the evaluation result of the image quality evaluation unit 124.

According to such a slit-lamp microscope, the orientation of the illumination system for satisfying the schemer condition can be adjusted in accordance with the image quality of the image actually acquired. For example, an image of low quality is obtained in a state where the lamb condition is not satisfied. In such a case, according to the present embodiment, the adjustment of the orientation of the lighting system can be automatically performed.

In some aspects, the slit-lamp microscope may further include a measurement unit that analyzes the image of the eye to be examined acquired by the imaging system to measure a corneal curvature radius, and a third determination unit that determines a target orientation of the optical axis of the illumination system based on at least a measurement result of the measurement unit. In the slit-lamp microscope of this aspect, the second deflecting mechanism may be configured to change the orientation of the illumination optical axis to the target orientation.

For example, the slit-lamp microscope 200C further includes a measurement unit 125 that analyzes the image of the eye E acquired by the imaging system 6 to measure the corneal curvature radius, and a third determination unit 128 that determines the target orientation of the illumination optical axis O2 based on at least the measurement result of the measurement unit 125. The slit-lamp microscope 200C can change the orientation of the illumination optical axis O2 to the target orientation by the second deflecting mechanism 61.

According to such a slit-lamp microscope, the corneal curvature radius of the eye to be examined can be actually measured, the target orientation of the illumination optical axis is determined based on the obtained data, and the orientation of the illumination system for satisfying the schemer condition can be adjusted. This makes it possible to adjust the orientation of the illumination system with high accuracy and high precision.

In some aspects, the slit-lamp microscope may further include a data receiving unit that receives measurement data of a corneal curvature radius of the eye to be examined acquired in advance, and a fourth determining unit that determines a target orientation of the illumination optical axis based on at least the measurement data. In the slit-lamp microscope of this aspect, the second deflecting mechanism may be configured to change the orientation of the illumination optical axis to the target orientation.

For example, the slit-lamp microscope 200D further includes a data receiving unit 130 that receives measurement data of the corneal curvature radius of the eye to be examined E acquired in advance, and a fourth determining unit 129 that determines the target orientation of the illumination optical axis O2 based on at least the measurement data. Then, the slit-lamp microscope 200D can change the orientation of the illumination optical axis O2 to the target orientation by the second deflecting mechanism 61.

According to such a slit-lamp microscope, the target orientation of the illumination optical axis can be determined from the actual measurement data of the corneal curvature radius of the eye to be examined, and the orientation of the illumination system can be adjusted so as to satisfy the schemer condition. This makes it possible to adjust the illumination system with high accuracy and high precision.

In some aspects, the imaging system may be configured to start imaging of the anterior segment in accordance with the second deflecting mechanism changing the orientation of the illumination system.

For example, the slit-lamp microscope 200C (or 200D) can start imaging of the anterior segment by the illumination system and the imaging system in accordance with the change in the orientation of the illumination system by the second deflection mechanism.

According to such a slit-lamp microscope, since the anterior segment can be automatically imaged after the orientation of the illumination system is adjusted, it is possible to avoid the situation where the anterior segment is imaged in a state where the schem condition is not satisfied.

< sixth mode >

In the first to fifth aspects, it is assumed that the directions (incident angles) of all principal rays incident on the imaging plane of the imaging element are equal. However, considering that the imaging plane is eccentric and inclined with respect to the optical axis of the optical system, strictly speaking, the incident angles of the principal rays reaching different positions on the imaging plane are different. In this embodiment, several exemplary optical system configurations are provided that take into account such differences in incident angles.

First, an optical simulation performed by the present inventors is explained. As shown in fig. 18, three positions 300a, 300b, 300c on the imaging plane of the imaging element 300 are considered as an example. Further, reference numeral 301 denotes an optical system optical axis passing through the center of the diaphragm (or, a principal ray propagating along the optical system optical axis). The angle of view of an image obtained by the image pickup element 300 is defined with reference to the optical system optical axis 301. Position 300b corresponds to the center of the viewing angle. The chief ray incidence angle at the position 300b is set to 38.11 degrees. At this time, the incident angle of the principal ray at the position 300a (lower end position of the angle of view) was 40.09 degrees, and the incident angle of the principal ray at the position 300c (upper end position of the angle of view) was 36.06 degrees. Thus, the error of the incident angle of the principal ray in the viewing angle is found to be about 4 degrees at the maximum.

