阅读说明：本技术 一种新型温度传感器高低温测试装置 (Novel high and low temperature testing device for temperature sensor ) 是由 裴艳荣 李文昌 鉴海防 于 2021-01-13 设计创作，主要内容包括：本发明公开了一种新型温度传感器高低温测试装置,包括：箱体,用于改变箱体内部的测试温度并放置测试模块；测试模块,可拆卸设置于箱体内侧,用于进行手动测试或自动化测试；显示模块,位于箱体上,用于显示信息和接收输入数据；分拣模块,用于放置和转移待测元器件；控制模块,位于箱体内部,与箱体、测试模块、显示模块、分拣模块电性连接,用于控制测试装置稳定运行。其中,测试模块包括：手动测试模块和自动测试模块。本发明提供的新型温度传感器高低温测试装置结构简单,能够实现手动测试和自动测试两种测试模式,应用面广,并且能够实现批量元器件测试,极大提高了测试效率,节省测试时间。(The invention discloses a novel high-low temperature testing device for a temperature sensor, which comprises: the box body is used for changing the testing temperature in the box body and placing the testing module; the test module is detachably arranged on the inner side of the box body and is used for carrying out manual test or automatic test; the display module is positioned on the box body and used for displaying information and receiving input data; the sorting module is used for placing and transferring the components to be tested; and the control module is positioned inside the box body, is electrically connected with the box body, the test module, the display module and the sorting module and is used for controlling the stable operation of the test device. Wherein, the test module includes: a manual test module and an automatic test module. The novel high-low temperature testing device for the temperature sensor, provided by the invention, has a simple structure, can realize two testing modes of manual testing and automatic testing, is wide in application range, can realize batch component testing, greatly improves the testing efficiency and saves the testing time.)

1. The utility model provides a novel high low temperature test of temperature sensor device which characterized in that includes:

the box body is used for changing the testing temperature in the box body and placing the testing module;

the test module is detachably arranged on the inner side of the box body and is used for performing manual test or automatic test;

the display module is positioned on the box body and used for displaying information and receiving input data;

the sorting module is used for placing and transferring the components to be tested;

and the control module is positioned inside the box body, is electrically connected with the box body, the test module, the display module and the sorting module and is used for controlling the stable operation of the test device.

2. The novel high and low temperature testing device for the temperature sensor as claimed in claim 1, wherein a first through hole is formed in one side of the box body, and a second through hole and a rectangular groove are formed in the opposite side of the first through hole.

3. The novel high and low temperature testing device for the temperature sensor according to claim 1, wherein the testing module comprises:

the manual testing module is positioned on one side of the second through hole on the box body and used for performing manual testing;

and the automatic test module is positioned on one side of the first through hole on the box body and used for carrying out automatic test.

4. The novel high and low temperature testing device for the temperature sensor according to claim 3, wherein the manual testing module comprises:

the flat plate support is used for supporting a first sample box, wherein one end of the flat plate support is fixedly provided with a handle, a sealing ring is arranged on the outer side of the handle close to the flat plate support, and the flat plate support is clamped on a second through hole in the box body through the sealing ring;

and the plurality of first sample boxes are uniformly fixed on the upper side of the flat support and used for placing the components to be tested.

5. The novel high and low temperature testing device for the temperature sensor according to claim 3, wherein the automatic testing module comprises:

the transmission device is clamped on one side of the first through hole on the box body and used for transmitting the component to be tested; the transmission device comprises two transmission shafts and a first transmission belt, and the two transmission shafts are respectively positioned at the first through hole and the inner side of the rectangular groove on the box body; the first conveyor belt is wrapped on the outer sides of the two transmission shafts;

the second sample boxes are uniformly fixed on the upper side of the first conveyor belt and used for placing the components to be tested;

the leading-in device is clamped on the first through hole on the box body and used for leading the component to be tested in the sorting module into the second sample box;

the first mechanical arm is fixed on one side, close to the first through hole, in the box body and used for moving the component to be tested on the lead-in device into the second sample box;

and the electric control door is fixed on the rectangular groove and used for controlling the component to be tested to enter and exit.

