Method and solution for cleaning INGAAS (or III-V) substrates
阅读说明:本技术 用于清洁ingaas(或iii-v族)基板的方法和解决方案 (Method and solution for cleaning INGAAS (or III-V) substrates ) 是由 春·燕 鲍新宇 于 2016-11-01 设计创作,主要内容包括:本文所述的实施方式大体涉及针对在III-V族沟道材料的外延生长之前清洁基板的改善的方法和解决方案。使用第一处理气体以从基板表面移除原生氧化物层,第一处理气体包括惰性气体和氢源。随后使用第二处理气体Ar/Cl<Sub>2</Sub>/H<Sub>2</Sub>以在基板表面上产生反应性表面层。最后,使用第三处理气体进行氢烘烤(hydrogen bake)以从基板表面移除反应性层,第三处理气体包括氢源和胂源。(Practice of the inventionApproaches generally relate to improved methods and solutions for cleaning a substrate prior to epitaxial growth of a III-V channel material. A first process gas is used to remove a native oxide layer from a substrate surface, the first process gas including an inert gas and a hydrogen source. Followed by a second process gas Ar/Cl 2 /H 2 To produce a reactive surface layer on the substrate surface. Finally, a hydrogen bake (hydrogen bake) is performed using a third process gas to remove the reactive layer from the substrate surface, the third process gas including a hydrogen source and an arsine source.)
1. A processing system for processing a substrate, comprising:
a transfer chamber;
a first chamber coupled to the transfer chamber;
a second chamber coupled to the transfer chamber;
a load lock chamber coupled to the transfer chamber;
a wafer transfer mechanism disposed within the transfer chamber, the wafer transfer mechanism capable of transferring a wafer between the first chamber or the second chamber and the load lock chamber; and
a wafer alignment chamber connecting the load lock chamber to the transfer chamber.
2. The processing system of claim 1, wherein the first chamber is an etch chamber.
3. The processing system of claim 1, wherein the second chamber is a deposition chamber.
4. The processing system of claim 1, further comprising one or more additional chambers coupled to the transfer chamber.
5. The processing system of claim 4, wherein the one or more additional chambers are selected from the group consisting of:
a deposition chamber, an etch chamber, a cleaning chamber, an annealing chamber, an oxidation chamber, a plasma chamber, a remote plasma chamber, a thermal chamber, a CVD chamber, a physical vapor deposition chamber, a rapid thermal processing chamber, an atomic layer deposition chamber, or an atomic layer etch chamber.
6. The processing system of claim 1, wherein the wafer transfer mechanism is configured to transfer the wafer from the load lock chamber to the first chamber or the second chamber.
7. The processing system of claim 1, wherein the wafer transfer mechanism is configured to transfer the wafer from the first chamber to the second chamber.
8. A method for cleaning a substrate, the method comprising:
introducing a first process gas into the chamber, the first process gas comprising an inert gas and a hydrogen source;
activating the first process gas;
exposing the substrate having a native oxide layer thereon to an activated first process gas;
introducing a second process gas into the chamber, the second process gas comprising Cl2And H2;
Activating the second process gas;
exposing the substrate to an activated second process gas;
introducing a third process gas into the chamber, the third process gas comprising the hydrogen source and an arsine source; and
exposing the substrate to the third process gas.
9. The method of claim 8, wherein the first process gas comprises Ar and H2。
10. The method of claim 8, wherein the third process gas comprises H2And tert-butyl arsine.
11. The method of claim 8, wherein activating the first process gas and activating the second process gas occur at a source power between about 150W and about 1000W, and wherein activating the first process gas occurs at a bias power between about 10W and about 50W, and activating the second process gas occurs at a bias power between about 0W and about 30W.
12. A method for cleaning a substrate, the method comprising:
introducing a first process gas into the first chamber, the first process gas comprising an inert gas and a hydrogen source;
activating the first process gas;
exposing the substrate having a native oxide layer thereon to an activated first process gas;
second treating gas is introducedIntroducing a gas into the first chamber, the second process gas comprising Cl2And H2;
Activating the second process gas;
exposing the substrate to an activated second process gas;
transferring the substrate to a second chamber;
introducing a third process gas into the second chamber, the third process gas comprising the hydrogen source and an arsine source; and
exposing the substrate to the third process gas.
