阅读说明：本技术 晶圆缺陷的检测方法、检测系统和计算机可读存储介质 (Wafer defect detection method, detection system and computer readable storage medium ) 是由 周静兰 谢真良 徐杨喆 于 2020-07-31 设计创作，主要内容包括：本申请提供了一种晶圆缺陷的检测方法、检测系统和计算机可读存储介质。该方法包括：晶圆缺陷的检测系统接收光刻机台生成的检测数据,检测数据包括晶圆的缺陷信息,晶圆缺陷的检测系统将检测数据转换为预定格式,预定格式为晶圆缺陷的检测系统的数据的标准格式。由于该检测数据包括缺陷信息,因此,无需其他扫描仪器再专门获取缺陷信息而传输至晶圆缺陷的检测系统,该晶圆缺陷的检测系统后续利用该预定格式的检测数据就可以进一步检测缺陷的情况。该方法中,将光刻机台的检测数据传输至晶圆缺陷的检测系统中进行进一步应用,进而解决了现有技术中难以对光刻机台的检测数据进行充分利用而导致的数据资源浪费的技术问题。(The application provides a wafer defect detection method, a wafer defect detection system and a computer readable storage medium. The method comprises the following steps: the wafer defect detection system receives detection data generated by the photoetching machine, the detection data comprise defect information of the wafer, the wafer defect detection system converts the detection data into a preset format, and the preset format is a standard format of the data of the wafer defect detection system. Because the inspection data includes defect information, the inspection data does not need to be acquired by other scanning instruments and transmitted to the wafer defect inspection system, and the wafer defect inspection system can further inspect the defect condition by using the inspection data in the predetermined format. In the method, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved.)

1. A method for detecting wafer defects is characterized by comprising the following steps:

the wafer defect detection system receives detection data generated by a photoetching machine, wherein the detection data comprises defect information of a wafer;

and the wafer defect detection system converts the detection data into a preset format, wherein the preset format is a standard format of the data of the wafer defect detection system.

2. The inspection method of claim 1, wherein after the inspection data is converted into a predetermined format by the inspection system of the wafer defect, the inspection method further comprises:

and the wafer defect detection system generates a detection image according to the detection data in the preset format, wherein the detection image comprises a defect position identifier.

3. The inspection method according to claim 2, wherein after the wafer defect inspection system generates an inspection image according to the inspection data in the predetermined format, the inspection method further comprises:

the wafer defect detection system determines whether the number of the defect position marks in the detection image is larger than a preset number;

and under the condition that the number of the defect position marks is larger than the preset number, the wafer defect detection system controls to scan the actual position area of the wafer corresponding to the defect position marks to obtain a scanned image, wherein the area corresponding to the surface of the wafer in unit area in the scanned image is a first area, the area corresponding to the surface of the wafer in unit area in the detected image is a second area, and the first area is larger than the second area.

4. The detection method according to any one of claims 1 to 3, wherein the defect information includes a size of a defect, a position of the defect, and a number of the defects.

5. The inspection method according to any one of claims 1 to 3, wherein the wafer defect inspection system comprises a wafer defect analysis system, and the predetermined format is a standard format of data of the wafer defect analysis system.

6. A method for detecting wafer defects is characterized by comprising the following steps:

the photoetching machine platform detects the wafer to obtain detection data;

the photoetching machine table transmits the detection data to a wafer defect detection system;

and the wafer defect detection system converts the detection data into a preset format, wherein the preset format is a standard format of the data of the wafer defect detection system.

7. A system for detecting wafer defects, comprising:

the receiving unit is used for receiving detection data generated by the photoetching machine, and the detection data comprises defect information of the wafer;

and the first conversion unit is used for converting the detection data into a preset format, wherein the preset format is a standard format of data of the wafer defect detection system.

8. The system of claim 7, wherein the detection system further comprises:

and the image generating unit is used for generating a detection image according to the detection data in the preset format after converting the detection data into the preset format, wherein the detection image comprises a defect position mark.

9. A computer-readable storage medium, comprising a stored program, wherein the program performs the method of detecting wafer defects of any one of claims 1 to 6.

10. A processor configured to run a program, wherein the program is configured to execute the method of detecting wafer defects according to any one of claims 1 to 6 when the program is run.

Technical Field

The present application relates to the field of semiconductors, and in particular, to a method, a system, a computer readable storage medium, and a processor for detecting wafer defects.

Background

The wafer detection function of the photolithography tool is that the detection precision is 300 x 300 μm, detection data is generally generated in the detection process, the detection data is RGB color data, and the defect information is reflected by the RGB color data. Many times, not only the real defect causes the loss of RGB colors, but also other parameters such as thickness, etc. besides the real defect can cause the loss of RGB colors, and therefore, the type of defect cannot be clearly defined by the inspection data.

At present, the detailed analysis of defects and the like are difficult to be carried out by utilizing the detection data of the photoetching machine, and the detection data is not fully utilized, so that the data is wasted.

