Electronic endoscope processor and electronic endoscope system

文档序号：706127 发布日期：2021-04-16 浏览：2次中文

阅读说明：本技术 电子内窥镜用处理器及电子内窥镜系统 (Electronic endoscope processor and electronic endoscope system ) 是由林佳宏于 2017-08-25 设计创作，主要内容包括：一种电子内窥镜用处理器及电子内窥镜系统。电子内窥镜系统的、对使用拍摄元件拍摄到的被拍摄体的图像信号进行处理的电子内窥镜用处理器具备：照明光切换单元,将向被拍摄体照射的照明光在第一照明光和第二照明光之间交替切换；以及拍摄元件控制单元,对拍摄元件的曝光时间及电荷的读出定时进行控制。所述拍摄元件控制单元基于第一照明光的每单位时间的光束的时间积分量R1以及第二照明光的每单位时间的光束的时间积分量R2,对向被拍摄体照射第一照明光时的拍摄元件的曝光时间T1以及向被拍摄体照射第二照明光时的拍摄元件的曝光时间T2进行控制。(A processor for an electronic endoscope and an electronic endoscope system. A processor for an electronic endoscope, which processes an image signal of an object captured by an imaging element, of an electronic endoscope system, includes: an illumination light switching unit that alternately switches illumination light to be irradiated to the subject between first illumination light and second illumination light; and an imaging element control unit that controls an exposure time of the imaging element and a readout timing of the electric charges. The imaging element control unit controls an exposure time T1 of the imaging element when the first illumination light is applied to the object and an exposure time T2 of the imaging element when the second illumination light is applied to the object, based on a time integral amount R1 of the light beam per unit time of the first illumination light and a time integral amount R2 of the light beam per unit time of the second illumination light.)

1. A processor for an electronic endoscope that processes an image signal of an object captured by using an imaging element of a CMOS image sensor, the processor comprising:

an illumination light switching unit that switches illumination light irradiated to an object between first illumination light and second illumination light that differs from the first illumination light in an amount of time integration of a light beam per unit time; and

an imaging element control unit that controls an exposure time of the imaging element and a timing of reading out the electric charge,

the imaging element control unit controls an exposure time T1 of the imaging element when the subject is irradiated with the first illumination light and an exposure time T2 of the imaging element when the subject is irradiated with the second illumination light, based on a time integral amount R1 of the light beam per unit time of the first illumination light and a time integral amount R2 of the light beam per unit time of the second illumination light, so that the exposure time T1 is shorter than the exposure time T2,

the image pickup device reads out charges at a light receiving position of the image pickup device by a rolling shutter method while shifting timings of start and end of exposure at the light receiving position,

the first illumination light and the second illumination light illuminate the subject, and a transition period in which the first illumination light and the second illumination light are mixed is provided when the illumination light is switched between the first illumination light and the second illumination light, and the transition period is not included in an exposure period by the rolling shutter method of the image pickup device when the first illumination light and the second illumination light are illuminated separately,

the imaging element control unit sets the exposure time T2 so that exposure of all rows of the imaging element is performed in an irradiation period of the second illumination light not including the transition period, and then sets the exposure time T1 using the set exposure time T2, when performing control by the imaging element control unit.

2. The processor for an electronic endoscope according to claim 1,

the imaging element performs resetting of noise-accumulated charges before the readout of the charges performed first within the irradiation time of the second illumination light, the resetting of the noise-accumulated charges being performed within the transition period.

3. An electronic endoscope system includes:

an imaging element of a CMOS image sensor configured to receive light from the subject and output an image signal corresponding to the received light; and

an imaging element control unit that controls an exposure time of the imaging element and a timing of reading out the electric charge,

4. The electronic endoscope system of claim 3,

the electronic endoscope system further includes:

a processor for an electronic endoscope having the illumination light switching unit and the imaging element control unit; and

an electronic mirror having the imaging element and configured to be detachably connected to the processor for the electronic endoscope,

the processor for an electronic endoscope or the electronic endoscope includes: an amplifying unit that performs an amplification process on the image signal output from the imaging element; and a control unit that controls an amplification rate of the amplification process,

a first wavelength band of the first illumination light and a second wavelength band of the second illumination light are different from each other,

the control unit controls the amplification ratio applied to the image signal of the subject to which either one of the first illumination light and the second illumination light is irradiated, based on a calculation amount K1 regarding the first illumination light in the first wavelength band, a calculation amount K2 regarding the second illumination light in the second wavelength band, the exposure time T1, and the exposure time T2,

the calculation amount K1 is obtained by integrating the product of the light intensity distribution of the first illumination light in the first wavelength band and the quantum efficiency distribution of the imaging element in the first wavelength band over the range of the first wavelength band,

the calculation amount K2 is obtained by integrating the product of the light intensity distribution of the second illumination light in the second wavelength band and the quantum efficiency distribution of the imaging element in the second wavelength band over the range of the second wavelength band.

5. The electronic endoscope system of claim 3,

the illumination light switching unit sequentially switches illumination light irradiated to the subject among the first illumination light, the second illumination light, and third illumination light that is different from the first illumination light or the second illumination light in an amount of time integration of a light flux per unit time,

the imaging element control unit controls the exposure time T1, the exposure time T2, and the exposure time T3 based on the time integral amount R1, the time integral amount R2, and the time integral amount R3, the time integral amount R3 is a time integral amount of the light flux of the third illumination light per unit time, and the exposure time T3 is an exposure time of the imaging element when the third illumination light is irradiated to the object.

6. The electronic endoscope system of claim 3,

7. An electronic endoscope system includes:

an imaging element of a CMOS image sensor that receives light from the subject and outputs an image signal corresponding to the received light; and

an imaging element control unit that controls an exposure time of the imaging element and a timing of reading out the electric charge,

the imaging element control unit controls an exposure time T1 of the imaging element when the first illumination light is applied to the object and an exposure time T2 of the imaging element when the second illumination light is applied to the object to make the exposure time T1 shorter than the exposure time T2 based on a calculation amount K1 related to the first illumination light in a first wavelength band of the first illumination light and a calculation amount K2 related to the second illumination light in a second wavelength band of the second illumination light,

8. The electronic endoscope system of claim 7,

9. An electronic endoscope system includes:

an imaging element of a CMOS image sensor configured to receive light from the subject and output an image signal corresponding to the received light;

an image pickup device control unit that controls an exposure time of the image pickup device and a readout timing of the electric charges, the image pickup device being controlled such that the image pickup device picks up an image of the subject to which the first illumination light is applied for an exposure time T3, and picks up an image of the subject to which the second illumination light is applied for an exposure time T4;

an amplifying unit that performs an amplification process on the image signal output from the imaging element; and

a control unit that controls an amplification factor of the amplification process,

a first wavelength band of the first illumination light and a second wavelength band of the second illumination light are different from each other,

the control unit controls an amplification factor applied to the image signal of the object to which the other of the first illumination light and the second illumination light is irradiated to make the exposure time T3 shorter than the exposure time T4 based on an amplification factor applied to the image signal of the object to which either one of the first illumination light and the second illumination light is irradiated, a calculation amount K1 relating to the first illumination light in the first wavelength band, a calculation amount K2 relating to the second illumination light in the second wavelength band, the exposure time T3, and the exposure time T4,

the imaging element control unit sets the exposure time T4 so that exposure of all rows of the imaging element is performed in an irradiation period of the second illumination light not including the transition period, and then sets the exposure time T3 using the set exposure time T4, when performing control by the imaging element control unit.

10. The electronic endoscope system of claim 9,

Technical Field

The present invention relates to a processor for an electronic endoscope and an electronic endoscope system.

Background

In the field of medical equipment, the following electronic endoscope systems are known: by simultaneously observing illumination light using wavelength regions having different characteristics, diagnosis of a lesion is facilitated. For example, patent document 1 describes a specific configuration of such an electronic endoscope system.

