阅读说明：本技术 一种晶振频率的测量方法、装置及系统 (Method, device and system for measuring crystal oscillation frequency ) 是由 滕成旺 陈健 吴继华 林潮兴 付珍峰 刘朝胜 张辉 于 2020-12-31 设计创作，主要内容包括：本发明公开了一种晶振频率的测量方法、装置及系统。所述方法包括：获取参考源信号和多路被测信号；将所述参考源信号进行分频得到多路参考源输入信号,并对所述多路被测信号和所述多路参考源输入信号进行同步采样得到被测上升沿信号和参考上升沿信号；将所述多路被测上升沿信号和所述多路参考上升沿信号一一对应组合得到多路信号对；对所述多路信号对分别进行时间差测量,确定每路信号对的时间差；根据所述时间差确定每路信号对中所述被测信号的频率。利用该方法,能够大批量的测量频率信号的晶振频率,且测量精度高,因此,能够有效提升测量效率,降低测量成本。(The invention discloses a method, a device and a system for measuring a crystal oscillation frequency. The method comprises the following steps: acquiring a reference source signal and a plurality of channels of signals to be tested; dividing the frequency of the reference source signal to obtain a plurality of paths of reference source input signals, and synchronously sampling the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal; correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs; respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each signal pair; and determining the frequency of the detected signal in each signal pair according to the time difference. By using the method, the crystal oscillator frequency of the frequency signal can be measured in large batch, and the measurement precision is high, so that the measurement efficiency can be effectively improved, and the measurement cost can be reduced.)

1. A method of measuring a crystal frequency, comprising:

acquiring a reference source signal and a plurality of channels of signals to be tested;

carrying out frequency division on the reference source signal to obtain a plurality of paths of reference source input signals, carrying out frequency division on the plurality of paths of tested signals to obtain a plurality of paths of tested input signals, and carrying out synchronous sampling on the plurality of paths of tested input signals and the plurality of paths of reference source input signals to obtain a tested rising edge signal and a reference rising edge signal;

correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs;

respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each signal pair;

and determining the frequency of the detected signal in each signal pair according to the time difference.

2. The method of claim 1, wherein the dividing the reference source signal into multiple reference source input signals comprises:

and dividing the reference source signal into a plurality of reference source input signals with the same frequency.

3. The method of claim 1, wherein synchronously sampling the plurality of signals under test and the plurality of reference source input signals to obtain a measured rising edge signal and a reference rising edge signal comprises:

and after a synchronous instruction is acquired, synchronously sampling the detected rising edge signals of the multiple paths of detected signals in a preset sampling time length and the reference rising edge signals of the multiple paths of reference source signals in the preset sampling time length.

4. The method of claim 1, wherein said performing a time difference measurement on said pairs of multipath signals, determining a time difference for each pair of multipath signals, comprises:

for each signal pair, determining a first start time of the measured rising edge signal and a second start time of the reference rising edge signal;

and taking the difference value of the first starting time and the second starting time as the time difference of the signal pair.

5. The method of claim 4, wherein determining the frequency of the measured signal in each signal pair according to the time difference comprises:

determining the frequency deviation of the signal pair according to the time difference of the signal pair and the preset sampling duration;

and determining the frequency of the measured signal in the signal pair according to the frequency deviation of the signal pair and the frequency of the reference source signal.

6. A device for measuring a crystal oscillation frequency, comprising:

the acquisition module is used for acquiring a reference source signal and a plurality of channels of signals to be detected;

the sampling module is used for carrying out frequency division on the reference source signal to obtain a plurality of paths of reference source input signals, carrying out frequency division on the plurality of paths of tested signals to obtain a plurality of paths of tested input signals, and carrying out synchronous sampling on the plurality of paths of tested input signals and the plurality of paths of reference source input signals to obtain a tested rising edge signal and a reference rising edge signal;

the combination module is used for correspondingly combining the multipath detected rising edge signals and the multipath reference rising edge signals one by one to obtain multipath signal pairs;

the first determining module is used for respectively measuring the time difference of the multi-channel signal pairs and determining the time difference of each channel of signal pair;

and the second determining module is used for determining the frequency of the detected signal in each signal pair according to the time difference.