The above information disclosed in this background section is only for enhancement of understanding of the background of the technology described herein and, therefore, certain information may be included in the background that does not form the prior art that is already known in this country to a person of ordinary skill in the art.

Disclosure of Invention

The present application mainly aims to provide a method, a system, a computer readable storage medium and a processor for detecting a wafer defect, so as to solve the problem of data resource waste caused by insufficient utilization of detection data of a lithography machine in the prior art.

According to an aspect of the embodiments of the present invention, there is provided a method for detecting a wafer defect, including: the wafer defect detection system receives detection data generated by a photoetching machine, wherein the detection data comprises defect information of a wafer; and the wafer defect detection system converts the detection data into a preset format, wherein the preset format is a standard format of the data of the wafer defect detection system.

Optionally, after the wafer defect detection system converts the detection data into a predetermined format, the detection method further includes: and the wafer defect detection system generates a detection image according to the detection data in the preset format, wherein the detection image comprises a defect position identifier.

Optionally, after the wafer defect detecting system generates a detection image according to the detection data in the predetermined format, the detecting method further includes: the wafer defect detection system determines whether the number of the defect position marks in the detection image is larger than a preset number; and under the condition that the number of the defect position marks is larger than the preset number, the wafer defect detection system controls to scan the actual position area of the wafer corresponding to the defect position marks to obtain a scanned image, wherein the area corresponding to the surface of the wafer in unit area in the scanned image is a first area, the area corresponding to the surface of the wafer in unit area in the detected image is a second area, and the first area is larger than the second area.

Optionally, the defect information includes a size of the defect, a location of the defect, and a number of the defects.

Optionally, the wafer defect detection system includes a wafer defect analysis system, and the predetermined format is a standard format of data of the wafer defect analysis system.

According to another aspect of the embodiments of the present invention, there is also provided a method for detecting a wafer defect, including: the photoetching machine platform detects the wafer to obtain detection data; the photoetching machine table transmits the detection data to a wafer defect detection system; and the wafer defect detection system converts the detection data into a preset format, wherein the preset format is a standard format of the data of the wafer defect detection system.

According to another aspect of the embodiments of the present invention, there is provided a wafer defect detecting system, including: the receiving unit is used for receiving detection data generated by the photoetching machine table by the wafer defect detection system, wherein the detection data comprises the defect information of the wafer; and the conversion unit is used for converting the detection data into a preset format, wherein the preset format is a standard format of data of the wafer defect detection system.

Optionally, the detection system further comprises: and the image generating unit is used for generating a detection image according to the detection data in the preset format after converting the detection data into the preset format, wherein the detection image comprises a defect position mark.

According to still another aspect of the embodiments of the present invention, there is also provided a computer-readable storage medium, which includes a stored program, wherein the program executes any one of the methods for detecting a wafer defect.

According to another aspect of the embodiments of the present invention, there is also provided a processor, configured to execute a program, where the program executes any one of the methods for detecting a wafer defect.

In the embodiment of the present invention, the Wafer defect detection system receives the detection data of the photolithography tool, that is, the data of the Wafer Inspection Scan (WIS), and converts the detection data into the data of the predetermined format. In the method, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the application and, together with the description, serve to explain the application and are not intended to limit the application. In the drawings:

FIG. 1 is a schematic flow chart illustrating a method for detecting wafer defects according to an embodiment of the present disclosure;

FIG. 2 illustrates an inspection image generated by an inspection system for wafer defects according to an embodiment of the present application;

FIG. 3 is a schematic flow chart diagram illustrating another wafer defect detection method according to an embodiment of the present application; and

fig. 4 is a schematic structural diagram illustrating a wafer defect detection system according to an embodiment of the present application.

Detailed Description

It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

It should be noted that the terms "first," "second," and the like in the description and claims of this application and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It should be understood that the data so used may be interchanged under appropriate circumstances such that embodiments of the application described herein may be used. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.

It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" another element, it can be directly on the other element or intervening elements may also be present. Also, in the specification and claims, when an element is described as being "connected" to another element, the element may be "directly connected" to the other element or "connected" to the other element through a third element.

As mentioned in the background of the invention, in order to solve the above-mentioned problems, a method for detecting a wafer defect, a detection system, a computer-readable storage medium, and a processor are provided in an exemplary embodiment of the present application.

According to an embodiment of the application, a method for detecting wafer defects is provided. Fig. 1 is a schematic flowchart illustrating a method for detecting a wafer defect according to an embodiment of the present disclosure. As shown in fig. 1, the method comprises the steps of:

step S101, a wafer defect detection system receives detection data generated by a photoetching machine, wherein the detection data comprises defect information of a wafer;

step S102, the wafer defect inspection system converts the inspection data into a predetermined format, where the predetermined format is a standard format of the wafer defect inspection system data.

