阅读说明：本技术 电极老化试验装置 (Electrode aging test device ) 是由 王蕾 黄珑鑫 韩明松 于 2019-12-19 设计创作，主要内容包括：本公开提供了一种电极老化试验装置,承载部具有焊盘阵列的主体部和与主体部连接且具有多个端口的连接部,焊盘阵列经由多根独立导线与多个端口对应连接；待测电极布置在承载部,待测电极包括具有基板和贯通基板的多个电极的接入端、具有多个刺激点的待测端、以及连接接入端的多个电极与待测端的多个刺激点的连接线缆,接入端与焊盘阵列对应连接,并且待测端的多个刺激点被隔绝层包覆；温控装置具有用于盛放液体的溶液腔,并且待测端浸没于液体,温控装置被配置为通过改变液体的温度来使待测端加速老化；以及测试仪器具有与液体连接的回路线路和与连接部连接的供电线路,并且测试仪器通过连接部向待测电极提供测试电压。(The utility model provides an electrode aging test device, a bearing part is provided with a main body part of a pad array and a connecting part which is connected with the main body part and is provided with a plurality of ports, and the pad array is correspondingly connected with the ports through a plurality of independent wires; the electrode to be tested is arranged on the bearing part and comprises an access end, a to-be-tested end and a connecting cable, wherein the access end is provided with a substrate and a plurality of electrodes penetrating through the substrate, the to-be-tested end is provided with a plurality of stimulation points, the connecting cable is used for connecting the electrodes of the access end and the stimulation points of the to-be-tested end, the access end is correspondingly connected with the pad array, and the stimulation points of the to-be-tested end are coated by the isolation layer; the temperature control device is provided with a solution cavity for containing liquid, the end to be tested is immersed in the liquid, and the temperature control device is configured to accelerate the aging of the end to be tested by changing the temperature of the liquid; and the test instrument is provided with a loop circuit connected with the liquid and a power supply circuit connected with the connecting part, and the test instrument provides test voltage for the electrode to be tested through the connecting part.)

1. An electrode aging test device is characterized in that,

the method comprises the following steps:

the bearing part comprises a main body part with a pad array and a connecting part which is connected with the main body part and is provided with a plurality of ports, wherein the pad array is correspondingly connected with the ports through a plurality of independent wires;

the electrode to be tested is arranged on the bearing part and comprises an access end, a terminal to be tested and a connecting cable, wherein the access end is provided with a substrate and a plurality of electrodes penetrating through the substrate, the terminal to be tested is provided with a plurality of stimulation points, the connecting cable is used for connecting the plurality of electrodes of the access end and the plurality of stimulation points of the terminal to be tested, the access end is correspondingly connected with the pad array, and the plurality of stimulation points of the terminal to be tested are covered by an isolation layer;

a temperature control device having a solution chamber for containing a liquid, and the end-to-be-measured being immersed in the liquid, the temperature control device being configured to accelerate aging of the end-to-be-measured by changing a temperature of the liquid; and

the test instrument is provided with a loop circuit connected with the liquid and a power supply circuit connected with the connecting part, the loop circuit, the liquid, the electrode to be tested, the plurality of independent wires, the connecting part and the power supply circuit form a loop, and the test instrument provides test voltage for the electrode to be tested through the connecting part.

2. The electrode burn-in test apparatus according to claim 1, wherein:

the electrode aging test device is characterized by further comprising an impedance test device connected with the connecting part, and the impedance test device detects the aging state of the electrode to be tested by detecting the impedance of the electrode to be tested.

3. The electrode burn-in test apparatus according to claim 1, wherein:

the electrode to be tested is arranged on the base plate, the temperature control device is arranged on the base plate, the cover plate is matched with the temperature control device and provided with an opening, and the end to be tested of the electrode to be tested penetrates through the opening to be in.

4. The electrode burn-in test apparatus according to claim 1, wherein:

the liquid is physiological saline.

5. The electrode burn-in test apparatus according to claim 1, wherein:

the connecting portion is elongated, and in the connecting portion, the plurality of ports are arranged side by side.

