阅读说明：本技术 计算机提高算力和降低功耗算力比的方法及系统 (Method and system for increasing computing power and reducing computing power ratio of computer ) 是由 刘建波 马伟斌 黄理洪 杨作兴 郭海丰 于 2020-04-14 设计创作，主要内容包括：本发明公开了一种具有多计算核的计算机提高算力和降低功耗算力比的方法,本发明实施例在具有多计算核的计算机中的每个芯片中,设置一个主时频单元及至少一个附属时频单元,其中,主时频单元的时钟频率、所述芯片中的由主时频单元提供时钟频率的计算核、及所述芯片中的由附属时频单元提供时钟频率的计算核是经过测试确定的,满足所述芯片中的计算核运行正常通过率大于或等于设定的通过率阈值,从而能够让所述芯片中的最大数目的计算核运行正常。这样,本发明实施例的具有多计算核的计算机就可以提高算力和降低功耗算力比。(The invention discloses a method for improving computing power and reducing power consumption computing power ratio of a computer with multiple computing cores. Thus, the computer with multiple computing cores of the embodiment of the invention can improve the computing power and reduce the power consumption computing power ratio.)

1. A method for increasing computing power and decreasing power consumption computing power ratios in a computer having multiple computing cores, the method comprising:

setting a main time-frequency unit and at least one auxiliary time-frequency unit in each chip of a computer with multiple computing cores;

the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, so that the normal passing rate of the calculation core in the chip is greater than or equal to the set passing rate threshold value.

2. The method of claim 1, wherein the determining, by testing, the clock frequency of the master time frequency unit, the computational cores in the chip that are clocked by the master time frequency unit, and the computational cores in the chip that are clocked by the slave time frequency units comprises:

A. starting a chip, wherein a main time-frequency unit in the chip provides initial clock frequency for all computing cores in the chip;

B. all the computing cores in the chip carry out operation test under the sent test excitation, whether the passing rate of the testing computing cores in the chip passing the test is larger than a set passing rate threshold value or not is judged, and if yes, the step C is executed; if not, executing the step D;

step C, increasing the clock frequency of the main time-frequency unit in the chip by a set frequency difference value, and returning to the step B to continue execution;

and D, switching the computing core which does not pass the test in the chip to an auxiliary time-frequency unit, providing a clock frequency by the auxiliary time-frequency unit by adopting the set clock frequency, and returning to the step B for execution.

3. The method of claim 2, wherein determining whether a pass rate at which a computing core under test in the chip passes the test is greater than a set pass rate threshold further comprises:

judging whether the passing rate of the test passing of the computing core in the chip is equal to a set passing rate threshold value or greater than the set passing rate threshold value and within a set range, and ending the test;

when the test is finished, the clock frequency currently provided by the main time frequency unit, the calculation core of the clock frequency currently provided by the main time frequency unit and the calculation core of the clock frequency currently provided by the auxiliary time frequency unit are respectively used as the clock frequency of the main time frequency unit, the calculation core of the clock frequency provided by the main time frequency unit and the calculation core of the clock frequency provided by the auxiliary time frequency unit in the chip.

4. The method according to any of claims 1 to 3, wherein the clock frequency provided by the subordinate time frequency unit is a predetermined value, or a difference value between the clock frequency provided by the main time frequency unit and a predetermined step difference value.

5. The method of claim 4, wherein at least one of the attached time-frequency units provides a clock frequency for different compute cores, respectively, and wherein the clock frequencies provided by the different attached time-frequency units are different.

6. A method according to any one of claims 1 to 3, wherein the testing is performed at initialization of the computer having multiple computing cores.

7. A system for improving computing power and reducing computing power of a virtual currency miner, the system comprising at least one chip in a computer having multiple computing cores, wherein each chip comprises: a main time-frequency unit, an auxiliary time-frequency unit and a plurality of computation cores, wherein,

the main time frequency unit is used for providing clock frequency for part of computing cores in the system;

an adjunct time-frequency unit to provide a clock frequency for another portion of the computational cores in the system;

the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, so that the normal passing rate of the calculation core in the chip is greater than or equal to the set passing rate threshold value.

8. The system of claim 7, wherein the clock frequency provided by the subordinate time frequency unit is a predetermined value or a difference between the clock frequency provided by the master time frequency unit and a predetermined step difference.

9. The system of claim 7 or 8, wherein there are multiple attached time frequency units, each providing a clock frequency for a different compute core, the clock frequencies provided by the different attached time frequency units being different.

10. The system of claim 7, wherein the testing is performed upon initialization of the computer with multiple compute cores.