In the first to fifth embodiments, typically, the chief ray incident angle 38.11 degrees at the position 300b corresponding to the center of the viewing angle is applied to the entire viewing angle. In contrast, in the present embodiment, different incident angles of principal rays are applied to different positions within the viewing angle. That is, in the first to fifth aspects, the incident angles of the principal rays are assumed to be the same, but in this aspect, it is considered that the incident angles of the principal rays are different.

The results of such a simulation are shown. The positions on the imaging plane corresponding to the corneal vertex, the anterior lens capsule, the lens core, and the posterior lens capsule are referred to as a corneal corresponding position, an anterior capsule corresponding position, a core corresponding position, and a posterior capsule corresponding position.

The distance between the cornea corresponding position and the front-capsule corresponding position was set to 2.55mm, the distance between the cornea corresponding position and the core corresponding position was set to 4.91mm, and the distance between the cornea corresponding position and the rear-capsule corresponding position was set to 7.14 mm.

In addition, the design value of the incident angle of the principal ray at the position corresponding to the cornea was set to 39.11 degrees, and 39.11 degrees was obtained as the correction value thereof. The design value of the incident angle of the principal ray at the position corresponding to the front capsule was set to 38.61 degrees, and 34.63 degrees was obtained as a correction value thereof. The design value of the incident angle of the principal ray at the verification-responsive position was set to 38.11 degrees, and 31.64 degrees was obtained as a correction value thereof. The design value of the incident angle of the principal ray at the corresponding position of the rear capsule was set to 37.61 degrees, and 29.24 degrees was obtained as a correction value thereof.

The average of these correction values is 33.65 degrees. In this embodiment, the optical system can be designed such that the incident angle of the principal ray to the imaging plane becomes 33.65 degrees on the average.

An example of calculation for obtaining a correction value of the incident angle of the principal ray will be described below. Reference numeral 400 in fig. 19 denotes an eyeball (eyeball model). The eyeball 400 is configured such that the corneal vertex 401 is located at the origin of the xy coordinate system and the eyeball optical axis coincides with the y axis. Reference numeral 410 denotes an image pickup plane (air-converted image plane) of the image pickup element converted into air. The air converted image plane 410 passes through the corneal vertex 401. Reference numeral 420 denotes a principal ray. The imaging position of the ray including the principal ray 420 is denoted by reference numeral 421. In addition, the angle formed by the principal ray 420 with respect to the y-axis is θ₁The angle of the air reduced image plane 410 with respect to the y-axis is represented by θ₂Then the angle of incidence θ of the chief ray 420 with respect to the air reduced image plane 410 is represented as θ＝θ₁+θ₂。

The correction value of the incident angle of the principal ray is obtained by obtaining a condition for matching the optical axis of the image plane converted in the eyeball with the eyeball optical axis (typically, the illumination optical axis) in the model shown in fig. 19. As can be seen from fig. 19, the optical axis of the image plane converted in the eyeball coincides with the eyeball optical axis, and is arranged on the y-axis, that is, the displacement Δ in the x direction of the imaging position 421 on the y-axis is zero (displacement Δ is close to zero: Δ → 0).

For an arbitrary incident angle of the principal ray (an arbitrary position on the imaging plane), θ (θ ═ θ)₁+θ₂) The displacement Δ can be obtained by, for example, the following four calculation steps.

(1) Setting theta₁And theta₂. Further, if θ is set₁And theta₂One, then the other is uniquely determined. For example, if θ is set, since θ is given₁Then theta₂＝θ-θ₁。

(2) The intersection of the principal ray 420 and the air converted image plane 410 is determined without considering refraction by the eyeball 400. That is, the design position of the imaging position 421 is found.

(3) The position where the principal ray 420 is incident on the eyeball 400 (cornea) is determined. In other words, the intersection point between the surface of the eyeball 400 and the principal ray 420 is obtained. Then, the incident angle and the output angle of the principal ray 420 at the intersection are determined. That is, the refraction point and the refraction angle of the principal ray 420 are obtained.

(4) The distance in the x direction (the above-described displacement Δ) between the (intra-ocular) imaging position 421 and the eyeball optical axis (y axis) is obtained in consideration of the refraction by the eyeball 400 (cornea).

