阅读说明：本技术 微设备筒映射和补偿 (Micro device cartridge mapping and compensation ) 是由 戈尔拉玛瑞扎·恰吉 埃桑诺拉·法蒂 于 2020-04-03 设计创作，主要内容包括：本公开涉及基于筒信息的微设备的补偿。(The present disclosure relates to cartridge information based compensation of micro devices.)

1. A method of filling a system (receiver) substrate with a microdevice, the method comprising disposing the microdevice in a cartridge;

extracting at least one parameter for at least one microdevice in the cartridge; and

the cartridges are selected and arranged to fill the system substrate such that the parameters extracted for adjacent cartridges are within a predetermined threshold.

2. A method of filling a system (receiver) substrate micro device, the method comprising disposing a micro device in a cartridge;

extracting a profile of at least one parameter for a microdevice in the cartridge; and

the cartridges are selected and arranged to fill the system substrate such that the profile of the at least one parameter forms a continuous graph having steps within a defined threshold between graphs of cartridges associated with respective adjacent areas on the system substrate.

3. A method of calculating microdevice variation compensation values for transfer from different cartridges to a system substrate, the method comprising:

acquiring the cartridge parameters using a microdevice location; and

the compensation value is calculated using the cartridge parameter and microdevice value.

4. The method of claim 3, wherein the microdevice value is converted to a brightness value and the cartridge parameter is passed to a compensation block where it converts the brightness value to a compensation value.

5. A compensation method for a micro device in a system substrate, the method comprising providing a different micro device, wherein at least an output of a micro device different from the micro device is adjusted to compensate for a parameter in the micro device.

6. The compensation method of claim 5, the method further comprising:

calculating a brightness value of the micro device;

calculating a compensation value for a different microdevice based on the cartridge parameter and microdevice position, wherein the compensation value is added to the brightness value; and

the modified brightness is used to calculate the programmed value.

7. A compensation method according to claim 5, wherein the programmed values are extracted from a gamma curve, pixel uniformity and temperature values.

8. The compensation method of claim 5, wherein the brightness value is extracted from a gamma curve.

Technical Field

The present disclosure relates to cartridge information based compensation of micro devices.

Disclosure of Invention

According to one embodiment, a method of filling a system (receiver) substrate with a microdevice may be provided. The method comprises arranging the microdevice in a cartridge, extracting at least one parameter of at least one microdevice in the cartridge; and selecting and arranging the cartridges to fill the system substrate such that the extraction parameters of adjacent cartridges are within a predetermined threshold.

According to another embodiment, a method of system (receiver) substrate microdevices may be provided. The method includes disposing a microdevice in a cartridge; extracting a profile of at least one parameter for the microdevice in the cartridge; and selecting and arranging the cartridges to fill the system substrate such that the profile of the at least one parameter forms a continuous graph having steps within a defined threshold between graphs of cartridges associated with respective adjacent areas on the system substrate.

According to another embodiment, a method of calculating a compensation value for variations in micro devices transferred from different cartridges into a system substrate may be provided. The method includes using a micro device position to obtain a cartridge parameter; and calculates a compensation value using the cartridge parameter and the microdevice value.

According to yet another embodiment, a compensation method for a micro device in a system substrate may be provided. The method includes providing a different microdevice, wherein at least an output of a microdevice different from the microdevice is adjusted to compensate for a parameter in the microdevice.

Drawings

The foregoing and other advantages of the disclosure will become apparent upon reading the following detailed description and upon reference to the drawings.

Fig. 1 shows a graph of the variation between at least one parameter of a device on a cartridge associated with adjacent regions on a system substrate.

Figure 2 shows the step of boxing the adjacent area of the cartridge.

FIG. 3 shows a profile of at least one parameter created for a cartridge.

FIG. 4 illustrates an exemplary block diagram of cartridge parameter compensation.

Fig. 5 shows an exemplary implementation of such compensation.

The present disclosure is susceptible to various modifications and alternative forms, specific embodiments, or implementations, as shown by way of example in the drawings and will be described in detail herein. It should be understood, however, that the disclosure is not intended to be limited to the particular forms disclosed. On the contrary, the disclosure is to cover all modifications, equivalents, and alternatives falling within the spirit and scope of the invention as defined by the appended claims.