Technical Field

The invention relates to the technical field of computers, in particular to a method and a system for improving computing power and reducing power consumption computing power ratio of a computer with multiple computing cores.

Background

With the progress of computer technology, various computers with superior computing power have appeared, and such computers can be applied to various application fields requiring strong computing power, such as those for earning virtual money as a virtual money miner. Generally, such a computer includes a plurality of chips each having a plurality of computing cores therein, and the plurality of computing cores perform computation of a large data amount in parallel, and when it is used as a virtual money miner, it is realized that more virtual money is acquired in a shorter time, and power consumption is large. When the computer is used as a virtual currency mining machine, mining software is downloaded, a mining algorithm in the mining software is operated in a plurality of computing cores in parallel, communication is carried out with a remote mining server, and corresponding virtual currency can be obtained after communication matching.

In order to achieve the highest computational power and the lowest power consumption computational power ratio when performing calculations, a plurality of computational cores operating in parallel are arranged in each chip and perform calculations in parallel, however, in consideration of the stability of the overall operation of the computer and the area and power consumption occupied by time-frequency units such as a phase-locked loop module (P LL) or a frequency-locked loop module (F LL) providing clock frequencies to the respective computational cores, all the computational cores in a chip are simultaneously provided with clock frequencies by one time-frequency unit arranged in the chip, i.e., each chip in the computer has only one time-frequency unit for providing a uniform clock frequency to all the computational cores in the chip.

Disclosure of Invention

In view of the above, embodiments of the present invention provide a method for increasing computing power and decreasing power consumption computing power ratio of a computer having multiple computing cores, which can increase computing power and decrease power consumption computing power ratio of a computer having multiple computing cores.

Embodiments of the present invention also provide a system for increasing computing power and decreasing power consumption computing power ratio of a computer having multiple computing cores, which can increase computing power and decrease power consumption computing power ratio of a computer having multiple computing cores.

The embodiment of the invention is realized as follows:

a method for increasing computing power and decreasing power consumption computing power ratios for a computer having multiple computing cores, the method comprising:

setting a main time-frequency unit and at least one auxiliary time-frequency unit in each chip of a computer with multiple computing cores;

the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, so that the normal passing rate of the calculation core in the chip is greater than or equal to the set passing rate threshold value.

Optionally, the testing and determining the clock frequency of the main time-frequency unit, the computation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the computation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, includes:

A. starting a chip, wherein a main time-frequency unit in the chip provides initial clock frequency for all computing cores in the chip;

B. all the computing cores in the chip carry out operation test under the sent test excitation, whether the passing rate of the passing test of the computing cores in the chip is larger than or equal to a set passing rate threshold value or not is judged, and if yes, the step C is executed; if not, executing the step D;

step C, increasing the clock frequency of the main time-frequency unit in the chip by a set frequency difference value, and returning to the step B to continue execution;

and D, switching the computing core which does not pass the test in the chip to an auxiliary time-frequency unit, providing a clock frequency by the auxiliary time-frequency unit by adopting the set clock frequency, and returning to the step B for execution.

Optionally, determining whether a passing rate of the test-passing computational core in the chip is greater than or equal to a set passing rate threshold further includes:

judging whether the passing rate of the test passing of the computing core in the chip is equal to a set passing rate threshold value or greater than the set passing rate threshold value and within a set range, and ending the test;

when the test is finished, the clock frequency currently provided by the main time frequency unit, the calculation core of the clock frequency currently provided by the main time frequency unit and the calculation core of the clock frequency currently provided by the auxiliary time frequency unit are respectively used as the clock frequency of the main time frequency unit, the calculation core of the clock frequency provided by the main time frequency unit and the calculation core of the clock frequency provided by the auxiliary time frequency unit in the chip.

Optionally, the clock frequency provided by the auxiliary time frequency unit adopts a preset value, or adopts a difference value between the clock frequency provided by the main time frequency unit and a preset step difference value.

Optionally, the plurality of attached time-frequency units respectively provide clock frequencies for different computation cores, and the clock frequencies provided by the different attached time-frequency units are different.

Optionally, the testing is performed at initialization of the computer with multiple computing cores.

A system for improving computing power and reducing power consumption computing power of a virtual currency miner, the system comprising a plurality of chips in a computer having multiple computing cores, wherein each chip comprises: a main time-frequency unit, an auxiliary time-frequency unit and a plurality of computation cores, wherein,

the main time frequency unit is used for providing clock frequency for part of computing cores in the system;

an adjunct time-frequency unit to provide a clock frequency for another portion of the computational cores in the system;

the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, so that the normal passing rate of the calculation core in the chip is greater than or equal to the set passing rate threshold value.

