阅读说明：本技术 一种电力芯片内时钟信号的自动校准装置及其方法 (Automatic calibration device and method for clock signal in power chip ) 是由 匡晓云 黄凯 郑文杰 李波 黄开天 蒋小文 郑丹丹 谭慧娟 杨祎巍 于 2021-06-24 设计创作，主要内容包括：本发明公开了一种电力芯片内时钟信号的自动校准装置及其方法,所述装置包括中测机台、待校准晶振、振荡器、测试控制模块、校准模块、参数调整模块；所述中测机台的信号输出端与待校准晶振连接,所述待校准晶振的第一信号输出端与振荡器的输入端连接,所述振荡器的输出端与所述测试控制模块的输入端连接,所述测试控制模块与校准模块连接,所述校准模块的输出端与所述参数调整模块的输入端连接,所述参数调整模块的输出端与所述中测机台的信号输入端连接。本发明实施例通过测试控制模块、校准模块和参数调整模块的配合,能够实现对电力芯片内时钟信号的自动校准；并通过对电力芯片内时钟信号的频率和相位进行双重调整,进一步提高校准的准确性。(The invention discloses an automatic calibration device and method for clock signals in a power chip, wherein the device comprises a middle test machine, a crystal oscillator to be calibrated, an oscillator, a test control module, a calibration module and a parameter adjustment module; the signal output end of the middle test machine platform is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjusting module, and the output end of the parameter adjusting module is connected with the signal input end of the middle test machine platform. According to the embodiment of the invention, through the matching of the test control module, the calibration module and the parameter adjusting module, the automatic calibration of the clock signal in the power chip can be realized; and the calibration accuracy is further improved by double adjustment of the frequency and the phase of the clock signal in the power chip.)

1. An automatic calibration device for clock signals in a power chip is characterized by comprising a middle test machine, a crystal oscillator to be calibrated, an oscillator, a test control module, a calibration module and a parameter adjustment module; the signal output end of the middle test machine platform is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjustment module, and the output end of the parameter adjustment module is connected with the signal input end of the middle test machine platform.

2. The apparatus according to claim 1, wherein the crystal oscillator to be calibrated is further connected to a processing module and a storage module, an input terminal of the processing module is connected to the second signal output terminal of the crystal oscillator to be calibrated, and an input terminal of the storage module is connected to the second signal output terminal of the crystal oscillator to be calibrated.

3. The apparatus according to claim 2, wherein the test control module is further connected to a comparison module and a signal transceiver module, an input terminal of the comparison module is connected to an output terminal of the test control module, and an input terminal of the signal transceiver module is connected to an output terminal of the test control module.

4. The apparatus for automatically calibrating clock signal in power chip according to claim 3, wherein said comparison module is further connected to a data storage, said data storage is connected to said signal transceiver module, and a time module is disposed inside said data storage.

5. The apparatus for automatically calibrating a clock signal on a power chip according to claim 4, wherein said calibration module further comprises a receiving module and an oscillating module, wherein an input terminal of said receiving module is connected to an output terminal of said calibration module, and an input terminal of said oscillating module is connected to an output terminal of said calibration module.

6. The apparatus of claim 5, wherein the adjustment frequency of the oscillation module is less than the adjustment frequency of the oscillator.

7. A method for automatically calibrating clock signals in a power chip, which is applied to the device for automatically calibrating clock signals in the power chip according to any one of claims 1 to 6, and comprises the following steps:

receiving a test instruction sent by a middle test machine;

the method comprises the steps that a crystal oscillator to be calibrated is subjected to self calibration, the frequency of a clock signal in a chip is the same as that of the crystal oscillator to be calibrated, and the clock signal in the chip is sent to a test control module;

testing the frequency of the clock signal in the chip through the test control module, and sending the clock signal passing the test to the calibration module;

calibrating the phase of the clock signal passing the test through the calibration module, and sending the calibrated clock signal to the parameter adjustment module;

adjusting parameters influencing the phase of the clock signal through the parameter adjusting module, and sending the adjusted clock signal to a middle test machine;

and adjusting the crystal oscillator to be calibrated according to the adjusted clock signal, thus completing the automatic calibration of the clock signal in the chip.

8. The method according to claim 7, wherein the self-calibration of the on-chip clock signal is performed on the to-be-calibrated crystal oscillator, so that the frequency of the on-chip clock signal is the same as that of the to-be-calibrated crystal oscillator, and the on-chip clock signal is sent to the test control module, further comprising:

and if the frequency of the crystal oscillator to be calibrated and the frequency of the clock signal in the chip are deviated, carrying out oscillation correction on the frequency of the clock signal in the chip through an oscillator.

9. The method for automatically calibrating a clock signal on a power chip according to claim 8, wherein the testing the frequency of the clock signal on the power chip by the test control module and sending the clock signal passing the testing to the calibration module further comprises:

comparing the clock signal in the chip with the correct time of the time module;

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is adjusted through an oscillation module in the calibration module;

and if the deviation does not exist between the clock signal in the chip and the correct time of the time module, sending the clock signal in the chip to a calibration module.

10. The method according to claim 9, wherein if the on-chip clock signal deviates from the correct time of the time module, the on-chip clock signal is adjusted by an oscillation module in the calibration module, specifically:

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is sent to a receiving module in the calibration module through a signal receiving and sending module;

and after the clock signal in the chip is received, adjusting the clock signal in the chip through an oscillation module in the calibration module.

