阅读说明：本技术 具有减少的斜坡稳定时间的积分斜坡电路 (Integrating ramp circuit with reduced ramp settling time ) 是由 左亮 王睿 海老原弘知 江妮君 于 2020-03-10 设计创作，主要内容包括：本发明涉及具有减少的斜坡稳定时间的积分斜坡电路。斜坡产生器包含积分器,所述积分器包含第一级和第二级,其中第一级具有第一输入端和第二输入端,以及第一输出端和第二输出端,并且第二级包含耦合在电源轨和接地之间的第一晶体管和第二晶体管。第一晶体管和第二晶体管之间的节点耦合到积分器放大器的输出端。第一晶体管的控制端子耦合到第一级的第一输出端,且第二晶体管的控制端子耦合到第一级的第二输出端。在从输出端产生的斜坡信号中的斜坡事件期间,第一电流从输出端流到接地。微调电路耦合到积分器放大器的输出端,以响应于微调输入向积分器放大器的输出端提供第二电流。第二电流基本上匹配第一电流。(The invention relates to an integrating ramp circuit with reduced ramp settling time. The ramp generator comprises an integrator comprising a first stage and a second stage, wherein the first stage has a first input terminal and a second input terminal, and a first output terminal and a second output terminal, and the second stage comprises a first transistor and a second transistor coupled between a power supply rail and ground. A node between the first transistor and the second transistor is coupled to an output of the integrator amplifier. A control terminal of the first transistor is coupled to the first output of the first stage and a control terminal of the second transistor is coupled to the second output of the first stage. During a ramp event in a ramp signal generated from the output, a first current flows from the output to ground. A trim circuit is coupled to the output of the integrator amplifier to provide a second current to the output of the integrator amplifier in response to a trim input. The second current substantially matches the first current.)

1. A method for reducing a delay of a ramp event in a ramp signal of a ramp generator, comprising:

generating the ramp signal at an output of an operational amplifier having a first input and a second input, wherein the operational amplifier is included in the ramp generator;

coupling an integrator capacitor between the first input and the output of the operational amplifier;

coupling a current source to the first input of the operational amplifier;

capacitively coupling a reference voltage to the second input of the operational amplifier;

sampling the reference voltage onto the reference voltage capacitance through a sampling switch coupled between the reference voltage and the reference voltage capacitance; and

reducing, by a tuning circuit coupled to the second input of the operational amplifier, the reference voltage sampled onto the reference voltage capacitance during the ramp event in the ramp signal to reduce the delay of the ramp event in the ramp signal.

2. The method of claim 1, further comprising enabling and disabling the ramp generator through an enable switch coupled between the first input and the output of the operational amplifier.

3. The method of claim 1, wherein the tuning circuit comprises:

a tuning capacitor coupled to the second input of the operational amplifier; and

a switching circuit coupled to the tuning capacitance, wherein the method further comprises:

coupling the tuning capacitance to a tuning voltage through the switching circuit when the ramp generator is disabled; and

coupling the tuning capacitance to ground through the switching circuit when the ramp generator is enabled.

4. The method of claim 3, wherein the switching circuit comprises:

a first switch coupled between the tuning voltage and the tuning capacitance; and

a second switch coupled between the tuning capacitor and ground.

5. The method of claim 3, wherein the tuning capacitance comprises a variable capacitance, wherein the method further comprises tuning the variable capacitance to make the ramp event in the ramp signal linear.

6. The method of claim 3, wherein a product of the tuning voltage and the tuning capacitance divided by a sum of the tuning capacitance and the reference voltage capacitance is equal to a constant.

7. A method for providing a ramp signal in an imaging system, comprising:

receiving image light by a pixel array;

generating an image charge voltage signal in response to receiving the image light; and

receiving, by a readout circuit coupled to the pixel array, the image charge voltage signal;

providing a digital representation of the image charge voltage signal in response to receiving the image charge voltage signal, wherein providing the digital representation comprises:

comparing, by a comparator, the image charge voltage signal with the ramp signal from a ramp generator;

providing the digital representation of the image charge voltage signal in response to comparing the image charge voltage signal to the ramp signal;

generating the ramp signal at an output of an operational amplifier having a first input and a second input, wherein the operational amplifier is included in a ramp generator;

coupling an integrator capacitor between the first input and the output of the operational amplifier;

coupling a current source to the first input of the operational amplifier;

capacitively coupling a reference voltage to the second input of the operational amplifier;

sampling the reference voltage onto the reference voltage capacitance through a sampling switch coupled between the reference voltage and the reference voltage capacitance; and

reducing, by a tuning circuit coupled to the second input of the operational amplifier, the reference voltage sampled onto the reference voltage capacitance during the ramp event in the ramp signal to reduce a delay of the ramp event in the ramp signal.

