阅读说明：本技术 一种用于铝阳极氧化膜层致密度快速检测的方法 (Method for rapidly detecting density of aluminum anodic oxide film layer ) 是由 杨文光 夏炎 孙克原 王孝刚 靳予 陈中顺 刘向阳 张敏华 陈佩民 于 2020-11-27 设计创作，主要内容包括：本发明公开了一种用于铝阳极氧化膜层致密度快速检测的方法,包括：步骤1：将待测试产品放置于导电托架上,导电托架连接地线；步骤2：调整电火花检漏仪的灵敏度,将电火花检漏仪接触导电托架；步骤3：采用电刷在待测试产品的膜层表面往复运动,同时,由小到大依次增加电刷的电压；步骤4：当电火花检漏仪的二极管发出亮光,且电火花检漏仪发出连续响声,即可判定此时的电压值为膜层的击穿电压,所述击穿电压用于表征膜层致密度。本发明使用电火花检漏仪,采用电刷形式对膜层致密性进行检测；对产品损伤很小或基本无损伤；检测精度高,数据可直接显示,评价较为精确；可以迅速检测大面积的氧化膜。(The invention discloses a method for rapidly detecting the density of an aluminum anodic oxide film layer, which comprises the following steps: step 1: placing a product to be tested on a conductive bracket, wherein the conductive bracket is connected with a ground wire; step 2: adjusting the sensitivity of the electric spark leak detector, and contacting the electric spark leak detector with the conductive bracket; and step 3: adopting an electric brush to reciprocate on the surface of a film layer of a product to be tested, and simultaneously increasing the voltage of the electric brush from small to large; and 4, step 4: when a diode of the electric spark leak detector emits bright light and the electric spark leak detector emits continuous sound, the voltage value at the moment can be judged to be the breakdown voltage of the film, and the breakdown voltage is used for representing the density of the film. The invention uses an electric spark leak detector and adopts an electric brush form to detect the compactness of a film layer; little or no damage to the product; the detection precision is high, data can be directly displayed, and evaluation is accurate; the large-area oxide film can be detected quickly.)

1. A method for rapidly detecting the density of an aluminum anodic oxide film layer is characterized by comprising the following steps:

step 1: placing a product to be tested on a conductive bracket, wherein the conductive bracket is connected with a ground wire;

step 2: adjusting the sensitivity of the electric spark leak detector, and contacting the electric spark leak detector with the conductive bracket;

and step 3: adopting an electric brush to reciprocate on the surface of a film layer of a product to be tested, and simultaneously increasing the voltage of the electric brush from small to large;

and 4, step 4: when a diode of the electric spark leak detector emits bright light and the electric spark leak detector emits continuous sound, the voltage value at the moment can be judged to be the breakdown voltage of the film, and the breakdown voltage is used for representing the density of the film.

2. The method for rapidly detecting the density of the aluminum anodic oxide film layer according to claim 1, wherein the step 2 specifically comprises:

the sensitivity of the spark leak detector is adjusted so that when the voltage on the conductive bracket is 200V, the spark leak detector can make a sound when contacting the conductive bracket.

3. The method for rapidly detecting the density of the aluminum anodic oxide film layer according to claim 2, wherein the voltage increase in the step 3 is 100V each time.

4. The method for rapidly detecting the density of the aluminum anodic oxide film layer according to claim 3, wherein the contact angle between the electric brush in the step 3 and the film layer of the product to be tested is 30-60 degrees, and the metal wire of the electric brush cannot contact the conductive bracket.

5. The method for rapidly detecting the density of the aluminum anodic oxide film layer according to claim 4, further comprising the following steps:

and after the test is finished, adjusting the voltage to 0V, closing the power supply of the electric brush, and taking down the product.

6. The method for rapidly detecting the density of the aluminum anodic oxide film layer according to claim 1, wherein the electric spark leak detector is a PCWI DC30 model.

Technical Field

The invention belongs to the technical field of density detection, and particularly relates to a method for rapidly detecting the density of an aluminum anodic oxide film layer.

