Halogen generator

文档序号:1014838 发布日期:2020-10-27 浏览:35次 中文

阅读说明:本技术 卤素产生器 (Halogen generator ) 是由 C.钱德勒 于 2020-04-21 设计创作,主要内容包括:本文公开的是用于产生卤素气体的一种方法和系统的实施例。所述方法可包含使固体氧化剂与包含卤化物化合物的蒸气接触,以产生包含对应于所述卤化物化合物中的卤化物的卤素的气流。所述卤化物化合物可以是酰卤,如乙酰卤或草酰卤。所述氧化剂可以是任何适合氧化剂,并且在某些实例中,使用高锰酸钾。可在减压下进行所述方法。本文还公开了一种适合于进行本公开的方法的系统。所述系统可包含储集器、氧化剂载体和气流出口。(Disclosed herein are embodiments of a method and system for generating halogen gas. The method can include contacting a solid oxidant with a vapor comprising a halide compound to produce a gas stream comprising a halogen corresponding to a halide in the halide compound. The halide compound may be an acid halide, such as acetyl halide or oxalyl halide. The oxidizing agent can be any suitable oxidizing agent, and in certain examples, potassium permanganate is used. The process may be carried out under reduced pressure. Also disclosed herein is a system suitable for performing the method of the present disclosure. The system can include a reservoir, an oxidant carrier, and an air flow outlet.)

1. A method comprising contacting a solid oxidant with a vapor comprising a halide compound to produce a gas stream comprising a halogen gas.

2. The method of claim 1, wherein the halide compound is an acid halide.

3. The method of claim 1, wherein the halide compound is an acetyl halide, an oxalyl halide, or a combination thereof.

4. The method of claim 1, wherein the halide compound is acetyl chloride or acetyl bromide.

5. The method of claim 1, wherein the halide compound is oxalyl chloride or oxalyl bromide.

6. The method of claim 1, wherein the halogen gas is chlorine gas.

7. The method of claim 1, wherein the halogen gas is bromine gas.

8. The method of claim 1, wherein the oxidizing agent comprises permanganate, dichromate, hypochlorite, hypobromite, chlorate, bromate, chlorite, bromite, perchlorate, perbromite, chlorochromate, perborate, bismuthate, nitrate, chromate, trioxide, tetraoxide, or a combination thereof.

9. The method of claim 1, wherein the oxidizing agent comprises lithium, calcium, barium, sodium, potassium, magnesium, chromium, osmium, ruthenium, or a combination thereof.

10. The method of claim 1, wherein the oxidizing agent comprises potassium permanganate, potassium chromate, chromium trioxide, sodium chromate, sodium dichromate, potassium chlorochromate, sodium bismuthate, potassium nitrate, sodium perborate, sodium hypochlorite, sodium chlorite, sodium chlorate, sodium perchlorate, sodium hypobromite, sodium bromite, sodium bromate, sodium perbromite, osmium tetraoxide, ruthenium tetraoxide, or a combination thereof.

11. The method of claim 1, comprising contacting the solid oxidant with the vapor at a pressure of greater than zero to less than 1 atmosphere.

12. The method of claim 11, wherein the pressure is from 1 torr to 650 torr.

13. The method of claim 11, wherein the pressure is from 50 torr to 300 torr.

14. The method of claim 11, wherein the pressure is from 100 torr to 250 torr.

15. The method of claim 1, wherein the halide compound is at a temperature of from-200 ℃ to 50 ℃.

16. The method of claim 15, wherein the temperature is from-80 ℃ to 30 ℃.

17. The method of claim 15, wherein the temperature is from 0 ℃ to 25 ℃.

18. The method of claim 15, comprising contacting the solid oxidant with the vapor at a vapor pressure of the halide compound at the temperature.

19. The method of claim 1, wherein the halide compound comprises acetyl halide and the gas stream further comprises acetic anhydride.

20. The method of claim 1, comprising contacting potassium permanganate with acetyl chloride vapor at 600 torr and 20 ℃ to 30 ℃ to produce a gas stream comprising chlorine gas.

