阅读说明：本技术 一种背光分区尺寸的测量方法、装置及系统 (Method, device and system for measuring backlight partition size ) 是由 闫晓林 林智远 谢相伟 于 2020-09-01 设计创作，主要内容包括：本申请适用于显示单元技术领域,提供了一种背光分区尺寸的测量方法、装置及系统,该测量方法包括：基于若干预设测试图形的显示参数分别控制显示单元显示并获取显示图像的黑条纹亮度值,所述预设测试图形包括黑白相间的条纹,所述若干预设测试图形的偏移值不相等；根据若干预设测试图形对应的所述黑条纹亮度值及所述偏移值确定所述显示单元对应的背光分区的尺寸参数。本申请可以解决相关技术中无法获取显示单元对应的背光分区的尺寸参数的问题。(The application is applicable to the technical field of display units, and provides a method, a device and a system for measuring the size of a backlight partition, wherein the measuring method comprises the following steps: respectively controlling a display unit to display and obtain the brightness value of black stripes of a display image based on the display parameters of a plurality of preset test patterns, wherein the preset test patterns comprise black and white stripes, and the deviation values of the plurality of preset test patterns are unequal; and determining the size parameters of the backlight subareas corresponding to the display units according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns. The method and the device can solve the problem that the size parameter of the backlight partition corresponding to the display unit cannot be acquired in the related technology.)

1. A method for measuring the size of a backlight partition is characterized by comprising the following steps:

respectively controlling a display unit to display and obtain the brightness value of black stripes of a display image based on the display parameters of a plurality of preset test patterns, wherein the preset test patterns comprise black and white stripes, and the deviation values of the plurality of preset test patterns are unequal;

and determining the size parameters of the backlight subareas corresponding to the display units according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns.

2. The measurement method according to claim 1, wherein the acquiring of the luminance value of the black stripe of the display image includes:

acquiring a central brightness value of each black stripe of the display image, and taking an average value of the acquired central brightness values as a black stripe brightness value of the display image; or

And acquiring the central brightness value of the black stripe at the central position of the display image as the brightness value of the black stripe of the display image.

3. The measurement method according to claim 1 or 2, wherein if the black-and-white stripes are vertical stripes, the size parameters of the backlight partition in the horizontal direction are obtained; alternatively, the first and second electrodes may be,

and if the black and white stripes are horizontal stripes, acquiring the size parameters of the backlight subarea in the vertical direction.

4. The method according to claim 1 or 2, wherein if the width periods of the plurality of predetermined test patterns are all equal, the determining the size parameter of the backlight partition corresponding to the display unit according to the black stripe brightness values and the offset values corresponding to the plurality of predetermined test patterns comprises:

obtaining a curve of the change of the black stripe brightness value along with the offset value according to the black stripe brightness value and the offset value corresponding to a plurality of preset test patterns;

and taking the period value of the curve as the size parameter of the backlight subarea corresponding to the display unit.

5. The measurement method according to claim 1 or 2, wherein the plurality of preset test patterns include a plurality of preset test patterns with inconsistent width periods, and the preset test patterns with equal width periods are divided into a subset; the determining the size parameter of the backlight partition corresponding to the display unit according to the black stripe brightness value and the deviant corresponding to the plurality of preset test patterns comprises:

for each subgroup, obtaining a curve of the brightness value of the black stripe corresponding to the subgroup along with the change of the offset value;

and determining a target curve from the curves corresponding to the sub-groups, and taking the period value of the target curve as the size parameter of the backlight subarea corresponding to the display unit.

6. The measurement method according to claim 1 or 2, wherein before the step of controlling the display unit to display and obtain the brightness value of the black stripe of the display image respectively based on the display parameters of the plurality of preset test patterns, the method further comprises:

presetting display parameters of a preset test pattern, wherein the display parameters comprise width cycles of black and white stripes and corresponding deviation values;

and controlling a display unit to display based on the display parameters to obtain a corresponding preset test pattern.

7. The measurement method according to claim 6, wherein the presetting of the display parameters of each preset test pattern comprises:

setting the width of a white stripe of the preset test pattern based on the resolution of the display unit;

setting a width period based on the white stripe width;

and configuring an offset value for the width period to obtain a display parameter corresponding to a preset test pattern.

8. The measurement method according to claim 1, wherein the widths of the white stripes of the preset test patterns are all consistent, and the offset value of the preset test patterns is smaller than the width period; the offset value represents a minimum distance between the first row of white stripes and a long edge of the display area of the display unit, or represents a minimum distance between the first column of white stripes and a short edge of the display area of the display unit.

9. A terminal device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that the processor implements the measurement method according to any one of claims 1 to 8 when executing the computer program.

10. A computer-readable storage medium, in which a computer program is stored which, when being executed by a processor, carries out the measurement method according to any one of claims 1 to 8.

Technical Field

The application belongs to the technical field of displays, and particularly relates to a method, a device and a system for measuring backlight partition size.

Background

With the continuous development of Light Emitting Diode (LED) technology, LED backlight units have become the mainstream products of backlight sources in display units.

In the LED backlight display unit, the dynamic backlight display unit with LED partitions is gradually becoming a research and development hotspot because of its better dynamic contrast and hierarchical feeling. The smaller the backlight partition, the more precise the control of the backlight, and the more excellent the display effect. However, a smaller partition size may result in a significant increase in backlight cost.

For example, compared with the conventional LED backlight unit, the Mini-LED backlight unit adopts a denser chip arrangement to reduce the light mixing distance, thereby achieving an ultra-thin light source module. In addition, with local dimming (local dimming) technology, the Mini-LED has better contrast and High-Dynamic Range (HDR) display effect. Therefore, the Mini-LED backlight has become an important research and development direction in the field of liquid crystal display units.

However, for the dynamic backlight display units on the market, their backlight partition size cannot be directly known. Therefore, how to obtain the partition size of the dynamic backlight display unit and further analyze the display effect or the cost structure of the dynamic backlight display unit by using the partition size is an urgent technical problem to be solved.

