阅读说明：本技术 绝缘检测电路、主板及相关装置 (Insulation detection circuit, mainboard and relevant device ) 是由 唐林 胡定高 赵德琦 吴壬华 于 2019-07-23 设计创作，主要内容包括：本申请公开了一种绝缘检测电路,包括交流电源、滤波电路和验波电路,验波电路包括第一子验波电路和第二子验波电路；交流电源与滤波电路连接,滤波电路与第一子验波电路和第二子验波电路连接；交流电源产生的交流电信号经过所述滤波电路产生第一电流信号,第一电流信号流向第一子验波电路和第二子验波电路,以及在第一子验波电路产生第一电压,在第二子验波电路产生第二电压。本申请实施例能够简化绝缘检测电路的设计。(The application discloses an insulation detection circuit, which comprises an alternating current power supply, a filter circuit and a wave checking circuit, wherein the wave checking circuit comprises a first sub wave checking circuit and a second sub wave checking circuit; the alternating current power supply is connected with the filter circuit, and the filter circuit is connected with the first sub-wave inspection circuit and the second sub-wave inspection circuit; the alternating current signal generated by the alternating current power supply generates a first current signal through the filter circuit, the first current signal flows to the first sub-wave inspection circuit and the second sub-wave inspection circuit, a first voltage is generated in the first sub-wave inspection circuit, and a second voltage is generated in the second sub-wave inspection circuit. The design of the insulation detection circuit can be simplified.)

1. An insulation detection circuit, comprising: alternating current power supply, filter circuit and test the ripples circuit, test the ripples circuit and include first sub-circuit of testing ripples and second sub-circuit of testing ripples, wherein:

the alternating current power supply is connected with the filter circuit, and the filter circuit is connected with the first sub-wave inspection circuit and the second sub-wave inspection circuit;

the alternating current signal that alternating current power supply produced passes through filter circuit produces first current signal, first current signal flow to first sub-ripples circuit of examining and second sub-ripples circuit of examining to and produce first voltage at first sub-ripples circuit of examining, produce the second voltage at second sub-ripples circuit of examining.

2. The insulation detection circuit of claim 1, wherein the filter circuit comprises a first capacitor, a first resistor, a second capacitor, and a second resistor, wherein:

the second port of the first capacitor is connected with the first port of the first resistor, the second port of the first resistor is connected with the first port of the second resistor, and the second port of the second resistor is connected with the first port of the second capacitor.

3. The insulation detection circuit of claim 2, wherein the first port of the filter circuit is connected to the first port of the first capacitor; a second port of the filter circuit is connected with a second port of the first capacitor and a first port of the first resistor; a third port of the filter circuit is connected with a second port of the first resistor and a first port of the second resistor; a fourth port of the filter circuit is connected with a second port of the second resistor and a first port of the second capacitor; and a fifth port of the filter circuit is connected with a second port of the second capacitor.

4. The insulation detection circuit of claim 3, wherein the first sub-circuit comprises a first rectifying diode and a third capacitor, and the second sub-circuit comprises a second rectifying diode and a fourth capacitor, wherein:

a first port of the first sub wave inspection circuit is connected with an anode of the first rectifying diode, a cathode of the first rectifying diode is connected with a first port of the third capacitor, and a second port of the third capacitor is connected with a second port of the first sub wave inspection circuit;

the first port of the second sub-wave checking circuit is connected with the first port of the fourth capacitor, the second port of the fourth capacitor is connected with the cathode of the second rectifying diode, and the anode of the second rectifying diode is connected with the second port of the second sub-wave checking circuit;

and the second port of the first sub-wave test circuit is connected with the first port of the second sub-wave test circuit.

5. The insulation detection circuit of claim 4, wherein the first port of the filter circuit is connected to the first port of the AC power source; the second port of the filter circuit is connected with the first port of the first sub-wave experience circuit; the third port of the filter circuit is connected with the second port of the first sub-wave test circuit and the first port of the second sub-wave test circuit; the fourth port of the filter circuit is connected with the second port of the second sub-wave test circuit; and a fifth port of the filter circuit is connected with a second port of the alternating current power supply.

