阅读说明：本技术 一种透明或半透明固体折射率的测定方法 (Method for measuring refractive index of transparent or semitransparent solid ) 是由 初凤红 张露 于 2019-10-10 设计创作，主要内容包括：本发明提供一种透明或半透明固体折射率的测定方法,用于通过预定仪器测定透明或半透明的待测固体的折射率,包括如下步骤：将待测固体的前驱体溶液滴在预定仪器的折射棱镜上；将预定仪器的进光棱镜与折射棱镜压紧固定,使得前驱体溶液均匀贴合在进光棱镜与折射棱镜之间；通过前驱体溶液的预定固化条件,使得前驱体溶液固化,从而形成具有符合预定仪器测定要求的抛光面的固体薄膜,作为待测固体薄膜；通过预定仪器测定待测固体薄膜的折射率。本发明能够直接测定待测固体的折射率,而无需对待测固体进行抛光,测定效率更高,且精度更高,很好的解决了待测固体抛光面不符合要求引起的读数视野不清晰的问题。(The invention provides a method for measuring the refractive index of a transparent or semitransparent solid, which is used for measuring the refractive index of the transparent or semitransparent solid to be measured by a preset instrument and comprises the following steps: dripping precursor solution of a solid to be detected on a refraction prism of a preset instrument; compressing and fixing a light inlet prism and a refraction prism of a preset instrument to enable the precursor solution to be uniformly attached between the light inlet prism and the refraction prism; solidifying the precursor solution through a preset solidification condition of the precursor solution, thereby forming a solid film with a polished surface meeting the measurement requirement of a preset instrument as a solid film to be measured; the refractive index of the solid film to be measured is measured by a predetermined instrument. The method can directly measure the refractive index of the solid to be measured without polishing the solid to be measured, has higher measuring efficiency and higher precision, and well solves the problem of unclear reading visual field caused by unsatisfactory polished surface of the solid to be measured.)

1. A method for measuring the refractive index of a transparent or semitransparent solid, which is used for measuring the refractive index of the transparent or semitransparent solid to be measured by a preset instrument, and is characterized by comprising the following steps:

step S1, dripping the precursor solution of the solid to be detected on a refraction prism of the preset instrument;

step S2, pressing and fixing the light inlet prism and the refraction prism of the preset instrument, so that the precursor solution of the solid to be detected is uniformly attached between the light inlet prism and the refraction prism of the preset instrument;

step S3, solidifying the precursor solution between the light-entering prism and the refraction prism of the predetermined instrument through the predetermined solidification condition of the precursor solution of the solid to be detected, so as to form a solid film which accords with the measurement requirement of the predetermined instrument and is a polished surface, and the solid film is used as the solid film to be detected;

and step S4, measuring the refractive index of the solid film to be measured through the predetermined instrument.

2. The method for measuring the refractive index of a transparent or translucent solid according to claim 1, wherein:

in step S3, the predetermined curing condition is one or more of a predetermined temperature, a predetermined radiation and a predetermined time.

3. The method for measuring the refractive index of a transparent or translucent solid according to claim 2, wherein:

wherein the predetermined radiation is any one of ultraviolet radiation, electron beam radiation, infrared radiation, visible light radiation, laser radiation, and chemiluminescent radiation.

4. The method for measuring the refractive index of a transparent or translucent solid according to claim 1, wherein:

wherein the precursor solution of the solid to be detected has physical or chemical curing properties corresponding to the predetermined curing conditions.

5. The method for measuring the refractive index of a transparent or translucent solid according to claim 2, wherein:

and the precursor solution of the solid to be detected is provided with a preset curing initiator corresponding to the preset radiation.

6. The method for measuring the refractive index of a transparent or translucent solid according to claim 5, wherein:

wherein the predetermined curing initiator is a photoinitiator,

the photoinitiator is any one of 2-hydroxy-2-methyl-propiophenone, 1-hydroxycyclohexyl phenyl ketone, 2, 4, 6-trimethyl benzoyl phenyl ethyl phosphonate, 2-methyl-2- (4-morpholinyl) -1- [4- (methylthio) phenyl ] -1-acetone and 2, 4, 6-trimethyl benzoyl-diphenyl phosphine oxide.

