阅读说明：本技术 存储器器件及提供写入电压的方法 (Memory device and method for providing write voltage ) 是由 赖建安 邹宗成 池育德 于 2020-11-13 设计创作，主要内容包括：本发明的实施例提供一种存储器器件及提供写入电压的方法,存储器器件包括多个单元,布置成包括多个行和多个列的矩阵。存储器器件还包括多个位线,其中,多个位线中的每个连接到布置在多个列的列中的多个单元中的第一多个单元。电压控制电路,与多个位线中的所选择的位线可连接,并且包括检测瞬时电源电压的电压检测电路和连接至电压检测电路的电压源选择电路。电压源选择电路基于检测到的瞬时电源电压从多个电压源中选择电压源。电压源选择电路包括将所选择的电压源连接到所选择的位线以提供写入电压的开关。(Embodiments of the present invention provide a memory device and a method of providing a write voltage, the memory device including a plurality of cells arranged in a matrix including a plurality of rows and a plurality of columns. The memory device also includes a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of cells of the plurality of cells arranged in a column of the plurality of columns. And a voltage control circuit connectable with a selected bit line of the plurality of bit lines and including a voltage detection circuit detecting an instantaneous power supply voltage and a voltage source selection circuit connected to the voltage detection circuit. The voltage source selection circuit selects a voltage source from a plurality of voltage sources based on the detected instantaneous power supply voltage. The voltage source selection circuit includes a switch that connects a selected voltage source to a selected bit line to provide a write voltage.)

1. A memory device, comprising:

a plurality of cells arranged in a matrix comprising a plurality of rows and a plurality of columns;

a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of the plurality of cells arranged in a column of the plurality of columns; and

a voltage control circuit connectable with a selected bit line of the plurality of bit lines, wherein the voltage control circuit comprises:

a voltage detection circuit, wherein the voltage detection circuit detects an instantaneous power supply voltage; and

a voltage source selection circuit connected to the voltage detection circuit, wherein the voltage source selection circuit selects a voltage source from a plurality of voltage sources based on the detected instantaneous supply voltage, and wherein the voltage source selection circuit includes a switch connecting the selected voltage source to the selected bit line to provide a write voltage.

2. The memory device of claim 1, wherein the voltage detection circuit comprises: a resistor ladder connected to a supply voltage node and a comparator connected to the resistor ladder, wherein the resistor ladder detects the instantaneous supply voltage and wherein the comparator compares the detected instantaneous voltage to a reference voltage.

3. The memory device of claim 2, wherein an output terminal of the comparator is connected to the switch, and wherein the switch selects the voltage source from the plurality of voltage sources based on an output of the comparator.

4. The memory device of claim 3, wherein the switch selects a first voltage source of the plurality of voltage sources when the instantaneous supply voltage is less than the reference voltage, and wherein the switch selects a second voltage source of the plurality of voltage sources when the instantaneous supply voltage is greater than the reference voltage.

5. The memory device of claim 2, wherein the voltage control circuit further comprises a timer, wherein the timer tracks a time period and generates a comparator enable signal after the time period expires, wherein the comparator enable signal triggers the comparator to compare the detected instantaneous voltage with the reference voltage.

6. The memory device of claim 5, wherein the voltage control circuit further comprises a latch circuit, wherein the latch circuit latches the comparison output of the comparator.

7. The memory device of claim 6, wherein the latch circuit is triggered by a clock signal, wherein the clock signal is generated by the timer.

8. The memory device of claim 6, wherein the voltage detection circuit is switched after latching the comparison output.

9. A memory device, comprising:

a cell array including a plurality of cells;

a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of the plurality of cells arranged in a column of the cell array;

a voltage control circuit connectable with a selected one of the plurality of bit lines, wherein the voltage control circuit provides a write voltage to the selected one of the plurality of bit lines for a write operation; and

a temperature compensation circuit connectable with the selected bit line, wherein the temperature compensation circuit comprises:

a reference voltage generator circuit, wherein the reference voltage generator circuit generates a temperature regulated reference voltage, an

A voltage regulator circuit connected to the reference voltage generator circuit, wherein the voltage regulator circuit compares an instantaneous write voltage to the temperature-regulated reference voltage and regulates the instantaneous write voltage based on the comparison.

10. A method of providing a write voltage, the method comprising:

detecting an instantaneous power supply voltage;

comparing the instantaneous supply voltage to a reference voltage;

selecting a voltage source from a plurality of voltage sources based on a comparison of the instantaneous supply voltage and the reference voltage; and

connecting the selected voltage source to a selected bit line of a cell array to provide a write voltage to the selected bit line.

Technical Field

Embodiments of the invention provide a memory device and a method of providing a write voltage.

Background

Integrated Circuit (IC) memory devices include resistive memory, such as Resistive Random Access Memory (RRAM), Magnetoresistive Random Access Memory (MRAM), Phase Change Random Access Memory (PCRAM), and the like. Resistive memories store information by changing the resistance of a dielectric material. For example, a RRAM is a memory structure that includes an array of RRAM cells, each of which stores a bit of data using a resistance value rather than a charge. In particular, each RRAM cell includes a resistive material layer, the resistance of which may be adjusted to represent a logic "0" or a logic "1".

