阅读说明：本技术 断裂检测装置及断裂检测方法 (Fracture detection device and fracture detection method ) 是由 唐书喜 于 2021-09-23 设计创作，主要内容包括：本申请提供一种断裂检测装置及断裂检测方法,涉及检测装置技术领域,用于解决OLED显示面板弯折区内走线断裂的检测效率低、检测准确性低的技术问题。该断裂检测装置包括：支撑台、加热装置、拍摄装置和处理器；支撑台用于承载OLED显示面板,加热装置用于对放置在支撑台上OLED显示面板的弯折区加热,拍摄装置用于采集OLED显示面板弯折区的红外图像；处理器与拍摄装置信号连接,处理器对红外图像进行断裂分析；当处理器从红外图像中提取到边缘特征时,确定弯折区的走线断裂。通过将走线的断裂信息转化为走线的热量信息,并通过处理器对热量信息进行分析,判断走线是否断裂,不易出现漏检误判,提高了检测效率和检测准确性。(The application provides a fracture detection device and a fracture detection method, relates to the technical field of detection devices, and is used for solving the technical problems that the detection efficiency of wire fracture in an OLED display panel bending area is low and the detection accuracy is low. This fracture detection device includes: a support table, a heating device, a shooting device and a processor; the OLED display panel bending device comprises a support table, a heating device, a shooting device and a control device, wherein the support table is used for bearing the OLED display panel, the heating device is used for heating a bending area of the OLED display panel placed on the support table, and the shooting device is used for collecting an infrared image of the bending area of the OLED display panel; the processor is in signal connection with the shooting device and is used for carrying out fracture analysis on the infrared image; and when the processor extracts the edge characteristics from the infrared image, determining that the wiring of the bending area is broken. The heat information of the wiring is converted into the breakage information of the wiring, the heat information is analyzed through the processor, whether the wiring is broken or not is judged, missing detection and misjudgment are not prone to occurring, and detection efficiency and detection accuracy are improved.)

1. The utility model provides a fracture detection device which characterized in that, fracture detection device is used for detecting whether the interior line of walking of the district of buckling of OLED display panel splits, fracture detection device includes: a support table, a heating device, a shooting device and a processor;

the OLED display panel bending device comprises a support table, a heating device, a shooting device and a control device, wherein the support table is used for bearing the OLED display panel, the heating device is used for heating a bending area of the OLED display panel placed on the support table, and the shooting device is used for collecting an infrared image of the bending area of the OLED display panel;

the processor is in signal connection with the shooting device and is used for carrying out fracture analysis on the infrared image; and when the processor extracts the edge features from the infrared image, determining that the routing of the bending area is broken.

2. The fracture detection device according to claim 1, wherein the support table is provided with a through hole which is opposed to the bending region, and the heating device is provided below the support table and opposed to the through hole.

3. The fracture detection device according to claim 2, wherein the heating device comprises a laser generator, and a line light source emitted by the laser generator irradiates the bending region through the through hole.

4. The fracture detection apparatus according to claim 1, wherein a plurality of support legs for supporting the support table are provided at a bottom of the support table;

the bottom of brace table is connected with the bracing piece, the bracing piece is located the several in the space that the supporting leg encloses, the cover is equipped with on the bracing piece is followed the bracing piece carries out the slider of elevating movement, heating device installs on the slider.

5. The fracture detection device of claim 1, further comprising a first slide rail and a second slide rail, the second slide rail intersecting the first slide rail, and the second slide rail sliding along the first slide rail;

the supporting table is arranged on the second slide rail and slides along the second slide rail;

preferably, the extending direction of the first slide rail is perpendicular to the extending direction of the second slide rail.

6. The fracture detection apparatus according to any one of claims 1 to 5, further comprising a support, the support being located beside the support table;

the shooting device is installed on the support, and the shooting device is located above the supporting table.

7. The breakage detection device according to claim 6, wherein the support includes a base and a vertical rod disposed on the base, a stepping motor is mounted on the vertical rod, and the shooting device is fixedly connected to a rotating shaft of the stepping motor.

8. The fracture detection device of any one of claims 1-5, wherein the capture device comprises an infrared thermal imaging microscope that captures the infrared image and transmits the infrared image to the processor.

