阅读说明：本技术 用于温度感测的方法和电路、温度传感器以及电器 (Method and circuit for temperature sensing, temperature sensor and electrical appliance ) 是由 塞巴斯蒂安·普瓦里埃 于 2019-06-18 设计创作，主要内容包括：在实施例中,一种用于温度感测的方法包括以下步骤：馈送包括物体的温度的第一值的模拟信号(Sin)；使用第一模数转换器(ADC)(10)执行步骤一(S1)的模拟信号的模数转换,并且据此提供表示初始数字温度值的第一数字信号(Soutl)；使用第二ADC(20)执行步骤二(S2)的模拟信号(Sin)的模数转换,并且据此提供表示数字参考温度值的第二数字信号(Sout2)；定期馈送包括物体的温度的连续值的模拟信号(Sin),使用第二ADC(20)执行步骤三(S3)的模拟信号(Sin)的模数转换,并且据此提供表示连续数字温度值的第二数字信号(Sout2),并且根据连续数字温度值与数字参考温度值之间的差来计算数字delta温度值；以及只要数字delta温度值处于预定范围内,就重复后一步骤。(In an embodiment, a method for temperature sensing comprises the steps of: feeding an analog signal (Sin) comprising a first value of the temperature of the object; performing an analogue-to-digital conversion of the analogue signal of step one (S1) using a first analogue-to-digital converter (ADC) (10) and providing therefrom a first digital signal (Soutl) representing an initial digital temperature value; performing an analog-to-digital conversion of the analog signal (Sin) of step two (S2) using the second ADC (20) and providing therefrom a second digital signal (Sout2) representing a digital reference temperature value; periodically feeding an analog signal (Sin) comprising successive values of the temperature of the object, performing an analog-to-digital conversion of the analog signal (Sin) of step three (S3) using the second ADC (20), and providing therefrom a second digital signal (Sout2) representing successive digital temperature values, and calculating a digital delta temperature value from the difference between the successive digital temperature values and a digital reference temperature value; and repeating the latter step as long as the digital delta temperature value is within the predetermined range.)

1. A method for temperature sensing, comprising the steps of:

feeding an analog signal (Sin) comprising a first value of the temperature of the object,

performing (S1) an analog-to-digital conversion of the analog signal using a first analog-to-digital converter (ADC) (10) and providing therefrom a first digital signal (Sout1) representing an initial digital temperature value,

performing (S2) an analog-to-digital conversion of the analog signal (Sin) using a second ADC (20) and providing therefrom a second digital signal (Sout2) representing a digital reference temperature value,

periodically feeding the analog signal (Sin) comprising successive values of the temperature of the object, performing (S3) an analog-to-digital conversion of the analog signal (Sin) using the second ADC (20), and providing therefrom the second digital signal (Sout2) representing successive digital temperature values, and calculating a digital delta temperature value from the difference between the successive digital temperature values and the digital reference temperature value,

the latter step is repeated as long as the digital delta temperature value is within the predetermined range.

2. The method of claim 1, wherein the first and second light sources are selected from the group consisting of,

wherein the analog-to-digital conversion performed by the second ADC (20) consumes less power than the analog-to-digital conversion performed by the first ADC (10), in particular the analog-to-digital conversion performed by the second ADC consumes less than five percent of the power consumed by the analog-to-digital conversion performed by the first ADC (10), more in particular consumes less than one percent thereof.

3. The method according to claim 1 or 2,

wherein the second ADC (20) uses an internal analog signal (Sint) of the analog-to-digital conversion performed by the first ADC (10), the internal analog signal (Sint) being provided during the analog-to-digital conversion of the analog signal (Sin) performed by the first ADC (10), the internal analog signal (Sint) being provided in dependence on an amplification of the analog signal (Sin) or an amplification and integration of the analog signal (Sin).

4. Method according to claim 3, wherein both the analog signal (Sin) and the internal analog signal (Sint) are realized as differential signals.

5. Method according to any one of claims 1 to 4, wherein feeding the analog signal (Sin) comprises sampling an actual value of the analog signal (Sin), the analog signal representing a first value, a continuous value or an additional continuous value of the temperature of the object.

6. The method of any of claims 1 to 5, further comprising

Restarting the method if the digital delta temperature value is outside the predetermined range.

7. The method of any one of claims 1 to 6,

the first ADC implements a first or higher order sigma-delta ADC or a pipelined algorithm ADC or a combination thereof; and is

The second ADC implements a successive approximation ADC or a cyclic ADC or a combination thereof.

