阅读说明：本技术 一种具有空间分辨的x射线谱仪及其方法 (X-ray spectrometer with spatial resolution and method thereof ) 是由 蔡红春 周少彤 王昆仑 徐强 张思群 任晓东 黄显宾 于 2021-11-09 设计创作，主要内容包括：本发明公开了一种具有空间分辨的X射线谱仪及其方法,谱仪包括成像针孔、铅屏蔽筒、滤片腔、滤片与成像板堆栈；所述铅屏蔽筒前端端部包裹所述成像针孔；所述铅屏蔽筒的后端设置所述滤片腔；所述滤片腔用于容纳所述滤片与成像板堆栈；所述X射线辐射源产生的辐射通过所述成像针孔,辐照在所述滤片与成像板堆栈上,所述滤片与成像板堆栈的多个成像通道上得到辐射源不同能段的辐射图像。本发明能够对高能X射线进行测量,能够同时获得高能X射线的具有空间分辨的辐射图像和辐射能谱。(The invention discloses an X-ray spectrometer with spatial resolution and a method thereof, wherein the spectrometer comprises an imaging pinhole, a lead shielding cylinder, a filter disc cavity, a filter disc and an imaging plate stack; the end part of the front end of the lead shielding cylinder wraps the imaging pinhole; the rear end of the lead shielding cylinder is provided with the filter disc cavity; the filter disc cavity is used for accommodating the filter disc and the imaging plate stack; the radiation generated by the X-ray radiation source passes through the imaging pinhole and irradiates the filter and the imaging plate stack, and radiation images of different energy sections of the radiation source are obtained on a plurality of imaging channels of the filter and imaging plate stack. The invention can measure the high-energy X-ray and can simultaneously obtain the radiation image and the radiation energy spectrum of the high-energy X-ray with spatial resolution.)

1. An X-ray spectrometer with spatial resolution is characterized by comprising an imaging pinhole (2), a lead shielding cylinder (3), a filter disc cavity (4), a filter disc and an imaging plate stack (5);

the end part of the front end of the lead shielding cylinder (3) wraps the imaging pinhole (2);

the rear end of the lead shielding cylinder (3) is provided with the filter disc cavity (4);

the filter disc cavity (4) is used for accommodating the filter disc and the imaging plate stack (5);

the radiation generated by the X-ray radiation source (1) passes through the imaging pinhole (2) and irradiates on the filter and imaging plate stack (5), and radiation images of different energy sections of the radiation source are obtained on a plurality of imaging channels of the filter and imaging plate stack (5).

2. An X-ray spectrometer with spatial resolution according to claim 1, characterised in that the imaging pinhole (2) is a thick pinhole;

the thick pinhole is composed of a double-sided inverted cone pinhole (22) on a tungsten block (21).

3. The X-ray spectrometer with spatial resolution according to claim 2, characterized in that the tungsten block (21) has a thickness of 5-15 cm and the minimum diameter of the inverted conical pinhole (22) is 0.5-2 mm.

4. An X-ray spectrometer with spatial resolution according to claim 1 characterised in that the filter and imaging plate stack (5) is made of stacks of different materials and thicknesses of filter and imaging plates.

5. An X-ray spectrometer with spatial resolution according to claim 4, characterised in that each imaging channel of the filter and imaging plate stack (5) comprises a layer of filters and a layer of imaging plates stacked in sequence.

The number of imaging channels of the filter and imaging plate stack (5) and the filter parameters of each channel are determined according to the range of the radiation source energy spectrum to be measured.

6. An X-ray spectrometer with spatial resolution according to claims 1 to 5, characterised in that the lead shielding cartridge (3) consists of an aluminium casing enclosing a layer of shielding lead;

the lead shielding cylinder (3) can absorb more than 80% of radiation with 1 MeV.

7. An X-ray spectrometer with spatial resolution according to claim 6, characterised in that the thickness of the aluminium casing is 12mm and the thickness of the shielding lead layer is 25 mm.

8. An X-ray spectrometer with spatial resolution according to any one of claims 1 to 5, characterised in that the filter chamber (4) consists of an aluminium casing of predetermined thickness, surrounded by a layer of shielding lead.

9. An X-ray spectrometer with spatial resolution according to any one of claims 1 to 5, characterised in that the filter and imaging plate stack (5) comprises at least more than 10 imaging channels.