Background

At the present stage, fingerprint tests, dyeing spot tests after acid treatment, phosphorus and chromic acid tests, admittance tests and the like are used for detecting the density and the sealing quality of the anodic oxide film, and although the testing processes of the first three methods are simple, the gradient difference of evaluation is large, and no direct data display exists. The tooling of the admittance test is complex, the film quality of the positions between the test points is evaluated during detection, and the evaluation of the large-area oxide film is difficult to quickly characterize.

Disclosure of Invention

The technical problem to be solved by the invention is to provide a method for rapidly detecting the density of an aluminum anodic oxide film layer aiming at the defects of the prior art, wherein the method for rapidly detecting the density of the aluminum anodic oxide film layer uses an electric spark leak detector and adopts an electric brush form to detect the density of the film layer; little or no damage to the product; the detection precision is high, data can be directly displayed, and evaluation is accurate; the large-area oxide film can be detected quickly.

In order to achieve the technical purpose, the technical scheme adopted by the invention is as follows:

a method for rapidly detecting the density of an aluminum anodic oxide film layer comprises the following steps:

step 1: placing a product to be tested on a conductive bracket, wherein the conductive bracket is connected with a ground wire;

step 2: adjusting the sensitivity of the electric spark leak detector, and contacting the electric spark leak detector with the conductive bracket;

and step 3: adopting an electric brush to reciprocate on the surface of a film layer of a product to be tested, and simultaneously increasing the voltage of the electric brush from small to large;

and 4, step 4: when a diode of the electric spark leak detector emits bright light and the electric spark leak detector emits continuous sound, the voltage value at the moment can be judged to be the breakdown voltage of the film, and the breakdown voltage is used for representing the density of the film.

As a further improved technical solution of the present invention, the step 2 specifically comprises:

the sensitivity of the spark leak detector is adjusted so that when the voltage on the conductive bracket is 200V, the spark leak detector can make a sound when contacting the conductive bracket.

As the further improved technical scheme of the invention, the voltage increase amplitude in the step 3 is 100V each time;

as a further improved technical scheme of the invention, a contact angle between the electric brush in the step 3 and a film layer of a product to be tested is 30-60 degrees, and a metal wire of the electric brush cannot contact the conductive bracket.

As a further improved technical scheme of the invention, the method also comprises the following steps:

and after the test is finished, adjusting the voltage to 0V, closing the power supply of the electric brush, and taking down the product.

As a further improved technical scheme of the invention, the electric spark leak detector adopts a model of PCWI DC 30.

The invention has the beneficial effects that: the invention uses an electric spark leak detector and adopts an electric brush form to detect the compactness of a film layer; the compactness is represented by the breakdown voltage of the film layer, and compared with methods such as dyeing, corrosion and the like, the method has the advantages that the damage to the product is small or basically not damaged, the detection precision is high, the data can be directly displayed, and the evaluation is relatively accurate; the detection is rapid, and a large-area oxide film can be detected; the detection can be directly carried out on the oxidation part with a complex shape; the manufacturing of the tool is avoided; the detection of the compactness of the film before and after hole sealing and before and after aging can be conveniently compared and detected.

Detailed Description

The following further illustrates embodiments of the invention:

example 1 hard anodization with sulfuric acid system:

the thickness of the aluminum anodic oxide film layer is 25 micrometers, the special-shaped product is measured, and the method for rapidly detecting the density of the aluminum anodic oxide film layer comprises the following steps:

step 1: placing a product to be tested on a conductive bracket, wherein the conductive bracket is connected with a ground wire;

step 2: adjusting the sensitivity of the electric spark leak detector to make the electric spark leak detector sound after contacting the conductive bracket when the voltage on the conductive bracket is 200V;

and step 3: adopting an electric brush to reciprocate on a planar part of a product to be tested, namely an aluminum anodic oxide film layer, and simultaneously increasing the voltage of the electric brush from small to large in sequence, wherein the voltage increase amplitude is 100V each time; the contact angle between the electric brush and the film layer is 30-60 degrees, and a metal wire of the electric brush cannot contact the conductive bracket;

and 4, step 4: when the diode of the electric spark leak detector emits bright light and the electric spark leak detector emits continuous sound, the voltage value of the electric brush at the moment can be judged to be the breakdown voltage of the film layer, and the breakdown voltage of the plane part of the film layer is measured to be 900V.