In the above solution, the Wafer defect detection system receives detection data of the photolithography tool, that is, what is called WIS (Wafer Inspection Scan) data, and converts the detection data into data in a predetermined format, and since the detection data includes defect information, it is not necessary for other scanning instruments to specially acquire the defect information and transmit the defect information to the Wafer defect detection system, and the Wafer defect detection system can further detect the defect condition by using the detection data in the predetermined format. In the scheme, the detection data of the photoetching machine are transmitted to the detection system of the wafer defects for further application, and the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine are difficult to be fully utilized in the prior art is solved.

It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.

It should be noted that, the above-mentioned conversion of the detection data into the data in the predetermined format may be implemented in any feasible manner, and those skilled in the art may select an appropriate conversion manner according to the actual situation. In a specific implementation, the process may include processes such as programmed calculation and format conversion.

In an embodiment of the application, after the wafer defect detecting system converts the detection data into a predetermined format, the detecting method further includes: and the wafer defect detection system generates a detection image according to the detection data in the preset format, wherein the detection image comprises a defect position identifier which indicates that a defect exists at the position of the defect position identifier. Thus, a detection image can be generated according to the detection data, as shown in fig. 2, the detection image includes a defective position mark 01, and the defective position mark 01 in the figure is a cross mark. Therefore, the defect position identification and the number of the defects in the wafer can be known through the detection image, so that the next operation can be reasonably determined according to the defect position identification and the defect number.

In another embodiment of the present application, after the system for detecting a wafer defect generates a detection image according to the detection data in the predetermined format, the method further includes: the wafer defect detection system determines whether the number of the defect position marks in the detection image is larger than a predetermined number, and when the number of the defect position marks is larger than the predetermined number, the wafer defect detection system controls to scan an actual position area of the wafer corresponding to the defect position marks to acquire a first scanning image, wherein an area corresponding to a unit area of the surface of the wafer in the first scanning image is a first area, an area corresponding to the unit area of the surface of the wafer in the detection image is a second area, and the first area is larger than the second area. According to the method, the next operation is determined according to whether the number of the defect position marks is larger than the preset number, the actual position area where the defect of the wafer is located is controlled to be scanned under the condition that the number of the defect position marks is larger than the preset number, the amplification factor of the first scanning image to the surface of the wafer is larger than the amplification factor of the detection image to the surface of the wafer, a clear image of the defect can be further obtained, and information such as the type and/or the cause of the defect can be accurately determined according to the clear image.

It should be noted that the predetermined number may be 10, 15, or other predetermined numbers, and those skilled in the art can determine the appropriate predetermined number according to the defect tolerance of the actual process.

Specifically, in an embodiment of the present application, the defect information includes a size (area) of the defect, a position of the defect, and a number of the defects. The corresponding detection data converted into the predetermined format also comprises the information, and the information can be displayed simultaneously in the detection image generated according to the detection information converted into the predetermined format, so that the next operation can be determined more accurately according to the detection image.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, and after the wafer defect inspection system generates an inspection image according to the inspection data in the predetermined format, the inspection method further includes: the wafer defect detection system determines whether the area of any defect in the detection image is larger than a preset area; when the area of any one of the defects is larger than the predetermined area, the wafer defect detection system controls to scan an actual position region of the wafer corresponding to the defect position mark to acquire a second scan image, wherein a region corresponding to the surface of the wafer per unit area in the second scan image is a third region, a region corresponding to the surface of the wafer per unit area in the detection image is a second region, and the third region is larger than the second region. In this embodiment, regardless of whether the number of the defect position marks is greater than the predetermined number, as long as the area of the defect is greater than the predetermined area, the scanning of the actual position area of the wafer corresponding to the defect position mark is controlled.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, and after the wafer defect inspection system generates an inspection image according to the inspection data in the predetermined format, the inspection method further includes: the wafer defect detection system determines whether the area of any defect in the detection image is larger than a preset area; when the area of any one of the defects is larger than the predetermined area, the wafer defect detection system controls to scan an actual position area of the wafer corresponding to the defect position mark to acquire a third scan image, wherein an area corresponding to the surface of the wafer per unit area in the third scan image is a fourth area, an area corresponding to the surface of the wafer per unit area in the detection image is a second area, and the fourth area is larger than the second area; and when the number of the defect position marks is larger than the predetermined number, the wafer defect detection system controls to scan an actual position area of the wafer corresponding to the defect position mark to acquire a fourth scan image, wherein an area corresponding to the surface of the wafer in unit area in the fourth scan image is a fifth area, and the fifth area is larger than the second area.

In the practical application process, the defect control system can control the camera to scan and photograph the actual position of the defect so as to obtain a scanned image.

It should be noted that the defect information is not limited to the above, and the defect information further includes information such as a structure layer where the defect is located, a serial number of the defect, an area of a curve, a classification of the defect, a lateral size of the defect, and a coordinate of the defect relative to a wafer level, and the like, and those skilled in the art can obtain the defect information according to actual situations. After format conversion, the defect information still exists, and new information may also be obtained through calculation, such as coordinates of the defect at a die (die) level and coordinates of the die, and the output detection image still retains and records coordinates of the defect, the number of the defect, a structural layer where the defect is located, and the like, which are consistent with information acquired by the camera in the yield improvement system, and can provide required defect information for yield improvement review, so as to achieve a function of replacing the camera in the yield improvement system, and obtain the size, the position and the image of the defect. It should be noted that the die in the present application is actually an area formed by dividing a wafer, and the die-level coordinates are coordinates of a defect in a coordinate system established by using one point of the area as a coordinate origin.

