阅读说明：本技术 多功能测试设备 (Multifunctional test equipment ) 是由 毕东珠 梁青松 于 2018-06-05 设计创作，主要内容包括：本发明涉及一种多功能测试设备,包括：测试装置,具备多个测试连接端；第一连接头和第二连接头,用于在测试过程中,连接至对应功能的测试连接端；所述第一连接头连接至第一线缆组,所述第一线缆组包括多根具有不同类型接头的线缆,各自通过第一开关与所述第一连接头连接；所述第二连接头连接至第二线缆组,所述第二线缆组包括多种具有不同类型接头的线缆,各自通过第二开关与所述第二连接头连接。所述多功能测试设备拥有多种类型的测试接头,可以做短接线缆使用、可用来做电路中上拉电路或下拉电路及可选择更换色环电阻、便于收纳。(The invention relates to a multifunctional test device, comprising: a test device having a plurality of test connection terminals; the first connector and the second connector are used for being connected to the test connecting ends with corresponding functions in the test process; the first connector is connected to a first cable group, the first cable group comprises a plurality of cables with different types of connectors, and each cable is connected with the first connector through a first switch; the second connector is connected to a second cable group, the second cable group includes a plurality of cables having different types of connectors, each connected to the second connector through a second switch. The multifunctional test equipment is provided with various types of test connectors, can be used as a short-circuit cable, can be used as a pull-up circuit or a pull-down circuit in a circuit, can select to replace a color ring resistor, and is convenient to store.)

1. A multifunctional test apparatus, comprising:

A test device having a plurality of test connection terminals;

The first connector and the second connector are used for being connected to the test connecting ends with corresponding functions in the test process;

The first connector is connected to a first cable group, the first cable group comprises a plurality of cables with different types of connectors, and each cable is connected with the first connector through a first switch;

The second connector is connected to a second cable group, the second cable group includes a plurality of cables having different types of connectors, each connected to the second connector through a second switch.

2. The multifunctional test equipment of claim 1, wherein the first connector and the second connector are both banana sockets.

3. The multifunctional test equipment of claim 1 further comprising an equipment enclosure, the test device, first and second connectors and first and second cable sets being located within the equipment enclosure; the device housing further has: the cable outlet structure comprises a first outlet hole group and a second outlet hole group, wherein the first outlet hole group comprises a plurality of first outlet holes, and cables in the first cable group are telescopically arranged in the first outlet holes; the second wire outlet hole group comprises a plurality of second wire outlet holes, and cables in the second cable group are arranged in the second wire outlet holes in a telescopic mode.

4. The multifunctional test apparatus of claim 1, further comprising: and the resistor module comprises a plurality of resistors with different resistance values, one ends of all the resistors are connected to the second connector, and the other ends of all the resistors are connected to the second connector through a third switch.

5. The multifunctional test device of claim 4, wherein the resistor is a fixed resistor or a variable resistor.

6. The multi-function test device of claim 4, wherein the third switch is a single pole multiple position switch.

7. The multifunctional test equipment as claimed in claim 4, further comprising a wire in the resistance module, wherein one end of the wire is connected to the second connector, and the other end of the wire is connected to the third switch.

8. The multifunctional test apparatus of claim 4, wherein the resistance module further comprises: the resistance vacancy is used for replacing or increasing the resistance; one end of the resistance vacancy is connected to the second connector, and the other end of the resistance vacancy is connected to the third switch.

9. The multifunctional test equipment according to claim 1, wherein the test device is a multimeter and the test connection end is a stylus hole site of the multimeter.

10. The multi-functional test device of claim 1, wherein the different types of joints comprise at least one of a card pin, a card hole, and an alligator clip.

Technical Field

The invention relates to the field of testing, in particular to multifunctional testing equipment.

Background

In the process of testing electrical properties, a universal meter is usually required to be connected to a pin of a connector of a device to be tested through a test cable, so that the electrical properties such as voltage, current and the like can be tested.

In practice, different types of connectors may be used for different devices, such as J14A, J36A, etc., and the pins of different types of connectors may be different, so that a single test cable connector cannot be used for different connectors. This results in the need to search for different connectors or take time to make different cables for testing during the actual testing process; moreover, different types of connectors need different corresponding test interfaces, and each type of connector needs to have a specific debugging line; various cables, debugging lines and the like in a test field are not easy to manage and are easy to lose when being taken at any time.

Therefore, there is a need for a multifunctional test device that can directly connect multiple types of connectors without the need to search for additional cables.

Disclosure of Invention

The invention aims to solve the technical problem of providing a multifunctional test device which can be connected with various types of connectors and is more convenient to use.

In order to solve the above problems, the present invention provides a multifunctional test apparatus including: a test device having a plurality of test connection terminals; the first connector and the second connector are used for being connected to the test connecting ends with corresponding functions in the test process; the first connector is connected to a first cable group, the first cable group comprises a plurality of cables with different types of connectors, and each cable is connected with the first connector through a first switch; the second connector is connected to a second cable group, the second cable group includes a plurality of cables having different types of connectors, each connected to the second connector through a second switch.

Optionally, the first connector and the second connector are both banana sockets.