8. The method of claim 7, further comprising enabling and disabling an enable switch coupled between the first input and the output of the operational amplifier.

9. The method of claim 7, wherein the tuning circuit comprises:

a tuning capacitor coupled to the second input of the operational amplifier; and

a switching circuit coupled to the tuning capacitance, wherein the method further comprises:

coupling the tuning capacitance to a tuning voltage through the switching circuit when the ramp generator is disabled; and

coupling the tuning capacitance to ground when the ramp generator is enabled.

10. The method of claim 9, wherein the switching circuit comprises:

a first switch coupled between the tuning voltage and the tuning capacitance; and

a second switch coupled between the tuning capacitor and ground.

11. The method of claim 9, wherein the tuning capacitance comprises a variable capacitance, wherein the method further comprises tuning the variable capacitance to make the ramp event in the ramp signal linear.

12. The method of claim 9, wherein a product of the tuning voltage and the tuning capacitance divided by a sum of the tuning capacitance and the reference voltage capacitance is equal to a constant.

Technical Field

The present invention relates generally to image sensors, and particularly, but not exclusively, to comparator output circuits for analog-to-digital conversion in image sensors.

Background

Image sensors have become ubiquitous. They are widely used in digital cameras, cellular phones, security cameras, and medical, automotive, and other applications. The technology for manufacturing image sensors has been rapidly developed. For example, the demand for higher resolution and lower power consumption encourages further miniaturization and integration of these devices.

Image sensors typically receive light over an array of pixels, which creates charge in the pixels. The intensity of the light may affect the amount of charge generated in each pixel, with higher intensities generating higher amounts of charge. Analog-to-digital converters (ADCs) are often used in CMOS Image Sensors (CIS) to convert charge into a digital representation of the charge by the image sensor. The ADC generates a digital representation of the charge based on a comparison of the image charge signal and a reference voltage signal. The reference voltage signal may typically be a ramp signal provided by a ramp generator and may typically be compared by a comparator, which provides an output that may be used with a counter to generate a digital representation of the image charge.

It will be appreciated that the ramp settling time or delay of the ramp signal generated by the ramp generator and received by the comparator may limit the maximum frame rate of the image sensor. Therefore, reducing the ramp settling time of the ramp signal can increase the maximum frame rate, thereby enhancing the performance of the image sensor.

Disclosure of Invention

In some embodiments, a ramp generator comprises an integrator amplifier having a first input and a second input and an output for generating a ramp signal, wherein the integrator amplifier comprises: a first stage having first and second inputs and first and second outputs, wherein the first and second inputs of the first stage are coupled to the first and second inputs of the integrator amplifier; a second stage comprising: a first transistor and a second transistor coupled between a power supply rail and ground, wherein a node between the first transistor and the second transistor is coupled to an output of an integrator amplifier, wherein a control terminal of the first transistor is coupled to a first output of a first stage, and wherein a control terminal of the second transistor is coupled to a second output of the first stage, wherein a first current flows from the output of the integrator amplifier through the integrator amplifier to ground during a ramp event in a ramp signal generated from the output of the integrator amplifier; and a trim circuit coupled between the power supply rail and an output of the integrator amplifier, wherein the trim circuit is coupled to provide a second current to the output of the integrator amplifier in response to the trim input, wherein the second current substantially matches the first current.

In some embodiments, an imaging system includes a pixel array for receiving image light and generating an image charge voltage signal in response; and readout circuitry coupled to receive the image charge voltage signal from the pixel array and to provide a digital representation of the image charge voltage signal in response, the readout circuitry including a comparator for receiving the image charge, comparing the image charge voltage signal with a ramp signal from a ramp generator, and providing a digital representation of the image charge voltage signal in response, wherein the ramp generator includes: an integrator amplifier having a first input and a second input and an output for generating a ramp signal, wherein the integrator amplifier comprises: a first stage having first and second inputs and first and second outputs, wherein the first and second inputs of the first stage are coupled to the first and second inputs of the integrator amplifier; a second stage comprising: a first transistor and a second transistor coupled between a power supply rail and ground, wherein a node between the first transistor and the second transistor is coupled to an output of an integrator amplifier, wherein a control terminal of the first transistor is coupled to a first output of a first stage, and wherein a control terminal of the second transistor is coupled to a second output of the first stage, wherein a first current flows from the output of the integrator amplifier through the integrator amplifier to ground during a ramp event in a ramp signal generated from the output of the integrator amplifier; and a trim circuit coupled between the power supply rail and an output of the integrator amplifier, wherein the trim circuit is coupled to provide a second current to the output of the integrator amplifier in response to the trim input, wherein the second current substantially matches the first current.

