阅读说明：本技术 数据存储装置及数据存储装置的操作方法 (Data storage device and operation method of data storage device ) 是由 金真洙 姜玟求 于 2019-07-31 设计创作，主要内容包括：本发明提供了一种数据存储装置。该数据存储装置可包括：非易失性存储器装置；以及控制器,控制非易失性存储器装置的读取操作,其中控制器包括：存储器,存储工作负载模式信息；以及处理器,基于工作负载模式信息检查第一时段中的工作负载模式,并且根据第一时段中的工作负载模式来判定在第一时段之后的第二时段中待执行的读取模式。(The invention provides a data storage device. The data storage device may include: a non-volatile memory device; and a controller controlling a read operation of the nonvolatile memory device, wherein the controller includes: a memory to store workload pattern information; and a processor checking a workload pattern in the first period based on the workload pattern information, and determining a read mode to be performed in a second period subsequent to the first period according to the workload pattern in the first period.)

1. A data storage device comprising:

a non-volatile memory device; and

a controller to control a read operation of the non-volatile memory device,

wherein the controller comprises:

a memory to store workload pattern information; and

a processor that checks a workload pattern in a first period based on the workload pattern information, and determines a read pattern to be performed in a second period subsequent to the first period according to the workload pattern in the first period.

2. The data storage device of claim 1, wherein the workload pattern in the first period of time includes information indicating whether commands provided to the non-volatile memory device in the first period of time are of the same type or different types, information indicating whether the size of a block of data provided to the non-volatile memory device in the first period of time is the same or different, and information about the number of commands queued in a command queue.

3. The data storage device of claim 1, wherein the read mode comprises a cache read mode and a normal read mode.

4. The data storage device of claim 3, wherein the workload pattern information comprises:

a first value indicating whether all commands provided to the non-volatile memory device in the first period of time are read commands;

a second value indicating whether a block of data provided to the non-volatile memory device in the first period of time is one size; and

a third value indicating whether a number of commands queued in the command queue in the first period of time is greater than or equal to a threshold.

5. The data storage device of claim 4, wherein the processor determines that the cache read mode is to be performed in the second period of time when all of the first value, the second value, and the third value of the workload pattern information are in a set state.

6. The data storage device of claim 4, wherein the processor determines that the normal read mode is to be performed in the second period of time when one or more of the first value, the second value, and the third value of the workload pattern information is in a reset state.

7. The data storage device of claim 1,

wherein a flash translation layer, FTL, is loaded into the memory, an

Wherein the FTL includes a workload detection module.

8. The data storage device of claim 7, wherein at the end of the first period, the processor drives the workload detection module to detect a workload pattern in the first period and update the workload pattern information based on the detected workload pattern.

9. A method of operating a data storage device, the data storage device comprising a non-volatile memory device and a controller that controls read operations of the non-volatile memory device and that includes a memory for storing workload pattern information, the method of operation comprising:

checking a workload pattern in a first period based on the workload pattern information, an

Determining a read mode to be performed in a second period after the first period according to a workload pattern in the first period.

10. The operating method of claim 9, wherein the workload pattern in the first period of time includes information indicating whether commands provided to the non-volatile memory device in the first period of time are of the same type or different types, information indicating whether the size of a block of data provided to the non-volatile memory device in the first period of time is the same or different, and information about the number of commands queued in a command queue.

11. The method of operation of claim 9, wherein the workload pattern information comprises:

a first value indicating whether all commands provided to the non-volatile memory device in the first period of time are read commands;

a second value indicating whether a block of data provided to the non-volatile memory device in the first period of time is one size; and

a third value indicating whether a number of commands queued in the command queue in the first period of time is greater than or equal to a threshold.

12. The operation method according to claim 11, wherein determining the read mode to be performed in the second period of time includes:

determining whether the first value, the second value, and the third value of the workload pattern information are all in a set state; and

determining to execute a cache read mode as the read mode when it is determined that the first value, the second value, and the third value of the workload pattern information are all in the set state.

13. The operation method according to claim 11, wherein determining the read mode to be performed in the second period of time includes: determining to execute a normal read mode as the read mode when one or more of the first value, the second value, and the third value of the workload pattern information are in a reset state.

14. The method of operation of claim 9, further comprising:

detecting a workload pattern in the first period at a first point in time at which the first period ends; and

updating the workload pattern information based on the detected workload pattern.

15. The method of operation of claim 14, further comprising:

detecting a workload pattern in the second period at a second point in time at which the second period ends; and

updating the workload pattern information based on the detected workload pattern.

16. A data storage device comprising:

a non-volatile memory device; and

a controller that controls the non-volatile memory device to perform a cache read operation during a current period when the non-volatile memory device performs a set number of read operations on only a single size block of data during a previous period.