Optionally, the test device further comprises an equipment housing, and the test device, the first joint, the second joint, the first cable group and the second cable group are all located in the equipment housing; the device housing further has: the cable outlet structure comprises a first outlet hole group and a second outlet hole group, wherein the first outlet hole group comprises a plurality of first outlet holes, and cables in the first cable group are telescopically arranged in the first outlet holes; the second wire outlet hole group comprises a plurality of second wire outlet holes, and cables in the second cable group are arranged in the second wire outlet holes in a telescopic mode.

Optionally, the method further includes: and the resistor module comprises a plurality of resistors with different resistance values, one ends of all the resistors are connected to the second connector, and the other ends of all the resistors are connected to the second connector through a third switch.

Optionally, the resistor is a fixed resistor or a variable resistor.

Optionally, the third switch is a single-pole multi-position switch.

optionally, the resistor module further includes a wire, one end of the wire is connected to the second connector, and the other end of the wire is connected to the third switch.

Optionally, the resistance module further includes: the resistance vacancy is used for replacing or increasing the resistance; one end of the resistance vacancy is connected to the second connector, and the other end of the resistance vacancy is connected to the third switch.

Optionally, the testing device is a universal meter, and the testing connection end is a meter pen hole site of the universal meter.

optionally, the different types of connectors include at least one of an insert pin, an insert hole, and an alligator clip.

The multifunctional testing equipment provided by the invention is provided with cables with various connector types, can adapt to various plug connectors with different types, does not need to additionally search for the cables when the plug connectors with different types need to be connected, and is convenient and practical. Furthermore, the multifunctional test equipment can also be provided with a resistance module, so that the requirement of lap joint resistance in the test process is met.

Drawings

fig. 1 is a schematic structural diagram of a multifunctional testing device according to an embodiment of the present invention.

Detailed Description

The following describes in detail a specific embodiment of the multifunctional testing device provided by the present invention with reference to the accompanying drawings.

Fig. 1 is a schematic structural diagram of a multifunctional testing apparatus according to an embodiment of the present invention.

The multifunctional test apparatus includes: a test apparatus 101 having a plurality of test connection terminals 1011; the first connector 102 and the second connector 103 are used for connecting to the test connection end 1011 with corresponding functions in the test process; the first connector 102 is connected to a first cable group 104, which includes a plurality of cables having different types of connectors, each connected to the first connector 102 through a first switch 105; the second connector 103 is connected to a second cable set 106, which includes a plurality of cables having different types of connectors, each connected to the second connector 103 through a second switch 107.

In this specific embodiment, the testing device 101 is a multimeter, and the testing connection end 1011 is a stylus hole site of the multimeter. In other embodiments, the testing device 101 may be used in other measuring instruments that require electrical contact to perform a measurement. The multifunctional testing device has the same functions as the testing device 101, and specifically, in this embodiment, the testing device 101 has the functions of current detection, voltage detection, resistance detection, conductivity measurement and the like.

In this embodiment, the first connector 102 and the second connector 103 are both in the form of banana sockets, which facilitates connection. In one embodiment, the first connector 102 and the second connector 103 have the same specification. When the multifunctional testing equipment performs any testing function, the two testing connection ends 1011 of the testing device with corresponding functions are respectively connected to the first connector 102 and the second connector 103, and are connected to the end to be tested through the first connector 102 and the second connector 103.

The first connector 102 is connected to a first cable set 104, and the first cable set 104 includes a plurality of cables, and the other ends of the cables have different or the same type of connectors for connecting to the end to be tested. The first cable set 104 includes at least two or more connector types.

The second connector 103 is connected to a second cable set 106, and the second cable set 106 comprises a plurality of cables, and the other ends of the cables have different or the same type of connectors for connecting to the end to be tested. The second cable set 106 includes at least two or more connector types.

In this particular embodiment, the first cable set 104 and the second cable set 106 have the same number and type of cables. In other specific embodiments, the first cable group 104 and the second cable group 106 may also have different numbers or types of cables, which are set according to specific requirements and are not limited herein.

Referring to fig. 1, in this embodiment, the cable splice of the first cable set 104 includes a plug pin 1041, a plug hole 1042 and an alligator clip 1043; the cable lug in the second cable set 106 includes an insert pin 1061, an insert hole 1062, and an alligator clip 1063. In other embodiments, the different types of connectors include at least one of a variety of types of connectors including a pin, a hole, and an alligator clip.

The multifunctional testing device further comprises a device housing 110, and the testing apparatus 101, the first connector 102, the second connector 103, the first cable set 104, and the second cable set 106 are all located in the device housing 110.

The device case 110 further has: the cable outlet structure comprises a first outlet hole group and a second outlet hole group, wherein the first outlet hole group comprises a plurality of first outlet holes 121 corresponding to the number of cables in the first cable group 104. The cables in the first cable group 104 are respectively and telescopically mounted in the first wire outlet hole 121, so that the cables can be conveniently extended and stored. The second outlet hole group includes a plurality of second outlet holes 122 corresponding to the number of cables in the second cable group 106. The cables in the second cable group 106 are respectively and telescopically mounted in the second wire outlet 122, so that the cables can be conveniently extended out and stored.

