阅读说明：本技术 探头覆盖率测试方法、装置及电子设备 (Probe coverage rate testing method and device and electronic equipment ) 是由 魏运飞 何元春 狄国标 张学峰 刘金刚 邹阳 赵新宇 黄乐庆 路士平 王晓东 徐 于 2019-09-04 设计创作，主要内容包括：本发明实施例涉及超声波探伤技术领域,具体而言,涉及一种探头覆盖率测试方法、装置及电子设备。在该方法中,当探头在滑槽中沿设定方向进行移动时,能够获取探头的多个接收通道采集的第一超声波,并根据第一超声波和探头在所述设定方向上的位置,得到波高曲线图,然后根据波高曲线图,确定出探头的叠加余量,从而根据叠加余量,判断探头的覆盖率是否合格,如此,能够获取同时处于工作状态的多个接收通道采集的第一超声波,从而将多个接收通道的重叠现象考虑在内,避免单独对测试每个接收通道的覆盖率,如此,能够实现对探头覆盖率的准确测试,进而能够准确地判断探头覆盖率是否合格。(The embodiment of the invention relates to the technical field of ultrasonic flaw detection, in particular to a probe coverage rate testing method and device and electronic equipment. According to the method, when the probe moves in the sliding groove along the set direction, first ultrasonic waves collected by a plurality of receiving channels of the probe can be obtained, a wave height curve graph is obtained according to the first ultrasonic waves and the position of the probe in the set direction, then the overlapping allowance of the probe is determined according to the wave height curve graph, and whether the coverage rate of the probe is qualified or not is judged according to the overlapping allowance, so that the first ultrasonic waves collected by the plurality of receiving channels in the working state at the same time can be obtained, the overlapping phenomenon of the plurality of receiving channels is taken into consideration, the coverage rate of each receiving channel is prevented from being tested independently, accurate test of the coverage rate of the probe can be achieved, and whether the coverage rate of the probe is qualified or not can be judged accurately.)

1. A probe coverage rate testing method is used for testing the coverage rate of a probe, the probe comprises a plurality of receiving channels, the probe is movably arranged in a sliding groove formed in a first side surface of a testing piece, a flat bottom hole is formed in a second side surface of the testing piece, and the first side surface and the second side surface are opposite surfaces of the testing piece, and the method comprises the following steps:

when the probe moves in the sliding groove along a set direction, first ultrasonic waves collected by the multiple receiving channels are obtained; wherein the first ultrasonic wave is a reflected wave of a second ultrasonic wave at the flat bottom hole, and the second ultrasonic wave is emitted by the probe;

obtaining a wave height curve chart according to the first ultrasonic wave and the position of the probe in the set direction;

determining the superposition allowance of the probe according to the wave height curve graph;

and judging whether the coverage rate of the probe is qualified or not according to the superposition allowance.

2. The probe coverage testing method according to claim 1, wherein the probe includes a first receiving channel, a second receiving channel and a third receiving channel arranged in sequence along the set direction, and the acquiring the first ultrasonic waves collected by the plurality of receiving channels when the probe moves in the chute along the set direction includes:

when the probe moves in the chute along the set direction, first ultrasonic waves collected by the first receiving channel, the second receiving channel and the third receiving channel are respectively obtained.

3. The probe coverage rate testing method according to claim 2, wherein the wave height graph comprises a first wave height curve, a second wave height curve and a third wave height curve, wherein the first wave height curve is obtained according to the position and the first ultrasonic wave collected by the first receiving channel, the second wave height curve is obtained according to the position and the first ultrasonic wave collected by the second receiving channel, the third wave height curve is obtained according to the position and the first ultrasonic wave collected by the third receiving channel, and the determining of the overlapping margin of the probe according to the wave height graph comprises:

determining a maximum wave height value from the first wave height curve, the second wave height curve and the third wave height curve;

obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment;

determining a first wave height value at the intersection of the first wave height curve and the second wave height curve and a second wave height value at the intersection of the second wave height curve and the third wave height curve;

and determining the superposition allowance of the probe according to the first wave height value, the second wave height value and the reference wave height value.