7. The apparatus according to claim 6, wherein the sampling module is specifically configured to, after obtaining the synchronization instruction, synchronously sample the detected rising edge signal of the multiple channels of detected signals within a preset sampling duration and the reference rising edge signal of the multiple channels of reference source signals within the preset sampling duration.

8. A system for measuring a crystal frequency, the system comprising: an editable logic, a plurality of digital-to-time converters, and a microcontroller;

the editable logic unit is respectively connected with the plurality of digital time converters and the microcontroller, and the plurality of digital time converters are connected with the microcontroller;

the microcontroller is used for sending a control instruction and a synchronization instruction to the editable logic device;

the editable logic device is used for receiving a plurality of channels of signals to be tested, dividing the frequency of the input reference source signals according to the control instruction to obtain a plurality of channels of reference source input signals, dividing the frequency of the plurality of channels of signals to be tested to obtain a plurality of channels of input signals to be tested, and synchronously sampling the plurality of channels of input signals to be tested and the plurality of channels of reference source input signals according to the synchronous instruction to obtain a tested rising edge signal and a reference rising edge signal;

the editable logic device is further used for correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs and respectively sending the multi-channel signal pairs to the plurality of digital time converters;

the digital-to-time converter is used for measuring the time difference of the received signal pair and determining the time difference of the signal pair;

and the microcontroller is used for determining the frequency of the measured signal in each signal pair according to the time difference and the frequency of the reference source signal.

9. The system of claim 8, further comprising: a reference signal source to provide a reference source signal to the editable logic.

10. The system of claim 8, further comprising: and the crystal oscillators are used for generating a plurality of channels of signals to be tested and sending the plurality of channels of signals to the editable logic unit.

Technical Field

The embodiment of the invention relates to the technical field of electronics, in particular to a method, a device and a system for measuring a crystal oscillation frequency.

Background

Crystal oscillators are used in communication devices as frequency sources. In a typical crystal oscillator, a quartz crystal having a nominal resonant frequency is coupled to an oscillator circuit that generates a signal having a nominal output frequency.

In the prior art, a frequency meter or a logic device is generally adopted to realize crystal oscillator frequency measurement, and when the frequency meter is adopted to measure the crystal oscillator frequency, signals measured each time are limited, the efficiency is low, the input cost is high, and the crystal oscillator frequency of the signals cannot be measured in a large batch. The measurement method using the complex editable logic device is difficult to meet the measurement precision.

Therefore, how to effectively improve the measurement efficiency of the crystal oscillator frequency and reduce the measurement cost is a technical problem to be solved at present.

Disclosure of Invention

The embodiment of the invention provides a method, a device and a system for measuring the crystal oscillator frequency, which can effectively improve the measurement efficiency and reduce the measurement cost.

In a first aspect, an embodiment of the present invention provides a method for measuring a crystal frequency, including:

acquiring a reference source signal and a plurality of channels of signals to be tested;

dividing the frequency of the reference source signal to obtain a plurality of paths of reference source input signals, and synchronously sampling the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal;

correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs;

respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each signal pair;

and determining the frequency of the detected signal in each signal pair according to the time difference.

In a second aspect, an embodiment of the present invention further provides a device for measuring a crystal frequency, including:

the acquisition module is used for acquiring a reference source signal and a plurality of channels of signals to be detected;

the sampling module is used for carrying out frequency division on the reference source signal to obtain a plurality of paths of reference source input signals and carrying out synchronous sampling on the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal;

the combination module is used for correspondingly combining the multipath detected rising edge signals and the multipath reference rising edge signals one by one to obtain multipath signal pairs;

the first determining module is used for respectively measuring the time difference of the multi-channel signal pairs and determining the time difference of each channel of signal pair;

and the second determining module is used for determining the frequency of the detected signal in each signal pair according to the time difference.

