阅读说明：本技术 存储器及其操作方法 (Memory and operation method thereof ) 是由 白宇铉 于 2019-12-12 设计创作，主要内容包括：本申请提供一种存储器及其操作方法。包括正常字线和冗余字线的存储器的操作方法可以包括：将行冗余信息和标志信号与激活命令和行地址一起接收；以及通过根据标志信号的逻辑电平而对行冗余信息进行解码来激活冗余字线中的一个。(The application provides a memory and an operation method thereof. The method of operating a memory including a normal word line and a redundant word line may include: receiving row redundancy information and a flag signal together with an activate command and a row address; and activating one of the redundant word lines by decoding the row redundancy information according to a logic level of the flag signal.)

1. A method of operating a memory including a normal word line and a redundant word line, the method of operating comprising:

receiving row redundancy information and a flag signal together with an activate command and a row address; and

activating one of the redundant word lines by decoding the row redundancy information according to a logic level of the flag signal.

2. The method of operation of claim 1, wherein the memory receives the row redundancy information from a memory controller via a data pad.

3. The operating method of claim 1, wherein the flag signal is transferred to the memory via one of the data pads.

4. The operating method of claim 3, wherein the flag signal is transferred to the memory via a separate signal pad other than the data pad.

5. The method of operation of claim 1, further comprising:

the logic level of the flag signal is checked to determine whether to access the normal word line or the redundant word line.

6. The method of operation of claim 3, further comprising:

activating one of the normal word lines by decoding the row address when it is determined to access the normal word lines in response to the flag signal.

7. A memory, comprising:

a normal word line;

a redundant word line;

a redundant decoder configured to: activating one of the redundant word lines by decoding row redundancy information received via a data pad when the memory determines to access the redundant word lines; and

a normal decoder configured to: activating one of the normal word lines by decoding an address when the memory determines to access the normal word lines.

8. The memory of claim 7, wherein, in an active operation, the memory receives a row activate command, the address, and the row redundancy information.

9. The memory of claim 8, wherein the memory receives a flag signal from a memory controller.

10. The memory of claim 9, wherein the memory receives the flag signal via one of the data pads.

11. A storage system, comprising:

a memory; and

a memory controller configured to transfer row redundancy information to the memory along with a row activate command and a row address.

12. The memory system of claim 11, wherein the memory receives the row redundancy information via data pads.

13. The storage system of claim 12, wherein the memory comprises:

a normal word line;

a redundant word line;

a redundant decoder configured to: selectively activating one of the redundant word lines by decoding the row redundancy information when it is determined to access the redundant word lines in response to a flag signal; and

a normal decoder configured to: activating one of the normal word lines by decoding an address when it is determined to access the normal word lines in response to the flag signal.

14. The memory system of claim 13, wherein the memory controller transmits the flag signal to the memory via one of the data pads.

15. The memory system of claim 13, wherein the memory controller transmits the flag signal to the memory via a separate signal pad other than the data pad.

Technical Field

Various embodiments relate to a memory, and more particularly, to repair of a memory.

Background

In the early days of the semiconductor memory industry, a plurality of raw quality die with non-failing memory cells were distributed on a wafer in memory chips that went through the semiconductor manufacturing process. However, as the capacity of the memory gradually increases, it has become difficult to manufacture a memory without defective memory cells. Currently, it seems impossible to manufacture such memories. As a way to solve such a problem, a repair method is used to provide redundant memory cells within a memory and to replace failed cells with redundant memory cells.

Generally, when a wafer fabrication process of a memory is completed, a test is performed to determine whether a memory cell is normal. After the test, the failed memory cell is replaced with a memory cell that is repaired in a wafer state through a repair operation. This is the normal repair where the repair is performed in the wafer state. There is a post-package repair (PPR) performed after the memory is packaged. By using the post-package repair technique, a defective memory cell that is not found in a wafer state after packaging but occurs when a user uses the memory device can be repaired.

Post-package repair (PPR) includes Hard post-package repair (Hard PPR) and Soft post-package repair (Soft PPR). Hard post-package repair (Hard PPR) refers to post-package repair in which the repair effect is permanently maintained by only one repair. Soft post package repair (Soft PPR) refers to temporary post package repair in which the repair effect disappears unless power is supplied to the memory. For example, when a hard repair operation is performed to replace a specific memory cell X with a redundant memory cell Y, the memory cell X is permanently replaced with the redundant memory cell Y, but when a soft repair operation is performed to replace the specific memory cell X with the redundant memory cell Y, the repair operation for the memory cell X needs to be performed whenever power is re-supplied to the memory device.

In the related art, in the hard pack repair and the soft pack repair, the number of memory cells that can be repaired is also limited due to the limitation of the number of fuses and the number of latches. In addition, complicated procedures need to be performed, such as entering the post-package repair mode to input a repair address and exiting from the post-package repair mode.

Disclosure of Invention

Various embodiments are directed to a technique that enables easy access to redundant word lines without restriction.

In one embodiment, a method of operating a memory including a normal word line and a redundant word line may include: receiving row redundancy information and a flag signal together with an activate command and a row address; and activating one of the redundant word lines by decoding row redundancy information according to a logic level of a flag signal.