6. The insulation detection circuit according to claim 5, wherein a capacitance value of the first capacitor is equal to a capacitance value of the second capacitor, a resistance value of the first resistor is equal to a resistance value of the second resistor, a capacitance value of the third capacitor is equal to a capacitance value of the fourth capacitor, and a type of the first rectifying diode is equal to a type of the second rectifying diode.

7. The insulation detection circuit of claim 6, wherein a housing is connected to the second port of the first resistor and the first port of the second resistor.

8. The insulation detection circuit according to claim 7, wherein the insulation detection circuit is connected to a control circuit, the control circuit comprising a micro control unit for detecting the voltage of the third and fourth capacitors;

if the voltage difference value of the third capacitor and the fourth capacitor is smaller than or equal to a preset threshold value, the micro control unit displays that the insulation is normal; and if the voltage difference value of the third capacitor and the fourth capacitor is greater than the preset threshold value, the micro control unit displays that the insulation fails.

9. A motherboard comprising a printed circuit board and an insulation detection circuit as claimed in any one of claims 1 to 8.

10. An insulation detecting device characterized by comprising a housing and the main board recited in claim 9.

Technical Field

The application relates to the technical field of circuit structures, in particular to an insulation detection circuit, a mainboard and a related device.

Background

In life, electricity is an essential element. In some occasions where there is no Power Supply or the Power Supply is required to be uninterrupted, some devices are inevitably used to convert other energy sources into alternating current to Supply Power to the electric devices, such as an Uninterruptible Power Supply (UPS) and a vehicle-mounted inverter. In order to avoid electric shock accidents caused by insulation failure when the equipment is used, the insulation performance of an alternating current power supply and a shell needs to be detected, and the power supply is cut off in time when the insulation failure is found. Currently, a common method for insulation detection circuits is the unbalanced bridge method. The unbalanced bridge method needs to control four switches and measure four voltages to calculate the insulation resistance value, and the measuring method is complex.

Disclosure of Invention

The embodiment of the application provides an insulation detection circuit, a mainboard and a related device, which are used for simplifying the design of the insulation detection circuit.

In a first aspect, an embodiment of the present application provides an insulation detection circuit, including ac power supply, filter circuit and wave inspection circuit, wave inspection circuit includes first sub wave inspection circuit and second sub wave inspection circuit, wherein:

the alternating current power supply is connected with the filter circuit, and the filter circuit is connected with the first sub-wave inspection circuit and the second sub-wave inspection circuit;

the alternating current power supply generates an alternating current signal, the alternating current signal passes through the wave testing circuit to generate a first current signal, the first current signal generates a first voltage at the first sub-wave testing circuit, and the first current signal generates a second voltage at the second sub-wave testing circuit.

In one embodiment of the present application, the filter circuit includes a first capacitor, a first resistor, a second capacitor, and a second resistor, wherein:

the second port of the first capacitor is connected with the first port of the first resistor, the second port of the first resistor is connected with the first port of the second resistor, and the second port of the second resistor is connected with the first port of the second capacitor.

In one embodiment of the present application, the first port of the filter circuit is connected to the first port of the first capacitor; a second port of the filter circuit is connected with a second port of the first capacitor and a first port of the first resistor; a third port of the filter circuit is connected with a second port of the first resistor and a first port of the second resistor; a fourth port of the filter circuit is connected with a second port of the second resistor and a first port of the second capacitor; and a fifth port of the filter circuit is connected with a second port of the second capacitor.