In a third aspect, an embodiment of the present invention further provides a system for measuring a crystal frequency, including:

an editable logic, a plurality of digital-to-time converters, and a microcontroller;

the editable logic unit is respectively connected with the plurality of digital time converters and the microcontroller, and the plurality of digital time converters are connected with the microcontroller;

the microcontroller is used for sending a control instruction and a synchronization instruction to the editable logic device;

the editable logic device is used for receiving a plurality of channels of signals to be tested, dividing the frequency of the input reference source signals according to the control instruction to obtain a plurality of channels of reference source input signals, and synchronously sampling the plurality of channels of signals to be tested and the plurality of channels of reference source input signals according to the synchronous instruction to obtain a tested rising edge signal and a reference rising edge signal;

the editable logic device is further used for correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs and respectively sending the multi-channel signal pairs to the plurality of digital time converters;

the digital-to-time converter is used for measuring the time difference of the received signal pair and determining the time difference of the signal pair;

and the microcontroller is used for determining the frequency of the detected signal in each signal pair according to the time difference.

The embodiment of the invention provides a method, a device and a system for measuring the frequency of a crystal oscillator, which comprises the steps of firstly obtaining a reference source signal and a plurality of channels of measured signals; secondly, frequency division is carried out on the reference source signal to obtain a plurality of paths of reference source input signals, and synchronous sampling is carried out on the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal; then correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs; then, respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each signal pair; and finally, determining the frequency of the detected signal in each signal pair according to the time difference. By utilizing the technical scheme, the measuring efficiency can be effectively improved, and the measuring cost is reduced.

Drawings

Fig. 1 is a schematic flowchart of a method for measuring a crystal frequency according to an embodiment of the present invention;

fig. 2 is a schematic flowchart of a method for measuring a crystal frequency according to a second embodiment of the present invention;

fig. 3 is a schematic structural diagram of a device for measuring a crystal frequency according to a third embodiment of the present invention;

fig. 4 is a schematic structural diagram of a system for measuring a crystal frequency according to a fourth embodiment of the present invention;

fig. 5 is a diagram illustrating a structure of a system for measuring a crystal frequency according to a fourth embodiment of the present invention;

fig. 6 is a schematic diagram of a measurement result of the crystal oscillator frequency according to the fourth embodiment of the present invention.

Detailed Description

Embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While certain embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be construed as limited to the embodiments set forth herein, but rather are provided for a more thorough and complete understanding of the present disclosure. It should be understood that the drawings and the embodiments of the present invention are illustrative only and are not intended to limit the scope of the present invention.

It should be understood that the various steps recited in the method embodiments of the present invention may be performed in a different order and/or performed in parallel. Moreover, method embodiments may include additional steps and/or omit performing the illustrated steps. The scope of the invention is not limited in this respect.

The term "include" and variations thereof as used herein are open-ended, i.e., "including but not limited to". The term "based on" is "based, at least in part, on". The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments". Relevant definitions for other terms will be given in the following description.

It should be noted that the terms "first", "second", and the like in the present invention are only used for distinguishing different devices, modules or units, and are not used for limiting the order or interdependence relationship of the functions performed by the devices, modules or units.

It is noted that references to "a", "an", and "the" modifications in the present invention are intended to be illustrative rather than limiting, and that those skilled in the art will recognize that reference to "one or more" unless the context clearly dictates otherwise.

The names of messages or information exchanged between devices in the embodiments of the present invention are for illustrative purposes only, and are not intended to limit the scope of the messages or information.

Example one

Fig. 1 is a schematic flowchart of a method for measuring a crystal oscillator frequency according to an embodiment of the present invention, where the method is applicable to a case where a crystal oscillator frequency of a frequency signal is measured, and the method may be performed by a device for measuring a crystal oscillator frequency, where the device may be implemented by software and/or hardware and is generally integrated in a system for measuring a crystal oscillator frequency.

As shown in fig. 1, a method for measuring a crystal frequency according to an embodiment of the present invention includes the following steps:

and S110, acquiring a reference source signal and a plurality of channels of signals to be tested.

In this embodiment, a reference source signal may be obtained from a crystal oscillator, and multiple signals to be measured may be obtained from the reference source.

The reference source signal may be a standard cesium clock reference signal, and may provide a high-precision reference source signal, that is, the reference source signal may be a high-precision frequency signal.

The measured signal output from the Crystal Oscillator may be a multi-channel frequency signal, and the Crystal Oscillator may be an Oven Controlled Crystal Oscillator (OCXO) and a Temperature compensated quartz Crystal resonator (TCXO).

