阅读说明：本技术 积尘厚度检测装置和积尘清洁告警系统 (Accumulated dust thickness detection device and accumulated dust cleaning alarm system ) 是由 陆超 李峰 钱相宜 董明知 李海军 鲜开义 周俊宇 谷湘煜 于 2021-08-30 设计创作，主要内容包括：本申请实施例提供了一种积尘厚度检测装置和积尘清洁告警系统,适用于光伏组件技术领域。该积尘厚度检测装置包括壳体(1)、光源(2)、分光板(3)、第一光电传感器(4)、第二光电传感器(5)和处理器(6),光源(2)、第一光电传感器(4)和处理器(6)位于壳体(1)内部,分光板(3)位于壳体(1)的开口处,第一光电传感器(4)用于检测光源(2)发出的光经分光板(3)反射得到的反射光的第一光强,第二光电传感器(5)用于检测光源(2)发出的光经分光板(3)透射得到的透射光的第二光强,处理器(6)用于根据第一光强和第二光强确定积尘厚度。该积尘厚度检测装置的结构简单,检测准确度较高,且检测操作较为方便。(The embodiment of the application provides a laying dust thickness detection device and a laying dust cleaning alarm system, and is suitable for the technical field of photovoltaic modules. This laying dust thickness detection device includes casing (1), light source (2), beam-splitting board (3), first photoelectric sensor (4), second photoelectric sensor (5) and treater (6), light source (2), first photoelectric sensor (4) and treater (6) are located inside casing (1), beam-splitting board (3) are located the opening part of casing (1), first photoelectric sensor (4) are used for detecting the first light intensity of the light that light source (2) sent through the reverberation that beam-splitting board (3) reflection obtained, second photoelectric sensor (5) are used for detecting the second light intensity of the light that light source (2) sent obtained through the transmission of beam-splitting board (3), treater (6) are used for confirming laying dust thickness according to first light intensity and second light intensity. The dust deposition thickness detection device is simple in structure, high in detection accuracy and convenient to detect and operate.)

1. The device for detecting the thickness of the accumulated dust is characterized by comprising a shell (1), a light source (2), a light splitting plate (3), a first photoelectric sensor (4), a second photoelectric sensor (5) and a processor (6);

the light source (2), the first photoelectric sensor (4) and the processor (6) are positioned inside the shell (1), the light-splitting plate (3) is positioned at an opening of the shell (1), and the first photoelectric sensor (4) is used for detecting first light intensity of reflected light which is obtained by reflecting light emitted by the light source (2) through the light-splitting plate (3);

the second photoelectric sensor (5) is positioned outside the shell (1), and the second photoelectric sensor (5) is used for detecting second light intensity of transmitted light which is obtained by transmitting light emitted by the light source (2) through the light splitting plate (3);

the processor (6) is respectively connected with the first photoelectric sensor (4) and the second photoelectric sensor (5), and the processor (6) is used for receiving first light intensity detected by the first photoelectric sensor (4) and second light intensity detected by the second photoelectric sensor (5) and determining the dust deposition thickness of the light splitting plate according to the first light intensity and the second light intensity.

2. The apparatus according to claim 1, wherein the processor (6) is configured to determine a ratio between the second intensity and the first intensity, and to determine the deposition thickness of the spectroscopic plate based on the ratio.

3. The device according to claim 1, characterized in that it further comprises a support (7);

the support (7) is connected to an opening of the shell (1), and the second photoelectric sensor (5) is connected with the support (7).

4. The device according to claim 1, characterized in that it further comprises a communication unit (9), said communication unit (9) being mounted inside said casing (1);

the communication unit (9) is connected with the processor (6), and the processor (6) sends the dust deposition thickness to other equipment through the communication unit (9).

5. The device according to any of claims 1 to 4, wherein the light-splitting plate (3) is a semi-transparent and semi-reflective mirror.

6. A dust deposition cleaning alarm system, which is characterized in that the system comprises computer equipment and at least one dust deposition thickness detection device, wherein the at least one dust deposition thickness detection device is respectively connected with the computer equipment, the at least one dust deposition thickness detection device is the dust deposition thickness detection device of the claims 1-5, and the at least one dust deposition thickness detection device is positioned on the surface of a photovoltaic module;

each dust deposition thickness detection device of the at least one dust deposition thickness detection device is used for detecting the dust deposition thickness on the surface of the photovoltaic module and sending the detected dust deposition thickness to the computer equipment;

and the computer equipment is used for receiving the deposition thicknesses respectively sent by the at least one deposition thickness detection device, obtaining at least one deposition thickness in one-to-one correspondence with the at least one deposition thickness detection device, and carrying out cleaning alarm on the photovoltaic module according to the at least one deposition thickness.

7. The system of claim 6,

the computer equipment is used for determining the overall power generation loss cost and the overall theoretical cleaning cost of the photovoltaic module according to the at least one dust deposition thickness; and cleaning and alarming the photovoltaic module according to the whole power generation loss cost and the whole theoretical cleaning cost of the photovoltaic module.

8. The system of claim 7,

the computer equipment is used for determining the power generation loss proportion and the theoretical cleaning cost corresponding to each dust deposition thickness according to each dust deposition thickness in the at least one dust deposition thickness; and determining the integral generating capacity loss cost of the photovoltaic module according to the generating capacity loss proportion respectively corresponding to the at least one dust deposition thickness, and determining the integral theoretical cleaning cost of the photovoltaic module according to the theoretical cleaning cost respectively corresponding to the at least one dust deposition thickness.

9. The system of claim 8,

and the computer equipment is used for carrying out cleaning alarm on the photovoltaic module if the integral theoretical cleaning cost is less than the integral generating capacity loss cost.

10. The system of claim 6, further comprising an alerting device, the alerting device being connected to the computer device;

the computer equipment is used for sending an alarm instruction to the alarm equipment if the surface of the photovoltaic assembly meets the cleaning condition according to the at least one dust deposition thickness;

and the warning equipment is used for receiving the warning instruction and sending warning information according to the warning instruction, wherein the warning information is used for prompting the cleaning of the photovoltaic module.

11. The system of claim 10, further comprising a cleaning device coupled to the computer device;

the computer equipment is also used for sending a cleaning instruction to the cleaning equipment if receiving a cleaning starting instruction;

and the cleaning equipment is used for receiving the cleaning instruction sent by the computer equipment and cleaning the photovoltaic module according to the cleaning instruction.

12. The system of any of claims 6-11,

the computer equipment is used for acquiring weather monitoring data of the area where the photovoltaic assembly is located; and acquiring the deposition thickness which is respectively sent by the at least one deposition thickness detection device and meets the preset weather condition according to the weather monitoring data to obtain the at least one deposition thickness.

13. The system of claim 12, further comprising a weather monitoring device, the weather monitoring device connected to the computer device;

the weather monitoring equipment is used for monitoring the weather condition of the area where the photovoltaic assembly is located, obtaining the weather monitoring data and sending the weather monitoring data to the computer equipment;

and the computer equipment is used for receiving the weather monitoring data sent by the weather monitoring equipment.

Technical Field

The application relates to the technical field of photovoltaic modules, and can realize a deposited dust thickness detection device and a deposited dust cleaning alarm system.