9. A fracture detection method, characterized in that the fracture detection method is performed using the fracture detection apparatus according to any one of claims 1 to 8, and the fracture detection method comprises:

placing the OLED display panel on a support table;

the heating device heats the bending area of the OLED display panel for a preset time;

the shooting device shoots an infrared image of the bending area;

and the processor performs fracture analysis on the infrared image, and when the processor extracts edge features from the infrared image, the processor determines that the wiring of the bending area is fractured.

10. The break detection method according to claim 9, wherein the processor is further configured to determine a break location of the trace in the bending area according to a location of the edge feature in the infrared image.

Technical Field

The application relates to the technical field of detection devices, in particular to a fracture detection device and a fracture detection method.

Background

Organic Light Emitting Display (OLED) has many features such as self-luminescence, fast response, wide viewing angle, and capability of being fabricated on a flexible substrate, and is increasingly applied in high performance Display field such as flexible Display devices.

With the progress of display technology, the OLED display panel develops to a narrow frame or even a frameless frame, and in order to realize the narrow frame or even the frameless frame, a Pad bending (Pad bending) method is generally adopted to reduce the frame width of the OLED display panel so as to improve the screen occupation ratio of the OLED display panel. As shown in fig. 1, the OLED display panel 100 includes a display region 110, a pad region 120 and a bending region 130, the pad region 120 is located on the back side of the display region 110, one end of the bending region 130 is connected to the display region 110, the other end of the bending region 130 is connected to the pad region 120, and a plurality of traces are generally disposed in the bending region 130 to connect the display region 110 and the pad region 120 by signals. When the bending area 130 has a smaller bending radius R, the wires in the bending area 130 are easily broken, and thus the display area 110 of the OLED display panel has a poor display.

In the related art, it is usually manually checked whether the traces in the bending region 130 of the OLED display panel 100 are broken, which is inefficient and less accurate.

Disclosure of Invention

In view of the foregoing problems, embodiments of the present application provide a fracture detection apparatus and a fracture detection method to improve detection efficiency and detection accuracy.

In order to achieve the above object, the embodiments of the present application provide the following technical solutions:

a first aspect of the embodiments of the present application provides a fracture detection device, fracture detection device is used for detecting whether the interior line of walking of the bending zone of OLED display panel splits, fracture detection device includes: a support table, a heating device, a shooting device and a processor; the OLED display panel bending device comprises a support table, a heating device, a shooting device and a control device, wherein the support table is used for bearing the OLED display panel, the heating device is used for heating a bending area of the OLED display panel placed on the support table, and the shooting device is used for collecting an infrared image of the bending area of the OLED display panel; the processor is in signal connection with the shooting device and is used for carrying out fracture analysis on the infrared image; and when the processor extracts the edge features from the infrared image, determining that the routing of the bending area is broken.

When adopting the fracture detection device that this application embodiment provided to detect OLED display panel, place OLED display panel at a supporting bench to through heating device to OLED display panel's bending zone heating, so that bending zone's the line of walking is heated and produces the heat radiation, gather its infrared image according to bending zone's radiation information through the shooting device, the treater carries out the fracture analysis to infrared image, when the treater extracts the marginal characteristic from infrared image, confirms bending zone's the line of walking and splits. The utility model provides a fracture detection device detects through the heat information that turns into the line of walking through the fracture information that will walk the line to heat information carries out the analysis through the treater, judges whether the line splits, compares in the manual work detection among the correlation technique, adopts the application embodiment to provide, has improved detection efficiency, is difficult for appearing lou to examine the erroneous judgement moreover, has improved the detection accuracy.

In a possible implementation, the supporting platform is provided with a through hole, the through hole is opposite to the bending area, and the heating device is arranged below the supporting platform and opposite to the through hole.

In a possible implementation manner, the heating device comprises a laser generator, and a line light source emitted by the laser generator penetrates through the through hole to irradiate the bending area.

In a possible implementation manner, the bottom of the supporting platform is provided with a plurality of supporting legs for supporting the supporting platform; the bottom of brace table is connected with the bracing piece, the bracing piece is located the several in the space that the supporting leg encloses, the cover is equipped with on the bracing piece is followed the bracing piece carries out the slider of elevating movement, heating device installs on the slider.