7. The method for measuring the refractive index of a transparent or translucent solid according to claim 1, wherein:

wherein the predetermined instrument is an Abbe refractometer.

Technical Field

The invention belongs to the field of instruments and relates to a method for measuring the refractive index of a solid, in particular to a method for measuring the refractive index of a transparent or semitransparent solid.

Background

The refractive index is the ratio of the propagation speed of light in vacuum to the propagation speed of light in the medium, and the higher the refractive index of a material is, the stronger the ability to refract incident light is, and the thinner the edge of the same material having a higher refractive index is than the edge having a lower refractive index is, and the properties of an object can be reflected by measuring the refractive index of the object.

In measuring the refractive index of an object, the measurement is performed by using a refractometer such as an abbe refractometer. The abbe refractometer measures the refractive index of an object based on the law of refraction, mainly measures the refractive index of a transparent liquid, and can also measure the refractive index and average dispersion of a transparent, semitransparent liquid or solid.

When the refractive index of transparent liquid is measured by an Abbe refractometer, the reading is clear, the operation is simple, but when the refractive index of transparent or semitransparent solid is measured, the measured solid needs to have a smooth polished surface, if the polished surface is not smooth enough, the measured solid cannot be in full contact with a refraction prism of the Abbe refractometer, so that an observer cannot see a clear bright and dark cut-off line during reading, the visual field is very dark, the accurate reading is difficult, and the measurement precision of the refractive index is influenced. Meanwhile, the polished surface of the measured solid has high requirement on the smoothness, the manufacturing process is difficult and materials are wasted.

Disclosure of Invention

In order to solve the problems, the invention provides a method for measuring the refractive index of a bright or semitransparent solid, which can accurately measure the degree and improve the measurement precision of the refractive index without the need of a solid to be measured to have a flat polished surface, and adopts the following technical scheme:

the invention provides a method for measuring the refractive index of a transparent or semitransparent solid, which is used for measuring the refractive index of the transparent or semitransparent solid to be measured by a preset instrument and is characterized by comprising the following steps of:

step S1, dripping the precursor solution of the solid to be detected on a refraction prism of a preset instrument;

s2, pressing and fixing a light inlet prism and a refraction prism of a preset instrument to ensure that a precursor solution of a solid to be detected is uniformly attached between the light inlet prism and the refraction prism;

step S3, solidifying the precursor solution between the light-entering prism and the refraction prism of the predetermined instrument through the predetermined solidification condition of the precursor solution of the solid to be detected, thereby forming the solid film of the polished surface which meets the measurement requirement of the predetermined instrument and is used as the solid film to be detected;

step S4, the refractive index of the solid thin film to be measured is measured by a predetermined instrument.

The method for measuring the refractive index of the transparent or semitransparent solid provided by the invention can also have the technical characteristics that in the step S3, the preset curing condition is one or more of preset temperature, preset radiation and preset time.

The method for measuring the refractive index of a transparent or translucent solid provided by the present invention may further have a technical feature in which the predetermined radiation is any one of ultraviolet radiation, electron beam radiation, infrared radiation, visible light radiation, laser radiation, and chemo-fluorescence radiation.

The method for measuring the refractive index of the transparent or semitransparent solid provided by the invention can also have the technical characteristics that the precursor solution of the solid to be measured has physical or chemical curing properties corresponding to the preset curing conditions.

The method for measuring the refractive index of the transparent or semitransparent solid provided by the invention can also have the technical characteristics that the precursor solution of the solid to be measured is provided with a preset curing initiator corresponding to preset radiation.