21. The method of claim 1, comprising contacting potassium permanganate with acetyl bromide vapor at 130 torr and 20 ℃ to 30 ℃ to produce a gas stream comprising bromine gas.

22. The method of claim 1, further comprising using the gas stream in an ion beam device.

23. The method of claim 1, comprising contacting a solid oxidant with a vapor comprising an acid chloride or an acid bromide, wherein the solid oxidant is selected from the group consisting of: potassium permanganate, potassium chromate, chromium trioxide, sodium chromate, sodium dichromate, potassium chlorochromate, sodium bismuthate, potassium nitrate, sodium perborate, sodium hypochlorite, sodium chlorite, sodium chlorate, sodium perchlorate, sodium hypobromite, sodium bromite, sodium bromate, sodium perbromite, osmium tetroxide, ruthenium tetroxide, or combinations thereof, wherein the acid chloride or acid bromide is at a temperature of-200 ℃ to 50 ℃, and the process is conducted under the vapor pressure of the acid chloride or acid bromide at said temperature.

24. A system, comprising:

a halide compound reservoir;

an oxidant carrier fluidly coupled to the reservoir; and

and an airflow outlet.

Background

The use of halide gas precursors in manufacturing and imaging tools often requires various safety precautions. These safety precautions are costly and require multiple levels of support to provide only one gas to the tool. In some cases, the desired gas may be avoided due to difficulties associated with gas storage and gas delivery to the tool. For example, it is desirable to use gas storage tanks (gas boxes) to store and transport chlorine and bromine. Such tanks are expensive to manufacture, take up a large amount of space and require separate venting of the tank to avoid potentially hazardous gas mixing. An existing product that can be used for such storage and delivery of chlorine gas is Nanochemix, and even if the chlorine cylinder is at a pressure below atmospheric pressure, it is necessary to equip it with a chlorine sensor to prevent leakage. Bromine is currently unavailable because of its difficulty in handling, and bromine liquids are corrosive to stainless steel welds and are best stored in expensive hastelloy crucibles. In general, it is desirable to have a gas storage and delivery system that provides halide etch gas with the full etch enhancement rate of a pure gas for charged particle beam processing, is easy to transport regardless of destination, does not corrode crucibles, is produced at sub-atmospheric pressures, and can be handled and connected to most of the gas delivery hardware.

Disclosure of Invention

Disclosed herein are embodiments of a method and system for generating a gas stream comprising a halogen gas, particularly chlorine or bromine gas. In some embodiments, the method comprises contacting a solid oxidant with a vapor comprising a halide compound to produce a gas stream comprising a halogen gas. The halide compound may be an acid halide, such as an acetyl halide or an oxalyl halide or a combination thereof. In some embodiments, the halide compound is acetyl chloride or acetyl bromide, but in other embodiments, the halide compound is oxalyl chloride or oxalyl bromide. And/or in certain embodiments, the halogen gas is chlorine gas or bromine gas.

In any embodiment, the oxidizing agent can comprise permanganate, dichromate, hypochlorite, hypobromite, chlorate, bromate, chlorite, bromite, perchlorate, perbromate, chlorochromate, perborate, bismuthate, nitrate, chromate, trioxide, or a combination thereof. And/or the oxidizing agent may comprise lithium, calcium, barium, sodium, potassium, magnesium, chromium, or combinations thereof. In certain embodiments, the oxidizing agent comprises potassium permanganate, potassium chromate, chromium trioxide, sodium chromate, sodium dichromate, potassium chlorochromate, sodium bismuthate, potassium nitrate, sodium perborate, sodium hypochlorite, sodium chlorite, sodium chlorate, sodium perchlorate, sodium hypobromite, sodium bromite, sodium bromate, sodium perbromite, osmium tetraoxide, ruthenium tetraoxide, or combinations thereof, and in particular embodiments, the oxidizing agent is potassium permanganate.