4. The probe coverage testing method of claim 3, wherein determining the superposition margin of the probe according to the first wave height value, the second wave height value and the reference wave height value comprises:

determining a first superposition allowance of the probe according to the first wave height value and the reference wave height value;

and determining a second superposition margin of the probe according to the second wave height value and the reference wave height value.

5. The probe coverage rate testing method according to claim 4, wherein the judging whether the coverage rate of the probe is qualified according to the superposition margin comprises:

judging whether the first superposition allowance and the second superposition allowance are both larger than or equal to zero;

if the first superposition allowance and the second superposition allowance are both larger than or equal to zero, judging that the coverage rate of the probe is qualified;

and if the first superposition allowance is smaller than zero or the second superposition allowance is smaller than zero, judging that the coverage rate of the probe is not qualified.

6. A probe coverage testing arrangement for testing the coverage of a probe, the probe including a plurality of receiving channels, the probe being movably disposed in a chute formed in a first side of a test piece, a flat bottom hole being formed in a second side of the test piece, the first and second sides being opposite sides of the test piece, the arrangement comprising:

the first ultrasonic acquisition module is used for acquiring first ultrasonic waves acquired by the plurality of receiving channels when the probe moves in the sliding groove along a set direction; wherein the first ultrasonic wave is a reflected wave of a second ultrasonic wave at the flat bottom hole, and the second ultrasonic wave is emitted by the probe;

the wave height curve graph determining module is used for obtaining a wave height curve graph according to the first ultrasonic wave and the position of the probe in the set direction;

the superposition allowance determining module is used for determining the superposition allowance of the probe according to the wave height curve graph;

and the coverage rate testing module is used for judging whether the coverage rate of the probe is qualified or not according to the superposition allowance.

7. The probe coverage testing device of claim 6, wherein the probe comprises a first receiving channel, a second receiving channel and a third receiving channel which are arranged in sequence along the set direction;

the first ultrasonic acquisition module is configured to:

when the probe moves in the chute along the set direction, the first ultrasonic waves collected by the first receiving channel, the second receiving channel and the third receiving channel are respectively obtained;

the wave height curve graph comprises a first wave height curve, a second wave height curve and a third wave height curve, wherein the first wave height curve is obtained according to the position and first ultrasonic waves collected by the first receiving channel, the second wave height curve is obtained according to the position and first ultrasonic waves collected by the second receiving channel, and the third wave height curve is obtained according to the position and first ultrasonic waves collected by the third receiving channel;

the wave height profile determination module is configured to:

determining a maximum wave height value from the first wave height curve, the second wave height curve and the third wave height curve; obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment; determining a first wave height value at the intersection of the first wave height curve and the second wave height curve and a second wave height value at the intersection of the second wave height curve and the third wave height curve; and determining the superposition allowance of the probe according to the first wave height value, the second wave height value and the reference wave height value.

8. The probe coverage testing apparatus of claim 7, wherein the overlay margin determination module is configured to:

determining a first superposition allowance of the probe according to the first wave height value and the reference wave height value; and determining a second superposition margin of the probe according to the second wave height value and the reference wave height value.

9. The probe coverage testing apparatus of claim 8, wherein the coverage testing module is configured to:

judging whether the first superposition allowance and the second superposition allowance are both larger than or equal to zero; if the first superposition allowance and the second superposition allowance are both larger than or equal to zero, judging that the coverage rate of the probe is qualified; and if the first superposition allowance is smaller than zero or the second superposition allowance is smaller than zero, judging that the coverage rate of the probe is not qualified.

10. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the probe coverage testing method when executing the computer program.

Technical Field

The embodiment of the invention relates to the technical field of ultrasonic flaw detection, in particular to a probe coverage rate testing method and device and electronic equipment.