Technical Field

Various embodiments of the present disclosure relate generally to a semiconductor device, and more particularly, to a data storage device and an operating method of the data storage device.

Background

More recently, computing environment paradigms have turned into pervasive computing where computer systems can be used anytime and anywhere. Therefore, the use of portable electronic devices such as mobile phones, digital cameras, and notebook computers has been rapidly increasing. Such portable electronic devices typically use data storage devices that utilize memory devices. The data storage device is used for storing data used in the portable electronic device.

Since the data storage device using the memory device has no mechanical driver, the data storage device has excellent stability and durability, high information access speed, and low power consumption. Data storage devices having these advantages include Universal Serial Bus (USB) memory devices, memory cards having various interfaces, universal flash memory (UFS) devices, and Solid State Drives (SSDs).

Disclosure of Invention

Various embodiments relate to a data storage device and an operating method of the data storage device capable of selectively performing a cache read operation and a normal read operation according to a workload.

In an embodiment, a data storage device may include: a non-volatile memory device; and a controller configured to control a read operation of the nonvolatile memory device, wherein the controller includes: a memory configured to store workload pattern information; and a processor configured to check a workload pattern in a first period based on the workload pattern information, and determine a read mode to be performed in a second period subsequent to the first period according to the workload pattern in the first period.

In an embodiment, a method of operating a data storage device may include: the method includes checking a workload pattern in a first period based on the workload pattern information, and determining a read pattern to be performed in a second period subsequent to the first period according to the workload pattern in the first period.

In an embodiment, a data storage device may include a non-volatile memory device; and a controller configured to control the non-volatile memory device to perform a cache read operation during a current period when the non-volatile memory device performs a set number of read operations on only a single-sized data block during a previous period.

Drawings

Fig. 1 illustrates a configuration of a data storage device according to an embodiment.

Fig. 2 shows a configuration of a memory such as that of fig. 1.

Fig. 3 illustrates a Flash Translation Layer (FTL).

Fig. 4 shows a period set to detect a workload pattern.

Fig. 5 illustrates workload pattern information.

Fig. 6A shows a process of determining which read operation is performed in a subsequent period according to the workload pattern.

Fig. 6B and 6C illustrate a normal read operation and a cache read operation, respectively.

FIG. 7 illustrates a method of operation of a data storage device according to an embodiment.

FIG. 8 illustrates a data processing system including a Solid State Drive (SSD) according to an embodiment.

Fig. 9 shows a controller such as that shown in fig. 8.

FIG. 10 illustrates a data processing system including a data storage device, according to an embodiment.

FIG. 11 illustrates a data processing system including a data storage device, according to an embodiment.

FIG. 12 illustrates a network system including a data storage device, according to an embodiment.

Fig. 13 is a diagram illustrating a nonvolatile memory device included in a data storage apparatus according to an embodiment.

Detailed Description

A data storage device and an operation method of the data storage device according to the present disclosure are described below by various embodiments with reference to the accompanying drawings. Throughout the specification, references to "an embodiment" or the like are not necessarily to only one embodiment, and different references to any such phrase are not necessarily to the same embodiment.

It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, these elements are not limited by these terms. These terms are used to distinguish one element from another. Therefore, a first element described below may also be referred to as a second element or a third element without departing from the spirit and scope of the present invention.

It will be further understood that when an element is referred to as being "connected to" or "coupled to" another element, it can be directly on, connected or coupled to the other element or one or more intervening elements may be present. In addition, it will also be understood that when an element is referred to as being "between" two elements, it can be the only element between the two elements, or one or more intervening elements may also be present. Communication between two elements, whether directly or indirectly connected/coupled, may be wired or wireless unless stated otherwise or the context dictates otherwise.

As used herein, the singular form may also include the plural form and vice versa, unless the context clearly dictates otherwise. The articles "a" and "an" as used in this application and the appended claims should generally be construed to mean "one or more" unless specified otherwise or the context clearly dictates otherwise.

It will be further understood that the terms "comprises," "comprising," "includes" and "including," when used in this specification, specify the presence of stated elements, and do not preclude the presence or addition of one or more other elements. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Fig. 1 shows a configuration of a data storage device 10 according to an embodiment.

Referring to fig. 1, a data storage device 10 may store data accessed by a host device 20 such as: a mobile phone, an MP3 player, a laptop computer, a desktop computer, a game console, a TV or a car infotainment system. The data storage device 10 may also be referred to as a memory system.