Disclosure of Invention

The embodiment of the application provides a method, a device and a system for measuring the size of a backlight partition, which can solve the problem that the size parameter of the backlight partition of a display unit cannot be obtained in the related technology.

In a first aspect, an embodiment of the present application provides a method for measuring a backlight partition size, including:

respectively controlling a display unit to display and obtain the brightness value of black stripes of a display image based on the display parameters of a plurality of preset test patterns, wherein the preset test patterns comprise black and white stripes, and the deviation values of the plurality of preset test patterns are unequal;

and determining the size parameters of the backlight subareas corresponding to the display units according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns.

The embodiment of the application adopts the optical measurement method to measure the backlight subarea size of the display unit, and can measure the unknown backlight subarea size of the display unit under the condition of not causing damage.

In a second aspect, an embodiment of the present application provides a backlight partition size measurement apparatus, including:

the device comprises a brightness value acquisition unit, a display unit and a control unit, wherein the brightness value acquisition unit is used for respectively controlling the display unit to display and acquiring the brightness value of black stripes of a display image based on display parameters of a plurality of preset test patterns, the preset test patterns comprise black and white stripes, and offset values of the preset test patterns are unequal;

and the partition size obtaining unit is used for determining the size parameters of the backlight partition corresponding to the display unit according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns.

In a third aspect, an embodiment of the present application provides a terminal device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, where the processor implements the measurement method according to the first aspect when executing the computer program.

In a fourth aspect, an embodiment of the present application provides a backlight partition size measurement system, including the terminal device according to the third aspect, and further including a shooting device, where the shooting device is configured to shoot the display image.

In a fifth aspect, the present application provides a computer-readable storage medium, where a computer program is stored, where the computer program is executed by a processor to implement the measurement method according to the first aspect.

In a sixth aspect, an embodiment of the present application provides a computer program product, which, when running on a terminal device, causes the terminal device to execute the measurement method according to the first aspect.

It is understood that the beneficial effects of the second to sixth aspects can be seen from the description of the first aspect, and are not described herein again.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.

Fig. 1 is a schematic structural diagram of a terminal device to which a method for measuring a backlight partition size provided in an embodiment of the present application is applied;

FIG. 2A is a schematic view of a backlight partition size measurement system according to an embodiment of the present disclosure;

FIG. 2B is a schematic diagram of a backlight partition according to an embodiment of the present application;

fig. 3 is a schematic flowchart of a method for measuring a backlight partition size according to an embodiment of the present disclosure;

FIG. 4A is a schematic diagram of a test pattern provided in an embodiment of the present application;

FIG. 4B is a schematic diagram of a test pattern provided in another embodiment of the present application;

FIG. 5 is a schematic diagram illustrating a method for measuring a backlight partition size according to an embodiment of the present disclosure;

FIG. 6 is a schematic diagram illustrating a variation curve presented in a method for measuring a backlight partition size according to an embodiment of the present disclosure;

FIG. 7 is a flowchart illustrating a method for measuring a backlight partition size according to another embodiment of the present disclosure;

FIG. 8 is a schematic structural diagram of a backlight partition size measurement apparatus according to an embodiment of the present disclosure;

FIG. 9 is a schematic structural diagram of a backlight partition size measurement apparatus according to another embodiment of the present disclosure;

fig. 10 is a schematic structural diagram of a backlight partition size measurement apparatus according to another embodiment of the present application.

Detailed Description

In the following description, for purposes of explanation and not limitation, specific details are set forth, such as particular system structures, techniques, etc. in order to provide a thorough understanding of the embodiments of the present application. It will be apparent, however, to one skilled in the art that the present application may be practiced in other embodiments that depart from these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present application with unnecessary detail.

It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.

It should also be understood that the term "and/or" as used in this specification and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

As used in this specification and the appended claims, the term "if" may be interpreted contextually as "when", "upon" or "in response to" determining "or" in response to detecting ". Similarly, the phrase "if it is determined" or "if a [ described condition or event ] is detected" may be interpreted contextually to mean "upon determining" or "in response to determining" or "upon detecting [ described condition or event ]" or "in response to detecting [ described condition or event ]".

Furthermore, in the description of the present application and the appended claims, the terms "first," "second," "third," and the like are used for distinguishing between descriptions and not necessarily for describing or implying relative importance.

Reference throughout this specification to "one embodiment" or "some embodiments," or the like, means that a particular feature, structure, or characteristic described in connection with the embodiment is included in one or more embodiments of the present application. Thus, appearances of the phrases "in one embodiment," "in some embodiments," "in other embodiments," or the like, in various places throughout this specification are not necessarily all referring to the same embodiment, but rather "one or more but not all embodiments" unless specifically stated otherwise. The terms "comprising," "including," "having," and variations thereof mean "including, but not limited to," unless expressly specified otherwise.

The method for measuring the backlight partition size provided by the embodiment of the application can be applied to terminal equipment, wherein the terminal equipment comprises a computer (computer), for example: personal computers, supercomputers, network computers, industrial computers, standalone servers, server clusters or distributed servers, and the like. The embodiment of the present application does not set any limit to the specific type of the terminal device.

Fig. 1 is a schematic structural diagram of a terminal device according to an embodiment of the present application. As shown in fig. 1, the terminal device 1 of the embodiment includes: at least one processor 10 (only one is shown in fig. 1), a memory 11, and a computer program 12 stored in the memory 11 and executable on the at least one processor 10, wherein the processor 10 executes the computer program 12 to implement the steps in the embodiments of the backlight partition size measurement method provided by the embodiments of the present application. Or the functions of each unit in the measurement device for the size of each backlight partition provided by the embodiment of the application are realized.

