阅读说明：本技术 基于多敏感器件复用的卫星星体单粒子风险自监测方法 (Satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing ) 是由 全林 冷佳醒 沈国红 王东亚 李泠 王鲲鹏 段美亚 赵蓓蕾 张大伟 于 2021-09-01 设计创作，主要内容包括：本发明公开了一种基于多敏感器件复用的卫星星体单粒子风险自监测方法。本发明利用卫星自身搭载的单粒子敏感器件的不同的抗辐射等级,通过多敏感器件复用实现卫星星体的单粒子风险感知,可实现卫星舱内引发器件单粒子风险的大规模、多阈值、准实时自感知,成本低,不增加卫星负担,可适用于不同轨道、不同体质的卫星,具有普遍性,是一套适应于卫星自身体质特点的风险自感知评估方法。(The invention discloses a satellite star single particle risk self-monitoring method based on multi-sensitive device multiplexing. The method realizes single particle risk perception of the satellite body by multiplexing the multiple sensitive devices by utilizing different radiation resistance levels of the single particle sensitive devices carried by the satellite, can realize large-scale, multi-threshold and quasi-real-time self perception of single particle risks of the devices caused in the satellite cabin, has low cost, does not increase satellite burden, is suitable for satellites with different orbits and different constitutions, has universality and is a set of risk self perception evaluation method suitable for the constitutional characteristics of the satellite.)

1. A satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing is characterized by comprising the following steps:

respectively carrying out single event effect and type analysis on each device on the satellite body to obtain the single event effect sensitivity level of each device;

different weight factors are adopted by devices with different sensitivity levels, and the sensitivity level weighted average value of all devices on the satellite is used as the single event effect sensitivity coefficient of the satellite;

and determining the single event risk level of the satellite body according to the satellite single event effect sensitivity coefficient.

2. The satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing of claim 1, wherein a processor, an FPGA, an EEPROM, a FLASH and a VCO on a satellite are sensitive devices, and the sensitivity level is defined as I level;

the watchdog, the AD, the DA, the DC-DC power supply module and the LDO are devices with general sensitivity, and the sensitivity level is defined as II level;

analog, radio frequency and power supply devices are devices with lower sensitivity, and the sensitivity level is defined as III level.

3. The satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing of claim 1, wherein the single event effect type of the sensitive device on the satellite is shown in table 1:

TABLE 1 Single event Effect types of sensitive devices

4. The satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing of claim 1, wherein device selection is performed according to the structure and use characteristics of a satellite and the single event effect sensitivity of the device: the device insensitive to the single event effect is directly used in a task; for a device sensitive to the single event effect, firstly, retrieving the single event effect data of the device, determining whether the data is available by a radiation-resistant expert, and for a sensitive device without data or with unavailable data, performing a single event effect evaluation test according to a test specification to obtain the single event effect data of the sensitive device; then, judging whether the device meets the requirements of the engineering task or not according to the single event effect index requirements of the task and the single event effect data of the device, wherein the requirements can be met for direct use, and the device can be replaced if the requirements cannot be met; and finally, aiming at the device which still does not meet the requirements, analyzing the possible harm to the circuit function by combining the functional circuit where the device is located, and determining the design idea of the circuit, the software and the system level.

5. The satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing of claim 1, wherein a satellite single event effect sensitivity coefficient σ is as follows:

wherein ξ₁、ξ₂、ξ₃Respectively representing risk weight factors of devices with sensitivity levels I, II and III, wherein the value interval of the risk weight factors is (0, 1); n is a radical of₁、N₂、N₃The number of devices of the sensitivity classes I, II and III is respectively expressed, and N is equal to N₁+N₂+N₃。

Technical Field

The invention relates to the technical field of single event risk assessment and early warning of in-orbit spacecrafts, in particular to a satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing.

Background

The single event effect is one of the most harmful radiation effects to the spacecraft electronics system. The single event effect can change the logic state of electronic devices for the satellite, cause the disorder of circuit logic function, cause the error of data processed by a computer, cause the error of instructions, cause programs to run away, cause the computer to be paralyzed, and cause bulk silicon CMOS devices and power devices to be burnt by the large current induced by the bulk silicon CMOS devices and the power devices, thereby causing the abnormality and the failure of the satellite and even causing the satellite to be in a catastrophic situation. The single event effect is closely related to the types of the devices, and the spatial high-energy particles interact with the devices of different types, so that multiple single event effect types exist, such as SEU, SEL, SEB, SEGR, SET, SEFI and the like. And according to the influence of the single-particle effect on the device, dividing the single-particle effect into a single-particle soft error and a single-particle hard error. The single-particle soft error is an error which does not cause physical damage to a device and can be recovered through a certain way, such as SEU, SET, SEFI and the like. Single event hard errors (SHE) are permanent damage or failure of devices such as SEL, SEB, SEGR, etc.