In a possible implementation manner, the fracture detection apparatus further includes a first slide rail and a second slide rail, where the second slide rail intersects with the first slide rail, and the second slide rail slides along the first slide rail; the supporting table is arranged on the second slide rail and slides along the second slide rail; preferably, the extending direction of the first slide rail is perpendicular to the extending direction of the second slide rail.

In a possible implementation manner, the fracture detection apparatus further includes a bracket, and the bracket is located beside the support table; the shooting device is installed on the support, and the shooting device is located above the supporting table.

In a possible implementation manner, the support comprises a base and a vertical rod arranged on the base, a stepping motor is installed on the vertical rod, and a rotating shaft of the stepping motor is fixedly connected with the shooting device.

In one possible implementation, the photographing device includes an infrared thermal imaging microscope, and the infrared thermal imaging microscope photographs the infrared image and transmits the infrared image to the processor.

A second aspect of the embodiments of the present application provides a fracture detection method, which uses the fracture detection apparatus described above to perform detection, and the fracture detection method includes: placing the OLED display panel on a support table; the heating device heats the bending area of the OLED display panel for a preset time; the shooting device shoots an infrared image of the bending area; and the processor performs fracture analysis on the infrared image, and when the processor extracts edge features from the infrared image, the processor determines that the wiring of the bending area is fractured.

In the fracture detection method provided by the embodiment of the application, the OLED display panel is placed on the supporting table firstly, the heating device is used for heating the bending area of the OLED display panel for a preset time, so that the wiring of the bending area is heated to generate heat radiation, the shooting device collects infrared images of the bending area according to the radiation information of the bending area, the processor is used for analyzing the fracture of the collected infrared images, and when the processor extracts edge features from the infrared images, the wiring of the bending area is determined to be fractured. The breakage detection method has the advantages that the breakage information of the wiring is converted into the heat information of the wiring, the heat information is analyzed through the processor, whether the wiring is broken or not is judged, and compared with manual detection in the related technology, the breakage detection method improves detection efficiency, is not prone to missing detection and misjudgment, and improves detection accuracy.

In a possible implementation manner, the processor is further configured to determine a fracture position of the trace in the bending region according to a position of the edge feature in the infrared image.

Drawings

In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts.

FIG. 1 is a partial schematic view of an OLED display panel according to the related art;

FIG. 2 is a schematic distribution diagram of traces in the bending region of FIG. 1;

FIG. 3 is a schematic structural diagram of a fracture detection apparatus according to an embodiment of the present application;

FIG. 4 is a schematic view of a heating device in an embodiment of the present application;

fig. 5 is a flowchart of a fracture detection method in the embodiment of the present application.

Description of reference numerals:

100-an OLED display panel; 110-a display area;

120-pad region; 130-a bending zone;

131-routing; 132-a substrate layer;

133-a photosensitive glue layer; 134-a first end;

200-a support table; 210-a via;

220-support legs; 300-a heating device;

310-a support bar; 320-a slide block;

400-a camera; 410-a stent;

420-a stepper motor; 500-a processor;

h-working distance; l-effective line length;

a-fan angle; r-bend radius.

Detailed Description

As shown in fig. 1 and fig. 2, the detection efficiency and the detection accuracy of manually detecting whether the trace 131 in the bending region 130 of the OLED display panel 100 is broken are low as described in the background art, and the inventors have found that the reason is: the number of the traces 131 in the bending region 130 is many, about several hundred, and the traces 131 are thin, and the line width of the traces 131 is usually 12 μm. During manual detection, a detector observes and identifies whether the wiring 131 is broken or not under a microscope. The detection personnel need to focus and move the sample for many times to complete the detection of the whole bending area 130, in addition, the crack after the breakage of the wiring 131 is usually small, and the detection personnel is easily influenced by external factors such as foreign matters on the OLED display panel 100 to judge, so that the detection efficiency and the detection accuracy are low.

