阅读说明：本技术 样本架回收方法、操纵装置、检测系统及计算机可读介质 (Sample rack recovery method, manipulator, detection system and computer readable medium ) 是由 林川 赵亮 于 2019-08-21 设计创作，主要内容包括：本申请涉及一种在样本架操纵装置意外中断操作之后的样本架回收方法。样本架操纵装置包括适于在转运区中运动以在加载/卸载区、采样区和缓冲区之间运送样本架的接驳装置。该方法包括：检测所述接驳装置的状态的接驳装置检测步骤；检测所述样本架操纵装置中的样本架的位置的样本架检测步骤；以及根据所述接驳装置和所述样本架的检测结果由所述接驳装置将所述样本架运送至所述加载/卸载区的样本架回收步骤。本申请还涉及一种能够执行该样本架回收方法的样本架操纵装置、包括该样本架操纵装置的自动检测系统以及存储有用于执行该样本架回收方法的程序的计算机可读介质。(The present application relates to a method of sample rack retrieval after an unexpected interruption of operation of a sample rack manipulator. The sample rack manipulation device comprises a docking device adapted to move in the transfer zone to transport the sample rack between the load/unload zone, the sampling zone and the buffer zone. The method comprises the following steps: a docking device detection step of detecting a state of the docking device; a sample rack detecting step of detecting a position of a sample rack in the sample rack manipulating device; and a sample rack recovery step of transporting the sample rack to the loading/unloading zone by the docking device according to the detection results of the docking device and the sample rack. The present application also relates to a sample rack manipulation device capable of performing the sample rack retrieval method, an automatic detection system including the sample rack manipulation device, and a computer readable medium storing a program for performing the sample rack retrieval method.)

1. A method of sample rack retrieval following an unexpected interruption of operation of a sample rack handler, wherein the sample rack handler comprises a docking device adapted to move in a transfer zone to transport sample racks between a load/unload zone, a sampling zone and a buffer zone,

the method comprises the following steps:

a docking device detection step for detecting a state of the docking device;

a sample rack detecting step of detecting a position of a sample rack in the sample rack manipulation device; and

a sample rack recovery step of transporting the sample rack to the loading/unloading zone by the docking device according to the detection state of the docking device and the detection position of the sample rack.

2. The sample rack retrieval method of claim 1, wherein the docking device detecting step includes detecting a position of the docking device and a sample rack loading state.

3. The sample rack retrieval method of claim 2, further comprising: and judging whether the docking device is in a non-interactive state capable of freely moving or in an interactive state with the loading/unloading zone, the sampling zone or the buffer zone according to the position of the docking device and the loading state of the sample rack.

4. The sample rack retrieval method of claim 3, further comprising: when the connection device is determined to be in the non-interactive state, judging whether a sample rack is loaded on the connection device; when it is determined that a sample rack is on the docking device, the docking device first transports the sample rack back to the loading/unloading zone.

5. The sample rack retrieval method of claim 3, further comprising: when the connection device is determined to be in an interaction state with the loading/unloading zone, the sample rack on the connection device is completely transferred into the loading/unloading zone.

6. The sample rack retrieval method of claim 3, further comprising: when the docking device is determined to be in an interaction state with the buffer zone, the sample rack on the docking device is completely transferred into the buffer zone, or the sample rack on the docking device is completely transferred onto the docking device and conveyed back to the loading/unloading zone.

7. The sample rack retrieval method of claim 3, further comprising: when it is determined that the docking device is in an interaction state with the sampling zone, it is determined whether the docking device interferes with a reset of a pushing device for controlling movement of the sample rack in the sampling zone.

8. The sample rack retrieval method of claim 7, further comprising: resetting the pushing device and determining whether a sample rack is on the docking device when it is determined that the docking device does not interfere with the resetting of the pushing device,

when the sample rack is judged to be on the connecting device, the connecting device conveys the sample rack back to the loading/unloading zone.

9. The sample rack retrieval method of claim 7, further comprising: when it is determined that the docking device interferes with the resetting of the pushing device, the docking device is moved first so as not to interfere with the resetting of the pushing device any more, and then the pushing device is reset.

10. The sample rack retrieval method of claim 9, further comprising: judging whether a sample rack exists on the connecting device or not; and when the sample rack is judged to be on the connecting device, the connecting device firstly conveys the sample rack on the connecting device back to the loading/unloading zone.

11. The sample rack retrieval method according to any one of claims 4, 6, 8 and 10, wherein the sample rack detecting step comprises detecting whether the loading/unloading zone is full of sample racks;

upon detecting that the load/unload zone is fully loaded with sample racks, waiting for an operator to remove one or more sample racks from the load/unload zone before performing the sample rack retrieval step.

12. The sample rack retrieval method of any one of claims 4-6, 8, and 10, further comprising: returning the docking device to an initial position prior to the sample rack retrieval step.

13. The sample rack retrieval method of any one of claims 1-10, further comprising: returning the docking device to an initial position after the sample rack retrieval step.

14. The sample rack retrieval method of any one of claims 1-10, wherein the sample rack retrieval step includes determining a retrieval priority level for each sample rack as a function of a distance measured between the sample rack and the docking device.

15. The sample rack retrieval method of any one of claims 1-10, wherein the sample rack retrieval step comprises: the sample racks of the sampling area are first transported to the load/unload area, and then the sample racks of the buffer area are transported to the load/unload area.

16. The sample rack retrieval method according to any one of claims 1 to 10, wherein the sample rack detection step comprises: detecting the position of the sample rack of the buffer zone when the sensor arranged on the connecting device moves along with the connecting device.

17. The sample rack retrieval method of any one of claims 1 to 10, wherein the docking device detecting step comprises: detecting a sample rack loading state of the docking device by sensors disposed at both ends and a middle portion of the docking device.

18. The sample rack retrieval method of any one of claims 1 to 10, wherein the docking device detecting step comprises: detecting a sample rack rail state of the sampling zone to determine whether the docking device is in an interactive state with the sampling zone.