The method can include contacting the solid oxidant with the vapor at greater than zero to less than 1 atmosphere pressure (e.g., from 1 torr to 650 torr, from 10 torr to 600 torr, from 50 torr to 500 torr, from 50 torr to 300 torr, or from 100 torr to 250 torr).

Additionally or alternatively, the halide compound may be at a temperature of from-200 ℃ to 50 ℃, such as from-80 ℃ to 30 ℃, or from 0 ℃ to 25 ℃. And/or the method may comprise contacting the solid oxidant with the vapor at the vapor pressure of the halide compound at the temperature.

In some embodiments, the halide compound is or comprises acetyl halide and the gas stream further comprises acetic anhydride.

In one embodiment, the method comprises contacting potassium permanganate with acetyl chloride vapor at 600 torr and 20 ℃ to 30 ℃ to produce a gas stream comprising chlorine gas.

In one embodiment, the method comprises contacting potassium permanganate with acetyl bromide vapor at 130 torr and at 20 ℃ to 30 ℃ to produce a gas stream comprising bromine gas.

In any embodiment, the method may further comprise using the gas stream in an ion beam device.

Also disclosed are embodiments of a system comprising a halide compound reservoir, an oxidant carrier fluidly coupled to the reservoir, and a gas flow outlet.

The above and other objects, features and advantages of the present invention will become more apparent from the following detailed description taken in conjunction with the accompanying drawings.

Drawings

FIG. 1 is a photograph of an exemplary apparatus suitable for practicing certain embodiments of the disclosed methods.

Detailed Description

I. Definition of

The following explanations of terms and abbreviations are provided to better describe the present invention and to guide those of ordinary skill in the art in the practice of the present invention. As used herein, the term "comprising" means "including" and the singular forms "a or an" or "the" include plural references unless the context clearly dictates otherwise. The term "or" refers to a single element, or a combination of two or more elements, of the recited substitute elements, unless the context clearly dictates otherwise.

Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs. Although methods and materials similar or equivalent to those described herein can be used in the practice or testing of the present invention, suitable methods and materials are described below. The materials, methods, and examples are illustrative only and not intended to be limiting. Other features of the present invention will be apparent from the following detailed description and claims.

Unless otherwise indicated, all numbers expressing components, molecular weights, percentages, temperatures, times, and so forth, used in the specification or claims are to be understood as being modified by the term "about". Accordingly, unless implicitly or explicitly indicated otherwise, the numerical parameters set forth are approximations that can depend upon the desired properties sought and/or the limits of detection under the test conditions/methods familiar to those of ordinary skill in the art. When directly and explicitly distinguishing embodiments from the prior art discussed, the embodiment numbers are not approximations unless the word "about" is recited.

"halogen" or "halide" means fluorine, chlorine, bromine or iodine, or the corresponding halide, especially chlorine or bromine.

"acyl" refers to the moiety R-C (O) -or- (O) C-R-C (O) -wherein R is a substantially hydrocarbon-based group or moiety, including aryl, alkyl, alkenyl, alkynyl, cyclic forms thereof, such as cycloalkyl, cycloalkenyl, or cycloalkynyl, and further including straight and branched chain arrangements, as well as all stereo and positional isomers. Unless expressly stated otherwise, the acyl moiety contains one to twenty-five carbon atoms; such as one to fifteen, one to ten, one to six, or one to four carbon atoms. Exemplary acyl moieties include, but are not limited to, formyl, acetyl, propionyl, butyryl, isobutyryl, oxalyl, malonyl, succinyl, and benzoyl.

General description of the invention

Halogen gases, such as chlorine and bromine gases, are toxic and corrosive, making storage and safe use of such gases problematic. For example, a chlorine sensor is often required when storing chlorine gas, even if the gas is stored in a cylinder. Bromine is not provided for some applications because it is difficult to handle. Bromine liquids can corrode stainless steel welds and are best stored in very expensive vessels lined with Hastelloy (Hastelloy-lined). Some applications use gas boxes to deliver halogen gases (e.g., chlorine and bromine gases) to the system. However, they are expensive to build, take up a lot of space and require separate ventilation of the air box. And for some applications (e.g., beam-etching applications), chlorine and bromine alternatives (e.g., XeF)2) Has limited use. XeF2For many applications, such as silicon etching, the corrosiveness is too strong because it reacts spontaneously with silicon.