And 5: and after the test is finished, adjusting the voltage to 0V, closing the power supply of the electric brush, and taking down the product.

The spark leak detector of this embodiment was a model PCWI DC 30.

Similarly, the breakdown voltage of the vertical part of the film layer is 600V, the film speed of the vertical part of the edge is low theoretically, the compactness of the film layer is poor, and the breakdown voltage of the vertical part of the film layer measured by the testing method is obviously smaller than the breakdown voltage of the plane part of the film layer, so that the film layer conforms to the theory, the breakdown voltage of the film layer can be used for accurately representing the compactness, and the damage to the product is small or basically zero; the detection precision is high, data can be directly displayed, and evaluation is accurate; the large-area oxide film can be detected quickly.

Example 2 hard anodization with oxalic acid system:

the thickness of the aluminum anodic oxide film layer is 25 microns, and the method for rapidly detecting the density of the aluminum anodic oxide film layer comprises the following steps:

step 1: placing a product to be tested on a conductive bracket, wherein the conductive bracket is connected with a ground wire;

step 2: adjusting the sensitivity of the electric spark leak detector to make the electric spark leak detector sound after contacting the conductive bracket when the voltage on the conductive bracket is 200V;

and step 3: adopting an electric brush to reciprocate on a planar part of a product to be tested, namely an aluminum anodic oxide film layer, and simultaneously increasing the voltage of the electric brush from small to large in sequence, wherein the voltage increase amplitude is 100V each time; the contact angle between the electric brush and the film layer is 30-60 degrees, and a metal wire of the electric brush cannot contact the conductive bracket;

and 4, step 4: when the diode of the electric spark leak detector emits bright light and the electric spark leak detector emits continuous sound, the voltage value at the moment can be judged to be the breakdown voltage of the film layer, and the breakdown voltage of the plane part of the film layer is measured to be 1400V (generally, the oxide film layer oxidized by the oxalic acid system is more compact).

And 5: and after the test is finished, adjusting the voltage to 0V, closing the power supply of the electric brush, and taking down the product.

The spark leak detector of this embodiment was a model PCWI DC 30.

In the method, the breakdown voltage of the oxide film layer oxidized by the oxalic acid system is 1400V which is far higher than the breakdown voltage of the oxide film layer oxidized by the sulfuric acid system in the example 1, namely 900V, so that the oxide film layer oxidized by the oxalic acid system is more compact and is consistent with the actual situation.

Example 3 hard anodization with sulfuric acid system:

the thickness of the aluminum anodic oxide film layer is 50 microns, and before sealing by the sealant, the breakdown voltage of the film layer is 1100V measured according to the test method of the embodiment 1 or the embodiment 2; the film is not completely sealed by hot water, and the breakdown voltage of the film is 1200V; after the sealing by using the medium-temperature sealing agent, the breakdown voltage of the film layer is 1400V, the film layer is placed at room temperature for 48h, the hole is continuously reduced, and the breakdown voltage of the film layer is 1500V.

Example 4 hard anodization with sulfuric acid system:

the oxidation temperature was 5 ℃ and the thickness of the aluminum anodized film layer was 50 μm, and the breakdown voltage of the film layer was 900V as measured by the test method of example 1 or example 2.

The oxidation temperature was-5 c and the thickness of the aluminum anodized film layer was 50 μm, and the breakdown voltage of the film layer was 1200V as measured by the test method of example 1 or example 2 (other test methods also confirmed that the oxide film layer was denser at low temperatures).

In the embodiment, the compactness is represented by the breakdown voltage of the film layer, and compared with methods such as dyeing, corrosion and the like, the method has little or basically no damage to the product; the detection precision is high, data can be directly displayed, the evaluation is accurate, and a PCWI DC30 model electric spark leak detector is preferred; the detection is rapid, and a large-area oxide film can be detected; the detection can be directly carried out on the oxidation part with a complex shape; the manufacturing of the tool is avoided; the detection of the compactness of the film before and after hole sealing and before and after aging can be conveniently compared and detected.

The scope of the present invention includes, but is not limited to, the above embodiments, and the present invention is defined by the appended claims, and any alterations, modifications, and improvements that may occur to those skilled in the art are all within the scope of the present invention.