阅读说明：本技术 用于在开放式空中环境中并行测量被测设备的系统和方法 (System and method for parallel measurement of devices under test in an open air environment ) 是由 科比特·罗威尔 伯诺伊特·德拉特 谢里夫·艾哈迈德 于 2019-11-25 设计创作，主要内容包括：本发明提供了一种用于在开放式空中环境中并行测量被测设备的系统和方法。该系统(10)包括多个对准结构(1,2),每个对准结构(1,2)包括布置在对准结构(1,2)的顶端的成形的反射器(5,6)和布置在成形的反射器(5,6)的聚焦区域处的天线(7,8)。在这种情况下,被测设备(3,4)布置在所述多个对准结构(1,2)的底端并且与对应的成形的反射器(5,6)相对。另外,所述多个对准结构(1,2)彼此平行放置而无需屏蔽的壳体。(The present invention provides a system and method for parallel measurement of devices under test in an open air environment. The system (10) comprises a plurality of alignment structures (1, 2), each alignment structure (1, 2) comprising a shaped reflector (5, 6) arranged at a tip of the alignment structure (1, 2) and an antenna (7, 8) arranged at a focal region of the shaped reflector (5, 6). In this case, the device under test (3, 4) is arranged at the bottom end of the plurality of alignment structures (1, 2) and opposite the corresponding shaped reflectors (5, 6). In addition, the plurality of alignment structures (1, 2) are placed parallel to each other without a shielded housing.)

1. A system (10) for parallel measurement of devices under test (3, 4) in an open air environment, the system (10) comprising a plurality of alignment structures (1, 2), each alignment structure (1, 2) comprising:

a shaped reflector (5, 6), said shaped reflector (5, 6) being arranged at the tip of said alignment structure (1, 2), and

an antenna (7, 8), the antenna (7, 8) being arranged at a focal region of the shaped reflector (5, 6);

wherein the device under test (3, 4) is arranged at the bottom end of the plurality of alignment structures (1, 2) and opposite to the corresponding shaped reflectors (5, 6), and

wherein the plurality of alignment structures (1, 2) are placed parallel to each other without a shielded housing.

2. The system of claim 1, wherein the first and second sensors are disposed in a common housing,

wherein the system (10) further comprises a measurement unit (9), the measurement unit (9) preferably being connected to the antenna (7, 8) of each alignment structure (1, 2).

3. The system of claim 2, wherein the first and second sensors are arranged in a single package,

wherein the measurement unit (9) is configured to measure similar performance characteristics for each alignment structure (1, 2), and/or

Wherein the measurement unit (9) is configured to measure different performance characteristics for each alignment structure (1, 2).

4. The system of any one of claims 1 to 3,

wherein the device under test (3, 4) is placed on a production line, preferably a conveyor belt, of the bottom ends of the plurality of alignment structures (1, 2).

5. The system of any one of claims 1 to 4,

wherein each device under test (3, 4) operates as a directional antenna having a main beam within a solid angle of 120 degrees.

6. The system of claim 5, wherein the first and second sensors are arranged in a single unit,

wherein the measurement unit (9) is configured to simultaneously perform measurements on the devices under test (3, 4) operating with the main beam within the solid angle of 120 degrees.

7. The system of any one of claims 1 to 6,

wherein the plurality of alignment structures (1, 2) are arranged horizontally with respect to a test plane, and/or

Wherein the plurality of alignment structures (1, 2) are arranged vertically with respect to the test plane, and/or

Wherein the plurality of alignment structures (1, 2) are arranged in an inclined position with respect to the test plane.

8. The system of any one of claims 1 to 7,

wherein the plurality of alignment structures (1, 2) are arranged in close proximity, preferably with a separation distance of less than 2 meters.

9. The system of any one of claims 1 to 8,

wherein the system (10) further comprises a positioner (11), the positioner (11) being configured to simultaneously orient the plurality of alignment structures (1, 2).

10. The system of any one of claims 1 to 9,

wherein the system (10) further comprises shielding walls (21) arranged between the plurality of alignment structures (1, 2), whereby the measurement unit (9) is adapted to simultaneously perform measurements on the device under test (3, 4) operating with the main beam having a solid angle larger than 120 degrees.

11. A method in a system (10) for parallel measurement of devices under test (3, 4) in an open air environment, the system (10) comprising a plurality of alignment structures (1, 2), the method comprising the steps of:

arranging (100) a shaped reflector (5, 6) at the top end of the alignment structure (1, 2),

arranging (101) an antenna (7, 8) at a focal area of the shaped reflector (5, 6),

arranging (102) the device under test (3, 4) at the bottom end of the plurality of alignment structures (1, 2) and opposite to the corresponding shaped reflectors (5, 6), and

wherein the plurality of alignment structures (1, 2) are placed parallel to each other without a shielded housing.

