阅读说明：本技术 时钟故障检测器 (Clock fault detector ) 是由 郝报田 王维铁 李超 于 2019-11-01 设计创作，主要内容包括：本发明公开了一种时钟故障检测器,其包含：时序控制信号产生器以及时钟故障检测模块,其可分别依据时钟信号产生控制信号以及依据控制信号进行时钟故障检测。时钟故障检测模块可包含第一积分器、采样保持电路、第二积分器以及比较器。第一积分器可分别依据控制信号中的乒乓模式控制信号将时钟信号的先前时钟周期转换为参考电压；采样保持电路可分别依据乒乓模式控制信号采样及保持参考电压；第二积分器可将时钟信号的目前时钟周期转换为斜坡信号；以及比较器可将斜坡信号和至少一参考电压进行比较,以产生比较结果信号,以供指出时钟信号是否正常。相较于传统架构,本发明的时钟故障检测器具有在工艺上的更高精度,且能使电子装置达到优化效能。(The invention discloses a clock fault detector, which comprises: the clock failure detection module is used for generating a control signal according to the clock signal and carrying out clock failure detection according to the control signal. The clock failure detection module may include a first integrator, a sample and hold circuit, a second integrator, and a comparator. The first integrator can respectively convert the previous clock period of the clock signal into a reference voltage according to a ping-pong mode control signal in the control signals; the sampling and holding circuit can sample and hold the reference voltage according to the ping-pong mode control signal respectively; the second integrator can convert the current clock period of the clock signal into a ramp signal; and the comparator can compare the ramp signal with at least one reference voltage to generate a comparison result signal for indicating whether the clock signal is normal or not. Compared with the traditional framework, the clock fault detector has higher precision in the process and can enable the electronic device to achieve the optimized efficiency.)

1. A clock failure detector, comprising:

the time sequence control signal generator is used for receiving a clock signal and generating a plurality of control signals according to the clock signal so as to carry out time sequence control on the clock fault detector; and

at least one clock failure detection module, coupled to the timing control signal generator, for performing clock failure detection according to the control signals, wherein the at least one clock failure detection module comprises:

a plurality of first integrators operating in a ping-pong mode, coupled to the timing control signal generator, for converting a plurality of previous clock cycles of the clock signal into a plurality of reference voltages according to a plurality of ping-pong mode control signals of the plurality of control signals, respectively;

a plurality of sample-and-hold circuits operating in the ping-pong mode, coupled to the plurality of first integrators, for sampling and holding the plurality of reference voltages for comparison according to the plurality of ping-pong mode control signals, respectively;

at least one second integrator, coupled to the timing control signal generator, for converting at least one current clock cycle of the clock signal into at least one ramp signal for comparison; and

at least one comparator, coupled to the sample-and-hold circuits and the second integrator, for comparing the ramp signal with at least one of the reference voltages to generate at least one comparison result signal for indicating whether the clock signal is normal.

2. The clock failure detector of claim 1, wherein the plurality of sample-and-hold circuits are integrated into the plurality of first integrators, respectively.

3. The clock-failure detector of claim 1, wherein the at least one second integrator comprises a plurality of second integrators, and the at least one comparator comprises a plurality of comparators; the at least one clock failure detection module comprises a plurality of clock failure detection modules, wherein any one of the plurality of clock failure detection modules comprises one of the plurality of first integrators, one of the plurality of sample and hold circuits, one of the plurality of second integrators, and one of the plurality of comparators; and said clock failure detector further comprises:

and the multiplexer is used for selecting one of a plurality of comparison result signals generated by the plurality of comparators respectively as a comparison result signal for outputting based on the ping-pong mode so as to indicate whether the clock signal is normal or not.

4. The clock failure detector of claim 3, wherein the multiplexer comprises:

a group of switches respectively receiving the ping-pong mode control signals, for selecting the comparison result signals in turn as the comparison result signals for output according to the ping-pong mode control signals.

5. The clock failure detector of claim 3, wherein the plurality of sample-and-hold circuits are integrated into the plurality of first integrators, respectively, wherein:

the one of the plurality of first integrators includes:

a current source coupled to a power voltage;

a switch coupled to the current source; and

the capacitor is coupled between the switch and a ground voltage; and

the one of the plurality of sample-and-hold circuits comprises:

the switch; and

the capacitor.