Background

Ultrasonic flaw detection is a method for inspecting materials by using the characteristic that ultrasonic energy penetrates into the depth of a material and is reflected at the edge of an interface when the ultrasonic energy enters another section from the section. A Transmit-Receive (TR) probe, which is a common ultrasonic probe, has been widely used in various fields. The TR probe comprises two types of one-transmitting multi-receiving and multiple-transmitting multi-receiving, wherein the one-transmitting multi-receiving means that the TR probe comprises a transmitting channel and a plurality of receiving channels, and the multiple-transmitting multi-receiving means that the TR probe comprises a plurality of transmitting channels and a plurality of receiving channels. However, the coverage rate of the TR probe is difficult to accurately test in the prior art.

Disclosure of Invention

In view of this, the invention provides a probe coverage rate testing method, a probe coverage rate testing device and electronic equipment.

The embodiment of the invention provides a probe coverage rate testing method, which is used for testing the coverage rate of a probe, wherein the probe comprises a plurality of receiving channels, the probe is movably arranged in a sliding groove formed in a first side surface of a testing piece, a flat bottom hole is formed in a second side surface of the testing piece, and the first side surface and the second side surface are opposite surfaces of the testing piece, and the method comprises the following steps:

when the probe moves in the sliding groove along a set direction, first ultrasonic waves collected by the multiple receiving channels are obtained; wherein the first ultrasonic wave is a reflected wave of a second ultrasonic wave at the flat bottom hole, and the second ultrasonic wave is emitted by the probe;

obtaining a wave height curve chart according to the first ultrasonic wave and the position of the probe in the set direction;

determining the superposition allowance of the probe according to the wave height curve graph;

and judging whether the coverage rate of the probe is qualified or not according to the superposition allowance.

Optionally, the probe includes a first receiving channel, a second receiving channel, and a third receiving channel that are sequentially arranged along the set direction, and when the probe moves in the chute along the set direction, the acquiring of the first ultrasonic waves collected by the multiple receiving channels includes:

when the probe moves in the chute along the set direction, first ultrasonic waves collected by the first receiving channel, the second receiving channel and the third receiving channel are respectively obtained.

Optionally, the determining the stacking allowance of the probe according to the wave height graph includes:

determining a maximum wave height value from the first wave height curve, the second wave height curve and the third wave height curve;

obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment;

determining a first wave height value at the intersection of the first wave height curve and the second wave height curve and a second wave height value at the intersection of the second wave height curve and the third wave height curve;

and determining the superposition allowance of the probe according to the first wave height value, the second wave height value and the reference wave height value.

Optionally, the determining the superposition margin of the probe according to the first wave height value, the second wave height value and the reference wave height value includes:

determining a first superposition allowance of the probe according to the first wave height value and the reference wave height value;

and determining a second superposition margin of the probe according to the second wave height value and the reference wave height value.

Optionally, the determining whether the coverage of the probe is qualified according to the superposition margin includes:

judging whether the first superposition allowance and the second superposition allowance are both larger than or equal to zero;

if the first superposition allowance and the second superposition allowance are both larger than or equal to zero, judging that the coverage rate of the probe is qualified;

and if the first superposition allowance is smaller than zero or the second superposition allowance is smaller than zero, judging that the coverage rate of the probe is not qualified.

The embodiment of the invention also provides a probe coverage rate testing device, which is used for testing the coverage rate of the probe, wherein the probe comprises a plurality of receiving channels, the probe is movably arranged in a sliding groove formed in a first side surface of a testing piece, a flat bottom hole is formed in a second side surface of the testing piece, and the first side surface and the second side surface are opposite surfaces of the testing piece, and the device comprises:

the first ultrasonic acquisition module is used for acquiring first ultrasonic waves acquired by the plurality of receiving channels when the probe moves in the sliding groove along a set direction; wherein the first ultrasonic wave is a reflected wave of a second ultrasonic wave at the flat bottom hole, and the second ultrasonic wave is emitted by the probe;

the wave height curve graph determining module is used for obtaining a wave height curve graph according to the first ultrasonic wave and the position of the probe in the set direction;

the superposition allowance determining module is used for determining the superposition allowance of the probe according to the wave height curve graph;

and the coverage rate testing module is used for judging whether the coverage rate of the probe is qualified or not according to the superposition allowance.