In one embodiment of the present application, the first sub-experience circuit includes a first rectifying diode and a third capacitor, and the second sub-experience circuit includes a second rectifying diode and a fourth capacitor, wherein:

a first port of the first sub wave inspection circuit is connected with an anode of the first rectifying diode, a cathode of the first rectifying diode is connected with a first port of the third capacitor, and a second port of the third capacitor is connected with a second port of the first sub wave inspection circuit;

the first port of the second sub-wave checking circuit is connected with the first port of the fourth capacitor, the second port of the fourth capacitor is connected with the cathode of the second rectifying diode, and the anode of the second rectifying diode is connected with the second port of the second sub-wave checking circuit;

and the second port of the first sub-wave test circuit is connected with the first port of the second sub-wave test circuit.

In one embodiment of the present application, the first port of the filter circuit is connected to the first port of the ac power source; the second port of the filter circuit is connected with the first port of the first sub-wave experience circuit; the third port of the filter circuit is connected with the second port of the first sub-wave test circuit and the first port of the second sub-wave test circuit; the fourth port of the filter circuit is connected with the second port of the second sub-wave test circuit; and a fifth port of the filter circuit is connected with a second port of the alternating current power supply.

In an embodiment of the present application, a capacitance value of the first capacitor is equal to a capacitance value of the second capacitor, a resistance value of the first resistor is equal to a resistance value of the second resistor, a capacitance value of the third capacitor is equal to a capacitance value of the fourth capacitor, and a type of the first rectifying diode is equal to a type of the second rectifying diode.

In one embodiment of the present application, a housing is connected to the second port of the first resistor and the first port of the second resistor.

In one embodiment of the present application, the insulation detection circuit is connected to a control circuit, and the control circuit includes a micro control unit for detecting voltages of the third capacitor and the fourth capacitor;

if the voltage difference value of the third capacitor and the fourth capacitor is smaller than or equal to a preset threshold value, the micro control unit displays that the insulation is normal; and if the voltage difference value of the third capacitor and the fourth capacitor is greater than the preset threshold value, the micro control unit displays that the insulation fails.

In a second aspect, an embodiment of the present application provides a motherboard including a printed circuit board and the insulation detection circuit described in any one of the above.

In a third aspect, the present application provides an insulation detection device, which includes a housing and the above-mentioned main board.

In the embodiment of the application, the alternating current power supply is connected with the filter circuit, and the filter circuit is connected with the wave checking circuit, wherein the wave checking circuit comprises a first sub wave checking circuit and a second sub wave checking circuit; the alternating current power supply generates an alternating current signal, the alternating current signal generates a first current signal through the wave checking circuit, the first current signal generates a first voltage in the first sub wave checking circuit, and the first current signal generates a second voltage in the second sub wave checking circuit. Therefore, the insulation performance of the alternating current power supply and the shell can be judged by only measuring two voltages and comparing the difference value of the two voltages, and compared with the existing unbalanced bridge method, the insulation detection circuit is simplified.

These and other aspects of the present application will be more readily apparent from the following description of the embodiments.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.

Fig. 1 is a circuit block diagram of an insulation detection circuit according to an embodiment of the present application;

fig. 2A is a schematic structural diagram of an insulation detection circuit according to an embodiment of the present disclosure;

FIG. 2B is a schematic diagram of the structure of the insulation detection circuit when the insulation performance is normal;

FIG. 2C is a schematic diagram of the insulation detection circuit in the event of an insulation performance failure;

FIG. 3 is a schematic diagram of a filter circuit in the insulation detection circuit shown in FIG. 2A;

fig. 4 is a schematic structural diagram of a wave test circuit in the insulation detection circuit shown in fig. 2A.

Detailed Description

In order to make the technical solutions better understood by those skilled in the art, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only partial embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.

The following are detailed below.

The terms "first," "second," "third," and "fourth," etc. in the description and claims of this application and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

Embodiments of the present application are described below with reference to the drawings.

Referring to fig. 1, fig. 1 is a circuit block diagram of an insulation detection circuit according to an embodiment of the present disclosure. This insulation detection circuitry includes alternating current power supply, filter circuit and test ripples circuit, tests ripples circuit and includes that first sub-ripples circuit and second are tested ripples circuit, wherein:

the alternating current power supply is connected with the filter circuit, and the filter circuit is connected with the first sub-wave checking circuit and the second sub-wave checking circuit;

the alternating current signal generated by the alternating current power supply generates a first current signal through the filter circuit, the first current signal flows to the first sub-wave inspection circuit and the second sub-wave inspection circuit, a first voltage is generated in the first sub-wave inspection circuit, and a second voltage is generated in the second sub-wave inspection circuit.