And S120, frequency division is carried out on the reference source signal to obtain a plurality of paths of reference source input signals, and synchronous sampling is carried out on the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal.

The reference source input signal may be a frequency signal obtained by frequency dividing the reference source signal. A measured rising edge signal is understood to be a signal sampled from a measured signal that includes a rising edge. A reference rising edge signal is understood to be a signal sampled from a reference source input signal that comprises one rising edge.

For example, when the frequency of the reference source signal is 10MHZ, the reference source signal is divided by 10M, and the multiple reference source input signals obtained after frequency division are all reference source input signals with the frequency of 1 HZ. After obtaining the multi-channel reference source input signals, the multi-channel reference source input signals can be sampled, and a plurality of detected rising edge signals can be obtained.

After obtaining the multiple channels of signals to be tested, frequency division can be performed on each channel of signals to be tested respectively, similarly, if the nominal frequency of the signals to be tested is 20MHz, frequency division is performed on the signals to be tested by 20M, and the input signals to be tested with the frequency of 1HZ can be obtained. After obtaining the multiple input signals to be tested, the multiple input signals can be sampled to obtain multiple reference rising edge signals.

It should be noted that, by dividing the reference source signal and the multiple channels of signals to be tested, the reference source input signal and the signals to be tested obtained after frequency division may have the same frequency.

And S130, correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs.

The multi-channel signal pair can be obtained by combining the multi-channel detected rising edge signal and the multi-channel reference rising edge signal according to the mode.

It should be noted that any one of the detected rising edge signals may be combined with any one of the reference rising edge signals to form a signal pair, which is not particularly limited.

And S140, respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each channel of signal pair.

The signal pair may include a detected rising edge signal and a reference rising edge signal, the detected rising edge signal and the reference rising edge signal may be obtained by obtaining the signal pair, and the time difference between the time of obtaining the detected rising edge signal and the time of obtaining the reference rising edge signal may be obtained.

It will be appreciated that each signal pair may have its time difference determined in the manner described above.

And S150, determining the frequency of the detected signal in each signal pair according to the time difference.

After the time difference of each signal pair is obtained, the frequency deviation can be determined according to the time difference, and further, the frequency of the detected rising edge signal in the signal pair can be calculated according to the frequency deviation and the frequency of the reference rising edge signal in the signal pair, wherein the frequency of the detected rising edge signal is the frequency of the detected signal.

The method for measuring the crystal oscillator frequency provided by the embodiment of the invention comprises the following steps of firstly, acquiring a reference source signal and a plurality of paths of measured signals; secondly, frequency division is carried out on the reference source signal to obtain a plurality of paths of reference source input signals, and synchronous sampling is carried out on the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal; then correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs; then, respectively measuring the time difference of the multi-channel signal pairs, and determining the time difference of each signal pair; and finally, determining the frequency of the detected signal in each signal pair according to the time difference. The method can simultaneously input multiple paths of signals to be measured, carry out frequency measurement on the input signals in a large batch, and further measure the crystal oscillator frequency of the signals to be measured by introducing a mode of forming multiple signal pairs by the reference source signal and the signals to be measured, so that the measurement precision can be improved, the measurement efficiency can be effectively improved, and the measurement cost can be reduced.

Example two

Fig. 2 is a schematic flow chart of a method for measuring a crystal frequency according to a second embodiment of the present invention, where the second embodiment is optimized based on the above embodiments. In this embodiment, the frequency division is performed on the reference source signal to obtain a plurality of reference source input signals, which is further embodied as: and dividing the reference source signal into a plurality of reference source input signals with the same frequency.

Further, in this embodiment, the detected rising edge signal and the reference rising edge signal are obtained by synchronously sampling the multiple detected signals and the multiple reference source input signals, and the method is further optimized as follows: and after a synchronous instruction is acquired, synchronously sampling the detected rising edge signals of the multiple paths of detected signals in a preset sampling time length and the reference rising edge signals of the multiple paths of reference source signals in the preset sampling time length.