Background

The photovoltaic power generation system is widely applied to the field of clean energy supply as a common solar energy resource utilization mode. The photovoltaic power generation system comprises a photovoltaic module, and the photovoltaic module comprises a plurality of photovoltaic module pieces, an inverter, a controller and the like. When sunlight irradiates the photovoltaic module, the photovoltaic module can generate current to convert light energy into electric energy. The efficiency of converting light energy into electric energy can be referred to as conversion efficiency or power generation efficiency, and is one of the core factors for measuring the performance of a photovoltaic power generation system. Wherein, photovoltaic module is because of exposing for a long time and probably accumulating the dust in the external world, and the dust can produce the effect of sheltering from to the sunshine, influences photovoltaic module to the absorption of sunlight to influence generating efficiency, burn out photovoltaic module even, consequently detect photovoltaic module's laying dust thickness very important.

In the related art, a dust-accumulated photovoltaic module with accumulated dust can be selected in advance and then cleaned to obtain a clean photovoltaic module without dust accumulation. And then, two electrical parameter acquisition devices comprising a current sensor and a voltage sensor are arranged. One electrical parameter acquisition device acquires electrical parameters of the clean photovoltaic module, and the other electrical parameter acquisition device acquires electrical parameters of the target photovoltaic module, wherein the electrical parameters can include current and voltage. According to the relation between the current and the voltage of the cleaning photovoltaic module and the current and the voltage of the target photovoltaic module, the dust deposition thickness of the target photovoltaic module can be determined. And if the thickness of the deposited dust exceeds the threshold value, cleaning the target photovoltaic module.

In the process of detecting the dust deposition thickness, the dust deposition photovoltaic module needs to be cleaned firstly to obtain a clean photovoltaic module, then the two electrical parameter acquisition devices are used for acquiring the electrical parameters of the clean photovoltaic module and the target photovoltaic module respectively so as to determine the dust deposition thickness of the target photovoltaic module according to the acquired electrical parameters, the detection operation is complex, and the detection device is complex. In addition, as the cleaned clean photovoltaic module cannot ensure complete dust accumulation, and the photovoltaic module has the problems of low power generation capacity and the like in night, rainy weather and sandy weather, the collection error of the electrical parameters may be introduced, so that the finally detected dust accumulation thickness has an error, and the detection accuracy is low.

Disclosure of Invention

The application provides a laying dust thickness detection device and a laying dust cleaning alarm system, and particularly provides a simple laying dust thickness detection device which can detect the laying dust thickness conveniently and accurately. The technical scheme is as follows:

in a first aspect, a deposited dust thickness detection device is provided, which includes a housing, a light source, a spectroscope, a first photosensor, a second photosensor, and a processor;

the light source, the first photoelectric sensor and the processor are positioned in the shell, the light splitting plate is positioned at an opening of the shell, and the first photoelectric sensor is used for detecting first light intensity of reflected light obtained by reflecting light emitted by the light source through the light splitting plate;

the second photoelectric sensor is positioned outside the shell and used for detecting second light intensity of transmitted light which is obtained by transmitting light emitted by the light source through the light splitting plate;

the processor is respectively connected with the first photoelectric sensor and the second photoelectric sensor, and is used for receiving first light intensity detected by the first photoelectric sensor and second light intensity detected by the second photoelectric sensor and determining the dust deposition thickness of the light splitting plate according to the first light intensity and the second light intensity.

As an example, the processor is configured to determine a ratio between the second light intensity and the first light intensity, and determine the dust deposition thickness of the spectroscopic plate according to the ratio.

Optionally, the device further comprises a stent;

the support is connected to the opening of casing, second photoelectric sensor with the leg joint.

Optionally, the device further comprises a communication unit mounted inside the housing;

the communication unit is connected with the processor, and the processor sends the dust deposition thickness to other equipment through the communication unit.

As one example, the spectroscope is a semi-transparent and semi-reflective mirror.

In a second aspect, a deposited dust cleaning warning system is provided, where the system includes a computer device and at least one deposited dust thickness detection device, the at least one deposited dust thickness detection device is respectively connected to the computer device, the at least one deposited dust thickness detection device is the deposited dust thickness detection device provided in the first aspect, and the at least one deposited dust thickness detection device is located on a surface of a photovoltaic module;

each dust deposition thickness detection device of the at least one dust deposition thickness detection device is used for detecting the dust deposition thickness on the surface of the photovoltaic module and sending the detected dust deposition thickness to the computer equipment;

and the computer equipment is used for receiving the deposition thicknesses respectively sent by the at least one deposition thickness detection device, obtaining at least one deposition thickness in one-to-one correspondence with the at least one deposition thickness detection device, and carrying out cleaning alarm on the photovoltaic module according to the at least one deposition thickness.

As an example, the computer device is configured to determine an overall power generation loss cost and an overall theoretical cleaning cost of the photovoltaic module according to the at least one dust deposition thickness; and cleaning and alarming the photovoltaic module according to the whole power generation loss cost and the whole theoretical cleaning cost of the photovoltaic module.

As an example, the computer device is configured to determine, according to each of the at least one dust deposition thickness, a power generation amount loss ratio and a theoretical cleaning cost corresponding to each dust deposition thickness; and determining the integral generating capacity loss cost of the photovoltaic module according to the generating capacity loss proportion respectively corresponding to the at least one dust deposition thickness, and determining the integral theoretical cleaning cost of the photovoltaic module according to the theoretical cleaning cost respectively corresponding to the at least one dust deposition thickness.

As an example, the computer device is configured to perform a cleaning alarm on the photovoltaic module if the overall theoretical cleaning cost is less than the overall power generation loss cost.

Optionally, the system further comprises an alarm device, wherein the alarm device is connected with the computer device;

the computer equipment is used for sending an alarm instruction to the alarm equipment if the surface of the photovoltaic assembly meets the cleaning condition according to the at least one dust deposition thickness;

and the warning equipment is used for receiving the warning instruction and sending warning information according to the warning instruction, wherein the warning information is used for prompting the cleaning of the photovoltaic module.

Optionally, the system further comprises a cleaning device connected with the computer device;

the computer equipment is also used for sending a cleaning instruction to the cleaning equipment if receiving a cleaning starting instruction;

and the cleaning equipment is used for receiving the cleaning instruction sent by the computer equipment and cleaning the photovoltaic module according to the cleaning instruction.

As an example, the computer device is configured to obtain weather monitoring data of an area where the photovoltaic module is located; and receiving the deposition thicknesses which are respectively sent by the at least one deposition thickness detection device and meet the preset weather conditions according to the weather monitoring data to obtain the at least one deposition thickness.

Optionally, the system further comprises a weather monitoring device, wherein the weather monitoring device is connected with the computer device;

the weather monitoring equipment is used for monitoring the weather condition of the area where the photovoltaic assembly is located, obtaining the weather monitoring data and sending the weather monitoring data to the computer equipment;

and the computer equipment is used for receiving the weather monitoring data sent by the weather monitoring equipment.

The technical scheme provided by the embodiment of the application has the following beneficial effects:

the embodiment of the application provides an laying dust thickness detection device, and this laying dust thickness detection device includes casing, light source, beam splitter, first photoelectric sensor, second photoelectric sensor and treater, and light source, first photoelectric sensor and treater are located inside the casing, and the beam splitter is located the opening part of casing, and the second photoelectric sensor is located the casing outside. The dust deposition thickness detection device can detect first light intensity of reflected light obtained by reflection of light emitted by the light source through the light splitting plate through the first photoelectric sensor, detect second light intensity of transmitted light obtained by transmission of the light emitted by the light source through the light splitting plate through the second photoelectric sensor, and determine the dust deposition thickness of the light splitting plate through the processor according to the first light intensity and the second light intensity. The dust deposition thickness detection device is simple in structure, and the dust deposition thickness is determined according to the light intensity detected by the photoelectric sensor, so that the acquisition errors of voltage and current are avoided, and the detection accuracy is high. In addition, the dust deposition thickness detection device can be directly installed on the surface of the photovoltaic assembly to detect the dust deposition thickness on the surface of the photovoltaic assembly, and the operation of detecting the dust deposition thickness is also convenient.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a schematic view of an application scenario of a deposited dust thickness detection apparatus according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a deposited dust thickness detection apparatus according to an embodiment of the present disclosure;

FIG. 3 is a schematic structural diagram of another device for detecting a thickness of deposited dust according to an embodiment of the present disclosure;

FIG. 4 is a schematic diagram of a dust deposition cleaning alarm system according to an embodiment of the present disclosure;

fig. 5 is a flowchart of a method for warning of dust deposition cleaning according to an embodiment of the present application.