6. The novel high and low temperature testing device for the temperature sensor as claimed in claim 5, wherein the lead-in device comprises a housing, and a second conveyor belt is arranged in the housing; and the second conveying belt is uniformly provided with partition blocks.

7. The novel high and low temperature testing device for the temperature sensor as claimed in claim 5, wherein a handle is arranged on the electric control door, and a mode switching button is arranged on the handle and used for controlling the switching between a manual mode and an automatic mode of the electric control door.

8. The novel high and low temperature testing device for the temperature sensor according to claim 1, wherein the display module comprises:

the display screen is fixed on the upper side of the box body and used for displaying error information, alarm information and set parameters;

the power button is positioned on one side of the display screen and used for controlling the test device to start or stop running;

the equipment self-checking button is positioned on one side of the display screen and used for controlling the testing device to perform self-checking;

the emergency stop button is positioned on one side of the display screen and used for controlling the test device to stop running emergently;

and the setting button is positioned on one side of the display screen and used for adjusting the testing temperature and related parameters of the testing device.

9. The novel high and low temperature testing device for the temperature sensor according to claim 1, wherein the sorting module comprises:

the sorting box is used for placing the component box to be tested and fixing the second mechanical arm;

the component box to be tested is placed in the sorting box and used for containing the components to be tested;

the second mechanical arm is fixed on the inner wall of the sorting box, is positioned above the component box to be tested and is used for moving the component to be tested to the automatic test module.

10. The novel high and low temperature testing device for the temperature sensor according to claim 1, wherein the control module comprises:

the connection unit is used for being connected with the terminal, converting the control instruction into a control signal and transmitting the control signal to the signal processing unit;

the signal processing unit is used for processing the received control signal and feeding the control signal back to the control unit;

and the control unit is used for receiving the feedback information of the control unit and controlling the test module and the sorting module to work.

Technical Field

The invention belongs to the technical field of test equipment, and particularly relates to a novel high-low temperature test device for a temperature sensor.

Background

With the rapid development of microelectronic technology, the functions of integrated circuits are becoming more and more abundant, and thus the requirements for integrated circuits are becoming higher and higher. And a temperature sensor, which is a member of the sensors, is therefore also widely paid attention. The temperature sensor is a sensor capable of detecting temperature, and the temperature precision of the temperature sensor needs to be detected when the temperature sensor detects the temperature, so that a high-temperature and low-temperature testing device is used. As is well known, a high-temperature and low-temperature testing apparatus is one of the indispensable items in integrated circuit testing, and the high-temperature and low-temperature environment has a great influence on the function and performance of a temperature sensor.

The traditional high-low temperature testing device needs to continuously open the oven door during testing, so that the testing speed is greatly reduced, and the large-batch testing process is hindered. And some enterprises in the industry adopt heat flow cover test equipment, but the price is high, the test cost is greatly increased, and the method has limited number of chips tested at one time and lower practicability.

Disclosure of Invention

In view of the above technical problems, the present invention provides a novel high and low temperature testing device for temperature sensors, so as to fill up the requirement of batch testing of temperature sensor products, provide the research and development direction of high-efficiency and fast high and low temperature testing devices, and solve the problems of high cost and low testing efficiency of high and low temperature testing devices.

In an aspect of the embodiments of the present invention, there is provided a novel temperature sensor high and low temperature testing apparatus, including:

the box body is used for changing the testing temperature in the box body and placing the testing module;

the testing module is detachably arranged on the inner side of the box body and is used for performing manual testing or automatic testing;

the display module is positioned on the box body and used for displaying information and receiving input data;

the sorting module is used for placing and transferring the components to be tested;

and the control module is positioned in the box body, is electrically connected with the box body, the test module, the display module and the sorting module, and is used for controlling the stable operation of the test device.

In an embodiment of the present invention, a first through hole is formed at one side of the case, and a second through hole and a rectangular groove are formed at an opposite side of the first through hole.

In another embodiment of the present invention, the test module includes:

the manual testing module is positioned on one side of the second through hole on the box body and used for performing manual testing;

and the automatic test module is positioned on one side of the first through hole on the box body and used for carrying out automatic test.