On the basis of the optimization, the time difference measurement is carried out on the multi-channel signal pairs, and the time difference of each channel of signal pair is determined, which is specifically optimized as follows: for each signal pair, determining a first start time of the measured rising edge signal and a second start time of the reference rising edge signal; and taking the difference value of the first starting time and the second starting time as the time difference of the signal pair.

Further, on the basis of the optimization, the frequency of the detected signal in each signal pair is determined according to the time difference, and the optimization is specifically as follows: determining the frequency deviation of the signal pair according to the time difference of the signal pair and the preset sampling duration; and determining the frequency of the measured signal in the signal pair according to the frequency deviation of the signal pair and the frequency of the reference source signal.

Please refer to the first embodiment for a detailed description of the present embodiment.

As shown in fig. 2, a method for measuring a crystal frequency according to a second embodiment of the present invention specifically includes the following steps:

and S210, acquiring a reference source signal and a plurality of channels of signals to be tested.

S220, dividing the frequency of the reference source signal into multiple reference source input signals with the same frequency, dividing the frequency of the multiple tested signals to obtain multiple tested input signals, and after a synchronous instruction is obtained, synchronously sampling the tested rising edge signals of the multiple tested signals in a preset sampling time length and the reference rising edge signals of the multiple reference source signals in the preset sampling time length.

After receiving the synchronization instruction, sampling a plurality of channels of signals to be tested and a plurality of channels of reference source signals synchronously, wherein the sampling may be performed in a specific manner that a rising edge signal of the signals to be tested appearing within a preset sampling duration is sampled to obtain a rising edge signal to be tested; and sampling a rising edge signal of the reference source signal within a preset sampling time length to obtain a reference rising edge signal.

The preset sampling time may be a preset sampling time, and for example, the preset sampling time may be 1 s. The sampling efficiency may be determined by presetting the sampling duration, and in order to obtain higher sampling efficiency, the sampling duration may be set to a smaller value, for example, 10ms, 100ms, and the like.

And S230, correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one to obtain multi-channel signal pairs.

And S240, determining a first starting time of the detected rising edge signal and a second starting time of the reference rising edge signal for each channel of signal pair.

The first start time may be a time when the detected rising edge signal is received, and the second start time may be a time when the reference rising edge signal is received.

And S250, taking the difference value of the first starting time and the second starting time as the time difference of the signal pair.

After the first start time and the second start time are obtained, the two start times may be subtracted, and the obtained difference value may be used as a time difference of the signal pair.

It should be noted that the time difference can be calculated for each signal pair in the above-mentioned manner.

And S260, determining the frequency deviation of the signal pair according to the time difference of the signal pair and the preset sampling time length.

And calculating the product of the preset sampling duration and the time difference of the signal pair, wherein the obtained calculation result is the frequency deviation of the signal pair.

S270, determining the frequency of the detected signal in the signal pair according to the frequency deviation of the signal pair and the frequency of the reference source signal.

And the frequency of the reference rising edge signal in the signal pair is the frequency of the reference source signal corresponding to the reference rising edge signal. And the frequency of the detected rising edge signal in the signal pair is the frequency of the detected signal corresponding to the rising edge signal.

And calculating the sum of the frequency deviation of the signal pair and the frequency of the reference rising edge signal in the signal pair, wherein the obtained calculation result can be the frequency of the measured signal in the signal pair. Wherein the frequency of the reference source signal is known.

According to the crystal oscillator frequency measuring method provided by the embodiment of the invention, the crystal oscillator frequency of the measured signal can be calculated by using the reference source signal, and by using the method, the crystal oscillator can be measured with high precision, so that the test precision is effectively improved.

EXAMPLE III

Fig. 3 is a schematic structural diagram of an apparatus for measuring a crystal oscillator frequency according to a third embodiment of the present invention, which may be adapted to measure a crystal oscillator frequency of a frequency signal, wherein the apparatus may be implemented by software and/or hardware and is generally integrated in a system for measuring a crystal oscillator frequency.

