阅读说明：本技术 离子束均匀度检测装置及检测方法 (Ion beam uniformity detection device and detection method ) 是由 李斌 庞闻 苏文华 李家军 于 2019-04-16 设计创作，主要内容包括：本发明提供了一种离子束均匀度检测装置及检测方法,所述离子束均匀度检测装置包括离子分束电流采样单元和分析计算单元,离子分束电流采样单元用于接收离子束,并获得离子束内多个位置的离子分束电流；分析计算单元根据多个位置的离子分束电流得到所述离子束均匀度是否满足控制要求。通过对多个位置的离子分束电流的分析,可以实时、精准的获知离子束的均匀度情况,及时调整离子植入机台以优化离子束,从而避免因离子束均匀度不好而导致的产品报废的问题,提高了产品良率。(The invention provides an ion beam uniformity detection device and a detection method, wherein the ion beam uniformity detection device comprises an ion beam splitting current sampling unit and an analysis calculation unit, wherein the ion beam splitting current sampling unit is used for receiving an ion beam and obtaining ion beam splitting currents at a plurality of positions in the ion beam; and the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at the plurality of positions. Through the analysis to the ion beam splitting current of a plurality of positions, can be real-time, the degree of consistency condition of accurate knowing ion beam, in time adjust the ion implantation board in order to optimize the ion beam to avoid because of the not good condemned problem of product that leads to of ion beam degree of consistency, improved the product yield.)

1. An apparatus for detecting uniformity of an ion beam, comprising:

the ion beam splitting current sampling unit is used for receiving the ion beam and obtaining ion beam splitting currents at a plurality of positions in the ion beam;

and the analysis and calculation unit is used for obtaining whether the uniformity of the ion beam meets the control requirement or not according to the ion beam splitting currents at the plurality of positions.

2. The apparatus of claim 1, wherein the ion beam uniformity detection unit comprises:

the filter unit comprises a disc body and a plurality of through holes arranged on the disc body, and the position and the aperture of each through hole are calculated according to an Archimedes spiral formula;

the control unit is used for driving the filtering unit to rotate;

and the receiving unit is used for receiving the ion beam splitting passing through the plurality of through holes on the filtering unit so as to obtain ion beam splitting currents at a plurality of positions in the ion beam.

3. The apparatus of claim 2, wherein the disk is a graphite disk, and the plurality of through holes are formed in the graphite disk.

4. The apparatus of claim 3, wherein the graphite disk has at least 6 through holes.

5. The apparatus of claim 2, wherein a surface of the filter unit is perpendicular to an emission direction of the ion beam, and the control unit controls the filter unit to rotate at a constant speed around the emission direction of the ion beam.

6. The apparatus of claim 1, wherein the analysis computation unit comprises:

the current-voltage conversion module is used for converting the analog signal of the ion beam splitting current into an analog signal of ion beam splitting voltage;

the analog-to-digital conversion module is used for converting the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage;

and the calculation module is used for comparing the relation between the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions and a preset threshold value so as to judge whether the uniformity of the ion beam meets the control requirement.

7. The apparatus of claim 6, wherein the uniformity of the ion beam does not meet the control requirement when the difference between the digital signals of the ion beam splitting voltages at two adjacent positions is greater than the predetermined threshold; when the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions is smaller than or equal to the preset threshold value, the uniformity of the ion beam meets the control requirement.

8. A method for detecting uniformity of an ion beam is characterized by comprising the following steps:

providing the ion beam uniformity detection apparatus of any of claims 1-7;

the ion beam splitting current sampling unit receives an ion beam and obtains ion beam splitting currents at a plurality of positions in the ion beam;

and the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at a plurality of positions.

9. The method of claim 8, wherein the ion beam uniformity detection unit comprises a filtering unit, a control unit, and a receiving unit, and wherein obtaining the ion beam currents at a plurality of locations within the ion beam comprises:

arranging the filter unit in the ion beam to enable the emission direction of the ion beam to be vertical to the surface of the filter unit;

the control unit drives the filter unit to rotate at a constant speed around the emission direction of the ion beam;

the receiving unit receives the ion beam splitting passing through the plurality of through holes on the filtering unit and obtains the ion beam splitting current of each ion beam splitting.

10. The method of claim 9, wherein the sampling time of the ion beam current sampling unit is the same for each position within the ion beam, and the sampling interval is the same for two adjacent positions.