It can be seen that, in the embodiment of the present application, the ac power supply is connected to the filter circuit, and the filter circuit is connected to the wave checking circuit, where the wave checking circuit includes a first sub wave checking circuit and a second sub wave checking circuit; the alternating current power supply generates an alternating current signal, the alternating current signal generates a first current signal through the wave checking circuit, the first current signal generates a first voltage in the first sub wave checking circuit, and the first current signal generates a second voltage in the second sub wave checking circuit. Therefore, the insulation performance of the alternating current power supply and the shell can be judged by only measuring two voltages and comparing the difference value of the two voltages, and compared with the existing unbalanced bridge method, the insulation detection circuit is simplified.

Referring to fig. 2A, fig. 2A is a schematic structural diagram of another insulation detection circuit provided in the present embodiment, the insulation detection circuit includes an ac power supply 100, a filter circuit 200, and a wave verification circuit 300, the wave verification circuit 300 includes a first sub-wave verification circuit 310 and a second sub-wave verification circuit 320, where:

the filter circuit 200 comprises a first capacitor C1, a first resistor R1, a second capacitor C2 and a second resistor R2, wherein a second port of the first capacitor C1 is connected with a first port of a first resistor R1, a second port of the first resistor R1 is connected with a first port of a second resistor R2, and a second port of the second resistor R2 is connected with a first port of a second capacitor C2.

The first port 201 of the filter circuit 200 is connected to the first port of the first capacitor C1; the second port 202 of the filter circuit 200 is connected to the second port of the first capacitor C1 and the first port of the first resistor R1; the third port 203 of the filter circuit 200 is connected to the second port of the first resistor R1 and the first port of the second resistor R2; the fourth port 204 of the filter circuit 200 is connected to the second port of the second resistor R2 and the first port of the second capacitor C2; the fifth port 205 of the filter circuit 200 is connected to the second port of the second capacitor C2.

The first sub-wave experience circuit 310 comprises a first rectifying diode D1 and a third capacitor C3, a first port 311 of the first sub-wave experience circuit 310 is connected with an anode of a first rectifying diode D1, a cathode of the first rectifying diode D1 is connected with a first port of a third capacitor C3, and a second port of the third capacitor C3 is connected with a second port 312 of the first sub-wave experience circuit;

the second sub-wave experience circuit 320 comprises a second rectifying diode D2 and a fourth capacitor C4, a first port 321 of the second sub-wave experience circuit 320 is connected with a first port of the fourth capacitor C4, a second port of the fourth capacitor C4 is connected with a cathode of a second rectifying diode D2, and an anode of a second rectifying diode D2 is connected with a second port 322 of the second sub-wave experience circuit 320;

the second port 312 of the first sub-adder 310 is connected to the first port 321 of the second sub-adder 320.

A first port 201 of the filter circuit 200 is connected to a first port of the ac power supply 100; the second port 202 of the filter circuit 200 is connected to the first port 311 of the first sub-a-wave circuit 310; the third port 203 of the filter circuit 200 is connected to the second port 312 of the first sub-a-wave circuit 310 and the first port 321 of the second sub-a-wave circuit 320; fourth port 204 of filter circuit 200 is connected to second port 322 of second sub-a-wave circuit 320; the fifth port 205 of the filter circuit 200 is connected to the second port of the ac power source 100.

The capacitance value of the first capacitor C1 is equal to that of the second capacitor C2, the resistance value of the first resistor R1 is equal to that of the second resistor R2, the capacitance value of the third capacitor C3 is equal to that of the fourth capacitor C4, and the type of the first rectifier diode D1 is equal to that of the second rectifier diode D2.