Patent document 1 discloses an electronic endoscope system including: the subject is illuminated alternately with white normal light and special light having a wavelength band different from that of the normal light, and the object light from the subject is detected by a CMOS type image sensor. In a CMOS image sensor, a rolling shutter method is used, and exposure of pixels and readout of pixel signals are performed sequentially for each row. Therefore, when the subject is illuminated by alternately switching between the normal light and the special light, information of the subject in the case of the normal light and information of the subject in the case of the special light are mixed in the pixel signal. In the electronic endoscope system of patent document 1, in order to prevent information of a subject illuminated with different illumination lights from being mixed into a pixel signal, the illumination light is turned off every 1 frame, and the pixel signal is read while the illumination light is turned off.

Documents of the prior art

Patent document

Patent document 1: japanese laid-open patent publication No. 2010-068992

Disclosure of Invention

Technical problem to be solved by the invention

As in the electronic endoscope system described in patent document 1, when the subject is illuminated alternately with normal light and special light, there may be a difference in illuminance between the subject illuminated with the normal light and the subject illuminated with the special light. When the difference in illuminance between two subjects is large, if exposure correction is performed in accordance with one subject image, the other subject image may be overexposed or underexposed.

The present invention has been made in view of the above circumstances, and an object thereof is to provide a processor for an electronic endoscope and an electronic endoscope system that can capture an image of an object illuminated with arbitrary illumination light under appropriate exposure in a case where the object is observed using illumination light having different light amounts.

Means for solving the problems

A processor for an electronic endoscope according to an embodiment of the present invention is a processor for an electronic endoscope that processes an image signal of an object captured by an imaging element, the processor including: an illumination light switching unit that alternately switches illumination light irradiated to an object between first illumination light and second illumination light that differs from the first illumination light in an amount of time integration of a light beam per unit time; and an imaging element control unit that controls an exposure time of the imaging element and a readout timing of the electric charges. In this configuration, the imaging device control means controls the exposure time T1 of the imaging device when the first illumination light is applied to the object and the exposure time T2 of the imaging device when the second illumination light is applied to the object, based on the time integral amount R1 of the light flux per unit time of the first illumination light and the time integral amount R2 of the light flux per unit time of the second illumination light.

Here, according to an embodiment described later, the illumination light switching unit includes a rotary filter portion 260.

According to an embodiment described later, the image pickup device control unit is a circuit of the system controller 202, the timing controller 204, or the driver signal processing circuit 110. According to one embodiment, the control of the exposure time of the image pickup device and the timing of reading out the electric charges by the image pickup device control unit means that the system controller 202, which is at least a part of these circuits, generates a control signal for controlling the exposure time and the timing of reading out the electric charges, and transmits the control signal to the image pickup device via the timing controller 204 and the driver signal processing circuit 110. And the shooting element receives the control signal and performs an action corresponding to the control signal according to the control signal. The above is also cited in the illumination light switching unit and the imaging element control unit, which will be described later.

According to such a configuration, when two first illumination lights and two second illumination lights having different light amounts (time integral amounts of light fluxes per unit time) are alternately irradiated to the object, the exposure time of the image pickup device is adjusted according to the light amount of the illumination light irradiated to the object. Therefore, both the subject illuminated by the first illumination light and the subject illuminated by the second illumination light can be imaged with appropriate exposure.

Further, according to an embodiment of the present invention, it is preferable that the photographing element control unit adjusts the exposure time T1 and the exposure time T2 so as to satisfy T1 × R1 — T2 × R2.

In addition, according to an embodiment of the present invention, the electronic endoscope processor is configured to be attachable to and detachable from an electronic scope including an imaging element. In this configuration, it is preferable that the image pickup device control unit acquires an amplification factor of the amplification process performed on the image signal by at least one of the electronic endoscope and the processor for the electronic endoscope, and when the amplification factor of the amplification process performed on the image signal of the subject irradiated with the first illumination light is defined as G1 and the amplification factor of the amplification process performed on the image signal of the subject irradiated with the second illumination light is defined as G2, the image pickup device control unit adjusts the exposure time T1 and the exposure time T2 so as to satisfy T1 × R1 × G1 — T2 × R2 × G2.

Here, the acquisition of the amplification factor of the amplification process performed on the image signal by the image pickup device control unit means, in an embodiment described later, that information of the amplification factor stored in the memory 112 of the electronic mirror is read out from a circuit corresponding to the image pickup device control unit and acquired.

According to an embodiment described later, the amplification process is performed by a part of a circuit corresponding to the imaging element control unit or a preceding signal processing circuit 220. Therefore, according to an embodiment described later, the adjustment of the magnification ratio is also performed by a part of a circuit corresponding to the image pickup device control unit.

In one embodiment of the present invention, for example, the time during which the first illumination light is continuously applied to the subject is equal to the time during which the second illumination light is continuously applied to the subject.

Further, according to an embodiment of the present invention, it is preferable that the illumination light switching unit includes: a light source that emits white light; a rotating plate in which a first filter and a second filter are arranged in a substantially same angular range in a circumferential direction, the first filter filtering the white light into the first illumination light, and the second filter filtering the white light into the second illumination light; and a rotation driving unit configured to insert the first optical filter into an optical path of the white light during an irradiation period of the first illumination light and insert the second optical filter into the optical path during an irradiation period of the second illumination light by rotating the rotating plate.

Further, according to an embodiment of the present invention, it is preferable that the illumination light switching unit sequentially switches the illumination light irradiated to the subject among the first illumination light, the second illumination light, and a third illumination light, the third illumination light being different from the first illumination light or the second illumination light in an amount of time integration of the light flux per unit time. In this case, it is preferable that the imaging element control unit controls the exposure time T1, the exposure time T2, and the exposure time T3 based on the time integral amount R1, the time integral amount R2, and the time integral amount R3, the time integral amount R3 is a time integral amount of the light flux per unit time of the third illumination light, and the exposure time T3 is an exposure time of the imaging element when the object is irradiated with the third illumination light.

According to an embodiment of the present invention, it is preferable that the electronic endoscope system further includes: a processor for an electronic endoscope having the illumination light switching unit and the imaging element control unit; and an electronic mirror having the imaging element and configured to be detachably connected to the processor for the electronic endoscope, wherein the processor for the electronic endoscope or the electronic mirror includes: an amplifying unit that performs an amplification process on the image signal output from the imaging element; and a control unit that controls an amplification rate of the amplification process. The first wavelength band of the first illumination light and the second wavelength band of the second illumination light are different from each other. In this case, the control unit controls the amplification factor applied to the image signal of the subject to which either one of the first illumination light and the second illumination light is irradiated, based on the calculated amount K1 related to the first illumination light in the first wavelength band, the calculated amount K2 related to the second illumination light in the second wavelength band, the exposure time T1, and the exposure time T2. The calculation amount K1 is obtained by integrating the product of the light intensity distribution of the first illumination light in the first wavelength band and the quantum efficiency distribution of the imaging element in the first wavelength band in the range of the first wavelength band, and the calculation amount K2 is obtained by integrating the product of the light intensity distribution of the second illumination light in the second wavelength band and the quantum efficiency distribution of the imaging element in the second wavelength band in the range of the second wavelength band.

According to an embodiment described later, the control unit preferably includes the control unit driver signal processing circuit 110 or a system controller 202. According to an embodiment described later, the amplification unit includes the driver signal processing circuit 110 or the preceding stage signal processing circuit 220. The control unit controls the amplification factor by generating a control signal for setting the amplification factor in at least a part of the circuits and transmitting the control signal to the circuit corresponding to the amplification unit. And means that a circuit corresponding to the amplifying means is configured to receive the control signal and operate in accordance with the control signal. The above is also referred to in the control means and the amplification means described later.

According to an embodiment of the present invention, it is preferable that the control unit controls the amplification factors G3 and G4 based on G3 × T3 × K1 — G4 × T4 × K2 when the amplification factors applied to the image signals of the subject to which the first illumination light and the second illumination light are irradiated are defined as G3 and G4, respectively, and the exposure time of the imaging element when the first illumination light and the second illumination light are irradiated is defined as T3 and T4, respectively.