Reference numerals:

1: a housing, 2: light source, 3: spectroscopic plate, 31: reflective surface, 32: transmission surface, 4: first photosensor, 5: second photosensor, 6: processor, 7: support, 8: power supply unit, 9: a communication unit.

Detailed Description

To make the objects, technical solutions and advantages of the present application more clear, embodiments of the present application will be described in further detail below with reference to the accompanying drawings.

In the description of the present application, the terms "upper", "lower", "inner", "outer", "left", "right", "front", "rear", and the like indicate orientations or positional relationships based on those shown in the drawings, which are merely for convenience of description, and do not indicate or imply that the referred device or element must be provided with a specific orientation or constructed and operated in a specific orientation, and thus, should not be construed as limiting the present application.

In the description of the present application, unless otherwise expressly specified or limited, the terms "mounted," "connected," "secured," and the like are to be construed broadly, e.g., as meaning fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or may be interconnected between two elements. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as appropriate.

It should be understood that reference to "a plurality" in this application means two or more. In the description of the present application, "/" means "or" unless otherwise stated, for example, a/B may mean a or B; "and/or" herein is only an association relationship describing an associated object, and means that there may be three relationships, for example, a and/or B, which may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, for the convenience of clearly describing the technical solutions of the present application, the terms "first", "second", and the like are used to distinguish the same items or similar items having substantially the same functions and actions. Those skilled in the art will appreciate that the terms "first," "second," etc. do not denote any order or quantity, nor do the terms "first," "second," etc. denote any order or importance.

Before explaining the embodiments of the present application in detail, an application scenario of the embodiments of the present application will be described.

The dust deposition thickness detection device provided by the embodiment of the application can be applied to a scene for detecting the dust deposition thickness on the surface of an object to be detected. The object to be detected can be an object such as a photovoltaic module and the like, the performance of which can be affected by dust deposition, and the object to be detected is not limited in the embodiment of the application.

For example, a photovoltaic power generation system can convert light energy into electric energy, and is a common solar energy resource utilization method. With the increasing demand of energy, photovoltaic power generation systems have been widely applied to the field of clean energy supply, such as photovoltaic cities and photovoltaic roofs, due to their "no pollution, no radiation". The photovoltaic power generation system can comprise a plurality of photovoltaic module pieces, an inverter, a controller and the like. Because photovoltaic module exposes for a long time and can accumulate the dust in the external world, the dust can produce the effect of sheltering from to the sunshine, influences photovoltaic module to the absorption of sunlight to influence generating efficiency, burn out photovoltaic module even, consequently can install laying dust thickness detection device on photovoltaic module surface, detect the laying dust thickness on photovoltaic module surface, whether wash photovoltaic module according to the laying dust thickness determination that detects.

Referring to fig. 1, fig. 1 is a schematic view of an application scenario of a deposited dust thickness detection apparatus according to an embodiment of the present disclosure. As shown in fig. 1, a dust deposition thickness detection device may be installed on the surface of the photovoltaic module, and the dust deposition thickness on the surface of the photovoltaic module is detected by the dust deposition thickness detection device.

The photovoltaic module is composed of a plurality of photovoltaic module sheets with the same specification. It should be understood that the photovoltaic module may also be composed of several photovoltaic module sheets with different specifications, which is not limited in the embodiments of the present application.

As an example, several photovoltaic module pieces may be connected in series to obtain a high voltage, then connected in parallel to obtain a high current, and then the voltage and the current are output through the diode. And then, panels can be respectively installed on the upper sides and the lower sides of the plurality of photovoltaic module sheets to form the photovoltaic module. For convenience of explanation, the panel mounted on the upper side of the plurality of photovoltaic module sheets may be referred to as a surface of the photovoltaic module, and the panel mounted on the lower side of the plurality of photovoltaic module sheets may be referred to as a back surface of the photovoltaic module.

The photovoltaic module can be a single-sided photovoltaic module and can also be a double-sided photovoltaic module. Only the surface of the single-sided photovoltaic module can transmit light, and both the surface and the back of the double-sided photovoltaic module can transmit light.

When the photovoltaic module is exposed to sunlight, the sunlight can be transmitted to the photovoltaic module through the surface of the photovoltaic module, so that the photovoltaic module generates current and voltage to convert light energy into electric energy. One of the core factors measuring the performance of a photovoltaic power generation system is the efficiency of converting light energy into electric energy, which may also be referred to as conversion efficiency or power generation efficiency. Because photovoltaic module exposes in the external world for when the sunlight shines photovoltaic module, photovoltaic module's surface can accumulate the dust, and the dust can influence photovoltaic module to the absorption of sunlight, further can influence generating efficiency, can burn out photovoltaic module even, therefore detects photovoltaic module's laying dust thickness very important.

In the embodiment of the application, a laying dust thickness detection device with a simple structure is provided, the laying dust thickness detection device can be directly installed on the surface of a photovoltaic assembly to detect the laying dust thickness on the surface of the photovoltaic assembly, the detection operation is convenient, and the detection accuracy is high. The structure and detection principle of the dust deposit thickness detection device will be described in detail in the embodiments of fig. 2 to 3.

Next, the structure and the detection principle of the deposited dust thickness detection device provided in the embodiment of the present application will be described.

Referring to fig. 2-3, fig. 2-3 are schematic structural diagrams of a dust deposition thickness detection apparatus according to an embodiment of the present disclosure, which may be applied to the application scenario shown in fig. 1. As shown in fig. 2 to 3, the dust deposition thickness detection apparatus includes a housing 1, a light source 2, a spectroscopic plate 3, a first photosensor 4, a second photosensor 5, and a processor 6.

The light source 2, the first photoelectric sensor 4 and the processor 6 are located inside the shell 1, the light-splitting plate 3 is located at an opening of the shell 1, and the first photoelectric sensor 4 is used for detecting first light intensity of reflected light obtained by reflecting light emitted by the light source 2 through the light-splitting plate 3. The second photoelectric sensor 5 is located outside the housing 1 and configured to detect a second light intensity of the transmitted light, which is obtained by transmitting the light emitted by the light source 2 through the spectroscopic plate 3. The processor 6 is respectively connected with the first photoelectric sensor 4 and the second photoelectric sensor 5, and the processor 6 is used for receiving a first light intensity detected by the first photoelectric sensor 4 and a second light intensity detected by the second photoelectric sensor 5, and determining the dust deposition thickness of the light splitting plate 3 according to the first light intensity and the second light intensity.

The housing 1 may be a housing with a closed bottom and an open top. For example, as shown in fig. 2, the housing 1 is a square housing with a closed bottom and an open top. Of course, the housing 1 may have other shapes, which is not limited in the embodiments of the present application.