Methods and systems

Disclosed herein is a method and system for generating a halogen gas, such as chlorine or bromine gas. The method and system are suitable for a variety of applications including, but not limited to, beam processing including beam etching applications and synthesis applications. The halogen gas may be provided at sub-atmospheric pressure. Halogen gas is generated as needed, and the generation of gas can be stopped as needed. This avoids the need to store gas and reduces or eliminates the potential for the problems described above, such as chlorine sensors, hastelloy vessels, separate vents, and/or gas boxes. Thus, the disclosed methods and systems have significant cost and safety benefits over other halogen gas delivery systems.

A. Method of producing a composite material

In some embodiments, the method comprises contacting an oxidant (typically a solid oxidant) with a vapor comprising a halide compound to produce a gas stream comprising a halogen gas corresponding to a halide in the halide compound. In some embodiments, the vapor consists essentially of or consists of a halide compound. That is, the vapor does not contain other volatile organic compounds, solvents, and/or water vapor in amounts that may interfere with or impair the end use of the halogen gas. In some embodiments, the vapor does not contain detectable amounts of additional volatile organic compounds, solvents, and/or water vapor.

It is understood by those of ordinary skill in the art that the gas stream also includes one or more oxidation products produced from the halogen-producing gas. For example, if the halide compound is acetyl chloride, the gas stream may comprise chlorine gas and one or more oxidation products of the acetyl moiety, such as acetic anhydride. And in some embodiments, the gas stream consists essentially of or consists of the halogen gas from the halide compound and the one or more oxidation products.

In some embodiments, the halide compound is an acid halide, such as a compound derived from a carboxylic acid. The acid halide may be a formyl halide, an acetyl halide, a propionyl halide, a butyryl halide, an isobutyryl halide, an oxalyl halide, a malonyl halide, a succinyl halide, a benzoyl halide, or a combination thereof. In any embodiment, the halide may be fluoride, chloride, bromide, or iodide. In certain embodiments, the halide compound is a chloride compound, such as an acid chloride, but in other embodiments, the halide compound is a bromide compound, such as an acid bromide. In particular embodiments, the acid halide is a formyl chloride, acetyl chloride, propionyl chloride, butyryl chloride, isobutyryl chloride, oxalyl chloride, malonyl chloride, succinyl chloride, benzoyl chloride, or a combination thereof. And in other particular embodiments, the acyl halide is formyl bromide, acetyl bromide, propionyl bromide, butyryl bromide, isobutyryl bromide, oxalyl bromide, malonyl bromide, succinyl bromide, benzoyl bromide, or a combination thereof. The acid halide may be selected from acetyl chloride, acetyl bromide, oxalyl chloride, oxalyl bromide, or combinations thereof. And in some embodiments, the acid halide is acetyl chloride, and in other embodiments, the acetyl halide is acetyl bromide.

The specification and/or purity of the halide compound can be any specification and/or purity suitable for use in the disclosed methods. In certain embodiments, the halide compound is at least 95% pure, such as at least 96%, at least 97%, at least 98%, at least 99%, or at least 99.5% pure halide compound, as determined by suitable techniques, such as Gas Chromatography (GC) and/or titration.

In certain embodiments, the acid halide comprises, consists essentially of, or consists of acetyl chloride, and the gas stream comprises, consists essentially of, or consists of chlorine gas and one or more oxidation products from an acetyl moiety, such as, but not limited to, acetic anhydride.

In other embodiments, the acyl halide comprises, consists essentially of, or consists of acetyl bromide, and the gas stream comprises, consists essentially of, or consists of bromine gas and one or more oxidation products from an acetyl moiety, such as, but not limited to, acetic anhydride.

In any embodiment, the acid halide can be a liquid at room temperature and pressure (e.g., at 25 ℃ and 1 atmosphere).