The casing is connected with the second port of the first resistor R1 and the first port of the second resistor R2.

The insulation detection circuit is connected with the control circuit, the control circuit comprises a micro control unit, and the micro control unit is used for detecting the voltage of the third capacitor C3 and the fourth capacitor C4.

If the voltage difference value between the third capacitor C3 and the fourth capacitor C4 is smaller than or equal to a preset threshold value, the micro control unit displays that the insulation is normal; if the voltage difference value between the third capacitor C3 and the fourth capacitor C4 is larger than the preset threshold value, the micro control unit displays that the insulation is failed.

It can be seen that, in the embodiment of the present application, the ac power supply is connected to the filter circuit, and the filter circuit is connected to the wave test circuit, where the wave test circuit includes a first sub wave test circuit and a second sub wave test circuit; the alternating current power supply generates an alternating current signal, the alternating current signal generates a first current signal through the wave checking circuit, the first current signal generates a first voltage in the first sub wave checking circuit, and the first current signal generates a second voltage in the second sub wave checking circuit. Therefore, the insulation performance of the alternating current power supply and the shell can be judged by only measuring two voltages and comparing the difference value of the two voltages, and compared with the existing unbalanced bridge method, the insulation detection circuit is simplified.

The operation flow of the insulation detection circuit shown in fig. 2A will be described in detail below based on its schematic configuration.

It should be noted that, the filter circuit 200 is connected to the output end of the ac power supply 100 in a symmetrical structure, and parameters of internal components are in one-to-one correspondence. Meanwhile, the first sub-wave test circuit 310 and the second sub-wave test circuit 320 have the same structure, so that the internal component parameters of the first sub-wave test circuit and the second sub-wave test circuit are also the same. For example, the capacitance of the first capacitor C1 and the capacitance of the second capacitor C2 in the filter circuit 200 are the same, and the resistance of the first resistor R1 and the resistance of the second resistor R2 are the same; the third capacitor C3 in the first sub-empirical circuit 310 has the same capacitance value as the third capacitor C4 in the second sub-empirical circuit 320, and the model of the first rectifying diode D1 in the first sub-empirical circuit 310 is the same as the model of the second rectifying diode D2 in the second sub-empirical circuit 320.

Referring to fig. 2B, fig. 2B is a schematic structural diagram of an insulation detection circuit when the insulation performance is normal. With respect to fig. 2A, fig. 2B accesses the chassis at the second port of the first resistor R1 and the first port of the second resistor R2 of fig. 2A. An alternating current power supply generates an alternating current signal, the alternating current signal generates a first current signal in a wave checking circuit through a first capacitor C1, a first resistor R1, a second resistor R2 and a second capacitor C2, the first current signal charges a third capacitor C3 through a first rectifier diode D1 in a first sub-wave checking circuit, the first current signal charges a fourth capacitor C4 through a second rectifier diode D2 in a second sub-wave checking circuit, and due to the fact that the insulation detection circuit in the normal insulation performance shown in FIG. 2B is completely symmetrical, the first voltage U1 at two ends of the third capacitor C3 and the second voltage U2 at two ends of the fourth capacitor C4 can be detected to be equal.

Referring to fig. 2C, fig. 2C is a schematic structural diagram of an insulation detection circuit when insulation performance fails. When the insulation performance of the ac power supply 100 fails, the output cable of the ac power supply and the housing do not exhibit an open circuit state. With respect to fig. 2B, fig. 2C is equivalent to that a third resistor Rx is connected between the first port of the first capacitor C1 of fig. 2B and the housing. The alternating current power supply generates an alternating current signal, the alternating current signal generates a second current signal through the third resistor Rx, the alternating current signal generates a third current signal through the first capacitor C1 and the first resistor R1, the alternating current signal generates a fourth current signal through the second resistor R2 and the second capacitor C2, the magnitude of the fourth current signal is equal to the sum of the second current signal and the third current signal, the third current signal charges the third capacitor C3 through the first rectifying diode D1 in the first sub-empirical circuit, the fourth current signal charges the fourth capacitor C4 through the second rectifying diode D2 in the second sub-empirical circuit, since the third current signal is smaller than the fourth current signal and the model of the first rectifying diode D1 is the same as the model of the second rectifying diode D2, the capacitance values of the third capacitor C3 and the fourth capacitor C4 are equal, it can be detected that the first voltage U1 across the third capacitor C3 and the second voltage U2 across the fourth capacitor C4 are not equal.