In order to solve the above problem, an embodiment of the present application provides a fracture detection apparatus and a fracture detection method, in which a heating device in the fracture detection apparatus heats a bending region, a shooting device collects an infrared image of the heated bending region, a processor performs fracture analysis of a trace according to the infrared image, and when the processor extracts edge features in the infrared image, it is determined that the trace of the bending region is fractured. The heat information of the wiring is converted into the breakage information of the wiring, the heat information is analyzed through the processor, whether the wiring is broken or not is judged, missing detection and misjudgment are not prone to occurring, and detection efficiency and detection accuracy are improved.

In order to make the aforementioned objects, features and advantages of the embodiments of the present application more comprehensible, embodiments of the present application are described in detail below with reference to the accompanying drawings. It is to be understood that the described embodiments are merely a few embodiments of the present application and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The embodiment of the application provides a breakage detection device, and the breakage detection device is used for detecting whether an internal wiring of a bending area of an OLED display panel is broken. Referring to fig. 3, fig. 3 is a schematic structural diagram of a fracture detection apparatus in an embodiment of the present application, where the fracture detection apparatus includes: support 200, heating device 300, imaging device 400, and processor 500.

The supporting table 200 is used for supporting the OLED display panel 100, and as shown in fig. 3, the OLED display panel 100 is placed on the supporting table 200. The supporting stage 200 may be a rectangular platform, as shown in fig. 3, and the upper surface of the supporting stage 200 is a plane to facilitate the placement of the OLED display panel 100. In order to prevent the OLED display panel 100 from moving on the support table 200, the upper surface of the support table 200 may be provided with a groove adapted to the OLED display panel 100, and the OLED display panel 100 is placed in the groove.

The support table 200 may be provided with a through hole 210, and the through hole 210 penetrates the support table 200 in a thickness direction, i.e., the through hole 210 penetrates upper and lower surfaces of the support table 200. After the OLED display panel 100 is placed on the supporting table 200, a partial region of the bending region 130 of the OLED display panel 100 is exposed in the through hole 210, so that the heating device 300 heats a designated region on the bending region 130.

Illustratively, the first end 134 of the trace 131 in the bending region 130 is opposite to the through hole 210, so that the heating device 300 heats the end of the trace 131, and heat is transferred along the trace 131 to the second end of the trace 131. For example, one end of the trace 131 connected to the pad region 120 is a first end 134, and the dashed line shown in fig. 2 is the first end 134 of the trace 131.

The first ends 134 are located above the through holes 210, the length of the through holes 210 is greater than the distribution length of the first ends 134 of the traces 131, and the orthographic projection of the first ends 134 of the traces 131 on the support stage 200 is located in the through holes 210, so that all the first ends 134 of the traces 131 can be heated by the heating device 300. The length direction of the through hole 210 is a direction parallel to the edge of the pad region 120 connected to the trace 131, the distribution length of the first end 134 refers to a distance between the first ends 134 of the two outermost traces 131, and referring to fig. 2, the length of the through hole 210 and the distribution length of the first end 134 of the trace 131 are both lengths in the direction D shown in fig. 2.

The support stage 200 can move in a plane to adjust the distance and the focal distance between the OLED display panel 100 and the camera 400. Illustratively, the support table 200 is disposed on a second slide rail, and the support table 200 can slide along the second slide rail, which is disposed on the first slide rail, and the second slide rail slides along the first slide rail. Specifically, the first slide rail comprises a first sliding groove, and the roller of the second slide rail is arranged in the first sliding groove and can slide along the first sliding groove so as to realize that the second slide rail slides along the first slide rail. The second slide rail includes the second spout, and the gyro wheel setting of brace table 200 is in the second spout, and slides along the second spout to realize that brace table 200 slides along the second spout. In order to improve the stability of the supporting platform 200, the first slide rails may be provided with two first slide rails arranged in parallel, and the second slide rails may also be provided with two second slide rails arranged in parallel.

The extending direction of the first slide rail is different from the extending direction of the second slide rail, for example, the extending direction of the first slide rail is perpendicular to the extending direction of the second slide rail, the first slide rail can be a transverse slide rail, the second slide rail can be a longitudinal slide rail, wherein the transverse direction can be parallel to the long side of the display panel, and the longitudinal direction can be parallel to the short side of the display panel. The movement of the support table 200 on the second slide rail, and the movement of the second slide rail on the first slide rail, may be manually adjusted or may be driven by a motor.