The terminal device 1 may include, but is not limited to, a processor 10 and a memory 11. Those skilled in the art will appreciate that fig. 1 is merely an example of the 1 terminal device 1, and does not constitute a limitation of the 1 terminal device 1, and may include more or less components than those shown, or combine some components, or different components, such as an input-output device, a network access device, and the like.

The Processor 10 may be a Central Processing Unit (CPU), and the Processor 10 may be other general purpose Processor, a Digital Signal Processor (DSP), an Application Specific Integrated Circuit (ASIC), an off-the-shelf Programmable Gate Array (FPGA) or other Programmable logic device, a discrete Gate or transistor logic device, a discrete hardware component, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 11 may in some embodiments be an internal storage unit of the terminal device 1, such as a hard disk or a memory of the terminal device 1. In other embodiments, the memory 11 may also be an external storage device of the terminal device 1, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card), and the like provided on the terminal device 1. Further, the memory 11 may also include both an internal storage unit and an external storage device of the terminal device 1. The memory 11 is used for storing an operating system, an application program, a BootLoader (BootLoader), data, and other programs, such as program codes of the computer program. The memory 11 may also be used to temporarily store data that has been output or is to be output.

Referring to fig. 2A, fig. 2A is a schematic view of a system for measuring a backlight partition size according to an embodiment of the present disclosure. The measurement system includes: a terminal device 201 and a photographing device 202. It should be noted that, in order to better understand the technical solution of the present application, a display unit 203 to be subjected to backlight partition size measurement is shown in fig. 2A. It will be understood by those skilled in the art that the display unit 203 is not an essential component constituting the divisional dimension measurement system. The display unit 203 and the photographing apparatus 202 communicate with the terminal apparatus 201 through a wired and/or wireless network.

The display unit 203 includes any form of backlight display unit, a display device such as a television or the like that provides a light source in a backlight structure.

Fig. 2B is a schematic diagram of a backlight unit of a display unit according to an embodiment of the present disclosure. As shown in fig. 2B, the lines in the lateral direction (horizontal direction) and the longitudinal direction (vertical direction) represent the boundaries of the backlight sections, and the backlight unit of the display unit includes a plurality of backlight sections arranged in an array, each having the same size. The number of the LED chips in each backlight partition is equal (the distance between two adjacent LEDs is equal), the current flowing into each LED chip in one backlight partition is the same, and the input signals of each LED chip are the same (i.e., the LED chips in the backlight partition are controlled at the same time). The measurement method provided by the embodiment of the application measures the length and/or width dimension of a single backlight partition. That is, the size parameter of the backlight partition of the embodiment of the present application refers to the length and/or width of the single backlight partition in the backlight unit. Pixels are typically used as units of length and width. The lateral direction shown in fig. 2B is a display unit length direction, and the longitudinal direction shown in fig. 2B is a display unit height direction, and the backlight unit includes M backlight partitions in the lateral direction and N backlight partitions in the longitudinal direction, and includes M × N backlight partitions in total. As in the non-limiting example of fig. 2B, where M is 5 and N is 4, the backlight unit includes 20 backlight partitions. It is to be understood that this description is made only by way of example and not as a limitation on the present application.

In an embodiment of the present application, the terminal device 201 controls the display unit 203 to sequentially display a plurality of preset test patterns, where the preset test patterns include periodic black-and-white alternate stripes; the plurality of preset test patterns correspond to different offset values, where the offset values reflect minimum distances that the first row of white stripes in the preset test patterns deviate from the corresponding edges of the display area of the display unit 203, for example, when the black-and-white stripes are horizontal stripes, the offset values refer to the minimum distance between the first row of white stripes and the long edge of the display area of the display unit 203 (from top to bottom, the minimum distance between the first row of white stripes and the uppermost edge of the display area); when the black-and-white alternate stripes are vertical stripes, the offset value refers to the minimum distance between the first column of white stripes and the short edge of the display area of the display unit 203 (starting from left to right, the minimum distance between the first column of white stripes and the leftmost edge of the display area).

The terminal apparatus 201 controls the photographing apparatus 202 to photograph a display image of the display unit 203 at the time of displaying each of the test patterns. The terminal device 201 acquires a series of the display images, acquires a black stripe luminance value of each of the display images, and then acquires a size parameter of the display unit backlight partition based on the black stripe luminance value and the offset value.

The embodiment of the application provides a measurement system for the size of a backlight partition, which measures the size parameter of the backlight partition by adopting an optical measurement method and can measure the size of the backlight partition of an unknown display unit under the condition of not disassembling a backlight plate.

The following describes a method for measuring the size of a backlight partition provided in an embodiment of the present application in detail.

Fig. 3 shows a schematic flowchart of a method for measuring a backlight partition size provided by the present application. The method is executed by a backlight partition size measuring device, the measuring device is configured on the terminal equipment, and can be realized by software and/or hardware. By way of example and not limitation, the method may be applied to the terminal device described above with respect to fig. 1. As shown in fig. 3, the method includes steps S310 to S340, and the implementation process and principle of each step are as follows.

And S310, presetting display parameters of a preset test pattern, wherein the display parameters comprise the width period of the black and white stripes and the corresponding deviation value.

In some embodiments of the present application, a set of display parameters of a test pattern is preset, each test pattern includes periodic black-and-white alternate stripes, the period values of a plurality of test patterns are the same, and each test pattern corresponds to an offset value of a different size.

In some embodiments of the present application, the step S310 further includes:

and controlling the display unit to display based on the display parameters to obtain a corresponding preset test pattern.

In some embodiments of the present application, the display unit may be controlled to display a corresponding image based on the set display parameters, and a series of preset test patterns, that is, a group of test patterns, may be generated. Each preset test pattern comprises black and white alternate stripes, and each preset test pattern corresponds to a different offset value.