6. The clock-failure detector of claim 5, wherein, according to one of the ping-pong mode control signals, the switch controls the current source to charge the capacitor to generate one of the reference voltages in one period of the clock signal and controls the capacitor to hold the one of the reference voltages in another period of the clock signal.

7. The clock-failure detector of claim 1, wherein the at least one second integrator comprises a single second integrator, and the at least one comparator comprises a single comparator; the at least one clock failure detection module is implemented as an integrated clock failure detection module, wherein the plurality of first integrators share at least one component; and said integrated clock failure detection module further comprises:

a multiplexer for selecting one of the plurality of reference voltages as a reference voltage for comparison based on the ping-pong mode for output to the single comparator.

8. The clock failure detector of claim 7, wherein the multiplexer comprises:

a set of switches respectively receiving the ping-pong mode control signals for selecting the reference voltages in turn as the reference voltages for comparison according to the ping-pong mode control signals.

9. The clock failure detector of claim 7, wherein the plurality of sample-and-hold circuits are integrated into the plurality of first integrators, respectively, wherein:

one of the plurality of first integrators includes:

a current source coupled to a supply voltage, wherein the at least one component shared by the plurality of first integrators comprises the current source;

a switch coupled to the current source; and

a capacitor coupled between the switch and a ground voltage; and

one of the plurality of sample-and-hold circuits comprises:

the switch; and

the capacitor.

10. The clock failure detector of claim 9, wherein, in accordance with one of the plurality of ping-pong mode control signals, the switch controls the current source to charge the capacitor to generate one of the plurality of reference voltages in one period of the clock signal and controls the capacitor to hold the one of the plurality of reference voltages in another period of the clock signal.

11. The clock failure detector of claim 1, wherein the at least one second integrator comprises:

at least one switch receiving at least one reset signal of the plurality of control signals is used for resetting the at least one second integrator according to the at least one reset signal so as to allow the clock failure detector to monitor the at least one current clock cycle indicated by the at least one ramp signal through the at least one second integrator.

12. The clock failure detector of claim 1, wherein a sample-and-hold circuit of the plurality of sample-and-hold circuits comprises:

a switch receiving a reset signal of the plurality of control signals to reset the sample and hold circuit in accordance with the reset signal to allow the clock failure detector to monitor the plurality of previous clock cycles indicated by the plurality of reference voltages via the plurality of sample and hold circuits.

13. The clock failure detector of claim 1, wherein a response time of the clock failure detector to the clock signal losing the normal period is less than or equal to the normal period based on the ping-pong mode when the plurality of previous clock periods of the clock signal represent a normal period of the clock signal.

14. The clock-failure detector of claim 1, wherein any first integrator of the plurality of first integrators is implemented with a first capacitor charged by a first current source, and any second integrator of the at least one second integrator is implemented with a second capacitor charged by a second current source, wherein the respective currents of the first current source and the second current source are equal to a first current value and a second current value, respectively, and the respective capacitances of the first capacitor and the second capacitor are equal to a first capacitance value and a second capacitance value, respectively; and the response time of the clock failure detector to the clock signal losing a normal period is with respect to a ratio of the first current value to the second current value and a ratio of the first capacitance value to the second capacitance value.

15. The clock failure detector of claim 14, wherein the response time is insensitive to process variations under conditions where the first current value, the second current value, the first capacitance value, and the second capacitance value are determined.

16. The clock failure detector of claim 14, wherein the first current value, the second current value, the first capacitance value, and the second capacitance value are preconfigured to determine the response time.

Technical Field

The present invention relates to electronic circuits, and more particularly to a clock fail detector (clock fail detector).

Background

Clock failure detectors are important basic circuits in electronic devices. Conventional clock fail detectors have certain problems, in particular, their response time (e.g., delay time of a pulse representing a clock fail with respect to a time point at which the clock fail occurs) is typically equal to a constant value and is independent of an input clock period, which may inconvenience error handling of the electronic device. For example, the response time cannot be shortened as the input clock becomes faster. For another example, the response time cannot be increased as the input clock is slowed. Furthermore, the response times are typically sensitive to process variations, which can cause inaccuracies in the operation of the electronic device, degrading overall performance. Therefore, a novel architecture is needed to improve the overall performance of the electronic system.