6. The electrode burn-in test apparatus according to claim 1, wherein:

the plurality of electrodes of the access end are welded on the bonding pad array of the connecting part in a gold wire ball bonding mode.

7. The electrode aging test apparatus according to claim 1 or 6, characterized in that:

the plurality of independent wires connect the plurality of ports of the connection portion and the pad array in a non-intersecting manner with each other.

8. The electrode burn-in test apparatus according to claim 2, wherein:

the aging state of the electrode to be tested is determined by an electrode aging model, which includes the appearance of the electrode to be tested and the impedance of the electrode to be tested.

9. The flexible electrode aging test apparatus of claim 8, wherein:

the appearance of the electrode to be detected at least comprises one of electrode discoloration, welding spot discoloration, polymer layering, electrode line crack or channel change.

10. The flexible electrode aging test device of claim 1, wherein:

the access end of the electrode to be detected is not contacted with the liquid.

Technical Field

The present disclosure relates to an electrode aging test apparatus.

Background

Currently, the artificial retina products can partially restore the vision of patients by replacing the function of photoreceptor cells of retinal damage caused by retinitis pigmentosa and age-related macular degeneration, such as stimulating retinal ganglion cells or bipolar cells by using stimulating electrodes to generate stimulating signals, and generating light sensation in the cerebral cortex by using other intact vision pathways. Because the life of the patients with the retinal diseases can be greatly improved by the artificial retina products, the artificial retina is increasingly regarded and developed as an implanted medical appliance in recent years.

The electrochemical impedance performance of the flexible electrode in the artificial retina, which is used as a main part for connecting the prosthesis and biological nerve tissue, directly influences the effectiveness, safety, stability and working strength of the prosthesis, wherein the impedance test is a difficult point for testing the performance of the electrode, and monitoring the impedance change in the aging process is more difficult to realize.

At present, the aging modes mostly adopted by the artificial retina as a medical active implant product comprise: the aging is accelerated by the long-term soaking of saline, and the aging is accelerated by the electrified saline of the finished welding electrode. However, the single temperature aging, the reliability is unstable, the performance change rule is not reliable, the pure flexible electrode is not easy to be electrified and aged, the connection mode is not easy to manufacture, and the change condition of the performance in the electrode aging is difficult to know.

Disclosure of Invention

The present disclosure has been made in view of the above-described state of the art, and an object thereof is to provide an electrode degradation test apparatus capable of performing brine immersion while supplying electricity and monitoring electrode impedance in real time.

Therefore, the present disclosure provides an electrode aging test device, which is characterized by comprising: the bearing part comprises a main body part with a pad array and a connecting part which is connected with the main body part and is provided with a plurality of ports, wherein the pad array is correspondingly connected with the ports through a plurality of independent wires; the electrode to be tested is arranged on the bearing part and comprises an access end, a terminal to be tested and a connecting cable, wherein the access end is provided with a substrate and a plurality of electrodes penetrating through the substrate, the terminal to be tested is provided with a plurality of stimulation points, the connecting cable is used for connecting the plurality of electrodes of the access end and the plurality of stimulation points of the terminal to be tested, the access end is correspondingly connected with the pad array, and the plurality of stimulation points of the terminal to be tested are covered by an isolation layer; a temperature control device having a solution chamber for containing a liquid, and the end-to-be-measured being immersed in the liquid, the temperature control device being configured to accelerate aging of the end-to-be-measured by changing a temperature of the liquid; and the testing instrument is provided with a loop circuit connected with the liquid and a power supply circuit connected with the connecting part, the loop circuit, the liquid, the electrode to be tested, the plurality of independent wires, the connecting part and the power supply circuit form a loop, and the testing instrument provides testing voltage for the electrode to be tested through the connecting part.

In this electrode aging testing device that this disclosure relates to, the incoming end that bears the weight of portion and await measuring electrode is connected through pad array, will be by the end that awaits measuring of insulating layer cladding submergence in the liquid that temperature control device held, and rethread test instrument gives the electrode power supply that awaits measuring to form the return circuit and produce the electric current, under this condition, the electrode that awaits measuring can carry out aging testing under the circumstances of circular telegram, from this, can improve aging testing's reliability.