In yet another embodiment of the present application, the wafer defect detecting system includes a wafer defect analyzing system (e.g., Klarity subsystem), and the predetermined format is a standard format of data of the wafer defect analyzing system. Thus, the detection data can be converted into a standard format, and the waste of data resources is further reduced. Of course, in practical application, it may also include other subsystems, devices or apparatuses for implementing the above methods. The wafer defect analysis system can adopt the Klary defect product.

In another embodiment of the present application, after the detecting system of the wafer defect converts the detecting data into a predetermined format, the method further includes: in step S103, the type of defect is determined according to the detection data in the predetermined format.

Fig. 3 is a schematic flowchart of another method for detecting a wafer defect according to an embodiment of the present disclosure. As shown in fig. 3, the method comprises the steps of:

step S201, a photoetching machine platform detects a wafer to obtain detection data;

step S202, the photoetching machine transmits the detection data to a wafer defect detection system;

in step S203, the wafer defect inspection system converts the inspection data into a predetermined format, where the predetermined format is a standard format of the wafer defect inspection system data.

In the above scheme, the lithography machine station obtains detection data after detecting the wafer, that is, what is called WIS data, transmits the detection data to the wafer defect detection system, and converts the detection data into data in a predetermined format. In the scheme, the detection data of the photoetching machine are transmitted to the detection system of the wafer defects for further application, and the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine are difficult to be fully utilized in the prior art is solved.

It should be noted that the steps illustrated in the flowcharts of the figures may be performed in a computer system such as a set of computer-executable instructions and that, although a logical order is illustrated in the flowcharts, in some cases, the steps illustrated or described may be performed in an order different than presented herein.

It should be noted that, the above-mentioned conversion of the detection data into the data in the predetermined format may be implemented in any feasible manner, and those skilled in the art may select an appropriate conversion manner according to the actual situation. In a specific implementation, the process may include processes such as programmed calculation and format conversion.

In an embodiment of the application, after the wafer defect detecting system converts the detection data into a predetermined format, the detecting method further includes: and the wafer defect detection system generates a detection image according to the detection data in the preset format, wherein the detection image comprises a defect position identifier which indicates that a defect exists at the position of the defect position identifier. Thus, a detection image is generated according to the detection data, as shown in fig. 2, the detection image includes a defect position mark, and the defect position mark 01 in the image is a cross mark. Therefore, the defect position identification and the number of the defects in the wafer can be known through the detection image, so that the next operation can be reasonably determined according to the defect position identification and the defect number.

In another embodiment of the present application, after the system for detecting a wafer defect generates a detection image according to the detection data in the predetermined format, the method further includes: the wafer defect detection system determines whether the number of the defect position marks in the detection image is larger than a predetermined number, and when the number of the defect position marks is larger than the predetermined number, the wafer defect detection system controls to scan an actual position region of the wafer corresponding to the defect position marks to acquire a fifth scanning image, wherein a region corresponding to a unit area of the surface of the wafer in the fifth scanning image is a sixth region, a region corresponding to the unit area of the surface of the wafer in the detection image is a seventh region, and the sixth region is larger than the seventh region. According to the method, the next operation is determined according to whether the number of the defect position marks is larger than the preset number, the actual position area where the defect of the wafer is located is controlled to be scanned under the condition that the number of the defect position marks is larger than the preset number, the magnification of the fifth scanning image to the surface of the wafer is larger than that of the detection image to the surface of the wafer, a clear image of the defect can be further obtained, and then the type and/or cause information of the defect can be accurately determined according to the clear image.

It should be noted that the predetermined number may be 10, 15, or other predetermined numbers, and those skilled in the art can determine the appropriate predetermined number according to the defect tolerance of the actual process.

