阅读说明：本技术 一种慢速运动固体颗粒物荷质比测量装置及方法 (Device and method for measuring charge-to-mass ratio of slow-moving solid particles ) 是由 王鹢 庄建宏 李存惠 赵振栋 王富刚 张海燕 全小平 于 2021-10-15 设计创作，主要内容包括：本申请涉及固体微颗粒荷质比测量技术领域,具体而言,涉及一种慢速运动固体颗粒物荷质比测量装置及方法,该装置包括负偏测量单元、正偏测量单元以及零偏测量单元,负偏测量单元、正偏测量单元以及零偏测量单元的结构相同,均包括防尘板、接地极、偏置极、石英晶体微天平、外壳以及绝缘片,其中：防尘板设置在外壳的上方；石英晶体微天平设置在外壳内部的下方,两侧设置有绝缘片；防尘板与石英晶体微天平之间设置有扫描栅网；扫描栅网为两级栅网,分别与接地极和偏置极连接。本申请能够获得固体电颗粒属性以及荷质比分布,实现了小型化,轻质化的设计,适用于野外或者在轨自主测量。(The utility model relates to a solid microparticle charge-to-mass ratio measures technical field, specifically, relates to a slow motion solid particulate matter charge-to-mass ratio measuring device and method, the device include negative deviation measuring unit, positive deviation measuring unit and zero deviation measuring unit, negative deviation measuring unit, positive deviation measuring unit and zero deviation measuring unit's structure is the same, all includes dust guard, earthing pole, bias utmost point, quartz crystal microbalance, shell and insulating piece, wherein: the dust guard is arranged above the shell; the quartz crystal microbalance is arranged below the inner part of the shell, and the two sides of the quartz crystal microbalance are provided with insulating sheets; a scanning grid is arranged between the dustproof plate and the quartz crystal microbalance; the scanning grid is a two-stage grid which is respectively connected with the grounding electrode and the bias electrode. The method can obtain the properties of the solid electric particles and the charge-to-mass ratio distribution, realizes the design of miniaturization and lightness, and is suitable for field or on-orbit autonomous measurement.)

1. The utility model provides a slow-speed motion solid particle load-to-mass ratio measuring device, its characterized in that includes negative deviation measuring unit, positive deviation measuring unit and zero deviation measuring unit, negative deviation measuring unit positive deviation measuring unit and zero deviation measuring unit's structure is the same, all includes dust guard, earthing pole, bias pole, quartz crystal microbalance, shell and insulating piece, wherein:

the dust guard is arranged above the shell;

the quartz crystal microbalance is arranged below the inner part of the shell, and insulating sheets are arranged on two sides of the quartz crystal microbalance;

a scanning grid is arranged between the dustproof plate and the quartz crystal microbalance;

the scanning grid is a two-stage grid which is respectively connected with the grounding electrode and the bias electrode.

2. The slow moving solid particulate matter charge-to-mass ratio measurement device of claim 1, wherein the ground electrode and the bias electrode are both disposed on a locator card slot inside the housing, the ground electrode being disposed above and the bias electrode being disposed below.

3. The slow moving solid particulate matter charge-to-mass ratio measurement device of claim 1, wherein the scanning grid is made of a metal material and the scanning grid is made of a circular mesh array.

4. The slow moving solid particle charge-to-mass ratio measurement device of claim 3, wherein the optical transmittance of the scanning grid is greater than 80% and the temperature coefficient of resistance is less than 0.004 ℃.

5. The slow moving solid particle charge-to-mass ratio measurement device of claim 1, wherein the surface of the quartz crystal microbalance is coated with an adhesive film, and the thickness of the adhesive film is 1-20 μm;

6. the slow moving solid particle charge-to-mass ratio measurement device of claim 4, wherein the surface of the viscous film is a rough surface having a roughness of 1-10 μm.