In addition, according to an embodiment of the present invention, the electronic endoscope system further includes: a processor for an electronic endoscope having the illumination light switching unit and the imaging element control unit; an electronic endoscope having the imaging element and detachably connected to the processor for the electronic endoscope; and an amplifying unit that performs an amplification process on the image signal output from the imaging element. In this configuration, the amplification means performs the amplification processing at an amplification factor G1 on the image signal of the subject to which the first illumination light is irradiated, and the amplification means performs the amplification processing at an amplification factor G2 on the image signal of the subject to which the second illumination light is irradiated. Further, it is preferable that the photographing element control unit adjusts the exposure time T1 and the exposure time T2 so that T1 × R1 × G1 — T2 × R2 × G2 is satisfied.

According to an embodiment of the present invention, it is preferable that the wavelength band of the first illumination light and the wavelength band of the second illumination light are different from each other, and when average quantum efficiencies in the wavelength bands of the first illumination light and the second illumination light in the image pickup device are defined as AQE1 and AQE2, respectively, the image pickup device control unit adjusts the exposure time T1 and the exposure time T2 so as to satisfy T1 × R1 × AQE1 ═ T2 × R2 × AQE 2.

According to an embodiment of the present invention, it is preferable that the electronic endoscope system is detachably provided with an electronic mirror including the imaging element, a wavelength band of the first illumination light and a wavelength band of the second illumination light are different from each other, the imaging element control unit acquires an amplification factor of an amplification process performed on the image signal in at least one of the electronic mirror and a processor for the electronic endoscope, the amplification factor of the amplification process performed on the image signal of the object irradiated with the first illumination light is defined as G1, the amplification factor of the amplification process performed on the image signal of the object irradiated with the second illumination light is defined as G2, and average quantum efficiencies in the wavelength bands of the first illumination light and the second illumination light in the imaging element are respectively defined as average quantum efficiency AQE1, In the case of AQE2, the image pickup element control unit adjusts the exposure time T1 and the exposure time T2 so that T1 × R1 × AQE1 × G1 ═ T2 × R2 × AQE2 × G2 is satisfied.

An electronic endoscope system according to an embodiment of the present invention includes: an illumination light switching unit that alternately switches illumination light irradiated to an object between first illumination light and second illumination light that differs from the first illumination light in an amount of time integration of a light beam per unit time; an imaging element that receives light from the subject and outputs an image signal corresponding to the received light; and an image pickup device control unit that controls an exposure time of the image pickup device and a readout timing of the electric charge, wherein the image pickup device control unit controls an exposure time T1 of the image pickup device when the object is irradiated with the first illumination light and an exposure time T2 of the image pickup device when the object is irradiated with the second illumination light based on a calculated amount K1 of the first illumination light in a first wavelength band and a calculated amount K2 of the second illumination light in a second wavelength band, the calculated amount K1 is an amount obtained by integrating a product of a light intensity distribution of the first illumination light in the first wavelength band and a quantum efficiency distribution of the image pickup device in the first wavelength band in a range of the first wavelength band, and the calculated amount K2 is an amount obtained by integrating a light intensity distribution of the second illumination light in the second wavelength band and a quantum efficiency distribution of the image pickup device in the second wavelength band The product of the first and second wavelengths is integrated over the second wavelength band.

According to an embodiment of the present invention, it is preferable that the photographing element control unit controls the exposure time T1 and the exposure time T2 so as to satisfy T1 × K1 — T2 × K2.

An electronic endoscope system according to an embodiment of the present invention includes: an illumination light switching unit that alternately switches illumination light irradiated to an object between first illumination light and second illumination light that differs from the first illumination light in an amount of time integration of a light beam per unit time; an imaging element configured to receive light from the subject and output an image signal corresponding to the received light; an image pickup device control unit that controls an exposure time of the image pickup device and a readout timing of the electric charges, the image pickup device being controlled such that the image pickup device picks up an image of the subject to which the first illumination light is applied for an exposure time T3, and picks up an image of the subject to which the second illumination light is applied for an exposure time T4; an amplifying unit that performs an amplification process on the image signal output from the imaging element; and a control unit that controls an amplification factor of the amplification processing. A first wavelength band of the first illumination light and a second wavelength band of the second illumination light are different from each other, the control unit controls an amplification factor applied to the image signal of the object to which one of the first illumination light and the second illumination light is applied, based on an amplification factor applied to the image signal of the object to which one of the first illumination light and the second illumination light is applied, a calculation amount K1 related to the first illumination light in the first wavelength band, a calculation amount K2 related to the second illumination light in the second wavelength band, the exposure time T3, and the exposure time T4, the calculation amount K1 being an amount obtained by integrating a product of a light intensity distribution of the first illumination light in the first wavelength band and a quantum efficiency distribution of the imaging element in the first wavelength band over the range of the first wavelength band, the calculation amount K2 is obtained by integrating the product of the light intensity distribution of the second illumination light in the second wavelength band and the quantum efficiency distribution of the imaging element in the second wavelength band over the range of the second wavelength band.

According to an embodiment of the present invention, it is preferable that the image pickup device is configured to read the electric charges at a light receiving position on a light receiving surface of the image pickup device while shifting timings of start and end of exposure at the light receiving position, the light intensity of the first illumination light is higher than the light intensity of the second illumination light, the exposure time T2 is equal to or less than a reference time obtained by dividing an irradiation time of the second illumination light to the object by the number of times of reading the electric charges at the light receiving position, and is equal to or more than a time obtained by subtracting a reading time and a reset time of the electric charges from the reference time, and the reset time is a time for resetting the noise accumulated electric charges before exposure at the light receiving position.

According to an embodiment of the present invention, it is preferable that a minimum time for which timings of start and end of exposure of the imaging element are shifted at the light receiving position is equal to the reset time.

According to one embodiment of the present invention, it is preferable that the second illumination light has a transition period in which the intensity of light gradually increases with time from the start of irradiation until the intensity of light becomes constant, and the reset period of the noise-accumulated charges, which is performed before the charges are read out first in the irradiation time, is in the transition period.

Further, according to an embodiment of the present invention, it is preferable that, for example, the irradiation time during which the first illumination light is continuously irradiated to the subject is equal to the irradiation time during which the second illumination light is continuously irradiated to the subject.

Further, according to an embodiment of the present invention, it is preferable that the illumination light switching unit includes: a light source that emits white light; a rotating plate on which a first filter and a second filter are arranged in the same angular range in the circumferential direction, the first filter filtering white light into first illumination light and the second filter filtering white light into second illumination light; and a rotation driving unit configured to insert the first filter into an optical path of the white light during an irradiation period of the first illumination light and insert the second filter into the optical path during an irradiation period of the second illumination light by rotating the rotating plate.

Further, according to an embodiment of the present invention, it is preferable that the illumination light switching unit sequentially switches the illumination light irradiated to the object among the first illumination light, the second illumination light, and a third illumination light, the third illumination light being different from the first illumination light or the second illumination light in an amount of time integration of the light flux per unit time. In this case, it is preferable that the imaging element control unit controls the exposure time T1, the exposure time T2, and the exposure time T3 based on the time integral amount R1, the time integral amount R2, and the time integral amount R3, the time integral amount R3 is a time integral amount of the light flux per unit time of the third illumination light, and the exposure time T3 is an exposure time of the imaging element when the third illumination light is irradiated to the object.

In addition, according to an embodiment of the present invention, the imaging element is preferably a CMOS type image sensor, for example.

Effects of the invention

According to the processor for an electronic endoscope and the electronic endoscope system, when an object is observed using illumination light having different light amounts, the object illuminated with arbitrary illumination light can be appropriately exposed and imaged.

Drawings

Fig. 1 is a block diagram showing a configuration of an electronic endoscope system according to an embodiment of the present invention.

Fig. 2 is a front view of a rotary filter unit included in a processor according to an embodiment of the present invention.

Fig. 3 is a front view of a rotary filter unit included in a processor of a conventional electronic endoscope system.