Disclosure of Invention

An object of the present invention is to disclose a clock failure detector to solve the above problems.

Another objective of the present invention is to disclose a clock failure detector for achieving optimized (optimal) performance of an electronic device.

It is a further object of the present invention to disclose a clock failure detector to achieve the goal of higher accuracy in the process.

At least one embodiment of the invention discloses a clock failure detector. The clock failure detector may include a timing control signal generator and at least one clock failure detection module coupled to the timing control signal generator. The timing control signal generator is operable to receive a clock signal and generate a plurality of control signals according to the clock signal for timing control of the clock failure detector, and the at least one clock failure detection module is operable to perform clock failure detection according to the plurality of control signals. In particular, the at least one clock failure detection module may include a plurality of first integrators and a plurality of sample and hold (sample and hold) circuits operating in a ping-pong mode, respectively coupled to the timing control signal generator and the plurality of first integrators, and may include at least one second integrator coupled to the timing control signal generator and at least one comparator coupled to the plurality of sample and hold circuits and the at least one second integrator. For example, the plurality of first integrators may be used to convert a plurality of previous clock cycles of the clock signal into a plurality of reference voltages according to a plurality of ping-pong mode control signals of the plurality of control signals, respectively; the plurality of sample-and-hold circuits can be used for sampling and holding the plurality of reference voltages according to the plurality of ping-pong mode control signals respectively for comparison; the at least one second integrator is operable to convert at least one current clock cycle of the clock signal into at least one ramp signal for comparison; and the at least one comparator is used for comparing the at least one ramp signal with at least one reference voltage in the plurality of reference voltages to generate at least one comparison result signal for indicating whether the clock signal is normal or not.

Compared with the conventional clock fault detector, the clock fault detector of the invention has higher precision in process (for example, the response time of the fault detection is insensitive to process variation), and can enable the electronic device to achieve optimized performance.

Drawings

Fig. 1 is a schematic diagram of a clock failure detector according to an embodiment of the invention.

FIG. 2 shows details of an implementation of the clock failure detector shown in FIG. 1 according to an embodiment of the invention.

FIG. 3 shows signals related to the clock failure detector shown in FIG. 1 according to an embodiment of the present invention.

FIG. 4 shows details of an implementation of the timing control signal generator in the clock failure detector shown in FIG. 1 according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of a clock failure detector according to an embodiment of the invention.

FIG. 6 shows details of an implementation of the clock failure detector shown in FIG. 5 according to an embodiment of the invention.

FIG. 7 shows signals associated with the clock fail detector shown in FIG. 5 according to an embodiment of the present invention.

FIG. 8 shows details of an implementation of the timing control signal generator in the clock fail detector shown in FIG. 5 according to an embodiment of the present invention.

Wherein the reference numerals are as follows:

100. 200 clock fault detector

110. 210 timing control signal generator

120A, 120B, 220 clock fault detection module

130 multiplexer

INT1A, INT1B, INT1 first integrator

INT2A, INT2B, INT2 second integrator

SH _ A, SH _ B, SH sample-hold circuit

CMP _ A, CMP _ B, CMP comparator

IB1(1), IB1(2), and current source

IB2(1)、IB2(2)、

IB1、IB2

SW _ S (1), SW _ S (2), switch

SW_R(1)、SW_R(2)、

SW11、SW12、SW21、SW22

CS (1), CS (2), capacitor

CR(1)、CR(2)、

CS1、CS2、CR

MN _ S (1), MN _ S (2), transistor

MN_R(1)、MN_R(2)、

MN_S1、MN_S2、MN_R

VDD Power supply Voltage

CLK clock signal

P1, P2 ping-pong mode control signals

RST _ S1, RST _ S2, RST _ R reset signal

VRef _ A, VRef _ B, reference voltage

VS1、VS2、VRef

VRamp _ A, VRamp _ B, ramp signal

VRamp

CLK _ OK _ A, comparison result signal CLK _ OK _ B,

CLK_OK

D. Q, QN terminal

Detailed Description

Fig. 1 is a schematic diagram of a clock failure detector 100 according to an embodiment of the invention. The clock failure detector 100 may include a timing control signal generator 110 and at least one clock failure detection module, such as clock failure detection modules 120A and 120B, coupled to the timing control signal generator 110. The timing control signal generator 110 is configured to receive a clock signal CLK and generate a plurality of control signals according to the clock signal CLK for timing control of the clock failure detector 100, and the at least one clock failure detection module, such as the clock failure detection modules 120A and 120B, is configured to perform clock failure detection according to the plurality of control signals. In particular, the at least one clock fail detection module, such as the clock fail detection modules 120A and 120B, may include a plurality of first integrators and a plurality of sample-and-hold circuits operating in a ping-pong mode, such as the first integrators INT1A and INT1B coupled to the timing control signal generator 110 and the sample-and-hold circuits SH _ a and SH _ B coupled to the first integrators INT1A and INT1B, respectively, and may include at least one second integrator, such as the second integrators INT2A and INT2B, coupled to the timing control signal generator 110, and may further include at least one comparator, such as the comparators CMP _ a and CMP _ B coupled to the plurality of sample-and-hold circuits SH _ B and the second integrators INT2A and INT2B, respectively.

According to the present embodiment, the first integrators INT1A and INT1B may respectively convert a plurality of previous clock cycles of the clock signal CLK into a plurality of reference voltages, such as reference voltages VRef _ a and VRef _ B, according to a plurality of ping-pong mode control signals of the plurality of control signals, and the sample-and-hold circuits SH _ a and SH _ B may respectively sample and hold the reference voltages VRef _ a and VRef _ B according to the plurality of ping-pong mode control signals for comparison. In addition, the at least one second integrator, such as the second integrators INT2A and INT2B, can convert at least one current clock cycle (e.g., one or more current clock cycles, such as the latest clock cycles at different time points) of the clock signal CLK into at least one ramp signal, such as the ramp signals VRamp _ a and VRamp _ B, for comparison. In addition, the at least one comparator, such as comparators CMP _ a and CMP _ B, may compare the at least one ramp signal, such as ramp signals VRamp _ a and VRamp _ B, and at least one reference voltage of reference voltages VRef _ a and VRef _ B, to generate at least one comparison result signal, and in particular, may compare the ramp signals VRamp _ a and VRamp _ B with the reference voltages VRef _ a and VRef _ B, respectively, to generate comparison result signals CLK _ OK _ a and CLK _ OK _ B for indicating whether the clock signal CLK is normal or not. As shown in fig. 1, the clock fail detector 100 may further include a multiplexer (multiplexer)130 (labeled "MUX" in fig. 1 for simplicity). Based on the ping-pong mode, the multiplexer 130 can select one of the comparison result signals CLK _ OK _ a and CLK _ OK _ B generated by the comparators CMP _ a and CMP _ B as the comparison result signal CLK _ OK for output, and in particular, can alternately select the comparison result signals CLK _ OK _ a and CLK _ OK _ B as the comparison result signal CLK _ OK for indicating whether the clock signal CLK is normal or not. For ease of understanding, when the clock signal CLK is in a normal state (e.g., the clock period of the clock signal CLK does not change), the clock failure detector 100 may control the comparison result signal CLK _ OK to be maintained at a predetermined voltage level to indicate that the clock signal CLK is normal; otherwise, in case the clock signal CLK is in an abnormal state (e.g. the clock period of the clock signal CLK changes), the clock failure detector 100 may control the comparison result signal CLK _ OK to switch to another predetermined voltage level to form a pulse representing a clock failure to indicate that the clock signal CLK is abnormal; but the invention is not limited thereto.

According to some embodiments, the switching element (e.g., switch) in the architecture shown in fig. 1 may be implemented by using some types of Metal Oxide Semiconductor Field Effect Transistors (MOSFETs), such as P-type and N-type MOSFETs, but the invention is not limited thereto.