7. A method for applying the slow moving solid particle charge-to-mass ratio measuring device of any one of claims 1 to 6, comprising the steps of:

step 1: placing a measuring device in a solid microparticle environment falling at a slow speed, and enabling a receiving surface of the measuring device to be vertical to the moving direction of solid particles;

step 2: positive offset measurementThe lower electrode of the cell is set with a positive bias U_iSetting negative bias voltage-U at lower electrode of negative bias measuring unit_iGrounding the lower electrode of the zero-offset measurement unit, opening a dustproof plate, starting measurement, and recording the frequency of the quartz crystal microbalance;

and step 3: scanning the voltage to sequentially increase or decrease the absolute value of the bias voltage;

and 4, step 4: setting positive bias voltage U on lower electrode of positive bias measuring unit_i+1Setting negative bias voltage-U at lower electrode of negative bias measuring unit_i+1Grounding the lower electrode of the zero-offset measuring unit, continuously measuring, and recording the frequency of the quartz crystal microbalance;

and 5: scanning to a specified voltage U₀And then, finishing the measurement, and calculating to obtain the charge-to-mass ratio of the solid particles.

8. The method for applying the slow moving solid particulate matter charge-to-mass ratio measuring device according to claim 7, wherein in the step 1, the negative bias measuring unit, the positive bias measuring unit and the zero bias measuring unit of the measuring device are electrically isolated from each other by an insulating material.

9. The method for applying the apparatus for measuring the charge-to-mass ratio of slowly moving solid particles according to claim 7, wherein in step 3, the distribution of the absolute values of the bias voltages is exponential while the voltages are scanned, and the bias voltages in each step are performed equally and > 1 h.

Technical Field

The application relates to the technical field of solid microparticle charge-to-mass ratio measurement, in particular to a slow-motion solid particulate matter charge-to-mass ratio measurement device and method.

Background

The universe space is filled with a large amount of solid particles, such as universe dust, mars dust, sand dust, moon dust and the like, and the dust particles are often charged under the factors of solar irradiation, charged particle adhesion, collision friction and the like, so that special movement and phenomena occur due to the charge characteristics.

The study of the charge characteristics of these particles is helpful to understand the formation of universe and stars, the evolution of the earth, and the origin of life.

In order to measure the charged property of the solid particles, a method of combining a Faraday cup with an electronic balance is commonly used, but the method cannot achieve autonomous measurement and is not suitable for the situation that no person exists in the field or in the rail.

Disclosure of Invention

The application mainly aims to provide a device and a method for measuring the charge-to-mass ratio of slow-moving solid particles, which overcome the limitations of the traditional measuring technology and can carry out autonomous in-situ measurement on the charged properties of the slow-moving solid particles in a natural state.

In order to realize the above-mentioned purpose, the application provides a slow motion solid particulate matter charge-to-mass ratio measuring device, including negative deviation measuring cell, positive deviation measuring cell and zero deviation measuring cell, negative deviation measuring cell, positive deviation measuring cell and zero deviation measuring cell's structure is the same, all includes dust guard, earthing pole, bias pole, quartz crystal microbalance, shell and insulating piece, wherein: the dust guard is arranged above the shell; the quartz crystal microbalance is arranged below the inner part of the shell, and the two sides of the quartz crystal microbalance are provided with insulating sheets; a scanning grid is arranged between the dustproof plate and the quartz crystal microbalance; the scanning grid is a two-stage grid which is respectively connected with the grounding electrode and the bias electrode.

Furthermore, the grounding electrode and the bias electrode are both arranged on the positioning clamping groove in the shell, the grounding electrode is arranged above the grounding electrode, and the bias electrode is arranged below the grounding electrode.

Furthermore, the scanning grid is made of metal materials and is formed by a circular mesh array.

Furthermore, the optical transmittance of the scanning grid is more than 80%, and the resistance temperature coefficient is less than 0.004 ℃.

Further, the surface of the quartz crystal microbalance is coated with a viscous film, and the thickness of the viscous film is 1-20 μm;

furthermore, the surface of the adhesive film is a rough surface with the roughness of 1-10 μm.

In addition, the application also provides a method for applying the slow-moving solid particulate matter charge-to-mass ratio measuring device, which comprises the following steps: step 1: placing a measuring device in a solid microparticle environment falling at a slow speed, and enabling a receiving surface of the measuring device to be vertical to the moving direction of solid particles; step 2: setting positive bias voltage U on lower electrode of positive bias measuring unit_iSetting negative bias voltage-U at lower electrode of negative bias measuring unit_iGrounding the lower electrode of the zero-offset measurement unit, opening a dustproof plate, starting measurement, and recording the frequency of the quartz crystal microbalance; and step 3: scanning the voltage to sequentially increase or decrease the absolute value of the bias voltage; and 4, step 4: setting positive bias voltage U on lower electrode of positive bias measuring unit_i+1Setting negative bias voltage-U at lower electrode of negative bias measuring unit_i+1Grounding the lower electrode of the zero-offset measuring unit, continuously measuring, and recording the frequency of the quartz crystal microbalance; and 5: scanning to a specified voltage U₀And then, finishing the measurement, and calculating to obtain the charge-to-mass ratio of the solid particles.