In a further embodiment, a ramp generator comprises: an operational amplifier having a first input and a second input and an output for generating a ramp signal; an integrator capacitor coupled between the first input and the output of the operational amplifier; a current source coupled to a first input of the operational amplifier; a reference voltage capacitor coupled to a second input of the operational amplifier; a sampling switch coupled between a reference voltage and a reference voltage capacitance, wherein the sampling switch is configured to sample the reference voltage onto the reference voltage capacitance; and a tuning circuit coupled to a second input of the operational amplifier, wherein the tuning circuit is coupled to reduce a reference voltage sampled onto the reference voltage capacitance during a ramp event in the ramp signal to reduce a delay of the ramp event in the ramp signal.

In a further embodiment, an imaging system includes: a pixel array for receiving image light and generating image charge voltage signals in response; and readout circuitry coupled to receive the image charge voltage signal from the pixel array and to provide a digital representation of the image charge voltage signal in response, the readout circuitry including a comparator for receiving the image charge, comparing the image charge voltage signal with a ramp signal from a ramp generator, and providing a digital representation of the image charge voltage signal in response, wherein the ramp generator includes: an operational amplifier having a first input terminal and a second input terminal and an output terminal for generating a ramp signal; an integrator capacitor coupled between the first input and the output of the operational amplifier; a current source coupled to a first input of the operational amplifier; a reference voltage capacitor coupled to a second input of the operational amplifier; a sampling switch coupled between a reference voltage and a reference voltage capacitance, wherein the sampling switch is configured to sample the reference voltage onto the reference voltage capacitance; and a tuning circuit coupled to the second input of the operational amplifier, wherein the tuning circuit is coupled to reduce the reference voltage sampled onto the reference voltage capacitance during a ramp event in the ramp signal to reduce a delay of the ramp event in the ramp signal.

Drawings

Non-limiting and non-exhaustive embodiments of the present invention are described with reference to the following figures, wherein like reference numerals refer to like parts throughout the various views unless otherwise specified.

FIG. 1 illustrates one example of an imaging system in accordance with the teachings of the present invention.

Figure 2A shows a schematic diagram of an example of a ramp generator with a trim input for the output stage of the ramp generator for use with an analog-to-digital converter in an image sensor in accordance with the teachings of the present invention.

Figure 2B shows a schematic diagram of an example of an operational amplifier with an output stage trimming circuit included in a ramp generator as shown in figure 2A for use with an analog-to-digital converter in an image sensor in accordance with the teachings of the present invention.

Fig. 3A is a timing diagram showing some of the signals in a ramp generator without an output stage trimming circuit in accordance with the teachings of the present invention.

Figure 3B is a timing diagram showing some of the signals in a ramp generator with an output stage trimming circuit in accordance with the teachings of the present invention.

Figure 4 shows a schematic diagram of another example of a ramp generator with an adjustable input circuit for use with an analog-to-digital converter in an image sensor in accordance with the teachings of the present invention.

Fig. 5A is a timing diagram showing some of the signals in a ramp generator without an adjustable input in accordance with the teachings of the present invention.

Figure 5B is a timing diagram showing some of the signals in a ramp generator with an adjustable input circuit in accordance with the teachings of the present invention.

Corresponding reference characters indicate corresponding parts throughout the several views of the drawings. Skilled artisans will appreciate that elements in the figures are illustrated for simplicity and clarity and have not necessarily been drawn to scale. For example, the dimensions of some of the elements in the figures may be exaggerated relative to other elements to help improve understanding of various embodiments of the present invention. Also, common but well-understood elements that are useful or necessary in a commercially feasible embodiment are often not depicted in order to facilitate a less obstructed view of these various embodiments of the present invention.