8. A circuit for temperature sensing, comprising

A first analog-to-digital converter, ADC, (10) having an input for receiving an analog signal (Sin) comprising a first value of a temperature of an object and an output for providing the first digital signal (Sout1) in accordance with an analog-to-digital conversion of the analog signal (Sin), the first digital signal (Sout1) comprising an initial digital temperature value,

a second ADC (20) having an input coupled to the first ADC (10), the second ADC (20) also having an output for analog-to-digital conversion of the analog signal (Sin) providing the second digital signal (Sout2), the second digital signal (Sout2) comprising a digital reference temperature value or a continuous digital temperature value,

a calculation unit (30) coupled to an output of the second ADC (20) and configured to provide a digital delta temperature value as a function of a difference between the consecutive digital temperature values and the digital reference temperature value,

wherein the circuit is prepared to operate in a first mode of operation or a second mode of operation based on the digital delta temperature value, and

wherein the second mode of operation consumes less power than the first mode of operation.

9. The circuit according to claim 8, wherein the first and second switches are connected to a common power supply,

wherein the second ADC (20) uses an internal analog signal (Sint) of the analog-to-digital conversion performed by the first ADC (10), the internal analog signal (Sint) being provided during the analog-to-digital conversion of the analog signal (Sin) performed by the first ADC (10), the internal analog signal (Sint) being provided in dependence on an amplification of the analog signal (Sin) or an amplification and integration of the analog signal (Sin).

10. The circuit according to claim 8 or 9,

wherein in the first mode of operation the first ADC (10) is activated and the second ADC (20) is deactivated, and in the second mode of operation the second ADC (20) is activated while the first ADC (10) is deactivated except for an operational amplifier (11) of the first ADC (10), and wherein the circuit operates in the first mode of operation while the first initial digital temperature value is provided, and

the circuit operates in the second mode of operation as long as the digital delta temperature value is within the predetermined range.

11. The circuit of any one of claims 8 to 10,

wherein the first ADC (10) comprises a first or higher order sigma-delta ADC or a pipeline algorithm ADC or a combination thereof, and the second ADC (20) comprises a successive approximation ADC or a cyclic ADC or a combination thereof.

12. The circuit of any one of claims 8 to 11,

wherein the first ADC (10) comprises:

an operational amplifier (11) having an input for receiving the analog input signal (Sin), the operational amplifier being configured for amplifying and/or integrating the analog input signal (11) and providing an internal analog signal (Sint) at its output accordingly,

a first comparator (12) coupled to an output of the operational amplifier (11), the first comparator (12) being configured to provide the internal analog signal (Sint) at its output from a digital bitstream signal (Sb), the digital bitstream signal (Sb) being representative of the first digital signal (Sout 1).

13. The circuit of any one of claims 8 to 12,

further comprising a main comparator (40) configured to receive a delta temperature signal (Sd) comprising the delta temperature value and a threshold signal (Sth) comprising an upper threshold and a lower threshold and configured to provide a control signal (Sctl) depending on a comparison of the delta temperature value signal (Sd) with the threshold signal (Sth),

wherein the control signal (Sctl) is provided to the first and second ADC (10, 20) for controlling them in the first and second operation mode, respectively.

14. The circuit of any one of claims 8 to 13,

wherein the calculation unit (30) comprises

A memory component (31) configured to store the digital reference temperature value, an

A subtraction unit (32) coupled to an output of the memory component (31) and configured to subtract the digital reference temperature value from the continuous digital temperature value and to provide the digital delta temperature value accordingly.

15. The circuit of any one of claims 12 to 14,

wherein the input of the second ADC (20) is adapted to receive the internal analog signal (Sint) of the first ADC (10), and the second ADC (20) comprises

A capacitance switching section (21) having a plurality of capacitors (Clp, Cln, C2p, C2n, C3p, C3n, C4p, C4n) and a plurality of switches (Sx),

a second comparator (22) coupled to the capacitive switching component (21), and

a logic unit (23) coupled to an output of the second comparator (22) and the capacitive switching unit (21),

wherein the logic means (23) is configured to control the switches combined with the capacitors during the second mode of operation according to a successive approximation algorithm by using the internal analog signal (Sint).

16. The circuit of any one of claims 8 to 15,

also comprises

A first scaling component (14) coupled to an output of the first ADC (10), and/or

A second scaling component (24) coupled to an output of the second ADC (20),

wherein the first scaling component (14) is configured to provide a first scaled digital signal (St1) comprising a scaled digital initial temperature value in accordance with a scaling of a first digital signal (Sout1) comprising the initial digital temperature value,

wherein the second scaling component (24) is configured to provide a second scaled digital signal (St2) comprising a scaled digital initial temperature value in dependence on a scaling of a second digital signal (Sout2) comprising the continuous digital temperature value or the additional continuous digital temperature value.

17. A temperature sensor has

An analog front end circuit (50) having at least two semiconductor devices (Tl, T2) configured to provide analog temperature dependent signals (Stn, Stp), and

the circuit (60) for temperature sensing according to any of claims 8 to 16, coupled to the analog front end circuit (50),

wherein the analog temperature-dependent signal is provided to an input of the circuit for temperature sensing (60).

18. An electrical appliance having the temperature sensor of claim 17.