In another embodiment of the present invention, the manual test module includes:

the flat plate support is used for supporting a first sample box, wherein one end of the flat plate support is fixedly provided with a handle, the outer side of the handle close to the end of the flat plate support is provided with a sealing ring, and the flat plate support is clamped on a second through hole in the box body through the sealing ring;

and the plurality of first sample boxes are uniformly fixed on the upper side of the flat support and used for placing the components to be tested.

In yet another embodiment of the present invention, the automatic test module includes:

the transmission device is clamped on one side of the first through hole on the box body and is used for transmitting the component to be tested; the transmission device comprises two transmission shafts and a first transmission belt, and the two transmission shafts are respectively positioned in the first through hole and the inner side of the rectangular groove on the box body; the first conveyor belt is wrapped on the outer sides of the two transmission shafts;

the second sample boxes are uniformly fixed on the upper side of the first conveyor belt and used for placing the components to be tested;

the leading-in device is clamped on the first through hole on the box body and used for leading the component to be tested in the sorting module into the second sample box;

a first mechanical arm fixed on one side of the box body close to the first through hole and used for moving the component to be tested on the leading-in device into the second sample box;

and the electric control door is fixed on the rectangular groove and used for controlling the component to be tested to enter and exit.

In yet another embodiment of the present invention, the introducing means includes a housing, in which the second conveyor belt is provided; and the second conveying belt is uniformly provided with partition blocks.

In another embodiment of the present invention, the electric control door is provided with a handle, and the handle is provided with a mode switching button for controlling the switching between the manual mode and the automatic mode of the electric control door.

In still another embodiment of the present invention, the display module includes:

the display screen is fixed on the upper side of the box body and used for displaying error information, alarm information and set parameters;

the power button is positioned on one side of the display screen and used for controlling the test device to start or stop running;

the equipment self-checking button is positioned on one side of the display screen and used for controlling the self-checking of the testing device;

the emergency stop button is positioned at one side of the display screen and is used for controlling the test device to stop running emergently;

and the setting button is positioned on one side of the display screen and used for adjusting the testing temperature and related parameters of the testing device.

In yet another embodiment of the present invention, the sorting module includes:

the sorting box is used for placing the component box to be tested and fixing the second mechanical arm;

the component box to be tested is placed in the sorting box and used for containing the components to be tested;

the second mechanical arm is fixed on the inner wall of the sorting box, is positioned above the component box to be tested and is used for moving the component to be tested to the automatic test module.

In still another embodiment of the present invention, the control module includes:

the connection unit is used for being connected with the terminal, converting the control instruction into a control signal and transmitting the control signal to the signal processing unit;

the signal processing unit is used for processing the received control signal and feeding the processed control signal back to the control unit;

the control unit is used for receiving the feedback information of the control unit and controlling the test module and the sorting module to work.

According to the technical scheme, the novel high-low temperature testing device for the temperature sensor has the following beneficial effects:

(1) the novel high-low temperature testing device for the temperature sensor, provided by the invention, has a simple structure, can realize two testing modes of manual testing and automatic testing, is wide in application range, can realize batch component testing, greatly improves the testing efficiency and saves the testing time.

(2) The novel high-low temperature testing device for the temperature sensor is low in use cost, and can be used for simply transforming the existing incubator; moreover, the invention is detachable, is convenient for repairing and replacing elements and is convenient for use and maintenance.

(3) The novel high-low temperature testing device for the temperature sensor can adjust parameters such as speed, time and the like of the automatic testing module at will through the display module, can customize sample boxes with different shapes and materials, and has high compatibility and practicability.

Drawings

Fig. 1 is a schematic structural diagram of a high-temperature and low-temperature testing device for a novel temperature sensor provided by an embodiment of the invention.

Fig. 2 is a schematic block diagram of a novel high-low temperature testing device for a temperature sensor according to an embodiment of the present invention.

Fig. 3 is a schematic structural diagram of a manual test module according to an embodiment of the present invention.

Fig. 4 is a schematic structural diagram of an automatic test module according to an embodiment of the present invention.

Fig. 5 is a schematic structural diagram of a control module according to an embodiment of the present invention.