Fig. 4 is a diagram for explaining exposure timing of a solid-state imaging device and readout timing of a pixel signal in a conventional electronic endoscope system.

Fig. 5 is a diagram for explaining the discharge timing and the readout timing of the electric charges of the solid-state imaging element used in the processor according to the embodiment of the present invention.

Fig. 6 is a front view of a rotary filter unit included in a processor according to an embodiment of the present invention.

Fig. 7 is a diagram for explaining the discharge timing and the readout timing of the electric charges of the solid-state imaging element used in the processor according to the embodiment of the present invention.

Fig. 8(a) to (e) are diagrams illustrating the calculated amounts K1 and K2 used in the processor according to the embodiment of the present invention.

Detailed Description

Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following, an electronic endoscope system will be described as an example of an embodiment of the present invention. In addition, the "control" or "adjustment" of the exposure time or the amplification factor (gain) described below includes setting the exposure time or the amplification factor to the value of the result after the control or the result after the adjustment, in addition to the case of performing the control operation or the adjustment operation.

Fig. 1 is a block diagram showing a configuration of an electronic endoscope system 1 according to an embodiment of the present invention. As shown in fig. 1, the electronic endoscope system 1 includes an electronic scope 100, a processor 200, and a monitor 300.

The processor 200 includes a system controller 202 and a timing controller 204. The system controller 202 executes various programs stored in the memory 212, and collectively controls the entire electronic endoscope system 1. In addition, the system controller 202 is connected to an operation panel 214. The system controller 202 changes each operation of the electronic endoscope system 1 and parameters used for each operation in accordance with an instruction from the operator input through the operation panel 214. The timing controller 204 outputs a clock pulse for adjusting the timing of the operation of each unit to each circuit in the electronic endoscope system 1.

The lamp 208 emits illumination light L when the lamp igniter 206 is started. The lamp 208 is a high-brightness lamp such as a xenon lamp, a halogen lamp, a mercury lamp, or a metal halide lamp. The lamp 208 may be a solid-state light source such as an led (light Emitting diode) or a laser diode. The illumination light L is light mainly having a spectrum extending from a visible light region to an invisible infrared light region (or white light including at least a visible light region).

The illumination light L emitted from the lamp 208 is reduced in light amount by the diaphragm 209 and then enters the rotary filter portion 260. Fig. 2 is a front view of the rotary filter section 260 as viewed from the condenser lens 210 side. The rotary filter unit 260 includes a rotary turret 261, a dc motor 262, an actuator 263, and a photointerrupter 264. The illumination light L incident on the rotary turntable 261 is shown by a broken line in fig. 2. As shown in fig. 2, an optical filter F1 for normal light (white light) and an optical filter F2 for special light are arranged in this order in the circumferential direction on the rotary turntable 261. The optical filters F1 and F2 each have a fan shape and are disposed around the rotation axis O within an angular range of approximately 180 °.

The driver 263 drives the dc motor 262 under the control of the system controller 202. The rotary turret 261 is rotated by a dc motor 262 to sequentially insert the optical filters F1 and F2 into the optical path of the illumination light L. Thus, the illumination light L incident from the lamp 208 is filtered by each optical filter, and one of two types of illumination light L (normal light L1 and special light L2) having different spectra is extracted at a timing synchronized with the image capturing. The rotational position and the rotational phase of the rotary turntable 261 are controlled by detecting an opening (not shown) formed near the outer periphery of the rotary turntable 261 by a photo interrupter 264.

Further, a frame F0 is provided between the optical filter F1 and the optical filter F2 in the circumferential direction of the rotary turntable 261. The frame F0 is made of a material that does not transmit the illumination light L. Therefore, when the frame F0 is inserted into the optical path of the illumination light L, the light amount of the illumination light L (the normal light L1 or the special light L2) transmitted through the rotary filter portion 260 is reduced, and the light in which the normal light L1 and the special light L2 are mixed can be extracted according to the size and the position of the frame F0. Hereinafter, a period in which the frame F0 is inserted into the optical path of the illumination light L is referred to as a transition period. The amount of illumination light L extracted from the rotary filter section 260 during this transition period is not stable, and therefore is not used for imaging the subject.

The normal optical filter F1 is a light reduction filter for reducing the illumination light L, but may be replaced with an opening only (no optical filter) or a slit having an aperture function (no optical filter). The optical filter F2 for special light has spectral characteristics suitable for capturing a spectral image of a blood vessel structure in the vicinity of the surface layer (or a blood vessel structure in a deep layer, a specific lesion, or the like), for example.

The illumination Light L (normal Light L1 and special Light L2) extracted by the rotary filter unit 260 is condensed by the condenser lens 210 at the entrance end face of the Light guide Bundle (LCB) 102 and enters the Light guide Bundle 102. According to one embodiment, the normal light L1 is preferably white light or pseudo-white light. The white light is light having a constant light intensity in a visible light wavelength band, and the pseudo-white light is light composed of a plurality of light components having a peak of the light intensity in a specific wavelength band of the visible light wavelength band. The special light L2 is light having a narrower wavelength band than the wavelength band of the white light or pseudo-white light. Thus, the wavelength band of the normal light L1 is different from that of the special light L2. In the electronic endoscope system, normal light L1 and special light L2 are used as illumination light for illuminating a living tissue as an object to be imaged, and a normal light observation image and a special light observation image are acquired. In the special light observation image, since an image different from the normal light observation image can be obtained according to the absorption characteristics of the living tissue, it is possible to observe the living tissue while emphasizing a certain characteristic portion, and it is easy to find a lesion portion or the like of the living tissue. Therefore, the spectral characteristics of the special optical filter F2 are set according to the absorption characteristics of the living tissue to be emphasized.

The illumination light L (normal light L1 and special light L2) incident into the light guide bundle 102 propagates inside the light guide bundle 102, is emitted from the emission end face of the light guide bundle 102 disposed at the tip of the electronic mirror 100, and illuminates the subject via the light distribution lens 104. Thus, the subject is illuminated with the normal light L1 and the special light L2 alternately. Return light from the subject illuminated with each illumination light L forms an optical image on the light receiving surface of the solid-state imaging device 108 via the objective lens 106.

The solid-state imaging element 108 is a cmos (complementary Metal Oxide semiconductor) type image sensor having a complementary color checkerboard type pixel arrangement. The solid-state imaging element 108 accumulates optical images formed by the respective pixels on the light receiving surface as electric charges according to the light amount, generates pixel signals of yellow Ye, cyan Cy, green G, and magenta Mg, and adds and mixes the generated pixel signals of two pixels adjacent in the vertical direction to output. The solid-state imaging element 108 may be provided with a primary color filter (bayer array filter). Since the solid-state imaging element 108 has a complementary color filter or a primary color filter, the quantum efficiency QE of each light receiving position on the light receiving surface of the solid-state imaging element 108 varies depending on the wavelength.

The timing of switching between the normal light L1 and the special light L2 by the rotary filter section 260 is synchronized with the exposure timing of the solid-state imaging element 108 and the readout timing of the charges accumulated in the solid-state imaging element 108. Thus, the solid-state imaging element 108 alternately outputs the pixel signal of the observation image (normal light observation image) of the subject illuminated with the normal light L1 and the pixel signal of the observation image (special light observation image) of the subject illuminated with the special light L2.

The electronic mirror 100 is detachably connected to the processor 200. The driver signal processing circuit 110 is provided in a connection portion of the electronic mirror 100 to the processor 200. The solid-state imaging element 108 alternately inputs pixel signals of a normal light observation image and a special light observation image to the driver signal processing circuit 110. The driver signal processing circuit 110 performs predetermined processing such as amplification processing and AD conversion processing on the pixel signal input from the solid-state imaging element 108, and outputs the pixel signal to the preceding signal processing circuit 220 of the processor 200.