The single event effect is the most main sudden environmental risk faced by the current spacecraft electronic system, an effective method is lacked at present, the conventional method relying on LET detection and the like can only realize limited point detection, the satellite structure, the operation condition and the individual difference are complex, the environment and effect monitoring load is difficult to carry on each satellite, how to quickly evaluate the risk level of the satellite and quickly give out early warning information is extremely difficult, and means are lacked at present.

Disclosure of Invention

In view of the above, the invention provides a satellite star single event risk self-monitoring method based on multi-sensitive device multiplexing, which is based on the satellite body enriching sensitive devices such as an FPGA (field programmable gate array) and an SRAM (static random access memory), and is matched with a multi-element device grouping fusion algorithm, so that the single event risk self-perception of a low-cost, large-scale and multi-threshold spacecraft is realized, and the method is used for warning the single event effect risk of the in-orbit spacecraft.

The invention discloses a satellite star single particle risk self-monitoring method based on multi-sensitive device multiplexing, which comprises the following steps:

respectively carrying out single event effect and type analysis on each device on the satellite body to obtain the single event effect sensitivity level of each device;

different weight factors are adopted by devices with different sensitivity levels, and the sensitivity level weighted average value of all devices on the satellite is used as the single event effect sensitivity coefficient of the satellite;

and determining the single event risk level of the satellite body according to the satellite single event effect sensitivity coefficient.

Furthermore, a processor, an FPGA, an EEPROM, a FLASH and a VCO on the satellite are easily sensitive devices, and the sensitivity level is defined as I level;

the watchdog, the AD, the DA, the DC-DC power supply module and the LDO are devices with general sensitivity, and the sensitivity level is defined as II level;

analog, radio frequency and power supply devices are devices with lower sensitivity, and the sensitivity level is defined as III level.

Further, the type of single event effect of the sensitive device on the satellite is shown in table 1:

TABLE 1 Single event Effect types of sensitive devices

Further, according to the structure and application characteristics of the satellite and the single event effect sensitivity of the device, the device selection is carried out as follows: the device insensitive to the single event effect is directly used in a task; for a device sensitive to the single event effect, firstly, retrieving the single event effect data of the device, determining whether the data is available by a radiation-resistant expert, and for a sensitive device without data or with unavailable data, performing a single event effect evaluation test according to a test specification to obtain the single event effect data of the sensitive device; then, judging whether the device meets the requirements of the engineering task or not according to the single event effect index requirements of the task and the single event effect data of the device, wherein the requirements can be met for direct use, and the device can be replaced if the requirements cannot be met; and finally, aiming at the device which still does not meet the requirements, analyzing the possible harm to the circuit function by combining the functional circuit where the device is located, and determining the design idea of the circuit, the software and the system level.

Further, the satellite single event effect sensitivity coefficient σ is:

wherein ξ₁、ξ₂、ξ₃Respectively representing risk weight factors of devices with sensitivity levels I, II and III, wherein the value interval of the risk weight factors is (0, 1); n is a radical of₁、N₂、N₃The number of devices of the sensitivity classes I, II and III is respectively expressed, and N is equal to N₁+N₂+N₃。

Has the advantages that:

the method realizes single particle risk perception of the satellite body by multiplexing the multiple sensitive devices by utilizing different radiation resistance levels of the single particle sensitive devices carried by the satellite, can realize large-scale, multi-threshold and quasi-real-time self perception of single particle risks of the devices caused in the satellite cabin, has low cost, does not increase satellite burden, is suitable for satellites with different orbits and different constitutions, has universality and is a set of risk self perception evaluation method suitable for the constitutional characteristics of the satellite.

Drawings

FIG. 1 is a flow chart of the method of the present invention.

Detailed Description

The invention is described in detail below by way of example with reference to the accompanying drawings.

The invention provides a satellite star single particle risk self-monitoring method based on multi-sensitive device multiplexing.