Disclosure of Invention

According to an aspect of an embodiment of the present invention, there is provided a memory device including: a plurality of cells arranged in a matrix comprising a plurality of rows and a plurality of columns; a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of cells of the plurality of cells arranged in a column of the plurality of columns; and a voltage control circuit connectable with a selected bit line of the plurality of bit lines, wherein the voltage control circuit includes: a voltage detection circuit, wherein the voltage detection circuit detects an instantaneous power supply voltage; and a voltage source selection circuit connected to the voltage detection circuit, wherein the voltage source selection circuit selects a voltage source from a plurality of voltage sources based on the detected instantaneous power supply voltage, and wherein the voltage source selection circuit includes a switch connecting the selected voltage source to the selected bit line to provide the write voltage.

According to another aspect of an embodiment of the present invention, there is provided a memory device including: a cell array including a plurality of cells; a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of cells of a plurality of cells arranged in a column of the cell array; a voltage control circuit connectable with a selected one of the plurality of bit lines, wherein the voltage control circuit provides a write voltage to the selected one of the plurality of bit lines for a write operation; and a temperature compensation circuit connectable with the selected bit line, wherein the temperature compensation circuit includes: a reference voltage generator circuit, wherein the reference voltage generator circuit generates a temperature regulated reference voltage, and a voltage regulator circuit connected to the reference voltage generator circuit, wherein the voltage regulator circuit compares the instantaneous write voltage to the temperature regulated reference voltage and regulates the instantaneous write voltage based on the comparison.

According to still another aspect of an embodiment of the present invention, there is provided a method of providing a write voltage, the method including: detecting an instantaneous power supply voltage; comparing the instantaneous supply voltage to a reference voltage; selecting a voltage source from a plurality of voltage sources based on a comparison of the instantaneous supply voltage to a reference voltage; and connecting the selected voltage source to the selected bit line of the cell array to provide a write voltage to the selected bit line.

Drawings

Various aspects of the invention are best understood from the following detailed description when read with the accompanying drawing figures. It should be emphasized that, in accordance with the standard practice in the industry, various features are not drawn to scale and are used for illustration purposes only. In fact, the dimensions of the various elements may be arbitrarily increased or decreased for clarity of discussion.

FIG. 1A is a block diagram generally illustrating an example memory device, in accordance with some embodiments.

FIG. 1B is a block diagram generally illustrating an array of cells of an example memory device, in accordance with some embodiments.

FIG. 2A is a block diagram generally illustrating an example write voltage circuit for a memory device, in accordance with some embodiments.

FIG. 2B is a block diagram generally illustrating another example write voltage circuit for a memory device, in accordance with some embodiments.

Fig. 3 is a block diagram generally illustrating an example voltage control circuit, in accordance with some embodiments.

FIG. 4 is a block diagram generally illustrating an example temperature compensation circuit, in accordance with some embodiments.

Fig. 5 is an example of a circuit for a PTAT current source, according to some embodiments.

FIG. 6 is a block diagram illustrating a memory device having a write voltage circuit according to an example embodiment.

FIG. 7 is a block diagram illustrating placement of components in an example memory device, according to an example embodiment.

FIG. 8 is a flow chart of a method for providing a write voltage to a memory device according to some embodiments.

Detailed Description

The following disclosure provides many different embodiments, or examples, for implementing different features of the invention. Specific embodiments or examples of components and arrangements are described below to simplify the present disclosure. Of course, these are merely examples and are not intended to be limiting. For example, in the following description, forming a first feature over or on a second feature may include embodiments in which the first and second features are formed in direct contact, and may also include embodiments in which additional features may be formed between the first and second features, such that the first and second features may not be in direct contact. Moreover, the present disclosure may repeat reference numerals and/or letters in the various examples. This repetition is for the purpose of simplicity and clarity and does not in itself dictate a relationship between the various embodiments and/or configurations discussed.

Further, for ease of description, spaced relationship terms such as "below …," "below …," "lower," "above …," "upper," and the like may be used herein to describe one element or component's relationship to another element or component as illustrated in the figures. The term spaced relationship is intended to encompass different orientations of the device in use or operation in addition to the orientation depicted in the figures. The device may be otherwise oriented (rotated 90 degrees or at other orientations) and the spatial relationship descriptors used herein interpreted accordingly as such.

In some Integrated Circuit (IC) memory devices, such as Resistive Random Access Memories (RRAMs), variations in Bit Line (BL) or Source Line (SL) voltages can occur during read and write operations. In addition, the BL voltage may change depending on the temperature. The present disclosure provides techniques for providing a suitable bit line voltage for a write operation of a memory device and methods of compensating for bit line voltage changes caused during the write operation due to temperature variations.

FIG. 1A is a block diagram illustrating an example memory device 100, according to some embodiments. In some examples, the memory device 100 is a resistive memory device, such as a Resistive Random Access Memory (RRAM). As shown in fig. 1A, the memory device 100 includes a cell array 102, a word line driver 104, an input/output (I/O) circuit 106, and a write voltage circuit 108. Although the write voltage circuit 108 is shown separate from the I/O circuit 106, the write voltage circuit 108 may be part of the I/O circuit 106. In addition, it will be apparent to those of ordinary skill in the art upon reading this disclosure that the memory device 100 may include more components or fewer components than those shown in FIG. 1A.

FIG. 1B is a block diagram illustrating an example cell array 102 of an example memory device 100, according to some embodiments. As shown in FIG. 1B, cell array 102 includes a plurality of cells (collectively referred to as a plurality of memory cells 110) labeled 110a0, 110m0, 110a1, 110m1, 110an, 110 mn. Each of the plurality of cells 110 may store a bit of information (i.e., a bit value of 0 or a bit value of 1). Accordingly, each of the plurality of cells 110 is also referred to as a bit cell or a memory cell.