On the basis of the above-mentioned embodiment, in an embodiment of the present application, the bottom of the supporting platform 200 is provided with a plurality of supporting legs 220, for example, four corners of the supporting platform 200 are respectively provided with one supporting leg 220. One end of the plurality of support legs 220 is mounted on the lower surface of the support platform 200, the other end of the plurality of support legs 220 is mounted on the first slide rail, and the support legs 220 can slide along the first slide rail. The plurality of support legs 220 enclose a space for receiving the heating device 300 such that the heating device 300 is opposite to the through-hole 210.

The support legs 220 may be telescopic to adjust the height of the support platform 200 relative to the first slide rail, so that the OLED display panel 100 disposed on the support platform 200 has three translational degrees of freedom, i.e., the support platform 200 translates along X, Y, Z shown in fig. 3. Of course, the implementation manner of the movement of the support table 200 in the present application is not limited, for example, the support table 200 is mounted on a robot, and the robot drives the support table 200 to move.

With continued reference to fig. 3, the heating device 300 heats the bending region 130 of the OLED display panel 100 placed on the supporting stage 200, and as shown in fig. 3, the heating device 300 is disposed below the supporting stage 200 and opposite to the through hole 210. The distance of the heating device 300 relative to the support 200 is adjustable to adjust the position of the heating device 300 relative to the support 200.

In one possible implementation manner of the present application, the bottom of the supporting platform 200 is connected to a supporting rod 310, and the supporting rod 310 is located in a space enclosed by the plurality of supporting legs 220. The supporting rod 310 is sleeved with a slider 320, the slider 320 can move up and down along the supporting rod 310, and the heating device 300 is installed on the slider 320. In order to improve the stability of the heating apparatus 300, the sliding block 320 may have a flat plate shape, and the supporting rods 310 may be provided in four positions at four corners of the sliding block 320.

The heating device 300 includes a laser generator, and a line light source emitted by the laser generator irradiates the bending region 130 through the through hole 210 to heat the trace 131 in the bending region 130. Illustratively, the laser generator uses a continuous Nd: YAG laser (Neodymium-doped: Yttrium aluminum Garnet, Nd: Y₃Al₅O₁₂) The laser is directionally adjusted and focused by a cylindrical mirror, a triangular prism and the like in the laser generator to form a line light source. When the trace 131 is made of aluminum (Al) or titanium (Ti), the wavelength of the Nd: YAG laser may be 1064nm, and thus, the absorption rate of the trace 131 to the laser with the wavelength is high, and the heating efficiency is improved.

The line width of the line light source may be 300 micrometers, and the effective line length may be adjusted according to the working distance between the laser generator and the support table 200 and the fan angle of the laser generator. The relationship between the effective line length and the fan angle, working distance is as shown in fig. 4, and the length of the effective line length L increases with the increase of the working distance H or the increase of the fan angle a. In the embodiment of the present application, the effective line length of the line light source is greater than the distribution length of the first end 134 of the trace 131, so that the first end 134 of the trace 131 is heated.

In the embodiment of the present application, the energy density of the laser generator is lower than the damage threshold of the OLED display panel 100, so as to prevent the OLED display panel 100 from being damaged when the bending region 130 is heated. The power of the laser generator can be continuously adjusted according to the temperature required by the bending region 130, for example, when the temperature required by the bending region 130 is higher, the power of the laser generator is higher, and when the temperature required by the bending region 130 is lower, the power of the laser generator is lower, and the power of the laser generator is related to the energy density, the irradiation area and the irradiation time.

It should be noted that the bending region 130 generally includes a substrate layer 132 and a trace 131 disposed on the substrate layer 132, where the trace 131 is generally a metal, and the substrate layer 132 is generally an organic material, such as Polyimide (PI). The wire performance of the wire 131 is superior to the heat conduction performance of the substrate layer 132, when the wire 131 and the substrate layer 132 of the bending area 130 are simultaneously heated by the heating device 300, the temperature of the wire 131 is higher, the temperature change is more obvious, the temperature of the substrate layer 132 is lower, and the temperature change is not obvious, so that the temperature of the wire 131 can be distinguished from the temperature of the substrate layer 132.