Detailed Description

Examples are described herein for a ramp generator that provides a ramp signal having a reduced ramp settling time. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the examples. One skilled in the relevant art will recognize, however, that the techniques described herein can be practiced without one or more of the specific details, or with other methods, components, materials, and so forth. In other instances, well-known structures, materials, or operations are not shown or described in detail to avoid obscuring certain aspects.

Reference throughout this specification to "one example" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the example is included in at least one example of the present invention. Thus, the appearances of the phrases "in one example" or "in an embodiment" in various places throughout this specification are not necessarily all referring to the same example. Furthermore, the particular features, structures, or characteristics may be combined in any suitable manner in one or more examples.

Throughout the specification, several technical terms are used. Their ordinary meaning is adopted in the art to which these terms belong unless specifically defined herein or otherwise clearly implied by the context in which they are used. It should be noted that element names and symbols may be used interchangeably herein (e.g., Si/silicon); however, both have the same meaning.

Fig. 1 shows one example of an imaging system 100 according to an embodiment of the present disclosure. Imaging system 100 includes a pixel array 102, control circuitry 104, readout circuitry 108, and functional logic 106. In one example, the pixel array 102 is a two-dimensional (2D) array of photodiode or image sensor pixels (e.g., pixels P1, P2 … … Pn). As shown, the photodiodes are arranged in rows (e.g., rows R1 through Ry) and columns (e.g., columns C1 through Cx) to acquire image data of a person, place, object, etc., which can then be used to render a 2D image of the person, place, object, etc. However, the photodiodes need not be arranged in rows and columns, and other configurations may be employed.

In one example, after each image sensor photodiode/pixel in pixel array 102 has acquired its image data or image charge, the image data is read out by readout circuitry 108 and then transferred to functional logic 106. Readout circuitry 108 may be coupled to readout image data from a plurality of photodiodes in pixel array 102. In various examples, the readout circuitry 108 may include amplification circuitry, analog-to-digital conversion (ADC) circuitry, or other circuitry. In some embodiments, one or more comparators 112 may be included for each readout column. For example, the one or more comparators 112 may be included in respective analog-to-digital converters (ADCs) included in the readout circuitry 108. In one example, the ADC may be a single slope ADC. Function logic 106 may simply store the image data or even manipulate the image data by applying post-image effects (e.g., cropping, rotating, removing red-eye, adjusting brightness, adjusting contrast, etc.). In one example, readout circuitry 108 may readout a row of image data at a time along readout column lines (shown), or may readout the image data using various other techniques (not shown), such as a simultaneous serial readout or a full parallel readout of all pixels.

For example, to perform ADC, the readout circuit 108 may receive the reference voltage ramp signal VRAMP 130 from the ramp generator circuit 110. VRAMP 130 may be received by comparator 112, which may also receive image charge signals from the pixels of pixel array 102. Comparator 112 may use a counter to determine a digital representation of the image charge based on a comparison of VRAMP 130 to the image charge voltage level. In one example, the output circuit of the comparator 112 transitions from the first state to the second state when the input VRAMP 130 voltage reaches the input image voltage level. In the example, a value in a counter coupled to a comparator in the ADC may be used to generate a digital representation of the image charge. In accordance with the teachings of the present invention, in one example, the ramp settling time or delay of the ramp signal VRAMP 130 generated by the ramp generator 110 and received by the comparator 112 is reduced to increase the maximum frame rate and thereby improve the performance of the imaging system 100.

In one example, the control circuitry 104 is coupled to the pixel array 102 to control operation of a plurality of photodiodes in the pixel array 102. For example, the control circuit 104 may generate a shutter signal for controlling image acquisition. In one example, the shutter signal is a global shutter signal for simultaneously enabling all pixels within the pixel array 102 to simultaneously capture their respective image data during a single acquisition window. In another example, the shutter signal is a rolling shutter signal such that each row, column, or group of pixels is enabled in sequence during successive acquisition windows. In another example, the image acquisition is synchronized with an illumination effect, such as a flash.

In one example, the imaging system 100 may be embodied in a digital camera, a cellular telephone, a laptop computer, or the like. In addition, the imaging system 200 may be coupled to other hardware, such as a processor (general purpose or otherwise), memory elements, outputs (USB port, wireless transmitter, HDMI port, etc.), lighting/flash, electrical inputs (keyboard, touch display, track pad, mouse, microphone, etc.), and/or a display. Other hardware may communicate instructions to the imaging system 100, extract image data from the imaging system 100, or manipulate image data provided by the imaging system 100.