12. The method of claim 11, wherein the first and second light sources are selected from the group consisting of,

wherein the method further comprises the step of measuring similar performance characteristics for each alignment structure (1, 2), and/or

Wherein the method further comprises the step of measuring a different performance characteristic for each alignment structure (1, 2).

13. The method according to claim 11 or 12,

wherein the method further comprises the step of placing the device under test (3, 4) on a production line, preferably on a conveyor belt, of the bottom ends of the plurality of alignment structures (1, 2).

14. The method of any one of claims 11 to 13,

wherein the method further comprises the steps of: each device under test (3, 4) is operated as a directional antenna having a main beam within a solid angle of 120 degrees.

15. The method of claim 14, wherein the first and second light sources are selected from the group consisting of,

wherein the method further comprises the steps of: performing measurements simultaneously on the devices under test (3, 4) operating with the main beam having the solid angle within 120 degrees.

Technical Field

The present invention relates to parallel measurement of Devices Under Test (DUTs) in an open environment, particularly for line testing of multiple DUTs with limited interference.

Background

Over The Air (OTA) testing is typically performed in a shielded and sealed environment within a microwave-absorbing dark room. These chambers are designed to be non-reflective and anechoic. The size of the dark room varies with the object being tested and the frequency range, and the dark room is typically lined with a cone of foam that absorbs the reflected signal. The test takes into account the radiation characteristics of the device while eliminating interference from any other transmission. In wireless device production testing, these dark chambers need to be opened and closed for subsequent placement of a Device Under Test (DUT). Alternatively, DUTs are loaded into these dark rooms using a complex mechanism (e.g., a six-axis robot). Therefore, the total time and cost increase significantly, especially in the case of production testing.

From the above point of view, an open test environment is beneficial for production testing. However, without shielding the chamber, the associated interference with the testing mechanism must reduce the overall testing accuracy. Furthermore, to test multiple Devices (DUTs) simultaneously, especially in an OTA environment, a separate noise abatement environment is typically implemented for each DUT to maintain an acceptable interference level. For example, document US9,179,340B2 shows a system for OTA testing of wireless devices. The system includes a plurality of individual chambers configured to house devices under test, wherein the chambers are connected by individually defined propagation path passageways. However, this system results in a more complex absorbing camera with multiple individual shells inside to isolate the device.

Disclosure of Invention

It is therefore an object of the present invention to provide a system and method for parallel measurement of DUTs for OTA production testing with minimal interference levels in a simplified and cost-effective manner.

This object is solved by the features of the first independent claim directed to a system and by the features of the second independent claim directed to a method. The dependent claims contain further developments.

According to a first aspect of the present invention, a system for parallel measurement of devices under test in an open air environment is provided. The system includes a plurality of alignment structures, each alignment structure including: a shaped reflector disposed at a top end of the alignment structure; and an antenna disposed at a focal region of the shaped reflector. In this case, the device under test is arranged at the bottom end of the plurality of alignment structures and opposite to the corresponding shaped reflectors. In addition, the plurality of alignment structures are positioned parallel to one another without the need for a shielded housing.

Thus, a plurality of Compact Antenna Test Range (CATR) settings are utilized to measure the corresponding DUTs without any shielded enclosure. Due to the natural nature of the CATR, the reflector scatters out most of the incident interference from the quiet zone, especially for radiation from adjacent DUTs. Thus, the reflector and beam collimation mechanism provide natural interference blocking capability to radiation from adjacent test mechanisms. Advantageously, multiple DUTs can be tested in parallel with limited interference without the need for a separate shielded enclosure. This is particularly advantageous for production testing of wireless devices, such as testing in a fifth generation (5G) production line.

According to a first preferred implementation form of the first aspect of the invention, the system further comprises a measurement unit, preferably connected to the antenna of each alignment structure. Advantageously, parallel measurements of the DUT are performed in a simpler manner.

According to a second preferred implementation form of the first aspect of the invention, the measurement unit is configured to measure similar performance characteristics for each alignment structure. Additionally or alternatively, the measurement unit is for measuring a different performance characteristic for each alignment structure. Thus achieving a higher degree of measurement flexibility.

According to another preferred implementation form of the first aspect of the invention, the device under test is placed on a production line, preferably a conveyor belt, of the bottom ends of the plurality of alignment structures. In this case, the DUTs may be placed on a single conveyor belt at the bottom end of the alignment structure. Alternatively, a plurality of parallel conveyor belts may be arranged at the bottom end of the respective alignment structure.