The outer surface of the bending region 130 is usually coated with a layer of photosensitive adhesive (UV adhesive), and the photosensitive adhesive layer 133 is used to protect the bending region 130. The photosensitive adhesive layer 133 is formed by curing the photosensitive adhesive, and the heating Temperature of the wire 131 is controlled within a certain range according to the Glass Transition Temperature (TG point for short) of the photosensitive adhesive, so that the photosensitive adhesive layer 133 is converted from a solid state to a Glass state when the wire 131 is heated, thereby affecting the effect of the photosensitive adhesive layer 133. For example, the TG point of the photosensitive glue is greater than 80 ℃, and the heating temperature of the trace 131 may be less than 60 ℃.

With continued reference to FIG. 3, the camera 400 captures an infrared image of the heated inflection zone 130 to obtain a temperature distribution of the inflection zone 130. The photographing device 400 is mounted on the bracket 410 beside the supporting platform 200, so that the photographing device 400 is located above the supporting platform 200 to facilitate the collection of pictures of the bending region 130.

The camera 400 can also rotate relative to the support 410, and the distance and the angle between the camera 400 and the bending area 130 are adjusted by the movement of the support 200 and the rotation of the camera 400, so as to focus on the bending area 130, and after the focus is reached, the camera 400 can shoot the infrared image of the bending area 130. Illustratively, the photographing apparatus 400 includes an infrared thermal imaging microscope, which photographs an infrared image and transmits the infrared image to the processor 500.

In some possible implementations of the present disclosure, the support 410 includes a base and a vertical rod disposed on the base, and the base has a larger contact area with the ground to improve stability of the support 410. The vertical rod is provided with a stepping motor 420, a rotating shaft of the stepping motor 420 is fixedly connected with the shooting device 400, and the angle of the shooting device 400 is roughly adjusted and/or finely adjusted through the stepping motor 420. The base and the vertical rod may be integrated or separated, and as shown in fig. 3, the support 410 is substantially in an inverted T shape.

It can be understood that, after the bending region 130 is heated by the heating device 300 for a predetermined time, the temperature of the trace 131 reaches a desired temperature, and a stable temperature distribution is formed on the trace 131, at this time, the photographing device 400 photographs the bending region 130 to obtain an infrared image of the bending region 130.

With continued reference to fig. 3, the camera 400 is in signal connection with a processor 500, and the processor 500 performs fracture analysis based on the infrared image, for example, the processor 500 performs edge detection and edge feature extraction on the infrared image. When the processor 500 extracts the edge feature from the infrared image, it is determined that the trace 131 of the inflection region 130 is broken.

It will be appreciated that the processor 500 processes the infrared images and performs a graphical analysis. Illustratively, the temperature transmission of the intact trace 131 is uniformly reduced, and the color brightness gradient on the trace 131 is uniform; the broken wires 131 are blocked during temperature transmission, an obvious temperature fault occurs, the color brightness gradient on the wires 131 suddenly changes on two sides of the breakpoint, when the color brightness gradient suddenly changes, the processor 500 can extract an edge feature, and at this time, it is determined that the wires 131 of the bending region 130 are broken. If the processor 500 does not extract the edge feature, it can be determined that the trace 131 of the inflection region 130 is not broken.

In the fracture detection device that this application embodiment provided, OLED display panel 100 is placed to supporting bench 200, heating device 300 heats OLED display panel 100's bending zone 130 to make bending zone 130 walk line 131 be heated and produce the heat radiation, shoot device 400 and gather its infrared image according to bending zone 130's radiation information, processor 500 carries out the fracture analysis according to infrared image, when the marginal feature of processor 500 extraction in the infrared image, confirm that bending zone 130 walks line 131 and fracture. Through the fracture information that turns into to walk line 131 walking the heat information of line 131 to carry out the analysis to heat information through treater 500, judge and walk whether fracture of line 131, compare in the manual work detection among the correlation technique, the fracture detection device of this application embodiment is difficult for appearing lou to detect the erroneous judgement, has improved detection efficiency, has also improved simultaneously and has detected the accuracy.

The embodiment of the present application further provides a fracture detection method, and with reference to fig. 5, the fracture detection method includes the following steps:

and S101, placing the OLED display panel on a support table.