The oxidant may be any oxidant suitable for generating a halogen gas from a halide compound. In certain embodiments, the oxidizing agent is a solid oxidizing agent. Suitable oxidizing agents may include permanganates, dichromates, hypochlorites, hypobromites, chlorates, bromates, chlorites, bromites, perchlorates, perborates, chlorochromates, perborates, bismuthates, nitrates, chromates, trioxides, tetraoxides, or combinations thereof. The oxidizing agent may further comprise a counter ion, typically a metal counter ion, such as, but not limited to, lithium, calcium, barium, sodium, potassium, magnesium, chromium, osmium, ruthenium, or combinations thereof. And in certain embodiments, the oxidizing agent comprises potassium permanganate, potassium chromate, chromium trioxide, sodium chromate, sodium dichromate, potassium chlorochromate, sodium bismuthate, potassium nitrate, sodium perborate, sodium hypochlorite, sodium chlorite, sodium chlorate, sodium perchlorate, sodium hypobromite, sodium bromite, sodium bromate, sodium perbromate, osmium tetraoxide, ruthenium tetraoxide, or combinations thereof. In some embodiments, the oxidizing agent does not comprise chromium. And in certain embodiments, the oxidizing agent is a permanganate salt, such as potassium permanganate.

The process may be carried out at an operating pressure suitable to promote the production of halogen gas. In some embodiments, the pressure is atmospheric pressure, or less than atmospheric pressure, such as from greater than zero to less than 1 atmosphere, from 1 torr to 650 torr, from 10 torr to 600 torr, from 50 torr to 500 torr, from 50 torr to 300 torr, or from 100 torr to 250 torr. Those of ordinary skill in the art understand that these pressures are pressures at which the halogen-containing gas is generated. The methods for using the generated gas may be at the same pressure or at different pressures (e.g., higher or lower pressures). For example, the use of, e.g., chemical beam etching, may require a pressure substantially less than the pressure used to generate the gas, e.g., on the order of about 5 less.

The vapor may be partially or completely generated by evaporation of the halide compound reservoir. The halide compound reservoir may be at a temperature suitable to facilitate vapor generation at the operating pressure. The halide compound reservoir may be at ambient or room temperature, or it may be heated above ambient temperature, or cooled below ambient temperature. One of ordinary skill in the art will appreciate that when a vacuum is applied to the system comprising the halide, an equilibrium will be achieved at the vapor pressure of the halide compound. Thus, the operating pressure of the system can be varied by changing the temperature of the halide compound reservoir, which in turn will change the vapor pressure of the halide compound. In some embodiments, the halide compound reservoir is cooled to below ambient temperature, thereby lowering the vapor pressure and promoting a lower operating pressure.

In some embodiments, the halide compound is at a temperature of from-200 ℃ or less to 50 ℃ or more (e.g., from-80 ℃ to 30 ℃, from-40 ℃ to 25 ℃, or from 0 ℃ to 25 ℃).

In one embodiment, the method comprises contacting potassium permanganate with acetyl chloride vapor at 600 torr and 20 ℃ to 30 ℃ to produce a gas stream comprising chlorine gas.

In one embodiment, the method comprises contacting potassium permanganate with acetyl bromide vapor at 130 torr and at 20 ℃ to 30 ℃ to produce a gas stream comprising bromine gas.

In some embodiments, 5 to 10mL of the halide compound used with a stoichiometric excess of the oxidant as compared to the halide on the halide compound makes the halide compound the limiting agent. In some embodiments, greater than 1 equivalent or greater than 10 equivalents of oxidizing agent are used, such as 1.2 to 10 equivalents, 1.5 to 5 equivalents, or 2 to 4 equivalents of oxidizing agent.

B. System for controlling a power supply

A system suitable for carrying out the disclosed method is also disclosed. Fig. 1 provides an exemplary system 2. Referring to fig. 1, a system 2 includes a halide compound reservoir 4 fluidly connected to an oxidizer carrier 6. The oxidant carrier may be any structure that supports the oxidant 8 to prevent its movement into the reservoir, and also facilitates contact between the vapor containing the halide compound and the oxidant 8. In the exemplary system illustrated in fig. 1, the oxidizer carrier 6 is a glass sintered disk.