Description of reference numerals: 1. a box body; 2. a manual test module; 3. an automatic test module; 4. a control module; 5. a display module; 6. a sorting module; 21. a plate holder; 22. a handle; 23. a seal ring; 24. a first sample cartridge; 31. an electrically controlled door; 32. a handle; 33. a first conveyor belt; 34. a mode switching button; 35. a drive shaft; 36. a second sample cartridge; 37. a lead-in device; 38. a first robot arm; 41. a connection unit; 42. a signal processing unit; 43. a control unit; 51. a power button; 52. an equipment self-checking button; 53. an emergency stop button; 54. setting a button; 55. a display screen; 61. a second mechanical arm; 62. and (5) a component box to be tested.

Detailed Description

In order that the objects, technical solutions and advantages of the present invention will become more apparent, the present invention will be further described in detail with reference to the accompanying drawings in conjunction with the following specific embodiments.

It should be understood that the description is illustrative only and is not intended to limit the scope of the present disclosure. In the following detailed description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of the embodiments of the disclosure. It may be evident, however, that one or more embodiments may be practiced without these specific details. Moreover, in the following description, descriptions of well-known structures and techniques are omitted so as to not unnecessarily obscure the concepts of the present disclosure.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the disclosure. The terms "comprises," "comprising," and the like, as used herein, specify the presence of stated features, steps, operations, and/or components, but do not preclude the presence or addition of one or more other features, steps, operations, or components.

All terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art unless otherwise defined. It is noted that the terms used herein should be interpreted as having a meaning that is consistent with the context of this specification and should not be interpreted in an idealized or overly formal sense.

Where a convention analogous to "at least one of A, B and C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B and C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.). Where a convention analogous to "A, B or at least one of C, etc." is used, in general such a construction is intended in the sense one having skill in the art would understand the convention (e.g., "a system having at least one of A, B or C" would include but not be limited to systems that have a alone, B alone, C alone, a and B together, a and C together, B and C together, and/or A, B, C together, etc.).

The novel temperature sensor high and low temperature testing device according to the exemplary embodiment of the present invention is described below with reference to fig. 1 and 2.

FIG. 1 is a schematic structural diagram of a novel temperature sensor high and low temperature testing device provided by an exemplary embodiment of the invention; fig. 2 is a schematic block diagram of a novel temperature sensor high and low temperature testing device provided by an exemplary embodiment of the invention.

The novel high and low temperature testing device for the temperature sensor provided by the exemplary embodiment of the invention comprises: the box 1, test module, control module 4, display module 5 and letter sorting module 6.

The box body 1 is used for changing the test temperature in the box body 1 and placing a test module; wherein, first through-hole has been seted up to 1 one side of box, has seted up second through-hole and rectangular channel at first through-hole offside. It should be noted that, in this embodiment, the diameters and sizes of the first through hole and the second through hole may be adjusted according to the use requirement; in addition, the case 1 of the present embodiment is a metal material capable of withstanding a plurality of temperature range changes including, but not limited to, 60 degrees below zero to 155 degrees above zero.

The testing module is detachably arranged on the inner side of the box body 1 and used for carrying out manual testing or automatic testing. It should be noted that the test module of the present embodiment includes a manual test module 2 and an automatic test module 3, where the manual test module 2 is located at one side of the second through hole on the box body 1, and can perform manual and small-amount temperature sensor tests; the automatic test module 3 is positioned on one side of the first through hole on the box body 1, and can automatically test the temperature sensors in batches.

And the display module 5 is positioned on the box body 1 and used for displaying information and receiving input data. And the sorting module 6 is used for placing and transferring the components to be tested. And the control module 4 is positioned inside the box body 1, is electrically connected with the box body 1, the test module, the display module 5 and the sorting module 6, and is used for controlling the stable operation of the test device.

According to the embodiment of the invention, two test modes of manual test and automatic test can be realized, the application range is wide, the batch component test can be realized, the test efficiency is greatly improved, and the test time is saved.

The manual testing module provided by the embodiment of the present invention is further explained with reference to fig. 3, and fig. 3 schematically illustrates a structural diagram of the manual testing module.