Specifically, in an embodiment of the present application, the defect information includes a size (area) of the defect, a position of the defect, and a number of the defects. The corresponding detection data converted into the predetermined format also comprises the information, so that the information can be displayed simultaneously in the detection image generated according to the detection information converted into the predetermined format, and the next operation can be determined more accurately according to the detection image.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, and after the wafer defect inspection system generates an inspection image according to the inspection data in the predetermined format, the inspection method further includes: the wafer defect detection system determines whether the area of any defect in the detection image is larger than a preset area; when the area of any one of the defects is larger than the predetermined area, the wafer defect detection system controls to scan an actual position region of the wafer corresponding to the defect position mark to acquire a sixth scan image, wherein a region corresponding to a unit area of the surface of the wafer in the sixth scan image is an eighth region, a region corresponding to a unit area of the surface of the wafer in the detection image is a seventh region, and the eighth region is larger than the seventh region. In this embodiment, regardless of whether the number of the defect position marks is greater than the predetermined number, as long as the area of the defect is greater than the predetermined area, the scanning of the actual position area of the wafer corresponding to the defect position mark is controlled.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, and after the wafer defect inspection system generates an inspection image according to the inspection data in the predetermined format, the inspection method further includes: the wafer defect detection system determines whether the area of any defect in the detection image is larger than a preset area; when the area of any one of the defects is larger than the predetermined area, the wafer defect detection system controls to scan an actual position area of the wafer corresponding to the defect position mark to acquire a seventh scan image, wherein an area corresponding to the surface of the wafer per unit area in the seventh scan image is a ninth area, an area corresponding to the surface of the wafer per unit area in the detection image is a seventh area, and the ninth area is larger than the seventh area; and when the number of the defect position marks is larger than the predetermined number, the wafer defect detection system controls to scan an actual position area of the wafer corresponding to the defect position mark to acquire an eighth scan image, wherein an area corresponding to the surface of the wafer in unit area in the eighth scan image is a tenth area, and the tenth area is larger than the seventh area.

In the practical application process, the defect control system can control the camera to scan and photograph the actual position of the defect so as to obtain a scanned image.

It should be noted that the defect information is not limited to the above, and the defect information further includes information such as a structure layer where the defect is located, a serial number of the defect, an area of a curve, a classification of the defect, a lateral size of the defect, and a coordinate of the defect relative to a wafer level, and the like, and those skilled in the art can obtain the defect information according to actual situations. After format conversion, the defect information still exists, and new information may also be obtained through calculation, such as coordinates of the defect at a die (die) level and coordinates of the die, and the output detection image still retains and records coordinates of the defect, the number of the defect, a structural layer where the defect is located, and the like, which are consistent with information acquired by the camera in the yield improvement system, and can provide required defect information for yield improvement review, so as to achieve a function of replacing the camera in the yield improvement system, and obtain the size, the position and the image of the defect. It should be noted that the die in the present application is actually an area formed by dividing a wafer, and the die-level coordinates are coordinates of a defect in a coordinate system established by using one point of the area as a coordinate origin.

In yet another embodiment of the present application, the wafer defect detecting system includes a wafer defect analyzing system (e.g., Klarity subsystem), and the predetermined format is a standard format of data of the wafer defect analyzing system. Thus, the detection data can be converted into a standard format, and the waste of data resources is further reduced. Of course, in practical application, it may also include other subsystems, devices or apparatuses for implementing the above methods. The wafer defect analysis system can adopt the Klary defect product.

In another embodiment of the present application, after the detecting system of the wafer defect converts the detecting data into a predetermined format, the method further includes: the kind of the defect is determined according to the detection data of the predetermined format.

The embodiment of the present application further provides a system for detecting a wafer defect, and it should be noted that the system for detecting a wafer defect of the embodiment of the present application can be used to execute the method for detecting a wafer defect provided by the embodiment of the present application. The following describes a system for detecting a wafer defect according to an embodiment of the present application.

Fig. 4 is a schematic structural diagram of a wafer defect detection system according to an embodiment of the present application. As shown in fig. 4, the system includes:

a receiving unit 10, configured to receive detection data generated by a photolithography tool by using a wafer defect detection system, where the detection data includes defect information of a wafer;

a first conversion unit 20, configured to convert the inspection data into a predetermined format, where the predetermined format is a standard format of data of the wafer defect inspection system.

In the system, the receiving unit receives the inspection data of the lithography machine, that is, the WIS data, and the first converting unit converts the inspection data into data in a predetermined format. In the system, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved.

It should be noted that the first conversion unit of the present application may adopt any feasible manner to convert the detection data into data in a predetermined format, and those skilled in the art may select a suitable first conversion unit according to practical situations. In a specific implementation, the process may include processes such as programmed calculation and format conversion.

In an embodiment of the application, the system further includes a first image generating unit, configured to generate a detected image according to the detection data in the predetermined format after converting the detection data into the predetermined format, where the detected image includes a defect location identifier, and the defect location identifier indicates that a defect exists at a location of the detected image. Thus, a detection image is generated according to the detection data, as shown in fig. 2, the detection image includes a defect position mark, and the defect position mark 01 in the image is a cross mark. Therefore, the defect position identification and the number of the defects in the wafer can be known through the detection image, so that the next operation can be reasonably determined according to the defect position identification and the defect number.