19. The sample rack retrieval method of claim 18, wherein the docking device detecting step further comprises: the interaction of the pushing means for controlling the movement of the sample rack in the sampling zone with the docking means is detected by a sensor arranged on the docking means.

20. A sample rack manipulation device capable of performing the sample rack retrieval method of any one of claims 1 to 19.

21. An automated detection system comprising the sample rack manipulation device of claim 20.

22. A computer-readable medium having stored thereon a program which, when executed by a processor, implements the sample rack retrieval method of any one of claims 1-19.

Technical Field

The present application relates to the field of medical technology, and more particularly, to a sample rack retrieval method after an unexpected interruption of an operation by a sample rack manipulation device, a sample rack manipulation device capable of performing the sample rack retrieval method, an automatic detection system including the sample rack manipulation device, and a computer readable medium storing a program for performing the sample rack retrieval method.

Background

The statements in this section merely provide background information related to the present disclosure and may not necessarily constitute prior art.

Automated detection systems (also referred to as analytical detectors) are commonly used to analyze the contents of sample tubes for a variety of purposes. An analytical test meter generally includes a sample rack manipulation section, a sampling section, and a test section. The sample rack manipulation part is used for conveying the sample test tube to the sampling part, and the sampling part transfers the sample in the sample test tube to the detection part to detect the sample.

The sample rack is used to receive, hold, align, hold, and/or carry one or more sample tubes to ensure that the sample tubes are positioned and/or transported within the analytical test meter. The sample rack manipulation device (sample rack manipulation section) is configured for loading, transporting and/or unloading one or more sample racks and thus comprises a loading/unloading zone, a transport zone, a sampling zone, etc. The sample rack manipulation device includes a cover body, an upper cover connected to the cover body by bolts or the like to cover the respective areas, and a door.

After the sample rack manipulation device is unexpectedly powered off to interrupt operation, an operator typically needs to open the door and the upper cover of the sample rack manipulation device to allow the operator to reach the various regions, manually remove the sample racks that have stayed at the various regions of the sample rack manipulation device one by one, then close the door of the sample rack manipulation device, and then restart and restore the sample rack manipulation device.

Manual removal of the sample holder is inconvenient and thus inefficient. Furthermore, the sample rack sampling passage is often narrow, so manual removal of the sample rack can easily result in sample spillage, which can contaminate other samples and can even present a safety hazard to the operator.

To this end, it is desirable in the art to provide a sample rack manipulation device that is capable of automatically retrieving sample racks after an accidental interruption of operation.

Disclosure of Invention

This section provides a general summary of the disclosure, and is not a comprehensive disclosure of its full scope or all of its features.

According to one aspect of the present invention, there is provided a sample rack retrieval method following an unexpected interruption of operation of a sample rack manipulation device. The sample rack manipulation device comprises a docking device adapted to move in the transfer zone to transport the sample rack between the load/unload zone, the sampling zone and the buffer zone. The method comprises the following steps: a docking device detection step of detecting a state of the docking device; a sample rack detecting step of detecting a position of a sample rack in the sample rack manipulating device; and a sample rack recovery step of transporting the sample rack to the loading/unloading zone by the docking device according to the detection results of the docking device and the sample rack.

According to the method of the present disclosure, the sample rack may be automatically retrieved to the loading/unloading zone after the sample rack manipulator is restarted. The sample rack recovery method solves some problems generated during manual recovery. For example, since the sample rack of the sampling zone and the buffer zone is automatically retrieved to the loading/unloading zone by the docking device, the operator can easily take out the sample rack from the loading/unloading zone near the door without opening the upper cover of the sample rack manipulating device and manually taking out the sample rack into the sampling zone and the buffer zone far from the door, thereby enabling to improve the sample rack retrieval efficiency. In addition, the sample rack is automatically recovered through the connection device, so that the problems of pollution, potential safety hazards and the like caused by sample splashing due to improper operation of an operator can be prevented.

In some embodiments, in the docking device detecting step, the position of the docking device and the sample rack loading state are detected.

In some embodiments, the sample rack retrieval method further comprises: and judging whether the docking device is in a non-interactive state capable of freely moving or in an interactive state with the loading/unloading zone, the sampling zone or the buffer zone according to the position of the docking device and the loading state of the sample rack.

In some embodiments, the sample rack retrieval method further comprises: when the connection device is determined to be in the non-interactive state, whether a sample rack is loaded on the connection device or not is judged, and when the connection device is determined to be provided with the sample rack, the connection device firstly conveys the sample rack back to the loading/unloading zone.

In some embodiments, when it is determined that the docking device is in an interactive state with the loading/unloading zone, the docking device first completely transfers the sample rack on the docking device into the loading/unloading zone.

In some embodiments, the sample rack retrieval method further comprises: when the docking device is determined to be in an interaction state with the buffer zone, the docking device completely transfers the sample rack on the docking device into the buffer zone, or completely transfers the sample rack on the docking device onto the docking device and transports the sample rack back to the loading/unloading zone.

In some embodiments, the sample rack retrieval method further comprises: when it is determined that the docking device is in an interaction state with the sampling zone, it is determined whether the docking device interferes with a reset of a pushing device for controlling movement of the sample rack in the sampling zone.

In some embodiments, the sample rack retrieval method further comprises: when it is determined that the docking device does not interfere with the resetting of the pushing device, the pushing device is reset and it is determined whether or not a sample rack is on the docking device. When the sample rack is judged to be on the connecting device, the connecting device conveys the sample rack back to the loading/unloading zone.

In some embodiments, the sample rack retrieval method further comprises: when it is determined that the docking device interferes with the resetting of the pushing device, the docking device is moved first so as not to interfere with the resetting of the pushing device any more, and then the pushing device is reset.