The driver signal processing circuit 110 also accesses the memory 112 and reads out the inherent information of the electronic mirror 100. The specific information of the electronic mirror 100 recorded in the memory 112 includes specifications such as the number of pixels and sensitivity of the solid-state imaging device 108, an operable frame rate, an amplification factor by the amplification process of the driver signal processing circuit 110, a model number of the electronic mirror 100, and the like. The driver signal processing circuit 110 outputs the unique information read out by the memory 112 to the system controller 202.

The system controller 202 performs various calculations based on the information specific to the electronic mirror 100 to generate a control signal. The system controller 202 controls the operation and timing of various circuits in the processor 200 using the generated control signal, and performs processing suitable for the electronic mirror 100 connected to the processor 200.

The timing controller 204 supplies a clock pulse to the driver signal processing circuit 110 according to timing control by the system controller 202. The driver signal processing circuit 110 drive-controls the solid-state imaging element 108 at a timing synchronized with the frame rate of the image processed on the processor 200 side, in accordance with the clock pulse supplied from the timing controller 204.

The preceding-stage signal processing circuit 220 generates an image signal by performing predetermined signal processing such as amplification processing, color interpolation processing, matrix operation processing, and Y/C separation processing on each pixel signal of the normal-light observation image and the special-light observation image input from the driver signal processing circuit 110, and outputs the image signal to the subsequent-stage signal processing circuit 230.

The subsequent signal processing circuit 230 processes the image signal input from the preceding signal processing circuit 220 to generate screen data for monitor display, and converts the generated screen data for monitor display into a predetermined video format signal. The converted video format signal is output to the monitor 300. As a result, the normal-light observation image and the special-light observation image of the subject are displayed on the display screen of the monitor 300.

Here, the exposure timing of the solid-state imaging device and the readout timing of the charge (pixel signal) in the conventional electronic endoscope system will be described.

Fig. 3 is a front view of a rotary filter section 1260 provided in a processor of a conventional electronic endoscope system. The rotary filter section 1260 is provided with a rotary turret 1261. The rotary turret 1261 is provided with a normal light filter F1p and a special light filter F2p arranged in this order in the circumferential direction. Each optical filter has a fan shape with a central angle of about 90 °, and is disposed at a position rotationally symmetrical with respect to the rotation axis O. Further, the region P0 of the rotary turret 1261 where each filter is not provided serves as a light blocking plate for blocking illumination light. Therefore, by rotating the rotary turret 1261, the irradiation and non-irradiation of the normal light, the irradiation and non-irradiation of the special light, and the like are switched at a predetermined frame rate (1/60 seconds in the present conventional example).

Fig. 4 is a diagram for explaining exposure timing of a solid-state image sensor and readout timing of charges (pixel signals) when a normal-light observation image and a special-light observation image are displayed in a single screen in a line in a conventional electronic endoscope system. The solid-state imaging device is a CMOS image sensor, and a rolling shutter method is used for reading pixel signals.

On a light receiving surface of the solid-state imaging element, a plurality of pixels are arranged in a column, and a plurality of rows of the pixels are arranged. The pixel signals are collectively read out for each row. Fig. 4 shows exposure times and readout timings of respective lines assuming that the solid-state imaging element includes pixels of X lines Line1 to LineX.

The exposure timing of the solid-state imaging device and the readout timing of the pixel signal are synchronized with the rotation of the rotary turret 1261. Specifically, at a timing t1, the irradiation of the normal light is started, and the exposure of all the pixels of the solid-state imaging device is started. The exposure of all the pixels is performed for 1/60 seconds until a timing t 2. At timing t2, the illumination light is blocked by the shutter plate P0, and the charges accumulated in the pixels are sequentially read out row by row between timings t1 to t 2. Specifically, pixel signals are read out while shifting the timing from a row having a small row number. The time taken to read out the pixel signals from all the pixels is 1/60 seconds. At timing t3, irradiation of special light starts, and exposure of all pixels of the solid-state imaging element starts. The exposure of all the pixels is performed for 1/60 seconds from the timing t3 to the timing t 4. At timing t4, the illumination light is blocked, and the readout of the electric charges accumulated in the pixels is sequentially performed for each row between timings t3 to t 4.

In this way, while the pixel signal of the subject illuminated with the illumination light of one of the normal light and the special light is being read, the illumination light is blocked from being applied to the subject, thereby preventing the information of the subject illuminated with the illumination light of the other from being mixed into the pixel signal, and the normal light observation image and the special light observation image are displayed on the monitor 300 at 15fps (frame per second).

Further, since the spectral characteristics and the light amounts of the normal light and the special light are different, the illuminance of the subject illuminated with the normal light and the illuminance of the subject illuminated with the special light are different. However, in the conventional electronic endoscope system, the exposure time of the solid-state imaging device when the normal light is irradiated is the same as the exposure time of the solid-state imaging device when the special light is irradiated. Since the normal light and the special light are switched at a high speed every 1/30 seconds, the aperture value of the aperture cannot be adjusted according to the illuminance of the subject that changes at a high speed. As a result, a difference occurs between the amount of charge accumulated in the solid-state imaging element when the normal light is irradiated and the amount of charge accumulated in the solid-state imaging element when the special light is irradiated. Therefore, when the aperture value is adjusted so that one of the subject images is exposed properly, the other subject image may be overexposed or underexposed. In the case of underexposure, although an image having an appropriate brightness can be obtained by image processing with an amplification factor, noise is also amplified, which is not preferable.

Therefore, the electronic endoscope system 1 according to the present embodiment is configured to be suitable for suppressing overexposure or underexposure of the subject image in the conventional electronic endoscope system.

Fig. 5 is a diagram for explaining the timing of discharging and the timing of reading out the charges of the pixels included in the solid-state imaging element 108 when the normal-light observation image and the special-light observation image are displayed in a single screen in an aligned manner in the present embodiment.

On the light receiving surface of the solid-state imaging element 108, a plurality of pixels are arranged in a column, and a plurality of rows of the pixels are arranged. The pixel signals are collectively read out for each row. In the embodiment shown in fig. 5, the solid-state imaging element 108 has a row in which a plurality of pixels are arranged in X rows. Fig. 5 shows the discharge timing and the read timing of the electric charges of each of the lines Line1 to LineX. The discharge of the electric charges refers to resetting of noise-accumulated electric charges that are not related to the captured image.

In the present embodiment, the normal light L1 and the special light L2 are alternately irradiated to the subject every 1/30 seconds. Both the irradiation period during which the normal light L1 is continuously irradiated to the subject and the irradiation period during which the special light L2 is continuously irradiated to the subject are 1/30 seconds inclusive of the transition period of the illumination light L.

The solid-state imaging element 108 is alternately exposed for a constant time during the irradiation period of the normal light L1 and the irradiation period of the special light L2, and outputs the accumulated electric charges as pixel signals. This enables the normal-light observation image and the special-light observation image to be captured substantially simultaneously.

In the present embodiment, the light intensity, which is the light amount of the normal light L1, is larger than the light intensity, which is the light amount of the special light L2. Therefore, if the exposure time of the solid-state imaging device 108 is adjusted so that the exposure of either one of the normal-light observation image and the special-light observation image becomes optimal, the other observation image becomes overexposed or underexposed. For example, if the exposure time is adjusted so that the exposure of the normal-light observation image becomes optimal, the special-light observation image becomes a dark image with insufficient exposure. Therefore, the solid-state imaging device 108 performs drive control so that both the normal-light observation image and the special-light observation image are properly exposed. Here, the light amount, i.e., the light intensity, refers to a value obtained by integrating the spectral intensity distribution of each light along the wavelength.