Optionally, the probe includes a first receiving channel, a second receiving channel, and a third receiving channel arranged in sequence along the setting direction;

the first ultrasonic acquisition module is configured to:

when the probe moves in the chute along the set direction, the first ultrasonic waves collected by the first receiving channel, the second receiving channel and the third receiving channel are respectively obtained;

the wave height curve graph comprises a first wave height curve, a second wave height curve and a third wave height curve, wherein the first wave height curve is obtained according to the position and first ultrasonic waves collected by the first receiving channel, the second wave height curve is obtained according to the position and first ultrasonic waves collected by the second receiving channel, and the third wave height curve is obtained according to the position and first ultrasonic waves collected by the third receiving channel;

the wave height profile determination module is configured to:

determining a maximum wave height value from the first wave height curve, the second wave height curve and the third wave height curve; obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment; determining a first wave height value at the intersection of the first wave height curve and the second wave height curve and a second wave height value at the intersection of the second wave height curve and the third wave height curve; and determining the superposition allowance of the probe according to the first wave height value, the second wave height value and the reference wave height value.

Optionally, the superimposition margin determination module is configured to:

determining a first superposition allowance of the probe according to the first wave height value and the reference wave height value; and determining a second superposition margin of the probe according to the second wave height value and the reference wave height value.

Optionally, the coverage rate testing module is configured to:

judging whether the first superposition allowance and the second superposition allowance are both larger than or equal to zero; if the first superposition allowance and the second superposition allowance are both larger than or equal to zero, judging that the coverage rate of the probe is qualified; and if the first superposition allowance is smaller than zero or the second superposition allowance is smaller than zero, judging that the coverage rate of the probe is not qualified.

The embodiment of the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the probe coverage testing method is implemented.

The embodiment of the invention also provides a computer-readable storage medium, which comprises a computer program, and the computer program controls the electronic device where the computer-readable storage medium is located to execute the probe coverage testing method when running.

According to the probe coverage rate testing method, the probe coverage rate testing device and the electronic equipment, when the probe moves in the sliding groove along the set direction, the first ultrasonic waves collected by the multiple receiving channels of the probe can be obtained, the wave height curve graph is obtained according to the first ultrasonic waves and the position of the probe in the set direction, then the overlapping allowance of the probe is determined according to the wave height curve graph, and whether the coverage rate of the probe is qualified or not is judged according to the overlapping allowance.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic structural diagram of a test strip according to an embodiment of the present invention.

Fig. 2 is a schematic structural diagram of a probe according to an embodiment of the present invention.

Fig. 3 is a schematic structural diagram of a probe disposed in a chute of a test piece according to an embodiment of the present invention.

Fig. 4 is a flowchart of a probe coverage testing method according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of a wave height curve provided by an embodiment of the invention.

Fig. 6 is a functional block diagram of a probe coverage testing apparatus according to an embodiment of the present invention.

Icon:

1-a test piece; 11-a chute; 12-flat bottom hole;

2-a probe; 21-a transmission channel; 221-a first receive channel; 222-a second receive channel; 223-a third receive channel; 23-Sound insulating layer

3-probe coverage rate testing device; 31-a first ultrasound acquisition module; a 32-wave height profile determination module; 33-a superposition margin determination module; 34-coverage test module.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

The inventor finds that the coverage rate of the common TR probe is mostly tested by one-by-one testing the coverage width of a single receiving channel, taking a one-to-three receiving probe as an example, the effective coverage width of each tested receiving channel is 17mm, the total coverage width of the probe is 51mm, and if the width of the probe is 50mm, the coverage rate of the probe is 100.2%. However, the uniformity problem of each receiving channel is ignored by the method, if each receiving channel is tested independently, the influence of the difference between the receiving channels on the reflected wave of the defect is large, and in addition, if the distance between the receiving channels is large, the coverage rate of the tested probe is seriously large, so that the subsequent use of the probe is influenced.