The data storage device 10 may be configured as any of various storage devices according to an interface protocol coupled to the host device 20. For example, the data storage device 10 may be configured as any one of the following: a Solid State Drive (SSD), a multimedia card (MMC) such as eMMC, RS-MMC or micro-MMC, a Secure Digital (SD) card such as mini SD or micro SD, a Universal Serial Bus (USB) memory device, a universal flash memory (UFS) device, a Personal Computer Memory Card International Association (PCMCIA) card type memory device, a Peripheral Component Interconnect (PCI) card type memory device, a PCI express (PCI-E) card type memory device, a Compact Flash (CF) card, a smart media card, and a memory stick.

Data storage device 10 may be manufactured as any of a variety of types of packages, such as: package On Package (POP), System In Package (SIP), System On Chip (SOC), multi-chip package (MCP), Chip On Board (COB), wafer-level manufacturing package (WFP), and wafer-level package on package (WSP).

The data storage device 10 may include a nonvolatile memory device 100 and a controller 200.

The nonvolatile memory device 100 may operate as a storage medium of the data storage device 10. Depending on the memory cell, the nonvolatile memory device 100 may be configured as any of various types of nonvolatile memory devices such as: NAND flash memory devices, NOR flash memory devices, Ferroelectric Random Access Memory (FRAM) using a ferroelectric capacitor, Magnetic Random Access Memory (MRAM) using a Tunnel Magnetoresistance (TMR) layer, phase change random access memory (PRAM) using a chalcogenide alloy, and resistive random access memory (ReRAM) using a transition metal oxide.

Fig. 1 shows that the data storage device 10 includes one non-volatile memory device 100, but this is merely an example. The data storage device 10 may include a plurality of nonvolatile memory devices, and the present invention may also be applied to the data storage device 10 including a plurality of nonvolatile memory devices in the same manner.

The nonvolatile memory device 100 may include a memory cell array (not shown) having a plurality of memory cells arranged at respective intersections between a plurality of bit lines (not shown) and a plurality of word lines (not shown). The memory cell array may include a plurality of memory blocks, and each of the memory blocks may include a plurality of pages.

For example, each of the memory cells of the memory cell array may be configured as a single-layer cell (SLC) storing 1-bit data or a multi-layer cell (MLC) storing 2-bit or more data. MLCs may store 2-bit data, 3-bit data, 4-bit data, or more. In general, a memory cell storing 2-bit data may be referred to as an MLC, a memory cell storing 3-bit data may be referred to as a Triple Layer Cell (TLC), and a memory cell storing 4-bit data may be referred to as a Quadruple Layer Cell (QLC). However, in this specification, memory cells storing 2-bit data to 4-bit data may be collectively referred to as MLCs for convenience.

The memory cell array 110 may include one or more of SLCs and MLCs. In addition, the memory cell array 110 may include memory cells having a two-dimensional horizontal structure or memory cells having a three-dimensional vertical structure.

The controller 200 may control the overall operation of the data storage device 10 by driving firmware or software loaded to the memory 230. The controller 200 may decode and drive code-based instructions or algorithms, such as firmware or software. The controller 200 may be implemented in hardware or a combination of hardware and software.

Controller 200 may include a host interface 210, a processor 220, a memory 230, and a memory interface 240. Although not shown in fig. 1, the controller 200 may further include an Error Correction Code (ECC) engine that generates parity data by performing ECC encoding on write data provided from the host device and performs ECC decoding on read data read from the nonvolatile memory device 100 using the parity data.

The host interface 210 may interface the host device 20 and the data storage device 10 in response to a protocol of the host device 20. For example, the host interface 210 may communicate with the host device 20 via any one of the following protocols: USB (universal serial bus), UFS (universal flash), MMC (multimedia card), PATA (parallel advanced technology attachment), SATA (serial advanced technology attachment), SCSI (small computer system interface), SAS (serial SCSI), PCI (peripheral component interconnect), and PCI-e (PCI express).

Processor 220 may include a Micro Control Unit (MCU) and/or a Central Processing Unit (CPU). The processor 220 may process a request transmitted from the host device 20. To process requests transmitted from the host device 20, the processor 220 may drive code-based instructions or algorithms, i.e., firmware, loaded to the memory 230 and control the non-volatile memory device 100 and internal functional blocks such as the host interface 210, the memory 230, and the memory interface 240.

The processor 220 may generate a control signal for controlling the operation of the nonvolatile memory device 100 based on a request transmitted from the host device 20 and provide the generated control signal to the nonvolatile memory device 100 through the memory interface 240.

Memory 230 may be configured as random access memory such as dynamic ram (dram) or static ram (sram). Memory 230 may store firmware driven by processor 220. In addition, the memory 230 may store data, such as metadata, required to drive the firmware. That is, the memory 230 may operate as a working memory of the processor 220.

The memory 230 may include a data buffer for temporarily storing write data to be transferred from the host device 20 to the nonvolatile memory device 100 or read data to be transferred from the nonvolatile memory device 100 to the host device 20. That is, the memory 230 may operate as a buffer memory.