10. A method for obtaining a radiation energy spectrum of a high-energy X-ray source, comprising:

acquiring a plurality of radiation images of different energy segments of an X-ray radiation source using an X-ray spectrometer as claimed in any one of claims 1 to 9;

and processing the obtained multiple radiation images to obtain a radiation energy spectrum of the high-energy X-ray source.

Technical Field

The invention belongs to the technical field of high-energy X-ray detection, and particularly relates to an X-ray spectrometer with spatial resolution and a method thereof.

Background

In scientific research applications relating to pulsed high-energy X-rays, it is necessary to measure the radiation image and the radiation energy spectrum of the high-energy X-rays. High-energy X-rays have very short wavelength and very strong penetrability, are difficult to image by adopting modes such as a lens, a curved surface reflector and the like, and generally adopt the principle of pinhole imaging to realize the imaging of the high-energy X-rays, but the traditional pinhole imaging device can only obtain a single radiation image and can not provide more comprehensive and reliable radiation data for the further analysis and application of a high-energy X-ray radiation source.

In summary, the conventional pinhole imaging apparatus has the following limitations:

(1) only a single radiation image can be obtained in one test, and the test efficiency is low;

(2) only a radiation image can be obtained and radiation spectrum data cannot be obtained.

The measurement of the high-energy X-ray radiation energy spectrum usually adopts a laminated energy spectrum detector with a thermoluminescent dose sheet, and these detection devices can only detect the energy spectrum of the high-energy X-ray radiation and cannot simultaneously obtain the radiation image of the high-energy X-ray.

Disclosure of Invention

Aiming at the limitation that the prior art can not simultaneously obtain radiation images of different energy sections of high-energy X rays, the invention provides an X-ray spectrometer with spatial resolution. The invention can measure the high-energy X-ray, can simultaneously obtain a plurality of radiation images of different energy sections of the high-energy X-ray, and can quickly provide comprehensive and reliable data support for further research and application of the high-energy X-ray source.

The invention is realized by the following technical scheme:

an X-ray spectrometer with spatial resolution comprises an imaging pinhole, a lead shielding cylinder, a filter disc cavity, a filter disc and an imaging plate stack;

the end part of the front end of the lead shielding cylinder wraps the imaging pinhole;

the rear end of the lead shielding cylinder is provided with the filter disc cavity;

the filter disc cavity is used for accommodating the filter disc and the imaging plate stack;

the radiation generated by the X-ray radiation source passes through the imaging pinhole and irradiates the filter and the imaging plate stack, and radiation images of different energy sections of the radiation source are obtained on a plurality of imaging channels of the filter and imaging plate stack.

Preferably, the imaging pinhole of the invention is a thick pinhole;

the thick pinhole is formed by a double-sided inverted cone pinhole on the tungsten block.

Preferably, the thickness of the tungsten block is 10cm, and the minimum diameter of the inverted conical pinhole is 1.5 mm.

Preferably, the filter and imaging plate stack of the present invention is formed by stacking filter and imaging plates of different materials and thicknesses.

Preferably, each imaging channel of the filter and imaging plate stack comprises a layer of filter and a layer of imaging plate which are stacked in sequence;

the number of imaging channels of the filter and the imaging plate stack and the filter parameter of each channel are determined according to the range of the radiation source energy spectrum to be measured.

Preferably, the lead shielding cylinder of the invention is composed of an aluminum shell wrapping a shielding lead layer;

the lead shielding cylinder can have a radiation absorption rate of more than 80% for 1 MeV.

Preferably, the thickness of the aluminum shell of the invention is 12mm, and the thickness of the shielding lead layer is 25 mm.

Preferably, the filter disc cavity of the invention is composed of an aluminum shell with a preset thickness and a shielding lead layer wrapped by the aluminum shell.

Preferably, the filter and imaging plate stack of the present invention comprises at least 10 or more imaging channels to improve the reliability of the result in inverse energy spectrum solution.

In a second aspect, the present invention provides a method for obtaining a radiation energy spectrum of a high-energy X-ray source, including:

the X-ray spectrometer is adopted to obtain a plurality of radiation images of different energy sections of an X-ray radiation source; and processing the obtained multiple radiation images to obtain a radiation energy spectrum of the high-energy X-ray source.

The invention has the following advantages and beneficial effects:

according to the invention, a pinhole structure is adopted in combination with a receiving mode of stacking the filter disc and the imaging plate, so that the spectrometer can obtain a plurality of radiation images of the high-energy X-ray source in different energy sections, and more complete and reliable data support is provided for further research and analysis of the high-energy X-ray source.