11. The method of claim 10, wherein the analyzing unit comprises: the current-voltage conversion module, the analog-to-digital conversion module and the calculation module are used for obtaining whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at a plurality of positions, and the method comprises the following steps:

the current-voltage conversion module converts the analog signal of the ion beam splitting current into an analog signal of ion beam splitting voltage;

the analog-to-digital conversion module converts the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage;

the calculation module compares the relation between the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions and a preset threshold value to judge whether the uniformity of the ion beam meets the control requirement.

Technical Field

The invention relates to the technical field of semiconductor manufacturing, in particular to an ion beam uniformity detection device and a detection method.

Background

As semiconductor integrated circuit manufacturing processes become more miniaturized, performance requirements for semiconductor manufacturing equipment become higher. An ion beam implanter is one of the most critical doping apparatuses in semiconductor device fabrication, and when the device fabrication process advances to a feature size of less than 90nm and a wafer size of 300mm, in order to ensure the uniformity of device performance on the entire wafer, it is necessary to have a higher requirement for maintaining the uniformity of doping distribution on the entire wafer during the ion implantation doping process. Therefore, it becomes more important to detect the shape and uniformity distribution of the ion implantation beam spot in real time and accurately.

The current detection method of the uniformity of the ion beam is as follows: before ion implantation of the integrated wafer, ion beam detection is carried out by adopting a mobile Faraday and the distribution condition of the ion beam is obtained by an integral calculation result. However, since the method is to estimate the uniformity of the ion beam by simulation, there is a certain error in the result of the method, and if the uniformity of the ion beam is not good during the ion beam implantation process, the yield of the product is reduced directly, and the whole wafer box is scrapped in a serious case.

In order to solve the above problems, it is urgent to provide a real-time detection device capable of detecting uniformity of an ion beam in order to timely and accurately find uniformity of the ion beam.

Disclosure of Invention

The invention aims to provide an ion beam uniformity detection device and a detection method, and aims to solve the problem that the yield of products is reduced because the ion beam uniformity detection method in the prior art is not real-time and cannot find out the condition of poor ion beam uniformity in time.

To solve the above technical problem, the present invention provides an ion beam uniformity detecting apparatus, comprising:

the ion beam splitting current sampling unit is used for receiving the ion beam and obtaining ion beam splitting currents at a plurality of positions in the ion beam;

and the analysis and calculation unit is used for obtaining whether the uniformity of the ion beam meets the control requirement or not according to the ion beam splitting currents at the plurality of positions.

Optionally, the ion beam splitting current sampling unit includes:

the filter unit comprises a disc body and a plurality of through holes arranged on the disc body, and the position and the aperture of each through hole are calculated according to an Archimedes spiral formula;

the control unit is used for driving the filtering unit to rotate;

and the receiving unit is used for receiving the ion beam splitting passing through the plurality of through holes on the filtering unit so as to obtain ion beam splitting currents at a plurality of positions in the ion beam.

Optionally, the tray body is a graphite disc, and the plurality of through holes are formed in the graphite disc.

Optionally, the number of the through holes formed in the graphite disc is at least 6.

Optionally, the surface of the filtering unit is perpendicular to the emission direction of the ion beam, and the control unit controls the filtering unit to rotate around the emission direction of the ion beam at a constant speed.

Optionally, the analysis calculating unit includes:

the current-voltage conversion module is used for converting the analog signal of the ion beam splitting current into an analog signal of ion beam splitting voltage;

the analog-to-digital conversion module is used for converting the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage;

and the calculation module is used for comparing the relation between the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions and a preset threshold value so as to judge whether the uniformity of the ion beam meets the control requirement.

Optionally, when the difference between the digital signals of the ion beam splitting voltages at two adjacent positions is greater than the predetermined threshold, the uniformity of the ion beam does not meet the control requirement; when the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions is smaller than or equal to the preset threshold value, the uniformity of the ion beam meets the control requirement.

The invention also provides an ion beam uniformity detection method, which comprises the following steps:

providing the ion beam uniformity detection device;

the ion beam splitting current sampling unit receives an ion beam and obtains ion beam splitting currents at a plurality of positions in the ion beam;

and the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at a plurality of positions.

Optionally, the ion beam splitting current sampling unit includes a filtering unit, a control unit, and a receiving unit, and obtaining the ion beam splitting currents at a plurality of positions in the ion beam includes:

arranging the filter unit in the ion beam to enable the emission direction of the ion beam to be vertical to the surface of the filter unit;

the control unit drives the filter unit to rotate at a constant speed around the emission direction of the ion beam;

the receiving unit receives the ion beam splitting passing through the plurality of through holes on the filtering unit and obtains the ion beam splitting current of each ion beam splitting.