While changing theta₁And theta₂The four operation steps (1) to (4) are repeated until the magnitude of the displacement Δ (the absolute value of the displacement Δ) becomes smaller than the predetermined threshold. Here, the threshold is set to, for example, 0.0001. By repeating such operations, the principal light beam is obtained when the displacement Δ is sufficiently small, that is, when the image plane optical axis substantially coincides with the eyeball optical axis (illumination optical axis)Correction value of the angle of incidence of the line.

As an example of such an operation, an operation for a core-corresponding position is described below. In addition, θ is 38.11107 degrees at the check corresponding position. The radius of curvature of the cornea of the eyeball 400 is set to r 7.72mm, and the eyeball refractive index is set to n 1.337.

(1) First, θ is set₁And theta₂. Assume that is set to θ₂5 degrees. At this time, θ₁＝θ-θ₂38.11107-5 degrees 33.11107 degrees.

(2) Next, the intersection of the principal ray 420 and the air-converted image plane 410 is determined by neglecting refraction by the eyeball 400. For this purpose, first, an equation representing the air converted image plane 410 and an equation representing the principal ray 420 are obtained. Since the angle of the air reduced image plane 410 with the x-axis is 90-theta₂Since the formula representing the air-converted image plane 410 is, y is (tan (90- θ))₂))x＝(tan(90-5))x＝11.43005x。

On the other hand, the angle formed by the principal ray 420 and the x-axis is 90+ θ₁Degree, the inclination of the chief ray 420 for the corresponding position of the nucleus is tan (90+ θ)₁)＝tan(90+33.11107)＝-1.53335。

Y slice (y) of the principal ray 420_s) The calculation of (2) is performed with reference to design data of the optical system. By means of I_mThe distance between the intersection of the principal ray 420 and the air converted image plane 410 and the origin of the xy coordinate system (corneal vertex 401) is shown. For example, the distance I to the corresponding position of the cornea_m0.00000mm, distance I to the corresponding position of the front bladder_m1.81661mm, distance I for the corresponding position of the nucleus_m3.68280mm, distance I to the corresponding location of the rear capsule_m5.57288 mm.

Here, refer to fig. 20. Fig. 20 shows an origin of an xy coordinate system (cornea vertex 401), an intersection of a principal ray 420 and an air converted image plane 410, and a y slice ((x, y) — (0, y)_s) Point of) as a triangle of three vertices. If the sine theorem is applied to the triangle, the value y of the y slice for the corresponding position of the kernel_sCalculated as follows: y is_s＝I_m·sin(180-θ)/sinθ₁＝3.68280·sin(180-38.11107)/sin(38.11107)＝4.16096。

From the above, the equation representing the chief ray 420 for the corresponding location of the nucleus is as follows: y-1.53335 x + 4.16096. Thus, the coordinate (x) of the intersection point of the principal ray 420 of the core corresponding position and the air converted image plane 410 is determined_i，y_i) Obtained by solving a system of equations consisting of the formula y-1.53335 x +4.16096 representing the principal ray 420 and the formula y-11.43005 x representing the air reduction image plane 410: (x)_i，y_i) = (0.32098, 3.66879). The calculation step (2) is completed as described above.

(3) Next, the refraction point and the refraction angle of the principal ray 420 are determined. The cornea of the eyeball 400 is represented by the following formula: x is the number of²+(y-r)²＝r²7.722. The coordinates (x) of the intersection point of the cornea and the principal ray 420 are obtained by solving a system of equations consisting of an equation representing the cornea and an equation representing the principal ray 420_c，y_c). Coordinates (x) of intersection points for corresponding positions of kernels_c，y_c) The following were used: (x)_c，y_c)＝(2.45277，0.40001)。

Then, the intersection (x) is obtained_c，y_c) The angle of incidence and the angle of exit of the chief ray 420. For this purpose, the intersection point (x) is first determined_c，y_c) The slope of tangent 430 of eyeball 400 (cornea). For the check position, the slope of tangent line 430 corresponds to curve x representing the cornea²+(y-r)²7.722, point of intersection (x)_c，y_c) X differential of (c). If x is used for the curve x representing the cornea²+(y-r)²Differentiating 7.722 yields the following equation: y ═ x/(r)²-x²)^1/2. Will intersect (x)_c，y_c) X coordinate x of_cThe x-differential equation is substituted to obtain the slope tan theta of the tangent line 430_y' 0.33508 to yield theta_y′＝arctan(0.33508)＝18.52486。

Further, as can be seen from fig. 21, the intersection (x) is a corresponding position of the nucleus_c，y_c) Angle of incidence theta of chief ray 420_iIs theta_i＝θ₁-θ_y′＝33.11107-18.52486＝14.58621。

In addition, the intersection (x) is directed to the corresponding position of the kernel_c，y_c) Exit angle theta of principal ray 420_i′Using Snell's law we obtain: theta_i′＝arcsin((sinθ_i) (/ n) — arcsin ((sin (14.58621))/1.337) — 10.85705. The calculation step (3) is completed as described above.