FIG. 2 shows details of an implementation of the clock fail detector 100 shown in FIG. 1 according to an embodiment of the present invention, wherein the sample-and-hold circuits SH _ A and SH _ B can be integrated into the (integrated inter) first integrators INT1A and INT1B, respectively, but the present invention is not limited thereto. In the clock failure detection module 120A, the first integrator INT1A may include a current source IB1(1) coupled to a power voltage VDD, a switch SW _ S (1) coupled to the current source IB1(1), and a capacitor CS (1) and a transistor MN _ S (1) coupled between the switch SW _ S (1) and a ground voltage (indicated by ground symbols), the sample-and-hold circuit SH _ a may include the switch SW _ S (1), the capacitor CS (1) and the transistor MN _ S (1), and the second integrator INT2A may include a current source IB2(1) coupled to the power voltage VDD, a switch SW _ R (1) coupled to the current source IB2(1), and a capacitor CR (1) and a transistor MN _ R (1) coupled between the switch SW _ R (1) and the ground voltage. Similarly, in the clock failure detection module 120B, the first integrator INT1B may include a current source IB1(2) coupled to the power voltage VDD, a switch SW _ S (2) coupled to the current source IB1(2), and a capacitor CS (2) and a transistor MN _ S (2) coupled between the switch SW _ S (2) and the ground voltage, the sample-and-hold circuit SH _ B may include the switch SW _ S (2), the capacitor CS (2) and the transistor MN _ S (2), and the second integrator INT2B may include a current source IB2(2) coupled to the power voltage VDD, a switch SW _ R (2) coupled to the current source 2(2), and a capacitor CR (2) and a transistor MN _ R (2) coupled between the switch SW _ R (2) and the ground voltage.

As shown in fig. 2, the control signals may include ping-pong mode control signals P1 and P2 and reset signals RST _ S1 and RST _ S2, wherein the ping-pong mode control signals P1 and P2 are examples of the ping-pong mode control signals. The clock failure detection modules 120A and 120B may perform operations related to the ping-pong mode according to the ping-pong mode control signals P1 and P2 and the reset signals RST _ S1 and RST _ S2 to generate comparison result signals CLK _ OK _ a and CLK _ OK _ B, and output the comparison result signals CLK _ OK _ a and CLK _ OK _ B to the multiplexer 130 for being alternately selected as the comparison result signal CLK _ OK. In addition, the multiplexer 130 may include a set of switches respectively receiving the ping-pong mode control signals P1 and P2, and the set of switches may alternately select the comparison result signals CLK _ OK _ a and CLK _ OK _ B as the comparison result signal CLK _ OK for output according to the ping-pong mode control signals P1 and P2. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

FIG. 3 shows signals related to the clock failure detector 100 shown in FIG. 1 according to an embodiment of the invention. The period of the ping-pong mode control signals P1 and P2 may be twice the period of the clock signal CLK, and the ping-pong mode control signals P1 and P2 may be alternately in their respective ON states (labeled "P1 ON" and "P2 ON" in fig. 3 for simplicity) to alternately (alternally) turn ON or off the corresponding switches in the clock fail detector 100, respectively.

For the clock failure detection module 120A, the switch SW _ S (1) may be on one cycle of the clock signal CLK (e.g., one of the plurality of previous clock cycles, such as on one of the plurality of previous clock cycles) in accordance with the ping-pong mode control signal P2

The 1 st "P2 ON" period in fig. 3) controls the current source IB1(1) to charge the capacitor CS (1) to generate the reference voltage VRef _ a, and to generate the reference voltage VRef _ a at another period of the clock signal CLK (e.g., one of a plurality of current clock periods, such as one of the respective latest clock periods at the different points in time; taking fig. 3 as an example, the 2 nd "P1 ON" cycle) controls capacitor CS (1) to maintain reference voltage VRef _ a, and in particular, to maintain the voltage level of reference voltage VRef _ a after it is charged, for comparison. In addition, in accordance with the ping-pong mode control signal P1, the switch SW _ R (1) can control the current source IB2(1) to charge the capacitor CR (1) to generate the ramp signal VRamp _ A during one cycle of the clock signal CLK (e.g., the one of the plurality of current clock cycles, such as the one of the respective latest clock cycles at the different time points; taking FIG. 3 as an example, the 2 nd "P1 ON" cycle), and control the capacitor CR (1) to maintain the voltage level of the ramp signal VRamp _ A after the reset thereof during another cycle of the clock signal CLK (e.g., the next cycle of the one of the plurality of current clock cycles, such as the 2 nd "P2 ON" cycle in FIG. 3), for use in subsequent monitoring.