In this embodiment, the manual testing module 2 includes a flat bracket 21 and a plurality of first sample boxes 24, wherein a handle 22 is fixed at one end of the flat bracket 21, a sealing ring 23 is arranged at the outer side of the handle 22 close to the end of the flat bracket 21, and the flat bracket 21 is clamped on the second through hole of the box body 1 through the sealing ring 23; the plurality of first sample boxes 24 are uniformly fixed on the upper side of the flat plate support 21 and used for placing components to be tested. It should be noted that the flat plate support 21 of the present embodiment may be a square or rectangular flat plate structure, or may be a flat plate structure with any other shape; the first sample box 24 is round or square, and the shape and the size can be customized according to the use requirement, so that different test requirements can be met. Meanwhile, the plate holder 21, the first sample box 24 and the handle 22 of the present embodiment are all made of metal materials capable of withstanding a plurality of temperature range changes including but not limited to-60 degrees to-155 degrees, and the sealing ring 23 is made of flexible materials capable of withstanding a plurality of temperature range changes including but not limited to-60 degrees to-155 degrees.

According to the embodiment of the invention, the manual test module 2 can perform manual test and a small amount of tests, the test method is flexible, and different test requirements can be met.

The automatic test module provided by the embodiment of the present invention is further explained with reference to fig. 4, and fig. 4 schematically illustrates a structural diagram of the automatic test module.

In this embodiment, the automatic test module 3 comprises an actuator, an electrically controlled door 31, a plurality of second sample cartridges 36, an introduction device 37 and a first robotic arm 38.

The transmission device comprises two transmission shafts 35 and a first transmission belt 33, wherein the two transmission shafts 35 are respectively positioned at the inner sides of the first through hole and the rectangular groove on the box body 1, and the first transmission belt 33 is wrapped at the outer sides of the two transmission shafts 35; the second sample boxes 36 are uniformly fixed on the upper side of the first conveyor belt 33 and used for placing components to be tested; the leading-in device 37 is clamped on the first through hole on the box body 1 and is used for leading the component to be tested in the sorting module 6 into the second sample box 36; the first mechanical arm 38 is fixed on one side, close to the first through hole, in the box body 1, and is used for moving the component to be tested on the lead-in device 37 into the second sample box 36, so that the vibration and surface abrasion of the component to be tested when the component falls from the lead-in device 37 into the second sample box 36 can be effectively prevented; and the electric control door 31 is fixed on the rectangular groove and used for controlling the component to be tested to enter and exit. It should be noted that the second sample box 36 of the present embodiment is a metal material capable of withstanding a plurality of temperature range changes including, but not limited to, 60 degrees below zero to 155 degrees above zero, and the first conveyor belt 33 is a flexible material capable of withstanding a plurality of temperature range changes including, but not limited to, 60 degrees below zero to 155 degrees above zero.

According to the embodiment of the invention, the automatic test module 3 can carry out automatic test, the test method is flexible, different test requirements can be adapted, the requirement of batch test of temperature sensor products can be met, the research and development directions of the high-efficiency and rapid high-low temperature test device are provided, and the problems of high cost and low test efficiency of the high-low temperature test device are solved.

In the present embodiment, the introducing device 37 includes a housing, a second conveyor belt provided in the housing, and a plurality of partition blocks; the plurality of partition blocks are uniformly arranged on the second conveying belt and used for partitioning each component to be tested, and the component to be tested is conveniently placed into the sample box to be loaded later. It should be noted that the second conveyor belt is a flexible material capable of withstanding a plurality of temperature range changes including, but not limited to, 60 degrees below zero to 155 degrees above zero.

In the present embodiment, a handle 32 is disposed on the electric control door 31, a mode switching button 34 is disposed on the handle 32, and the mode switching button 34 is used for controlling the switching between the manual mode and the automatic mode of the electric control door 31.

In this embodiment, the running speeds of the first conveyor belt 33 and the second conveyor belt are precisely controlled by the signal instruction sent by the control module 4, so that each temperature sensor can stay in the temperature environment of the novel high-low temperature incubator body 1 for more than 30 minutes. This is the requirement of temperature sensor test experimental standard, and the inside personnel of trade all know, and the no longer repeated here.