In some embodiments, the sample rack retrieval method further comprises: judging whether a sample rack exists on the connecting device or not; and when the sample rack is judged to be on the connecting device, the connecting device firstly conveys the sample rack on the connecting device back to the loading/unloading zone.

In some embodiments, the sample rack detecting step comprises detecting whether the load/unload region is loaded with a full sample rack. Upon detecting that the load/unload zone is fully loaded with sample racks, waiting for an operator to remove one or more sample racks from the load/unload zone before performing the sample rack retrieval step.

In some embodiments, the sample rack retrieval method further comprises: returning the docking device to an initial position prior to the sample rack retrieval step.

In some embodiments, the sample rack retrieval method further comprises: returning the docking device to an initial position after the sample rack retrieval step.

In some embodiments, the sample rack retrieval step comprises determining a retrieval priority level for the sample rack based on the detected distance between the sample rack and the docking device.

In some embodiments, the sample rack retrieving step comprises: the sample racks of the sampling area are first transported to the load/unload area, and then the sample racks of the buffer area are transported to the load/unload area.

In some embodiments, the sample rack testing step comprises: detecting the position of the sample rack of the buffer zone when the sensor arranged on the connecting device moves along with the connecting device.

In some embodiments, the docking device detecting step comprises: detecting a sample rack loading state of the docking device by sensors disposed at both ends and a middle portion of the docking device.

In some embodiments, the docking device detecting step comprises: detecting a sample rack rail state of the sampling zone to determine whether the docking device is in an interactive state with the sampling zone.

In some embodiments, the docking device detecting step further comprises: the interaction of the pushing means for controlling the movement of the sample rack in the sampling zone with the docking means is detected by a sensor arranged on the docking means.

According to another aspect of the present disclosure, there is provided a sample rack manipulation apparatus capable of performing the above-described sample rack recovery method.

According to yet another aspect of the present disclosure, there is provided an automated inspection system comprising the above-described sample rack manipulator.

According to still another aspect of the present disclosure, there is provided a computer-readable medium having stored thereon a program which, when executed by a processor, implements the above-described sample rack collection method.

The above and other objects, features and advantages of the present disclosure will be more fully understood from the detailed description given herein below and the accompanying drawings which are given by way of illustration only and thus are not to be considered as limiting the present disclosure.

Drawings

The drawings described herein are for illustrative purposes only of selected embodiments and not all possible implementations, and are not intended to limit the scope of the present disclosure.

FIG. 1 is a schematic diagram of the main structure of an automated inspection system including a sample rack manipulator according to an embodiment of the present disclosure;

FIG. 2 is a schematic view of the sample rack manipulation device of FIG. 1, showing the arrangement of sensors in various regions thereof;

fig. 3 is a schematic view showing a sample rack loading state of the docking apparatus;

fig. 4 is a schematic view showing another sample rack loading state of the docking apparatus;

fig. 5 is a schematic view showing a further sample rack loading state of the docking apparatus;

fig. 6 is a schematic view showing the position of the docking device;

fig. 7 is a schematic view showing another position of the docking device;

fig. 8 is a schematic view showing a further position of the docking device;

fig. 9 is a schematic view showing a further position of the docking device;

fig. 10 is a schematic view showing another position of the docking device;

FIG. 11 is a flow chart of a method of sample rack retrieval according to an embodiment of the present disclosure; and

fig. 12 is a flow chart of detecting a state of a docking device according to an embodiment of the present disclosure.

Corresponding reference characters indicate corresponding parts throughout the several views of the drawings.

Detailed Description

Exemplary embodiments according to the present disclosure will now be described more fully with reference to the accompanying drawings.

The exemplary embodiments are provided so that this disclosure will be thorough and will fully convey the scope to those skilled in the art. Numerous specific details are set forth such as examples of specific components, devices, and methods to provide a thorough understanding of embodiments of the present disclosure. It will be apparent to those skilled in the art that specific details need not be employed, that example embodiments may be embodied in many different forms and that should not be construed as limiting the scope of the disclosure. In some exemplary embodiments, well-known methods, well-known device structures, and well-known technologies are not described in detail.

Overview of automated inspection System

The main structure and the working principle of the automatic detection system 1 are described below with reference to fig. l. Fig. 1 is a schematic diagram of the main structure of an automatic detection system 1. For the sake of clarity, some parts of the automatic detection system 1, in particular the cover, the support structure, the control means, etc., are omitted from fig. 1. The automated detection system 1 is configured for automatically performing detection analysis, such as clinical chemistry, immunology or genetics, of a plurality of samples. As shown in the figure, the automatic inspection system 1 mainly includes a sample rack manipulator 10, a sampler 11, a reaction stage 12, a reagent dispenser 13, a reagent storage 14, an optical analysis device 15, a stirring device 16, and a cleaning device 17.

When a test analysis of a sample (e.g., a biological fluid) is required, as shown in fig. 1, a test tube (container) 31 containing the sample is placed on the sample rack 30, and then the door 101 of the sample rack manipulator 10 is opened and the sample rack 30 is loaded into the loading/unloading zone TA of the sample rack manipulator 10. In the illustrated example, the sample holder 30 is elongate in shape and is adapted to receive a plurality of sample tubes 31. Referring again to fig. 1, the sample rack 30 is transported from the load/unload zone TA to the sampling zone TD by the docking device 103. The sample in the test tube 31 is collected into the reaction stage 12 by the sampler 11. The reaction table 12 rotates to transport the sample to the reagent dispenser 13, and the reagent dispenser 13 dispenses the corresponding reagent stored in the reagent storage 14 into the sample. The stirring device 16 stirs the mixture of the sample and the reagent to be uniformly mixed for reaction. The reaction table 12 is rotated to the detection position, whereby the reaction product is detected and analyzed by means of the optical analysis device 15 to obtain a detection analysis result. After all the samples on the sample rack 30 are tested and analyzed, the reaction platform 12 is cleaned by the cleaning device 17 for the next test and analysis. After the sample testing analysis is completed, the sample rack handler 10 transports the tested sample rack 30 back to the loading/unloading area TA, and then the operator opens the door 101 and takes out the tested sample rack 30.