As shown in fig. 3, the apparatus includes:

an obtaining module 310, configured to obtain a reference source signal and multiple channels of signals to be tested;

the sampling module 320 is configured to frequency-divide the reference source signal to obtain multiple reference source input signals, and synchronously sample the multiple signals to be tested and the multiple reference source input signals to obtain a signal to be tested and a reference rising edge signal;

the combining module 330 is configured to correspondingly combine the multiple detected rising edge signals and the multiple reference rising edge signals one to obtain multiple signal pairs;

a first determining module 340, configured to perform time difference measurement on the multiple signal pairs respectively, and determine a time difference of each signal pair;

and a second determining module 350, configured to determine the frequency of the measured signal in each signal pair according to the time difference.

In this embodiment, the apparatus first obtains a reference source signal and multiple channels of signals to be measured through an obtaining module; secondly, frequency division is carried out on the reference source signal through a sampling module to obtain a plurality of paths of reference source input signals, and synchronous sampling is carried out on the plurality of paths of signals to be tested and the plurality of paths of reference source input signals to obtain a signal to be tested and a reference rising edge signal; then correspondingly combining the multi-channel detected rising edge signals and the multi-channel reference rising edge signals one by one through a combination module to obtain multi-channel signal pairs; then, respectively measuring the time difference of the multi-channel signal pairs through a first determining module, and determining the time difference of each channel of signal pair; and finally, determining the frequency of the detected signal in each signal pair through a second determining module according to the time difference.

The embodiment provides a measuring device of crystal frequency, can input multichannel measured signal simultaneously, and large batch carries out the measurement of frequency to the input signal, further measures the crystal frequency of measured signal through the mode that introduces reference source signal and measured signal component multichannel signal pair, can improve measuring precision, consequently, can effectively promote measurement of efficiency, reduction measurement cost.

Further, the sampling module 320 is further configured to: and dividing the reference source signal into a plurality of reference source input signals with the same frequency.

On the basis of the above optimization, the sampling module 320 is specifically configured to: and after a synchronous instruction is acquired, synchronously sampling the detected rising edge signals of the multiple paths of detected signals in a preset sampling time length and the reference rising edge signals of the multiple paths of reference source signals in the preset sampling time length.

Based on the above technical solution, the first determining module 340 is specifically configured to: for each signal pair, determining a first start time of the measured rising edge signal and a second start time of the reference rising edge signal; and taking the difference value of the first starting time and the second starting time as the time difference of the signal pair.

Further, the second determining module 350 is specifically configured to: determining the frequency deviation of the signal pair according to the time difference of the signal pair and the preset sampling duration; and determining the frequency of the measured signal in the signal pair according to the frequency deviation of the signal pair and the frequency of the reference source signal.

The crystal oscillator frequency measuring device can execute the crystal oscillator frequency measuring method provided by any embodiment of the invention, and has corresponding functional modules and beneficial effects of the execution method.

Example four

Fig. 4 is a schematic structural diagram of a system for measuring a crystal oscillator frequency according to a fourth embodiment of the present invention, where the system is applicable to a case of measuring a crystal oscillator frequency of a frequency signal, and the system may be implemented by software and/or hardware.

As shown in fig. 4, the system includes: an editable logic 410, a plurality of digital to time converters 420, and a microcontroller 430; the editable logic device 410 is respectively connected with a plurality of digital-to-time converters 420 and a microcontroller 430, and the plurality of digital-to-time converters 420 are connected with the microcontroller 430; microcontroller 430 is used to send control instructions and synchronization instructions to editable logic 410; the editable logic device 410 is configured to receive multiple channels of signals to be tested, divide the frequency of an input reference source signal according to the control instruction to obtain multiple channels of reference source input signals, divide the frequency of the multiple channels of signals to be tested to obtain multiple channels of input signals to be tested, and perform synchronous sampling on the multiple channels of input signals to be tested and the multiple channels of reference source input signals according to the synchronous instruction to obtain a tested rising edge signal and a reference rising edge signal; the editable logic device 410 is further configured to correspondingly combine the multiple measured rising edge signals and the multiple reference rising edge signals one to obtain multiple signal pairs, and send the multiple signal pairs to the multiple digital-to-time converters respectively; a digital-to-time converter 420 for performing a time difference measurement on the received signal pair to determine a time difference of the signal pair; and the microcontroller 430 is used for determining the frequency of the measured signal in each signal pair according to the time difference and the frequency of the reference source signal.