The invention can also obtain the radiation energy spectrums of different positions of the high-energy X-ray source according to the radiation images of different energy sections by combining the existing energy spectrum inverse solution technology, and can realize the simultaneous measurement of the radiation images and the radiation energy spectrums without other hardware.

Drawings

The accompanying drawings, which are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the principles of the invention. In the drawings:

fig. 1 is a schematic structural diagram of an X-ray spectrometer according to the present invention.

FIG. 2 is an enlarged view of an imaging pinhole and a portion of the pinhole according to the present invention.

FIG. 3 is a schematic diagram of the X-ray spectrometer principle of the present invention.

Fig. 4 is a radiation image of an energy segment of a radiation source recorded by the imaging plate of the present invention.

Reference numbers and corresponding part names in the drawings:

1-radiation source, 2-imaging pinhole, 21-tungsten block, 22-inverted cone pinhole, 3-lead shielding cylinder, 4-filter cavity, 5-filter and imaging plate stack, and 6-centering laser.

Detailed Description

Hereinafter, the term "comprising" or "may include" used in various embodiments of the present invention indicates the presence of the invented function, operation or element, and does not limit the addition of one or more functions, operations or elements. Furthermore, as used in various embodiments of the present invention, the terms "comprises," "comprising," "includes," "including," "has," "having" and their derivatives are intended to mean that the specified features, numbers, steps, operations, elements, components, or combinations of the foregoing, are only meant to indicate that a particular feature, number, step, operation, element, component, or combination of the foregoing, and should not be construed as first excluding the existence of, or adding to the possibility of, one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.

In various embodiments of the invention, the expression "or" at least one of a or/and B "includes any or all combinations of the words listed simultaneously. For example, the expression "a or B" or "at least one of a or/and B" may include a, may include B, or may include both a and B.

Expressions (such as "first", "second", and the like) used in various embodiments of the present invention may modify various constituent elements in various embodiments, but may not limit the respective constituent elements. For example, the above description does not limit the order and/or importance of the elements described. The foregoing description is for the purpose of distinguishing one element from another. For example, the first user device and the second user device indicate different user devices, although both are user devices. For example, a first element could be termed a second element, and, similarly, a second element could be termed a first element, without departing from the scope of various embodiments of the present invention.

It should be noted that: if it is described that one constituent element is "connected" to another constituent element, the first constituent element may be directly connected to the second constituent element, and a third constituent element may be "connected" between the first constituent element and the second constituent element. In contrast, when one constituent element is "directly connected" to another constituent element, it is understood that there is no third constituent element between the first constituent element and the second constituent element.

The terminology used in the various embodiments of the invention is for the purpose of describing particular embodiments only and is not intended to be limiting of the various embodiments of the invention. As used herein, the singular forms are intended to include the plural forms as well, unless the context clearly indicates otherwise. Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which various embodiments of the present invention belong. The terms (such as those defined in commonly used dictionaries) should be interpreted as having a meaning that is consistent with their contextual meaning in the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in various embodiments of the present invention.

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to examples and accompanying drawings, and the exemplary embodiments and descriptions thereof are only used for explaining the present invention and are not meant to limit the present invention.

Examples

The present embodiment provides an X-ray spectrometer with spatial resolution, and as shown in fig. 1, the X-ray spectrometer of the present embodiment includes an imaging pinhole 2, a lead shielding cylinder 3, a filter cavity 4, a filter and imaging plate stack 5, and a centering laser 6.

The front end tip (towards the one end tip of radiation source 1 promptly) parcel formation of image pinhole 2 of lead shielding section of thick bamboo 3, the rear end of lead shielding section of thick bamboo 3 sets up filter chamber 4, and filter chamber 4 is inside to be placed filter and formation of image board stack 5, and this filter and formation of image board stack 5 include a plurality of imaging channel for acquire the radiation image of different energy sections.

The lead shielding cylinder 3 and the filter cavity 4 protect the imaging plate from direct penetration of high-energy X-rays and stray light. The radiation generated by the high-energy X-ray source 1 passes through the imaging pinhole 2 and is irradiated on the filter disc and the imaging plate in sequence, and radiation images of different energy sections are obtained on the plurality of imaging plates.

In this embodiment, after the imaging pinhole 2, the lead shielding cavity 3, the filter cavity 4, and the filter are assembled with the imaging plate stack 5, the alignment of the X-ray spectrometer and the radiation source 1 is realized by using the alignment laser 6.