The method for measuring the refractive index of a transparent or translucent solid provided by the present invention may further have a technical feature that the predetermined curing initiator may be a photoinitiator, and the photoinitiator may be any one of 2-hydroxy-2-methyl-propiophenone, 1-hydroxycyclohexyl phenyl ketone, ethyl 2, 4, 6-trimethylbenzoylphenylphosphonate, 2-methyl-2- (4-morpholinyl) -1- [4- (methylthio) phenyl ] -1-propanone, and 2, 4, 6-trimethylbenzoyl-diphenylphosphine oxide.

The method for measuring the refractive index of a transparent or semitransparent solid provided by the invention can also have the technical characteristics that the predetermined instrument is an Abbe refractometer.

Action and Effect of the invention

According to the method for measuring the refractive index of the transparent or semitransparent solid, the precursor solution of the solid to be measured has physical or chemical curing properties corresponding to the preset curing conditions, for example, the precursor solution has a preset curing initiator corresponding to the preset radiation; dripping precursor solution of a solid to be detected on a refraction prism of a preset instrument; compressing and fixing a light inlet prism and a refraction prism of a preset instrument to ensure that a precursor solution of a solid to be detected is uniformly attached between the light inlet prism and the refraction prism; irradiating the precursor solution of the solid to be detected by a curing light source with a preset wavelength, so that the precursor solution of the solid to be detected is cured between a light inlet prism and a refraction prism of a preset instrument under the action of a photoinitiator, and thus a solid film with a polished surface meeting the measurement requirement is formed and used as the solid film to be detected; the refractive index of the solid film to be measured was measured by the above-mentioned predetermined instrument. Therefore, compared with the method that the solid to be measured needs to be polished in advance and then the refractive index is measured in the prior art, the method can directly measure the refractive index of the solid to be measured without polishing the solid to be measured, and has the advantages of simpler operation and higher measurement efficiency. Furthermore, because the solid film to be measured is formed between the light inlet prism and the refraction prism, the surface of the solid film to be measured is smoother, and the solid film to be measured is in more sufficient contact with the refraction prism, so that the visual field can be fresher when the reading is measured, and the measurement precision of the refractive index can be improved. However, this method must consider whether the precursor solution is easily removed from the intended instrument before and after solidification, and does not damage the instrument.

Drawings

FIG. 1 is a schematic view showing the overall flow of a method for measuring the refractive index of a transparent or translucent solid according to the present invention;

FIG. 2 is a schematic diagram of curing initiated by a precursor solution of a solid to be measured under ultraviolet lamp radiation between a light-entering prism and a refraction prism of an Abbe refractometer in the embodiment of the invention;

FIG. 3 is a schematic diagram of a solid film formed by a solid precursor solution to be measured after being cured between a light-entering prism and a refraction prism according to an embodiment of the present invention;

FIG. 4 is a graph showing the measurement results of the method for measuring the refractive index of a transparent or translucent solid according to the embodiment of the present invention.

Detailed Description

The conception, the specific structure and the technical effects of the present invention will be further described with reference to the accompanying drawings to fully understand the objects, the features and the effects of the present invention.

FIG. 1 is a schematic view showing the overall flow of the method for measuring the refractive index of a transparent or translucent solid according to the present invention.

As shown in fig. 1, in step S1, drop 1-2 of the prepared precursor solution of the solid to be tested is dropped on the refraction prism of the predetermined instrument, and the light prism cover is quickly covered.

In this embodiment, the predetermined instrument is an abbe refractometer, and specifically, a 2WA-J abbe refractometer or the like can be used. Prior to the measurement, the reading must be calibrated against the intended instrument.

The specific calibration process of the 2WA-J Abbe refractometer is as follows: dropping 1-2 drops of naphthalene bromide on the polished surface of the refraction prism, and then attaching the polished surface of the standard sample. When the reading view field indicates the value on the standard sample, observing whether the bright and dark cut-off line is in the middle of the cross line through the ocular lens, if the bright and dark cut-off line has deviation, slightly rotating the adjusting screw by using a screwdriver to drive the objective lens to deflect, and enabling the bright and dark cut-off line to move to the center of the cross line. After calibration, the calibration screw is not allowed to be moved during the measurement.