(4) Finally, the distance (displacement Δ) in the x direction between the imaging position 421 to which the refraction by the eyeball 400 is added and the eyeball optical axis is obtained. For this purpose, the intersection of the principal ray 420 and the x-axis is first determined. If y is 0 in the formula y-1.53335 x +4.16096 representing the principal ray 420 for the matching position, the intersection (x) of the principal ray 420 and the x-axis₀，y₀) The following were obtained: (x)₀，y₀)＝(2.71364，0)。

Next, an imaging position of the incident light when the refraction by the eyeball 400 is ignored is determined. That is, the distance between the x-axis when refraction by the eyeball 400 is ignored and the air-converted image plane 410 is determined. Consider a triangle having three vertices, namely, the intersection of the principal ray 420 and the x-axis, the intersection of the principal ray 420 and the air converted image plane 410, and a foot (foot) drawn as a perpendicular line to the x-axis from this intersection. By applying the pythagorean theorem to this triangle, the distance L between the x-axis and the air-reduced image plane 410 is found as follows: l ═ x₀-x_i)²+(y₀-y_i)²)^1/2＝((2.71364-0.32098)²+(0-3.66879)²)^1/2＝4.38005。

Further, referring to fig. 22, the principal ray 420 passes through the x-axis and then travels a distance Δ in the x-direction until entering the eyeball 400₁That is, the x-component Δ of the distance between the point where the chief ray 420 intersects the x-axis and the point where the chief ray 420 intersects the eyeball 400₁Obtained by the following operation: delta₁＝|x_c-x₀|＝|2.45277-2.71364|＝0.26087。

On the other hand, the propagation distance Δ in the y direction after the principal ray 420 passes through the x axis and enters the eyeball 400₁That is, the chief ray 420 andthe y-component H of the distance between the point where the x-axis intersects and the point where the chief ray 420 intersects the eyeball 400₁To be H₁＝|y_c-y₀|＝0.40001。

Therefore, the propagation distance L from the x-axis of the principal ray 420 to the eyeball 400₁That is, the distance L between the point where the chief ray 420 intersects the x-axis and the point where the chief ray 420 intersects the eyeball 400₁Obtained by the following operation: l is₁＝(Δ₁ ²+H₁ ²)^1/2＝(0.260872+0.400012)1/2＝0.47755。

As described above, the distance L between the x-axis and the air-converted image plane 410 during refraction and the propagation distance L until the principal ray 420 enters the eyeball 400 after passing through the x-axis are ignored₁The difference is multiplied by the refractive index n of the eyeball, thereby the length L of the chief ray 420 in the eyeball 400₂That is, the distance L between the point where the chief ray 420 intersects the eyeball 400 (cornea) and the imaging position 421₂Obtained by the following operation: l is₂＝(L-L₁)·n＝(4.38005-0.47755)·1.337＝5.21764。

In addition, an angle θ formed by the principal ray 420 in the eyeball 400 with respect to the optical axis (y-axis) of the eyeball 400_nObtained by the following formula: theta_n＝θ_y′+θ_i′＝18.52486+10.85705＝29.38191。

Further, the distance Δ that the chief ray 420 travels in the x direction within the eyeball 400₂Obtained by the following operation: l is₂·sinθ_n＝5.21764·sin(29.38191)＝2.55992。

Thus, the distance Δ (target displacement Δ) in the x direction between the imaging position 421 and the eyeball optical axis (y axis) in consideration of refraction by the eyeball 400 (eye to be inspected) is obtained by the following equation: Δ ═ x₀-Δ₁-Δ₂＝2.71364-0.26087-2.55992＝0.10715。

The magnitude of the displacement Δ thus found (the absolute value of the displacement Δ) is compared with a predetermined threshold value (for example, 0.0001). In this example, since the displacement Δ is 0.10715 > 0.0001, θ was changed₁And theta₂And executes four operation processes (1) to(4). This iterative operation is repeated until the magnitude of the displacement Δ is smaller than the threshold value. Thereby, a correction value of the incident angle of the principal ray 420 when the displacement Δ is sufficiently small, that is, when the image plane optical axis substantially coincides with the eyeball optical axis (illumination optical axis) is obtained.