Optionally, the clock frequency provided by the auxiliary time frequency unit adopts a preset value, or adopts a difference value between the clock frequency provided by the main time frequency unit and a preset step difference value.

Optionally, the plurality of attached time-frequency units respectively provide clock frequencies for different computation cores, and the clock frequencies provided by the different attached time-frequency units are different.

Optionally, the testing is performed at initialization of the computer with multiple computing cores.

As can be seen from the above, in the embodiment of the present invention, a main time-frequency unit and at least one auxiliary time-frequency unit are disposed in each chip in a computer having multiple computation cores, where a clock frequency of the main time-frequency unit, a computation core in the chip, which is provided with the clock frequency by the main time-frequency unit, and a computation core in the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, and it is satisfied that a normal pass rate of the computation cores in the chips is greater than or equal to a set pass rate threshold, so that the maximum number of computation cores in the chips can operate normally. Thus, the computer with multiple computing cores of the embodiment of the invention can improve the computing power and reduce the power consumption computing power ratio.

Drawings

FIG. 1 is a flow chart of a method for increasing computing power and decreasing power consumption computing power ratio for a computer having multiple computing cores, according to an embodiment of the present invention;

FIG. 2 is a flow chart of a method of a test process provided by an embodiment of the present invention;

fig. 3 is a schematic diagram of a system architecture of a computer with multiple computing cores for increasing computing power and reducing power consumption computing power ratio according to an embodiment of the present invention.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is further described in detail below with reference to the accompanying drawings and examples.

In order to enable a computer with multiple computing cores, such as a virtual currency mining machine, to improve computing power and reduce power consumption computing power, a main time-frequency unit and at least one auxiliary time-frequency unit are arranged in each chip of the computer with the multiple computing cores, wherein the clock frequency of the main time-frequency unit, the computing cores, provided with the clock frequency by the main time-frequency unit, in the chips and the computing cores, provided with the clock frequency by the auxiliary time-frequency units, in the chips are determined through tests, and the normal running passing rate of the computing cores in the chips is larger than or equal to a set passing rate threshold value, so that the maximum number of computing cores in the chips can run normally.

Furthermore, the clock frequency provided by the subsidiary time frequency unit is a preset value, or is determined according to the clock frequency provided by the main time frequency unit and a preset step difference value.

In the embodiment of the present invention, the main time frequency unit and the auxiliary time frequency unit may be P LL or F LL, as long as the clock frequency is provided for the computation core.

Fig. 1 is a flowchart of a method for increasing computing power and decreasing power consumption computing power ratio of a computer with multiple computing cores according to an embodiment of the present invention, which includes the following specific steps:

step 101, setting a main time-frequency unit and at least one auxiliary time-frequency unit in each chip of a computer with multiple computing cores;

and step 102, determining the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, through tests, so that the normal operating passing rate of the calculation core in the chip is greater than or equal to the set passing rate threshold value.

In the method, the clock frequency provided by the subsidiary time frequency unit adopts a preset value, or is determined according to the clock frequency provided by the main time frequency unit and a preset step difference value, specifically the difference value between the clock frequency provided by the main time frequency unit and the preset step difference value.

In the method, the test process is performed when the computer with multiple computing cores is initialized.

In the method, at least one auxiliary time frequency unit is provided and respectively provides clock frequency for different computing cores; the clock frequency provided by each auxiliary time-frequency unit adopts a preset value, or is determined according to the clock frequency provided by the main time-frequency unit and a preset step difference value, and the clock frequencies provided by different auxiliary time-frequency units can be different.

In the method, as shown in fig. 2, fig. 2 is a flowchart of a method of a test process provided in an embodiment of the present invention, and the method includes the following specific steps:

step 201, after a chip is started, a main time-frequency unit in the chip provides an initial clock frequency for all computation cores in the chip;

in this step, the initial clock frequency provided by the main time-frequency unit in the chip is a lower frequency value, specifically, in order to warm up and keep running of the computer with multiple computation cores stable, the main time-frequency unit will gradually increase from the low clock frequency to the high clock frequency, and the initial lower frequency may be an artificially set empirical value, or may be set as the clock frequency required by the computation core with the worst computation power in the chip, or may be set as another clock frequency, but is not necessarily the clock frequency required by the computation core with the worst computation power in the chip;

in this step, the clock frequency provided by the attached time-frequency unit may be determined by the clock frequency required by the computation core with the worst computation power in the chip, and the clock frequency required by the computation core with the worst computation power in the chip is determined based on the empirical value of the clock frequency required by the computation core under the same process conditions;