Referring to fig. 3, fig. 3 is a schematic structural diagram of a filter circuit in the insulation detection circuit shown in fig. 2A, the filter circuit 200 includes a first capacitor C1, a first resistor R1, a second capacitor C2, and a second resistor R2, wherein:

a second port of the first capacitor C1 is connected to a first port of the first resistor R1, a second port of the first resistor R1 is connected to a first port of the second resistor R2, and a second port of the second resistor R2 is connected to a first port of the second capacitor C2.

Wherein, C1 and C2 are safety capacitors.

The capacitance of the first capacitor C1 is equal to that of the second capacitor C2, and the resistance of the first resistor R1 is equal to that of the second resistor R2.

The first port 201 of the filter circuit 200 is connected to the first port of the first capacitor C1, the second port 202 of the filter circuit 200 is connected to the second port of the first capacitor C1 and the first port of the first resistor R1, the third port 203 of the filter circuit 200 is connected to the second port of the first resistor R1 and the first port of the second resistor R2, the fourth port 204 of the filter circuit 200 is connected to the second port of the second resistor R2 and the first port of the second capacitor C2, and the fifth port 205 of the filter circuit 200 is connected to the second port of the second capacitor C2.

Referring to fig. 4, fig. 4 is a schematic structural diagram of a wave test circuit in the insulation detection circuit shown in fig. 2A, the wave test circuit 300 includes a first sub-wave test circuit 310 and a second sub-wave test circuit 320, wherein:

the first sub-wave experience circuit 310 comprises a first rectifying diode D1 and a third capacitor C3, a first port 311 of the first sub-wave experience circuit 301 is connected with the anode of a first rectifying diode D1, the cathode of the first rectifying diode D1 is connected with a first port of a third capacitor C3, and a second port of the third capacitor C3 is connected with a second port 312 of the first sub-wave experience circuit;

the second sub-wave experience circuit 320 comprises a second rectifying diode D2 and a fourth capacitor C4, a first port 321 of the second sub-wave experience circuit 320 is connected with a first port of the fourth capacitor C4, a second port of the fourth capacitor C4 is connected with a cathode of a second rectifying diode D2, and an anode of a second rectifying diode D2 is connected with a second port 322 of the second sub-wave experience circuit 320;

the second port 312 of the first sub-adder 310 is connected to the first port 321 of the second sub-adder 320.

The capacitance value of the third capacitor C3 is equal to that of the fourth capacitor C4, and the model of the first rectifying diode D1 is the same as that of the second rectifying diode D2.

In one possible example, the present application provides a motherboard including a printed circuit board and the insulation detection circuit described in any one of the above.

In one possible example, the embodiment of the present application provides an insulation detection device, which includes a housing and the above-mentioned main board.

The insulation detection circuit in the insulation detection device is the same as the insulation detection circuit described in any of the embodiments of the above-mentioned application, and will not be described here.

It should be noted that, for the sake of simplicity, the embodiments of the present application are described as a series of acts or combinations, but those skilled in the art should understand that the present application is not limited by the described order of acts, as some steps may be performed in other orders or simultaneously according to the present application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.

In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, the above-described division of the units is only one type of division of logical functions, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some interfaces, devices or units, and may be an electric or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The foregoing detailed description of the embodiments of the present application has been presented to illustrate the principles and implementations of the present application with specific examples, and the above description of the embodiments is only provided to help understand the present application and its core ideas; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in view of the above, the content of the present specification should not be construed as a limitation to the present application.