In yet another embodiment of the present application, the system further includes a first determining unit configured to determine whether the number of the defect position marks in the inspection image is greater than a predetermined number after the inspection image is generated based on the inspection data in the predetermined format, and a first acquiring unit configured to control to scan an actual position region of the wafer corresponding to the defect position marks when the number of the defect position marks is greater than the predetermined number, and acquire a first scanned image, where a region corresponding to a unit area of a surface of the wafer in the first scanned image is a first region, a region corresponding to a unit area of the surface of the wafer in the inspection image is a second region, and the first region is greater than the second region. According to the system, the next operation is determined according to whether the number of the defect position marks is larger than the preset number, the actual position area where the defect of the wafer is located is controlled to be scanned under the condition that the number of the defect position marks is larger than the preset number, the amplification factor of the first scanning image to the surface of the wafer is larger than that of the detection image to the surface of the wafer, a clear image of the defect can be further obtained, and information such as the type and/or the cause of the defect can be accurately determined according to the clear image subsequently.

It should be noted that the predetermined number may be 10, 15, or other predetermined numbers, and those skilled in the art can determine the appropriate predetermined number according to the defect tolerance of the actual process.

Specifically, in an embodiment of the present application, the defect information includes a size (area) of the defect, a position of the defect, and a number of the defects. The corresponding detection data converted into the predetermined format also comprises the information, so that the information can be displayed simultaneously in the detection image generated according to the detection information converted into the predetermined format, and the next operation can be determined more accurately according to the detection image.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, the system further includes a second determining unit configured to determine whether an area of any one of the defects in the inspection image is larger than a predetermined area after the inspection image is generated based on the inspection data of the predetermined format, and a second acquiring unit configured to control to scan an actual position region of the wafer corresponding to the defect position mark and acquire a second scan image in a case where the area of any one of the defects is larger than the predetermined area, where a region corresponding to a unit area of the surface of the wafer in the second scan image is a third region, and a region corresponding to a unit area of the surface of the wafer in the inspection image is a second region, the third region is larger than the second region. In this embodiment, regardless of whether the number of the defect position marks is greater than the predetermined number, as long as the area of the defect is greater than the predetermined area, the scanning of the actual position area of the wafer corresponding to the defect position mark is controlled.

The system further includes a third determining unit configured to determine whether an area of any one of the defects in the inspection image is larger than a predetermined area after an inspection image is generated based on the inspection data of the predetermined format, a third acquiring unit configured to control to scan an actual position region of the wafer corresponding to the defect position indicator when the area of any one of the defects is larger than the predetermined area, and acquire a third scanned image in which a region corresponding to a unit area of the surface of the wafer is a fourth region, a region corresponding to the unit area of the surface of the wafer in the inspection image is a second region, and the fourth region is larger than the second region; the fourth determining unit is configured to determine whether the number of the defect position marks in the inspection image is greater than a predetermined number when the area of all the defects is not greater than the predetermined area, and the fourth acquiring unit is configured to control to scan an actual position region of the wafer corresponding to the defect position mark and acquire a fourth scan image when the number of the defect position marks is greater than the predetermined number, where a region corresponding to a unit area of the surface of the wafer in the fourth scan image is a fifth region, and the fifth region is greater than the second region.

In the practical application process, the defect control system can control the camera to scan and photograph the actual position of the defect so as to obtain a scanned image.

It should be noted that the defect information is not limited to the above, and the defect information further includes information such as a structure layer where the defect is located, a serial number of the defect, an area of a curve, a classification of the defect, a lateral size of the defect, and a coordinate of the defect relative to a wafer level, and the like, and those skilled in the art can obtain the defect information according to actual situations. After format conversion, the defect information still exists, and new information may also be obtained through calculation, such as coordinates of the defect at a die (die) level and coordinates of the die, and the output detection image still retains and records coordinates of the defect, the number of the defect, a structural layer where the defect is located, and the like, which are consistent with information acquired by the camera in the yield improvement system, and can provide required defect information for yield improvement review, so as to achieve a function of replacing the camera in the yield improvement system, and obtain the size, the position and the image of the defect. It should be noted that the die in the present application is actually an area formed by dividing a wafer, and the die-level coordinates are coordinates of a defect in a coordinate system established by using one point of the area as a coordinate origin.

In yet another embodiment of the present application, the wafer defect detecting system includes a wafer defect analyzing system (e.g., a klary subsystem), the wafer defect analyzing system includes the receiving unit and the first converting unit, and the predetermined format is a standard format of data of the wafer defect analyzing system. Thus, the detection data can be converted into a standard format, and the waste of data resources is further reduced. Of course, in practical application, it may also include other subsystems, devices or apparatuses for implementing the above methods. The wafer defect analysis system can adopt the Klary defect product.

In another embodiment of the present application, the inspection system further includes a defect type determining unit, configured to determine the type of the defect according to the inspection data in the predetermined format after converting the inspection data into the predetermined format.

The embodiment of the present application further provides another wafer defect detection system, and it should be noted that the wafer defect detection system of the embodiment of the present application can be used for executing the wafer defect detection method provided by the embodiment of the present application. The following describes a system for detecting a wafer defect according to an embodiment of the present application. The system comprises:

the detection unit is used for detecting the wafer by the photoetching machine to obtain detection data;

a transmission unit, configured to transmit the detection data to a wafer defect detection system by the photolithography tool;

and a second conversion unit for converting the inspection data into a predetermined format by the wafer defect inspection system, wherein the predetermined format is a standard format of the wafer defect inspection system data.