step 202, testing all the computing cores in the chip under the sent test excitation;

in the step, test excitation is sent to a computing core in each chip by a central processing unit of the computer, the computing core runs based on the test excitation after receiving the test excitation, and a test excitation response is fed back, so that the central processing unit of the computer judges whether the computing core runs normally according to the excitation response, if so, the computing core passes the test, and if not, the computing core does not pass the test;

step 203, judging whether the test passing rate of the computing core for testing in the chip is greater than or equal to a set passing rate threshold value, if so, executing step 204; if not, go to step 205;

step 204, increasing the clock frequency of the main time-frequency unit in the chip by a set frequency difference value, and returning to the step 202 to continue execution;

in this step, the set frequency difference value may be a preset empirical value, which is not particularly limited herein;

step 205, switching the computation core which does not pass the operation test in the chip to the auxiliary time-frequency unit, providing the clock frequency for the auxiliary time-frequency unit by adopting the set clock frequency, and returning to the step 202 for execution;

in this step, the clock frequency of the attached time-frequency unit may be a fixed value, where the fixed value is an empirical value of the slowest clock frequency of the chip under the process condition, that is, a short-plate value of a short-plate effect, for example, a clock frequency required by a computational core with the worst computational power in the chip; or a variation value, which is determined according to the clock frequency provided by the main time-frequency unit and a preset step difference value, that is, a difference value between the clock frequency provided by the main time-frequency unit and the preset step difference value, where the step difference value may be determined by combining the working clock difference value ranges and the empirical values of different computation cores in the chip under the process condition.

In this step, if there are multiple attached time-frequency units, the computation cores that have not passed the operation test in the chip may also be switched to different attached time-frequency units, and the different attached time-frequency units provide clock frequencies for the computation cores switched to themselves. Here, switching the computation cores that do not pass the operation test in the chip to different attached time-frequency units may be performed according to a set switching manner, where the set switching manner is multiple, for example: random handover, polling handover, etc.

Although the process described in fig. 2 allows the computation cores in the chip to determine the time-frequency units (which may be the main time-frequency units or the auxiliary time-frequency units) that provide the clock frequencies for the computation cores after multiple switching, the process described in fig. 2 is performed during testing, specifically during initialization of the computer, so that the clock frequency switching of the computation cores is not performed any more in the subsequent operating state of the computer, and the operating stability of each chip in the computer is not affected.

In the process shown in fig. 2, when the step 203 determines whether the passing rate of the computing core performing the test in the chip passing the test is greater than or equal to the set passing rate threshold, the method further includes:

when the passing rate of the test passing of the computing core in the chip is judged to be equal to the set passing rate threshold value or larger than the set passing rate threshold value and is in a set range, ending the test process, wherein the set range is usually a set smaller range;

when the test process is finished, determining the specific number of the clock frequencies provided by the main time-frequency unit and providing the main clock frequencies for the computing cores in the chip; and the auxiliary time frequency unit provides auxiliary clock frequency for which computing cores in the chip.

Where the set range is an empirical value that does not exceed the pass rate threshold much, such as the difference between the two is only a single digit level. That is, the setting range is actually a revised range value of the pass rate threshold, so as to ensure that the entire test is finished only when the setting range value is larger than the revised range value of the pass rate threshold. If the setting range is set to be large and exceeds the revision range value, a problem exists, which indicates that each computing core of the chip does not finally determine the most appropriate clock frequency in the whole testing process, and the process of fig. 2 still needs to be executed continuously until the most appropriate clock frequency is determined for each computing core in the chip.

The following describes a test method using an embodiment of the present invention, taking a computer with multiple computing cores as an example of a virtual currency mining machine.

In the first step, a chip in the virtual currency miner is started while 2 or more time-frequency cells of the chip are turned on. The number of the starting time frequency units depends on the number of the time frequency units in the chip, 1 time frequency unit with the best performance is set as a main time frequency unit, the time frequency unit provides a lower initial clock frequency, and the initial clock frequency is gradually increased to a high clock frequency to test the calculation core in the chip; meanwhile, the other time frequency units are set as auxiliary time frequency units, and fixed clock frequency is set, wherein the fixed clock frequency value is an empirical value of the slowest frequency of the chip under the process condition, namely a short plate value of the short plate effect. According to the number of the available attached time frequency units, the clock frequency value set by steps is relatively low, that is, the fixed clock frequency set by different attached time frequency units can be different.

In this step, according to the process conditions set by the chip, the performance of each time-frequency unit is known, and the video unit with the best performance is taken as the main time-frequency unit.