Fig. 2A shows a schematic diagram of an example of a ramp generator 210 in accordance with the teachings of the present invention, the ramp generator 210 having a trim input for an output stage of the ramp generator for use with an analog-to-digital converter in an image sensor. Note that the ramp generator 210 of fig. 2A may be an example of the ramp generator 110 of fig. 1, and similarly named and numbered elements referenced below are coupled and function similarly to those described above. As shown in the depicted example, the ramp generator 210 includes an operational amplifier (op amp)214 configured as an integrator amplifier, with an integrating capacitor Cint 216 coupled between the output and inverting input of the operational amplifier 214. A switch Intg _ sw 218 is also coupled between the output and the inverting input of the operational amplifier 214 to enable and disable the integrator. The inverting input of the operational amplifier 214 is coupled to receive the feedback input voltage vinteg 236 and is also coupled to the current source 220 that provides the integrator current i _ integer. The non-inverting input of operational amplifier 214 is coupled to receive a reference input voltage VREF _ DAC _ SMP 238. The reference voltage capacitor Cvref 222 is coupled to the non-inverting input of the operational amplifier 214 to sample the reference voltage VREF _ DAC 226 to the reference voltage capacitor Cvref 222 through a sampling switch SAMP _ SW 224. The output of the operational amplifier 214 is coupled to generate an output ramp signal VRAMP 230 across a load capacitor Cload 234.

In operation, switch Intg _ sw 218 is closed (e.g., turned on) to disable and reset ramp generator 210 by resetting the voltage across Cint 216. The switch Intg _ sw 218 is turned off (e.g., turned off), which enables the integrator current i _ integer to flow from the current source 220 into the capacitor Cint 216 to begin generating a ramp of the ramp signal VRAMP 230 at the output of the operational amplifier 210. At the beginning stage of the ramp in the ramp signal VRAMP 230, the current Ipull232 is brought to operational amplifier 214 to ground through the output stage or second stage of operational amplifier 214 during the ramp event in the ramp signal VRAMP 230 output of operational amplifier 214 due to the presence of a capacitance Cload 234 representing the capacitance distributed in the column stage circuitry of the imaging system. The presence of the capacitance Cload and the resulting current Ipull232 may be a primary cause of delay in the ramping of the ramp signal VRAMP 230, which increases the ramp settling time of the ramp signal VRAMP 230. In the depicted example, the operational amplifier 214 is also coupled to receive a trim input DACI _ cut [3:0]288, which trim input DACI _ cut [3:0]288 is coupled to be received by trim circuitry in the output stage of the operational amplifier 214 to compensate for the current Ipull232 and improve the ramp settling time of the VRAMP 230 in accordance with the teachings of the present invention.

Figure 2B shows a schematic diagram of an example of an operational amplifier with an output stage trimming circuit included in a ramp generator as shown in figure 2A for use with an analog-to-digital converter in an image sensor in accordance with the teachings of the present invention. It should be noted that the operational amplifier 214 of fig. 2B may be an example of the operational amplifier 214 of fig. 2A with added detail, and that similarly named and numbered elements referenced below are coupled and function similarly to those described above. As shown in the depicted example, the operational amplifier 214 includes an input stage or first stage 240 that includes an operational amplifier 240, the operational amplifier 240 having an inverting input coupled to receive a feedback voltage vinteg 236 and a non-inverting input coupled to receive a sampled reference input voltage VREF _ DAC _ SMP 238. The operational amplifier 240 has a first output vp coupled to the gate of the PMOS transistor 242 and a second output vn coupled to the gate of the NMOS transistor 244.

In the example shown in fig. 2B, the output stage or second stage of operational amplifier 214 includes transistors 242 and 244 coupled between the power supply rail and ground. The node between transistors 242 and 244 is the output node of the second stage and is configured to generate the output ramp signal VRAMP 230. As previously described, at the beginning stage of the ramp signal VRAMP 230, the current Ipull232 is brought into the operational amplifier 214 through the second stage of the operational amplifier 214, through the transistor 244 to ground.

To compensate for current Ipull232, operational amplifier 240 also includes a trim circuit 246 in the second stage coupled to the output node of the second stage in accordance with the teachings of the present invention. As shown, trim circuit 246 includes a plurality of transistors 248-250 coupled between the power supply rail and the output of operational amplifier 214. It should be noted that although the example shown in FIG. 2B shows that trim circuit 246 includes two transistors 248 and 250, it should be appreciated that in other examples, trim circuit 246 may include fewer than two or more than two transistors, each of which is coupled to be controlled in response to a respective one of trim inputs DACI _ cut [3:0] 228.