The light source 2, the first photosensor 4 and the processor 6 may be fixed directly to the bottom of the housing 1, or may be fixed to the bottom of the housing 1 through a connector. For example, the light source 2, the first photosensor 4, and the processor 6 may be welded to the bottom of the housing 1, or embedded in the bottom of the housing 1.

The light source 2 is used for emitting light, and the light emitted from the light source can be irradiated onto the spectroscopic plate 3. The light source 2 may be a light-emitting diode (LED) light source, and may also be other light sources, which is not limited in this embodiment.

The light splitting plate 3 is located at the opening of the upper part of the housing 1 and is used for closing the opening of the upper part of the housing 1, so that the inside of the housing 1 forms a closed space. Thus, the external dust can be prevented or reduced from entering the inside of the housing 1, so that the lower surface of the light-splitting plate 3 is not easy to adhere to the dust, and the upper surface of the light-splitting plate 3 is easy to accumulate the dust due to being exposed to the outside. For convenience of description, the upper surface of the spectroscopic plate 3 may be referred to as a dust deposition surface, and the lower surface of the spectroscopic plate 3 may be referred to as a clean surface.

The dust accumulation surface is located outside the shell 1, can receive the irradiation of sunlight, and can accumulate dust which has the functions of absorbing and shielding light. The dust deposition thickness of the dust deposition surface is also the dust deposition thickness of the spectroscope 3. The cleaning surface is located in the housing 1 in a closed space. Further, since the clean surface is located below the spectroscope 3, dust is not likely to fall down, and therefore, the clean surface is considered to have no dust accumulation.

The spectroscope 3 is used to separate light emitted from the light source 2. As shown in fig. 1, light emitted from the light source 2 irradiates the spectroscope 3, and the spectroscope 3 disperses the light emitted from the light source 2 into reflected light and transmitted light. The light emitted by the light source 2 can be reflected by the lower surface of the light-splitting plate 3 to obtain reflected light, and transmitted by the upper surface of the light-splitting plate 3 to obtain transmitted light. Since the lower surface of the spectroscopic plate 3 is a clean surface, the reflected light is not affected by dust. Since the upper surface of the spectroscopic plate 3 is a dust accumulation surface, the transmitted light is affected by dust on the dust accumulation surface.

In addition, since the transmitted light and the reflected light are obtained by using the same light source 2 and splitting the light by the beam splitter 3, the accuracy of determining the dust deposition thickness of the beam splitter 3 according to the first light intensity of the reflected light and the second light intensity of the transmitted light is high.

As an example, the light emitted by the light source 2 may be light of a dust sensitive band, and the bands of light detected by the first and second photosensors 4 and 5 may be dust sensitive bands. Since the light emitted from the light source 2 is light in a dust-sensitive wavelength band, the transmitted light and the reflected light dispersed by the spectroscope 3 are also light in the dust-sensitive wavelength band, and the sensitivity and accuracy of detecting the first light intensity of the reflected light by the first photosensor 4 and the second light intensity of the transmitted light by the second photosensor 5 are high.

As one example, the spectroscope 3 may be a half-transparent half mirror. A transflective mirror is a transparent medium that transmits light but does not reflect completely. When light emitted by the light source 2 irradiates the semi-transparent and semi-reflective mirror, a part of light is reflected, and a part of light is transmitted, so that the light splitting effect is achieved. As shown in fig. 1, the transflective mirror includes a reflective surface 31 and a transmissive surface 32. The reflecting surface 31 is a cleaning surface, and the transmitting surface 32 is a dust collecting surface.

As an example, the light splitting plate 3 may also be another device capable of achieving a light splitting function, for example, a device capable of achieving an optical path such as a light splitting prism or a slit, which is not limited in this embodiment of the present application.

The first and second photoelectric sensors 4 and 5 can detect light intensity. The first photoelectric sensor 4 is located in the housing 1 and in the enclosed space, and can detect the light intensity of the reflected light, which is obtained by reflecting the light emitted by the light source 2 through the clean surface of the spectroscope 3, and the light intensity of the reflected light can be referred to as a first light intensity.

The second photoelectric sensor 5 is located outside the housing 1, and can detect the light intensity of the transmitted light, which is obtained by transmitting the light emitted by the light source 2 through the dust deposition surface of the light splitting plate 3, and the light intensity of the transmitted light can be referred to as a second light intensity.

As an example, the second photosensor 5 may be fixed to the upper side of the spectroscopic plate 3 by a connector. For example, as shown in fig. 2, the dust deposition thickness detection apparatus may further include a bracket 7. The bracket 7 is connected to the opening of the housing 1, and the second photosensor 5 is connected to the bracket 7. The holder 7 may fix the second photosensor 5 to the upper side of the spectroscopic plate 3 so that the second photosensor 5 can detect the first light intensity of the transmitted light.

As shown in fig. 2, the brackets 7 may be attached to both sides of the opening of the housing 1. In addition, the bracket 7 may be connected to the opening of the housing 1 by welding or a detachable connection, which is not limited in the embodiment of the present application.

As an example, the processor 6 may determine a ratio between the second light intensity and the first light intensity, and determine the dust deposition thickness of the spectroscopic plate 3 based on the ratio.

For example, the processor 6 can determine the dust deposition thickness of the spectroscopic plate 3 according to the ratio between the second light intensity and the first light intensity and the corresponding relationship between the ratio and the dust deposition thickness.

The corresponding relationship between the ratio and the dust deposition thickness may include different ratios and dust deposition thicknesses corresponding to different ratios. The correspondence may be obtained by testing in advance. For example, in the case where preset weather conditions and preset time conditions are satisfied, the spectroscopic plate 3 is irradiated with the light source 2. The preset weather condition and the preset time condition may be preset, for example, the preset time condition is a time period from 12 nights to 5 nights, and the preset weather condition is clear weather. The test process is as follows: firstly, the dust deposition surface of the light splitting plate 3 has different known dust deposition thicknesses, and the ratio of the second light intensity to the first light intensity under different dust deposition thicknesses can be obtained for multiple times; then, a polynomial can be used for fitting different dust deposition thicknesses and the corresponding ratio between the second light intensity and the first light intensity to obtain the corresponding relation between the ratio between the second light intensity and the first light intensity and the dust deposition thickness. Wherein, different dust thicknesses correspond to different ratios. During detection, the processor 6 first obtains the ratio between the second light intensity and the first light intensity, and then determines the dust deposition thickness of the light splitting plate 3 according to the corresponding relationship between the ratio between the second light intensity and the first light intensity and the dust deposition thickness.

As an example, the corresponding relationship between the ratio of the second light intensity to the first light intensity and the deposited dust thickness may be expressed by using a fitting curve, or may be expressed in other ways, and the comparison in this application is not limited.

As one example, processor 6 may include one or more processing cores, such as a 4-core processor, an 8-core processor, and so forth. The processor 6 may be implemented in at least one hardware form of a DSP (Digital Signal Processing), an FPGA (Field Programmable Gate Array), and a PLA (Programmable Logic Array).

Alternatively, as shown in fig. 2 to 3, the dust deposition thickness detection apparatus may further include a power supply unit 8. The power supply unit 8 is located within the housing 1. The power supply unit 8 may be fixed directly to the bottom of the housing 1 or fixed to the bottom of the housing 1 by a connector. For example, the power supply unit 8 may be welded to the bottom of the housing 1 or embedded in the bottom of the housing 1.

The power supply unit 8 is connected with the light source 2 and the processor 6 for supplying power to the light source 2 and the processor 6. Further, since the processor 6 is connected to the first photosensor 4 and the second photosensor 5, respectively, the power supply unit 8 can also be used to supply power to the first photosensor 4 and the second photosensor 5.