Further, in step 1, the negative bias measuring unit, the positive bias measuring unit and the zero bias measuring unit of the measuring device are electrically isolated from each other by an insulating material.

Further, in step 3, when the voltage is scanned, the absolute value distribution of the bias voltage conforms to the exponential distribution, the execution time of each step of bias voltage is equal, and is greater than 1 h.

The device and the method for measuring the charge-to-mass ratio of the slow-moving solid particles have the following beneficial effects:

this application is through exerting different bias voltages on the scanning grid net structure and inhibiting different charge-to-mass ratio particles, obtains the cumulative mass of dust under the different bias voltages, obtains electrified particle attribute and charge-to-mass ratio and distributes, has realized the miniaturization, and the design of lightweight is applicable to the field or independently measures on the orbit.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, serve to provide a further understanding of the application and to enable other features, objects, and advantages of the application to be more apparent. The drawings and their description illustrate the embodiments of the invention and do not limit it. In the drawings:

FIG. 1 is a schematic diagram of a slow moving solid particle charge-to-mass ratio measuring device according to an embodiment of the present application;

FIG. 2 is a flow chart of a method for measuring the charge-to-mass ratio of slow moving solid particles and a calculation chart of the charge-to-mass ratio of the solid particles according to an embodiment of the present application;

in the figure: 1-dust guard, 2-earth plate, 3-bias pole, 4-quartz crystal microbalance, 5-outer shell and 6-insulation sheet.

Detailed Description

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

As shown in fig. 1, the application provides a slow-moving solid particulate matter charge-to-mass ratio measuring device, which comprises a negative bias measuring unit, a positive bias measuring unit and a zero bias measuring unit, wherein the negative bias measuring unit, the positive bias measuring unit and the zero bias measuring unit have the same structure, and each of the negative bias measuring unit, the positive bias measuring unit and the zero bias measuring unit comprises a dust guard 1, a grounding electrode 2, a bias electrode 3, a quartz crystal microbalance 4, a shell 5 and an insulating sheet 6, wherein: the dust-proof plate 1 is arranged above the shell 5; the quartz crystal microbalance 4 is arranged below the inner part of the shell 5, and the two sides of the quartz crystal microbalance are provided with insulating sheets 6; a scanning grid is arranged between the dustproof plate 1 and the quartz crystal microbalance 4; the scanning grid is a two-stage grid which is respectively connected with the grounding electrode 2 and the bias electrode 3.

Specifically, the device for measuring the charge-to-mass ratio of the slow-moving solid particles provided by the embodiment of the application is mainly used for measuring the particle size of less than 50 microns, the moving speed of less than 50m/s and the particle resistivity of more than 10⁹The omega · m solid particle is measured by a negative bias measurement unit, a positive bias measurement unit and a zero bias measurement unit, each unit has the same structure, a viscous quartz crystal microbalance is arranged below a scanning grid mesh, different bias voltages are applied to the scanning grid mesh structure to inhibit particles with different charge-to-mass ratios, so that the accumulated mass of dust under different bias voltages is obtained, and the measurement of the charge-to-mass ratio of the slow-motion solid particles is realized. Dustproof board 1 mainly used is dustproof, and during the measurement, open dustproof board 1, can make solid particulate matter enter into 5 insides of shell, through the scanning grid, finally fall into on quartz crystal microbalance 4. The grounding electrode 2 and the bias electrode 3 are mainly used for connecting and arranging grids so as to apply different bias voltages to the scanning grids, and the distance between the bias electrodes 3 is the same as the diameter of a mesh distribution area of the scanning grids. The quartz crystal microbalance 4 is mainly used for recording the mass of the fallen solid particles, and the range of the charge-to-mass ratio of the fallen solid particles can be obtained by recording the frequency of the quartz crystal microbalance 4. The insulating sheet 6 mainly serves as an insulating electrical insulator.

