阅读说明：本技术 用于预测在装配单元中的缺陷的方法 (Method for predicting defects in an assembly unit ) 是由 塞缪尔·布鲁斯·韦斯 安娜-卡特里娜·谢德列茨基 西蒙·科兹罗夫 安娜·乌林 米哈伊尔·奥库 于 2018-04-13 设计创作，主要内容包括：用于预测制造缺陷的方法的一个变形包括：访问由光学检查站记录的装配单元集合的一组检查图像；对于在该组检查图像中的每个检查图像,检测在检查图像中的特征集合,并生成在多维特征空间中表示该特征集合的向量；将在多维特征空间中的相邻向量分组到向量组集合内；以及响应于接收到指示在该装配单元集合中的与在该向量组集合中的第一向量组中的第一向量相关联的第一装配单元中的缺陷的第一检查结果,而用缺陷标注第一向量组,并且将与第一向量组中的第二向量相关联的第二装配单元标记为展示缺陷的特性。(One variation of the method for predicting manufacturing defects includes: accessing a set of inspection images of a set of assembled units recorded by an optical inspection station; for each inspection image in the set of inspection images, detecting a set of features in the inspection image and generating a vector representing the set of features in a multi-dimensional feature space; grouping neighboring vectors in the multi-dimensional feature space into a set of vector groups; and in response to receiving a first inspection result indicating a defect in a first assembly cell of the set of assembly cells associated with a first vector of a first set of vectors in the set of vector groups, labeling the first set of vectors with the defect and labeling a second assembly cell associated with a second vector of the first set of vectors as exhibiting characteristics of the defect.)