As is apparent from the above description, the sample rack manipulation device 10 constitutes a sample rack manipulation unit of the automatic inspection system 1, and the components 11 to 17 shown in fig. 1 constitute a sample inspection unit of the automatic inspection system 1. It should be understood, however, that the automatic detection system 1 shown in fig. 1 is for illustrative purposes only and is not limiting to the present invention. Furthermore, it is also understood that the sample rack manipulation device 10 may be connected to more than one sample detection unit, e.g. the right side of the sample rack manipulation device 10 may also be connected to another sample detection unit (not shown in fig. 1) for detecting the same sample or a different sample.

Sample rack operating device

As described above, the sample rack manipulation device 10 constitutes a sample rack manipulation unit of the automatic detection system 1. The sample rack manipulation device 10 includes a housing (not shown) in a substantially rectangular parallelepiped form and a door 101. The door 101 may be opened to allow the sample rack 30 to be placed in the load/unload zone TA of the sample rack manipulator 10 or to allow the sample rack 30 to be removed from the load/unload zone TA. In addition, the door 101 may be closed to form an enclosed space, providing a safe and reliable environment for handling of the sample rack.

The sample rack manipulation device 10 further comprises a docking device 103 for transporting the sample rack to a desired area for various operations (e.g., loading, unloading, sampling, waiting, etc.). Referring to fig. 1, the sample rack handler 10 includes a loading/unloading zone TA, a transfer zone TB, a buffer zone TC, and sampling zones TD and TE (in the case of two sample detection units), according to the operating state of the sample rack 30. It will be appreciated that in the case of an automated inspection system 1 having only one sample detection unit, the sample rack manipulator 10 may have only one sampling region TD or TE.

The specimen rack 30 to be tested is first loaded in the loading/unloading zone TA. Then, the sample rack 30 is transported to the buffer zone TC via the transfer zone TB by the docking device 103, and then transferred from the buffer zone TC to the sampling zones TD and TE on both sides, which are docked with the corresponding sample detection units, via the transfer zone TB for sampling and detection. The tested sample rack is returned to the buffer zone TC again by the docking device 103 via the transfer zone TB to wait for the test result. If the inspected sample rack does not need to be retested, the inspected sample rack is finally returned to the loading/unloading zone TA for unloading (i.e., removal) by the docking device 103. If the inspected sample rack still needs to be inspected again, the inspected sample rack is made to wait in the buffer TC to be sent to the sampling region TD or TE again for sampling and inspection. It should be understood that the sample rack manipulation device 10 according to the present disclosure is not limited to the specific operational procedures described above. For example, the sample rack 30 may be transported directly from the loading/unloading zone TA to the sampling zone TD or TE via the transport zone TB. Similarly, the tested sample rack may also be returned directly from the sampling zone TD or TE to the loading/unloading zone TA via the transfer zone TB.

Loading/unloading area TA

The loading/unloading zone TA is disposed adjacent to the door 101 and extends along the length (i.e., the horizontal direction in fig. 1) of the door 101. The load/unload region TA is substantially rectangular. In the example of fig. 1, the loading/unloading zone TA has a plurality of sample rack passages S01 to S12 extending substantially perpendicular to the door 101 for placing the elongated sample racks 30. However, it should be understood that the shape or configuration of the sample rack may vary, and accordingly, the shape or configuration of the sample rack channel may also vary, and is not limited to the specific examples shown.

The door 101 is pivotably connected at its bottom to a housing (not shown), whereby the door 101 can be pivoted about its bottom to the outside to be opened, so that an operator can easily load or remove the sample rack 30 carrying the sample tubes 31 into or from the passage of the loading/unloading zone TA.

Referring to fig. 2, sensors TAS01 to TAS12 for detecting whether or not the specimen rack 30 is loaded in the lanes are provided corresponding to the respective lanes S01 to S12. Indicator lights (not shown) may be provided for each lane to indicate the loading and testing of the sample racks in that lane, e.g., unloaded sample racks, loaded sample racks to be tested, and loaded sample racks tested.

A sensor TAs15 is provided adjacent the transfer zone TB of the loading/unloading zone TA. In the example of fig. 2, the sensor TAS15 is arranged in a horizontal direction to detect whether any sample rack during loading or transport is partially entering the transport zone TB beyond the rack lane. For example, in fig. 2, the sensor TAS15 detects that the sample rack 30a is beyond the sample rack lane S08.

It should be understood that the sensor for detecting the sample rack of the loading/unloading zone TA is not limited to the specific example illustrated, but may be changed as needed.

Buffer TC

The buffer zone TC is arranged on both sides of the transfer zone TB opposite the loading/unloading zone TA. In fig. 2, buffer zone TC is located on the upper side of transfer zone TB, while load/unload zone TA is located on the lower side of transfer zone TB. The buffer TC is used for temporarily storing the sample rack, for example, waiting to be transported to the sampling area TD or TE for testing or waiting for test results.

The size and configuration of the buffer zone TC may be substantially the same as the load/unload zone TA. Like the loading/unloading zone TA, the buffer zone TC may have a plurality of sample rack lanes arranged side by side for storing a plurality of sample racks. The sample rack lane of the buffer zone TC may correspond to or align with the sample rack lane of the load/unload zone TA.

The buffer zone TC may be provided with sensors as the load/unload zone TA to detect the loading of the sample rack in the respective sample rack lane. However, it is to be understood that the arrangement of the sensors of the buffer zone TC may be different from that of the load/unload zone TA. For example, referring to fig. 2, in order to reduce costs, a sensor TBS09 may be provided on an end of the docking device 103 facing the buffer TC, as shown in fig. 2. The sensor TBS09 can detect the presence of a sample rack in each sample rack channel of the buffer TC as the docking apparatus 103 moves in the horizontal direction.

