用于接触触发式坐标机中的测量循环生成的方法、计算机程序和设备

文档序号:835262 发布日期:2021-03-30 浏览:3次 >En<

阅读说明:本技术 用于接触触发式坐标机中的测量循环生成的方法、计算机程序和设备 (Method, computer program and device for measurement cycle generation in a touch-triggered coordinate machine ) 是由 马汀·彼得·舒摩斯 于 2019-08-12 设计创作,主要内容包括:描述了一种用于生成用于使用由诸如机床(34)等坐标定位设备承载的测量探头(4;30)来检查物体(82)的测量循环的方法。所述测量循环包括测量路径,所述测量探头(4;30)沿着所述测量路径相对于所述物体(82)移动,以使得能够使用一系列接触触发式测量来检查所述物体(82)。所述方法包括在所述物体(82)的表面上定义多个接触触发式测量点(80a至80e)的步骤。所述多个接触触发式测量点(80a至80e)中的每一个都具有相关联的间隔位置(84a至84e),从所述相关联的间隔位置使所述测量探头朝向所述接触触发式测量点(80a至80e)加速,使得所述多个接触触发式测量点中的每一个都与所述相关联的间隔位置(84a至84e)分隔开间隔距离(S-1至S-5)。所述方法进一步包括为所述多个接触触发式测量点(80a至80e)中的至少一些接触触发式测量点定义不同的间隔距离(S-1至S-5),以及基于与每个接触触发式测量点(80a至80e)相关联的间隔距离(S-1至S-5)来计算在获取所述接触触发式测量点时要使用的探测给进速率(F-1至F-5)。还描述了对应的计算机程序和设备。(A method is described for generating a measurement cycle for inspecting an object (82) using a measurement probe (4; 30) carried by a coordinate positioning apparatus, such as a machine tool (34). The measurement cycle comprises a measurement path along which the measurement probe (4; 30) is moved relative to the object (82) to enable inspection of the object (82) using a series of touch-triggered measurements. The method comprises the step of defining a plurality of touch-triggered measurement points (80a to 80e) on the surface of the object (82). Each of the plurality of touch trigger measurement points (80 a-80 e) has an associated spaced position (84 a-84 e) from which the measurement probe is accelerated towards the touch trigger measurement point (80 a-80 e) such that the measurement probe is caused to move in a direction away from the touch trigger measurement pointEach of the plurality of touch-triggered measurement points is separated from the associated spaced location (84 a-84 e) by a spacing distance (S) 1 To S 5 ). The method further comprises defining different separation distances (S) for at least some of the plurality of touch-triggered measurement points (80 a-80 e) 1 To S 5 ) And based on the separation distance (S) associated with each touch-triggered measurement point (80 a-80 e) 1 To S 5 ) To calculate a probe feed rate (F) to be used in acquiring said touch-triggered measurement points 1 To F 5 ). Corresponding computer programs and devices are also described.)

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