The following table shows various parameter values for the cornea corresponding position, anterior capsule corresponding position, matching corresponding position, and posterior capsule corresponding position, which are obtained by the above-described calculation so as to satisfy the displacement Δ < 0.0001.

[ TABLE 1 ]

	Corresponding position of cornea	Corresponding position of anterior capsule	Check response position	Corresponding position of the posterior capsule
					θ1	39.11025	34.62912	31.63867	29.23846
θ2	0	3.98356	6.47240	8.36637
					y3	0	1.99496	4.33311	6.96216
xi	0	0.12620	0.41514	0.81087
					yi	0	1.81222	3.65933	5.51357
xc	0	1.30143	2.42834	3.44346
					yc	0	0.11049	0.39186	0.81052
θi′	0	9.70517	18.33375	26.49017
					θi	39.11025	24.92395	13.30492	2.74829
θi′	28.15208	18.37255	9.91149	2.05522
					x0	0	1.37773	2.66978	3.89716
L	0	2.20238	4.29815	6.31860
					Δ1	0	0.07630	0.24144	0.45370
L1	0	0.13427	0.46027	0.92886
					L2	0	2.76505	5.13124	7.20608
θn	28.15208	28.07772	28.24524	28.54539
					Δ2	0	1.30143	2.42834	3.44346
Δ	0	0.00000002	0.00000035	0.00000054

Based on the findings obtained by the above simulation, the deflection angle of the object plane due to the refractive index of the eye E can be set as follows.

First, the deflection angle of the object plane due to the refractive index of the eye E to be inspected may be determined based on at least the angle formed by the optical axis of the illumination system 8 (illumination optical axis O2) and the optical axis of the photographing system 6 (photographing optical axis O1).

Here, the angle formed by the illumination optical axis O2 and the imaging optical axis O1 may be set to a value in a range of more than 0 degrees and 60 degrees or less. According to schem's law, this angular range does not, of course, include 0 degrees. The maximum value of the angular range of 60 degrees is a limit value of an angle formed by the illumination optical axis O2 and the imaging optical axis O1, which is found by the present inventors through experiments on anterior segment imaging using the schemer's law, and which enables an image of a range from the cornea to the lens to be obtained appropriately.

The deflection angle of the object plane due to the refractive index of the eye E is determined based on at least the angle formed by the illumination optical axis O2 and the imaging optical axis O1 and the corneal curvature radius.

Here, the value of the corneal radius of curvature may be set based on a predetermined model eye. The model eye may be, for example, a gullsland model eye, a navaro model eye, a Liou-Brennan model eye, a Badal model eye, an Arizona model eye, an Indiana model eye, any standard model eye, and any model eye equivalent to any of these.

Typically, as in the above-described operation example, the value of the corneal radius of curvature may be set to a value in the range of, for example, 7.7mm ± 0.5mm based on the gooch model eye.

The deflection angle of the object plane due to the refractive index of the eye E to be examined can be determined based on at least the angle formed by the illumination optical axis O2 and the imaging optical axis O1 and the refractive index of the eyeball.

Here, the value of the eyeball refractive index may be set based on a predetermined model eye. The model eye may be, for example, a gullsland model eye, a navaro model eye, a Liou-Brennan model eye, a Badal model eye, an Arizona model eye, an Indiana model eye, any standardized model eye, and any model eye equivalent to any of these.

Typically, the value of the eyeball refractive index may be set to a value in the range of 1.336 ± 0.001, for example, based on the gooch model eye, as in the above-described operation example.

The deflection angle of the object plane due to the refractive index of the eye E to be examined can be determined based on at least the angle formed by the illumination optical axis O2 and the imaging optical axis O1, the corneal curvature radius, and the eyeball refractive index.

Here, the value of the corneal curvature radius and the value of the eyeball refractive index may be set based on a predetermined model eye, respectively, as described above. Typically, as in the above-described operation example, the value of the corneal radius of curvature can be set to a value in the range of 7.7mm ± 0.5mm and the value of the eyeball refractive index can be set to a value in the range of 1.336 ± 0.001 based on the gooch model eye.