Continuing with the example shown in FIG. 2B, each of the plurality of transistors 248-250 includes a control terminal or gate terminal coupled to the control terminal or gate terminal of the transistor 242 to receive the vp output of the first stage operational amplifier 240. Further, each of the plurality of transistors 248-250 is also selectively coupled to the output node of the second stage of the operational amplifier 214 generating the VRAMP 230 in response to a respective one of the trim inputs DACI _ cut [3:0] 228. In the depicted example, each of the plurality of transistors 248 and 250 is selectively coupled to the output node of the second stage of the operational amplifier 214 via a respective switch in response to the trim input DACI _ cut [3:0]228, as shown. In operation, each of the trim inputs DACI _ cut [3:0]228 individually control the appropriate number of the plurality of transistors 248-.

For purposes of illustration, FIG. 3A is a timing diagram showing some of the signals in a ramp generator without an output stage trimming circuit, such as that shown in FIG. 2A, in accordance with the teachings of the present invention. As shown, the switch SAMP _ SW 324 and the switch Intg _ SW 318 are first closed to sample the VREF _ DAC voltage 226 onto the reference voltage capacitor Cvref 222 and reset the voltage across the Cint 216 capacitor before the ramp begins. Sampling switch SAMP _ SW 324 is then turned off, at which time reference input voltage VREF _ DAC _ SMP 238 has been sampled into reference voltage capacitor Cvref 222. The switch Intg _ sw 318 is then turned off and the ramp event in the output of the VRAMP 330 is initiated, as shown. However, at this time, since the Cload 234 capacitance is present at the output of the ramp generator, Ipull332 current begins to flow into the output of the ramp generator to ground.

As shown in fig. 3A, Ipull332 current causes a delay in the ramp signal at the beginning of the ramp event. The "ideal line" (dashed line) of the ramp in VRAMP 330 can be characterized by a linear function:

ideal line: kt.

However, due to the effects of the load parasitic capacitances Cload and Ipull332, the ramp signal is delayed, which can then be characterized by:

delayed ramp signal:

the main result of the delayed ramp signal caused by Ipull332 is an increased ramp settling time, which increases the amount of time required to read image data from the image sensor, which reduces the maximum frame rate possible for the image sensor.

Thus, fig. 3B is a timing diagram showing some of the signals in a ramp generator having an output stage trimming circuit for compensating Ipull332 in accordance with the teachings of the present invention. As shown, the switch SAMP _ SW 324 and the switch Intg _ SW 318 are first closed to sample the VREF _ DAC voltage 226 onto the reference voltage capacitor Cvref 222 and reset the voltage across the Cint 216 capacitor before the ramp begins. Sampling switch SAMP _ SW 324 is then turned off, at which time reference input voltage VREF _ DAC _ SMP 238 has been sampled onto reference voltage capacitor Cvref 222. The switch Intg _ sw 318 is then turned off and the ramp event in the output of the VRAMP 330 is initiated, as shown. For comparison purposes, the "original waveform" in fig. 3B illustrates the ramp in VRAMP 330 without compensating Ipull 332.

However, FIG. 3B also shows that trim input DACI _ cut [3:0]328 also activates and controls the plurality of transistors 248-250 in trim circuit 246, while turning off switch Intg _ sw 318 at the beginning of a ramp event in VRAMP 330. As will be shown, the different DACI _ cut [3:0]328 bits may be trimmed to achieve an ideal linear ramp (e.g., the "ideal line" in FIG. 3A) in VRAMP 330 in accordance with the teachings of the present invention. Specifically, at the beginning of a ramp event, to maintain the operating point, some portion of the second stage of the operational amplifier 214 may be turned off in response to the fine tuning input DACI _ cut [3:0] 328. Thus, the current Ipouh 252 flowing through the second stage of the operational amplifier 214 may substantially match Ipull 232. The value of Ipul can be determined from the slope and Cload 234 values. Likewise, the feedback voltage vinteg 236 at the non-inverting input of the operational amplifier 214 may be stable, and thus the ramp in the VRAMP 230 signal may approach a linear "ideal line" ramp. Thus, according to the teachings of the present invention, when the switch opens switch Intg _ sw 318, the ramp "corrected waveform" in VRAMP 330, produced by Ipush 252 current controlled in response to the trim input DACI _ cut [3:0]328, follows the linear characteristic of the "ideal line" of the ramp in VRAMP 330 characterized by Kt immediately after the switch Intg _ sw 318 is turned off.