In addition, the electrode degradation test apparatus according to the present disclosure may further include an impedance test apparatus connected to the connection unit, wherein the impedance test apparatus detects a degradation state of the electrode to be tested by detecting an impedance of the electrode to be tested. Therefore, the impedance of the electrode to be measured can be measured at any time, and the aging state of the electrode to be measured can be known.

In addition, in the electrode aging test device according to the present disclosure, optionally, the device further includes a cover plate having an opening matched with the temperature control device, and the end to be tested of the electrode to be tested passes through the opening to contact the liquid. Therefore, the heat preservation effect of the temperature control device can be improved.

In addition, in the electrode aging test apparatus according to the present disclosure, optionally, the liquid is normal saline. This makes it possible to simulate the environment inside the human body.

In the electrode degradation test apparatus according to the present disclosure, the connection portion may be elongated, and the plurality of ports may be arranged side by side in the connection portion. Therefore, the test instrument can be conveniently connected with a plurality of ports.

In the electrode burn-in test apparatus according to the present disclosure, the plurality of electrodes of the inlet may be bonded to the pad array of the connection portion by gold wire ball bonding. Therefore, the welding point of the access end can be accurately welded to the pad array.

In the electrode degradation test apparatus according to the present disclosure, the plurality of independent wires may connect the plurality of ports of the connection portion and the pad array so as not to intersect with each other. In this way, the plurality of electrodes of the access terminal can be connected to the corresponding ports, respectively.

In addition, in the electrode aging test apparatus according to the present disclosure, optionally, the aging state of the electrode to be tested is determined by an electrode aging model, and the electrode aging model includes an appearance of the electrode to be tested and an impedance of the electrode to be tested. In this case, the aging state of the electrode to be measured can be judged by the aging model, and thus the aging degree of the electrode to be measured can be judged by the appearance of the electrode to be measured and the impedance of the electrode to be measured.

In addition, in the electrode aging test device according to the present disclosure, optionally, the appearance of the electrode to be tested at least includes one of electrode discoloration, solder joint discoloration, polymer delamination, electrode line crack or channel change. Therefore, the aging degree of the electrode to be measured can be judged through the appearance of the electrode to be measured.

In addition, in the electrode aging test device according to the present disclosure, optionally, the access end of the electrode to be tested is not in contact with the liquid. This can reduce the possibility of occurrence of short circuits.

According to the present disclosure, an electrode aging test device capable of performing brine soaking while electrifying and monitoring electrode impedance in real time can be provided.

Drawings

Embodiments of the present disclosure will now be explained in further detail, by way of example only, with reference to the accompanying drawings, in which:

fig. 1 is a schematic view showing a state of use of an electrode degradation test apparatus according to an embodiment of the present disclosure.

Fig. 2 is a schematic view showing a structure of a carrier section of the electrode degradation test apparatus according to the embodiment of the present disclosure.

Fig. 3 is a schematic diagram illustrating a structure of an electrode to be tested of the electrode aging test apparatus according to the embodiment of the present disclosure.

Fig. 4 is a schematic view showing a state in which an electrode to be tested and a carrier part of the electrode aging test apparatus according to the embodiment of the present disclosure are connected.

Fig. 5 is a schematic view showing the structure of a temperature control device of the electrode aging test device according to the embodiment of the present disclosure.

Fig. 6 is a cross-sectional view schematically showing a use state of the electrode degradation test apparatus according to the embodiment of the present disclosure.

Fig. 7 is a schematic view showing a test apparatus structure of an electrode degradation test apparatus according to an embodiment of the present disclosure.

The reference numbers illustrate:

1 … electrode aging test device, 10 … bearing part, 11 … main part, 12 … connecting part, 121 … port, 13 … pad array, 14 … independent lead, 20 … electrode to be tested, 21 … access end, 211 … electrode, 22 … end to be tested, 221 … stimulation point, 23 … connecting cable, 24 … isolation layer, 30 … temperature control device, 31 … solution cavity, 32 … cover plate, 40 … test instrument, 41 … power supply line, 42 … loop line and 43 … row plug.