Optionally, the sampling time of the ion beam splitting current sampling unit at each position in the ion beam is the same, and the sampling intervals of two adjacent positions are the same.

Optionally, the analysis calculating unit includes: the current-voltage conversion module, the analog-to-digital conversion module and the calculation module are used for obtaining whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at a plurality of positions, and the method comprises the following steps:

the current-voltage conversion module converts the analog signal of the ion beam splitting current into an analog signal of ion beam splitting voltage;

the analog-to-digital conversion module converts the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage;

the calculation module compares the relation between the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions and a preset threshold value to judge whether the uniformity of the ion beam meets the control requirement.

In the ion beam uniformity detection device and the ion beam uniformity detection method provided by the invention, the ion beam uniformity detection device comprises an ion beam splitting current sampling unit and an analysis calculation unit, wherein the ion beam splitting current sampling unit is used for receiving an ion beam and obtaining ion beam splitting currents at a plurality of positions in the ion beam; and the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at the plurality of positions. Through the analysis to the ion beam splitting current of a plurality of positions, can be real-time, the degree of consistency condition of accurate knowing ion beam, in time adjust the ion implantation board in order to optimize the ion beam to avoid because of the not good condemned problem of product that leads to of ion beam degree of consistency, improved the product yield.

Drawings

Fig. 1 is a schematic structural diagram of an ion beam uniformity detection apparatus according to an embodiment of the present invention;

fig. 2 is a flow chart illustrating an application of an apparatus for uniformity detection of an ion beam in accordance with an embodiment of the present invention;

FIG. 3 is a schematic structural view of a graphite disk having 6 holes formed therein according to an embodiment of the present invention;

FIG. 4 is a waveform of a sample taken using the graphite disk shown in FIG. 3;

FIG. 5 is a schematic diagram of obtaining ion beam splitting current in an embodiment of the present invention;

FIG. 6 is a flowchart of a process for determining uniformity of ion beam splitting uniformity in accordance with one embodiment of the present invention;

FIG. 7 is a block diagram of an analysis computing unit in accordance with an embodiment of the present invention;

FIG. 8 is a circuit diagram of a current to voltage conversion module according to an embodiment of the present invention;

FIG. 9 is a circuit diagram of an analog-to-digital conversion module according to an embodiment of the invention;

FIG. 10 is a circuit diagram of a computing module in accordance with an embodiment of the present invention;

in the figure: ion beam-1; an ion beam splitting current sampling unit-2; an analysis calculation unit-3; a current-voltage conversion module-30; an analog-to-digital conversion module-31; a calculation module-32.

Detailed Description

The ion beam uniformity detection apparatus of the present invention will be described in further detail with reference to the accompanying drawings and specific embodiments. The advantages and features of the present invention will become more apparent from the following description. It is to be noted that the drawings are in a very simplified form and are not to precise scale, which is merely for the purpose of facilitating and distinctly claiming the embodiments of the present invention.

Referring to fig. 1, which is a schematic structural diagram of an ion beam uniformity detecting apparatus according to the present invention, as shown in fig. 1, the ion beam uniformity detecting apparatus includes: the ion beam splitting device comprises an ion beam splitting current sampling unit 2 and an analysis calculation unit 3, wherein the ion beam splitting current sampling unit 2 is used for receiving an ion beam 1 and obtaining ion beam splitting currents at a plurality of positions in the ion beam 1; the analysis and calculation unit 3 is used for obtaining whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at a plurality of positions.

Further, the ion beam splitting current sampling unit 2 includes: the device comprises a filtering unit, a receiving unit and a control unit, wherein the control unit is used for driving the filtering unit to rotate, a plurality of through holes are formed in the filtering unit, and the positions and the apertures of the through holes are obtained by calculation according to an Archimedes spiral formula; the receiving unit is used for receiving the ion beam splitting of each through hole on the filtering unit so as to obtain ion beam splitting currents of a plurality of positions in the ion beam 1.