For comparison, FIG. 3B also shows that "DACI _ cut [3:0] is too small" to show a ramp in VRAMP 330 in the event that insufficient current flows through Ipouh 252, and "DACI _ cut [3:0] is too large" to show a ramp in VRAMP 330 in the event that too much current flows through Ipouh 252. Thus, in accordance with the teachings of the present invention, the DACI _ cut [3:0] signal may first be programmed to appropriately control the plurality of transistors 248-250 in trim circuit 246 to compensate for Ipul 332.

Fig. 4 shows a schematic diagram of another example of a ramp generator 410 for use with an analog-to-digital converter in an image sensor in accordance with the teachings of the present invention. Note that the ramp generator 410 of fig. 4 may be an example of the ramp generator 210 of fig. 2A and/or the ramp generator 110 of fig. 1, and similarly named and numbered elements referenced below are coupled and function similarly to those described above. Further, it should also be noted that the ramp generator 410 of fig. 4 shares various similarities with the ramp generator 210 of fig. 2A. However, one difference between the ramp generator 410 of FIG. 4 and the ramp generator 210 of FIG. 2A is that the example ramp generator 410 of FIG. 4 does not receive the trim inputs DACI _ cut [3:0] or trim circuits in the output stage of the operational amplifier 414. In contrast, the ramp generator 410 of fig. 4 includes a tuning circuit 454 coupled to the non-inverting input of the operational amplifier 414 to tune the reference input voltage of the integrator amplifier to compensate for the current Ipull 432 in accordance with the teachings of the present invention.

As shown in the depicted example, the ramp generator 410 includes an operational amplifier 414 configured as an integrator amplifier having an integrator capacitor Cint416 coupled between the output and inverting input of the operational amplifier 414. A switch Intg _ sw 418 is also coupled between the output and the inverting input of the operational amplifier 414 to enable and disable the integrator. The inverting input of the operational amplifier 414 is coupled to receive the feedback input voltage vinteg 436 and is also coupled to a current source 420 that provides a current i _ integer. The non-inverting input of operational amplifier 414 is coupled to receive a reference input voltage VREF _ DAC _ SMP 438. The reference voltage capacitor Cvref 422 is coupled to the non-inverting input of the operational amplifier 414 to sample the reference voltage VREF _ DAC 426 onto the reference voltage capacitor Cvref 422 through the sampling switch SAMP _ SW 424. As will be discussed, the tuning circuit 454 tunes the reference input voltage VREF _ DAC _ SMP 438 received at the non-inverting input of the operational amplifier 414 to compensate for the Ipull 432 current in accordance with the teachings of the present invention. The output of the operational amplifier 414 is coupled to generate an output ramp signal VRAMP 430 across a load capacitor Cload 434.

As shown in the depicted example, tuning circuit 454 includes a tuning capacitance implemented with a variable capacitance Cimp462, where one end of variable capacitance Cimp462 is coupled to the non-inverting input of operational amplifier 414. The other end of variable capacitance Cimp462 is coupled to a switching circuit comprising switch 458 and switch 460. In the depicted example, the switching circuit is configured to couple the variable capacitance Cimp462 to the tuning voltage VREP _ IMP 456 or ground. Specifically, switch 458 is configured to couple variable capacitance Cimp462 to VREF _ IMP 456 voltage in response to signal IMP _ SW, and switch 460 is configured to couple variable capacitance Cimp462 to ground in response to complementary signal IMP _ SWB. In the depicted example, the variable capacitor Cimp462 is coupled to the tuning voltage VREF _ IMP 456 when the integrator amplifier is disabled, and is coupled to ground during a ramp event in the ramp signal VRAMP 430 when the integrator amplifier is enabled.