As shown in fig. 5, the exposure time T1 of the solid-state imaging element 108 during the irradiation period of the normal light L1 and the exposure time T2 of the solid-state imaging element 108 during the irradiation period of the special light L2 are different. Each exposure time is set according to the light amounts of the normal light L1 and the special light L2. Specifically, when the light amount of the normal light L1 is R1 and the light amount of the special light L2 is R2, the exposure times T1 and T2 are T1 × R1 — T2 × R2. Thus, the exposure amount of the solid-state imaging element 108 during the irradiation period with the normal light L1 is substantially the same as the exposure amount of the solid-state imaging element 108 during the irradiation period with the special light L2. The light amount R1 is a time integral amount of the normal light L1 emitted to the subject per unit time. The light amount R2 is a time integral amount of the beam of the special light L2 per unit time irradiated to the subject. Therefore, R1 and R2 also correspond to the light intensities of the normal light L1 and the special light L2. Further, if the type of the illumination light L such as the normal light L1 and the special light L2 is known, the light amount thereof can be also known. According to one embodiment, since the information on the type of illumination light and the light amount thereof are stored in the memory 23 in advance, and the information on the illumination light L emitted from the processor 200 (the types of the normal light L1 and the special light L2) is known, the light amounts R1 and R2 can be acquired using the information and the related information stored in the memory 23.

In general, the larger the exposure amount, the higher the signal-to-noise ratio of the pixel signal output from the solid-state imaging element 108. Therefore, in one embodiment, the exposure time T2 during which the special light L2 having a small light amount is irradiated is preferably set to be as large as possible. Here, the period during which the special light L2 is irradiated is a period obtained by subtracting the transition period from 1/30 seconds. When the exposure time T2 is set, the exposure time T1 during the irradiation period of the normal light L1 is set to T1 ═ T2 × (R2/R1).

In the present embodiment, pixels in each row are read out every 1/30 seconds by the rolling shutter method. Therefore, the exposure times T1, T2 are adjusted by the exposure start time, not the readout time (exposure end time). In the present embodiment, as shown in fig. 5, the reset of the noise accumulated charges, which is the discharge processing of the charges of each pixel, is performed so that the exposure times T1 and T2 are set to predetermined values. The time when the discharge process ends is the exposure start time, and the time from the exposure start time to the time when the charge readout process is performed is the exposure time.

In fig. 5, during the timing t1 to t3, after the illumination light L transitions from the special light L2 to the normal light L1, the subject is irradiated with the normal light L1. Thereafter, the electric charges accumulated in the pixels are sequentially discharged for each row. Next, at a timing when the exposure time of the pixel becomes T1, the accumulated electric charges are read out for each row and output to the driver signal processing circuit 110. In this embodiment, the time taken for reading out the charges of all the pixels is 1/60 seconds from the timing t2 to t 3. The timing of performing the discharge processing of the electric charges is set by inverse calculation so that the exposure time becomes T1 based on the timing of reading the electric charges.

In the period from the timing t3 to the timing t5, after the illumination light L transitions from the normal light L1 to the special light L2, the subject is irradiated with the special light L2. Thereafter, the electric charges accumulated in the pixels are sequentially discharged for each row. Here, the timing at which the discharge processing of the electric charges starts is set so that the exposure of the pixels of Line1 starts immediately after the end of the transition period from the normal light L1 to the special light L2. This can lengthen the exposure time T2 of the special light L2. Next, at a timing when the exposure time of the pixel becomes T2, the accumulated electric charges are read out for each row and output to the driver signal processing circuit 110.

In this way, in the present embodiment, the exposure time T1 of the solid-state imaging device 108 during irradiation with the normal light L1 is set to be shorter than the exposure time T2 during irradiation with the special light L2. Thus, when the light intensity, which is the light intensity of the normal light L1, is larger than the light intensity, which is the light intensity of the special light L2, the difference in the amount of charge accumulated in the solid-state imaging element 108 can be reduced. Therefore, the subject image with appropriate exposure can be obtained both when the normal light L1 is irradiated and when the special light L2 is irradiated.

In the present embodiment, the charge reading process of each pixel is performed every 1/30 seconds, and the discharge process of the charges is performed at a timing corresponding to the exposure times T1 and T2, but the present embodiment is not limited thereto. The exposure time T1, T2 of the solid-state imaging element 108 may not include the transition period of the illumination light L, and the charge reading process may not be performed at a constant interval. For example, the discharge processing of the electric charges may be performed at a timing when the transition period from the normal light L1 to the special light L2 ends and at a timing when the transition period from the special light L2 to the normal light L1 ends. In this case, the discharge processing of the electric charges is performed every 1/30 seconds, and the readout processing of the electric charges is performed at timings corresponding to the exposure times T1 and T2.

According to one embodiment, the solid-state imaging device 108 is configured such that the light intensity, which is the light amount of the normal light L1 (first illumination light), is larger than the light intensity, which is the light amount of the special light L2 (second illumination light), by reading out the charges at the light receiving position while shifting the timings of starting and ending the exposure at the light receiving position on the light receiving surface of the solid-state imaging device 108. In this case, it is preferable that the exposure time T2 in the special light L2 is equal to or less than a reference time obtained by dividing the special light L2 (second illumination light) irradiation time by the number of times of reading out the electric charges at the light receiving position, and equal to or more than a time obtained by subtracting the reading out time of the electric charges from a reset time for resetting the noise-accumulated electric charges before exposure at the light receiving position. By securing the exposure time T2 of the special light L2 having a low light intensity as much as possible in this way, the difference in the amount of charges accumulated in the solid-state imaging element 108 between the special light L2 having a weak light intensity and the normal light L1 having a strong light intensity can be reduced.

In addition, according to one embodiment, the minimum time at the light receiving position of the timing of the start and the end of the exposure of the solid-state imaging element 108, for example, the shift time between adjacent rows is preferably equal to the reset time for resetting the noise accumulated charges. This can lengthen the exposure time T2 in the limited irradiation period.

In addition, as shown in fig. 5, the normal light L1 (first illumination light) and the special light L2 (second illumination light) have a transition period in which the light intensity gradually increases with time from the start of irradiation until the light intensity becomes constant. In this case, it is preferable that a period of resetting the noise accumulated charges (discharge processing of the charges) performed before the first readout of the charges performed within the irradiation time of the special light L2 be within the transition period. This can lengthen the exposure time T2 in the limited irradiation period.

In the above embodiment, the exposure time T1 of the normal light L1 and the exposure time T2 of the special light L2 are set to satisfy the relationship of T1 × R1 to T2 × R2, but the embodiment of the present invention is not limited thereto. According to an embodiment, the exposure times T1, T2 may also be set using the gain of the amplification process for the image signal in addition to the light amounts R1, R2. Specifically, the exposure times T1 and T2 are set to satisfy T1 × R1 × G1 — T2 × R2 × G2. Here, G1 is a gain of the amplification processing of the image signal for the normal light observation image. Further, G2 is a gain of the amplification processing of the image signal of the special light observation image.

Each image signal is amplified by the driver signal processing circuit 110 and the preceding stage signal processing circuit 220. The driver signal processing circuit 110 amplifies the analog pixel signal output from the solid-state imaging element 108. In the preceding-stage signal processing circuit 220, the digital pixel signal after the AD conversion is subjected to amplification processing. The system controller 202 acquires the gain of the amplification process in the driver signal processing circuit 110 and the gain of the amplification process in the preceding stage signal processing circuit 220, and calculates the gains G1 and G2. The gains G1 and G2 are the products of the gain of the amplification processing in the driver signal processing circuit 110 and the gain of the amplification processing in the preceding-stage signal processing circuit 220, respectively. According to an embodiment, whenever the illumination light L is switched between the normal light L1 and the special light L2, the gain of the amplification process is switched between G1 and G2. In addition, either or both of the gain of the amplification process in the driver signal processing circuit 110 and the gain of the amplification process in the preceding signal processing circuit 220 may be switched in accordance with the switching of the illumination light L. Further, the amplification process for the image signal may be performed only in one of the driver signal processing circuit 110 and the previous stage signal processing circuit 220.

For example, when the light amount R1 of the normal light L1 and the light amount R2 of the special light L2 are small, the exposure time T2 becomes long if the exposure times T1 and T2 are set to satisfy T1 × R1 — T2 × R2. Since the captured image is more likely to be blurred as the exposure time is longer, when the difference between the light amount R1 and the light amount R2 is large, the observed image captured using the special light L2 may be blurred and difficult to see. However, when the exposure times T1 and T2 are set to satisfy T1 × R1 × G1 — T2 × R2 × G2, the exposure time T2 is set to be shorter by increasing the gain G2. This makes it possible to obtain an observed image with blur suppressed. In this case, the exposure time T1 and the exposure time T2 may be set to the same length or different lengths.