In order to ensure the uniformity of the ion beam implanted by the ion implantation equipment, the ion beam uniformity detection apparatus of the present invention is used to improve during the operation of the ion implantation equipment, and the specific process is understood with reference to fig. 1 and 2. Specifically, first, the ion beam uniformity detecting apparatus needs to be disposed in the path of the ion beam, the filter unit is disposed in the ion beam in a state of rotating at a uniform speed around the emission direction of the ion beam under the driving of the control unit, and the emission direction of the ion beam 1 is perpendicular to the surface of the filter unit, the ion beam uniformity detecting apparatus is initialized under the control of the control system, and the initialization purpose is as follows: the position of a preset hole on the filtering unit in the ion beam splitting current sampling unit is adjusted to receive the ion beam firstly, so that each through hole can obtain the ion beam splitting current at a plurality of positions in the ion beam in the selection process of the filtering unit. Then, judging whether ion beam injection exists at the current moment, if so, starting an ion beam uniformity detection device to detect the uniformity of the ion beam, and at the moment, preferably, the rotating speed of the filtering unit is 100 r/min; otherwise, detecting the uniformity of the ion beam until the ion beam starts to be injected; after the ion beam uniformity detection device detects the result of obtaining the ion beam uniformity, judging whether the ion beam uniformity meets the control requirement, if so, continuing the ion beam injection work without optimizing the ion beam; if the control requirement is not met, the ion beam uniformity is not good, at the moment, ion beam injection is interrupted, and ion beams are re-optimized, so that the influence of the ion beams with the uniformity not meeting the control requirement on the product yield is better avoided, optionally, a device formed according to actual requirements can be adjusted according to the control requirement, if the device precision requirement is high, the ion beam uniformity requirement is also high, otherwise, the device precision requirement is low, and the ion beam uniformity requirement is also low.

Referring to fig. 3 and 4, in the present embodiment, the filtering unit includes a tray body and a plurality of through holes disposed on the tray body, the tray body is preferably a graphite disc, and the plurality of through holes are disposed on the graphite disc. In this embodiment, the number of the through holes is 6, and the positions of the 6 through holes opened in the graphite disk are positions of P1, P2, P3, P4, P5 and P6 in fig. 3. The graphite disc in fig. 3 has a predetermined hole P1 at initialization.

For better understanding of the filter unit, the filter unit is a graphite disc with a radius of 15cm and 6 through holes. Before the through holes are opened, specific positions and apertures for opening the 6 through holes are calculated through an Archimedes spiral formula, so that the 6 through holes cannot be intersected at the same point at the same time. Here, since the positions of the 6 through holes are different at different positions of the graphite disk, the linear velocity at each position is different (the linear velocity at the edge position closer to the graphite disk is larger), and the 6 through holes need to use different radii to ensure the same sampling time.

The specific positions and apertures of the 6 through holes are calculated as follows:

I. according to the archimedean spiral formula: the distance from the 6 through holes to the center of the graphite disk can be calculated (where b is the coefficient of the archimedean spiral, and θ is the polar angle of the center of each hole, i.e., the total number of turns of the archimedean spiral to the center of each hole):

r1＝1.59cm；r2＝3.9cm；r3＝6.15cm；r4＝8.28cm；r5＝10.56cm；r6＝12.72cm；

wherein r1 is the distance from the through hole P1 to the center of the graphite disc, r2 is the distance from the through hole P2 to the center of the graphite disc, r3 is the distance from the through hole P3 to the center of the graphite disc, r4 is the distance from the through hole P4 to the center of the graphite disc, r5 is the distance from the through hole P5 to the center of the graphite disc, and r6 is the distance from the through hole P6 to the center of the graphite disc.

Deriving the radius of 6 vias according to the formula (ensuring that the sampling time T of 6 vias is the same):

linear velocity ═ angular velocity ═ radius → sampling time T ═ hole diameter/linear velocity → sampling time T ═ hole diameter/angular velocity ═ radius → sampling time T ═ hole diameter/1.667 radius;

first, the radius R of the design hole P1 is defined₁₁0.2 cm; then: t is 0.024 s;

radius R of through-hole P2₁₂＝0.49cm；

Radius R of through-hole P3₁₃＝＝0.77cm；

Radius R of through-hole P4₁₄＝1.04cm；

Radius R of through-hole P5₁₅＝1.33cm；

Radius R of through-hole P6₁₆＝1.6cm。

Sampling time calculation:

because the sampling times of the 6 vias are equal: t1, T2, T3, T4, T5, T6, T0.024 s, 24 ms;

t1 is the sampling time of through hole P1, t2 is the sampling time of hole P2, t3 is the sampling time of through hole P3, t4 is the sampling time of through hole P4, t5 is the sampling time of through hole P5, and t6 is the sampling time of through hole P6;

sampling interval time of 6 vias:

the speed of the graphite disc is 100r/min, 600ms is needed when the graphite disc rotates for one circle, and the sampling interval time of 6 through holes is equal: h1, h2, h3, h4, h5, h6, 0.076ms, 76ms (fig. 4).