The preset test pattern is a one-dimensional stripe, and the stripe can be a horizontal stripe or a vertical stripe. Each preset test pattern comprises black and white alternate stripes. As shown in fig. 4A, one of the schematic diagrams of the preset test pattern is shown, in the example shown in fig. 4A, the black and white alternate stripes are stripes in the longitudinal direction, i.e. the vertical direction, and the preset test pattern includes three independent features: white width n, period value p and offset value o. The units of these three features are the number of pixels. The period value p is the sum of the white width and the black width, and the period value can also be referred to as the width period, that is, the width period is the sum of the widths of a black stripe and a white stripe. Referring to fig. 4A, the offset value o may be the distance from the left starting point of the first row of white pixels to the left edge of the test pattern in any row of the test pattern. For convenience of description, in the following example, if the black-and-white alternate stripes are in the vertical direction shown in fig. 4A, the minimum distance between the first column of white stripes and the left edge of the display area of the backlight unit is taken as an offset value o, and the distance between the white pixels closest to the left edge of the first column of white stripes can be considered as the offset value o. Or, in the direction from right to left, the minimum distance between the first column of white stripes and the right edge of the display area is taken as an offset value o, that is, the distance between the white pixels closest to the right edge is taken as the offset value o.

In other examples, as shown in fig. 4B, the black and white alternate stripes may be stripes in a lateral direction, i.e., a horizontal direction. At this time, the offset value o is the minimum distance between the first row of white stripes and the upper edge of the display area of the display unit from the top to the bottom, that is, the distance between the white pixel points closest to the upper edge is taken as the offset value o; or, from bottom to top, the minimum distance between the first row of white stripes and the lower edge of the display area of the display unit, that is, the distance between the white pixels closest to the lower edge, is taken as the offset value o.

In the embodiment of the present application, the stripe direction of the black and white alternate stripes may be along the width direction of the display unit screen, i.e. the vertical direction, as shown in fig. 4A; it is also possible to have the length direction of the display unit screen, i.e. the horizontal direction, as shown in fig. 4B. The gray level of the white portion of the test pattern is preset to a maximum value, typically 255. The gray level of the black portion is the lowest value, usually 0.

In an implementation manner of the present application, the presetting of the display parameters of the test pattern includes:

setting the width of a white stripe of the test pattern based on the resolution of the display unit;

setting a width period based on the width of the white stripes; and configuring the deviation value for the width period to obtain the display parameter of each test pattern in a group of test patterns.

The embodiment of the application needs to use a group of test patterns. All test patterns in the set have the same white width n, i.e. the width of the white stripe. The white width n should be selected such that the optical imager, e.g., a camera, can measure a relatively stable peak brightness. The width of the white stripe of the test pattern may be set based on the resolution of the display unit. The width of the white stripe is usually in the range of 4 to 128 pixels, depending on the resolution typically employed by the display unit.

The period p is chosen such that the width of the black portion is larger than the size of a single backlight partition. Since the size of a single backlight partition is unknown, it may be that the test pattern generated by the initially set period p cannot measure the exact backlight partition size, and therefore in some embodiments of the present application, several different periods may be selected to try until a reasonable backlight partition size is found. It should be understood that these different periods of black and white alternate stripes are of a fixed width or n width. The value of the period p is usually between 16 and 640 pixels. For a certain period p, a series of test patterns are generated according to the period p and the width n of the white stripe, the values of the offsets o corresponding to the series of test patterns are generally uniformly distributed in a [1, p ] interval, and first coarse search and then fine search are carried out. Therefore, the value of o is usually between 1 and 640 pixels.

The test principle of the embodiment of the present application is shown in fig. 5 and 6. The dotted line c in fig. 5 indicates the boundary of adjacent backlight partitions in the backlight unit, and the LED1, the LED2, the LED3, the LED4, and the LED5 sequentially indicate the LEDs in the five backlight partitions. When different offset values o are selected for the test pattern, the offset values o in the graphs (a) and (b) in FIG. 5 are different, and the offset value o in the graph (a) is₁(b) the offset value of the graph is o₂. Of test patternsThe white stripes correspond to the high gray levels H in fig. 5 and the black stripes correspond to the low gray levels L in fig. 5. The black and white alternate stripes in the test pattern are gradually moved from the initial position of the graph (a) in fig. 5 to the position shown in the graph (b) in fig. 5. When the black and white alternate stripes in the test pattern are located at the positions shown in the diagram (a) in fig. 5, the LED1 and the LED3 are controlled to be turned on, and the LED2 and the LED4 are controlled to be turned off. When the black and white alternate stripes in the test pattern are located at the positions shown in the diagram (b) in fig. 5, all of the LEDs 1,2, 3 and 4 are controlled to be turned on. Since there is light leakage in the case of the zero gray level L, if the LEDs 1 to 4 are all controlled to be turned on as shown in (b) of fig. 5, the luminance of the luminance test point a is high. If the LED2 and the LED4 are not lit, as shown in (a) of fig. 5, the brightness of the brightness test point a is low. Therefore, by changing the characteristic of the test pattern, i.e., the offset o, it can be observed that the luminance b of the central black stripe exhibits a periodic variation with the offset o, as shown in fig. 6, the period Q of the luminance variation curve is equal to the size of the backlight partition. In fig. 6, the intensity variation width of the luminance variation curve is W. This test is applicable to both the length direction and the height direction of the display unit. When the stripe direction is the longitudinal direction shown in fig. 4A, the dimension of the display unit corresponding to the backlight partition in the length direction can be measured. When the stripe direction is the horizontal direction shown in fig. 4B, the dimension of the width direction of the backlight partition corresponding to the display unit can be measured.

It should be noted that step S310 is a preparation step in the embodiment of the present application, and may be applied to each backlight partition size measurement method after setting the display parameters of the test pattern, and the step does not need to be executed each time the backlight partition size measurement is performed.

And S320, controlling the display unit to display and acquire the brightness value of the black stripe of the display image based on the display parameters of the test image.