Further, if the gains G1 and G2 are excessively increased, noise included in the image signal is also amplified, and it may be difficult to clearly observe the image. Further, as described above, if the exposure times T1 and T2 are too long, the observed image may be blurred. Therefore, in modification 1, the upper limit value may be set for either one or both of the exposure time (T1, T2) and the gain (G1, G2).

In the above-described embodiment, the illumination light L is alternately switched between the normal light L1 and the special light L2, but the embodiment of the present invention is not limited thereto. According to one embodiment, the illumination light L may be switched sequentially between three or more types of light. Fig. 6 is a front view of the rotary filter part 260 according to an embodiment. The rotary filter section 260 has a normal light filter F1, a special light filter F2A, and a special light filter F2B arranged in a circumferential direction. The optical filters F1, F2A, and F2B each have a fan shape and are disposed around the rotation axis O within an angular range of approximately 120 °. The light-transmitting characteristics of the special optical filter F2A and the special optical filter F2B are different from each other. The optical filters F1, F2A, and F2B are sequentially inserted into the optical path of the illumination light L, so that the illumination light L emitted from the lamp 208 is filtered by the optical filters, and three types of illumination light (normal light L1, special light L2A, and special light L2B) having different spectra are sequentially extracted at a timing synchronized with the image capturing.

According to one embodiment, the normal light L1, the special light L2A, and the special light L2B are sequentially irradiated to the subject every 1/30 seconds. The irradiation period in which the normal light L1 is continuously irradiated to the subject, the irradiation period in which the special light L2A is continuously irradiated to the subject, and the irradiation period in which the special light L2B is continuously irradiated to the subject are all 1/30 seconds including the transition period of the illumination light L. The solid-state imaging element 108 is exposed during the irradiation period of each illumination light L, and the accumulated electric charges are output as pixel signals. This makes it possible to simultaneously capture a normal light observation image, a special light observation image a using special light L2A, and a special light observation image B using special light L2B.

In the above embodiment, the light amount of the normal light L1 is larger than the light amount of the special light L2A. The light amount of the special light L2A is larger than the light amount of the special light L2B. Therefore, the exposure time of the solid-state imaging device 108 in the irradiation period of each illumination light L is adjusted so that the exposure of the three observation images, i.e., the normal-light observation image, the special-light observation image a, and the special-light observation image B, is appropriate.

Fig. 7 is a diagram for explaining the discharge timing and the readout timing of the charges of the pixels included in the solid-state imaging element 108 during irradiation with the normal light L1, the special light L2A, and the special light L2B.

As shown in fig. 7, the exposure time T1 of the solid-state imaging element 108 during the irradiation period of the normal light L1, the exposure time T2A of the solid-state imaging element 108 during the irradiation period of the special light L2A, and the exposure time T2B of the solid-state imaging element 108 during the irradiation period of the special light L2B are different. The exposure times T1, T2A, and T2B are set in accordance with the light amounts of the normal light L1, the special light L2A, and the special light L2B. Specifically, when the light amount of the normal light L1 is R1, the light amount of the special light L2A is R2A, and the light amount of the special light L2B is R2B, the exposure times T1, T2A, and T2B are set to T1 × R1 — T2A × R2A — T2B × R2B. Here, the light amount R1 is a time integral amount of the light flux per unit time of the normal light L1 irradiated to the subject. The light amount R2A is a time integral amount of the beam of the special light L2A per unit time irradiated to the subject. The light amount R2B is a time integral amount of the beam of the special light L2B per unit time irradiated to the subject. Accordingly, the exposure of the three observation images, i.e., the normal light observation image, the special light observation image a, and the special light observation image B, is appropriate.

In the case shown in fig. 7, the exposure times T1, T2A, and T2B may be set using gains for image signals in addition to the light amounts R1, R2A, and R2B. Specifically, the exposure times T1, T2A, and T2B may be set to satisfy T1 × R1 × G1 ═ T2A × R2A × G2A ═ T2B × R2B × G2B. Here, G1 is a gain of the amplification processing of the image signal for the normal light observation image. Further, G2A is a gain of the amplification processing of the image signal of the special light observation image a. Further, G2B is a gain of the amplification processing for the image signal of the special light observation image B. By setting the exposure times T1, T2A, and T2B using the gain of the image signal in this way, it is possible to prevent the observation image from being blurred due to an excessively long exposure time.

In any of the above embodiments, the difference in the light intensity, which is the amount of the normal light L1 and the special light L2 (or the special light L2A and the special light L2B), has been described, and the exposure time is set based on the difference, but in order to realize the appropriate exposure of the object with high accuracy, it is preferable to set the exposure time in consideration of the quantum efficiency of the solid-state imaging device 108.

Fig. 8(a) to (e) are diagrams illustrating the calculated amounts K1 and K2 used in the processor according to the embodiment. The calculated amounts K1, K2 are amounts used in place of the light amounts R1, R2 described above in consideration of the quantum efficiency of the solid-state imaging element 108.

The normal light L1 and the special light L2 have light intensity distributions as shown in fig. 8(a) and (b), and have characteristics of quantum efficiency QE of the solid-state image sensor 108 as shown in fig. 8 (c). The quantum efficiency QE is an efficiency of converting photons incident on the photoelectric surface (light receiving surface) into electrons, and is largely dependent on, for example, wavelength characteristics of photoelectric conversion of the photoelectric surface (light receiving surface) itself of the solid-state imaging element 108 and transmittance characteristics of a color filter (for example, a primary color filter) provided in front of the photoelectric surface (light receiving surface). Therefore, as shown in fig. 8(d) and (e), it is preferable to determine the calculated amounts K1 and K2 as the amounts obtained by integrating the products of the light intensity distributions shown in fig. 8(a) and (b) and the distributions of the quantum efficiencies of the solid-state imaging element 108 in the respective wavelength bands, and use the calculated amounts K1 and K2 as the light amounts R1 and R2 instead. That is, the calculated amounts K1 and K2 are amounts obtained by integrating the wavelength band light intensity distribution of the normal light L1 and the special light L2 and the wavelength band ranges in which the integral of the distribution of the quantum efficiency of the solid-state imaging element 108 in the wavelength bands of the normal light L1 and the special light L2 is located.

The information on the characteristics of the quantum efficiency QE is contained in the information specific to the electronic mirror 100 as the information on the solid-state imaging element 108 and is stored in the memory 112. When the electronic mirror 100 is connected to the processor 200, the signal is read out from the driver signal processing circuit 110 and acquired, and is output to the system controller 110.

According to one embodiment, it is preferable to control the exposure time T1 of the solid-state imaging device 108 when the subject is irradiated with the normal light L1 (first illumination light) and the exposure time T2 of the solid-state imaging device 108 when the subject is irradiated with the special light L2 (second illumination light) based on the calculated amount K1 relating to the normal light L1 in the wavelength band of the normal light L1 and the calculated amount K2 relating to the special light L2 in the wavelength band of the special light L2.

In this case, it is preferable to control the exposure times T1, T2 so as to satisfy T1 × K1 — T2 × K2. Further, it is preferable that when the gains (amplification factors) applied to the image signal of the subject irradiated with the normal light L1 (first illumination light) and the special light L2 (second illumination light) are G1 and G2, respectively, the exposure times T1 and T2 are controlled so as to satisfy T1 × K1 × G1 — T2 × K2 × G2. According to one embodiment, the exposure time T1 is preferably set according to the exposure time T2.