Sampling regions TD and TE

The sampling regions TD and TE are arranged on both sides (left and right sides in fig. 2) in the transverse direction of the load/unload region TA and the buffer region TC, which are disposed side by side, respectively. The sampling regions TD and TE are the interface regions of the sample holder manipulator 10 associated with the respective detection units. When the sample rack 30 to be tested is transferred from the buffer zone TC or the loading/unloading zone TA to the sampling zone TD or TE by the docking device 103, as described above, the sample in the test tube 31 is collected into the reaction stage 12 (see fig. 1) by the sampler 11 (see fig. 1) for detection.

After the sample in one test tube 31 is collected, the sample rack 30 is moved to make the next test tube 31 reach the sampling position of the sampler 11 for the next sampling until the sampling of the samples in all the test tubes 31 on one sample rack 30 is completed. Thereafter, the tested sample rack 30 is transferred by the docking device 103 from the sampling zone TD or TE to the buffer zone TC to wait for the test result. If no more testing is needed, the docking device 103 transfers the tested sample rack in the buffer zone TC to the loading/unloading zone TA for unloading. If a test is required (either the test of the same test cell or the test of a different test cell), the sample rack that has been tested once waits in the buffer TC to be sent to the sample area TD or TE for the next sample test. To improve detection efficiency, during sampling of one sample rack, the other sample rack may be transported into the sampling regions TD and TE to await sampling.

Referring to fig. 2, a sensor TDs03 may be provided in the sampling region TD to detect the presence of a sample rack in the sampling region TD. Similarly, sensor TES03 may be disposed in sampling zone TE to detect the presence of a sample rack in sampling zone TE.

Transport zone TB

The docking device 103 moves in the transfer zone TB to transport the sample rack to the various zones of the sample rack manipulator 10. To this end, the loading/unloading zone TA, the buffer zone TC and the sampling zones TD and TE of the sample rack manipulator 10 are arranged adjacent to and around the transport zone TB. As shown, the docking device 103 is movable in the transfer zone TB in the X direction (horizontal direction in the figure) and the Y direction (vertical direction in the figure) to enable access to the loading/unloading zone TA, the buffer zone TC and the sampling zones TD and TE. Thus, the transfer zone TB may be considered as the zone in which the docking device 103 moves.

Connecting device

A plurality of motors may be provided on the docking device 103 to enable movement and lifting movement of the docking device 103 in the X and Y directions within the transfer zone TB and also to enable interaction between the docking device 103 and the loading/unloading zone TA, the buffer zone TC and the sampling zones TD and TE.

Since the docking device 103 is an important movable part that transports the sample rack, the position of the docking device 103 needs to be accurately controlled and the sample rack loading state of the docking device 103 needs to be accurately known.

For this purpose, an initial position is usually set for the docking device 103, for example at a position adjoining the buffer zone TC and the sampling zone TD. The docking device 103 is typically stopped in an initial position before the sample rack manipulator 10 is activated. When the sample rack manipulator 10 is finished to stop, the docking device 103 returns to the initial position after transporting all the sample racks to the loading/unloading zone TA for the next operation of the sample rack manipulator 10. By setting the initial position, the position of the docking device 103 can be advantageously and accurately calculated and the accumulated error of the position of the docking device 103 can be eliminated. A sensor (not shown) is provided at the initial position to detect whether the docking device 103 is at the initial position.

However, when the sample rack manipulator 10 is interrupted, for example due to an unexpected power outage, the docking device 103 is often not in the initial position, but is parked at any possible position, for example, at any position on the way to transport the sample rack or at a position when in an interactive state with one of the load/unload zone TA, the buffer zone TC and the sampling zones TD and TE.

The term "interaction state" is used herein to denote a state when a sample rack has not been completely transferred between the loading/unloading zone TA, the buffer zone TC and one of the sampling zones TD and TE and the docking device 103, and a state in which there is an element (e.g., a push rod for pushing the sample rack to move in the sampling zone) that interacts with the docking device 103 and may impede movement relative to each other. Furthermore, the term "non-interactive state" is used to denote a state in which the docking device 103 is able to move freely in the transfer zone TB to transport a sample rack loaded thereon to or from another area.

In order to determine the state of the docking apparatus 103, sensors TBS06, TBS07 and TBS08 are provided on the docking apparatus 103 in its longitudinal direction. Referring to fig. 2, the sensor TBS06 is located at an end facing the loading/unloading zone TA. The sensor TBS08 is located at an end facing the buffer TC, i.e. arranged opposite to the sensor TBS 06. Sensor TBS07 is located between sensor TBS06 and TBS 08.

Referring to fig. 2, when none of the sensors TBS06, TBS07 and TBS08 detected a sample rack 30, it indicates that no sample rack 30 was present on the docking apparatus 103. At this time, the docking device 103 is in a non-interactive state in which one sample rack 30 is to be transported away from one of the loading/unloading zone TA, the buffer zone TC, and the sampling zones TD and TE.

Referring to fig. 3, when the sensors TBS06, TBS07 and TBS08 are all able to detect the sample rack 30, it indicates that the sample rack 30 is fully loaded on the docking apparatus 103. At this time, the docking device 103 is in a non-interactive state of transporting the sample rack 30 to one of the loading/unloading zone TA, the buffer zone TC, and the sampling zones TD and TE.

Referring to fig. 4, when both sensors TBS06 and TBS07 detect a sample rack 30 and sensor TBS08 does not detect a sample rack 30, it indicates that a portion of the sample rack 30 is on the docking apparatus 103 and another portion of the sample rack 30 is in the loading/unloading zone TA. In an example not shown, when only the sensor TBS06 detects a sample rack 30, it is also indicated that a part of the sample rack 30 is on the docking apparatus 103, while another part of the sample rack 30 is in the loading/unloading zone TA. At this time, the docking device 103 is in an interactive state with the loading/unloading zone TA.