In the embodiment of the present application, step S320 includes: controlling a display unit to display the test graph based on the display parameters of the test graph, acquiring a display image shot by the display unit when the test graph is displayed, and acquiring the black stripe brightness value of the display image.

In one possible implementation manner, the terminal device sends a series of preset test patterns (or display parameters thereof) to the display unit, and controls the display unit to sequentially display the preset test patterns. And the terminal equipment controls the display unit to display the test pattern and controls the shooting equipment to shoot the display unit to display the display image when the test pattern is preset. For example, the terminal device controls the display unit to sequentially display a series of test patterns, and controls the shooting device to regularly shoot a corresponding display image when the display unit displays each test pattern. And respectively acquiring the brightness value of the black stripe of each display image until the shooting equipment finishes shooting the display image corresponding to each test pattern.

In another possible implementation manner, the terminal device does not send a series of preset test patterns (or display parameters thereof) to the display unit at a time, but sends one preset test pattern (or display parameters thereof) to the display unit at a time, and controls the display unit to display the preset test pattern. And the terminal equipment controls the display unit to display a preset test pattern and controls the shooting equipment to shoot a display image when the display unit displays the test pattern. And if the shooting equipment shoots the display image well. And the terminal equipment sends the next preset test pattern to the display unit, controls the display unit to display the preset test pattern and controls the shooting equipment to shoot the display image of the test pattern of the display unit. And until all the test patterns are sent to the display unit, shooting the display images corresponding to all the test patterns by the shooting equipment, and acquiring the black stripe brightness values of all the display images.

It should be noted that, because the plurality of test patterns correspond to different offset values o, when each preset test pattern is displayed in the display unit, distances between the first row or the first column of white stripes and the boundary of the display unit are different, that is, the offset values o are different.

In the embodiment of the application, the terminal device controls the shooting device to shoot the display image when the display unit displays one test pattern at a time, so that a series of display images returned by the shooting device can be acquired. Each test pattern corresponds to a display image.

It should be noted that the test pattern includes black and white alternate stripes, and the display image includes light and dark alternate stripes.

In one possible implementation manner, the acquiring a brightness value of a black stripe of a display image includes: and acquiring the central brightness value of the central black stripe in the display image.

For example, the luminance value of the center black stripe in the display image is acquired as the center luminance value, that is, the luminance value of the center position of the black stripe, that is, the center pixel position of the center black stripe is taken as the center luminance value. It should be noted that, in this case, the luminance values of the black stripes located in the middle of the display area may be summed, and the sum is averaged, and the average value is used as the corresponding central luminance value.

For another example, an average value of luminance values of a central pixel region of a preset size of a central black stripe of the display image is obtained as a central luminance value. That is, the average value of the luminance values of the respective pixel points in the central pixel region of the central black stripe is taken as the central luminance value.

Optionally, the preset size of the central pixel region is an empirical value, and is set as required, and only the preset size does not exceed the black stripe region to which the central pixel region belongs, which is not limited in the present application.

For another example, more generally, the brightness value of the central pixel point of any black stripe in the display image may be obtained as the central brightness value, or the average value of the brightness values of the central pixel areas of the preset size of any black stripe in the display image may be obtained as the central brightness value.

In a possible implementation manner, the acquiring a central luminance value of a black stripe in each of the display images includes: and acquiring the average brightness value of the central brightness values of the most central black stripes in each display image.

For example, the brightness values of the central pixel points corresponding to the plurality of black stripes at the center of the display image are obtained, and then the average value of the brightness values of the plurality of central pixel points is calculated and used as the central brightness value.

For another example, a plurality of black stripes in the middle of the display image and the average brightness values of the corresponding central pixel regions are obtained, and then the average value of the average brightness values of the central pixel regions is calculated and used as the central brightness value. The average brightness value is obtained by averaging the brightness values of the pixel points included in each central pixel region.

Alternatively, 3 black stripes in the middle of the display area may be selected. By the arrangement, on one hand, the calculation amount can be controlled, and the calculation cost is saved; on the other hand, a measurement result with high accuracy can be obtained.

For another example, more generally, the black stripes may not be the most central ones of the display images, and may be any ones of the black stripes in the display images, and the black stripes may be adjacent or non-adjacent. Even in some embodiments of the present application, the number of black stripes may be each black stripe in the display image, a central luminance value of each black stripe is obtained, and the obtained average value of the central luminance values is used as the central luminance value of the black stripe in the display image.

Please refer to fig. 5 (a) and (b), during the testing process, the LEDs corresponding to the white stripe region (i.e. the high gray level region) in the test pattern are basically in the "on" state, and the LEDs corresponding to the black stripe region (i.e. the zero gray level region) in the test pattern are switched to the "on" state or the "off" state. Therefore, the brightness of the black stripe region in the displayed image changes relatively greatly, that is, the light intensity at the black stripe changes in a larger magnitude than that of the bright stripe. In the embodiment of the application, the black stripes in the display image are selected for measuring the brightness value, so that a more accurate test result can be obtained.

Therefore, the corresponding black stripe luminance value is obtained for each test pattern having a different offset value o.

S330, determining the size parameters of the backlight subareas corresponding to the display units according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns.

In the embodiment of the application, the display images corresponding to the test patterns are obtained through the test patterns corresponding to the different offset values o, and then the black stripe brightness value of each display image is obtained, when the test patterns move, the brightness of the corresponding LEDs in the backlight partition changes accordingly, and when the white stripe moves on the display plane, the relative positions of the white stripe and the black stripe with the LED partitions also change. Therefore, the brightness of the white stripes and the black stripes also changes. Due to the spatial periodicity of the backlight partitions, the brightness variation is also periodically changed by the partitions, i.e. the brightness variation corresponds to the periodic variation of the backlight partitions. Therefore, the variation relationship of the black stripe luminance value with the variation of the offset value o is obtained. As an example, the period values of the variation curve, which correspond to the size parameters of the backlight partition of the display unit, can be obtained by fitting a plurality of black stripe luminance values and corresponding offset values. As another example, a corresponding variation relation curve is obtained based on the brightness value of the black stripe and the corresponding offset value; and taking the period value of the variation relation curve as a backlight partition size parameter of the display unit. In the embodiment of the present application, the curve may be referred to as a light intensity variation curve.