The memory interface 240 may control the non-volatile memory device 100 under the control of the processor 220. The memory interface 240 may also be referred to as a memory controller. The memory interface 240 may provide control signals to the non-volatile memory device 100. The control signals may include command, address, and operation control signals for controlling the nonvolatile memory device 100. The memory interface 240 may provide data stored in the data buffer to the nonvolatile memory device 100 or store data transferred from the nonvolatile memory device 100 in the data buffer.

Fig. 2 illustrates the memory 230 of fig. 1 according to an embodiment.

Referring to fig. 2, the memory 230 may include a first region R1 storing a Flash Translation Layer (FTL) and a second region R2 serving as a command queue CMDQ for queuing one or more commands corresponding to a request provided from the host device 20. However, in addition to the areas shown in fig. 2, the memory 230 may include areas for various other purposes, such as an area serving as a write data buffer that temporarily stores write data, an area serving as a read data buffer that temporarily stores read data, and an area serving as a map cache buffer that caches map data.

The memory 230 may include an area (not shown) to store system data or metadata. The workload pattern information WLPI may be stored in an area in the memory 230 where system data or metadata is stored. The workload pattern information WLPI will be described in detail below with reference to fig. 5.

When the nonvolatile memory device 100 is configured as a flash memory device, the processor 220 may control an intrinsic (unique) operation of the nonvolatile memory device 100 and drive the FTL to provide device compatibility with the host device 20. When the FTL is driven, the data storage device 10 can be recognized by the host device 20 and used as a general data storage device such as a hard disk.

The FTL stored in the first region R1 of the memory 230 may include modules for performing various functions and metadata required for driving the respective modules. The FTL may be stored in a system area (not shown) of the non-volatile memory device 100. When the data storage device 10 is powered on, the FTL may be read from the system area of the non-volatile memory device 100 and loaded into the first region R1 of the memory 230.

Fig. 3 illustrates an FTL according to an embodiment.

Referring to fig. 3, the FTL may include a workload detection module (WLDM)310, etc., but is not particularly limited thereto. Although fig. 3 only shows the workload pattern information WLPI, it is apparent to those skilled in the art that the FTL further may include various functional modules such as a garbage collection module, a wear leveling module, a bad block management module, an address mapping module, a write module, a read module, and a mapping module.

The WLDM310 may detect the workload pattern over a set period of time. The WLDM310 may update the workload pattern information WLPI stored in the memory 230 based on the detected workload pattern. The WLDM310 may determine whether to perform a cache read operation or a normal read operation in a subsequent period by referring to the workload pattern information WLPI, and provide a read control signal corresponding to the determination result to the processor 220. In the present embodiment, the WLDM310 may be driven by the control of the processor 220. In the present embodiment, a configuration in which the WLDM310 is included in the FTL will be described as an example. However, the WLDM310 may be configured in hardware or a combination of hardware and software.

Fig. 4 shows a period set to detect a workload pattern, and fig. 5 shows workload pattern information WLPI.

By way of example, fig. 4 shows only the first to third periods. However, the number of periods is not particularly limited to three, but may increase as time elapses. In fig. 4, "t" may indicate a current time point, and "t-1" may indicate a time point before the current time point. Further, "t + 1" may indicate a time point after the current time point, and "t + 2" may indicate a time point after "t + 1". The time between adjacent time points may be fixed. For example, adjacent time points may be separated by a set time. However, the present invention is not limited to this configuration. In another embodiment, the time intervals between adjacent time points may be different.

At time point "t", the processor 220 may drive the WLDM310 to detect a workload pattern for a first period of time from time point "t-1" to time point "t". For example, the workload patterns may include various pieces of information such as: the type of command provided to the non-volatile memory device 100 in the corresponding period, the size of the data block provided to the non-volatile memory device 100, and the queue depth. However, the workload pattern is not particularly limited to the above information.

For example, the WLDM310 may detect whether the commands provided to the non-volatile memory device 100 in the respective period, e.g., the first period, are all read commands or all write commands or a mixture of read commands and write commands. The WLDM310 may detect whether the size of the data block provided to the non-volatile memory device 100 in a corresponding period, e.g., a first period, is one size or a plurality of sizes. Further, the WLDM310 may detect whether the number of commands queued in the command queue CMDQ in the corresponding period, e.g., the first period, i.e., the queue depth, is greater than or equal to a threshold.

When all the commands provided to the nonvolatile memory device 100 in the first period are read commands, the WLDM310 may set the first field (read CMD only) of the workload mode information WLPI shown in fig. 5 to a "set (1)" state. When the sizes of the data blocks provided to the nonvolatile memory device 100 are all the same in the first period, the WLDM310 may set the second field (one type of block size) of the workload pattern information WLPI to a "set (1)" state. Further, when the number of commands queued in the command queue CMDQ, i.e., the queue depth, is greater than or equal to the threshold value in the first period, the WLDM310 may set the third field (the queue depth above the threshold value) of the workload pattern information WLPI to a "set (1)" state.