In another embodiment, the memory may include: a normal word line; a redundant word line; a redundancy decoder configured to activate one of the redundant word lines by decoding row redundancy information received via the data pad when the memory determines to access the redundant word lines; and a normal decoder configured to activate one of the normal word lines by decoding an address when the memory determines to access the normal word lines.

In another embodiment, a storage system may include: a memory; and a memory controller configured to transfer the row redundancy information to the memory together with the row activation command and the row address.

According to the embodiment, the redundant word line of the memory can be easily accessed without limitation.

Drawings

FIG. 1 is a block diagram illustrating a memory system according to an embodiment of the present invention.

Fig. 2 is a flowchart for describing an operation method of the memory system shown in fig. 1.

Detailed Description

Various embodiments will be described in more detail below with reference to the accompanying drawings. This invention may, however, be embodied in different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art. Throughout this disclosure, like reference numerals refer to like parts throughout the various figures and embodiments of the present invention.

Note that references to "an embodiment," "another embodiment," etc., do not necessarily mean only one embodiment, and different references to any such phrases are not necessarily to the same embodiment.

It will be understood that, although the terms first, second, third, etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. Thus, a first element described below could also be termed a second or third element without departing from the spirit and scope of the present invention.

Throughout the specification, when an element is referred to as being "connected to" or "coupled to" another element, it may indicate that the former element is directly connected or coupled to the latter element or that the former element is electrically connected or coupled to the latter element with another element interposed therebetween. Further, when an element "comprises" or "includes" a component, it means: unless otherwise stated to the contrary, the element does not exclude another component, but may further include or comprise another component. Further, although the components described in the specification are expressed in the singular form, the present embodiment is not limited thereto, and the corresponding components may also be expressed in the plural form.

FIG. 1 is a block diagram illustrating a memory system 100 according to an embodiment of the invention.

Referring to fig. 1, a memory system 100 may include a memory controller 110 and a memory 120.

The memory controller 110 may control the memory 120. Specifically, the memory controller 110 may control the operation of the memory 120 by applying a command CMD and an address ADD to the memory 120, and transmit and receive DATA to and from the memory 120.

The memory 120 may include a command receiving circuit 121, an address receiving circuit 122, a data transmitting/receiving circuit 123, a command decoder 124, a normal decoder 125, a redundancy decoder 126, normal word lines WL _0 to WL _ N, and redundancy word lines RWL _0 to RWL _ M. Memory 120 may comprise many other configurations; however, fig. 1 shows only the configuration related to accessing the normal word lines WL _0 to WL _ N and the redundant word lines RWL _0 to RWL _ M.

The command receiving circuit 121 can receive a command CMD from the memory controller 110. Since the command CMD may be generally composed of a plurality of control signals such as a chip select signal (i.e., CS), a row address strobe signal (i.e., RAS), a column address strobe signal (i.e., CAS), a write enable signal (i.e., WE), a clock enable signal (i.e., CKE), the command receiving circuit 121 may include a plurality of command pads and a plurality of command receivers corresponding thereto. Address receive circuit 122 may receive an address ADD from memory controller 110. Since the address ADD may be composed of a plurality of bits, the address receiving circuit 122 may include a plurality of address pads and a plurality of address receivers corresponding thereto. The DATA transmission/reception circuit 123 may receive the DATA transferred from the memory controller 110 and may transmit the DATA to the memory controller 110. The data transmission/reception circuit 123 may include a plurality of data (I/O) pads, a plurality of data receivers, and data transmitters corresponding thereto. In the figure, DQ <0:15> may indicate data received through 16 data pads. For example, DQ <0> may indicate data bits received through data pad #0, and DQ <3> may indicate data bits received through data pad # 3.

The command decoder 124 may generate an internal command signal by decoding a command CMD received via the command receiving circuit 121. The internal command signals may include a read signal, a write signal, an activate signal ACT, a precharge signal, and the like. Fig. 1 shows only the active signal ACT directly related to the embodiment. The activation signal ACT may be an internal command signal that is activated when an activation operation is instructed by the command CMD.

The normal word lines WL _0 to WL _ N denote general word lines. In this embodiment, the term "normal" is used to distinguish the normal word lines WL _0 to WL _ N from the redundant word lines RWL _0 to RWL _ M. A plurality of normal memory cells may be electrically connected to each of the normal word lines WL _0 to WL _ N. Fig. 1 shows that normal word lines WL _0 to WL _ N are disposed in one region; however, in the memory 120, the normal word lines WL _0 to WL _ N may be distributively disposed in respective regions such as a plurality of banks.

The redundant word lines RWL _0 to RWL _ M may be word lines for replacing defective word lines among the normal word lines WL _0 to WL _ N. A plurality of redundant memory cells may be electrically connected to each of the redundant word lines RWL _0 to RWL _ M. Fig. 1 shows that redundant word lines RWL _0 to RWL _ M are provided in one region; however, in the memory 120, the redundant word lines RWL _0 to RWL _ M may be distributively arranged in respective areas such as a plurality of banks. The number of redundant word lines RWL _0 to RWL _ M may be smaller than the number of normal word lines WL _0 to WL _ N.