Referring to fig. 5, when both sensors TBS08 and TBS07 detect a sample rack 30 and sensor TBS06 does not detect a sample rack 30, it indicates that a portion of the sample rack 30 is on the docking apparatus 103 and another portion of the sample rack 30 is in the buffer TC. In an example not shown, when only the sensor TBS08 detects a sample rack 30, it also indicates that a portion of the sample rack 30 is on the docking apparatus 103, while another portion of the sample rack 30 is in the buffer TC. At this time, the docking device 103 is in an interactive state with the buffer TC.

Referring again to fig. 2, a sensor TBS16 may also be provided on the docking apparatus 103. The sensor TBS16 is adapted to cooperate with a detection feature (e.g., a detection tab or a detection notch) on the trajectory of movement of the docking device 103 to detect the position of the docking device 103 in the X-direction.

Furthermore, a sensor TBs01 may be provided in the transport zone TB for detecting whether the docking device 103 is in a position adjacent to the sampling zone TD for unloading or loading a sample rack from or to the sampling zone TD. Similarly, a sensor TBs18 may also be provided in the transfer zone TB for detecting whether the docking device 103 is in a position adjacent to the sampling zone TE for unloading or loading a sample rack from or to the sampling zone TE.

Optionally, a sensor TDS05 may also be provided for detecting whether the sample rack passage of the sampling area TD is in an initial position, thereby determining whether the docking device 103 is in an interaction state with, for example, the push rod (not shown) as described above. Similarly, a sensor TES05 may also be provided for detecting whether the sample rack lane of the sampling area TE is in an initial position, thereby determining whether the docking device 103 is in an interaction state with, for example, a push rod (not shown).

A push rod (not shown) is adapted to push a sample rack in the sampling region TD so that the sample in each test tube on that sample rack is sampled one by one, and to push a sample rack so that one sample rack is loaded or unloaded and the other sample rack is pushed to the sampling position if two sample racks can be present in the sampling region TD. When the docking device 103 interacts with the push rod, there may be situations where movement relative to each other is impeded. For this reason, the interaction state of the docking device 103 with the push rod may be judged by combining the detection results of the sensors TDS05, TES05 and TBS16 (see table 1 below).

TABLE 1

Position of the connecting device	TDS05	TBS16	TES05
				Position A1	Initial position	----	Initial position
Position A2	Non-initial position	Interference	Initial position
				Position A3	Non-initial position	Without interference	Initial position
Position A4	Initial position	Interference	Non-initial position
				Position A5	Initial position	Without interference	Non-initial position

When the sensors TDS05 and TES05 detect that the sample rack lanes of the sampling regions TD and TE, respectively, are in the initial positions, this indicates that the docking device 103 is in the transport region TB and does not interact with the sampling regions TD and TE, i.e. is in position a1 shown in fig. 6. In this case, the detection result of the sensor TBS16 does not need to be referred to.

When sensor TDS05 detects that the sample rack lane of sampling zone TD is in a non-home position and sensor TES05 detects that the sample rack lane of sampling zone TE is in a home position, this indicates that the docking device 103 is in an interactive state with the sampling zone TD. At this time, in order to further determine the position of the docking apparatus 103, the detection result of the sensor TBS16 needs to be referred to.

When the sensor TBS16 detects that the docking apparatus 103 interferes with the ram reset, it further indicates that the docking apparatus 103 is in the position a2 shown in fig. 7, i.e., in the interference interaction state.

When the sensor TBS16 detects that the docking apparatus 103 does not interfere with the ram reset, it further indicates that the docking apparatus 103 is in the position A3 shown in fig. 8, i.e., in a non-interfering interaction state.

When sensor TDS05 detects that the sample rack lane of the sampling zone TD is in the initial position and sensor TES05 detects that the sample rack lane of the sampling zone TE is in the non-initial position, this indicates that the docking device 103 is in an interactive state with the sampling zone TE. At this time, in order to further determine the position of the docking apparatus 103, the detection result of the sensor TBS16 needs to be referred to.

When the sensor TBS16 detects that the docking apparatus 103 interferes with the ram reset, it further indicates that the docking apparatus 103 is in the position a4 shown in fig. 9.

When the sensor TBS16 detects that the docking apparatus 103 does not interfere with the ram repositioning, it further indicates that the docking apparatus 103 is in the position a5 shown in fig. 10.

It will be appreciated that the push rod described above is merely one example of a pushing means for pushing the sample rack to move within the sampling region. When the structure, arrangement or pushing manner of the pushing means is changed, the interaction manner of the docking means 103 with the sampling zone may also be changed.

It should also be understood that the various components and regions of the sample rack manipulation device and the type and arrangement of sensors according to the present disclosure are not limited to the specific examples illustrated, so long as they are capable of performing the above-described functions.

For example, in the illustrated embodiment, the load and unload regions of the sample rack are not provided separately, but rather function through a common load/unload region. The present invention is not limited thereto and a separate unloading zone may be additionally provided in a downstream area of the conveyor belt opposite to the upstream loading zone.

In the embodiment shown, the load/unload and buffer zones of the sample rack manipulator are arranged substantially symmetrically, but the buffer zones may have different sample rack capacities than the load/unload zones, depending on the circumstances.

Sample rack recovery method

When the sample rack manipulator 10 is unexpectedly powered down and interrupted, there may be sample racks in one or more of the load/unload zone TA, the buffer zone TC, and the sampling zones TD and TE, and it is likely that the interface 103 and push rod, etc. do not return to the initial position. Therefore, when the sample rack manipulator 10 is restarted, it is necessary to automatically retrieve the sample rack to the loading/unloading zone TA for the operator to take it out, and return the docking device 103 to the initial position so that the sample rack manipulator 10 is restored to the normal detection procedure.

The automatic sample rack retrieval method according to the present disclosure is described below in terms of various possible situations after an accidental power outage to the sample rack manipulation device 10.