The workload pattern information WLPI may be used as reference information for determining whether it is more efficient to perform a cache read operation or to perform a normal read operation in a subsequent period.

Fig. 6A shows a process of deciding which read operation is performed in a subsequent period according to a workload pattern in an existing period, fig. 6B shows a normal read operation and fig. 6C shows a cache read operation.

As shown in fig. 6A, when the first field (read-only CMD), the second field (one type of block size), and the third field (queue depth above the threshold) of the workload pattern information WLPI are all set to the "set (1)" state, the WLDM310 may determine that it is efficient to perform the cache read operation in the subsequent period. When all fields of the workload pattern information WLPI are set to the "set (1)" state, it may indicate that a read operation is performed only on a data block of the same size during a previous period (i.e., a first period). In this case, the WLDM310 may determine that it is highly likely that only read operations for data blocks of the same size will be performed in subsequent periods.

When a read operation for a data block of the same size is performed in the current period, it is more efficient to perform a cache read operation in a subsequent period than to perform an ordinary read operation. Accordingly, the WLDM310 may decide to perform a cache read operation on a read request received from the host device 20 in a subsequent period. Further, the WLDM310 may provide a read control signal corresponding to the determination result, i.e., a cache read control signal, to the processor 220, and the processor 220 may control the nonvolatile memory device 100 to perform a cache read operation as a read operation in a subsequent period.

When one or more of the first field (read-only CMD), the second field (one type of block size), and the third field (queue depth above a threshold) of the workload mode information WLPI are set to a "reset (0)" state, the WLDM310 may determine that it is efficient to perform a normal read operation in a subsequent period. When the "read only CMD" of the workload mode information WLPI is set to the "reset (0)" state, it may indicate that both the read operation and the write operation are performed during the previous period, i.e., the second period; when "one type of block size" is set to the "reset (0)" state, it may indicate that an operation is performed on a data block of a different size, and when "queue depth above threshold" is set to the "reset (0)" state, it may indicate that a smaller number of requests are received from the host device 20. Depending on which field(s) is/are set to the "reset (0)" state, the WLDM310 may determine that read and write operations will be performed, that operations will be performed on different sized blocks of data, or that a smaller number of requests will be received from the host device 20 in a subsequent period.

In this case, since it is more efficient to perform the normal read operation than to perform the cache read operation, the WLDM310 may decide to perform the normal read operation on the read request received from the host device 20 in a subsequent period. The WLDM310 may provide the processor 220 with a read control signal corresponding to the determination result, i.e., a normal read control signal, and the processor 220 may control the nonvolatile memory device 100 to perform a normal read operation as a read operation in a subsequent period.

Referring to fig. 6B, a normal read operation will be described as follows when the controller 200 transfers a normal read command CMD _ NR to the nonvolatile memory device 100(①), control logic (not shown) of the nonvolatile memory device 100 may read DATA corresponding to the normal read command CMD _ NR from the memory cell array and store the read DATA in the page buffer (②). the DATA stored in the page buffer may be output to the controller 200 through the cache buffer and the input/output circuit (③). that is, the normal read operation may include a series of processes of reading DATA from the memory cell array in response to one read command and outputting the read DATA to the controller.

Referring to fig. 6C, a cache read operation will be described as follows when the controller 200 transfers a first cache read command CMD _ CR1 to the nonvolatile memory device 100(①), the control logic of the nonvolatile memory device 100 may read DATA (e.g., first DATA1) corresponding to the first cache read command CMD _ CR1 from the memory cell array and store the read DATA in the page buffer (②) — when the first DATA1 stored in the page buffer is transferred to the cache buffer (③), the processing of the first cache read command CMD _ CR1 may be completed.

Then, when the controller 200 transfers the second cache read command CMD _ CR2 to the nonvolatile memory device 100(④), the control logic of the nonvolatile memory device 100 may read DATA (e.g., the second DATA2) corresponding to the second cache read command CMD _ CR2 from the memory cell array and store the read DATA in the page buffer (⑤) — at the same time, the control logic may output the first DATA1 stored in the cache buffer to the controller 200 through the input/output circuit (⑤).

Fig. 6C illustrates that when the processing of the first cache read command CMD _ CR1 is completed, the controller 200 transmits the second cache read command CMD _ CR2 to the nonvolatile memory device 100. However, the time when the controller 200 transmits the second cache read command CMD _ CR2 is not particularly limited thereto. For example, the time when the controller 200 transmits the second cache read command CMD _ CR2 may overlap with the time when the first DATA1 is transmitted from the page buffer to the cache buffer, or before the first DATA1 is transmitted.