Detailed Description

The present disclosure will be described in further detail below with reference to the accompanying drawings and specific embodiments. In the drawings, the same components or components having the same functions are denoted by the same reference numerals, and redundant description thereof will be omitted.

Fig. 1 is a schematic view showing a state of use of an electrode degradation test apparatus 1 according to an embodiment of the present disclosure.

As shown in fig. 1, the electrode aging test apparatus 1 according to the present disclosure may include a carrier 10, an electrode 20 to be tested, a temperature control device 30, and a test device 40. The carrier part 10 may include a main body part 11 having a pad array 13 and a connection part 12 connected to the main body part 11, wherein the pad array 13 is correspondingly connected to the connection part 12 via a plurality of independent wires 14. The electrode to be measured 20 may include an access terminal 21 having a substrate and a plurality of electrodes 211 penetrating the substrate, a terminal to be measured 22 having a plurality of stimulation points 221, and a connection cable 23 connecting the plurality of electrodes 211 of the access terminal 21 and the plurality of stimulation points 221 of the terminal to be measured 22, the access terminal 21 is correspondingly connected to the pad array 13, and the plurality of stimulation points 221 of the terminal to be measured 22 are covered by the insulating layer 24. The temperature control device 30 may have a solution chamber 31 for containing a liquid, and be configured to accelerate the aging of the end-to-be-measured 22 by changing the temperature of the liquid. The test instrument 40 may have a circuit line 42 connected to the liquid and a power supply line 41 connected to the connection portion 12, the circuit line 42, the liquid, the electrode 20 to be tested, the plurality of individual wires 14, the connection portion 12, and the power supply line 41 forming a circuit, and the test instrument 40 supplying the test voltage to the electrode 20 to be tested through the connection portion 12.

In the electrode aging test device 1 according to the present disclosure, the carrier part 10 is connected to the connection end 21 of the electrode 20 to be tested through the pad array 13, the end 22 to be tested covered by the insulating layer 24 is immersed in the liquid contained in the temperature control device 30, and then the test instrument 40 supplies power to the electrode 20 to be tested, and a loop is formed to generate current, in this case, the electrode 20 to be tested can perform the aging test under the power-on condition, and thus, the reliability of the aging test can be improved.

Fig. 2 is a schematic structural view showing the carrier section 10 of the electrode degradation test apparatus 1 according to the embodiment of the present disclosure.

As shown in fig. 2, in the present embodiment, the carrier part 10 may include a main body part 11 having a pad array 13. In some examples, the body portion 11 may have a rectangular parallelepiped shape. Specifically, the body portion 11 may be a PCB board. This allows a desired wiring pattern to be printed on the main body 11 as needed. In addition, in some examples, the PCB board may have a multi-layer structure. Thus, the area of the PCB board can be reduced as much as possible. In other examples, both the front and back sides of the PCB board may have a circuit pattern.

In some examples, the pad array 13 may be a rectangular array. This enables matching with the inlet 21 of the electrode 20 to be measured. In other examples, the pad arrays 13 may be disposed on both sides of the PCB. This enables the welding of the inlet 21 of the electrode 20 to be measured by selecting one or more surfaces.

In addition, in some examples, the pad array 13 may be disposed on a side of the PCB board away from the connection part 12. This facilitates connection of the electrode 20 to be measured. In other examples, the pad array 13 may be disposed in the middle of a side of the PCB board away from the connection part 12. This allows a sufficient wiring space for the plurality of individual wires 14 connecting the pad array 13 and the plurality of ports 121.

In the present embodiment, the carrier part 10 may include a connection part 12 connected to the body part 11 and having a plurality of ports 121. In some examples, the connection portion 12 is elongated, and in the connection portion 12, the plurality of ports 121 are arranged side by side. Thereby, connection of the test instrument 40 to the plurality of ports 121 can be facilitated. In other examples, the connector 12 may have 60 ports 121 arranged side by side in two rows of 30 ports 121 each. In some examples, the port 121 may be a metal sheet having electrical conductivity. In other examples, port 121 may be a receptacle having electrical conductivity. In this case, the plurality of ports 121 may form a current in the circuit by connecting a test instrument 40 (described later).