In some examples, the plurality of cells 110 of the cell array 102 may include resistive memory cells. A resistive memory cell includes a resistive element having a layer of high-k dielectric material disposed between conductive electrodes disposed within a back end of line (BEOL) metallization stack. The resistive memory cell is configured to operate based on a reversible switching process between resistive states. Such reversible switching may be achieved by selectively forming conductive filaments through the layer of high-k dielectric material. For example, a layer of high-k dielectric material, which is typically insulating, may be rendered conductive by applying a voltage across a conductive electrode to form a conductive filament extending through the layer of high-k dielectric material. A resistive memory cell having a first (e.g., high) resistance state corresponds to a first data value (e.g., a logic "0") and a resistive memory cell having a second (e.g., low) resistance state corresponds to a second data value (e.g., a logic "1").

As shown in fig. 1B, the plurality of cells 110 of the cell array 102 are arranged in a matrix having a plurality of rows (e.g., m rows) and a plurality of columns (e.g., n columns). Each of the plurality of rows includes a first plurality of cells of the plurality of cells. For example, row 0 of cell array 102 includes a first plurality of cells labeled 110a0, …, 110m 0. Similarly, the first row of the cell array 102 includes a first plurality of cells labeled 110a1, …, 110m 1. Finally, the nth row of the cell array 102 includes a first plurality of cells labeled 110n1, … …, 110nm 1.

Similarly, each column of the plurality of columns includes a second plurality of cells of the plurality of cells. For example, column 0 of the cell array 102 includes a second plurality of cells labeled 110a0, 110a1, …, 110 an. Similarly, the mth column of cell array 102 includes a second plurality of cells labeled 110m0, 110ml, …, 110 mn.

The cell array 102 further includes a plurality of word lines (e.g., WL0, WL1,. gthri, WLn) and a plurality of bit lines (e.g., BL0,. gthri, BLm). Each of the plurality of word lines is associated with a row of the plurality of rows. For example, each of the first plurality of cells in a row of the plurality of rows is connected to a word line of the plurality of word lines. As shown in FIG. 1B, the first plurality of cells labeled 110a0, …, 110m0 of row 0 are connected to word line WL 0. Similarly, a first plurality of cells labeled 110a1, …, 110m1 of the first row is connected to word line WL 1. Finally, a first plurality of cells labeled 110n 0.

Similarly, each bit line of the plurality of bit lines is associated with a column of the plurality of columns. For example, each cell of the second plurality of cells of one of the plurality of columns is coupled to a bit line of the plurality of bit lines. As shown in FIG. 1B, a second plurality of cells labeled 110a0, 110a1, …, 110an of column 0 are connected to bit line BL 0. Similarly, a second plurality of cells labeled 110m0, 110m1, … …, 110mn of the mth column are connected to the bit line BLm.

Thus, each of the plurality of cells of the cell array 102 is associated with an address defined by the intersection of a word line and a bit line. In some examples, the cell array 102 also includes a plurality of source lines (e.g., SL0, …, SLm). Each source line of the plurality of source lines is also associated with a column of the plurality of columns. For example, a second plurality of cells of a column is coupled to a source line of the plurality of source lines. As shown in FIG. 1B, a second plurality of cells labeled 110a0, 110a1, …, 110an of column 0 are connected to a source line SL 0. Similarly, a second plurality of cells labeled 110m0, 110m1, … …, 110mn in the mth column is connected to the source line SLm.

In some examples, and as shown in fig. 1B, each of the plurality of cells 110 of the cell array 102 includes a resistive memory element 112 and an access transistor 114. The resistive memory element 112 has a resistive state that is switchable between a low resistance state and a high resistance state. The resistance state indicates a data value (e.g., "1" or "0") stored within the resistive memory element 112. The resistive memory element 112 has a first terminal coupled to a bit line and a second terminal coupled to the access transistor 114. Access transistor 114 has a gate coupled to the word line, a source coupled to the source line, and a drain coupled to the second terminal of resistive memory element 112. In an example, the access transistor 114 may be symmetrical. That is, the drain of access transistor 114 may be the source and the source of access transistor 114 may be the drain.

To read data from the cell array 102 or write data to the cell array 102, a word line of a plurality of word lines is selected and charged to a predetermined voltage, for example, a word line voltage VWL. In addition, a bit line of the plurality of bit lines and a source line of the plurality of source lines are selected and precharged to a predetermined voltage, for example, a BL/SL voltage (VBL/VSL). The applied voltages cause the sense amplifier to receive a signal having a value that depends on the data state of the cells of the cell array 102.

Returning to fig. 1A, the word line driver 104 selects a word line of the plurality of word lines and charges the selected word line to a predetermined voltage, for example, a word line voltage VWL. The word line driver 104 selects a word line to be charged based on decoding an address provided by a plurality of address lines. As shown in fig. 1A, a word line driver 104 is connected to the cell array 102.

I/O circuit 106 applies BL/SL voltages (i.e., VBL/VSL) to the selected bit line and the selected source line during read-write operations. In some embodiments, the I/O circuitry 106 includes circuitry for multiplexing and encoding data to be written to the cell array 102 or written from the cell array 102 and demultiplexing and decoding data, as well as circuitry for precharging selected bit lines and selected source lines of a read-write operation. In some embodiments, the I/O circuitry 106 includes circuitry to amplify or apply read-write signals to or from the selected bit line and the selected source line. In general, the I/O circuitry 106 includes one or more circuits necessary to control the selected bit line and the selected source line voltages for all set, reset, and read operations performed on the cell array 102 of resistive memory cells. As shown in fig. 1A, I/O circuitry 106 is connected to cell array 102.