As an example, the light source 2, the first photosensor 4, the second photosensor 5, and the processor 6 may also respectively carry power supply units such as batteries, each of which implements a power supply function.

As an example, the power supply unit 8 may be a lithium battery, or another device capable of providing a power supply function, which is not limited in this embodiment of the application.

Alternatively, as shown in fig. 2 to 3, the dust deposition thickness detection apparatus may further include a communication unit 9. The communication unit 9 may be fixed directly to the bottom of the housing 1 or fixed to the bottom of the housing 1 by a connector. For example, the communication unit 9 may be welded to the bottom of the housing 1 or embedded in the bottom of the housing 1.

The communication unit 9 is connected to the processor 6, and the processor 6 can transmit the dust deposit thickness to other devices through the communication unit 9. Wherein the other device may be a computer device or the like.

As an example, the communication unit 9 may be connected with a power supply unit 8, the power supply unit 8 being used for supplying power to the communication unit 9. The communication unit 9 may be a power supply unit such as a battery, and may independently realize a power supply function.

As an example, the communication unit 9 may include a wireless interface or a wired interface, and the communication unit 9 transmits the dust deposit thickness to other devices through the wireless interface or the wired interface.

As an example, the dust deposition thickness detection means detects the dust deposition thickness on the surface of the spectroscopic plate 3 when a preset time condition is satisfied. Wherein the preset time condition can be preset. For example, the predetermined time condition may be night, such as a time period from 12 o 'clock night to 5 o' clock early in the morning.

Because interference stray light exists in the daytime environment, the light intensity of the interference stray light influences the first light intensity of reflected light and the second light intensity of transmitted light, and further influences the first light intensity detected by the first photoelectric sensor 4 and the second light intensity detected by the second photoelectric sensor 5, so that an error exists in the dust deposition thickness of the spectroscopic plate 3 determined according to the first light intensity and the second light.

This application embodiment detects laying dust thickness at night through setting up laying dust thickness detection device, can avoid the influence that the first light intensity that first photoelectric sensor 4 detected and the second light intensity that second photoelectric sensor 5 detected receive the interference veiling glare of daytime environment. For example, the time period from 12 nights to 5 nights is nights, the interference stray light is less, and the light intensity of the interference stray light is less, so that the influence on the first light intensity of the reflected light and the second light intensity of the transmitted light is less, and further the first light intensity detected by the first photoelectric sensor 4 and the second light intensity detected by the second photoelectric sensor 5 are more accurate, so that the accuracy of the dust deposition thickness of the spectroscopic plate 3 determined according to the first light intensity and the second light is higher, and the degree of influence of the dust deposition thickness detection device on resisting the ambient light is higher.

As an example, the deposited dust thickness detection device may be applied to the application scenario shown in fig. 1, and the deposited dust thickness of the photovoltaic module is detected by the deposited dust thickness detection device. For example, the dust deposition thickness detection device may be installed on the surface of the photovoltaic module, the dust deposition thickness of the dust deposition surface of the light splitting plate may represent the dust deposition thickness of the surface of the photovoltaic module, the clean surface of the light splitting plate may represent the clean photovoltaic module, and the dust deposition thickness of the light splitting plate 3 detected by the dust deposition thickness detection device is used as the dust deposition thickness of the surface of the photovoltaic module. That is, the laying dust thickness detection device does not need to select the laying dust photovoltaic module to wash and obtain clean photovoltaic module, does not need to set up two electrical parameter collection devices and gathers two photovoltaic module's electrical parameter respectively, therefore when the laying dust thickness detection device who adopts the embodiment of this application to provide detects photovoltaic module's laying dust thickness, detection operation is comparatively convenient.

As an example, in order to improve the accuracy of detecting the dust deposition thickness on the surface of the photovoltaic module, when the dust deposition thickness detection apparatus is installed on the surface of the photovoltaic module, the dust deposition surface of the spectroscope 3 in the dust deposition thickness detection apparatus may be kept parallel to the surface of the photovoltaic module.

The utility model provides a laying dust thickness detection device can detect the first light intensity of the reverberation that the light source sent obtains through the reflection of beam-splitting board through first photoelectric sensor to and the second light intensity of the transmitted light that the light that sends through second photoelectric sensor detection light source obtained through the transmission of beam-splitting board, then confirm the laying dust thickness of beam-splitting board according to first light intensity and second light intensity through the treater. The dust deposition thickness detection device is simple in structure, and the dust deposition thickness is determined according to the light intensity detected by the photoelectric sensor, so that the acquisition errors of voltage and current are avoided, and the detection accuracy is high.

It should be noted that, after the deposition thickness of the photovoltaic module is detected by the deposition thickness detection device, whether the photovoltaic module is to be cleaned and alarmed is determined according to the deposition thickness, so that continuous accumulation of dust is avoided, and the influence of the dust on the photovoltaic power generation system is reduced. Next, a dust deposition cleaning warning system provided in an embodiment of the present application will be described in detail.

Referring to fig. 4, fig. 4 is a schematic view illustrating a dust deposition cleaning alarm system according to an embodiment of the present disclosure. As shown in fig. 4, the dust deposit cleaning warning system comprises a computer device 401 and at least one dust deposit thickness detection means 402. At least one deposited dust thickness detection device 402 is respectively connected with the computer equipment 401, each deposited dust thickness detection device in the at least one deposited dust thickness detection device 402 is the deposited dust thickness detection device in the above-mentioned fig. 1-3, and the at least one deposited dust thickness detection device 402 is positioned on the surface of the photovoltaic module.

Each of the at least one dust deposition thickness detection device 402 is configured to detect a dust deposition thickness on the surface of the photovoltaic module, and send the detected dust deposition thickness to the computer device 401. For example, each of the at least one deposited dust thickness detecting devices 402 can detect the deposited dust thickness on the surface of the spectroscope in the respective device, and use the deposited dust thickness on the surface of the spectroscope as the deposited dust thickness on the surface of the photovoltaic module.

And the computer device 401 is configured to receive the deposition thicknesses respectively sent by the at least one deposition thickness detection device 402, obtain at least one deposition thickness in one-to-one correspondence with the at least one deposition thickness detection device 402, and perform cleaning alarm on the photovoltaic module according to the at least one deposition thickness.

For example, the computer device 401 may determine whether the surface of the photovoltaic module meets the cleaning condition according to at least one deposited dust thickness, and if the surface of the photovoltaic module meets the cleaning condition, the photovoltaic module is cleaned and alarmed, so that continuous accumulation of dust is avoided, and the influence of the dust on the power generation efficiency of the photovoltaic power generation system is reduced.

Wherein, at least one dust thickness detection device 402 can be respectively connected with the computer device 401 through a wired network and/or a wireless network. For example, the connection is made by a combination of a wireless network and a wired network. The communication network combining the wireless network and the wired network has long transmission distance, and can realize the long-distance transmission of information.

As an example, the at least one dust deposition thickness detection apparatus 402 may be connected to the computer device 401 through a communication network consisting of an industrial wireless access point and a communication fiber.

The at least one dust deposition thickness detection device 402 may be one or more. For example, as shown in fig. 4, the at least one dust deposit thickness detecting device 402 may include a dust deposit thickness detecting device 4021 and a dust deposit thickness detecting device 4022.

As an example, the at least one deposition thickness detection device 402 may be located at different locations on the same photovoltaic module surface, or on different photovoltaic module surfaces. For example, at least one dust deposition thickness detection device 402 is in one-to-one correspondence with at least one photovoltaic module, and each dust deposition thickness detection device is located on the surface of the corresponding photovoltaic module.

