阅读说明：本技术 用于测试显示面板的探针头 (Probe head for testing display panel ) 是由 李镕宽 于 2020-08-31 设计创作，主要内容包括：公开了一种用于测试显示面板的探针头,其包括主体、构造成与面板接触的第一接触部、构造成与面板接触的第二接触部、构造成将主体连接到第一接触部的第一臂、以及构造成将主体连接到第二接触部的第二臂。其中,第一臂和第二臂每个都从主体水平延伸。第一臂和第二臂布置成在垂直方向间隔开。第一接触部和第二接触部布置成在前后方向间隔开。第一臂布置在第二臂的下面。第一接触部布置在第二接触部的前方。而且,布置在主体和第二臂之间的边界上的第二角部位于布置在主体和第一臂之间的边界上的第一角部的后方。(A probe head for testing a display panel is disclosed, which includes a main body, a first contact portion configured to contact the panel, a second contact portion configured to contact the panel, a first arm configured to connect the main body to the first contact portion, and a second arm configured to connect the main body to the second contact portion. Wherein the first arm and the second arm each extend horizontally from the body. The first arm and the second arm are arranged to be spaced apart in a vertical direction. The first contact portion and the second contact portion are arranged to be spaced apart in the front-rear direction. The first arm is disposed below the second arm. The first contact portion is arranged in front of the second contact portion. Also, the second corner portion disposed on the boundary between the main body and the second arm is located rearward of the first corner portion disposed on the boundary between the main body and the first arm.)

1. A probe head, comprising:

a main body;

a first contact portion configured to contact the panel;

a second contact portion configured to contact the panel;

a first arm configured to connect the body to the first contact portion; and

a second arm configured to connect the main body to the second contact portion,

wherein the first arm and the second arm each extend horizontally from the body,

wherein the first arm and the second arm are arranged to be spaced apart in a vertical direction,

wherein the first contact portion and the second contact portion are arranged to be spaced apart in the front-rear direction,

wherein the first arm is disposed below the second arm,

wherein the first contact portion is arranged in front of the second contact portion, and

wherein a second corner disposed on a boundary between the body and the second arm is located rearward of a first corner disposed on a boundary between the body and the first arm.

2. The probe head as recited in claim 1, wherein the first contact portion includes a region having a front-to-back width that gradually decreases in an upward direction, and

wherein the second contact portion includes a region having a front-rear width that gradually increases in an upward direction.

3. The probe head as recited in claim 1, wherein in the face plate, the second contact portion forms a scratch that at least partially overlaps with a scratch formed by the first contact portion.

4. The probe head according to claim 1, wherein a front-to-rear width between a front surface of the first contact portion and a rear surface of the second contact portion decreases in an upward direction.

5. The probe head according to claim 1, wherein a rear surface of the first contact portion and a front surface of the second contact portion are arranged to face each other, and

wherein the rear surface of the first contact portion and the front surface of the second contact portion are arranged to be inclined forward in the vertical direction.

6. The probe head of claim 5, wherein the first contact portion comprises a first tip configured to contact the faceplate,

wherein the second contact portion includes a second pointed end configured to contact the panel,

wherein the first tip is disposed forward of the first arm, and

wherein the second tip is disposed forward of the second arm.

7. The probe head of claim 1, wherein a vertical distance between a bottom surface of the second arm and a top surface of the first arm is less than a minimum distance between a rear surface of the first contact and a front surface of the second contact.

Technical Field

Embodiments relate to a probe pin for testing a display panel.

Background

Various tests were performed on display panels including a mobile display panel. For example, a lighting test or the like may be performed on a motherboard disposed on an in-tank probe (ICP) unit or a probe block of a lighting probe unit. During the testing of the display panel, the contact ends of the probe head may form scratches. Shavings generated when the contact end forms a scratch may be accumulated in front of the contact end. Such shavings cause problems of disturbing the electrical contact of the contact terminals.

Disclosure of Invention

The present invention aims to provide a probe tip having excellent electrical contact at a scratch.

Aspects of the present invention are not limited to the above aspects, and other unrepresented aspects of the present invention will be understood by those skilled in the art from the following disclosure.

According to an aspect of the present invention, there is provided a probe head including a body, a first contact portion configured to contact a panel, a second contact portion configured to contact the panel, a first arm configured to connect the body to the first contact portion, and a second arm configured to connect the body to the second contact portion. Wherein the first arm and the second arm each extend horizontally from the body. The first arm and the second arm are arranged to be spaced apart in a vertical direction. The first contact portion and the second contact portion are arranged to be spaced apart in the front-rear direction. The first arm is disposed below the second arm. The first contact portion is arranged in front of the second contact portion. Also, the second corner portion disposed on the boundary between the main body and the second arm is located rearward of the first corner portion disposed on the boundary between the main body and the first arm.