According to another preferred implementation form of the first aspect of the invention, each device under test operates as a directional antenna having a main beam within a solid angle of 120 degrees. Advantageously, the DUT is directed at a dominant radiated power in a solid angle of 120 x 120 degrees around the reflector in order to reduce interference towards adjacent test facilities.

According to another preferred implementation form of the first aspect of the invention, the measurement unit is configured to perform measurements simultaneously on the device under test operating with the main beam within the solid angle of 120 degrees. Advantageously, parallel testing of the DUTs is performed simultaneously.

According to another preferred realisation form of the first aspect of the present invention, the plurality of alignment structures are arranged horizontally and/or vertically and/or in an inclined position with respect to the test plane. Thus, the system allows flexible test setups with respect to, for example, the type of DUT to be tested, alignment requirements on the production line, arrangement of the test facilities, etc.

According to another preferred realisation form of the first aspect of the invention, the plurality of alignment structures are arranged in close proximity, preferably with a separation distance of less than 2 metres. Advantageously, the DUT is measured in a compact environment.

According to another preferred implementation form of the first aspect of the invention, the system further comprises a positioner for simultaneously orienting the plurality of alignment structures. Thus, the CATR and DUT are advantageously oriented relative to each other.

According to another preferred implementation form of the first aspect of the invention, the system further comprises shielding walls arranged between the plurality of alignment structures, such that the measurement unit is adapted to simultaneously perform measurements on the device under test operating with the main beam having a solid angle larger than 120 degrees. Advantageously, the DUT can be measured with limited interference even if it is not perfectly oriented and/or beamformed.

According to a second aspect of the present invention, there is provided a method in a system for parallel measurement of a device under test in an open air environment, the system comprising a plurality of alignment structures. The method comprises the following steps: a shaped reflector is disposed at the tip of the alignment structure. In addition, the method comprises the steps of: an antenna is disposed at a focal region of the shaped reflector. Further, the method comprises the steps of: the device under test is disposed at bottom ends of the plurality of alignment structures and opposite the corresponding shaped reflectors. In this case, the plurality of alignment structures are placed parallel to each other without a shielded housing. Thus, a plurality of Compact Antenna Test Range (CATR) settings are utilized to measure the corresponding DUT without any shielded housing.

According to a first preferred implementation form of the second aspect of the invention, the method further comprises the step of measuring similar performance characteristics for each alignment structure. Additionally or alternatively, the method further comprises the step of measuring a different performance characteristic for each alignment structure. Advantageously, a higher degree of measurement flexibility is achieved.

According to a second preferred implementation form of the second aspect of the invention, the method further comprises the following steps: placing the device under test on a production line, preferably a conveyor belt, of the bottom ends of the plurality of alignment structures. In this case, the DUTs may be placed on a single conveyor belt at the bottom end of the alignment structure. Alternatively, a plurality of parallel conveyor belts may be arranged at the bottom end of the respective alignment structure.

According to another preferred implementation form of the second aspect of the invention, the method further comprises the following steps: each device under test is operated as a directional antenna having a main beam within a solid angle of 120 degrees. Advantageously, the DUT is oriented with a dominant radiated power in a solid angle of 120 x 120 degrees around the reflector in order to reduce interference towards adjacent test setups.

According to another preferred implementation form of the second aspect of the invention, the method further comprises the following steps: simultaneously performing measurements on the device under test operating with the main beam within the solid angle of 120 degrees. Advantageously, parallel testing of the DUTs is performed simultaneously.

Drawings

Exemplary embodiments of the present invention will now be further elucidated, by way of example only, and not by way of limitation, with reference to the accompanying drawings. In the drawings:

fig. 1 shows a first exemplary embodiment of a system according to a first aspect of the present invention;

fig. 2 shows a second exemplary embodiment of a system according to the first aspect of the present invention;

FIG. 3 illustrates an exemplary interference situation with a reflector of an alignment structure according to a first aspect of the present invention;

fig. 4 shows an exemplary interference situation for an antenna of an alignment structure according to the first aspect of the present invention; and

fig. 5 shows an exemplary embodiment of a method according to the second aspect of the present invention.

Detailed Description

Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. However, various modifications may be made to the following embodiments of the present invention, and the scope of the present invention is not limited by the following embodiments.