Continuing with FIG. 1A, write voltage circuit 108 provides a write voltage to be applied to selected bit lines of cell array 102. In addition, the write voltage circuit 108 compensates for a variation in write voltage due to a variation in temperature of the cell array 102. The write voltage circuit 108 improves the write margin of the cell array 102. For example, the write voltage circuit 108 reduces variations in write voltages along bit lines of the cell array 102. In an example embodiment, and as discussed in detail below in portions of this disclosure, the write voltage circuit 108 includes a voltage control circuit (also referred to as a power switching system) that automatically selects an appropriate power supply for the write driver. Furthermore, and as discussed in detail in the following portions of the present disclosure, the write voltage circuit 108 also provides a temperature-dependent reference signal to accommodate mobility degradation in write operations of the cell array 102 due to temperature variations of the cell array 102.

FIG. 2A illustrates a block diagram showing a write voltage circuit 108 according to an example embodiment. As shown in fig. 2A, the write voltage circuit 108 includes a voltage control circuit 200. The voltage control circuit 200 (also referred to as a power switching system or power switching system) uses a resistor ladder to detect the voltage level of the power supply and compare it to a known voltage source (i.e., VBG). Voltage control circuit 200 then uses the detected voltage level to select the appropriate power supply for the write driver. The appropriate power source is automatically selected. The voltage control circuit 200 is described in more detail with reference to fig. 3 of the present disclosure.

In addition, as shown in fig. 2B, in some examples, the write voltage circuit 108 also includes a temperature compensation circuit 210. The temperature compensation circuit 210 (also referred to as a temperature compensation scheme) generates a temperature dependent reference signal for the write driver for the temperature compensation circuit. The temperature dependent reference signal will then be used to compensate for the writability loss at high temperatures and prevent device stress at low temperatures. The temperature dependent reference signal is designed to align its level with room temperature. No additional trimming may be required. In addition, the temperature dependent reference signal can automatically adapt to different write voltage levels. The temperature compensation circuit 210 is described in more detail with reference to fig. 4 of the present disclosure.

Fig. 3 is a block diagram illustrating an example voltage control circuit 200 according to some embodiments. As shown in fig. 3, the voltage control circuit 200 includes a voltage source selection circuit 302 and a voltage detection circuit 304. The voltage source selection circuit 302 is connected to the voltage detection circuit 304. The voltage detection circuit 304 detects an instantaneous power supply voltage (also referred to as an instantaneous voltage). And provides the detected instantaneous supply voltage to the voltage source selection circuit 302. The voltage source selection circuit 302 selects a voltage source from a plurality of voltage sources based on the detected instantaneous power supply voltage. For example, and as discussed in the following portions of the present disclosure, the voltage source selection circuit 302 includes a switch that connects a selected voltage source to a selected bit line to provide a write voltage.

As shown in fig. 3, the voltage source selection circuit 302 includes a plurality of voltage sources 306, the plurality of voltage sources 306 including, for example, a first voltage source 306a and a second voltage source 306 b. In some examples, the first voltage source 306a corresponds to a supply voltage level (i.e., VDIO) and the second voltage source 306b corresponds to an increased supply voltage level. For example, and as shown in fig. 3, the second voltage source 306b includes a low ripple charge pump (i.e., LR-CP)314 connected to the supply voltage node. The LR-CP 314 increases the supply voltage level to provide the increased supply voltage level to the second voltage source 306 b. Although the voltage source selection circuit 302 is shown as including only two voltage sources (i.e., the first voltage source 306a and the second voltage source 306b), it will be apparent to those skilled in the art after reading this disclosure that the voltage source selection circuit 302 may include more than two voltage sources.

In addition, the voltage source selection circuit 302 includes a switch 308. In an example, the switch 308 is a multi-domain power switch. For example, switch 308 is a two-domain power switch. Switch 308 includes an input terminal 310 and an output terminal 312. The switch 308 selects one of the plurality of voltage sources 306 and provides a voltage level associated with the selected one of the plurality of voltage sources 306 at the output terminal 312. For example, the input terminal 310 of the switch 308 is connected to a selected voltage source node to select one of the plurality of voltage sources 306. The switch 308 selects one of the plurality of voltage sources 306 based on the instantaneous supply voltage. For example, switch 308 receives a signal representative of the instantaneous supply voltage from voltage detection circuit 304.

The voltage detection circuit 304 includes a resistor ladder 316 and a first comparator 318. The resistor ladder 316 includes a first resistor 330 and a second resistor 332. A first terminal of the first resistor 330 is connected to a supply voltage node (i.e., VDIO) and a second terminal of the first resistor 330 is connected to a first reference node 334. A first terminal of the second resistor 332 is connected to the first reference node 334 and a second terminal of the second resistor 332 is connected to ground. In an example, the resistance value of the first resistor 330 is equal to the resistance value of the second resistor 332. However, it will be apparent to those skilled in the art after reading this disclosure that the resistance values of the first resistor 330 and the second resistor 332 may be different. Additionally, although resistor ladder 316 is shown to include only two resistors (i.e., first resistor 330 and second resistor 332), it will be apparent to one of ordinary skill in the art after reading this disclosure that resistor ladder 316 may include more than two resistors.

The resistor ladder 316 provides a voltage representative of the instantaneous value of the supply voltage (i.e., VDIO) at the first reference node 334. For example, the first reference node 334 provides half of the supply voltage (i.e., 1/2 (VDIO)). A representative voltage of the instantaneous value of the supply voltage (hereinafter also referred to as instantaneous supply voltage) is supplied to the first comparator 318. The first comparator 318 compares the instantaneous supply voltage to a reference voltage (e.g., a gated voltage (i.e., VBG) — in some examples, the first comparator 318 is an amplifier, such as an operational amplifier.