In some examples, the pad array 13 may have the same number of pads as the ports 121 of the connection portion 12. This can improve the utilization rate of the port 121. In other examples, the pad array 13 may have the same number of pads as the plurality of electrodes 211 of the access terminal 21 of the electrode 20 to be tested. In some examples, the pad array 13 may have the same shape as the arrangement of the plurality of electrodes 211 of the access terminal 21 of the electrode 20 to be tested. This enables the electrode 20 to be better matched.

In some examples, the pads in the pad array 13 are exposed to the PCB board surface. This enables easy welding with the electrode 20 to be measured.

In the present embodiment, the pad array 13 may be connected to the plurality of ports 121 via the plurality of individual wires 14. In some examples, the plurality of individual wires 14 may be circuitry disposed in a PCB board. In this case, the individual wires 14 may be disposed inside the PCB board, whereby the ports 121 and the pads can be stably connected.

In some examples, the plurality of individual wires 14 may connect the plurality of ports 121 of the connection portion 12 and the pad array 13 in a non-crossing manner with each other. Specifically, the plurality of individual wires 14 may be connected to the plurality of ports 121 by the pad array 13 in a radial manner. Thereby, the plurality of electrodes 211 of the inlet 21 can be connected to the corresponding ports 121. In other examples, the plurality of independent wires 14 may connect the plurality of ports 121 of the connection portion 12 and the pad array 13 in a staggered manner.

Fig. 3 is a schematic diagram showing the structure of the electrode 20 to be tested of the electrode aging test apparatus 1 according to the embodiment of the present disclosure. Fig. 4 is a schematic view showing a state in which the electrode 20 to be tested and the carrier part 10 are connected in the electrode aging test apparatus 1 according to the embodiment of the present disclosure.

As shown in fig. 3 and 4, in the present embodiment, the electrode 20 to be measured may be disposed on the carrier part 10. In some examples, the electrode 20 to be tested may be disposed on the carrier 10 by bonding, clipping, coupling, welding, or the like. In some examples, the plurality of electrodes 211 of the access terminal 21 may be gold wire ball bonded to the pad array 13 of the connection portion 12. Thereby, the solder of the inlet 21 can be accurately spot-welded to the pad array 13. In some examples, a layer of glue may be applied after the access end 21 is soldered to the pad array 13. This enables the inlet 21 to be further fixed to the body 11.

In some examples, the electrode 20 to be tested may be a multilayer structure. Specifically, the electrode 20 to be tested may include a plurality of metal line layers for routing and a plurality of insulating layers for insulation, and the insulating layers and the metal line layers may be alternately stacked. In this case, the electrode 20 to be measured may arrange a plurality of conductive lines in a small area. In other examples, the insulating layer may be made of an insulating material, such as polyimide or the like. In other examples, the uppermost layer and the lowermost layer of the electrode 20 to be measured may be insulating layers.

In the present embodiment, the electrode to be measured 20 may include an access terminal 21 having a substrate and a plurality of electrodes 211 penetrating the substrate, and the access terminal 21 is connected to the pad array 13. In some examples, the plurality of electrodes 211 of the access end 21 may be non-through substrate. In other examples, the plurality of electrodes 211 of the access end 21 are at least partially embedded in the substrate. In this case, the inlet 21 may be soldered to the pad array 13 of the main body 11 through the surface in which the plurality of electrodes 211 are embedded, whereby the plurality of electrodes 211 can be connected to the pad array 13.

In some examples, the electrodes 20 to be measured may be disposed on both front and back sides of the main body portion 11. Thereby, one carrier section 10 can simultaneously measure two electrodes to be measured 20.

In the present embodiment, the electrode to be measured 20 may have the end to be measured 22 with a plurality of stimulation points 221. In some examples, the end under test 22 may have the same size as the access end 21. In other examples, the end-to-be-tested 22 is slightly smaller than the access end 21. Thereby, the incoming end 21 and the end to be measured 22 can be distinguished conveniently. In some examples, the stimulation points 221 on the end-to-be-measured 22 may be arranged in a through manner. In other examples, the stimulation points 221 on the end-to-be-measured 22 may be disposed in an embedded manner. In some examples, the plurality of stimulation points 221 on the end-to-be-measured 22 may have the same number as the plurality of electrodes 211 of the access end 21. This enables energization to each of the plurality of electrodes 211.