The multifunctional testing equipment adopts the cable joints in the first cable group 104 and the second cable group 106 to be respectively connected to the end to be tested, so that the electrical test can be carried out on the end to be tested. When the connector type of the end to be tested changes, the cables with the corresponding connectors in the first cable group 104 and the second cable group 106 are correspondingly selected to complete the test, and the cables do not need to be temporarily searched or manufactured, so that the test is convenient and fast.

The cables in the first cable group 104 are respectively connected to the first connector 102 through a first switch 105, the cables in the second cable group 106 are respectively connected to the second connector 103 through a second switch 107, and the cables for testing in the first cable group 104 and the second cable group 106 are selected by controlling the first switch 105 and the second switch 107.

In order to meet the requirement during the test process, the resistance needs to be lapped or the test end needs to be short-circuited sometimes. In this specific manner, the multifunctional testing device further includes a resistor module 109 including a plurality of resistors 1091 with different resistance values, one end of each resistor 1091 is connected to the second connector 103, the other end of each resistor 1091 is connected to the second connector 102 through a third switch 108, and the third switch 108 is used to control the connection or disconnection between the first connector 102 and any resistor in the resistor module 109. The resistor 1091 may be a constant resistor or a variable resistor. In this embodiment, the resistor module 109 includes four resistors 1091 having 10 Ω, 100 Ω, 1k Ω and 10k Ω.

The resistor module 109 further includes a wire 1092, wherein one end of the wire 1092 is connected to the second connector 103, and the other end is connected to the third switch 108.

The resistor module 109 also comprises a resistor vacancy 1093 for replacing or increasing the resistor; one end of the resistor vacancy 1093 is connected to the second connector, and the other end is connected to the third switch 108. The resistor vacancy 1093 can be a direct-insertion type resistor vacancy, so that the resistor is convenient to replace. In fig. 1, the state of inserting a resistor is shown in the resistor vacancy 1093, the resistor vacancy 1093 may be kept in an off state without providing a resistor, and at this time, when the first connector 102 and the second connector 103 are connected to the resistor vacancy 1093, respectively, the first connector 102 and the second connector 103 are disconnected.

The third switch 108 is a single-pole multi-position switch, a single connection end is connected to the first connector 102, multiple connection ends are respectively connected to the resistors 1091, the conductors 1092 and the resistor vacancy 1093 of the resistor module 109, and the connection state between the first connector 102 and the second connector 103 is controlled by the selection of the third switch 108.

The multifunctional test equipment has various types of test connectors, can be suitable for connectors of various connector types, can be used as a short-circuit cable, can be used as a pull-up circuit or a pull-down circuit in a circuit, can select to replace a color ring resistor, and is convenient to store.

In one embodiment, when a voltage between 3 pins and 5 pins of a connector with a model number of J36A-9TJ needs to be tested, first, two test connection terminals 1011 corresponding to the test voltage of the test device 101 are connected to the second connector 102 and the third connector 103, respectively; cable connectors in the form of "J36A holes" in the first cable set 104 and the second cable set 106 are selected to connect to the 3-pin and 5-pin of such a J36A-9TJ and to turn on the corresponding first switch 105 in the first cable set 104 and the second switch 107 in the second cable set 106.

When the test circuit needs to lap the resistance, for example, in a specific embodiment, when the test circuit needs to lap the resistance of 10k between the pins 1 and 9 of one such connector with the model number J14A-15ZK, the cable connectors in the form of "J14A pins" in the first cable group 104 and the second cable group 106 can be selected to be connected to the holes of the pins 1 and 9 of the J14A-15ZK connector and connected to the corresponding first switch 105 and the second switch 107, and the third switch 108 is connected to the resistance 1091 with the resistance of 10k Ω in the resistance module 109 through the single-pole multiple-position switch.

When a signal needs to be used as an input signal and a test signal, for example, in a specific embodiment, a 160ms negative pulse command needs to be tested to control the on-state action of the relay, the command point needs to be connected with a 10k Ω resistor in series and pull up a 3.3V voltage, a negative level command with a duration of 160ms is sent through software to act on the command point, the command point corresponds to the 5 pins of a connector type J14A-25ZK, and whether the test command is executed or not needs to be connected with an oscilloscope, at this time, a cable with one end capable of being connected to a 3.3V power supply is needed, and the signal is divided into two after one end is connected with the 10k Ω resistor in series and is led to the command point and the oscilloscope probe. In this case, the 3.3V power supply can be connected to the appropriate cable of the first cable group 104, the corresponding first switch 105 is turned on, the third switch 108 between the first connector 102 and the second connector 103 turns on the 10k Ω resistor 1091, the cable corresponding to the "pin J14A" in the second cable group 106 is connected to the 5 pins of the J14A-25ZK, the cable corresponding to the alligator clip is connected to the oscilloscope probe, and the corresponding second switch 107 is turned on, so that when the command is executed, the relay is turned on, and at the same time, the command action waveform is displayed on the oscilloscope.

The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and decorations can be made without departing from the principle of the present invention, and these modifications and decorations should also be regarded as the protection scope of the present invention.