Optionally, the computer device 401 is further configured to obtain weather monitoring data of an area where the photovoltaic module is located; and receiving the deposition thicknesses meeting the preset weather conditions and respectively sent by at least one deposition thickness detection device 402 according to the weather monitoring data to obtain at least one deposition thickness. That is, the computer device 401 may obtain the weather monitoring data, determine whether the weather monitoring data meets a preset weather condition, and if the preset weather condition is met, the computer device 401 receives the deposition thicknesses respectively sent by the at least one deposition thickness detection device 402 to obtain the at least one deposition thickness.

The preset weather condition may be preset, for example, the preset weather condition may be clear weather. The weather monitoring data may be directly obtained by the computer device 401, or may be obtained by other methods, which is not limited in this embodiment of the application.

As an example, the computer device 401 may be a tablet computer, a computer, or a server, and the computer device 401 is not limited in this embodiment of the application.

Optionally, as shown in fig. 4, the dust-laden cleaning warning system may further include a weather monitoring device 403.

And the weather monitoring device 403 is configured to monitor a weather condition of an area where the photovoltaic module is located, obtain weather monitoring data, and send the weather monitoring data to the computer device 401.

The computer device 401 is further configured to receive weather monitoring data sent by the weather monitoring device 403, and receive, according to the weather monitoring data, deposition thicknesses that satisfy preset weather conditions and are sent by at least one deposition thickness detection device 402, to obtain at least one deposition thickness.

The computer device 401 and the weather monitoring device 403 may be connected via a wired network and/or a wireless network. For example, the connection is made by a combination of a wireless network and a wired network.

As one example, the weather monitoring device 403 may automatically observe and store weather monitoring data for the area where the photovoltaic component is located, and send the weather monitoring data to the computer device 401. The weather monitoring devices 403 may include sensors, collectors, communication interfaces, system power supplies, and the like.

As an example, the weather monitoring device 403 may also be integrated in the computer device 401, that is, the computer device 401 may directly obtain weather monitoring data of the area where the photovoltaic module is located. For example, the weather monitoring device 403 may be any software or program capable of obtaining weather monitoring data for the area in which the photovoltaic module is located.

Optionally, as shown in fig. 4, the dust deposit cleaning warning system may further include a warning device 404.

The computer device 401 may further send an alarm instruction to the alarm device 404 when it is determined that the surface of the photovoltaic module satisfies the cleaning condition according to the at least one deposited dust thickness. The alarm device 404 is configured to receive an alarm instruction and send out alarm information according to the alarm instruction.

The warning instruction is used for indicating the warning device 404 to give a warning, and the warning information is used for prompting to clean the photovoltaic module. The manner of sending the warning information may include displaying the warning information or sending a warning sound, and the like, which is not limited in the embodiment of the present application.

The computer device 401 and the alarm device 404 may be connected via a wired network and/or a wireless network. For example, the connection is made by a combination of a wireless network and a wired network.

As an example, the alerting device 404 may be located around the computer device 401, or around the photovoltaic module. For example, the alert device 404 may be an integrated circuit or device capable of implementing an alert function.

As an example, the alerting device 404 may also be integrated in the computer device 401, i.e. the computer device 401 may directly generate and issue alerting information. For example, the alert device 404 may be any software or program capable of implementing an alert.

Optionally, as shown in fig. 4, the dust deposit cleaning warning system may further include a cleaning device 405.

The computer device 401 is further configured to send a cleaning instruction to the cleaning device 405 if receiving a start cleaning instruction. Cleaning device 405 is configured to clean the photovoltaic module according to a start-up cleaning instruction if the start-up cleaning instruction is received. The dust on the surface of the photovoltaic assembly is cleaned through the cleaning equipment 405, so that the continuous accumulation of the dust can be avoided, and the influence of the dust on the power generation efficiency of the photovoltaic power generation system is reduced.

Wherein, the computer device 401 and the cleaning device 405 are connected through a wired network and/or a wireless network. For example, the connection is made by a combination of a wireless network and a wired network.

As an example, the cleaning device 405 may automatically spray water to clean the photovoltaic module after receiving a start-up cleaning command.

It should be noted that the weather monitoring device 403, the alarm device 404, and the washing device 405 are optional devices. That is, the dust deposit cleaning alarm system may include only the computer device 401 and the at least one dust deposit thickness detecting device 402, or may include one or more of the weather monitoring device 403, the alarm device 404, and the cleaning device 405 in addition to the computer device 401 and the at least one dust deposit thickness detecting device 402.

In the dust deposition cleaning alarm system of the embodiment of the application, at least one dust deposition thickness detection device can detect the dust deposition thickness on the surface of the photovoltaic module. The computer equipment can determine whether the surface of the photovoltaic module meets the cleaning condition or not according to the dust deposition thicknesses respectively detected by the at least one dust deposition thickness detection device, and if the surface of the photovoltaic module meets the cleaning condition, the photovoltaic module is cleaned and alarmed so as to prompt that the photovoltaic module is cleaned. Therefore, the continuous accumulation of dust can be avoided, and the influence of the dust on the power generation efficiency of the photovoltaic power generation system is reduced.

Next, a dust deposition cleaning warning method provided in an embodiment of the present application will be described with reference to the drawings.

Referring to fig. 5, fig. 5 is a flowchart of a method for warning of dust deposition cleaning according to an embodiment of the present application, which can be applied to the dust deposition cleaning warning system shown in fig. 4. The method comprises the following steps:

step 501, at least one dust deposition thickness detection device respectively detects the dust deposition thickness on the surface of the photovoltaic module.

Each dust deposition thickness detection device in the at least one dust deposition thickness detection device can detect the dust deposition thickness of the surface of the corresponding photovoltaic module.

As an example, at least one deposited dust thickness detection device corresponds to at least one photovoltaic module one by one, and each deposited dust thickness detection device is located on the surface of the corresponding photovoltaic module and is used for detecting the deposited dust thickness of the corresponding photovoltaic module.

Step 502, at least one deposited dust thickness detection device sends the detected deposited dust thickness to a computer device.

The dust deposition thickness detection device can send the detected dust deposition thickness to the computer equipment through a wired network and/or a wireless network. For example, the detected dust deposition thickness may be transmitted to the computer device by a combination of a wireless network and a wired network.

Step 503, monitoring the weather condition of the area where the photovoltaic module is located by the weather monitoring equipment to obtain weather monitoring data.

The weather conditions may include sand, rain, dew, ice, snow, and the like.

In addition, the weather monitoring data may include real-time weather conditions of the area where the photovoltaic module is located, and may also include weather conditions of the area where the photovoltaic module is located in a future time period.

The future time period refers to a time period after the monitoring start time, and the future time period may be preset. For example, the future time period may be Y days in the future, and Y may be 3 days, 5 days, or 7 days, etc.

In step 504, the weather monitoring device sends weather monitoring data to the computer device.

The weather monitoring device may send the weather monitoring data to the computer device via a wired network and/or a wireless network.

And 505, the computer device receives the weather monitoring data sent by the weather monitoring device.

It should be noted that, in the embodiment of the present application, the example is only described in which the computer device acquires the weather monitoring data by receiving the weather monitoring data sent by the weather monitoring device, and in other embodiments, the computer device may also acquire the weather monitoring data in other manners.

For example, the computer device may obtain weather monitoring data from a network. For example, the computer device may install a weather monitoring application through which weather monitoring data is obtained.