In the satellite structure, hundreds of single-particle sensitive devices are usually required to be carried, the types of the single-particle sensitive devices include an FPGA (field programmable gate array), an SRAM (static random access memory), and the like, the radiation resistance levels of the single-particle sensitive devices are different, so that the fault performances of the single-particle sensitive devices are different, and the sensitive devices are usually the main bodies of the fault performances. The invention uses the sensitive devices, refers to the characteristic of single particle resistant constitution, and adopts the multi-element device grouping fusion algorithm, thereby being convenient for generating individualized single particle risk information and realizing the immediate alarm of the satellite.

The flow chart of the invention is shown in fig. 1, and specifically comprises the following steps:

step 1, combing a common single-particle sensitive device of a satellite to realize multiplexing characteristic classification and classification, wherein the specific conditions are as follows:

a) generally, devices used in tasks have certain sensitivity to a single event effect, and passive elements such as resistors, capacitors, inductors, relays and the like are not sensitive to the single event effect;

b) SEU exists in storage devices such as SRAM, EEPROM, FLASH and the like, but the PROM does not have the SEU due to the adoption of a fuse structure, while the SRAM type FPGA and a processor containing RAM or a register unit also have the SEU, and the devices manufactured by deep submicron and below processes also have MBU phenomenon in a certain proportion;

c) devices manufactured by using a CMOS process have SELs with different sensitivity degrees due to the existence of parasitic PNPN structures;

d) SEB and SEGR exist in power MOSFETs in a power module such as a DC-DC power module;

e) common analog, radio frequency and power supply devices, such as an operational amplifier, a comparator, an ADC/DAC, a low noise amplifier, a radio frequency power amplifier, a DC-DC power supply module and the like, have SET, and logic circuit units in a processor and an FPGA also have SET;

f) the SEFIs with different sensitivity degrees exist for devices with complex control functions such as a processor, an FPGA, an EEPROM, a FLASH, a VCO and the like.

And 2, selecting the device based on the single event effect sensitivity of the device according to the structural characteristics of the satellite, and determining the single event effect type of each sensitive device on the satellite.

According to the structure and use characteristics of the satellite, firstly, whether a used device is sensitive to a single event effect is judged, an insensitive device can be directly used in a task, and the sensitive device needs to further give a possible single event effect type; then, retrieving single event effect data of the sensitive device, determining whether the data is available by a radiation-resistant expert, and carrying out a single event effect evaluation test on the sensitive device without data or with unavailable data according to a test specification; secondly, judging whether the device meets the requirements of the engineering task or not according to the single event effect index requirements of the task and the single event effect data of the device, wherein the requirements can be met for direct use, and the requirements cannot be met for replacing the device; finally, aiming at the devices which still do not meet the requirements (including the devices which cannot be replaced or cannot be replaced to meet the requirements), the design thought of the circuit, the software and the system level is determined by analyzing the possible damage to the circuit function by combining the functional circuit where the device is located.

And 3, reasonably constructing a weight factor for risk generation by referring to the grade difference of the selected sensitive devices, and calculating the single event risk effect index.

In the embodiment, the single-particle sensitivity of a satellite common device is analyzed, and a single-particle effect type table which may occur in a sensitive device is given, as shown in table 1.

TABLE 1 Single event Effect types of sensitive devices

a) For the sensitive devices such as a processor, an FPGA, an EEPROM, a FLASH, a VCO and the like, the sensitivity level is defined as I level;

b) for devices with general sensitivity such as a watchdog, an AD (analog-digital) power supply module, a DA (digital-analog) power supply module, a DC-DC power supply module and an LDO (low dropout regulator), the sensitivity level is defined as II level;

c) common analog, radio frequency and power supply devices, such as operational amplifiers, comparators, ADC/DAC, low noise amplifiers, radio frequency power amplifiers and other devices with lower sensitivity, and the sensitivity level is defined as level III.

According to different sensitivity levels of devices, different weight factors can be adopted in risk generation, such as xi₁、ξ₂、ξ₃And respectively representing device risk weight factors of sensitivity levels I, II and III, wherein the value interval of the weight factors is (0, 1).

Then, according to the following calculation formula, obtaining the satellite single event effect sensitivity coefficient sigma, namely

In the formula N₁、N₂、N₃Each representing three levels of device number, N ═ N₁+N₂+N₃。

And 4, giving a risk grade according to three red, orange and yellow to realize the quick generation of early warning information.

And calculating to obtain a single event effect sensitivity coefficient according to the formula, dividing the risk grade, and distinguishing by three colors of red, orange and yellow, wherein red represents the highest grade of the single event risk, and orange is the lowest grade, so that the early warning information is generated quickly.

In summary, the above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.