With respect to the clock failure detection module 120B, according to the ping-pong mode control signal P1, the switch SW _ S (2) can control the current source IB1(2) to charge the capacitor CS (2) to generate the reference voltage VRef _ B during one cycle of the clock signal CLK (e.g., another one of the previous clock cycles, such as the 1 st "P1 ON" cycle in fig. 3), and control the capacitor CS (2) to maintain the reference voltage VRef _ B, and in particular, to maintain the voltage level of the reference voltage VRef _ B after the charging thereof, for comparison during another cycle of the clock signal CLK (e.g., another one of the current clock cycles, such as another one of the latest clock cycles at the different time points; taking fig. 3 as an example, the 1 st "P2 ON" cycle). In addition, in accordance with the ping-pong mode control signal P2, the switch SW _ R (2) can control the current source IB2(2) to charge the capacitor CR (2) to generate the ramp signal VRamp _ B during one period of the clock signal CLK (e.g., the other one of the plurality of current clock cycles, such as the other one of the respective latest clock cycles at the different time points; taking FIG. 3 as an example, the 1 st "P2 ON" period), and control the capacitor CR (2) to maintain the voltage level of the ramp signal VRamp _ B after the reset thereof during another period of the clock signal CLK (e.g., the next period of the other one of the plurality of current clock cycles, such as the 2 nd "P1 ON" period in FIG. 3) for use in subsequent monitoring.

According to the present embodiment, the at least one second integrator, such as the second integrators INT2A and INT2B, may include at least one switch, such as transistors MN _ R (1) and MN _ R (2), for receiving at least one reset signal of the plurality of control signals, and more particularly, the transistors MN _ R (1) and MN _ R (2) may reset the second integrators INT2A and INT2B according to the at least one reset signal, such as the reset signals RST _ S2 and RST _ S1, respectively, so as to allow the clock failure detector 100 to monitor the at least one current clock period indicated by the at least one ramp signal through the at least one second integrator, such as the second integrators INT2A and INT 2B. In addition, a sample-and-hold circuit of the sample-and-hold circuits SH _ a and SH _ B may include a switch receiving a reset signal of the control signals, such as any one of the transistors MN _ S (1) and MN _ S (2), and in particular, the transistors MN _ S (1) and MN _ S (2) may reset the sample-and-hold circuits SH _ a and SH _ B according to the reset signals RST _ S2 and RST _ S1, respectively, to allow the clock failure detector 100 to monitor the previous clock cycles indicated by the reference voltages VRef _ a and VRef _ B through the sample-and-hold circuits SH _ a and SH _ B. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

Fig. 4 shows details of the implementation of the timing control signal generator 110 in the clock failure detector 100 shown in fig. 1 according to an embodiment of the invention. The timing control signal generator 110 may include a flip-flop (flip-flop) receiving the clock signal CLK, such as a D-type flip-flop (D-type flip-flop), and two inverters respectively coupled to output terminals of the flip-flop (e.g., the terminals Q and QN of the D-type flip-flop), and two NOR gates (NOR gate) respectively coupled to the inverters, wherein the terminal QN of the D-type flip-flop may also be denoted asNamely, a transverse line (Q-bar) is added on the upper surface of the Q. The input terminal and the clock terminal of the flip-flop (e.g., terminal D and clock terminal of the D-type flip-flop) are coupled to one of the output terminals (e.g., terminal QN of the D-type flip-flop) and the clock signal CLK, respectively. As shown in fig. 4, the ping-pong mode control signals P1 and P2 can be respectively obtained from the terminals Q and QN of the D-type flip-flop, and the reset signals RST _ S1 and RST _ S2 can be respectively obtained from the respective output terminals of the two nor gates. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