And secondly, providing a clock frequency from low to high for each computing core in the chip by adopting a main time-frequency unit, starting the clock frequency from low, increasing a set frequency difference value every time, sending test excitation to enable each computing core in the chip to carry out operation test, checking whether all the computing cores pass the test, continuously increasing the clock frequency when the passing rate meets the requirement, and carrying out further analysis when the passing rate does not meet the requirement.

And step three, when the passing rate does not meet the requirement, namely a part of the computation cores with large process deviation cannot normally operate at the current clock frequency, the operation test failure rate of the computation cores in the chip is increased, the clock frequency of the main time-frequency unit cannot be increased any more, otherwise, many computation cores cannot normally operate, and the computation power is lost. At this time, the part of the computation cores can be switched to the previously set auxiliary time frequency unit which provides a relatively low clock frequency, and the other computation cores continue to provide the clock frequency by the main time frequency unit, and meanwhile, the main time frequency unit continues to increase the frequency.

And step four, after running test, the calculation cores switched to the auxiliary time-frequency unit can successfully pass the test, and the frequency of the auxiliary time-frequency unit is set previously and cannot change, so that the calculation cores can work stably. Therefore, the overall test passing rate is improved, the main time-frequency unit keeps continuously increasing the clock frequency, when a batch of computing cores fail to test, the third step and the fourth step are continuously repeated, if other auxiliary time-frequency units are not used, for example, the provided clock frequency is faster than the slowest auxiliary time-frequency unit, a new batch of computing cores which fail to test can be switched to a new auxiliary time-frequency unit, and more computing power can be improved.

In this way, in the embodiment of the present invention, by switching a small number of computation cores with weak computation power in the chip to the auxiliary time-frequency unit providing a relatively low clock frequency, most of the computation cores in the chip have the highest computation power that they can have, which effectively improves the computation power and reduces the power consumption computation power ratio.

Fig. 3 is a schematic structural diagram of a system for increasing computing power and decreasing power consumption computing power ratio of a computer with multiple computing cores according to an embodiment of the present invention, where the system includes at least one chip in the computer with multiple computing cores, where each chip includes: a main time-frequency unit, an auxiliary time-frequency unit and a plurality of computation cores, wherein,

the main time frequency unit is used for providing clock frequency for part of computing cores in the system;

an adjunct time-frequency unit to provide a clock frequency for another portion of the computational cores in the system;

the clock frequency of the main time-frequency unit, the calculation core of the chip, which is provided with the clock frequency by the main time-frequency unit, and the calculation core of the chip, which is provided with the clock frequency by the auxiliary time-frequency unit, are determined through tests, so that the normal running passing rate of the calculation core in the chip is more than or equal to the set passing rate threshold value.

In the system, the system further comprises a central processing unit for controlling the main time-frequency unit to set the clock frequency and switching the main time-frequency unit and the auxiliary time-frequency unit for the calculation core.

In the system, the clock frequency provided by the subsidiary time frequency unit adopts a preset value, or is determined according to the clock frequency provided by the main time frequency unit and a preset step difference value, specifically, the difference value between the clock frequency provided by the main time frequency unit and the preset step difference value.

In this system, the test procedure is performed by the system at initialization.

In the system, at least one auxiliary time frequency unit is provided for respectively providing clock frequency for different computing cores; the clock frequency provided by each auxiliary time-frequency unit adopts a preset value, or is determined according to the clock frequency provided by the main time-frequency unit and a preset step difference value, and the clock frequencies provided by different auxiliary time-frequency units are different.

If the time-frequency unit in the chip is frequently and dynamically switched under the working state of a computer with multiple computing cores, such as a virtual currency mining machine, the voltage of the chip is unstable, so that the stability of the computer with multiple computing cores is influenced, the embodiment of the invention adopts a test method, in the chip initialization stage, the clock frequency of a main time-frequency unit, the computing core in the chip, which is provided with the clock frequency by the main time-frequency unit, and the computing core in the chip, which is provided with the clock frequency by an auxiliary time-frequency unit, are determined, the time-frequency unit in the chip does not need to be frequently switched in the actual operation, so that the working stability of the computer with multiple computing cores is maintained, meanwhile, the computing core with poor computing power can be correctly switched to the corresponding multi-gear auxiliary time-frequency unit, the clock frequency is provided by the multi-gear auxiliary time-frequency unit, and the computing power of the computing core in the chip does not need to be improved by improving the chip voltage, such that computers with multiple computing cores, such as virtual currency miners, have higher computing power and lower power consumption computing power ratios.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the scope of the present invention.