Fig. 5A is a timing diagram illustrating some of the signals in the ramp generator without the adjustable input as shown in fig. 4 in accordance with the teachings of the present invention. As shown, the switch SAMP _ SW 524 and the switch Intg _ SW 518 are first closed to sample the VREF _ DAC voltage 426 onto the reference voltage capacitor Cvref 422, and reset the voltage across the Cint416 capacitor before the ramp begins. Sampling switch SAMP _ SW 524 is then turned off, at which time reference input voltage VREF _ DAC _ SMP 438 has been sampled into reference voltage capacitor Cvref 422. The switch Intg _ sw 518 is then turned off, starting the ramp event in the output of the VRAMP530 as shown. However, at this time, since the Cload 434 capacitance is present at the output of the ramp generator, Ipull 532 current begins to flow into the output of the ramp generator to ground. The Ipull332 current causes a delay in the ramp signal at the beginning of the ramp event. The "ideal line" of the ramp in VRAMP 330 is labeled in fig. 5A as a dashed line with the following linear characteristics:

Kt。

however, due to the influence of Ipull 532, the ramp signal is delayed, which is characterized by:

this increases the amount of time required to read image data from the image sensor and reduces the maximum frame rate possible for the image sensor.

Thus, fig. 5B is a timing diagram showing some of the signals in a ramp generator with an adjustable input circuit in accordance with the teachings of the present invention. As shown, switch IMP _ SWB560 is first opened, which indicates that switch IMP _ SW458 is first closed. Furthermore, first switch SAMP _ SW 524 and switch Intg _ SW 518 are closed. Thus, reference voltage capacitor Cvref 422 is first coupled to sample reference voltage VREF _ DAC 426 through sampling switch SAMP _ SW 424 to sample voltage VREF _ DAC _ SMP 538 onto reference voltage capacitor Cvref 422. Further, one end of the variable capacitance Cimp462 is first coupled to VREF _ IMP 456, and the other end is coupled to VREF _ DAC 426. Accordingly, the voltage across variable capacitance Cimp462 is initialized to the difference between VREF _ DAC 426 and VREF _ IMP 456.

The sampling switch SAMP _ SW 524 is then turned off, at which time the reference input voltage VREF _ DAC _ SMP 538 has been sampled into the reference voltage capacitor Cvref 422. Switch Intg _ SW 518 is then turned off and switch 460 is turned on in response to IMP _ SWB560, which indicates that switch 458 is turned off in response to IMP _ SW 558. As shown in the example, sampling switches SAMP _ SW 524 and IMP _ SWB560 (and complementary IMP _ SW 458) are switched simultaneously. As shown, this begins to initiate a ramp event in the output of VRAMP 530. For comparison purposes, the "original waveform" in fig. 5B illustrates the ramp in VRAMP530 without compensating Ipull 432.

As shown, at the beginning of a ramp event in VRAMP530, variable capacitance Cimp462 switches from being coupled to VREF _ IMP 456 through switch 458 to being coupled to ground through switch 460 in response to IMP _ SWB 560. The other end of the variable capacitor Cimp462 is coupled to the non-inverting input of the operational amplifier 414. As a result, the reference input voltage VREF _ DAC _ SMP 538 is pulled down by the variable capacitance Cimp462, which variable capacitance Cimp462 is now coupled to ground through switch 460 at the beginning of the ramp event in VRAMP 530. In the depicted example, the values of VREF _ IMP 456 and variable capacitance Cimp462 are flipped such that:

in other words, if the values of VREF _ IMP, Cimp, and Cvref are selected (e.g., by tuning Cimp) to substantially match-K τ, the ramp event in ramp signal VRAMP530 will be linear and nearly ideal. In other words, the product of the tuning voltage VREF _ IMP 456 and the tuning capacitance Cimp462 divided by the sum of the tuning capacitance Cimp462 and the reference voltage capacitance of the reference voltage capacitor Cvref 422 is equal to the constant K τ. To illustrate, the exemplary ramp event labeled "corrected waveform" in VRAMP530 in fig. 5B is due to VREF _ IMP, Cimp, and Cvref being tuned such that:

for comparison, fig. 5B also shows that if the value selected for Cimp is too small, "Cimp is too small" to show a ramp in VRAMP530, and if the value selected for Cimp is too large, "Cimp is too large" to show a ramp in VRAMP 530.

The above description of illustrated embodiments of the invention, including what is described in the abstract, is not intended to be exhaustive or to limit the invention to the precise forms disclosed. While specific examples of the invention are described herein for illustrative purposes, various modifications are possible within the scope of the invention, as those skilled in the relevant art will recognize.

These modifications can be made to the invention in light of the above detailed description. The terms used in the following claims should not be construed to limit the invention to the specific examples disclosed in the specification. Rather, the scope of the invention is to be determined entirely by the following claims, which are to be construed in accordance with established doctrines of claim interpretation.