A first exemplary embodiment of a system 10 according to the first aspect of the present invention is shown in fig. 1. In particular, two parallel alignment structures 1, 2 are shown herein, wherein the alignment structure 1 comprises a reflector 5 and an antenna 7 (e.g. a feed antenna), and the alignment structure 2 comprises a reflector 6 and an antenna 8 (e.g. a feed antenna), wherein the antenna 7 is arranged at a focal area of the reflector 5 and the antenna 8 is arranged at a focal area of the reflector 6. Reflector 5 is located at the top end of alignment structure 1, reflector 6 is located at the top end of alignment structure 2, and DUTs 3, 4 are placed at the bottom end such that reflectors 5, 6 are suspended above respective DUTs 3, 4. The DUTs 3, 4 are wireless devices, such as modular devices, antenna arrays, etc., preferably operating in accordance with a 5G communication standard. Alignment structures 1, 2 resemble a vertical CATR system, wherein the CATR and DUTs 3, 4 are oriented such that the parallel DUTs 3, 4 do not radiate energy directly towards each other.

The system further comprises a measurement unit (MEAS)9 connected to each antenna 7, 8 and performing measurements on DUT3, DUT 4 simultaneously. Each of the antennas 7, 8 is connected individually or collectively to a measurement unit 9 via a switching component, e.g. via a Radio Frequency (RF) switch box (not shown). Therefore, the measurement unit 9 can measure the same performance characteristics (e.g., error vector magnitude) for the DUT3, DUT 4. In addition, the measurement unit 9 is capable of measuring a plurality of different performance characteristics (e.g., error vector magnitude and channel power) for the DUT3, 4. The measurement unit 9 may additionally comprise a measurement antenna or probe or sensor for detailed measurements of the DUT3, 4. Typically, the measurement unit 9 comprises signal generating means, data/signal processing means, a user interface and memory means, which are well known in the art and which are not described in detail in order to avoid unnecessarily obscuring the present invention.

The system further comprises a Positioner (POS)11, which positioner 11 is connected to the measurement unit 9 and further to the alignment structures 1, 2, so that the respective orientations of the alignment structures 1, 2 are performed simultaneously. The positioner 11 may optionally be connected to the DUT3, DUT 4 in order to orient the DUT3, DUT 4 relative to the alignment structures 1, 2 simultaneously. In this case, the positioner 11 may orient the alignment structures 1, 2 vertically or horizontally or at an oblique angle with respect to the test plane. In addition, the positioner 11 may orient the alignment structures 1, 2 at different angles relative to each other. The alignment structures 1, 2 may be externally oriented by the positioner 11, for example by a user via the measurement unit 9 according to the requirements of a production test.

Specifically for alignment structures 1, 2 shown herein, two DUTs 3, 4 to be tested in parallel may be placed on a production line. The two alignment structures 1, 2 are thus oriented vertically on the production line, with the two DUTs 3, 4 on one conveyor belt or two parallel conveyor belts, which are located below the respective reflectors 5, 6. In each instance of two DUTs 3, 4, measurements are performed in parallel using two respective alignment structures 1, 2. Advantageously, no shielding enclosure (e.g., a microwave absorbing dark room) is required, thereby enabling production-level testing of multiple devices. However, alignment structure 1 may include some level of shielding 13 and 15 as described herein, and alignment structure 2 may include some level of shielding 14 and 16 as described herein, for example, to isolate the back lobes from antennas 7 and 8 and the side lobes from DUTs 3 and 4. The antennas 7, 8 illuminate the respective reflector 5, 6 from the focal region, and the DUT3, DUT 4 (e.g., antenna array) operate at a dominant radiated power in a solid angle of 120 x 120 degrees around the respective reflector 5, 6. It is noted that exemplary shield portions 13, 14, 15, and 16 are partially shown in fig. 1. Additional shielding may be introduced between the antennas 7, 8 and the respective reflectors 5, 6 as desired.

The two alignment structures 1, 2 may be placed in close proximity, for example at approximately 1 or 2 meters, preferably less than 2 meters, in order to achieve a compact testing environment. Since the main radiation from the DUTs 3, 4 is directed in a 120 x 120 solid angle (+/-60 degrees from line of sight in two orthogonal directions) around the reflectors 5, 6, the radiation from one DUT has a negligible effect on the adjacent DUT in the direct line of sight. For example, radiation from DUT3 has negligible effect on DUT 4 in the direct line of sight. On the other hand, electromagnetic waves radiated by the DUT3 can actually reach the reflector 6 with a non-negligible power. However, since the DUT3 is not placed in the focal region of the reflector 6, the reflector 6 will scatter radiation from the DUT3 mostly out of the quiet zone (the region where the DUT 4 is located). Thus, reflector 5, reflector 6 and beam collimation mechanism provide a natural interference rejection capability that blocks radiation from adjacent test mechanisms.