That is, the cache read operation may include a series of processes of reading data from the memory cell array in response to one read command, and simultaneously outputting data corresponding to a previous read command to the controller. Thus, a cache read operation may exhibit higher read performance than a normal read operation.

However, since the cache read operation stores the currently read data in the cache buffer while outputting the previous data cached in the cache buffer to the controller, when the next command provided from the controller is not a read command, it is necessary to first provide a separate command for outputting the data stored in the cache buffer to the nonvolatile memory device and then provide the next command to the nonvolatile memory device. Thus, cache read operations may be more efficient when read commands are provided continuously, and may be less efficient than normal read operations when read and write commands are mixed and provided.

In an embodiment, which of a plurality of types of read operations is performed may be decided according to a workload pattern in a subsequent period, which is estimated based on the workload pattern in a previous period, which may improve read performance.

FIG. 7 illustrates a method of operation of a data storage device according to an embodiment. In describing this method, reference may be made to one or more of fig. 1-6 in addition to fig. 7.

In step S701, the processor 220 of the controller 200 may drive the WLDM310 to check the workload pattern information WLPI of the previous period, i.e., the first period.

Although not shown in fig. 7, the processor 220 may drive the WLDM310 at a time point "t" at which the first period ends, so as to detect a workload pattern in the first period from the time point "t-1" to the time point "t". Since the workload patterns and the detection methods have been described above, further description thereof is omitted here. The WLDM310 may update the values set for the various fields of the workload pattern information WLPI based on the detected workload patterns in the previous period.

In step S703, the WLDM310 may determine whether the cache read condition is satisfied based on the values set for the respective fields of the workload pattern information WLPI. For example, WLDM310 may determine that the cache read condition is satisfied when the first field (read-only CMD), the second field (one type of block size), and the third field (queue depth above a threshold) of workload mode information WLPI are all set to a "set (1)" state. When the cache read condition is satisfied (i.e., yes in step S703), the process may proceed to step S705. On the other hand, when the cache read condition is not satisfied (i.e., no in step S703), the process may proceed to step S707.

In step S705, the WLDM310 may provide a read control signal to the processor 220 indicating that the cache read condition is satisfied, and the processor 220 may transmit a cache read command to the non-volatile memory device 100 to perform the cache read operation in a subsequent period.

In step S707, the WLDM310 may provide the processor 220 with a read control signal indicating that the cache read condition is not satisfied, and the processor 220 may check whether the last read command transmitted in the previous period is a cache read command. If so (i.e., YES in step S707), the process may proceed to step S709. On the other hand, when the last read command transmitted in the previous period is not a cache read command (i.e., no in step S707), the process may proceed to step S711.

In step S709, the processor 220 may control the nonvolatile memory device 100 to output the read data cached in a cache buffer (not shown) of the nonvolatile memory device 100.

In step S711, the processor 220 may transmit a normal read command to the nonvolatile memory device 100 in a subsequent period.

After steps S705 and S711, step S701 may be performed again.

According to an embodiment of the present invention, the data storage device is configured to detect a workload pattern during a set period, and selectively perform one of a cache read operation and a normal read operation based on the detected workload pattern.

That is, the data storage device may perform a cache read operation when the cache read operation has an advantage, and perform a normal read operation when the normal read operation has an advantage. Accordingly, the performance of the data storage device can be maximized.

FIG. 8 illustrates a data processing system including a Solid State Drive (SSD) according to an embodiment. Referring to fig. 8, a data processing system 2000 may include a host device 2100 and an SSD 2200.

SSD2200 may include controller 2210, cache memory device 2220, nonvolatile memory devices 2231 through 223n, power supply 2240, signal connector 2250, and power connector 2260.

Controller 2210 may control the overall operation of SSD 2220.

The buffer memory device 2220 may temporarily store data to be stored in the nonvolatile memory devices 2231 to 223 n. The buffer memory device 2220 may temporarily store data read from the nonvolatile memory devices 2231 to 223 n. The data temporarily stored in the buffer memory device 2220 may be transferred to the host apparatus 2100 or the nonvolatile memory devices 2231 and 223n according to the control of the controller 2210.

The nonvolatile memory devices 2231 to 223n may serve as storage media of the SSD 2200. The nonvolatile memory devices 2231 to 223n may be coupled to the controller 2210 through a plurality of channels CH1 to CHn. One or more non-volatile memory devices may be coupled to one channel. A non-volatile memory device coupled to one channel may be coupled to the same signal bus and the same data bus.