For example, the first comparator 318 includes a first input terminal 320, a second input terminal 322, and an output terminal 324. A first input terminal 320 of the first comparator 318 is connected to the gated voltage node and a second input terminal 322 of the second comparator 318 is connected to a first reference node 334 of the resistor ladder 316. The first comparator 318 compares the instantaneous supply voltage received at the first input terminal 320 with a reference voltage received at the second input terminal 322 and provides a comparison result at an output terminal 324. In an example embodiment, the comparison result indicates whether the instantaneous supply voltage is greater than or less than a reference voltage.

The comparison result from the first comparator 318 is provided to the switch 308. For example, the output terminal 324 of the first comparator 318 is connected to the switch 308. The switch 308 selects one of the plurality of voltage sources 306 based on the comparison result. For example, the switch 308 selects a first voltage source 306a of the plurality of voltage sources 306 when the comparison result indicates that the instantaneous supply voltage is equal to or greater than the reference voltage. In addition, the switch 308 selects a second voltage source 306b of the plurality of voltage sources 306 when the comparison indicates that the instantaneous supply voltage is less than the reference voltage.

In some embodiments, voltage control circuit 200 includes a latch 326 and a timer 328. Timer 328 tracks a time period and generates a first trigger signal after a first predetermined time period and a second trigger signal after a second predetermined time period. In some examples, the second trigger signal is generated after the first trigger signal. The first trigger signal triggers the first comparator 318 to compare the instantaneous supply voltage with the reference voltage. The second trigger signal triggers latch 326 to store the comparison result from first comparator 318. After latching the comparison results, the first comparator 318 may be turned off to save power. In an example embodiment, latch 326 may be a flip-flop. In addition, latch 326 may be used to speed up detection delay.

Fig. 4 is a block diagram generally illustrating an example temperature compensation circuit 210, in accordance with some embodiments. As shown in fig. 4, the temperature compensation circuit 210 includes a reference voltage generator circuit 402 and a voltage regulator circuit 404. The voltage regulator circuit 404 is connected to the reference voltage generator circuit 402. The reference voltage generator circuit 402 generates a temperature compensated reference voltage and provides the temperature compensated reference voltage to the voltage regulator circuit 404. The voltage regulator circuit 404 compares the temperature compensated reference voltage to the instantaneous bit line voltage and adjusts the instantaneous bit line voltage based on the comparison.

As shown in fig. 4, the reference voltage generator circuit 402 includes a first current source 406 and a second current source 408. The first current source 406 is connected in parallel with the second current source at a second reference node 410. The first current source 406 sinks a first current at the second reference node 410, and the second current source 408 sinks a second current at the second reference node 410. In some examples, the first current source 406 is a Proportional To Absolute Temperature (PTAT) current source and the second current source is a Zero Temperature Coefficient (ZTC) current source. An example PTAT current source is discussed in more detail with reference to fig. 5 of the present disclosure.

In some examples, the PTAT current generated by the PTAT current source (i.e., the first current source 406) is proportional to absolute temperature and increases or decreases in the same direction as the temperature increases or decreases. The ZTC current generated by the ZTC current source (i.e., second current source 408) has a zero temperature coefficient with absolute temperature. That is, the ZTC current is substantially constant with respect to absolute temperature. The PTAT current and ZTC current are used in combination to generate a bias current for the reference voltage generator circuit 402. For example, the slope (i.e., the rate of increase or decrease) of the PTAT current and the ZTC current is controlled using a trim code such that the bias current for the reference voltage generator circuit 402 remains the same at a specified temperature (e.g., room temperature) when the slope changes.

The reference voltage generator circuit 402 also includes a variable resistor 412. A first terminal of the variable resistor 412 is connected to the second reference node 410 and a second terminal of the variable resistor 412 is connected to ground. In some examples, the resistance value of the variable resistor 412 is changed to adjust the bias current of the reference voltage generator 402. The temperature compensated reference voltage is generated at the second reference node 410 and provided at an output terminal 414 of the reference voltage generator circuit 402. In an example, the temperature compensated reference voltage generated at the output terminal 414 of the reference voltage generator circuit 402 is provided to the voltage regulator circuit 404.

Continuing with fig. 4, the voltage regulator circuit 404 includes a second comparator 416 and a third current source 418. A third current source 418 is connected to the second comparator 416. The second comparator 416 includes a first input terminal 420, a second input terminal 422, and an output terminal 424. The first input terminal 420 is connected to the output terminal 414 of the reference voltage generator circuit 402. The second input terminal 422 is connected to a selected bit line of the cell array 102. In an example, the second comparator 416 compares the temperature compensated reference voltage received at the first input terminal 420 with the instantaneous bit line voltage received at the second input terminal 422 and provides a comparison result on the output terminal 424. The comparison result may include whether the instantaneous bit line voltage is less than or greater than the temperature compensated reference voltage.

The comparison result is provided to a third current source 418. The third current source 418 changes the amount of source current Is drawn by the selected bitline based on the comparison result. For example, when the temperature compensated reference voltage Is greater than the instantaneous bit line voltage, the third current source 418 increases the amount of the selected bit line sink source current Is. In addition, the third current source 418 reduces the amount of source current Is drawn by the selected bitline when the temperature compensated reference voltage Is less than the instantaneous bitline voltage.