Step 506, the computer device receives the deposition thicknesses respectively sent by the at least one deposition thickness detection device, and obtains at least one deposition thickness corresponding to the at least one deposition thickness detection device one to one.

As an example, the computer device may obtain, according to the weather monitoring data, the deposition thicknesses that are respectively sent by the at least one deposition thickness detection device and satisfy the preset weather condition, to obtain the at least one deposition thickness.

Wherein the preset weather condition may be preset. If the preset weather condition can be clear weather, the influence of sand and dust weather, rainwater condensation weather, ice and snow weather and the like on the dust deposition thickness can be avoided, and the dust deposition thickness respectively sent by at least one dust deposition thickness detection device is more accurate.

As an example, according to the weather monitoring data, the operation of obtaining the deposition thicknesses meeting the preset weather condition respectively sent by at least one deposition thickness detection device may include the following two implementation manners:

the first implementation manner is that the accumulated dust thickness meeting the preset weather condition and sent by at least one accumulated dust thickness detection device is received, and the accumulated dust thickness meeting the preset weather condition is obtained from the received accumulated dust thickness according to the weather monitoring data to obtain at least one accumulated dust thickness.

In a second implementation manner, if it is determined that the preset weather condition is currently met according to the weather monitoring data, the deposition thicknesses respectively sent by the at least one deposition thickness detection device are received, and the at least one deposition thickness is obtained.

That is, the computer device obtains the deposition thicknesses respectively transmitted by the at least one deposition thickness detection device only when the preset weather condition is satisfied.

As an example, the computer device may also receive the deposition thicknesses respectively sent by the at least one deposition thickness detection device when a preset weather condition is met and a preset time condition is met, so as to obtain at least one deposition thickness.

Wherein the preset weather condition and the preset time condition may be preset. For example, the preset weather condition may be clear weather, and the preset time condition may be a preset time condition adjusted according to the weather condition. For example, the weather monitoring data indicates that the weather is sand weather from 12 o 'clock to 3 o' clock in the night, and clear weather from 3 o 'clock to 5 o' clock in the morning, the time for acquiring the deposition thickness is set to be 3 o 'clock in the morning to 5 o' clock in the morning, so that the accuracy of the deposition thickness is further ensured to be high.

In addition, the computer equipment can determine whether the surface of the photovoltaic module meets the cleaning condition according to the at least one dust deposition thickness, and if the surface of the photovoltaic module meets the cleaning condition, the photovoltaic module is cleaned and alarmed. Wherein, wash and report an emergency and ask for help or increased vigilance and be used for the suggestion to wash photovoltaic module.

As an example, the manner in which the computer device performs the cleaning alarm on the photovoltaic module may be implemented in two manners as follows:

the first implementation mode comprises the following steps: and sending alarm information, wherein the alarm information is used for prompting that the photovoltaic module is cleaned. That is, the computer device itself has a cleaning alarm function, and the cleaning alarm can be directly performed by the computer device.

The second implementation mode comprises the following steps: and generating an alarm instruction, sending the alarm instruction to alarm equipment, and sending alarm information by the alarm equipment. The embodiment of the present application takes an example of sending out alarm information by an alarm device as an example.

And 507, generating an alarm instruction by the computer equipment according to the at least one dust deposition thickness, wherein the alarm instruction is used for indicating alarm equipment to alarm.

The computer equipment can determine whether the surface of the photovoltaic module meets the cleaning condition according to the at least one dust deposition thickness, and if the surface of the photovoltaic module meets the cleaning condition, an alarm instruction is generated.

Wherein the operation of the computer device determining whether the surface of the photovoltaic module meets the cleaning condition according to the at least one dust deposition thickness may comprise: determining the overall power generation loss cost and the overall theoretical cleaning cost of the photovoltaic module according to at least one dust deposition thickness; and determining whether the surface of the photovoltaic module meets the cleaning condition or not according to the whole power generation loss cost and the whole theoretical cleaning cost of the photovoltaic module.

As one example, if the overall theoretical cleaning cost is less than the overall power generation loss cost, it is determined that the surface of the photovoltaic module satisfies the cleaning condition. And if the integral theoretical cleaning cost is more than or equal to the integral power generation loss cost, determining that the surface of the photovoltaic module does not meet the cleaning condition.

As an example, the operation of the computer device to determine an overall power generation loss cost and an overall theoretical cleaning cost of the photovoltaic module based on the at least one deposited dust thickness may comprise the steps of:

1) and determining the power generation loss proportion and the theoretical cleaning cost corresponding to each dust deposition thickness according to each dust deposition thickness in the at least one dust deposition thickness.

And each dust deposition thickness is the dust deposition thickness on the surface of the photovoltaic module detected by the corresponding dust deposition thickness detection device, and the generated energy loss proportion and the theoretical cleaning cost of the corresponding photovoltaic module can be determined according to each dust deposition thickness.

As an example, the at least one deposition thickness is a deposition thickness detected by at least one deposition thickness detection device, and the at least one deposition thickness detection device may be mounted on at least one photovoltaic module, so that the at least one deposition thickness may be a deposition thickness of the at least one photovoltaic module, that is, the at least one deposition thickness corresponds to the at least one photovoltaic module one to one. For example, the at least one deposition thickness may be n deposition thicknesses, and the n deposition thicknesses correspond to the n photovoltaic modules one to one.

As an example, the power generation loss ratio and the theoretical cleaning cost of the first photovoltaic module corresponding to the first deposition thickness may be determined according to the first deposition thickness. Wherein the first deposition thickness is any one of the at least one deposition thickness. The first photovoltaic module is detected by the dust deposition thickness detection device corresponding to the first dust deposition thickness.

For example, the power generation loss ratio of the first photovoltaic module may be determined from the first dust deposition thickness by the following formula (1):

d1＝(w1-q×p×w1)/w1 (1)

wherein w1 is the theoretical power generation capacity of the first photovoltaic module, and can be the theoretical power generation capacity of the first photovoltaic module for one day, and w1 can be an empirical value; q is the first dust deposition thickness; p is a generated energy loss proportion coefficient corresponding to the dust deposition thickness, and represents the electric quantity loss proportion of the corresponding photovoltaic module when the dust deposition thickness is q; d1 is the power generation loss proportion of the first photovoltaic module, and can be the power generation loss proportion of the first photovoltaic module in one day.

And obtaining the generated energy loss proportional coefficient p corresponding to the dust deposition thickness through advanced testing. For example, a light source can be used for irradiating a deposited dust thickness detection device on the surface of a photovoltaic module in a dark space, under the condition that different known deposited dust thicknesses are deposited on the surface of the deposited dust thickness detection device, the generated energy data of the photovoltaic module is tested according to preset time times under different deposited dust thicknesses, and the generated energy data and the deposited dust thickness of the photovoltaic module are fitted by using a polynomial, so that the generated energy loss proportional coefficient p corresponding to the deposited dust thicknesses under different deposited dust thicknesses can be obtained. p may be a set of varying data, with different dust deposition thicknesses corresponding to different values of p.

The power generation loss proportional coefficient p corresponding to different dust deposition thicknesses can be represented by a fitting curve or other manners, and the comparison in the embodiment of the application is not limited.

For example, the theoretical cleaning cost of the first photovoltaic module can also be determined from the first deposition thickness by the following equation (2):

c1＝q×k×c，i＝1,…,n (2)

wherein q is the dust deposition thickness; k is a dust deposition thickness mapping cleaning cost proportionality coefficient which represents the corresponding cleaning cost proportionality coefficient when the dust deposition thickness is q; c is theoretical cleaning cost per unit dust deposition thickness and is an empirical value; c1 is the theoretical cleaning cost for the first photovoltaic module, which may be the theoretical cleaning cost required to clean the first photovoltaic module.