The power supply 2240 may supply the power PWR input through the power connector 2260 to the inside of the SSD 2200. Power supply 2240 may include an auxiliary power supply 2241. The auxiliary power supply 2241 may supply power so that the SSD2200 is normally terminated even if sudden power failure occurs. The auxiliary power supply 2241 may include a large-capacity capacitor capable of charging the power PWR.

Host interface 2210 may exchange signals SGL with host device 2100 through signal connector 2250. The signal SGL may include commands, addresses, data, and the like. The signal connector 2250 may be configured as any of various types of connectors according to an interface connection method between the host device 2100 and the SSD 2200.

Fig. 9 illustrates the controller 2210 of fig. 8. Referring to fig. 9, the controller 2210 may include a host interface 2211, a control component 2212, a Random Access Memory (RAM)2213, an Error Correction Code (ECC) component 2214, and a memory interface 2215.

The host interface 2211 may perform interfacing between the host device 2100 and the SSD2200 according to a protocol of the host device 2100. For example, the host interface 2211 may communicate with the host device 2100 through any of the following: secure digital protocol, Universal Serial Bus (USB) protocol, multimedia card (MMC) protocol, embedded MMC (emmc) protocol, Personal Computer Memory Card International Association (PCMCIA) protocol, Parallel Advanced Technology Attachment (PATA) protocol, Serial Advanced Technology Attachment (SATA) protocol, Small Computer System Interface (SCSI) protocol, serial SCSI (sas) protocol, Peripheral Component Interconnect (PCI) protocol, PCI express (PCI-E) protocol, and Universal Flash (UFS) protocol. The host interface 2211 may perform a disk emulation function, i.e., the host device 2100 recognizes the SSD2200 as a general-purpose data storage device, such as a hard disk drive HDD.

The control component 2212 may analyze and process the signal SGL input from the host device 2100. Control component 2212 may control the operation of internal functional blocks according to firmware and/or software used to drive SSD 2200. The RAM 2213 may operate as a working memory for driving firmware or software.

The ECC component 2214 may generate parity data for data to be transferred to the non-volatile memory devices 2231 through 223 n. The generated parity data may be stored in the nonvolatile memory devices 2231 to 223n together with the data. The ECC component 2214 may detect errors in the data read from the nonvolatile memory devices 2231 through 223n based on the parity data. When the detected error is within the correctable range, the ECC assembly 2214 may correct the detected error.

The memory interface 2215 may provide control signals such as commands and addresses to the nonvolatile memory devices 2231 to 223n according to the control of the control component 2212. The memory interface 2215 can exchange data with the nonvolatile memory devices 2231 to 223n according to the control of the control component 2212. For example, the memory interface 2215 may provide data stored in the buffer memory device 2220 to the nonvolatile memory devices 2231 to 223n, or provide data read from the nonvolatile memory devices 2231 to 223n to the buffer memory device 2220.

FIG. 10 illustrates a data processing system including a data storage device, according to an embodiment. Referring to fig. 10, data processing system 3000 may include a host device 3100 and a data storage device 3200. The host device and the data storage device may also be referred to as a host apparatus and a data storage apparatus, respectively.

The host device 3100 may be configured in a board form such as a Printed Circuit Board (PCB). Although not shown in fig. 10, the host device 3100 may include internal functional blocks configured to perform the functions of the host device 3100.

Host device 3100 can include connection terminals 3110 such as sockets, slots, or connectors. The data storage device 3200 may be mounted on the connection terminal 3110.

The data storage device 3200 may be configured in a board form such as a PCB. The data storage device 3200 may also be referred to as a memory module or a memory card. The data storage device 3200 may include a controller 3210, a buffer memory device 3220, nonvolatile memory devices 3231 and 3232, a Power Management Integrated Circuit (PMIC)3240, and a connection terminal 3250.

The controller 3210 may control the overall operation of the data storage device 3200. The controller 3210 may have the same configuration as the controller 2210 shown in fig. 9.

The buffer memory device 3220 may temporarily store data to be stored in the non-volatile memory devices 3231 and 3232. The buffer memory device 3220 may temporarily store data read from the nonvolatile memory devices 3231 and 3232. The data temporarily stored in the buffer memory device 3220 may be transmitted to the host device 3100 or the nonvolatile memory devices 3231 and 3232 according to control of the controller 3210.

Nonvolatile memory devices 3231 and 3232 may be used as storage media for the data storage apparatus 3200.

The PMIC 3240 may supply power input through the connection terminal 3250 to internal components of the data storage device 3200. The PMIC 3240 may manage power of the data storage device 3200 according to control of the controller 3210.

Connection terminal 3250 may be coupled to connection terminal 3110 of host device 3100. Signals such as commands, addresses, data, and power may be transmitted between the host device 3100 and the data storage device 3200 through the connection terminal 3250. The connection terminal 3250 may be configured in various forms according to an interface connection method between the host device 3100 and the data storage device 3200. The connection terminal 3250 may be disposed on any side of the data storage device 3200.