The editable logic device 410 may be a Complex Programming Logic Device (CPLD).

The editable logic device 410 may be connected to the microcontroller 430, and configured to receive a control instruction and a synchronization instruction sent by the microcontroller 430, and after receiving the control instruction, the editable logic device 410 may divide the frequency of the input reference source signal and the input multiple channels of signals to be tested to obtain multiple channels of reference source input signals and multiple channels of signals to be tested. After the editable logic 410 finishes the synchronization command, the multiple reference source input signals and the multiple tested input signals may be synchronously sampled to obtain the tested rising edge signal and the reference rising edge signal.

The editable logic 410 may be configured to send multiple signal pairs to multiple digital-to-time converters by interfacing with multiple digital-to-time converters 420. Wherein, one signal pair is sent to a digital-to-time converter.

The digital-to-time converter 420 is a data control, and the digital-to-time converter 420 may be connected to the editable logic 410, and configured to receive the signal pair, perform time difference measurement according to the time of the detected rising edge signal and the reference rising edge signal in the received signal pair, and store the time difference in a register inside the digital-to-time converter 420. In which a digital-to-time converter 420 measures the time difference of a signal pair.

The digital-to-time converter 420 may also be coupled to the microcontroller 430 for transmitting the calculated time difference to the microcontroller 430.

The Microcontroller 430 may be a Micro Controller Unit (MCU), and the Microcontroller 430 may transmit the control command and the synchronization command to the editable logic 410 by connecting to the editable logic 410. The microcontroller 430 may be connected to the digital-to-time converters 420 to obtain the time difference of the multi-channel signal pair and the frequency of the reference source signal, and calculate the frequency of the measured signal according to the time difference and the frequency of the reference source signal.

Further, the frequency measuring system further includes: a reference signal source to provide a reference source signal to the editable logic.

Wherein, the reference signal source can be a cesium clock reference source.

Further, the frequency measuring system further includes: and the crystal oscillators are used for generating a plurality of channels of signals to be tested and sending the plurality of channels of signals to the editable logic unit.

The crystal oscillator may be OCXO or TCXO.

The system for measuring the crystal oscillator frequency according to the third embodiment of the invention firstly sends a control instruction and a synchronization instruction through a microcontroller, secondly an editable logic unit receives a plurality of channels of signals to be measured and divides the frequency of the input reference source signal according to the control instruction to obtain a plurality of channels of reference source input signals, divides the frequency of the plurality of channels of signals to be measured to obtain a plurality of channels of input signals to be measured, secondly the editable logic unit synchronously samples the plurality of channels of input signals to be measured and the plurality of channels of reference source input signals according to the synchronization instruction, combines the sampled signals into a plurality of channel signal pairs, secondly a plurality of digital time converters calculate time differences according to the signal pairs, and finally the microcontroller calculates the frequency of the signals to be measured by obtaining the time differences and the frequency of the reference source signals. Through the system, the crystal oscillator frequency of the frequency signal can be measured in large batch, and the measurement precision is high, so that the measurement efficiency can be effectively improved, and the measurement cost is reduced.

Fig. 5 is a diagram illustrating a structure of a system for measuring a crystal frequency according to a fourth embodiment of the present invention. As shown in fig. 5, the system includes a CPLD, i.e., editable logic, a plurality of TDCs, i.e., digital-to-time converters, and an MCU, i.e., a microcontroller.

The MCU can also be connected with a computer and used for outputting the calculated frequency of the measured signal in each signal pair to the computer, and the computer completes data analysis and draws a chart.

Fig. 6 is a schematic diagram of a crystal oscillator frequency measurement result according to a fourth embodiment of the present invention, and it can be known from fig. 6 that the input measured signal is an OCXO frequency signal of 10MHZ, and a group of frequency deviation data of the multi-path OCXO measured signal is obtained. The ordinate is the frequency deviation condition of the measured signal per second, and the abscissa is the time of measurement. The maximum value of the deviation of the crystal oscillation frequency of the measured signal is-1.3 e^-10. Therefore, the measurement precision of the crystal oscillator frequency measurement system can reach e^-11Magnitude.

It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.