Fig. 5 is a diagram of a clock failure detector 200 according to an embodiment of the invention. The clock failure detector 200 may include a timing control signal generator 210 and at least one clock failure detection module, such as clock failure detection module 220, coupled to the timing control signal generator 210. In contrast to the architecture shown in fig. 1, the at least one clock failure detection module may be implemented as an integrated clock failure detection module such as the clock failure detection module 220, and in particular, the clock failure detection modules 120A and 120B, preferably together with the multiplexer 130, may be integrated into the integrated clock failure detection module, and the timing control signal generator 110 may be modified to the timing control signal generator 210 accordingly. For example, the plurality of first integrators, such as the first integrators INT1A and INT1B, may share at least one component to form an integrated first integrator, such as the first integrator INT1, and the correlation circuits in the at least one clock fail detection module may be modified accordingly, wherein the plurality of sample-and-hold circuits may be implemented as a sample-and-hold circuit SH, the at least one second integrator may include a single second integrator, such as the second integrator INT2, and the at least one comparator may include a single comparator, such as the comparator CMP, but the invention is not limited thereto. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

According to some embodiments, the sample-and-hold circuits SH _ A and SH _ B may be integrated into the first integrators INT1A and INT1B, respectively, and in particular, the clock fail detection modules 120A and 120B, including the first integrators INT1A and INT1B, respectively, preferably together with the multiplexer 130, may be integrated into the integrated clock fail detection modules such as the clock fail detection module 220, but the invention is not limited thereto.

Fig. 6 shows implementation details of the clock fail detector 200 shown in fig. 5 according to an embodiment of the invention, wherein the sample-and-hold circuit SH may be integrated into the first integrator INT1, but the invention is not limited thereto. In contrast to the architecture shown in FIG. 2, the clock failure detection modules 120A and 120B, preferably in conjunction with the multiplexer 130, may be integrated into the integrated clock failure detection module described above, such as clock failure detection module 220. In particular, in this integrated architecture, the sub-circuit corresponding to the first integrator INT1A in the first integrator INT1 may include a current source IB1 coupled to the power voltage VDD, a switch SW12 coupled to the current source IB1, a capacitor CS2 and a transistor MN _ S2 (which receives the reset signal RST _ S2) coupled between the switch SW12 and the ground voltage (indicated by the ground symbol), and this sub-circuit may replace the first integrator INT 1A; and a sub-circuit corresponding to the sample-and-hold circuit SH _ a in the sample-and-hold circuit SH may include the switch SW12, the capacitor CS2, and the transistor MN _ S2 receiving the reset signal RST _ S2, and the sub-circuit may replace the sample-and-hold circuit SH _ a. Similarly, in this integrated architecture, the sub-circuit corresponding to the first integrator INT1B in the first integrator INT1 may include a current source IB1 coupled to the power voltage VDD, a switch SW11 coupled to the current source IB1, a capacitor CS1 and a transistor MN _ S1 (which receive the reset signal RST _ S1) coupled between the switch SW11 and the ground voltage, and this sub-circuit may replace the first integrator INT 1B; and a sub-circuit corresponding to the sample-and-hold circuit SH _ B in the sample-and-hold circuit SH may include the switch SW11, the capacitor CS1, and the transistor MN _ S1 receiving the reset signal RST _ S1, and the sub-circuit may replace the sample-and-hold circuit SH _ B. Thus, the reference voltages VS2 and VS1 can replace the reference voltages VRef _ a and VRef _ B, respectively.

In addition, for the multiplexer 130 to be integrated into the integrated clock failure detection module described above, such as the clock failure detection module 220, the clock failure detector 220 may comprise a multiplexer, such as the multiplexer 130. In particular, the multiplexer may include a set of switches SW21 and SW22 receiving ping-pong mode control signals P1 and P2, respectively, and may select one of the plurality of reference voltages, such as one of reference voltages VS2 and VS1, as a reference voltage VRef for comparison based on the ping-pong mode for output to the single comparator, such as the comparator CMP, wherein the set of switches SW21 and SW2 may alternately select the reference voltages VS2 and VS1 as the reference voltage VRef for comparison according to the ping-pong mode control signals P1 and P2. In addition, in this integrated architecture, the sub-circuit corresponding to the second integrators INT2A and INT2B in the second integrator INT2 may include a current source IB2 coupled to the power voltage VDD, and a capacitor CR and a transistor MN _ R (which receive the reset signal RST _ R) coupled between the current source IB2 and the ground voltage, and this sub-circuit may replace the second integrators INT2A and INT 2B. Thus, the ramp signal VRamp can replace the ramp signals VRamp _ a and VRamp _ B.