It is important to note that the number of alignment structures and the number of DUTs and their respective orientations are shown herein by way of example only and not by way of limitation.

A second exemplary embodiment of a system 20 according to the first aspect of the present invention is shown in fig. 2. System 20 differs from system 10 of fig. 1 in that system 20 includes additional shielding walls 21 or a single shielding wall between alignment structure 1 and alignment structure 2 to minimize interference. The shielding wall 21 may be in the form of: a surface with metallic skin, a piece with RF absorbing material (e.g., ferrite or pyramidal foam), or any combination thereof. Such shielding walls 21 advantageously suppress adjacent interference, particularly where a DUT (e.g., DUT 3) radiates beams in a solid angle greater than 120 degrees, which may interfere with an adjacent DUT (e.g., DUT 4) as well as with DUTs in close proximity to the adjacent DUT 4. Thus, multiple devices can be tested on a production line even though one or more devices may be traveling in a main beam solid angle of greater than 120 degrees.

An exemplary interference situation for the reflector 5 of the alignment structure 1 according to the first aspect of the present invention is shown in fig. 3. The interference source 30 may be, for example, an adjacent DUT. Although the interference source 30 has a negligible effect on the DUT3 in the direct line of sight, the level of interference to the reflector 5 is of considerable intensity. However, since the interference source 30 does not originate from the focal region of the reflector 5, the reflector 5 scatters almost all the interference from the quiet zone. Therefore, even without a shielded housing, interference with the reflector 5 can be sufficiently minimized.

An exemplary interference situation for the DUT3, the antenna 7 of the alignment structure 1 according to the first aspect of the present invention is shown in fig. 4. The sources of interference 41, 42 may be scattered waves from adjacent reflectors, and the sources of interference 43, 44 may be one or more of the adjacent antennas. Alternatively, interference source 41, interference source 42, interference source 43, interference source 44 may be any of the scatterings from one or more adjacent reflectors, antennas and DUTs. However, due to beam collimation on the reflector and beam radiation concentrated over a solid angle of 120 degrees, most of the interferers 41, 42, 43, 44 cause negligible power level interference and therefore do not significantly affect the antenna 7 and hence the DUT 3.

An exemplary embodiment of a method according to the second aspect of the present invention is shown in fig. 5. In a first step 100, a shaped reflector 5 is arranged on top of the alignment structure 1 and a shaped reflector 6 is arranged on top of the alignment structure 2. In a second step 101, the antenna 7 is arranged at the focal area of the shaped reflector 5 and the antenna 8 is arranged at the focal area of the shaped reflector 6. In a third step 102, a device under test 3, 4 is arranged at the bottom end of the plurality of alignment structures 1, 2, respectively, opposite the corresponding shaped reflector 5, 6. In this case, the plurality of alignment structures 1, 2 are placed parallel to each other without a shielded housing.

Furthermore, the method comprises the step of measuring similar performance characteristics for each alignment structure 1, 2. Additionally or alternatively, the method further comprises the step of measuring a different performance characteristic for each alignment structure 1, 2.

It is particularly advantageous if the method further comprises placing the device under test 3, 4 on the production line, preferably on a conveyor belt at the bottom end of the plurality of alignment structures 1, 2.

In addition, the method further comprises the steps of: each device under test 3, 4 is operated as a directional antenna having a main beam within a solid angle of 120 degrees.

Furthermore, the method comprises the step of simultaneously performing measurements on the device under test 3, 4 operating with a main beam within a solid angle of 120 degrees.

Embodiments of the present invention may be implemented by hardware, software, or any combination thereof. Various embodiments of the present invention may be implemented by one or more Application Specific Integrated Circuits (ASICs), Digital Signal Processors (DSPs), Digital Signal Processing Devices (DSPDs), Programmable Logic Devices (PLDs), Field Programmable Gate Arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, etc.

While various embodiments of the present invention have been described above, it should be understood that they have been presented by way of example only, and not limitation. Many modifications to the disclosed embodiments can be made in accordance with the disclosure herein without departing from the spirit and scope of the present invention. Thus, the breadth and scope of the present invention should not be limited by any of the above-described embodiments. Rather, the scope of the invention should be defined in accordance with the following claims and their equivalents.

Although the invention has been shown and described with respect to one or more implementations, equivalent alterations and modifications will occur to others skilled in the art upon the reading and understanding of this specification and the annexed drawings. In addition, while a particular feature of the invention may have been disclosed with respect to only one of several implementations, such feature may be combined with one or more other features of the other implementations as may be desired and advantageous for any given or particular application.