As shown in fig. 3, the OLED display panel 100 is placed on a support table 200. The support table 200 may be a rectangular platform. The support table 200 may be provided with through holes 210 as shown in fig. 3, the through holes 210 penetrating the support table 200 in a thickness direction, i.e., the through holes 210 penetrating the upper and lower surfaces of the support table 200. After the OLED display panel 100 is placed on the supporting table 200, a partial region of the bending region 130 of the OLED display panel 100 is exposed in the through hole 210, so that the heating device 300 heats a designated region on the bending region 130.

The supporting stage 200 can move in a plane to adjust the distance between the OLED display panel 100 and the photographing device 400, thereby facilitating the focus of the photographing device 400. Illustratively, the support table 200 is disposed on a second slide rail, and the support table 200 can slide along the second slide rail; the second slide rail is arranged on the first slide rail, and the second slide rail slides along the first slide rail. The first slide rail is intersected with the second slide rail. For example, the first slide rail and the second slide rail are vertically disposed, the first slide rail may be a transverse slide rail, and the second slide rail may be a longitudinal slide rail.

The support base 200 has a plurality of support legs 220 at the bottom thereof, for example, one support leg 220 is provided at each of four corners of the support base 200. One end of the plurality of support legs 220 is mounted on the lower surface of the support platform 200, the other end of the plurality of support legs 220 is mounted on the first slide rail, and the support legs 220 can slide along the first slide rail. The support legs 220 are telescopic to adjust the height of the support platform 200 relative to the first slide rail, so that the OLED display panel 100 disposed on the support platform 200 has three translational degrees of freedom, i.e., the support platform 200 translates along X, Y, Z shown in fig. 3.

And S102, heating the bending area of the OLED display panel for preset time by the heating device.

As shown in fig. 3, the heating device 300 is disposed under the supporting stage 200 and opposite to the through-hole 210. The distance of the heating device 300 relative to the support 200 is adjustable to adjust the position of the heating device 300 relative to the support 200. In a possible implementation manner of the present application, the bottom of the supporting platform 200 is connected to a supporting rod 310, a sliding block 320 is sleeved on the supporting rod 310, the sliding block 320 can move up and down along the supporting rod 310, and the heating device 300 is installed on the sliding block 320. In order to improve the stability of the heating apparatus 300, the sliding block 320 may have a flat plate shape, and the supporting rods 310 may be provided in four positions at four corners of the sliding block 320.

The heating device 300 includes a laser generator, and a line light source emitted by the laser generator irradiates the bending region 130 through the through hole 210 to heat the trace 131 in the bending region 130. YAG laser, which may have a wavelength of 1064nm, is directionally adjusted and focused by a cylindrical mirror, a triangular prism, etc., inside the laser generator to form a line light source.

The line width of the line light source may be 300 micrometers, and the effective line length may be adjusted according to a working distance H between the laser generator and the support table 200 and a fan angle of the laser generator. As shown in fig. 4, as the working distance H increases or the fan angle increases, the length of the effective line length increases. In the embodiment of the present application, the effective line length of the line light source is greater than the distribution length of the first end 134 of the trace 131, so that the first end 134 of the trace 131 is heated.

The energy density of the laser generator is lower than the damage threshold of the OLED display panel 100 to prevent the OLED display panel 100 from being damaged when the bending region 130 is heated. The power of the laser generator can be continuously adjusted according to the desired temperature of the inflection zone 130. The outer surface of the bending region 130 is usually coated with a photosensitive adhesive layer 133, the photosensitive adhesive layer 133 is used for protecting the bending region 130, and the heating temperature of the wire 131 is controlled within a certain range according to the glass transition temperature of the photosensitive adhesive, so as to prevent the photosensitive adhesive layer 133 from being converted from a solid state into a glass state when the wire 131 is heated, thereby affecting the effect of the photosensitive adhesive layer 133. For example, the TG point of the photosensitive glue is greater than 80 ℃, and the heating temperature of the trace 131 may be less than 60 ℃.

And S103, shooting an infrared image of the bending area of the OLED display panel by the shooting device.