Example 1: the docking device is in a non-interactive state and does not load a sample rack

As described above, when no sample rack is detected by any of the sensors TBS06, TBS07, and TBS08, it may be determined that no sample rack is loaded on the docking apparatus 103, which means that the docking apparatus 103 does not interact with the loading/unloading zone TA or the buffer zone TC. Further, when the sensors TDS05 and TES05 detect that the sample rack lanes of the sampling regions TD and TE, respectively, are in the initial positions, it may further indicate that the docking device 103 is in the non-interacting state.

Thus, in this example, it is detected by the sensor that the docking device is in a non-interactive state free to move in the transfer zone and no sample rack is loaded (see step S110 in fig. 12).

In this case, the docking device 103 may be returned to the initial position first. The position of the sample rack in the respective area of the sample rack manipulator is detected. Then, the sample racks in the buffer zone TC, the sampling zone TD, and the TE are carried back into the unloaded sample rack lanes of the loading/unloading zone TA one by the docking device 103 according to the condition of the sample racks in the loading/unloading zone TA, the buffer zone TC, the sampling zone TD, and the TE detected by the sensor. If a full sample rack has been loaded in the load/unload area TA, it may wait for the operator to take one or more sample racks from the load/unload area TA before transporting the sample racks of other areas back into the unloaded sample rack lanes of the load/unload area TA.

In order to improve the recovery efficiency of the sample rack, the docking device 103 may be configured to recover the sample rack closest to the docking device 103 and then recover the sample rack farther from the docking device 103. That is, the order of the recovered sample racks may be determined according to the distance from the docking device 103. In this way, the recovery efficiency is improved by reducing the movement distance of the docking device 103.

In order to achieve efficient detection of the sensor, the docking device 103 may first recover the sample rack of the sampling zone and then recover the sample rack of the buffer zone TC. In this way, when the docking apparatus 103 retrieves the sample racks of the sampling regions TD and TE, the sensor TBS09 can detect whether there is a sample rack in each sample rack passage of the buffer region TC as the docking apparatus 103 moves in the horizontal direction (X direction).

Example 2: the docking device is in a non-interactive state and is loaded with a sample holder

Example 2 differs from example 1 in that the sensors TBS06, TBS07, and TBS08 each detect a sample rack, from which it can be determined that the docking apparatus 103 is loaded with a sample rack and in a non-interactive state.

In example 2, the docking device 103 may return to the initial position with the sample rack and then transport the sample rack back into the unloaded sample rack lane of the loading/unloading zone TA. Thereafter, the docking device 103 retrieves the sample racks in the sampling zone and the buffer zone into the loading/unloading zone TA one by one as in example 1.

In an alternative embodiment, the docking device 103 may also transport the sample rack thereon back to the loading/unloading zone TA and then return to the initial position. Thereafter, the docking device 103 retrieves the sample racks in the sampling zone and the buffer zone one by one into the loading/unloading zone TA.

If a full sample rack has been loaded in the load/unload area TA, it may wait for the operator to take one or more sample racks from the load/unload area TA before transporting the sample racks of other areas back into the unloaded sample rack lanes of the load/unload area TA.

Example 3: the connection device is in an interactive state with the loading/unloading zone or the buffer zone

As described above, when one or both of the sensors TBS06 and TBS07 detect a sample rack 30 and the sensor TBS08 does not detect a sample rack, it indicates that the docking apparatus 103 is in an interactive state with the loading/unloading zone TA.

When it is determined that the docking device 103 is in an interaction state with the loading/unloading zone TA, the sample rack is completely transferred into the sample rack passage of the loading/unloading zone TA, and then the docking device 103 is returned to the initial position. Thereafter, the docking device 103 retrieves the sample racks in the sampling zone and the buffer zone one by one into the loading/unloading zone TA.

Regarding the interaction state of the docking device 103 with the buffer zone TC, the interaction state of the docking device 103 with the load/unload zone TA is similar, and therefore the description is not repeated herein.

Example 4: the connection device is in the state of interaction with the sampling zone

As described above, when the sensor TDS05 or TES05 detects that the sample rack lane of the sampling region TD or TE is in a non-initial position, it indicates that the docking device 103 is in an interactive state with the sampling region TD or TE.

Further, in combination with the detection result of the sensor TBS16, it can be determined whether the docking apparatus 103 is in the interference interaction state (as shown in fig. 7 and 9) or the non-interference interaction state (as shown in fig. 8 and 10).

When it is determined that the docking device 103 is in the interference interaction state, the docking device 103 is first moved away from the sampling zone (e.g., the docking device 103 moves to the right in fig. 7, and the docking device 103 moves to the left in fig. 9), so that the docking device 103 no longer interferes with the push rod reset. Then, the push rod is reset. At this time, it is determined whether there is a sample rack on the docking apparatus 103 by the sensors TBS06, TBS07, and TBS 08. Upon determining that no sample rack is present on the docking device 103, the sample rack manipulation device 10 may be operated according to the sample rack retrieval method described in example 1. Upon determining that a sample rack is present on the docking device 103, the sample rack manipulation device 10 may be operated according to the sample rack retrieval method described in example 2.

Furthermore, when the sensor TDS03 detects the presence of a sample rack in the sampling zone, the push rod is moved again to a position to interact with the docking device to unload the sample rack detected in the sampling zone onto the docking device, which is then transported back to the loading/unloading zone TA by the docking device. The process of the push rod returning to the interaction position and interacting with the docking device to remove the sample rack from the sampling zone is the same as the process of the sample rack manipulator when it is operating normally and will not be described further here.

When it is determined that the docking device 103 is in the non-interfering interaction state as shown in fig. 8 and 10, the push rod may be reset. Whether a sample rack exists on the docking apparatus 103 is determined according to the detection results of the sensors TBS06, TBS07 and TBS 08. Upon determining that no sample rack is present on the docking device 103, the sample rack manipulation device 10 may be operated according to the sample rack retrieval method described in example 1. Upon determining that a sample rack is present on the docking device 103, the sample rack manipulation device 10 may be operated according to the sample rack retrieval method described in example 2.