When the value of the corneal curvature radius is set to a value within a range of 7.7mm ± 0.5mm, the value of the eyeball refractive index is set to a value within a range of 1.336 ± 0.001, and the angle formed by the illumination optical axis O2 and the imaging optical axis O1 is set to a value within a range of more than 0 degrees and 60 degrees or less, the deviation angle of the object plane due to the refractive index of the eye E to be examined may be set to a value within a range of more than 0 degrees and 11.09 degrees or less. Here, the fact that the deflection angle of the object plane is larger than 0 degree is naturally obtained according to the schemer's law. The maximum value of the range of the deflection angle of 11.09 degrees is the angle θ formed by the cornea radius of curvature r of 7.2mm, the eyeball refractive index n of 1.337, and the illumination optical axis O2 and the imaging optical axis O1 used in the calculation steps (1) to (4)₁+θ₂60 degrees, and calculated with a displacement Δ < 0.0001.

According to this aspect, it is possible to avoid the mismatch of the lamb condition caused by the difference in refractive index between the inside and outside of the eye to be inspected with higher accuracy and higher accuracy than those of the first to fifth aspects.

This aspect can combine any one or two or more of the first to fifth aspects. In addition, any known technique can be combined with the embodiments including at least a part of the present embodiment, and a modification (addition, replacement, or the like) based on any known technique can be performed.

< other things >)

The several modes described above are merely examples. Thus, any modification (omission, replacement, addition, or the like) within the spirit of the present invention can be implemented.

For example, in several ways, the slit-lamp microscope can be operated remotely. Thus, the slit-lamp microscope includes, for example, an information receiving section, a control section, and an information transmitting section.

The information receiving unit of the slit-lamp microscope of the present embodiment receives an instruction from the first device via the communication line. The information receiving section includes at least a part of the communication section described above. The first device comprises, for example, an operating means for inputting instructions for remotely operating the slit-lamp microscope, a computer for receiving the inputted instructions, and a transmitting means for transmitting the received instructions to the slit-lamp microscope.

The control unit of the slit-lamp microscope of the present embodiment controls at least the illumination system and the imaging system in accordance with the instruction received by the information receiving unit. Thereby, an image of the eye to be inspected is obtained. The control section includes at least a part of the computer 100.

The information transmission unit of the slit-lamp microscope of the present embodiment transmits the image of the eye to be examined acquired in accordance with the instruction or the data (image, analysis data, etc.) obtained by processing the image to be examined to the second device via the communication line. The information transmitting unit includes at least a part of the communication unit described above. The second apparatus includes at least a receiving device that receives an image or data transmitted from the slit-lamp microscope, and for example, further includes a storage device that stores the received image or data, a computer that processes the received image or data, and the like.

As in the slit-lamp microscopes 200A and 200B, a light field camera may be provided as an imaging device in place of a configuration capable of changing the orientation of the optical axis of the imaging system, and an image obtained by the imaging device may be subjected to optical spatial image processing to obtain an in-focus image at least over the entire object plane.

A program that causes a computer to execute a process of any one of several modes or a combination of any two or more modes can be configured. Further, it is possible to configure a program that causes a computer to execute processing realized by applying a modification within the spirit of the present invention to any one of several modes or a combination of any two or more modes.

Also, a computer-readable non-transitory storage medium storing such a program can be made. The non-transitory storage medium may have any form, and examples thereof include a magnetic disk, an optical disk, an opto-magnetic disk, a semiconductor memory, and the like.

The present invention includes methods that may be implemented in any one of several ways or in any combination of two or more. Further, a method realized by applying any variation within the gist of the present invention to any one of several modes or any combination of two or more modes also belongs to the present invention.

Description of the reference numerals

200. 200A, 200B, 200C, 200D slit-lamp microscope

6 shooting system

6a optical system

8 illumination system

O2 lighting optical axis

43 image pickup element

60 moving mechanism

61 second deflection mechanism

70 first deflection mechanism

100 computer

111 first deflection control part

112 second deflection control section

121 three-dimensional image constructing unit

122 rendering part

123 analysis part

124 image quality evaluation unit

125 measuring part

126 first determination part

127 second determination part

128 third determination part

129 fourth determination part

130 data receiving part