As shown in fig. 6, the control signals may include ping-pong mode control signals P1 and P2 and reset signals RST _ S1, RST _ S2 and RST _ R. The clock failure detection module 220 may perform operations with respect to the ping-pong mode according to the ping-pong mode control signals P1 and P2 and the reset signals RST _ S1, RST _ S2 and RST _ R to generate the comparison result signal CLK _ OK. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

FIG. 7 shows signals related to the clock fail detector 200 shown in FIG. 5 according to an embodiment of the invention. Compared to the embodiment shown in fig. 3, the control signals may include ping-pong mode control signals P1 and P2 and reset signals RST _ S1, RST _ S2 and RST _ R. In addition, the reference voltages VS2 and VS1 can replace the reference voltages VRef _ a and VRef _ B, respectively, and the ramp signal VRamp can replace the ramp signals VRamp _ a and VRamp _ B, wherein the switches SW21 and SW2 can alternately select the reference voltages VS2 and VS1 as the reference voltage VRef for comparison according to the ping-pong mode control signals P1 and P2. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

Fig. 8 shows details of the implementation of the timing control signal generator 210 in the clock failure detector 200 shown in fig. 5 according to an embodiment of the invention. Compared to the architecture shown in fig. 4, the timing control signal generator 210 may include the timing control signal generator 110, and more particularly, components therein (e.g., the flip-flops such as the D-flip-flop, the two sets of inverters, and the two nor gates), and an OR gate (OR gate) coupled to the timing control signal generator 110, wherein a plurality of input terminals of the OR gate are respectively coupled to the respective output terminals of the two nor gates, and the reset signal RST _ R can be obtained from the output terminal of the OR gate. For brevity, the contents of this embodiment similar to the foregoing embodiment are not repeated herein.

According to some embodiments, when the previous clock cycles of the clock signal CLK represent a normal cycle (e.g., a fixed length of time) of the clock signal CLK, the response time of the clock fail detectors (e.g., clock fail detectors 100 and 200) of the present invention to the clock signal CLK losing the normal cycle may be less than or equal to the normal cycle based on the ping-pong mode. For brevity, the descriptions of these embodiments similar to the previous embodiments are not repeated herein.

According to some embodiments, any first integrator of the plurality of first integrators is implemented with a first capacitor charged by a first current source (e.g. capacitor CS (1) charged by current source IB1(1), capacitor CS (2) charged by current source IB1(2), capacitor CS1 charged by current source IB1, and capacitor CS2 charged by current source IB 1), and any second integrator of the at least one second integrator is implemented with a second capacitor charged by a second current source (e.g. capacitor CR (1) charged by current source IB2(1), capacitor CR (2) charged by current source 2(2), and capacitor CR charged by current source IB 2), wherein the respective currents of the first and second current sources are equal to first and second current values, respectively, and the respective capacitances of the first and second capacitors are equal to first and second capacitance values, respectively. In particular, the response time of the clock failure detectors of the present invention (e.g., clock failure detectors 100 and 200) to the loss of the normal period (e.g., fixed length of time) of the clock signal CLK is with respect to the ratio of the first current value to the second current value and the ratio of the first capacitance value to the second capacitance value. For example, the response time is insensitive to process variations under the conditions that the first current value, the second current value, the first capacitance value, and the second capacitance value are determined. For brevity, the descriptions of these embodiments similar to the previous embodiments are not repeated herein.

According to some embodiments, the first current value, the second current value, the first capacitance value and the second capacitance value may be pre-configured to determine the response time, but the invention is not limited thereto. For brevity, the descriptions of these embodiments similar to the previous embodiments are not repeated herein.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.