The above prior art solutions have shortcomings which are the results of practical and careful study of the inventor, and therefore, the discovery process of the above problems and the solutions proposed by the following embodiments of the present invention to the above problems should be the contribution of the inventor to the present invention in the course of the present invention.

Based on the above research, the embodiment of the invention provides a probe coverage rate testing method, a probe coverage rate testing device and electronic equipment, which can realize accurate test of probe coverage rate.

Fig. 1 shows a schematic structural diagram of a test piece 1 according to an embodiment of the present invention, and as can be seen from the diagram, the test piece 1 may be a rectangular parallelepiped, a first side surface of the test piece 1 is provided with a sliding groove 11, and a second side surface of the test piece 1 is provided with a flat bottom hole 12.

It is understood that the hole diameter of the flat-bottom hole 12 can be set according to practical situations, for example, the hole diameter of the flat-bottom hole 12 can be 3mm, and can also be 5mm, and is not limited herein. In addition, the burial depth of the flat-bottom hole 12 can also be adjusted according to different probe test requirements, and generally, the burial depth of the flat-bottom hole 12 can be 6mm to 54mm, which is not limited herein.

In the embodiment of the present application, the chute 11 is used for placing the probe, and the probe can move in the chute 11 along a set direction, wherein the set direction is the X direction in fig. 1. In practice, the probe may be held by a press block and moved in the X direction through the flat bottom hole 12.

Referring to fig. 2, the probe 2 includes a transmitting channel 21, a first receiving channel 221, a second receiving channel 222, and a third receiving channel 223, wherein the transmitting channel 21 is located on one side of the sound insulation layer 23, the first receiving channel 221, the second receiving channel 222, and the third receiving channel 223 are located on the other side of the sound insulation layer 23, and the first receiving channel 221, the second receiving channel 222, and the third receiving channel 223 are sequentially arranged along a predetermined direction.

Referring to fig. 3, when the probe 2 is movably disposed in the sliding chute 11, the first receiving channel 221, the second receiving channel 222 and the third receiving channel 223 are close to the sliding chute 11.

Referring to fig. 4, fig. 4 is a flowchart illustrating a probe coverage testing method according to an embodiment of the invention. The specific process shown in fig. 4 will be described in detail below:

and S21, acquiring the first ultrasonic waves collected by the plurality of receiving channels when the probe moves in the chute along the set direction.

In the present embodiment, the first ultrasonic wave is a reflected wave of the second ultrasonic wave at the flat-bottom hole 12, and the second ultrasonic wave is emitted from the transmission channel 21 of the probe 2.

Referring to fig. 3, when the probe 2 moves in the sliding slot 11 along the X direction, the third receiving channel 223 first passes through the flat-bottom hole 12 along the X direction, then the second receiving channel 222, and finally the first receiving channel 221, in this process, the transmitting channel 21 emits the second ultrasonic wave, the reflection of the second ultrasonic wave at the flat-bottom hole 12 forms the first ultrasonic wave, the third receiving channel 223, the second receiving channel 222, and the first receiving channel 221 receive the first ultrasonic wave one after another, the third receiving channel 223 and the second receiving channel 222 overlap when receiving the first ultrasonic wave, and the second receiving channel 222 and the first receiving channel 221 also overlap when receiving the first ultrasonic wave. Compared with the common method for testing the coverage width of each receiving channel independently, the method provided by the embodiment of the application can take the overlapping between the adjacent receiving channels into account, so that the coverage rate of the probe can be accurately determined.

S22, a wave height graph is obtained based on the first ultrasonic wave and the position of the probe in the set direction.

In the embodiment of the present application, the wave height refers to the vertical distance between adjacent peaks and troughs, and by acquiring the first ultrasonic waves collected by the first receiving channel 221, the second receiving channel 222, and the third receiving channel 223, and combining the position (displacement) of the probe 2 relative to the test piece 1 when moving along the X direction, a wave height graph reflecting the relationship between the displacement and the wave height can be obtained, as shown in fig. 5. The wave height graph of fig. 5 includes a first wave height curve P1, a second wave height curve P2, and a third wave height curve P3. In fig. 5, the abscissa is the position of the probe 2 relative to the test piece 1, which can be understood as relative displacement, and the ordinate is the wave height value.