It should be noted that, if the stripe direction is a vertical stripe in steps S310 to S330, as shown in fig. 4A, the length parameter of the backlight partition corresponding to the display unit is measured in step S330. Therefore, if the width of the backlight partition corresponding to the display unit is to be measured, the steps S310 to S330 are repeated using the horizontal stripe test pattern shown in fig. 4B to measure the width of the backlight partition corresponding to the display unit.

The embodiment of the application measures the backlight subarea size corresponding to the display unit in an optical measurement mode, and can measure the backlight subarea size without damaging the backlight plate, so that the measurement is convenient and easy to implement.

As described above, since the backlight partition size of the display unit is not known, the display parameters initially set by the test pattern may not be able to obtain an accurate backlight partition size measurement result due to limitations of the number of samples and sampling intervals, etc.

Therefore, in order to obtain a more accurate measurement result, on the basis of the embodiment shown in fig. 3, an embodiment of the present application provides another method for measuring the backlight partition size, as shown in fig. 7. The embodiment shown in fig. 7 is the same as the embodiment shown in fig. 3, and the description thereof is omitted here for brevity.

And S710, presetting display parameters of the test pattern, wherein the display parameters comprise the width period of the black and white stripes and the corresponding deviation value.

And S720, controlling the display unit to display and acquire the brightness value of the black stripe of the display image based on the display parameters of the test image.

And S730, determining the size parameter of the backlight partition corresponding to the display unit according to the black stripe brightness values and the deviation values corresponding to a plurality of preset test patterns.

And S740, reducing the width cycle of the black and white alternate stripes, and repeatedly executing the steps S710 to S730.

In the embodiment of the present application, the initially selected period p cannot obtain a relatively accurate measurement result of the backlight partition size, and therefore, in step S740, the period value is reduced to generate a new set of test patterns.

The width of the white stripe of each new group of test patterns can be the same as or different from that of the original test patterns. That is, when the period value of the test pattern is changed, the width of the white stripe may not be adjusted, and only the width of the black stripe may be adjusted. For example, in some embodiments of the present application, the width n of the white stripe, i.e., the white width n, may be constant over multiple measurements. Alternatively, the white width n may be set to 6 to 10 pixels, preferably 8 pixels.

In the embodiment of the present application, the original set of test patterns is replaced with a new set of test patterns, the period value p of each new set of test patterns may be smaller than the period value of the original test patterns, and accordingly, the offset values are also reduced. For example, the value of the new period value may be half or less than half of the original test pattern period value, and at this time, each offset value is also reduced by half or less than half accordingly.

It should be noted that, if the backlight partition size is repeatedly measured after the period value is changed, and a new measurement result is obtained, or the backlight partition size does not meet the preset accuracy requirement, a new set of test patterns may be generated by continuously changing the period value, and the backlight partition size is repeatedly measured until a test result meeting the preset accuracy requirement is obtained. The preset accuracy requirement includes, but is not limited to, an error of the measurement result, or a value interval of the measurement result, for example, the error is less than 10%, or the measurement result of the backlight partition size is within 5 pixels, and the like, which is not limited in this application.

It should be noted that, in some other embodiments, if the adjacent interval in the series of deviation values o used to obtain the current measurement result is 1 pixel, this means that the sampling interval is small enough to satisfy the predetermined accuracy requirement.

In order to obtain a more accurate measurement result, based on the embodiment shown in fig. 3, another embodiment of the present application provides a method for measuring the size of the backlight partition, which is further optimized based on the embodiment shown in fig. 3.

In the embodiment of the present application, the preset test patterns include a plurality of preset test patterns with different width periods, and the preset test patterns with the same width periods are divided into a subset, that is, the width periods of the preset test patterns in each subset are equal.

At this time, in step S330 in the embodiment shown in fig. 3, the determining the size parameter of the backlight partition corresponding to the display unit according to the black stripe brightness values and the offset values corresponding to the plurality of preset test patterns includes:

for each subgroup, obtaining a curve of the brightness value of the black stripe corresponding to the subgroup along with the change of the offset value;

and determining a target curve from the curves corresponding to the preset test pattern subgroups, and taking the period value of the target curve as the size parameter of the backlight subarea corresponding to the display unit.

In the embodiment of the application, a plurality of test pattern subgroups are preset, the width periods of the preset test patterns in each test pattern subgroup are equal, and the width periods of the preset test patterns in different test pattern subgroups are unequal. Therefore, for each preset test pattern subgroup, a corresponding curve can be obtained based on the obtained central brightness values and the corresponding offset values. That is, curves corresponding to the preset test pattern subgroups are obtained. And then determining a target curve from the curves corresponding to the test pattern subgroups, and taking the period of the target curve as the backlight partition size of the display unit.

In an implementation manner of the present application, after obtaining respective corresponding curves of a plurality of preset test pattern subgroups, an average value of difference values of two adjacent offset values in each curve is determined, a curve with a minimum average value of difference values of two adjacent offset values is determined as a target curve, and a period of the target curve is taken as a backlight partition size of the display unit. It should be noted that, for a curve, the average value of the difference values between two adjacent offset values may be the average value of the difference values between all two adjacent offset values corresponding to the curve, or may be the average value of the difference values between two adjacent offset values.

Taking a television to be subjected to backlight partition size measurement as an example, a specific implementation process of the present application is described below. The backlight partition size measuring method comprises the following steps:

in a first step, a white width n is selected according to the television resolution, and the user may set the white width to n =8, or the terminal device system may set the white width to n =8 by default.

In the second step, a period value p is preliminarily selected, and the user can choose to set p to p =640, or the terminal device system defaults to p being half of the horizontal resolution or half of the vertical resolution of the television.