13. The method of claim 12, wherein the first process gas comprises Ar and H2。
14. The method of claim 12, wherein the third process gas comprises H2And tert-butyl arsine.
15. The method of claim 12, wherein the temperature of the second chamber is between about 300 ℃ and about 800 ℃.
16. The method of claim 12, wherein the pressure in the first chamber is between about 5mT and about 100mT and the pressure in the second chamber is between about 10T and about 600T.
17. A method for manufacturing a substrate, the method comprising:
introducing a first process gas into the first chamber, the first process gas comprising Ar and H2;
Activating the first process gas;
exposing the substrate having a native oxide layer thereon to an activated first process gas;
introducing a second process gas into the first chamber, the second process gas comprising Cl2And H2;
Activating the second process gas;
exposing the substrate to an activated second process gas;
transferring the substrate to a second chamber;
introducing a third process gas into the second chamber, the third process gas comprising H2And tert-butyl arsine;
exposing the substrate to the third process gas; and
depositing an epitaxial material over a surface of the substrate.
18. The method of claim 17, wherein the first chamber is an etch chamber and the second chamber is a deposition chamber.
19. The method of claim 17, wherein the epitaxial material is a III-V material.
20. The method of claim 17, wherein the epitaxial material is InAs.
Technical Field
Embodiments of the present disclosure generally relate to the fabrication of semiconductor devices. More specifically, improved methods and solutions are described for cleaning a substrate surface prior to epitaxial growth.
Background
Epitaxial growth is widely used in the manufacture of semiconductor devices, display devices, and other devices. Prior to depositing an epitaxial layer on a substrate, a surface cleaning process is performed to remove native oxide and/or other impurities from the deposition surface and improve the quality of the epitaxial layer formed.
The deposition of group III-V elements may be advantageous in certain applications of silicon-based devices. For example, due to low contact resistance, excellent electron mobility, and lower operating voltage, group III-V elements may be used as channel or fin (fin) materials for sub-7 nanometer (nm) Complementary Metal Oxide Semiconductor (CMOS) devices. However, there are major challenges for growing group III-V materials on group III-V, such as lattice mismatch, valence difference, thermal property difference, conductivity difference, and anti-phase defect (anti-phase defect).
Current wet or dry cleaning processes may not be suitable for reliable fabrication of next generation devices with III-V materials, such as InP, InAs, GaAs, and InGaAs, because these wet or dry cleaning processes are high power, high temperature (> 600 ℃) processes. Furthermore, these wet or dry cleaning processes are not suitable for cleaning materials within very small features (< 7nm), and they produce damaged surface layers.
Accordingly, there is a need in the art for improved methods and solutions for cleaning InGaAs or III-V substrates prior to epitaxial growth of III-V channel materials.
Disclosure of Invention
Embodiments described herein generally provide methods of cleaning a substrate surface. The method includes positioning a substrate having a native oxide layer thereon on a support in a chamber. A first process gas may be introduced into the chamber, the first process gas including an inert gas (noble gas) and a hydrogen source. The first process gas may be activated. A native oxide layer of a substrate may be contacted with an activated first process gas to activate the native oxide layer or partially remove the native oxide layer. After activating the native oxide layer or partially removing the native oxide layer, a second process gas (Ar/Cl) may be introduced2/H2) Is introduced into the chamber. The second process gas may be activated. The substrate may be contacted with a second process gas to produce a reactive surface layer. A third process gas may be introduced into the chamber, the third process gas including a hydrogen source and an arsine (arsine) source. Finally, the substrate may be contacted with a third process gas to remove the reactive surface layer.
In another embodiment, a method of cleaning a surface of a substrate is provided. The method includes positioning a substrate having a native oxide layer thereon on a support in a first chamber. A first process gas may be introduced into the first chamber, the first process gas including an inert gas and a hydrogen source. The first process gas may be activated. A native oxide layer of a substrate may be contacted with an activated first process gas to activate the native oxide layer or partially remove the native oxide layer. After activating the native oxide layer or partially removing the native oxide layer, a second process gas (Ar/Cl) may be introduced2/H2) Is introduced into the first chamber. The second process gas may be activated. The substrate may be contacted with a second process gas to produce a reactive surface layer. Can be combined withThe substrate is transferred to the second chamber. A third process gas may be introduced into the second chamber, the third process gas including a hydrogen source and an arsine source. Finally, the substrate may be contacted with a third process gas to remove the reactive surface layer.