The gas stream containing the halogen gas exits the system 2 through pipe 10. The pressure within the system 2 may be reduced by connecting the tube 10 to a vacuum system (not shown) that also facilitates the flow of air out of the system 2. The vacuum system may be part of a device that requires a halide gas source. For example, the tube 10 may be fluidly connected to a beam etching device operating at a pressure below atmospheric pressure. The vacuum system for the beam apparatus may reduce the pressure within the system 2 and facilitate the flow of gas from the system 2 to the beam apparatus via the tube 10.

One of ordinary skill in the art will appreciate that when a vacuum is applied through the tube 10, a portion of the halide compound in the halide compound reservoir 4 will vaporize and contact the oxidant 8, thereby forming a gas stream. Optionally, the system 2 may include a faucet 12 that may open or close the tube 10. When open, faucet 12 facilitates airflow out of tube 10 in response to an applied vacuum. However, when closed, the tap 12 prevents halogen gas from leaving the system 2. Thus, the system 2 can provide halogen gas as needed by opening and closing the faucet 12. Furthermore, because halogen gas is only generated on demand, system 2 does not require halogen gas storage devices that may also require gas sensors, vented storage areas, and/or specialized and expensive containment materials (e.g., hastelloy). And because the system and method generate halogen gas from readily available and inexpensive halide compounds (e.g., acetyl chloride or acetyl bromide), the difficulties and costs associated with transporting halogen gas are significantly removed or eliminated.

Additionally, the system 2 may include a faucet 14. The tap 14 is normally closed during operation, but may be used to release vacuum in the system 2, for example, to facilitate refilling of the reservoir 4 and/or replacement to replenish the oxidant 8. The tap 14 may also be connected to an inert gas or air line, for example to flush the system to remove residual halogen gas.

Application of

The halogen gas produced by the disclosed methods and/or systems may be suitable for any application requiring halogen gas, particularly for the controllable flow of halogen gas. In some embodiments, a halogen gas flow is used for ion beam etching. Typically, in ion beam etching, a charged particle beam is directed at a substrate with a suitable mask in a high vacuum chamber. Reactive ionic species, such as halogens, particularly chlorine or bromine, may be added to the beam to enhance material etching. For example, using the disclosed method with acetyl chloride or acetyl bromide to generate a halogen gas stream, the etching of aluminum substrates is enhanced by a factor of 40 to 100 compared to ion beam etching performed with halogen-free gases. The enhancement may also be due to the presence of oxidation products of acetyl moieties (such as acetic anhydride) in the gas stream. Without being bound by a particular theory, the presence of oxidation products of acetyl moieties (e.g., acetic anhydride) may help to cause AlCl to form during the etching process3Or AlBr3The corresponding halogen gas is volatilized.

In addition, the silicon dioxide etching is enhanced by 10 to 20 times compared to the silicon dioxide ion beam etching without the addition of the halogen gas flow.

In addition, typical ion beam etching systems are at pressures significantly below atmospheric pressure (e.g., about 10 f)-5Is supported to 10-6Torr) operation. By operating the halogen gas generator at a reduced pressure compared to atmospheric pressure, the halogen gas stream is also at a pressure below atmospheric pressure. Accordingly, the disclosed method will be passedThe already low pressure of the process-generated halogen gas stream is significantly easier to reduce to a pressure suitable for ion beam etching than reducing the halogen gas stream at atmospheric pressure or greater, such as that generated by a gas cylinder or halogen box.

In view of the many possible embodiments to which the principles of the disclosed invention may be applied, it should be recognized that the illustrated embodiments are only preferred examples of the invention and should not be taken as limiting the scope of the invention. Rather, the scope of the invention is defined by the appended claims. The inventors hereby claim that the invention is fully within the scope and spirit of the claims appended hereto.

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