And thirdly, generating a series of test patterns according to the n and p selected in the first step and the second step, wherein the stripe direction of the test patterns is along the height direction of the television, for example, the stripe direction shown in fig. 4A, and the series of test patterns correspond to a series of offsets o. The range of values of the offset o typically covers the interval of values 1 to p.

And fourthly, controlling the television to display a series of test patterns generated in the third step, and controlling the shooting equipment to shoot each test pattern displayed by the television to obtain a display image corresponding to each test pattern. The central luminance value of each display image is measured. The measurement point may be selected to be at the center of a black stripe (or black stripe), or several black stripes may be selected to be averaged after brightness measurement. According to the corresponding relationship between the deviation value and the central brightness value, an intensity variation curve similar to that shown in fig. 6 is obtained. At this time, if the selected value of p is just suitable, an accurate backlight partition size measurement result can be obtained. However, if the selected p value is large, the obtained curve may have a small intensity variation range or even may have no intensity variation, and the size of the backlight partition cannot be accurately determined, and the subsequent steps are continuously executed.

In a fifth step, the first to fourth steps are repeated, but in the second step a smaller period value p is selected. Illustratively, the strategy for selecting p is that the new p is half the value of the old p. After repeating the first step and the fourth step, a new intensity variation curve is obtained.

And sixthly, repeating the fifth step until the size of the backlight subarea can be accurately judged when the period value p takes a certain value.

And seventhly, if the size of the backlight subarea in the length direction of the television, namely the horizontal direction or the transverse direction, is obtained in the sixth step. The first to sixth steps are repeated but the stripe direction of the third step is changed from along the height direction of the tv set to along the length direction of the tv set in the repeating process, for example, the stripe direction shown in fig. 4B. Repeating the first step to the sixth step results in the size of the backlight partition in the height direction of the television, i.e. in the vertical direction or the longitudinal direction.

Taking a television to be subjected to backlight partition size measurement as an example, another exemplary description is given below of a specific implementation process of the present application. The backlight partition size measuring method comprises the following steps:

in the first step, the user can set a period value p by himself at the terminal device, or the terminal device system defaults to set a period value p.

In a second step, the white width n and a series of offset values o are determined from the period value p.

As a non-limiting example, determining the white width n from the period value p comprises: and determining a first preset interval to which the period value p belongs, and acquiring the white width n corresponding to the first preset interval to which the period value p belongs.

Determining a series of offset values o from the period value p comprises: and determining a second preset interval to which the period value p belongs, and acquiring a group of offset values o corresponding to the second preset interval to which the period value p belongs.

It should be understood that the range of values for the set of offset values o typically covers a range of values from 1 to p.

For example, if P > =100, the white width n = P/10; if 100> p > =50, the white width n = p/5; if p <50, the white width n = 10.

If P >50, the interval between two adjacent offset values in the set of offset values o is P/50, i.e. the set of offset values o is: p/50, 2 × p/50, 3 × p/50, 4 × p/50, (p-1) × p/50, p × p/50. If p < =50, the interval between two adjacent offset values in the set of offset values o is 1, i.e. the set of offset values o is: 1,2, 3, 4,. cndot.p-1, p.

This example may be represented by a table as shown in table one below.

Watch 1

And thirdly, generating a series of test patterns according to the p, n and o determined in the first step and the second step, wherein the stripe direction of the test patterns is along the height direction of the television, for example, the stripe direction shown in fig. 4A, and the series of test patterns correspond to a series of offsets o.

And fourthly, controlling the television to display a series of test patterns generated in the third step, and controlling the shooting equipment to shoot each test pattern displayed by the television to obtain a display image corresponding to each test pattern. The central luminance value of each display image is measured. The measurement point may be selected to be at the center of a black stripe (or black stripe), or several black stripes may be selected to be averaged after brightness measurement. According to the corresponding relationship between the deviation value and the central brightness value, an intensity variation curve similar to that shown in fig. 6 is obtained. At this time, if the selected value of p is just suitable, an accurate backlight partition size measurement result can be obtained. However, if the selected p value is large, the obtained curve may have a small intensity variation range or even may have no intensity variation, and the size of the backlight partition cannot be accurately determined, and the subsequent steps are continuously executed.

In a fifth step, the first to fourth steps are repeated, but in the second step a smaller period value p is selected. Illustratively, the strategy for selecting P is that the new P is half the old P value (the n-th acquired P value is half the n-1-th acquired P value). After repeating the first step and the fourth step, a new intensity variation curve is obtained.

And sixthly, repeating the fifth step until the size of the backlight subarea can be accurately judged when the period value p takes a certain value.

And seventhly, if the size of the backlight subarea in the length direction of the television, namely the horizontal direction or the transverse direction, is obtained in the sixth step. The first to sixth steps are repeated but the stripe direction of the third step is changed from along the height direction of the tv set to along the length direction of the tv set in the repeating process, for example, the stripe direction shown in fig. 4B. Repeating the first step to the sixth step results in the size of the backlight partition in the height direction of the television, i.e. in the vertical direction or the longitudinal direction.

Taking the full high-definition television to be subjected to the backlight partition size measurement as an example, another exemplary description is made below on a specific implementation process of the present application. In this example, the resolution of the television is 1920 x 1080.

The backlight partition size measuring method comprises the following steps:

in a first step, a white width n is selected according to the television resolution, the white width being set to n = 8.

In the second step, a period value of p =200 is initially set.

And thirdly, generating a series of test patterns with the stripe direction along the height direction (or longitudinal direction) of the television according to the n and the p selected in the first step and the second step. The offset values o of a series of test patterns are 20, 40, 60, 80,100, 120, 140, 160, 180, 200 in order.