In this example, the refractive index of the hydrogel solid is measured as an example. 3.571ml of polyethylene glycol diacrylate, 4.354ml of deionized water and 74.28 mul of 2-hydroxy-2-methyl-propiophenone are selected to prepare a precursor solution of the hydrogel solid to be detected.

The precursor solution of the solid to be detected must have physical or chemical curing properties corresponding to the predetermined curing conditions, so that the precursor solution of the solid to be detected can initiate curing under the predetermined conditions, and the curing conditions are the same as the forming conditions of the solid to be detected.

The predetermined curing condition is one or more of a predetermined temperature, a predetermined radiation and a predetermined time, so that the precursor solution of the solid to be detected can be cured under the predetermined curing condition.

Taking the hydrogel solid as an example, a precursor solution of the hydrogel solid has a predetermined curing initiator corresponding to a predetermined radiation.

In this embodiment, the predetermined curing initiator in the precursor solution of the hydrogel solid is 2-hydroxy-2-methyl-propiophenone, so that the hydrogel precursor solution is subjected to photocrosslinking curing under the radiation of an ultraviolet lamp, and the formed hydrogel solid is a semitransparent solid, and if the refractive index of the solid is measured according to a conventional abbe refractometer, a clear bright-dark cut-off cannot be seen under the abbe refractometer after the hydrogel precursor solution is polished, so that the accurate refractive index of the hydrogel solid cannot be read. The method for measuring the solid by the invention is used for measuring the refractive index of the hydrogel solid, and is greatly improved.

In this embodiment, the prepared hydrogel precursor solution contains a photoinitiator, and can be cured under ultraviolet radiation to form a hydrogel solid to be detected, and the precursor solution of the solid to be detected is easily removed from an instrument before and after curing, and the instrument is not damaged.

FIG. 2 is a schematic diagram of curing initiated by a precursor solution of a solid to be measured under ultraviolet lamp radiation between a light-entering prism and a refraction prism of an Abbe refractometer in the embodiment of the invention; fig. 3 is a schematic diagram of a solid film formed by solidifying a precursor solution of a solid to be measured between a light-entering prism and a refraction prism according to an embodiment of the present invention. As shown in fig. 2 and 3, in step S2, the light-entering prism and the refraction prism of the abbe refractometer are pressed and fixed, and the light-shielding plate is opened, so that the hydrogel solid precursor solution is uniformly attached between the light-entering prism and the refraction prism.

And step S3, solidifying the precursor solution of the hydrogel solid through a preset solidifying condition of the precursor solution, thereby forming a solid film with a polished surface meeting the measuring requirement of a preset instrument as the solid film to be measured.

In this example, an abbe refractometer was irradiated with an ultraviolet lamp (365nm, 5mWcm-2) for 5 minutes, and the ultraviolet light entered the abbe refractometer through a light entrance prism, and the hydrogel precursor solution in the gap between the light entrance prism and the refraction prism was cured to form a layer of hydrogel solid film having a polished surface and sufficiently adhering to the surface of the refraction prism.

And step S4, measuring the refractive index of the hydrogel solid film through an Abbe refractometer, namely the refractive index of the solid to be measured.

FIG. 4 is a graph showing the measurement results of the method for measuring the refractive index of a transparent or translucent solid according to the embodiment of the present invention.

As shown in fig. 4, the predetermined instrument measures the refractive index of the solid thin film to be measured to be 1.4080 by seeing a clear bright-dark cut-off line. Compared with the prior art, the measuring result is more accurate after polishing the solid to be measured in advance and then measuring the refractive index, the solid to be measured does not need to be polished, the measuring speed is higher, the efficiency is higher, and the problem that the reading visual field is not clear due to the fact that the polished surface of the solid to be measured does not meet the requirement is well solved.