FIG. 11 illustrates a data processing system including a data storage device, according to an embodiment. Referring to FIG. 11, data processing system 4000 may include a host device 4100 and a data storage device 4200.

The host device 4100 may be configured in a board form such as a PCB. Although not shown in fig. 11, the host device 4100 may include internal functional blocks configured to perform the functions of the host device 4100.

The data storage device 4200 may be configured in the form of a surface mount package. The data storage device 4200 may be mounted on the host device 4100 by solder balls 4250. Data storage device 4200 may include a controller 4210, a cache memory device 4220, and a non-volatile memory device 4230.

The controller 4210 may control the overall operation of the data storage device 4200. The controller 4210 may be configured to have the same configuration as the controller 2210 shown in fig. 9.

Buffer memory device 4220 may temporarily store data to be stored in non-volatile memory device 4230. Buffer memory device 4220 may temporarily store data read from non-volatile memory device 4230. The data temporarily stored in the buffer memory device 4220 may be transferred to the host apparatus 4100 or the nonvolatile memory device 4230 by the control of the controller 4210.

The nonvolatile memory device 4230 may be used as a storage medium of the data storage apparatus 4200.

Fig. 12 illustrates a network system 5000 that includes a data storage device according to an embodiment. Referring to fig. 12, a network system 5000 may include a server system 5300 and a plurality of client systems 5410-5430 coupled via a network 5500.

The server system 5300 may service data in response to requests by the plurality of client systems 5410 to 5430. For example, server system 5300 may store data provided from multiple client systems 5410-5430. In another example, server system 5300 may provide data to multiple client systems 5410-5430.

The server system 5300 may include a host device 5100 and a data storage device 5200. The data storage device 5200 may be configured as the data storage apparatus 10 of fig. 1, the data storage device 2200 of fig. 8, the data storage device 3200 of fig. 10, or the data storage device 4200 of fig. 11.

Fig. 13 is a diagram illustrating a nonvolatile memory device included in a data storage apparatus according to an embodiment. Referring to fig. 13, the nonvolatile memory device 100 may include a memory cell array 110, a row decoder 120, a column decoder 140, a data read/write block 130, a voltage generator 150, and a control logic 160.

The memory cell array 110 may include memory cells MC arranged at regions where word lines WL1 to WLm and bit lines BL1 to BLn intersect each other.

Row decoder 120 may be coupled to memory cell array 110 by word lines WL1 through WLm. The row decoder 120 may operate under the control of control logic 160. The row decoder 120 may decode an address provided from an external device (not shown). The row decoder 120 may select and drive word lines WL1 to WLm based on the decoding result. For example, the row decoder 120 may provide the word line voltage provided from the voltage generator 150 to the word lines WL1 to WLm.

The data read/write block 130 may be coupled to the memory cell array 110 through bit lines BL1 through BLn. The data read/write block 130 may include read/write circuits RW1 to RWn corresponding to the bit lines BL1 to BLn. The data read/write block 130 may operate according to the control of the control logic 160. The data read/write block 130 may operate as a write driver or a sense amplifier depending on the mode of operation. For example, in a write operation, the data read/write block 130 may operate as a write driver configured to store data provided from an external device in the memory cell array 110. In another example, in a read operation, the data read/write block 130 may operate as a sense amplifier configured to read data from the memory cell array 110.

The column decoder 140 may operate under the control of control logic 160. The row decoder 140 may decode an address provided from an external device (not shown). The column decoder 140 may couple the read/write circuits RW1 to RWn of the data read/write block 130 corresponding to the bit lines BL1 to BLn with data input/output (I/O) lines (or data I/O buffers) based on the decoding result.

The voltage generator 150 may generate a voltage for an internal operation of the nonvolatile memory device 100. The voltage generated by the voltage generator 150 may be applied to the memory cells of the memory cell array 110. For example, a program voltage generated in a program operation may be applied to a word line of a memory cell on which the program operation is to be performed. As another example, an erase voltage generated in an erase operation may be applied to a well region of a memory cell on which the erase operation is to be performed. For another example, a read voltage generated in a read operation may be applied to a word line of a memory cell on which the read operation is to be performed.

The control logic 160 may control the overall operation of the nonvolatile memory apparatus 100 based on a control signal provided from an external device. For example, the control logic 160 may control operations of the non-volatile memory device 100, such as read operations, write operations, and erase operations of the non-volatile memory device 100.

While various embodiments have been illustrated and described, it will be appreciated by those skilled in the art in light of the present disclosure that various modifications may be made to any of the disclosed embodiments. Accordingly, it is intended that the invention cover all such modifications as fall within the scope of the claims and their equivalents.