Optical monitoring of target characteristics

文档序号:1510193 发布日期:2020-02-07 浏览:37次 中文

阅读说明:本技术 对目标特性的光学监测 (Optical monitoring of target characteristics ) 是由 达伦·T·瓦利斯 于 2018-05-14 设计创作,主要内容包括:一种光学监测器包括被设置在光学监测器内并暴露于环境空气的目标,其中暴露于环境空气使得目标的光学特性产生变化。光学监测器还可以包括照射目标的光发射器和基于从目标反射的或透射通过目标的光来生成信号的光学检测器。处理设备可以激活光发射器并从光学检测器接收信号。(An optical monitor includes a target disposed within the optical monitor and exposed to ambient air, wherein exposure to ambient air causes a change in an optical characteristic of the target. The optical monitor may also include an optical emitter to illuminate the target and an optical detector to generate a signal based on light reflected from or transmitted through the target. The processing device may activate the light emitter and receive a signal from the optical detector.)

1. An optical monitor comprising

A target representing a component of a system being monitored, the target being disposed within the optical monitor and exposed to ambient air, wherein exposure to the ambient air causes a change in an optical characteristic of the target;

a light emitter configured to illuminate the target;

an optical detector configured to generate a signal based on light reflected from or transmitted through the target; and

a processing device configured to activate the light emitter and receive the signal from the optical detector.

2. The optical monitor of claim 1, further comprising a baffle configured to provide the ambient air to the target and to block ambient light from reaching the target or the optical detector.

3. The optical monitor of claim 1, further comprising a baffle configured to reduce light reaching the optical detector from the light emitter other than light interacting with the target.

4. The optical monitor of claim 1, wherein the processing device is further configured to analyze the signal from the optical detector and determine a change in a physical characteristic of the target.

5. The optical monitor of claim 1, wherein the light emitter comprises a vertical cavity surface emitting laser.

6. The optical monitor of claim 1, further comprising a second light emitter, wherein the second light emitter provides light at a frequency different from the frequency of the light provided by the light emitter.

7. The optical monitor of claim 6, further comprising a second optical detector, wherein the second optical detector is configured to receive light at the second frequency.

8. The optical monitor of claim 1, wherein the processing device is further configured to:

determining that the signal received from the optical detector satisfies a threshold; and

in response to determining that the signal satisfies a threshold, generating an indication that the threshold is satisfied.

9. The optical monitor of claim 1, further comprising a communication interface, wherein the processing device is configured to communicate with a host system through the communication interface.

10. The optical monitor of claim 1, wherein the target is copper, silver, steel, or a material coated with a metal film, and the optical property changes based on corrosion of the target.

11. The optical monitor of claim 1, wherein the target is a transparent target coated with a substance that promotes bacterial growth, and the optical characteristic varies based on growth of bacteria or mold on the target.

12. A method, comprising:

illuminating, by a light emitter, a target disposed within a device and exposed to ambient air, wherein the target represents one or more components of a system being monitored;

generating a measurement signal by an optical detector in response to receiving light reflected from the target; and

determining, by a processing device, a change in a physical characteristic of the target based on the measurement signal generated by the optical detector.

13. The method of claim 12, further comprising:

illuminating the target with light of a second frequency by a second light emitter; and

generating, by the optical detector, a second measurement signal in response to receiving the light of the second frequency reflected from the target.

14. The method of claim 12, further comprising:

illuminating the target with light of a second frequency by a second light emitter; and

generating a second measurement signal by a second optical detector in response to receiving light of the second frequency reflected from the target.

15. The method of claim 12, further comprising:

determining that the measurement signal generated by the optical detector satisfies a threshold; and

in response to determining that the measurement signal satisfies a threshold, generating an indication that the threshold is satisfied.

16. A system, comprising:

a host system; and

an optical monitor communicatively coupled to the host system over a communication channel, the optical monitor comprising:

a target representing one or more components of a system being monitored, the target being disposed within the optical monitor and exposed to ambient air, wherein exposure to the ambient air causes a change in an optical characteristic of the target;

a light emitter configured to illuminate the target; and

an optical detector configured to generate a signal based on light reflected from or transmitted through the target; and

a processing device configured to control operation of the optical monitor.

17. The system of claim 16, wherein the monitored system is a computer system and the optical characteristic of the target changes due to corrosion of the target.

18. The system of claim 16, wherein the processing device of the optical monitor is further configured to:

receiving a request to update configuration parameters from the host system over the communication channel; and

updating the configuration parameters in response to receiving the request.

19. The system of claim 16, wherein the change in the optical characteristic of the target is indicative of the integrity of contacts and housings of the one or more components of the monitored system.

20. The system of claim 16, wherein the host system is configured to:

receiving the signal generated by the optical detector from the processing device over the communication channel; and

determining a level of corrosion of the one or more components of the monitored system based on the signal generated by the optical detector,

wherein the monitored system is a server within a data center and the one or more components are structures in the server.

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