In the present embodiment, the electrode to be measured 20 may have a connection cable 23 connecting the plurality of electrodes 211 of the access terminal 21 and the plurality of stimulation points 221 of the end to be measured 22. In some examples, the connection cable 23 may include a plurality of wires. Thus, each stimulation point 221 can have an independent line to connect with the plurality of electrodes 211 on the access end 21. In other examples, the connection cable 23 may be a single wire. Thus, the entire test terminal 22 can be supplied with power by applying power to any of the plurality of electrodes 211.

In the present embodiment, the plurality of stimulation points 221 of the dut 22 may be covered by the isolation layer 24. This can improve the stability of the end-to-be-measured 22. In some examples, the insulating layer 24 may be silicone. Therefore, the temperature and the humidity can not be isolated while the insulation effect is obtained, and the aging test of the electrode 20 to be tested is favorably realized. In some examples, the insulating layer 24 can be coated on the outer periphery of the end 22 by injection molding, coating, spin coating, spray coating, or the like. In some examples, the insulating layer 24 may cover a portion of the connection cable 23 and the end 22 to be tested. In other examples, the insulating layer 24 may cover all of the cable to be tested and the end 22 to be tested. This can improve the stability of the end-to-be-measured 22.

Fig. 5 is a schematic structural view showing the temperature control device 30 of the electrode degradation test apparatus 1 according to the embodiment of the present disclosure. Fig. 6 is a cross-sectional view schematically showing a use state of the electrode degradation test apparatus 1 according to the embodiment of the present disclosure.

As shown in fig. 5 and 6, in the present embodiment, the temperature control device 30 may have a solution chamber 31 for containing a liquid. In some examples, the liquid may be normal saline. Specifically, the physiological saline may be a 0.85 to 0.9% sodium chloride solution, for example, a 0.9% sodium chloride solution. This makes it possible to simulate the environment inside the human body. In some examples, the solution chamber 31 may be a cuboid, cylinder, prism, or other irregular shape. In some examples, the solution chamber 31 has an opening facing upward. Thereby, pouring of the solution or immersion into the electrode 20 to be measured can be facilitated. In some examples, the solution chamber 31 may be composed of transparent glass. In other examples, the solution chamber 31 may be comprised of an incubator. Therefore, the temperature control effect can be improved, and the reliability of the aging test can be improved.

In this embodiment, the end-to-be-measured 22 may be immersed in a liquid. In some examples, access end 21 of electrode 20 to be tested is not in contact with the liquid. This can reduce the possibility of occurrence of short circuits.

In the present embodiment, the temperature control device 30 may be configured to accelerate the aging of the terminal under test 22 by changing the temperature of the liquid. In some examples, the temperature control device 30 may have a thermometer. Therefore, the temperature of the liquid can be accurately controlled. In other examples, the temperature control device 30 may have a water level gauge. Specifically, the water level gauge may be, for example, a float type water level gauge, a fiber optic water level gauge, a tracking type water level gauge, a pressure type water level gauge, or a sound wave type water level gauge. This allows the water level inside the solution chamber 31 to be observed by the water level gauge.

In some examples, the electrode burn-in apparatus 1 may have a cover plate 32 that mates with the temperature control device 30 and has an opening through which the end 22 of the electrode 20 to be tested is exposed to the liquid. This can improve the heat-insulating effect of the temperature control device 30. In some examples, the cover plate 32 may have a recess for embedding the carrier 10. In particular, the groove may have a width and length slightly larger than the carrier 10. Furthermore, the recess may have a through hole for passing the electrode 20 to be measured. In some examples, the through-hole may have an inner diameter greater than the groove width. In this case, the carrier 10 may be fixed to the surface of the cover plate 32 through the groove, and the end 22 to be tested of the electrode 20 to be tested is immersed in the liquid in the solution chamber 31 through the through hole, whereby the test can be conveniently placed and stably performed. Additionally, in some examples, the cover plate 32 surface may have a plurality of grooves. Wherein, each groove can be arranged along the same direction or randomly. In other examples, the cover plate 32 may also have an opening for passing through the return line 42. Additionally, in some examples, the cover plate 32 may also have a handle to facilitate lifting.