It is understood that the first wave height profile P1 is derived from the position relative to the test piece 1 when the probe 2 is moved in the X direction and the first ultrasonic waves collected by the first receiving channel 221, the second wave height profile P2 is derived from the position relative to the test piece 1 when the probe 2 is moved in the X direction and the first ultrasonic waves collected by the second receiving channel 222, and the third wave height profile P3 is derived from the position relative to the test piece 1 when the probe 2 is moved in the X direction and the first ultrasonic waves collected by the third receiving channel 223.

The first wave height curve P1, the second wave height curve P2 and the third wave height curve P3 are used for testing whether the covered road of the probe 2 is qualified.

In the embodiment of the present application, the unit of the wave height is dB.

And S23, determining the superposition margin of the probe according to the wave height curve graph.

In the embodiment of the application, the superposition margin of the probe is determined according to the wave height curve graph, and the method is specifically realized in the following way:

firstly, determining a maximum wave height value Amax from a first wave height curve P1, a second wave height curve P2 and a third wave height curve P3;

and secondly, obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment.

The preset wave height value increment may be determined according to the sensitivity drop value of the probe 2, for example, the preset wave height value increment may be Ax, and the reference wave height value Ac ═ Amax-Ax.

Then, a first wave height value Ao1 at the intersection of the first wave height curve P1 and the second wave height curve P2 and a second wave height value Ao2 at the intersection of the second wave height curve P2 and the third wave height curve P3 are determined.

Finally, according to the first wave height value A12 and the reference wave height value Ac, the first superposition margin Ay1 of the probe 2 is determined to be Ao1-Ax, and the second superposition margin Ay2 of the probe 2 is determined to be Ao 2-Ax.

And S24, judging whether the coverage rate of the probe is qualified or not according to the superposition allowance.

In the embodiment of the application, whether the coverage rate of the probe is qualified or not is judged according to the superposition allowance, and the method is realized by the following specific steps:

judging whether the first superposition margin Ay1 and the second superposition margin Ay2 are both larger than or equal to zero;

if both the first overlap margin Ay1 and the second overlap margin Ay2 are equal to or greater than zero, the process proceeds to S25.

If the first superimposition residual amount Ay1 is less than zero or the second superimposition residual amount Ay2 is less than zero, the routine proceeds to S26.

And S25, judging that the coverage rate of the probe is qualified.

And S26, judging that the coverage rate of the probe is not qualified.

Specifically, when ultrasonic flaw detection is performed on a flat-bottom hole having a depth of burial of 18mm and an aperture of 5mm, and the preset wave height value increment is taken as 6dB, as shown in fig. 5, the first superimposition margin Ay 1-Ao 1-Ax is 0.3dB, and the second superimposition margin Ay 2-Ao 2-Ax is 1.7dB, it can be understood that both the first superimposition margin and the second superimposition margin are larger than zero, and therefore, it can be determined that the coverage of the probe 2 is acceptable.

In S26, if the first superimposition margin Ay1 is less than zero or the second superimposition margin Ay2 is less than zero, specifically, if the first superimposition margin Ay1 and the second superimposition margin Ay2 are not equal to or greater than zero at the same time, it indicates that there is no overlap between the first receiving channel 221 and the second receiving channel 222, or that there is no overlap between the second receiving channel 222 and the third receiving channel 223, in which case, it indicates that the distance between the first receiving channel 221 and the second receiving channel 222, or the distance between the second receiving channel 222 and the third receiving channel 223 is too large, which may cause a false detection phenomenon in which each receiving channel detects flaws in the same flat-bottom hole.

In the embodiment of the application, the multiple receiving channels can simultaneously acquire the first ultrasonic waves, the wave height curve graph is generated based on the first ultrasonic waves acquired by each receiving channel, and whether the coverage rate of the probe 2 is qualified or not is judged on the basis of the wave height curve graph.