As shown in FIG. 3, the camera 400 is mounted on a support 410 beside the supporting platform 200, so that the camera 400 is located above the supporting platform 200 to facilitate the collection of the pictures of the bending region 130. The camera 400 can also rotate relative to the support 410, and the distance and the angle between the camera 400 and the bending area 130 are adjusted by the movement of the support 200 and the rotation of the camera 400, so as to focus on the bending area 130, wherein the camera 400 comprises an infrared thermal imaging microscope.

In some possible implementation manners of the present application, the support 410 includes a base and a vertical rod disposed on the base, a larger contact area is provided between the base and the ground to improve the stability of the support 410, and the base and the vertical rod may be an integrated structure or a split structure. The vertical rod is provided with a stepping motor 420, a rotating shaft of the stepping motor 420 is fixedly connected with the shooting device 400, and the angle of the shooting device 400 is roughly adjusted and/or finely adjusted through the stepping motor 420.

After the bending region 130 is heated by the heating device 300 for a predetermined time, the temperature of the wire 131 reaches a desired temperature, and a stable temperature distribution is formed on the wire 131, at this time, the photographing device 400 photographs the bending region 130 to obtain an infrared image of the bending region 130.

And S104, the processor performs fracture analysis on the infrared image, and when the processor extracts the edge features from the infrared image, the processor determines that the wiring of the bending area is broken.

The signal connection of the camera 400 is connected to the processor 500, the processor 500 performs fracture analysis according to the infrared image, when the processor 500 extracts the edge feature from the infrared image, it is determined that the wire 131 of the bending region 130 is fractured, and if the edge feature is not extracted by the processor 500, it may be determined that the wire 131 of the bending region 130 is not fractured.

It can be understood that the temperature transmission of the intact trace 131 is uniformly reduced, and the color brightness gradient on the trace 131 is uniform; the broken wires 131 are blocked during temperature transmission, an obvious temperature fault occurs, the color brightness gradient on the wires 131 suddenly changes on two sides of the breakpoint, when the color brightness gradient suddenly changes, the processor 500 can extract an edge feature, and at this time, it is determined that the wires 131 of the bending region 130 are broken. In addition, the processor 500 can determine the breaking position of the trace 131 according to the position (e.g., coordinates) of the edge feature in the infrared image.

In the fracture detection method provided by the embodiment of the application, the OLED display panel 100 is placed on the supporting table 200, the heating device 300 heats the bending area 130 of the OLED display panel 100 for a preset time, so that the wiring 131 of the bending area 130 is heated to generate heat radiation, the shooting device 400 collects an infrared image of the bending area 130 according to radiation information of the bending area 130, the processor 500 performs fracture analysis according to the infrared image, and when the processor 500 extracts edge features from the infrared image, it is determined that the wiring 131 of the bending area 130 is fractured. Through the heat information that turns into the line 131 with the fracture information of walking line 131 to heat information is analyzed through treater 500, judges whether to walk the line 131 fracture, compares in the manual work detection among the correlation technique, and the fracture detection method of this application embodiment is difficult for appearing lou to detect the erroneous judgement, has improved detection efficiency, has also improved simultaneously and has detected the accuracy.

The embodiments or implementation modes in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments may be referred to each other.

It should be noted that references in the specification to "one embodiment," "an example embodiment," "some embodiments," etc., indicate that the embodiment may include a particular feature, structure, or characteristic, but every embodiment may not necessarily include the particular feature, structure, or characteristic. Moreover, such phrases are not necessarily referring to the same embodiment. Further, when a particular feature, structure, or characteristic is described in connection with an embodiment, it is within the knowledge of one skilled in the art to effect such feature, structure, or characteristic in connection with other embodiments whether or not explicitly described.

It should be readily understood that "on … …", "above … …" and "above … …" in this disclosure should be interpreted in its broadest sense such that "on … …" means not only "directly on something", but also includes the meaning of "on something" with intervening features or layers therebetween, and "above … …" or "above … …" includes not only the meaning of "above something" or "above" but also includes the meaning of "above something" or "above" with no intervening features or layers therebetween (i.e., directly on something).

Furthermore, spatially relative terms, such as "below," "lower," "above," "upper," and the like, may be used herein for ease of description to describe one element or feature's illustrated relationship to another element or feature. Spatially relative terms are intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The device may have other orientations (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly as well.

Finally, it should be noted that: the above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present application.