阅读说明：本技术 用于检测信号损失的多路复用积分放大器 (Multiplexed integrating amplifier for detecting signal loss ) 是由 C·D·安斯沃思 于 2019-08-07 设计创作，主要内容包括：一种信号损失电路,其具有多路复用器和耦合到多路复用器第一输入的光电二极管。参考信号发生器耦合到多路复用器的第二输入。放大器耦合到多路复用器的输出。分离器包括耦合到放大器输出的多路复用器的输入。第一电容器耦合到分离器的第一输出。第二电容器耦合到分离器的第二输出。比较器具有耦合到分离器第一输出的第一输入以及耦合到分离器第二输出的第二输入。(A signal loss circuit has a multiplexer and a photodiode coupled to a first input of the multiplexer. The reference signal generator is coupled to a second input of the multiplexer. An amplifier is coupled to the output of the multiplexer. The splitter includes an input of a multiplexer coupled to the amplifier output. The first capacitor is coupled to the first output of the splitter. The second capacitor is coupled to the second output of the splitter. The comparator has a first input coupled to the first output of the splitter and a second input coupled to the second output of the splitter.)

1. A semiconductor device, comprising:

a multiplexer;

a photodiode coupled to a first input of the multiplexer;

a reference signal generator coupled to a second input of the multiplexer;

an amplifier coupled to an output of the multiplexer; and

a splitter comprising an input of the splitter, the input of the splitter being coupled to the output of the amplifier.

2. The semiconductor device according to claim 1, further comprising:

a first capacitor coupled to the first output of the splitter; and

a second capacitor coupled to the second output of the splitter.

3. The semiconductor device according to claim 2, further comprising a comparator, the comparator comprising:

a first input of a comparator coupled to a first output of the splitter;

a second input of the comparator coupled to a second output of the splitter.

4. The semiconductor device of claim 3, further comprising an output of the comparator coupled to an input of the reference signal generator.

5. The semiconductor device of claim 1, further comprising a limiting amplifier coupled to the photodiode and in parallel with the multiplexer.

6. The semiconductor device of claim 1, further comprising a transconductance amplifier coupled from an output of the amplifier to an input of the amplifier.

7. A semiconductor device, comprising:

a multiplexer;

a data input coupled to a first input of the multiplexer;

a reference signal generator coupled to a second input of the multiplexer; and

an amplifier coupled to the output of the multiplexer.

8. The semiconductor device of claim 7, further comprising a rectifier coupled to the output of the amplifier.

9. The semiconductor device of claim 8, further comprising a splitter coupled to an output of the rectifier.

10. The semiconductor device according to claim 9, further comprising:

a first capacitor coupled to the first output of the splitter;

a second capacitor coupled to the second output of the splitter; and

a comparator coupled to the first capacitor and the second capacitor.

11. A method of detecting a loss of signal, comprising:

receiving a data signal at a first input of a multiplexer;

receiving a reference signal at a second input of the multiplexer;

outputting a reference signal from a multiplexer to an amplifier during a first time period; and

the data signal is output from the multiplexer during a second time period.

12. The method of claim 11, further comprising zeroing the amplifier during a third time period.

13. The method of claim 11, further comprising: the output of the amplifier is rectified to produce a Direct Current (DC) signal.

14. The method of claim 13, further comprising:

coupling a direct current signal to a first capacitor during a first time period; and

the dc signal is coupled to the second capacitor during a second time period.

15. The method of claim 14, further comprising comparing a voltage potential of the first capacitor to a voltage potential of the second capacitor.