Fig. 7 is a schematic diagram showing a test apparatus structure of the electrode degradation test apparatus 1 according to the embodiment of the present disclosure.

As shown in fig. 7, in the present embodiment, the test instrument 40 may have a circuit line 42 connected to the liquid and a power supply line 41 connected to the connection portion 12. In some examples, the circuit line 42 may include a metal rod for insertion into the liquid. In some examples, the test instrument 40 may be a power supply. In some examples, the power supply line 41 may have a parallel patch 43. Thereby, the extension socket 43 can be simultaneously connected to the plurality of mounting units 10, and the power supply wire 41 can simultaneously supply power to the plurality of mounting units 10.

In the present embodiment, the circuit line 42, the liquid, the electrode to be tested 20, the plurality of individual wires 14, the connection section 12, and the power supply line 41 form a circuit, and the test instrument 40 supplies a test voltage to the electrode to be tested 20 through the connection section 12. In this case, a current can be generated in the circuit, and thus the electrode 20 to be measured can be subjected to the burn-in test while being energized, and the reliability of the burn-in test can be improved.

In some examples, the electrode degradation test apparatus 1 may include an impedance test apparatus (not shown) connected to the connection part 12, the impedance test apparatus detecting a degradation state of the electrode 20 to be tested by detecting an impedance of the electrode 20 to be tested. This makes it possible to measure the impedance of the electrode 20 at any time and to know the state of aging of the electrode 20.

In some examples, the aging state of the electrode 20 under test is determined by an electrode aging model that includes the appearance of the electrode 20 under test and the impedance of the electrode 20 under test. In this case, the aging state of the electrode 20 to be measured can be determined by the aging model, and thus the degree of aging of the electrode 20 to be measured can be determined by the appearance of the electrode 20 to be measured and the impedance of the electrode 20 to be measured.

In some examples, the appearance of the electrode 20 under test includes at least one of electrode discoloration, solder joint discoloration, polymer delamination, electrode line cracking, or channel change. The polymer delamination means that the multilayer structure of the electrode 20 to be measured is delaminated, that is, the insulating layer and the metal circuit layer are delaminated. This allows the degree of degradation of the electrode 20 to be determined from the appearance of the electrode 20.

Specific embodiments to which the disclosure relates are further described below.

First, a predetermined carrier 10 is prepared, and the carrier 10 has a flat rectangular shape with a certain thickness. The connection portion 12 is provided along one long side, and the pad array 13 is provided at the middle of the other long side.

Subsequently, the access terminal 21 of the electrode 20 to be tested is soldered on the pad array 13 by gold wire ball bonding, and glue is applied to the access terminal 21 to further fix the access terminal 21. Secondly, injecting silica gel on the end 22 to be tested of the electrode 20 to be tested and the connecting cable 23 close to one side of the end 22 to be tested, so that the end 22 to be tested can be completely coated by the silica gel.

Then, the bearing part 10 with the electrode 20 to be measured is disposed on the cover plate 32 of the temperature control device 30, and the physiological saline is contained in the temperature control device 30, at this time, the end 22 to be measured of the electrode 20 to be measured is immersed in the physiological saline of the temperature control device 30 through the through hole on the cover plate 32, and the bearing part 10 is engaged with the groove on the cover plate 32.

Finally, the power feeding line 41 is connected to the connection portion 12 of the carrier portion 10, and the circuit line 42 is brought into contact with the liquid in the solution chamber 31 and formed as a circuit. Under the condition of keeping the temperature constant, the impedance of the electrode 20 to be tested is observed and recorded by the impedance testing device within a period of time, the appearance of the electrode is observed, and the aging state of the electrode 20 to be tested is judged by combining an aging model.

While the present disclosure has been described in detail in connection with the drawings and examples, it should be understood that the above description is not intended to limit the disclosure in any way. Those skilled in the art can make modifications and variations to the present disclosure as needed without departing from the true spirit and scope of the disclosure, which fall within the scope of the disclosure.