On the basis, as shown in fig. 6, an embodiment of the present invention provides a block diagram of a probe coverage testing apparatus 3, where the probe coverage testing apparatus 3 includes: a first ultrasonic wave acquisition module 31, a wave height profile determination module 32, a superimposition margin determination module 33, and a coverage test module 34.

A first ultrasonic wave obtaining module 31, configured to obtain first ultrasonic waves collected by the multiple receiving channels when the probe moves in the chute in a set direction; wherein the first ultrasonic wave is a reflected wave of a second ultrasonic wave at the flat bottom hole, and the second ultrasonic wave is emitted by the probe.

And a wave height curve chart determining module 32, configured to obtain a wave height curve chart according to the first ultrasonic wave and the position of the probe in the set direction.

And a superposition margin determining module 33, configured to determine a superposition margin of the probe according to the wave height graph.

And the coverage rate testing module 34 is configured to judge whether the coverage rate of the probe is qualified according to the stacking allowance.

Further, the first ultrasonic acquisition module 31 is configured to:

when the probe moves in the chute along the set direction, the first ultrasonic waves collected by the first receiving channel, the second receiving channel and the third receiving channel are respectively obtained;

the wave height curve graph comprises a first wave height curve, a second wave height curve and a third wave height curve, wherein the first wave height curve is obtained according to the position and first ultrasonic waves collected by the first receiving channel, the second wave height curve is obtained according to the position and first ultrasonic waves collected by the second receiving channel, and the third wave height curve is obtained according to the position and first ultrasonic waves collected by the third receiving channel;

the wave height profile determination module 32 is configured to:

determining a maximum wave height value from the first wave height curve, the second wave height curve and the third wave height curve; obtaining a reference wave height value according to the maximum wave height value and a preset wave height value increment; determining a first wave height value at the intersection of the first wave height curve and the second wave height curve and a second wave height value at the intersection of the second wave height curve and the third wave height curve; and determining the superposition allowance of the probe according to the first wave height value, the second wave height value and the reference wave height value.

Further, the superimposition margin determination module 33 is configured to:

determining a first superposition allowance of the probe according to the first wave height value and the reference wave height value; and determining a second superposition margin of the probe according to the second wave height value and the reference wave height value.

Further, the coverage test module 34 is configured to:

judging whether the first superposition allowance and the second superposition allowance are both larger than or equal to zero; if the first superposition allowance and the second superposition allowance are both larger than or equal to zero, judging that the coverage rate of the probe is qualified; and if the first superposition allowance is smaller than zero or the second superposition allowance is smaller than zero, judging that the coverage rate of the probe is not qualified.

The embodiment of the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, the probe coverage testing method is implemented.

The embodiment of the invention also provides a computer-readable storage medium, which comprises a computer program, and the computer program controls the electronic device where the computer-readable storage medium is located to execute the probe coverage testing method when running.

To sum up, according to the probe coverage testing method, device and electronic device provided by the embodiments of the present invention, when the probe moves in the chute along the set direction, the first ultrasonic waves collected by the multiple receiving channels of the probe can be obtained, the wave height curve graph is obtained according to the first ultrasonic waves and the position of the probe in the set direction, and then the stacking allowance of the probe is determined according to the wave height curve graph, so as to judge whether the coverage of the probe is qualified according to the stacking allowance, and thus, the first ultrasonic waves collected by the multiple receiving channels in the working state at the same time can be obtained, so as to take the overlapping phenomenon of the multiple receiving channels into consideration, and avoid separately testing the coverage of each receiving channel, so that the accurate test of the probe coverage can be realized, and further, whether the probe coverage is qualified can be accurately judged.

In the embodiments provided in the present invention, it should be understood that the disclosed apparatus and method can be implemented in other ways. The apparatus and method embodiments described above are illustrative only, as the flowcharts and block diagrams in the figures illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in some alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.

In addition, the functional modules in the embodiments of the present invention may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, an electronic device, or a network device) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk. It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.