The imaging pinhole 2 of the present embodiment is a thick pinhole, and is used for imaging the X-ray source. The principle of thick pinhole imaging is as follows: the X-rays have a very short wavelength and their diffraction effects are negligible. By utilizing the principle that X-rays propagate along straight lines, a heavy metal block with enough attenuation capacity to the X-rays is provided with a pinhole, so that the X-rays penetrate through the pinhole to be imaged, and an image is received and recorded by a receiving medium (an imaging plate).

As shown in fig. 2, the thick pinhole of the present embodiment is formed of a double-sided reverse tapered pinhole 22 on a tungsten block 21 having a certain thickness. The thickness of the tungsten block 21 is determined according to the range of the energy spectrum of the radiation source to be measured, for example, the thickness of the tungsten block 21 can be set to be 5-15 cm; the diameter of the minimum part of the inverted cone-shaped pinhole 22 in the embodiment is determined according to the required spatial resolution, for example, the diameter of the minimum part of the pinhole can be set to be 0.5-2 mm.

The lead shielding cylinder 3 of the embodiment is used for shielding stray X-rays, reducing the interference of the stray X-rays on a radiation image and improving the signal-to-noise ratio of the image.

The lead shielding cylinder 3 of the present embodiment is formed by wrapping a lead layer (the thickness of the lead layer may be set to 25mm) with an aluminum shell having a certain thickness (may be set to 12mm), and the radiation absorption rate of the lead shielding cylinder to 1MeV exceeds 80%.

The filter chamber 4 of this embodiment is formed by an aluminum housing of a certain thickness enclosing a shielding lead layer. The filter cavity 4 of this embodiment is used for placing the filter and the imaging plate stack, and simultaneously protects the stack from stray X-rays, and the filter cavity 4 is closely connected with the lead shielding cylinder 3.

The size of the filter cavity 4 of the present embodiment can be varied according to the number of imaging channels in the filter and imaging plate stack 5, improving flexibility and operability of the device.

The filter and imaging plate stack 5 of this embodiment is formed by stacking filter and imaging plates of different materials and thicknesses, wherein each imaging channel includes a layer of filter and a layer of imaging plate (IP plate) stacked in sequence, i.e., radiation emitted by the high-energy X-ray source is attenuated by the filter and then imaged by the imaging plate.

The filter parameters of each channel and the total number of channels can be selected according to the range of the energy spectrum of the radiation source to be measured, and the number of imaging channels is preferably more than 10.

As shown in fig. 3, the working principle of the X-ray spectrometer of the present embodiment is as follows:

the radiation generated by the high-energy X-ray source passes through the thick pinhole and is irradiated on the filter disc and the imaging plates in sequence, and multi-radiation images of different energy sections of the radiation source are obtained on the plurality of imaging plates (as shown in figure 4); based on the radiation images of different energy bands, the radiation energy spectrum of the high-energy X-ray source can be obtained.

In this embodiment, according to a plurality of obtained radiation images of the radiation source in different energy segments, inverse energy spectrum is performed to obtain a radiation energy spectrum of the high-energy radiation source, which specifically includes:

selecting signals of a region to be processed (such as a circle in fig. 4) on each channel imaging plate, wherein the signal intensity recorded by the nth channel imaging plate of the spectrometer is as follows:

N_k＝∫R_k(E)Φ(x)dE (1)

wherein: n is a radical of_kSignals recorded for a k-th layer imaging plate; r_k(E) Is the response function of the imaging plate of the k layer to the X-ray with energy E; Φ (X) is the time-integrated flux of an incident X-ray of energy E.

To obtain the energy spectrum of the radiation source, equation (1) is first discretely processed:

wherein: r_klThe value of the response function at the ith energy bin (1, 2 …, n) for the kth imaging plate; phi_lIs the integral value of the energy intensity in the ith energy grid; e.g. of the type_kIs the deviation of the policy data.

And then carrying out inverse solution to obtain a spectrum, wherein the specific inverse solution algorithm flow comprises the following steps: first, the spectrum Φ is pre-estimated from the known information₀(ii) a And then starting iterative solution by using the pre-estimated spectrum, wherein the iterative formula is an equation (3), and finally ending the iteration by using an iteration ending judgment method to obtain an inverse solution energy spectrum.

In the formula:-a calculated value of the ith iteration spectrum;

-a weight;

ρ_k-standard deviation of experimental measurements;

the above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are merely exemplary embodiments of the present invention, and are not intended to limit the scope of the present invention, and any modifications, equivalent substitutions, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.