Detailed Description

In this specification, the terms "device" and "microdevice" are used interchangeably. However, it will be clear to those skilled in the art that the embodiments described herein are independent of the size of the apparatus.

The invention relates to a method for filling a system substrate with a microdevice. These methods also involve taking into account thresholds for certain parameter values and compensating the microdevice as compared to neighboring microdevices. Furthermore, binning is also used to reduce parameter variation between microdevice areas on the system substrate.

Fig. 1 shows a graph of the variation between at least one parameter of the equipment on the cartridge 2110 associated with adjacent regions 2112 on the system substrate. To reduce the difference between these areas, the cartridges associated with these areas may be boxed.

Figure 2 shows the step of boxing the adjacent area of the cartridge. In a first step 2202, an average or median value of at least one parameter of the cartridge is calculated. In a second step 2204, the cartridges are binned and arranged to fill adjacent regions in the system substrate such that the average or median value of at least one parameter (or any other representation of the measured parameter) remains within a threshold value. In this case, the difference between at least one parameter (or a parametric representation thereof) of the cartridges associated with adjacent regions remains within the threshold.

FIG. 3 shows a profile of at least one parameter created for a cartridge. Here, at step 2302, a profile is extracted for at least one of the parameters of the device on the cartridge. In a second step 2304, the cartridges are binned and arranged to fill adjacent regions in the system substrate, wherein the step between the maps of cartridges associated with the adjacent regions is within a threshold.

In another case, a combination of the binning processes of fig. 2 and 3 may be used.

In another case, characteristics of the micro devices associated with adjacent regions are compensated such that a difference between devices in different adjacent regions is less than a threshold. In one case, if the parameter is the color point, other micro-devices may be used to adjust the color point of the micro-device. Here, the data extracted for the cartridge can be used to compensate the microdevice. In another case, microdevice performance associated with different cartridges may be measured after transfer to the system substrate.

FIG. 4 illustrates an exemplary block diagram of cartridge parameter compensation. Few of these blocks can be used in series or in parallel if different parameters are compensated. The first block stores 2402 parameters associated with the cartridge used to fill the system substrate. Further, the micro device location 2403 is passed to block 2402 to extract cartridge parameters associated with the cartridge from which the micro device was extracted. The microdevice passes through a value calculator block 2404 to generate a compensation value 2408. The calculator block may be a look-up table or a calculation block. Here, the value of the micro device 2406 is also passed to the value calculator block 2404.

In some cases, compensation involves the use of other microdevice types. In an embodiment, the color point of the display can be adjusted by using different micro-light emitting devices (micro-LEDs).

Fig. 5 shows an exemplary implementation of such compensation. Here, the value of the micro device 2502 is converted into luminance by the luminance calculator 2504 using the luminance parameter 2506. Further, the luminance value may be extracted from a gamma curve, wherein the gamma curve displays a desired luminance level for each gray scale. The gamma curve may be normalized by the peak brightness to eliminate the dependence on peak brightness.

Further, the micro device 1 location 2503 is passed to a block 2505 to extract the compensation parameters 2522 associated with the cartridge from which the micro device was extracted. These parameters 2522 are passed along with the microdevice luminance values to the compensation calculator 2518 to calculate the compensation values 2520 required by the other devices. The compensation values are in a luminance format. The luminance value of the micro device 1 is also combined with the required compensation values 2508, 2510 associated with the other micro devices. The combined values 2512 are then passed to a calculator block 2514 to calculate programmed values 2516. In one case, the compensation values 2508, 2510 are added to the brightness of the microdevice 1. In this block 2514, other functions may be contemplated, such as compensating for microdevice 1 non-uniformity, pixel non-uniformity, and gamma adjustment (related to the gamma curve of adjacent regions).

The invention described above may be varied in many ways. Such variations are not to be regarded as a departure from the scope of the invention, and all such modifications as would be obvious to one skilled in the art are intended to be included within the scope of the following claims.