The first contact portion may include a region having a front-rear width gradually decreasing in the upward direction, and the second contact portion may include a region having a front-rear width gradually increasing in the upward direction.

In the panel, the second contact portion may form a scratch at least partially overlapping with the scratch formed by the first contact portion.

A front-to-rear width between the front surface of the first contact portion and the rear surface of the second contact portion may decrease in the upward direction.

The rear surface of the first contact portion and the front surface of the second contact portion may be arranged to face each other. Also, the rear surface of the first contact portion and the front surface of the second contact portion may be arranged to be inclined forward in the vertical direction.

The first contact portion may include a first tip configured to contact the panel. The second contact portion may include a second pointed end configured to contact the panel. The first tip may be disposed forward of the first arm. The second tip may be disposed forward of the second arm.

A vertical distance between the bottom surface of the second arm and the top surface of the first arm may be less than a minimum distance between the rear surface of the first contact and the front surface of the second contact.

The first arm may include a first hole and a second hole horizontally arranged, and the second hole may be arranged above the first hole.

The front-to-back width of the second aperture may be greater than the front-to-back width of the first aperture.

The second hole may include a bent portion formed by bending the rear end downward.

The curved portion may include a region overlapping the first hole in the front-rear direction.

In the vertical direction, a vertical distance between a top surface of the first hole and a bottom surface of the second hole may be smaller than each of a vertical height of the first hole and a vertical height of the second hole.

Drawings

The above and other objects, features and advantages of the present invention will become more apparent to those of ordinary skill in the art by describing in detail exemplary embodiments thereof with reference to the attached drawings, in which:

FIG. 1 is a view of a probe head according to an embodiment;

FIG. 2 is a front view of the probe head shown in FIG. 1;

fig. 3 and 4 are enlarged views illustrating the first contact portion and the second contact portion illustrated in fig. 2;

FIG. 5 is a front view of the probe head showing the first arm including the first aperture and the second aperture.

Fig. 6 is a view showing a vertical distance between a first hole and a second hole; and

fig. 7 is a view illustrating scratches generated by the first contact portion and the second contact portion.

Detailed Description

Various aspects, specific advantages and novel features of the invention will become apparent from the following detailed description of exemplary embodiments with reference to the drawings. In addition, the terms used in the specification and the claims should not be limited to general or lexical meanings, but should be interpreted as having meanings and concepts conforming to the technical concepts of the present invention on the basis of the principle that the inventor can appropriately define the concepts of the terms to describe the present invention in the best way. In addition, in describing the present invention, a detailed description of known functions or components of the related art will be omitted when it is considered that such detailed description would obscure the essence of the present invention.

FIG. 1 is a view of a probe head according to an embodiment. Hereinafter, an x-axis in the drawings indicates a front-rear direction of the probe head, a y-axis indicates a lateral direction of the probe head, and a z-axis indicates a vertical direction of the probe head.

Referring to fig. 1, a probe head according to an embodiment may include a body 100, a first contact part 200, a second contact part 300, a first arm 400, and a second arm 500. The first arm 400 and the second arm 500 may be disposed above the body 100. The first contact portion 200 may be disposed above the first arm 400. The second contact portion 300 may be disposed above the second arm 500.

The body 100 may include a region formed with a longitudinal direction in a vertical direction.

The first contact portion 200 and the second contact portion 300 are portions that contact the panel.

The first arm 400 connects the first contact portion 200 to the main body 100. The first arm 400 may be formed to horizontally extend from the main body 100 in the front-rear direction (x).

The second arm 500 connects the second contact part 300 to the main body 100. The second arm 500 may be formed to horizontally extend in the front-rear direction (x) from the main body 100.

The first arm 400 may be disposed below the second arm 500. The first arm 400 may be disposed to be spaced apart from the second arm 500 in the vertical direction (z).

Figure 2 is a front view of the probe head shown in figure 1.

Referring to fig. 2, the first contact portion 200 and the second contact portion 300 are arranged to be spaced apart from each other in the front-rear direction (x). The first contact portion 200 may be disposed in front of the second contact portion 300.

The first arm 400 horizontally extends from the main body 100 to have a cantilever shape. A first corner 410 having a curved shape is disposed on a boundary between the first arm 400 and the body 100.

The second arm 500 horizontally extends from the main body 100 to have a cantilever shape. A second corner 510 having a curved shape is disposed on a boundary between the second arm 500 and the main body 100.

The second corner portion 510 is disposed rearward of the first corner portion 410. This is in consideration of the fact that the position of the first contact portion 200 is configured to generate scratches (scrub marks) in front of the second contact portion 300.