Calculation of edge margins

The distance from the through hole P6 to the center of the circle is 12.72cm, and the radius R of the hole P6₁₆The distance L from the hole P6 to the circular edge is 15-12.72-1.6-0.68 cm, so that 6 through holes can be opened on the graphite disc, the edge distance is sufficient, the design meets the requirement, if the distance from the last through hole to the circular edge calculated by the method is greater than the radius of the graphite disc, the 6 through holes cannot be opened on the graphite disc, and the position and the aperture of the through hole P1 (namely the design hole) need to be readjusted.

The number of the through holes formed in the filter unit includes, but is not limited to, 6, as long as the number of the through holes formed is enough for the requirement of the data required for the inspection of the uniformity of the ion beam, and is preferably at least 6.

Please refer to fig. 5, which is a schematic diagram of obtaining the ion beam splitting current in the present embodiment. As shown in fig. 5, the receiving unit includes a magnetic field and an inductor, during the ion beam implantation process, the ion beam enters the magnetic field, since the ion beam is composed of charged ions, for example, positively charged ions, and the magnetic field and the inductor of the receiving unit form a path, when the positive ions enter the magnetic field, negative charges can be induced in the inductor, and a corresponding amount of negative charges can be induced in the inductor by how much positive charges enter the magnetic field to form a current, so that the magnitude of the ion beam splitting current can be known by detecting the current in the path.

Please refer to fig. 7, which is a block diagram of an analysis and calculation unit in the present embodiment. As shown in fig. 7, the analyzing and calculating unit 3 includes a current-voltage converting module 30, an analog-to-digital converting module 31, and a calculating module 32, which are connected in sequence; the current-voltage conversion module 30 is configured to convert an analog signal of the ion beam splitting current into an analog signal of the ion beam splitting voltage; the analog-to-digital conversion module 31 is configured to convert an analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage; the calculating module 32 is configured to compare a difference between the digital signals of the ion beam splitting voltages at two adjacent positions with a predetermined threshold, so as to determine whether the uniformity of the ion beam meets the control requirement. Preferably, the calculation module 32 is a single chip microcomputer.

Specifically, fig. 8 is a circuit diagram of a current-voltage conversion module according to an embodiment of the present invention; in fig. 8, the design of the circuit diagram of the current-voltage conversion module 30 in fig. 8 is taken as an example that the ion beam implantation equipment is a Varian 810 series machine, in which the receiving unit circularly inputs the ion beam splitting current at each position from the current input port I of the current-voltage conversion module 30, and the current-voltage conversion module 30 sequentially outputs the ion beam splitting voltage from the voltage output port V thereof, where R1, R2, R3, R4, and R5 represent resistors, U1 represents a current-voltage converter, and C1 represents a capacitor. Since the ion beam splitting current emitted by the machine station under a normal condition does not exceed 10mA, if R3 is 100K Ω, R4 is 150K Ω, and R1 is 200 Ω, the 0-10 mA input corresponds to a voltage output of 0-5V. Because the ion beam splitting current and the ion beam splitting voltage are both analog signals, the comparison is convenient, and the analog signals of the ion beam splitting voltage need to be converted into digital signals.

Fig. 9 is a circuit diagram of an analog-to-digital conversion module according to an embodiment of the invention. The analog-to-digital conversion module 31 in fig. 9 selects ADC0804 as a processing chip, and ADC0804 is an 8-bit, single-channel, low-price converter, and is mainly characterized in that: convenient TTL or CMOS standard interface; differential voltage input can be satisfied; a clock generator is contained; when the single power supply works, the V input voltage range is 0-5V; zero setting and the like are not needed, and the analog-to-digital conversion time is about 100 us; the requirements of the design on precision and sampling frequency are met. In fig. 9, the output port V of the current-voltage conversion module 30 inputs an analog signal of the ion splitting voltage to the input port VIN of the analog-to-digital conversion module 31, and then outputs a digital signal of the ion splitting voltage from the output ports DB0-DB7 of the analog-to-digital conversion module 31, where R5, R6, and R7 represent resistors, C2 represents capacitors, letters on the ADC0804 chip are all defined pins, and the ADC0804 chip is not described herein in any detail.