According to the embodiment of the invention, the manual mode can enable a user to manually open the electric control door 31 at any time according to requirements; in the automatic mode, the opening interval time can be set, and the electric control door 31 can be opened circularly according to the set interval time.

The automatic test module 3 provided by the embodiment of the present invention is further explained with reference to fig. 1.

In the present embodiment, the display module 5 includes: a power button 51, a device self-test button 52, an emergency stop button 53, a set button 54, and a display screen 55. The display screen 55 is fixed on the box body 1 and used for displaying error information, alarm information and set parameters; the power button 51 is positioned at one side of the display screen 55 and is used for controlling the test device to start or stop running; the equipment self-test button 52 is positioned on one side of the display screen 55 and is used for controlling the self-test of the test device; the emergency stop button 53 is positioned on one side of the display screen 55 and is used for controlling the test device to stop running emergently; a set button 54 is located on the side of the display screen 55 for adjusting the test temperature and related parameters of the test device.

According to the embodiment of the invention, the setting and control functions of the display module 5 can ensure that the whole device can run more safely and stably, and meanwhile, the display screen 55 can help a user to observe the running information of the equipment more intuitively.

The automatic test module 3 provided by the embodiment of the present invention is further explained with reference to fig. 4.

In the present embodiment, the sorting module 6 includes: the sorting box comprises a sorting box, a second mechanical arm 61 and a component box 62 to be tested, wherein the component box 62 to be tested is placed in the sorting box and used for containing components to be tested; the second mechanical arm 61 is fixed on the inner wall of the sorting box, is located above the component box 62 to be tested, and is used for moving the component to be tested to the automatic test module 3. It should be noted that the sorting box and the component box to be tested 62 are made of antistatic materials, and the shapes and sizes of the boxes can be adjusted according to the number of components to be tested.

According to the embodiment of the invention, the novel high-low temperature testing device for the temperature sensor is more automatic, labor and time cost are saved, and sorting efficiency is improved.

The automatic test module provided by the embodiment of the present invention is further explained with reference to fig. 5, which schematically shows a structural diagram of the control module 4.

In the present embodiment, the control module 4 includes: a connection unit 41, a signal processing unit 42 and a control unit 43. The connection unit 41 is used for connecting with a terminal, converting a control instruction into a control signal and transmitting the control signal to the signal processing unit 42; the signal processing unit 42 is used for processing the received control signal and feeding back the control signal to the control unit 43; the control unit 43 is used for receiving the feedback information of the control unit 43 and controlling the test module and the sorting module 6 to work.

So far, embodiments of the present invention have been described in detail with reference to the accompanying drawings. From the above description, those skilled in the art should clearly recognize that the high and low temperature testing apparatus for a novel temperature sensor of the present invention is provided. Furthermore, the above definitions of the various elements and methods are not limited to the particular structures, shapes or arrangements of parts mentioned in the embodiments, which may be readily substituted by those of ordinary skill in the art, such as: the material and the size of the box body 1 are changed; the flat plate support 21, can change its shape, size, material; similarly, the sample cell may be changed in material and shape, or may be changed in size as necessary.

In summary, the novel high and low temperature testing device for the temperature sensor provided by the invention utilizes the automatic testing module 3 to meet the requirement of batch testing of the sensor chips at high temperature and low temperature. The module has simple structure, simple and convenient operation and good practicability; and automatic test module 3 and manual test module 2 all can be dismantled, load on ordinary incubator, saved the cost of purchasing new incubator, have the convenient advantage of change part simultaneously. Meanwhile, the automatic test mode in the novel high-low temperature test device for the temperature sensor can adjust parameters such as speed, time and the like according to requirements, and the shape and the material of the sample box can be customized; the manual test module 2 can also customize styles and the like according to requirements, and has strong compatibility and practicability. The novel high-low temperature testing device for the temperature sensor solves the problem of low high-low temperature testing efficiency, and fills the blank of the automatic high-low temperature testing device for the temperature sensor.

The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.