Fig. 3 and 4 are enlarged views illustrating the first contact portion 200 and the second contact portion 300 illustrated in fig. 2.

Referring to fig. 3, the first contact portion 200 may include a region having a front-to-rear width W1 that gradually decreases in an upward direction. The second contact portion 300 may also include a region having a front-rear width W2 that gradually increases in the upward direction. In addition, the front-to-rear width W3 between the front surface 210 of the first contact portion 200 and the rear surface 320 of the second contact portion 300 may gradually decrease in the upward direction.

Referring to fig. 4, the rear surface 220 of the first contact part 200 and the front surface 310 of the second contact part 300 may be arranged to face each other. The rear surface 220 of the first contact portion 200 and the front surface 310 of the second contact portion 300 may be arranged to be inclined forward in the vertical direction (z).

Also, the first contact portion 200 may include a first pointed end 230 contacting the panel. The second contact portion 300 may include a second tip 330 contacting the panel. Also, the first tip 230 may be disposed in front of the first arm 400, and the second tip 330 may be disposed in front of the second arm 500.

Meanwhile, a perpendicular distance D2 between the bottom surface of the second arm 500 and the top surface of the first arm 400 may be less than a minimum distance D1 between the rear surface 220 of the first contact part 200 and the front surface 310 of the second contact part 300.

The above structure of the probe head is configured to form two scratches on the panel using the first contact portion 200 and the second contact portion 300 and allow the two scratches to partially overlap.

Figure 5 is a front view of the probe head showing the first arm 400 including the first aperture and the second aperture. Referring to fig. 5, the first arm 400 may include a first hole 420 and a second hole 430. The first and second holes 420 and 430 may be arranged to be horizontal in the front-rear direction (x). The second hole 430 may be disposed above the first hole 420. The first and second holes 420 and 430 perform a function of dispersing stress concentrated on the first arm 400. The front-to-back width W5 of the second hole 430 may be greater than the front-to-back width W4 of the first hole 420.

Here, the second hole 430 may include a bent portion 421 formed by bending a rear end downward. The bent portion 421 may include a region O overlapping the first hole 420 in the front-rear direction (x). This is to effectively disperse the stress generated by the external force generated by the contact with the panel.

Fig. 6 is a view showing a perpendicular distance D3 between the first hole 420 and the second hole 430.

Referring to fig. 6, in the vertical direction (z), a vertical distance D3 between the top surface of the first hole 420 and the bottom surface of the second hole 430 may be less than each of a vertical height H1 of the first hole 420 and a vertical height H2 of the second hole 430. This is to effectively absorb an external force when the first contact portion 200 forms a scratch.

Fig. 7 is a view illustrating scratches generated by the first contact portion 200 and the second contact portion 300.

Referring to fig. 7, when the first tip 230 of the first contact portion 200 applies pressure to the panel, a first scratch S1 may be generated. The first scratch S1 may be formed from back to front in the front-back direction (x). When the first scratch S1 is generated, the film of the panel is first removed. The shavings generated when the film of the panel is removed are accumulated in front of the first contact portion 200.

When the first pointed end 230 of the first contact part 200 applies pressure to the panel, the second pointed end 330 of the second contact part 300 applies pressure to the panel. When the second tip 330 of the second contact part 300 applies pressure to the panel, a second scratch S2 may be generated. The first scratch S1 may be formed from back to front in the front-back direction (x). Since the second tip 330 is disposed behind the first tip 230, the position of the second scratch S2 is different from the position of the first scratch S1, but an overlapping region S3 between the second scratch S2 and the first scratch S1 may be formed.

When the probe head is brought into contact with the faceplate, eventually, the second tips 330 come into contact with the overlap area S3. Here, since shavings generated when removing the film of the panel are accumulated in front of the first tip 230, the overlapping area S3 disposed behind the first tip 230 is in a clean state. Since the first pointed end 230 and the second pointed end 330 are both in contact with the panel, there is an advantage in that stability of electrical contact is high. In particular, since the second tips 330 are disposed in the overlapping area S3, there is an advantage in that electrical contact is stably maintained without being disturbed by shavings generated when the film of the panel is removed.

As described above, the probe head according to one exemplary embodiment of the present invention has been described in detail.

According to this embodiment, an advantageous effect of having excellent electrical contact at the scratch is provided.

It should be noted that the above-mentioned one embodiment of the present invention is only an example in all aspects and is not intended to be limiting, and the scope of the present invention will be defined by the appended claims rather than the above detailed description. Also, it should be construed that all changeable or modifiable shapes and equivalents thereof derived from the meaning and scope of the claims are included in the scope of the present invention.

[ description of reference numerals ]

100: main body

200: first contact part

300: second contact part

400: first arm

410: first corner

420: first hole

430: second hole

500: second arm

510: second corner