2) And determining the integral generating capacity loss cost of the photovoltaic module according to the generating capacity loss proportion corresponding to the at least one dust deposition thickness, and determining the integral theoretical cleaning cost of the photovoltaic module according to the theoretical cleaning cost corresponding to the at least one dust deposition thickness.

As one example, the overall power generation loss proportion of the photovoltaic module for one day may be calculated before the overall power generation loss cost is calculated. The overall power generation loss proportion can be determined according to the power generation loss proportion corresponding to at least one dust deposition thickness.

For example, if the thickness of dust deposited on the ith photovoltaic module in the n photovoltaic modules is q_iThen, according to the above formula (1), the power generation loss ratio of the ith photovoltaic module in one day can be determined as: d1_i＝(w1-q_i×p_iXw 1)/w 1. Wherein w1 is the theoretical power generation amount of a single photovoltaic module in one day and is an empirical value; q. q.s_iThe accumulated dust thickness of the ith photovoltaic module is the accumulated dust thickness detected by the accumulated dust thickness detection device; p is a radical of_iMapping the power generation loss proportional coefficient for the ith photovoltaic module dust deposition thickness to represent the dust deposition thickness q_iThe power loss proportion of the photovoltaic module in one day is corresponding; d1_iThe power generation loss ratio of the ith photovoltaic module in one day is shown.

According to the power generation loss ratio d1 of the ith photovoltaic module in one day_iThe overall power generation loss ratio of the n photovoltaic modules in one day can be determined by the following formula (3):

wherein, d1_iThe power generation loss proportion of the ith photovoltaic module in one day is obtained; d2 is the overall power generation loss ratio, which represents the overall power generation loss ratio of n photovoltaic modules in one day.

It should be noted that, in the embodiment of the present application, the theoretical power generation amounts of the individual photovoltaic modules in at least one photovoltaic module are all calculated as an example.

Then, the total power generation amount loss cost can be determined by the following formula (4) based on the total power generation amount loss proportion d 2:

c2＝w2×d2×t×Y (4)

wherein w2 is the integral theoretical power generation capacity, which represents the theoretical power generation capacity of n photovoltaic modules in one day,n is the number of the photovoltaic modules, and w1 is the theoretical power generation amount of a single photovoltaic module in one day; d2 is the integral power generation loss proportion of the n photovoltaic modules in one day; t is the price of unit electricity quantity; y is a future time period; c2 is the total power generation loss cost, which represents the total power generation loss cost of the n photovoltaic modules in the future time period Y.

According to the theoretical cleaning cost respectively corresponding to at least one dust deposition thickness, the overall cleaning theoretical cost can be determined by the following formula (5):

wherein k is_wThe weather influence factor represents the influence of the overall weather in the future time period Y on the cleaning cost; n is the number of photovoltaic modules; c1_iTheoretical cleaning cost required for cleaning the ith photovoltaic module; c3 is the total cleaning theoretical cost, which represents the total cleaning theoretical cost of the n photovoltaic modules in the future time period Y.

Can be confirmed by the formula (2)C1_i＝k_i×q_iX c. Wherein k is_iMapping a cleaning cost scaling factor for the dust deposit thickness, representing the dust deposit thickness as q_iProportional coefficient of time-corresponding cleaning cost; q. q.s_iThe dust deposition thickness of the ith photovoltaic module; c is the theoretical cleaning cost per unit dust deposition thickness and is an empirical value.

As shown in the formula (4) and the formula (5), the influence of the dust deposition thickness on the cleaning cost is considered for the whole power generation loss cost and the whole theoretical cleaning cost. In addition, the overall power generation loss cost is a prediction of the overall power generation loss cost in the future time period Y of the n photovoltaic modules. The overall theoretical cleaning cost is also a prediction of the overall cleaning theoretical cost of the n photovoltaic modules in the future time period Y, and the influence of the overall weather in the future time period Y on the cleaning cost is considered, such as natural rainfall, so that the cleaning effect is achieved. It can be seen that the cleaning alarm in the embodiment of the application is sent in advance through prediction, is not a simple threshold control method, has certain advance, and is more economic, more reasonable and more scientific.

As an example, the overall power generation loss cost and the overall theoretical cleaning cost may also be determined in other ways, such as by taking the cleaning cost of a single photovoltaic module as a fixed value and multiplying that value by the number of photovoltaic modules n and k_wThe overall theoretical cleaning cost is obtained.

As an example, the computer device may also determine whether the surface of the photovoltaic module satisfies the cleaning condition according to other relationships between the overall theoretical cleaning cost and the overall power generation loss cost, which is not limited in the embodiment of the present application.

In step 508, the computer device sends an alert instruction to the alerting device.

The computer device may send the alert instruction to the alert device via a wired network and/or a wireless network.

In step 509, the alarm device receives the alarm command sent by the computer device and sends out alarm information.

And the warning information is used for prompting that the photovoltaic module is cleaned. Through the alarm information, a user or other equipment can make corresponding response actions, so that the continuous accumulation of dust is avoided, and the influence of the dust on the power generation efficiency of the photovoltaic power generation system is reduced.

And step 510, if the computer equipment receives a cleaning starting instruction, generating a cleaning instruction, wherein the cleaning instruction is used for instructing the cleaning equipment to clean the photovoltaic module.

The cleaning starting instruction can be triggered by a user, or can be automatically triggered by computer equipment when the photovoltaic module meets the cleaning condition according to at least one dust deposition thickness.

For example, after the alarm device sends the alarm information, the user may execute a cleaning start operation on the computer device according to the alarm information, and if the computer device detects the cleaning start operation, a cleaning instruction may be generated.

In step 511, the computer device sends a cleaning instruction to the cleaning device.

The alert device may send the cleaning instructions to the cleaning device via a wired network and/or a wireless network.

And step 512, the cleaning equipment receives a cleaning instruction sent by the computer equipment.

And 513, cleaning the photovoltaic module by the cleaning equipment according to the cleaning instruction.

Through the washing to photovoltaic module, can avoid the lasting accumulation of dust, reduce the influence of dust to photovoltaic power generation system's generating efficiency.

It should be noted that steps 503 to 505, steps 508 to 509, and steps 510 to 513 are optional steps. In addition, steps 503 to 505 may be performed after steps 501 to 502, before steps 501 to 502, or simultaneously with steps 501 to 502, and the execution order of steps 503 to 505 and steps 501 to 502 is not limited in the embodiment of the present application.

In addition, steps 508 to 509 may be performed after steps 510 to 513, before steps 510 to 513, or simultaneously with steps 510 to 513, and the execution order of steps 508 to 509 and steps 510 to 513 is not limited in this embodiment of the application.

The accumulated dust cleaning warning method provided by the embodiment of the application can acquire the accumulated dust thickness meeting the preset weather condition detected by the accumulated dust thickness detection device according to the weather monitoring data, determine the whole power generation loss cost and the whole theoretical cleaning cost of the photovoltaic module according to the accumulated dust thickness, and clean and warn the photovoltaic module according to the whole power generation loss cost and the whole theoretical cleaning cost of the photovoltaic module. Therefore, the photovoltaic module can be cleaned more economically and reasonably.

It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program instructing relevant hardware, where the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.

The above description is only exemplary of the present application and should not be taken as limiting, as any modification, equivalent replacement, or improvement made within the spirit and principle of the present application should be included in the protection scope of the present application.