In the above-described embodiment, if the exposure time is increased during the irradiation with the special light L2 or the like, the observation image may be blurred and difficult to see, and therefore, the gain, which is the amplification factor in the amplification process, is adjusted instead while suppressing the increase in the exposure time. In this case, after the exposure time is determined in advance, the calculated amounts K1 and K2 can be used instead of the light amounts R1 and R2 to set the gain. According to one embodiment, it is preferable that the gain (amplification factor) applied to the image signal of the subject irradiated with one of the normal light L1 (first illumination light) and the special light L2 (second illumination light) be controlled based on the gain (amplification factor) applied to the image signal of the subject irradiated with the other, the calculated amount K1 and the calculated amount K2, and the exposure time of the solid-state imaging element 108 during the irradiation period of the normal light L1 and the special light L2.

In this case, when gains (amplification factors) applied to image signals of the subject irradiated with the normal light L1 (first illumination light) and the special light L2 (second illumination light) are defined as G3 and G4, respectively, and the exposure time of the solid-state imaging device 108 when the normal light L1 (first illumination light) and the special light L2 are irradiated is defined as T3 and T4, respectively, it is preferable to control the amplification factors G3 and G4 based on G3 × T3 × K1 — G4 × T4 × K2. According to an embodiment, the magnification G4 is preferably set according to a known magnification G3.

In the above embodiment, the exposure time T1 in the irradiation period of the normal light L1 is set to T1 — T2 × (R2/R1). However, in this case, the exposure may not be appropriately performed without considering the quantum efficiency of the solid-state imaging element 108. In this case, the gain (amplification factor) applied to the image signal of the subject irradiated with the normal light L1 (first illumination light) and the special light L2 (second illumination light) can be adjusted in consideration of the quantum efficiency. Therefore, according to one embodiment, it is also preferable to control the amplification factor applied to the image signal of the subject irradiated with either one of the normal light L1 (first illumination light) and the special light L2 (second illumination light) based on the calculated amount K1, the calculated amount K2, and the set exposure times T1 and T2.

According to one embodiment, it is preferable that the magnifications G3 and G4 be controlled based on G3 × T3 × K1 ═ G4 × T4 × K2, in the case where the magnifications applied to the image signals of the subject irradiated with the normal light L1 (first illumination light) and the special light L2 (second illumination light) are respectively defined as G3 and G4, and the exposure times of the solid-state imaging device 108 when the normal light L1 (first illumination light) and the special light L2 (second illumination light) are respectively defined as T3 and T4. According to an embodiment, the magnification G4 is preferably set according to a known magnification G3.

Instead of the above-described embodiment in which the exposure times T1, T2, the magnifications G1, G2, or the magnifications G3, G4 are controlled using the calculated amounts K1, K2, the exposure times T1, T2, the magnifications G1, G2, or the magnifications G3, G4 may be controlled using the average quantum efficiencies AQE1, AQE 2. For example, since the wavelength bands of the normal light L1 (first illumination light) and the special light L2 (second illumination light) are known in advance, the average quantum efficiency of the quantum efficiency QE in the wavelength bands can be calculated and used instead of the calculated amounts K1 and K2. In this case, it is not necessary to calculate the calculation amounts K1 and K2 in advance, and the processing can be simplified.

According to one embodiment, the average quantum efficiencies AQE1 and AQE2 are preferably determined in advance as AQE1 ═ K1/R1 and AQE2 ═ K2/R2. Since the type of the illumination light L (normal light, special light) emitted from the processor 200 is known in advance, the light intensity distribution of the illumination light L is information that can be acquired. The quantum efficiency QE characteristic (characteristic shown in fig. 8 c) is also information that can be obtained from the information of the individual image sensor 108 included in the unique information of the galvano mirror 100 connected to the processor 200. Therefore, the average quantum efficiencies AQE1 and AQE2 calculated using the calculated amounts K1 and K2, and R1 and R2 obtained from these acquired information can be acquired and used for adjusting the exposure time and the gain (amplification factor) described later. Such average quantum efficiencies AQE1 and AQE2 can be obtained without calculation by the system controller 202 or the like. For example, the association information associating the combination of the type of the illumination light L and the information of the quantum efficiency QE included in the information specific to the electronic mirror 100 and the average quantum efficiency can be stored in the memory 212 in advance, and the value of the average quantum efficiency can be set by referring to the association information when the electronic mirror 100 is connected to the processor 200.

According to an embodiment, it is also preferable to control the exposure time T1 and the exposure time T2 to satisfy T1 × R1 × AQE1 ═ T2 × R2 × AQE2 instead of T1 × K1 ═ T2 × K2. According to one embodiment, the exposure time T1 is preferably set according to a known exposure time T2.

Further, according to one embodiment, it is preferable that the exposure times T1 and T2 be adjusted to satisfy T1 × R1 × AQE1 × G1 — T2 × R2 × AQE2 × G2 when gains (amplification factors) applied to image signals of the subject irradiated with the normal light L1 (first illumination light) and the special light L2 (second illumination light) are set to G1 and G2, respectively.

The information of the average quantum efficiency is determined for each of the predetermined wavelength bands of the normal light L1 and the special light L2 as the information of the solid-state image sensor 108, and the information is included in the unique information of the mirror 100 and stored in the memory 112. When the electronic mirror 100 is connected to the processor 200, it is read out and acquired from the driver signal processing circuit 110, and is output to the system controller 110.

In the above embodiments, the exposure time and the amplification factor (gain) are controlled using the information of the light amounts of the normal light L1, the special light L2, and the like, but according to one embodiment, it is also preferable that the exposure time and the amplification factor are fixed to values controlled so as to satisfy appropriate exposure conditions without performing the above control.

For example, the exposure times T1 and T2 are preferably set so that the exposure time T1 of the solid-state image sensor 108 when the subject is irradiated with the normal light L1 (first illumination light) and the exposure time T2 of the solid-state image sensor 108 when the subject is irradiated with the special light L2 (second illumination light) satisfy T1 × K1 to T2 × K2.

In the above embodiment, the light amounts R1, R2, R3 are time integral amounts of the light beams per unit time of the illumination light. In one embodiment, when generating an image signal from photoelectric conversion of the solid-state imaging element 108, the output signal from the solid-state imaging element 108 may be logarithmically converted to generate an image signal. Therefore, in one embodiment, the light amounts R1, R2, and R3 are preferably amounts obtained by integrating the time of the light flux per unit time of the illumination light and logarithmically converting the integrated amount into the light amounts R1, R2, and R3. In one embodiment, the calculated amounts K1 and K2 are preferably obtained by integrating the product of the light intensity distribution in the wavelength band of the illumination light and the distribution of the quantum efficiency of the solid-state imaging element 108 over the range of the wavelength band, and are logarithmically converted amounts used as the calculated amounts K1 and K2. Therefore, the amount of the light flux integrated per unit time of the illumination light and the amount obtained by integrating the product of the light intensity distribution in the wavelength band of the illumination light and the distribution of the quantum efficiency of the solid-state imaging device 108 over the range of the wavelength band also include the amount after the logarithmic conversion.

The above is a description of exemplary embodiments of the invention. The embodiments of the present invention are not limited to the above description, and various modifications can be made within the scope of the technical idea of the present invention. For example, the embodiments described in the specification or obvious embodiments may be appropriately combined with each other.

Description of reference numerals:

an electronic endoscope system; an electronic mirror; 102.. directing a light beam; a light distribution lens; an objective lens; a solid state imaging element; driver signal processing circuitry; a memory; a processor; a system controller; a timing controller; a lamp power igniter; a lamp; a condenser lens; a memory; an operating panel; a preceding stage signal processing circuit; a post-stage signal processing circuit; 260.. rotating the filter portion; 261.. a rotary turret; a common optical filter for light; f2.. special light optical filters; f2a. F2b. optical filters for special light; f0... frame; a dc motor; a driver; a photointerrupter; 1260.. rotating the filter portion; 1261.. rotating a turntable; an ordinary optical filter for light; f2p. optical filter for special light; p0.. visor.

28页详细技术资料下载

上一篇：一种医用注射器针头装配设备

下一篇：一种内窥显示器、内窥镜系统及内窥显示器显示方法

Electronic endoscope processor and electronic endoscope system

相关技术

网友询问留言