In yet another embodiment, a method of fabricating a substrate is provided. The method includes positioning a substrate having a native oxide layer thereon on a support in a first chamber. The first process gas (Ar/H) may be introduced2) Is introduced into the first chamber. The first process gas may be ionized. A native oxide layer of a substrate may be contacted with an activated first process gas to activate the native oxide layer or partially remove the native oxide layer. After activating the native oxide layer or partially removing the native oxide layer, a second process gas (Ar/Cl) may be introduced2/H2) Is introduced into the first chamber. The second process gas may be activated. The substrate may be contacted with a second process gas to produce a reactive surface layer. The substrate may be transferred to the second chamber. A third process gas (H) may be introduced2T-butyl arsine (TBA)) is introduced into the second chamber. The substrate may be contacted with a third process gas to remove the reactive surface layer. Finally, a III-V channel material may be deposited over the substrate surface.
Drawings
So that the manner in which the above recited features of the present disclosure can be understood in detail, a more particular description of the disclosure, briefly summarized above, may be had by reference to embodiments, some of which are illustrated in the appended drawings. It is to be noted, however, that the appended drawings illustrate only typical embodiments and are therefore not to be considered limiting of its scope, for the disclosure may admit to other equally effective embodiments.
FIG. 1 is a flow chart summarizing a method according to one embodiment described herein.
Fig. 2A-2C depict schematic cross-sectional side views of stages in the manufacture of a device structure according to the method of fig. 1.
Fig. 3 is a schematic diagram of an apparatus for performing a method according to one embodiment described herein.
To facilitate understanding, identical reference numerals have been used, where possible, to designate identical elements that are common to the figures. It is contemplated that elements and features of one embodiment may be beneficially incorporated in other embodiments without further recitation.
Detailed Description
Embodiments described herein generally relate to methods and solutions for cleaning a substrate surface prior to epitaxial growth of a III-V channel material. Exemplary substrates for use in the method include InGaAs substrates. Plasma dry cleaning and thermal processing at lower temperatures are used to manage variations in substrate surface contamination and roughness. A substrate is placed in a first processing chamber. A first precursor is flowed into a first processing chamber and activated with low energy and power to create reactive sites on a substrate surface. The low energy plasma then reacts with the substrate surface to create a reactive layer on the substrate surface. The substrate is then transferred into a second processing chamber having a low temperature. A second precursor is injected into the second processing chamber, removing the reactive layer and leaving a very clean substrate surface ready for epitaxial growth of III-V channel material. The first processing chamber may be an etch chamber and the second processing chamber may be an epitaxial deposition chamber.
Fig. 1 is a flow chart summarizing a
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The first processing chamber is a plasma processing chamber. In one embodiment, the first processing chamber is an etch chamber. In another embodiment, the first processing chamber is a vapor deposition chamber. The etch chamber may be a commercially available process chamber, such as AdvantEdge available from applied materials, Inc. of Santa Clara, CalifTMMesaTMA hardware configuration, or any suitable semiconductor processing chamber suitable for performing an epitaxial deposition process.
The
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At the end of the
FIG. 1 illustrates one embodiment of a method for cleaning a substrate. In another embodiment, the operations of the
The methods disclosed herein may be performed in a single chamber or in multiple chambers of a single apparatus. Fig. 3 is a schematic diagram of an
As shown in fig. 2A, the
The use of a
Although fig. 3 depicts one example of an apparatus having two processing chambers for performing the methods described herein, other apparatus and chamber configurations for performing the methods are contemplated herein. For example, more than two processing chambers may be attached to the
Accordingly, methods and solutions are provided for cleaning a substrate prior to epitaxial growth of a III-V channel material. The disclosed cleaning prior to epitaxial growth facilitates highly selective epitaxial growth of group III-V materials on InGaAs substrates in sub-7 nm CMOS devices. Advantages of the present disclosure include reducing the oxygen content on the substrate surface to less than 5.0E +11 atoms/cm2Without compromising surface smoothness.
While the foregoing is directed to embodiments of the present disclosure, other and further embodiments of the disclosure may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.
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