And fourthly, controlling the television to sequentially display a series of test patterns. And acquiring a corresponding display image aiming at the test graph displayed each time. And selecting the positive center of 3 black stripes at the most center of the displayed image, and averaging after brightness measurement to obtain the central brightness value. Therefore, based on the correspondence relationship between the offset value o and the central luminance value, a curve having a shape similar to that shown in fig. 6 is obtained. The intensity of the curve then varies to a lesser extent, only roughly judging the period to be 10 to 50 pixels.

And fifthly, returning and repeating the second step to the fourth step according to the result of the fourth step. During the course of repeated tests, p and n are adjusted. Selecting p in the second step as 80, and selecting the value of the offset value o as: 10, 20, 30, 40, 50, 60, 70,80, 90, 100, a new test pattern is generated. And acquiring the display image again based on the new test pattern to obtain a new curve. From the new curve, the period can be roughly judged to be in the range of 15 to 25 pixels.

And sixthly, repeating the fifth step. In the process of repeated testing, p is selected to be 40, and the value of the offset value o is selected as follows: 1,2, 3, 4, 5,..., 38, 39, 40. When these characteristics are selected, the obtained curve intensity changes significantly, and it can be determined that the period is 20 pixels, i.e., the backlight partition size in the television length direction (or transverse direction) is 20 pixels.

Seventh, the first to sixth steps are repeatedly performed, but the stripe direction in the third step is changed from the height direction (or longitudinal direction) to the length direction (or lateral direction) of the tv. The values of p and o can be the same as before. The resulting backlight partition size in the height direction (i.e., the portrait direction) of the television is also 20 pixels.

It should be understood that, the sequence numbers of the steps in the foregoing embodiments do not imply an execution sequence, and the execution sequence of each process should be determined by its function and inherent logic, and should not constitute any limitation to the implementation process of the embodiments of the present application.

Fig. 8 shows a block diagram of a structure of a backlight partition size measuring device provided in the embodiment of the present application, corresponding to the backlight partition size measuring method described in the above embodiment, and only the parts related to the embodiment of the present application are shown for convenience of description.

Referring to fig. 8, the measuring apparatus includes:

a brightness value obtaining unit 81, configured to respectively control the display unit to display and obtain a brightness value of a black stripe of a display image based on display parameters of a plurality of preset test patterns, where the preset test patterns include black and white stripes, and offset values of the plurality of preset test patterns are unequal;

and a partition size obtaining unit 82, configured to determine a size parameter of the backlight partition corresponding to the display unit according to the black stripe brightness values and the offset values corresponding to the plurality of preset test patterns.

Optionally, the acquiring a brightness value of a black stripe of the display image includes:

acquiring a central brightness value of each black stripe of the display image, and taking an average value of the acquired central brightness values as a black stripe brightness value of the display image; or

And acquiring the central brightness value of the black stripe at the central position of the display image as the brightness value of the black stripe of the display image.

Optionally, as shown in fig. 9, the apparatus further includes: the unit 80 is preset.

The presetting unit 83 is configured to preset display parameters of a preset test pattern, where the display parameters include a width period of a black-and-white stripe and a corresponding offset value;

and controlling a display unit to display based on the display parameters to obtain a corresponding preset test pattern.

Optionally, the partition size obtaining unit 82 is specifically configured to:

obtaining a curve of the change of the black stripe brightness value along with the offset value according to the black stripe brightness value and the offset value corresponding to a plurality of preset test patterns;

and taking the period value of the curve as the size parameter of the backlight subarea corresponding to the display unit.

Optionally, the preset test patterns include a plurality of preset test patterns with inconsistent width periods, the preset test patterns with equal width periods are divided into a subset, and the partition size obtaining unit 82 is specifically configured to:

for each subgroup, obtaining a curve of the brightness value of the black stripe corresponding to the subgroup along with the change of the offset value;

and determining a target curve from the curves corresponding to the sub-groups, and taking the period value of the target curve as the size parameter of the backlight subarea corresponding to the display unit.

Optionally, as shown in fig. 10, the measuring apparatus further includes:

a repetition measurement unit 84 for:

the width cycle of the black-and-white alternate stripes is reduced, and the steps implemented by the preset unit 83, the brightness value obtaining unit 81, and the partition size obtaining unit 82 are repeated.

It should be noted that, for the information interaction, execution process, and other contents between the above-mentioned devices/units, the specific functions and technical effects thereof are based on the same concept as those of the embodiment of the method of the present application, and specific reference may be made to the part of the embodiment of the method, which is not described herein again.

It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.

The embodiments of the present application further provide a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the computer program implements the steps in the above-mentioned method embodiments.

The embodiments of the present application provide a computer program product, which when running on a terminal device, enables the terminal device to implement the steps in the above method embodiments when executed.

The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, all or part of the processes in the methods of the embodiments described above can be implemented by a computer program, which can be stored in a computer-readable storage medium and can implement the steps of the embodiments of the methods described above when the computer program is executed by a processor. Wherein the computer program comprises computer program code, which may be in the form of source code, object code, an executable file or some intermediate form, etc. The computer readable medium may include at least: any entity or device capable of carrying computer program code to a photographing apparatus/terminal apparatus, a recording medium, computer Memory, Read-Only Memory (ROM), Random Access Memory (RAM), electrical carrier wave signal, telecommunication signal, and software distribution medium. Such as a usb-disk, a removable hard disk, a magnetic or optical disk, etc. In certain jurisdictions, computer-readable media may not be an electrical carrier signal or a telecommunications signal in accordance with legislative and patent practice.

In the above embodiments, the descriptions of the respective embodiments have respective emphasis, and reference may be made to the related descriptions of other embodiments for parts that are not described or illustrated in a certain embodiment.

Those of ordinary skill in the art will appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware or combinations of computer software and electronic hardware. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus/network device and method may be implemented in other ways. For example, the above-described apparatus/network device embodiments are merely illustrative, and for example, the division of the modules or units is only one logical division, and there may be other divisions when actually implementing, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not implemented. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.