In an example, the third current source 418 includes a transistor 426. The source of transistor 426 is connected to the write voltage node and the drain of transistor 426 is connected to a selected bit line of cell array 102. A gate of the transistor 426 is connected to the output terminal 424 of the comparator 416. In some examples, the transistor 426 is a p-channel metal oxide semiconductor (pMOS) transistor. However, it will be apparent to those of ordinary skill in the art, after reading this disclosure, that other types of transistors, such as Metal Oxide Semiconductor Field Effect Transistors (MOSFETs), n-channel metal oxide semiconductor (nMOS) transistors, or Complementary Metal Oxide Semiconductor (CMOS) transistors, may be used for transistor 426. In addition, the transistor 426 is symmetrical. That is, the source of transistor 426 may be the drain, and the drain of transistor 426 may be the source.

In an example, a general buffer may be connected between the reference voltage generator circuit 402 and the voltage regulator circuit 404. The general purpose buffer shields the reference voltage generator circuit 402 from kickback noise generated by the regulator circuit 404. In other examples, the regulator circuit 404 is a Low Dropout (LDO) circuit. In some examples, the second comparator 416 is an amplifier, such as an operational amplifier.

Fig. 5 is an example of a circuit of a PTAT current source 500 according to some embodiments. In an example embodiment, the PTAT current source 500 includes a bandgap reference (BGR) circuit. The PTAT current source 500 is a temperature independent current source that outputs a fixed (constant) current regardless of temperature variations. In some examples, the PTAT current source 500 outputs a PTAT current that varies linearly with temperature. As shown in fig. 5, the PTAT current source 500 includes a first transistor Q1502 and a second transistor Q2504. Further, the PTAT current source 500 includes a first resistor R1506, a second resistor R2508, a third resistor R3510, and a fourth resistor R4512. The PTAT current source 500 includes a third comparator 514, a first current mirror 516, and a second current mirror 518.

The first transistor Q1502 is connected between the first node 520 and ground. A first terminal of the first resistor R1506 is connected to the third node 524, and a second terminal of the first resistor R1506 is connected to the first node 520. A first terminal of a second resistor R2508 is connected to the third node 524 and a second terminal of the second resistor. A second resistor R2508 is connected to the second node 522. A first terminal of a third resistor R3510 is connected to the second node 522 and a second terminal of the third resistor R3510 is connected to the second transistor 504. In some examples, the first transistor Q1502 and the second transistor Q2504 are Bipolar Junction Transistors (BJTs). However, other types of transistors are also within the scope of the present disclosure.

A first input terminal of the third comparator 514 is connected to a first node 520 and a second input terminal of the third comparator 514 is connected to a second node 522. The output terminal of the third comparator 514 is connected to the fourth node 526. The first current mirror 516 is connected to the third node 524 and sinks a first matching current at the third node 526. The second current mirror 518 is connected to a first terminal of a fourth resistor R4512 and sinks a second matching current to the fourth resistor R4512. Each of the first current mirror 516 and the second current mirror is connected to the output terminal of the third comparator 514 at a fourth node 526. A second terminal of the fourth resistor R4512 is grounded.

In the example, the voltage of the first node 520 is denoted as v1 and the voltage of the second node 522 is denoted as v 2. The third comparator 514 compares v1 with v2 and adjusts the first and second matching currents sunk by the first and second current mirrors 516 and 518, respectively, based on the comparison. For example, the third comparator 514 adjusts the first and second matching currents sunk by the first and second current mirrors 516 and 518, respectively, such that v1 is approximately equal to v 2. In an example, the first matching current sunk by the first current mirror 516 is approximately equal to the second matching current sunk by the second current mirror 518.

In the example, the current flowing through the first resistor R1506 is denoted as I1, the current flowing through the second resistor R2508 is denoted as I2, and the current flowing through the fourth resistor R4512 is denoted as I3. In some examples, the resistance value of the first resistor R1506, denoted R1, is approximately equal to the resistance value of the second resistor R2508, denoted R2. Namely, R1 ═ R2. Additionally, since v1 is approximately equal to v2, I1 is approximately equal to I2. Thus, using the BJT equation:

wherein, V_TLinearly proportional to temperature, n is the ratio of the emitter areas of transistors Q1 and Q2. I3 is proportional to I2 applied to the gate of the second current mirror 518 by a factor of K. Because VT varies linearly with temperature, IPTAT (i.e., PTAT current) also varies linearly with temperature.

FIG. 6 is a block diagram illustrating a memory device 600 having a write voltage circuit 108 according to an example embodiment. As shown in fig. 6, the memory device 600 includes a voltage source selection circuit 302 and a voltage detection circuit 304 connected to the voltage source selection circuit 302. In addition, as shown in FIG. 6, memory device 600 further includes a reference voltage generator circuit 402 and a voltage regulator circuit 404 coupled to reference voltage generator circuit 402. The voltage source selection circuit 302 is connected to a voltage regulator circuit 404. Further, a voltage regulator circuit 404 is connected to the cell array 102.

The voltage detection circuit 304 detects an instantaneous power supply voltage (also referred to as VDIO) and supplies the detected instantaneous power supply voltage to the voltage source selection circuit 302. The voltage source selection circuit 302 selects a voltage source from the plurality of voltage sources 306 based on the detected instantaneous supply voltage. For example, voltage source selection circuit 302 includes a switch 310 that connects the selected voltage source to the selected bit line to provide the write voltage (i.e., V0). The reference voltage generator circuit 402 generates a temperature compensated reference voltage and provides the temperature compensated reference voltage to the voltage regulator circuit 404. The voltage regulator circuit 404 compares the temperature compensated reference voltage to the instantaneous bit line voltage (i.e., VBL) and regulates the instantaneous bit line voltage (i.e., VBL) based on the comparison. In example embodiments, multiple cell arrays of the memory device 600 may share the voltage source selection circuit 302, the voltage detection circuit 304, and the reference voltage generator circuit 402.