In the system, the detection unit obtains detection data after the wafer is detected by the lithography machine, namely the WIS data, the transmission unit transmits the detection data to the wafer defect detection system, the second conversion unit converts the detection data into data in a preset format, and the detection data comprises defect information, so that other scanning instruments are not required to specially obtain the defect information and transmit the defect information to the wafer defect detection system, and the wafer defect detection system can further detect the defect condition by using the detection data in the preset format. In the system, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved. It should be noted that the WIS data may generate a defect information file at the TEL machine side, and the data is converted into a standard file format through programming calculation and format conversion.

It should be noted that the second conversion unit of the present application may adopt any feasible manner to convert the detection data into data in a predetermined format, and those skilled in the art may select a suitable second conversion unit according to practical situations. In a specific implementation, the process may include processes such as programmed calculation and format conversion.

In an embodiment of the application, the system further includes a second image generating unit, configured to generate a detected image according to the detection data in the predetermined format after converting the detection data into the predetermined format, where the detected image includes a defect location identifier, and the defect location identifier indicates that a defect exists at a location of the detected image. Thus, a detection image is generated according to the detection data, as shown in fig. 2, the detection image includes a defect position mark, and the defect position mark 01 in the image is a cross mark. Therefore, the defect position identification and the number of the defects in the wafer can be known through the detection image, so that the next operation can be reasonably determined according to the defect position identification and the defect number.

In yet another embodiment of the present application, the system further includes a fourth determining unit configured to determine whether the number of the defect position marks in the inspection image is greater than a predetermined number after the inspection image is generated based on the inspection data in the predetermined format, and a fourth acquiring unit configured to control to scan an actual position region of the wafer corresponding to the defect position marks when the number of the defect position marks is greater than the predetermined number, and acquire a fifth scan image in which a region corresponding to a unit area of the surface of the wafer is a sixth region, a region corresponding to a unit area of the surface of the wafer in the inspection image is a seventh region, and the sixth region is greater than the seventh region. According to the system, the next operation is determined according to whether the number of the defect position marks is larger than the preset number, the actual position area where the defect of the wafer is located is controlled to be scanned under the condition that the number of the defect position marks is larger than the preset number, the magnification of the fifth scanning image to the surface of the wafer is larger than that of the detection image to the surface of the wafer, a clear image of the defect can be further obtained, and then the type and/or cause information of the defect can be accurately determined according to the clear image.

It should be noted that the predetermined number may be 10, 15, or other predetermined numbers, and those skilled in the art can determine the appropriate predetermined number according to the defect tolerance of the actual process.

Specifically, in an embodiment of the present application, the defect information includes a size (area) of the defect, a position of the defect, and a number of the defects. The corresponding detection data converted into the predetermined format also comprises the information, so that the information can be displayed simultaneously in the detection image generated according to the detection information converted into the predetermined format, and the next operation can be determined more accurately according to the detection image.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, the system further includes a fifth determining unit configured to determine whether an area of any one of the defects in the inspection image is larger than a predetermined area after the inspection image is generated based on the inspection data of the predetermined format, and a fifth acquiring unit configured to control to scan an actual position region of the wafer corresponding to the defect position mark and acquire a sixth scan image in which a region corresponding to a unit area of the surface of the wafer is an eighth region and a region corresponding to a unit area of the surface of the wafer is a seventh region when an area of any one of the defects is larger than the predetermined area, the eighth region is larger than the seventh region. In this embodiment, regardless of whether the number of the defect position marks is greater than the predetermined number, as long as the area of the defect is greater than the predetermined area, the scanning of the actual position area of the wafer corresponding to the defect position mark is controlled.

In another embodiment of the present application, the defect information includes a size (area) of a defect, a position of the defect, and a number of the defects, and the system further includes a sixth determining unit, a sixth acquiring unit, a seventh determining unit, and a seventh acquiring unit, where the sixth determining unit is configured to determine whether an area of any one of the defects in the inspection image is larger than a predetermined area after the inspection image is generated by the wafer defect inspection system according to the inspection data in the predetermined format; a sixth acquiring unit, configured to, when an area of any one of the defects is larger than the predetermined area, control the wafer defect detection system to scan an actual position region of the wafer corresponding to the defect position mark, and acquire a seventh scan image in which a region corresponding to a unit area of the surface of the wafer is a ninth region, a region corresponding to a unit area of the surface of the wafer is a seventh region, and the ninth region is larger than the seventh region; a seventh determining unit, configured to determine whether the number of defect position marks in the inspection image is greater than a predetermined number when the area of all the defects is not greater than the predetermined area, and a seventh acquiring unit, configured to control to scan an actual position region of the wafer corresponding to the defect position mark and acquire an eighth scan image when the number of the defect position marks is greater than the predetermined number, where a region corresponding to a unit area of the surface of the wafer in the eighth scan image is a tenth region, and the tenth region is greater than the seventh region.