Further, the grounding electrode 2 and the bias electrode 3 are both arranged on a positioning clamping groove in the shell 5, the grounding electrode 2 is arranged above, and the bias electrode 3 is arranged below. The inside positioning groove that is provided with of shell 5, earthing pole 2 sets up in the top, and biasing utmost point 3 sets up in the below, and both symmetry set up.

Furthermore, the scanning grid is made of metal materials and is formed by a circular mesh array. In the embodiment of the application, the scanning grid is mainly made of beryllium copper, constantan and other metal materials, the meshes of the scanning grid are formed by circular meshes in an array of 60 degrees, and the distribution area of the meshes is the same as the area of a quartz crystal.

Furthermore, the optical transmittance of the scanning grid is more than 80%, and the resistance temperature coefficient is less than 0.004 ℃. The optical transmittance and the resistance temperature coefficient of the scanning grid mesh are selected according to actual measurement conditions.

Further, the surface of the quartz crystal microbalance 4 is coated with an adhesive film, and the thickness of the adhesive film is 1-20 μm; the surface of the quartz crystal microbalance 4 is coated with an adhesive film which is mainly used for adhering tiny solid particles accumulated on the surface, so that the tiny solid particles and the quartz crystal can generate integral oscillation, and the accurate measurement of the mass of the solid particles is realized.

Furthermore, the surface of the adhesive film is a rough surface with the roughness of 1-10 μm. The adhesive film surface is provided as a rough surface mainly for improving the adhesion and the sensitivity of measurement.

In addition, the application also provides a method for applying the slow-moving solid particulate matter charge-to-mass ratio measuring device, which comprises the following steps: step 1: placing a measuring device in a solid microparticle environment falling at a slow speed, and enabling a receiving surface of the measuring device to be vertical to the moving direction of solid particles; step 2: setting positive bias voltage U on lower electrode of positive bias measuring unit_iSetting negative bias voltage-U at lower electrode of negative bias measuring unit_iThe lower electrode of the zero-offset measurement unit is grounded, the dust-proof plate 1 is opened, the measurement is started, and the frequency of the quartz crystal microbalance 4 is recorded; and step 3: scanning the voltage to sequentially increase or decrease the absolute value of the bias voltage; and 4, step 4: setting positive bias voltage U on lower electrode of positive bias measuring unit_i+1Setting negative bias voltage-U at lower electrode of negative bias measuring unit_i+1The lower electrode of the zero-offset measuring unit is grounded, measurement is continued, and the frequency of the quartz crystal microbalance 4 is recorded; and 5: scanning to a specified voltage U₀And then, finishing the measurement, and calculating to obtain the charge-to-mass ratio of the solid particles.

Further, in step 1, the negative bias measuring unit, the positive bias measuring unit and the zero bias measuring unit of the measuring device are electrically isolated from each other by an insulating material.

Further, in step 3, when the voltage is scanned, the absolute value distribution of the bias voltage conforms to the exponential distribution, the execution time of each step of bias voltage is equal, and is greater than 1 h.

The following examples are given in detail in connection with the specific examples:

selecting solid particles with the movement speed of less than 1m/s, the particle size of less than 20 micrometers and the charge rate of less than 50% for measurement, taking positive bias as an example, wherein a scanning grid is processed by beryllium copper, the thickness of the scanning grid is 0.2mm, the diameter of a mesh is 0.4mm, the center distance of holes is 0.45mm, the diameter of a grid is 24mm, the diameter of a mesh distribution area is 12mm, the distance between a grounding electrode 2 and a biasing electrode 3 is 12mm, the distance between the biasing electrode 3 and a sensing surface of a quartz crystal microbalance 4 is 12mm, the natural frequency of the quartz crystal is 10MHz, the thickness of a viscous film is 5 micrometers, applying bias voltage between the scanning grids, and the range of the bias voltage is 0-100V, wherein the U-shaped balance is used for measuring the solid particles with the charge rate of less than 50%, and the positive bias is used for example₀＝100V，U_i50 × exp (-i/20)/i, (i ═ 1, 2, 3 …, 20), the execution time of each bias voltage step, i.e. the measurement time step, was 100min, the frequency displayed by the quartz crystal microbalance 4 at different scanning voltages was recorded, the obtained sets of data were processed according to fig. 2, and finally the charge-to-mass ratio of the solid particles could be obtained.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.