FIG. 7 is a block diagram illustrating placement of components in an example memory device 700, according to an example embodiment. As shown in fig. 7, the first cell array 102a is disposed in a first portion of the cell region. The first portion extends from a third edge 706 to an opposite fourth edge 708 of the cell region along the first edge 702. The second cell array 102b is disposed in a second portion of the cell region. The second portion extends from a third edge 706 to a fourth edge 708 of the cell region along the second edge 704. The second edge 704 is opposite the first edge 702.

The first voltage regulator circuit 404a is disposed in a third portion of the cell region. The third portion is adjacent to the first portion. The third portion extends along the first portion from the third edge 706 to the fourth edge 708. The second voltage regulator circuit 404b is placed in a fourth portion of the cell area. The fourth portion is adjacent to the second portion. The fourth portion extends along the second portion from the third edge 706 to the fourth edge 708. The LR-CP 314, the voltage control circuit 200, and the temperature compensation circuit 210 are placed in the fifth part of the cell region. The fifth portion is sandwiched between the third portion and the fourth portion and extends from edge 706 to fourth edge 708.

For example, the LR-CP 314 is placed in the first subsection of the fifth section. The voltage control circuit 200 is placed in a second subsection of the fifth section. The second sub-portion is beside or adjacent to the first sub-portion. The temperature compensation circuit 210 is placed in a third subsection of the fifth section. The third sub-portion is located next to or near the second sub-portion. The second sub-portion is sandwiched between the first sub-portion and the third sub-portion. Thus, the voltage control circuit 200 is placed next to or near the LR-CP 314. In addition, the temperature compensation circuit 210 is placed next to or near the voltage control circuit 200. However, other arrangements are within the scope of the present disclosure.

FIG. 8 is a flow diagram of a method 800 for providing a write voltage to a memory device, according to some embodiments. The method 800 may be performed, for example, by the write voltage circuit 108 discussed with reference to any of fig. 1A-7. In some embodiments, method 800 may be stored as instructions on a non-transitory computer-readable medium that are executable by a processor to perform method 800.

At block 810 of method 800, an instantaneous supply voltage is detected. For example, resistor ladder 316 of voltage detection circuit 304 detects the instantaneous supply voltage. A voltage signal representative of the instantaneous supply voltage is provided at reference node 334.

In block 820 of method 800, the instantaneous supply voltage is compared to a reference voltage. For example, the first comparator 318 of the voltage detection circuit compares the instantaneous supply voltage with a reference voltage. An instantaneous supply voltage is provided at a first input terminal 320 of the first comparator 318 and a reference voltage is provided at a second input terminal 322 of the first comparator 318.

In block 830 of method 800, a voltage source is selected from a plurality of voltage sources based on comparing the instantaneous supply voltage to a reference voltage. For example, the first comparator 318 provides an output signal having the comparison result at the output terminal 324. The output signal may, for example, indicate whether the instantaneous supply voltage is less than, equal to, or greater than a reference voltage. The output signal with the comparison result is provided to the switch 310 of the voltage source selection circuit 302. The switch 310 then selects one of the plurality of voltage sources 306 based on the comparison result. For example, when the instantaneous supply voltage is equal to or greater than the reference voltage, the switch 310 selects the first voltage source 306 a. In other examples, the switch 310 selects the second voltage source 306b when the instantaneous supply voltage is less than the reference voltage.

At block 840 of method 800, a selected voltage source is connected to a selected bit line of the cell array to provide a write voltage to the selected bit line. For example, the switch 310 of the voltage source selection circuit 302 connects the selected voltage source to the selected bit line of the cell array through the switch input terminal 310 and the switch input terminal 312 to provide the write voltage to the selected bit line.

In block 850 of method 800, a temperature-adjusted reference voltage is generated. For example, the reference voltage generator circuit 402 generates a temperature regulated reference voltage. In an example embodiment, the temperature adjustment reference voltage is generated using a first current source 406 (i.e., a PTAT current source) and a second current source 408 (i.e., a ZTC current source). A temperature regulated reference voltage is provided at an output terminal 414 of the reference voltage generator circuit 402.

At block 860 of method 800, the transient write voltage is detected. At block 870 of method 800, the instantaneous write voltage is compared to a temperature regulation reference voltage. In an example embodiment, the second comparator 416 of the voltage regulator circuit 404 compares the instantaneous write voltage to the temperature regulated reference voltage. A temperature regulated reference voltage is provided at a first input terminal 420 of the second comparator 416 and an instantaneous write voltage is provided at a second input terminal 422 of the second comparator 416.

At block 880 of method 800, the instantaneous write voltage is adjusted based on comparing the instantaneous write voltage to the temperature adjustment reference voltage. For example, the second comparator 416 provides an output signal having the comparison result at the output terminal 424. The output signal may indicate, for example, whether the instantaneous write voltage is less than, equal to, or greater than the temperature regulation reference voltage. The output signal with the comparison result is provided to the gate of the third current source 418. The third current source 418 then increases or decreases the source current Is sunk by the selected bit line. For example, when the instantaneous write voltage Is equal to or greater than the temperature adjustment reference voltage, the third current source 418 decreases the source current Is sunk by the selected bit line. In other examples, the third current source 418 increases the source current Is sunk by the selected bit line when the transient write voltage Is less than the temperature adjustment reference voltage.