FIG. 10 is a circuit diagram of a computing module in accordance with an embodiment of the present invention. In fig. 10, the calculation module 32 is an 80C51 serial single chip microcomputer, which can save cost when meeting design requirements, the DBO-DB7 interface, the INTR interface (clock), and the WR/RO interface (read/write) in the calculation module 32 are all connected to the interface corresponding to the adc module 31, and for defining the connection of other module interfaces, reference is made to the names of the pins of the AT89C52 chip in fig. 10, which is not described herein in detail.

Corresponding measures are taken in order to intuitively acquire whether the uniformity of the ion beam meets the control requirement. The present implementation determines whether the uniformity of the ion beam satisfies the control requirement by setting the predetermined threshold in the calculation module 32, where a relationship between a difference between digital signals of ion beam splitting voltages at two adjacent positions and the predetermined threshold is used as a determination criterion, for example: if the difference value of the digital signals of the ion beam splitting voltages at the positions P1 and P2 is greater than the predetermined threshold, the ion beam uniformity does not meet the control requirement, and if the difference value of the digital signals of the ion beam splitting voltages at the positions P1 and P2 is less than or equal to the predetermined threshold, the ion beam uniformity meets the control requirement, but the ion beam uniformity meets the control requirement at this moment, the filter unit rotates continuously, at the next moment, the relationship between the digital signals of the ion beam splitting voltages at the positions P2 and P3 and the predetermined threshold is compared, and at the next moment, the relationship … … between the digital signals of the ion beam splitting voltages at the positions P3 and P4 and the predetermined threshold is compared to cycle so as to accurately know the ion beam uniformity in real time.

Referring to fig. 6, the specific determination process of the calculating unit 2 may be that, firstly, the current-voltage conversion module 30 converts the analog signal of the ion beam splitting current into an analog signal of an ion beam splitting voltage, and then the analog-to-digital conversion module 31 samples the ion beam at 70ms interval frequency to convert the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage; the calculation module 33 starts to analyze the sampling result, that is, by comparing the relationship between the difference between the digital signals of the ion beam splitting voltages at two adjacent positions and the predetermined threshold, it is determined whether the uniformity of the ion beam meets the control requirement, and if the uniformity of the ion beam does not meet the control requirement, an alarm pulse can be output to stop ion implantation, thereby preventing generation of defective products. In this embodiment, the predetermined threshold is set to 10%.

The source program corresponding to fig. 6 is as follows:

in another embodiment, the present invention further provides an ion beam uniformity detecting method for the ion beam uniformity detecting apparatus, which includes the following steps:

s1: the ion beam splitting current sampling unit receives the ion beam and obtains ion beam splitting currents at a plurality of positions in the ion beam; the sampling time of each position in the ion beam is the same by the ion beam splitting current sampling unit, and the sampling intervals of two adjacent positions are the same.

S1 specifically includes the following steps:

s11: arranging a filter unit in the ion beam, and enabling the emission direction of the ion beam to be vertical to the surface of the filter unit;

s12: the control unit drives the filter unit to rotate at a constant speed around the emission direction of the ion beam;

s13: the receiving unit receives the ion beam splitting passing through the plurality of through holes on the filtering unit and obtains the ion beam splitting current of each ion beam splitting.

S2: the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at the plurality of positions, wherein the step S2 specifically comprises the following steps:

s21: the current-voltage conversion module converts the analog signal of the ion beam splitting current into an analog signal of the ion beam splitting voltage;

s22: the analog-to-digital conversion module converts the analog signal of the ion beam splitting voltage into a digital signal of the ion beam splitting voltage;

s23: the calculation module compares the relation between the difference value of the digital signals of the ion beam splitting voltages at two adjacent positions and a preset threshold value to judge whether the uniformity of the ion beam meets the control requirement.

In summary, in the ion beam uniformity detecting apparatus and the detecting method provided by the present invention, the ion beam uniformity detecting apparatus includes an ion beam splitting current sampling unit and an analyzing and calculating unit, wherein the ion beam splitting current sampling unit is configured to receive an ion beam and obtain ion beam splitting currents at a plurality of positions in the ion beam; and the analysis and calculation unit obtains whether the uniformity of the ion beam meets the control requirement according to the ion beam splitting currents at the plurality of positions. Through the analysis to the ion beam splitting current of a plurality of positions, can be real-time, the degree of consistency condition of accurate knowing ion beam, in time adjust the ion implantation board in order to optimize the ion beam to avoid because of the not good condemned problem of product that leads to of ion beam degree of consistency, improved the product yield.

The above description is only for the purpose of describing the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention, and any variations and modifications made by those skilled in the art based on the above disclosure are within the scope of the appended claims.