Through the description of the above examples 1 to 4, the sample rack collection method according to the present disclosure may be summarized as a flowchart shown in fig. 11. Referring to fig. 11, the sample rack recovery method includes: a docking device detection step S10 of detecting a state of the docking device; a sample rack detecting step S30 of detecting the positions of the sample rack manipulating device, particularly the sample racks in the loading/unloading zone TA, the buffer zone TC, and the sampling zones TD and TE; and a sample rack recovery step S50 of conveying the sample rack to the loading/unloading zone TA by the docking device 103 according to the detection results of the docking device 103 and the sample rack. After the sample rack recovery step S50, the docking device 103 may also be returned to its initial position (step S70) in order to perform a normal sample detection procedure.

Fig. 12 illustrates one embodiment of detecting a state of a docking device. Referring to fig. 12, step S10 in fig. 11 includes detecting the position of the docking device 103 and the specimen rack loading state (step S100).

Depending on the position of the docking device 103 and the sample rack loading state, it is determined whether the docking device 103 is in a non-interacting state capable of free movement (step S110) or in an interacting state with the loading/unloading zone TA, the sampling zone TD or TE or the buffer zone TC (steps S120, S130 and S140).

When it is determined that the docking device 103 is in the non-interactive state (step S110), it is determined whether a specimen rack is loaded on the docking device 103 (step S102). When it is determined that there is a sample rack on the docking device 103, the docking device 103 first transports the sample rack back to the loading/unloading zone TA (step S104). Before step S104, it may be checked whether the loading/unloading area TA is loaded with a full sample rack (step S107). If the load/unload area TA is already loaded with full sample racks, it may wait for the operator to take one or more sample racks from the load/unload area TA and then transport the sample racks of other areas back into the unloaded sample rack lanes of the load/unload area TA (step S108). If no full sample rack is loaded in the loading/unloading zone TA, the sample racks of other areas can be directly transported back into the unloaded sample rack lanes of the loading/unloading zone TA (step S104). Then, before the sample rack collection step, the docking device 103 may also be returned to the initial position (step S106).

When it is determined that the docking device 103 is in the interaction state with the loading/unloading zone TA (step S120), the docking device 103 first completely transfers the sample rack on the docking device 103 into the loading/unloading zone TA (step S122). Then, before the sample rack collection step, the docking device 103 may also be returned to the initial position (step S106).

When it is determined that the docking apparatus 103 is in the interaction state with the buffer zone TC (step S130), the docking apparatus 103 completely transfers the sample rack on the docking apparatus 103 into the buffer zone TC (step S134), or completely transfers the sample rack on the docking apparatus 103 onto the docking apparatus 103 (step S132) and transports back to the loading/unloading zone TA (step S104). Before step S104, it may be checked whether the loading/unloading area TA is loaded with a full sample rack (step S107). If the load/unload area TA is already loaded with full sample racks, it may wait for the operator to take one or more sample racks from the load/unload area TA and then transport the sample racks of other areas back into the unloaded sample rack lanes of the load/unload area TA (step S108). If no full sample rack is loaded in the loading/unloading zone TA, the sample racks of other areas can be directly transported back into the unloaded sample rack lanes of the loading/unloading zone TA (step S104). Then, before the sample rack collection step, the docking device 103 may also be returned to the initial position (step S106).

When it is determined that the docking device 103 is in an interaction state with the sampling region TD or TE (step S140), it is determined whether the docking device 103 interferes with the reset of the pushing device for controlling the movement of the sample rack in the sampling region (step S142).

When it is determined that the docking device 103 does not interfere with the return of the pushing device, the pushing device is returned and it is determined whether or not there is a sample rack on the docking device 103 (step S102). When it is determined that there is a sample rack on the docking device, the docking device first transports the sample rack back to the loading/unloading zone TA (step S104). Then, before the sample rack collection step, the docking device 103 may also be returned to the initial position (step S106).

When it is determined that the docking device 103 interferes with the resetting of the pushing device, the docking device 103 is moved so as not to interfere with the resetting of the pushing device, and then the pushing device is reset (step S144). Then, it is determined whether or not a sample rack is present on the docking apparatus (step S102). When it is determined that there is a sample rack on the docking device, the docking device first transports the sample rack thereon back to the loading/unloading zone TA (step S104). Before step S104, it may be checked whether the loading/unloading area TA is loaded with a full sample rack (step S107). If the load/unload area TA is already loaded with full sample racks, it may wait for the operator to take one or more sample racks from the load/unload area TA and then transport the sample racks of other areas back into the unloaded sample rack lanes of the load/unload area TA (step S108). If no full sample rack is loaded in the loading/unloading zone TA, the sample racks of other areas can be directly transported back into the unloaded sample rack lanes of the loading/unloading zone TA (step S104). Then, before the sample rack collection step, the docking device may also be returned to the initial position (step S106).

It should be understood that the above-described automatic collection method of the sample rack is not limited to the above-described specific example, but may be changed as needed. For example, the respective steps of the automatic recycling method may change the order of execution without contradiction, or may be combined with each other or omit a certain step.

The apparatus and methods described herein may be implemented by one or more computer programs executed by one or more processors. The computer program includes processor-executable instructions stored on a non-transitory tangible computer-readable medium. The computer program may also include stored data. Non-limiting examples of non-transitory tangible computer readable media are non-volatile memory, magnetic storage devices, and optical storage devices.

While various embodiments and modifications of the present invention have been specifically described above, it will be understood by those skilled in the art that the present invention is not limited to the specific embodiments and modifications described above but may include other various possible combinations and combinations. Other modifications and variations may be effected by one skilled in the art without departing from the spirit and scope of the invention. All such variations and modifications are intended to be within the scope of the present invention. Moreover, all the components described herein may be replaced by other technically equivalent components.