In the practical application process, the defect control system can control the camera to scan and photograph the actual position of the defect so as to obtain a scanned image.

It should be noted that the defect information is not limited to the above-mentioned types, and the defect information further includes information of a structure layer where the defect is located, and the like, and those skilled in the art can acquire the defect information according to actual situations. After format conversion, the output detection image still retains and records the coordinates of the defects, the number of the defects, the structural layer where the defects are located and other information, which are consistent with the information acquired by the camera in the yield improvement system, and can provide required determination information for yield improvement recheck, thereby realizing the function of replacing the camera in the yield improvement system and obtaining the sizes, the positions and the images of the defects.

In another embodiment of the present application, the inspection system further includes a defect type determining unit, configured to determine the type of the defect according to the inspection data in the predetermined format after converting the inspection data into the predetermined format.

The detection system comprises a processor and a memory, the receiving unit, the conversion unit and the like are stored in the memory as program units, and the processor executes the program units stored in the memory to realize corresponding functions.

The processor comprises a kernel, and the kernel calls the corresponding program unit from the memory. The kernel can be set to be one or more than one, and the waste of data resources is avoided by fully utilizing the detection data of the photoetching machine through adjusting the kernel parameters.

The memory may include volatile memory in a computer readable medium, Random Access Memory (RAM) and/or nonvolatile memory such as Read Only Memory (ROM) or flash memory (flash RAM), and the memory includes at least one memory chip.

An embodiment of the present invention provides a storage medium, on which a program is stored, and the program, when executed by a processor, implements the method for detecting wafer defects described above.

The embodiment of the invention provides a processor, which is used for running a program, wherein the method for detecting the wafer defects is executed when the program runs.

The embodiment of the invention provides equipment, which comprises a processor, a memory and a program which is stored on the memory and can run on the processor, wherein when the processor executes the program, at least the following steps are realized:

step S101, a wafer defect detection system receives detection data generated by a photoetching machine, wherein the detection data comprises defect information of a wafer;

step S102, the wafer defect inspection system converts the inspection data into a predetermined format, where the predetermined format is a standard format of the wafer defect inspection system data.

The device herein may be a server, a PC, a PAD, a mobile phone, etc.

The present application further provides a computer program product adapted to perform a program of initializing at least the following method steps when executed on a data processing device:

step S101, a wafer defect detection system receives detection data generated by a photoetching machine, wherein the detection data comprises defect information of a wafer;

step S102, the wafer defect inspection system converts the inspection data into a predetermined format, where the predetermined format is a standard format of the wafer defect inspection system data.

In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the above-described division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated unit may be stored in a computer-readable storage medium if it is implemented in the form of a software functional unit and sold or used as a separate product. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the above methods according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic or optical disk, and other various media capable of storing program codes.

From the above description, it can be seen that the above-described embodiments of the present application achieve the following technical effects:

1) according to the wafer defect detection method, the wafer defect detection system receives detection data of a photoetching machine, namely the WIS data, and converts the detection data into data in a preset format. In the scheme, the detection data of the photoetching machine are transmitted to the detection system of the wafer defects for further application, and the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine are difficult to be fully utilized in the prior art is solved.

2) According to the other wafer defect detection method, the photoetching machine detects the wafer to obtain detection data, namely the WIS data, the detection data are transmitted to the wafer defect detection system, the detection data are converted into the data in the preset format, and the detection data comprise defect information, so that the defect information is not required to be acquired by other scanning instruments and transmitted to the wafer defect detection system, and the wafer defect detection system can further detect the defect condition by utilizing the detection data in the preset format. In the scheme, the detection data of the photoetching machine are transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine are difficult to be fully utilized in the prior art is solved

3) The receiving unit receives detection data of a photoetching machine, namely the WIS data, the first conversion unit converts the detection data into data in a preset format, and the detection data comprise defect information, so that the defect information is not required to be acquired by other scanning instruments and transmitted to the wafer defect detection system, and the wafer defect detection system can further detect the defect condition by utilizing the detection data in the preset format. In the system, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved.

4) According to the other wafer defect detection system, the detection data, namely the WIS data, is obtained by the detection unit after the wafer is detected by the photoetching machine, the detection data is transmitted to the wafer defect detection system by the transmission unit, the detection data is converted into the data in the preset format by the second conversion unit, and the detection data comprises the defect information, so that the defect information is transmitted to the wafer defect detection system without being specially acquired by other scanning instruments, and the wafer defect detection system can further detect the defect condition by utilizing the detection data in the preset format subsequently. In the system, the detection data of the photoetching machine is transmitted to the detection system of the wafer defects for further application, so that the technical problem of data resource waste caused by the fact that the detection data of the photoetching machine is difficult to be fully utilized in the prior art is solved.

The above description is only a preferred embodiment of the present application and is not intended to limit the present application, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, improvement and the like made within the spirit and principle of the present application shall be included in the protection scope of the present application.