When the active signal ACT is activated (i.e., when an active operation is instructed by the command CMD), the normal decoder 125 may selectively activate one of the normal word lines WL _0 to WL _ N by decoding an address ADD (i.e., a row address). The address ADD may include a bank address for selecting a target bank to be activated and a row address for selecting a normal word line to be activated in the selected bank. The normal decoder 125 may be activated when data DQ <0> of the data pad #0 input together with the command CMD instructing an active operation has a logic low level, and the normal decoder 125 may be deactivated when data DQ <0> of the data pad #0 input together with the command CMD instructing an active operation has a logic high level.

When the active signal ACT is activated, the redundancy decoder 126 can selectively activate one of the redundancy word lines RWL _0 to RWL _ M by decoding data DQ <1:13 >. The redundancy decoder 126 may be activated when data DQ <0> of the data pad #0 input together with the command CMD instructing an activation operation has a logic high level, and the redundancy decoder 126 may be deactivated when data DQ <0> of the data pad #0 input together with the command CMD instructing an activation operation has a logic low level. In general, since data is input together with the command CMD instructing a write operation, when the command CMD instructing an activate operation is applied, data is not input. Therefore, signals DQ <0:15> input via the data pads together with the command CMD instructing an active operation are address information (i.e., row redundancy information).

Table 1 below indicates information included in signals DQ <0:13> input together with a (row) activate command (i.e., a command CMD indicating an activate operation). The redundant decoder 126 may not use the signals DQ <14:15> (i.e., be uncorrelated).

TABLE 1

Among data input together with the activate command, the signal DQ <0> can be used to select a decoder to be activated among the normal decoder 125 and the redundant decoder 126. For example, when the signal DQ <0> is at a logic low level, one of the normal word lines WL _0 to WL _ N may be activated, and when the signal DQ <0> is at a logic high level, one of the redundant word lines RWL _0 to RWL _ M may be activated. That is, the signal DQ <0> may be used as an enable signal or a flag signal. Fig. 1 shows the following example: signal DQ <0> is used to select a decoder to be activated among normal decoder 125 and redundant decoder 126; however, a separate flag signal may be transferred from the memory controller 110 to the memory 120 along with the activation command, in addition to the signal DQ <0>, and may be used to select a decoder to be activated among the normal decoder 125 and the redundant decoder 126 according to the level of the separate flag signal.

Signals DQ <12:13> may be used to select the bank group that includes the redundant word lines to be activated, and signals DQ <10:11> may be used to select the banks to be activated in the selected bank group. Signals DQ <8:9> may be used to select the region (hereinafter, referred to as a quarter) to be activated in the selected bank. In addition, signals DQ <1:7> may be used to select redundant word lines to be activated in selected regions within selected memory banks.

Fig. 2 is a flowchart for describing an operation method of the memory system 100 shown in fig. 1.

Referring to fig. 2, an address ADD and DATA may be transmitted from the memory controller 110 to the memory 120 together with an active command CMD in step 201. In the existing memory system, in the active operation, only an address is sent from the memory controller to the memory together with an active command; however, unlike the existing memory system, in this embodiment, not only the address ADD but also the DATA are sent from the memory controller 110 to the memory 120 as row redundancy information. The address ADD and the DATA may be transferred from the memory controller 110 to the memory 120 at the same time as the command CMD indicating the active operation.

In step 203, the memory 120 may check whether a signal DQ <0> received with the activate command has a logic high level. In this embodiment, signal DQ <0> serves as a flag signal for determining a word line to be accessed among normal word lines WL <0: N > and redundant word lines RWL <0: M >; however, separate flag signals may also be used to determine the word lines to be accessed among the normal word lines WL <0: N > and the redundant word lines RWL <0: M >.

When the signal DQ <0> has a logic low level (no in step 203), the normal decoder 125 may be activated, and then one of the normal word lines WL _0 to WL _ N may be activated by decoding the address ADD in step 205.

When signal DQ <0> has a logic high level (YES in step 203), redundancy decoder 126 may be activated, and then one of redundancy word lines RWL _0 to RWL _ M may be activated by decoding data DQ <1:13> in step 207.

Referring to fig. 2, not only the address ADD but also the DATA are transferred from the memory controller 110 to the memory 120 together with the command CMD indicating an active operation, so that one of the normal word lines WL _0 to WL _ N and the redundant word lines RWL _0 to RWL _ M can be freely accessed in an immediate manner. In addition, since additional circuits such as latches are not required to access the redundant word lines RWL _0 to RWL _ M, the entire redundant word lines RWL _0 to RWL _ M can be accessed without limitation.

Although, in the previous embodiment of the present invention, it was described that the memory controller transmits row redundancy information together with an activation command via the data pad, an alternative signal transmitted via a pad other than the data pad, which is not used in an activation operation, may not be used as the redundancy information.

Although various embodiments have been described for illustrative purposes, it will be apparent to those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the following claims.