Accordingly, a disclosed embodiment provides a memory device comprising: a plurality of cells arranged in a matrix comprising a plurality of rows and a plurality of columns; a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of cells of the plurality of cells arranged in a column of the plurality of columns; and a voltage control circuit connectable with a selected bit line of the plurality of bit lines, wherein the voltage control circuit includes: a voltage detection circuit, wherein the voltage detection circuit detects an instantaneous power supply voltage; and a voltage source selection circuit connected to the voltage detection circuit, wherein the voltage source selection circuit selects a voltage source from a plurality of voltage sources based on the detected instantaneous power supply voltage, and wherein the voltage source selection circuit includes a switch connecting the selected voltage source to the selected bit line to provide the write voltage.

In the above memory device, the voltage detection circuit includes: a resistor ladder connected to the supply voltage node and a comparator connected to the resistor ladder, wherein the resistor ladder detects an instantaneous supply voltage and wherein the comparator compares the detected instantaneous voltage with a reference voltage.

In the above memory device, the output terminal of the comparator is connected to the switch, and wherein the switch selects the voltage source from the plurality of voltage sources based on the output of the comparator.

In the above memory device, the switch selects a first voltage source of the plurality of voltage sources when the instantaneous supply voltage is less than the reference voltage, and wherein the switch selects a second voltage source of the plurality of voltage sources when the instantaneous supply voltage is greater than the reference voltage.

In the above memory device, the voltage control circuit further comprises a timer, wherein the timer tracks a time period and generates a comparator enable signal after the time period expires, wherein the comparator enable signal triggers the comparator to compare the detected instantaneous voltage with a reference voltage.

In the above memory device, the voltage control circuit further includes a latch circuit, wherein the latch circuit latches the comparison output of the comparator.

In the above memory device, the latch circuit is triggered by a clock signal, wherein the clock signal is generated by a timer.

In the above memory device, the voltage detection circuit is switched after the comparison output is latched.

In the above memory device, the resistor ladder comprises a first resistor and a second resistor, wherein a first terminal of the first resistor is connected to the first voltage source, wherein a second terminal of the first resistor is connected to the output node, wherein a first terminal of the second resistor is connected to the output node, wherein a second terminal of the second resistor is connected to ground, and wherein the output node provides the instantaneous supply voltage.

In the above memory device, the first input terminal of the comparator is connected to the output node, and wherein the second input terminal of the comparator is connected to the reference voltage node.

In the above memory device, a temperature compensation circuit connectable to the selected bit line is further included, wherein the temperature compensation circuit compensates the write voltage for a temperature change of the memory device.

According to other disclosed examples, a memory device includes: a cell array including a plurality of cells; a plurality of bit lines, wherein each of the plurality of bit lines is connected to a first plurality of cells of a plurality of cells arranged in a column of the cell array; a voltage control circuit connectable with a selected one of the plurality of bit lines, wherein the voltage control circuit provides a write voltage to the selected one of the plurality of bit lines for a write operation; and a temperature compensation circuit connectable with the selected bit line, wherein the temperature compensation circuit includes: a reference voltage generator circuit, wherein the reference voltage generator circuit generates a temperature regulated reference voltage, and a voltage regulator circuit connected to the reference voltage generator circuit, wherein the voltage regulator circuit compares the instantaneous write voltage to the temperature regulated reference voltage and regulates the instantaneous write voltage based on the comparison.

In the above memory device, the reference voltage generator circuit includes: a first current source; a second current source connected in parallel with the first current source at a reference node; and a variable resistor connected between a reference node and ground, wherein the reference node provides a temperature regulated reference voltage.

In the above memory device, the first current source is a Proportional To Absolute Temperature (PTAT) current source, and the second current source is a Zero Temperature Coefficient (ZTC) current source.

In the above memory device, the voltage regulator circuit comprises an amplifier and a third current source, wherein the amplifier comprises a first input terminal, a second input terminal, and an output terminal, wherein the first input terminal of the amplifier is connected to the reference voltage node, wherein the second input terminal of the amplifier is connected to the selected bit line, and wherein the output terminal of the amplifier is connected to the third current source.

In the above memory device, the amplifier adjusts the amount of current sunk to the selected bit line by the third current source based on comparing the instantaneous write voltage with the temperature adjustment reference voltage.

In the above memory device, further comprising a general buffer connected between the reference voltage generator and the voltage regulator circuit.

In the above memory device, the voltage regulator circuit includes a Low Dropout (LDO) circuit.

According to a further disclosed example, a method of providing a write voltage includes: detecting an instantaneous power supply voltage; comparing the instantaneous supply voltage to a reference voltage; selecting a voltage source from a plurality of voltage sources based on a comparison of the instantaneous supply voltage to a reference voltage; and connecting the selected voltage source to the selected bit line of the cell array to provide a write voltage to the selected bit line.

In the above method, further comprising: generating a temperature regulation reference voltage; detecting an instantaneous write voltage; comparing the instantaneous write voltage with a temperature regulation reference voltage; and adjusting the instantaneous write voltage based on comparing the instantaneous write voltage to the temperature adjustment reference voltage.

The foregoing outlines features of several embodiments so that those skilled in the art may better understand the aspects of the present disclosure. Those skilled in the art should appreciate that they may readily use the present disclosure as a basis for designing or modifying other processes and structures for carrying out the same purposes and/or achieving the same advantages of the embodiments introduced herein. Those skilled in the art should also realize that such equivalent constructions do not depart from the spirit and scope of the present disclosure, and that they may make various changes, substitutions, and alterations herein without departing from the spirit and scope of the present disclosure.