Technical Field

The invention relates to the technical field of clock calibration, in particular to an automatic calibration device and method for a clock signal in a power chip.

Background

In applications where the chip is oriented towards power systems, there are high demands on the control accuracy of the chip due to the high complexity of the power application scheme. A clock is a common type of timer used in life, by which people record time. The clock inside the sequential circuit plays a role in timing the whole circuit, so that a high-precision power chip internal clock is needed as a tool for timing the circuit. However, after the general clock is used for a long time, the time is deviated due to the influence of external factors, and the normal operation of the chip is influenced.

Disclosure of Invention

The technical problem to be solved by the embodiments of the present invention is to provide an apparatus and a method for automatically calibrating a clock signal in a power chip, which can automatically calibrate the clock signal of the power chip and further improve the accuracy of calibration.

In order to achieve the above object, an embodiment of the present invention provides an automatic calibration apparatus for a clock signal in an electrical power chip, including a middle test machine, a crystal oscillator to be calibrated, an oscillator, a test control module, a calibration module, and a parameter adjustment module; the signal output end of the middle test machine platform is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjustment module, and the output end of the parameter adjustment module is connected with the signal input end of the middle test machine platform.

As an improvement of the above scheme, the crystal oscillator to be calibrated is further connected to a processing module and a storage module, an input end of the processing module is connected to the second signal output end of the crystal oscillator to be calibrated, and an input end of the storage module is connected to the second signal output end of the crystal oscillator to be calibrated.

As an improvement of the above scheme, the test control module is further connected with a comparison module and a signal transceiver module, an input end of the comparison module is connected with an output end of the test control module, and an input end of the signal transceiver module is connected with an output end of the test control module.

As an improvement of the above scheme, the comparison module is further connected with a data storage, the data storage is connected with the signal transceiver module, and a time module is arranged inside the data storage.

As an improvement of the above scheme, the calibration module is further connected with a receiving module and an oscillating module, an input end of the receiving module is connected with an output end of the calibration module, and an input end of the oscillating module is connected with an output end of the calibration module.

As an improvement of the above scheme, the adjustment frequency of the oscillation module is smaller than the adjustment frequency of the oscillator. Further, in the above-mentioned case,

the embodiment of the invention also provides an automatic calibration method of a clock signal in the power chip, which is applied to any one of the automatic calibration devices of the clock signal in the power chip, and the method comprises the following steps:

receiving a test instruction sent by a middle test machine;

the method comprises the steps that a crystal oscillator to be calibrated is subjected to self calibration, the frequency of a clock signal in a chip is the same as that of the crystal oscillator to be calibrated, and the clock signal in the chip is sent to a test control module;

testing the frequency of the clock signal in the chip through the test control module, and sending the clock signal passing the test to the calibration module;

calibrating the phase of the clock signal passing the test through the calibration module, and sending the calibrated clock signal to the parameter adjustment module;

adjusting parameters influencing the phase of the clock signal through the parameter adjusting module, and sending the adjusted clock signal to a middle test machine;

and adjusting the crystal oscillator to be calibrated according to the adjusted clock signal, thus completing the automatic calibration of the clock signal in the chip.

As an improvement of the above scheme, the self-calibrating the crystal oscillator to be calibrated to make the frequency of the clock signal in the chip the same as that of the crystal oscillator to be calibrated, and sending the clock signal in the chip to the test control module further includes:

and if the frequency of the crystal oscillator to be calibrated and the frequency of the clock signal in the chip are deviated, carrying out oscillation correction on the frequency of the clock signal in the chip through an oscillator.

As an improvement of the above scheme, the testing the frequency of the clock signal in the chip by the test control module, and sending the clock signal passing the test to the calibration module, further includes:

comparing the clock signal in the chip with the correct time of the time module;

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is adjusted through an oscillation module in the calibration module;

and if the deviation does not exist between the clock signal in the chip and the correct time of the time module, sending the clock signal in the chip to a calibration module.

As an improvement of the above scheme, if there is a deviation between the on-chip clock signal and the correct time of the time module, the on-chip clock signal is adjusted by an oscillation module in the calibration module, specifically:

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is sent to a receiving module in the calibration module through a signal receiving and sending module;

and after the clock signal in the chip is received, adjusting the clock signal in the chip through an oscillation module in the calibration module.

Compared with the prior art, the automatic calibration device and method for the clock signal in the power chip provided by the embodiment of the invention have the beneficial effects that: the automatic calibration device comprises a middle test machine platform, a crystal oscillator to be calibrated, an oscillator, a test control module, a calibration module and a parameter adjustment module; the signal output end of the middle test machine platform is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjustment module, and the output end of the parameter adjustment module is connected with the signal input end of the middle test machine platform. According to the embodiment of the invention, through the matching of the test control module, the calibration module and the parameter adjusting module, the automatic calibration of the clock signal in the power chip can be realized; and the calibration accuracy is further improved by double adjustment of the frequency and the phase of the clock signal in the power chip.

Drawings

FIG. 1 is a schematic structural diagram of an embodiment of an apparatus for automatically calibrating a clock signal in a power chip according to the present invention;

fig. 2 is a schematic flowchart of a preferred embodiment of a method for automatically calibrating a clock signal in a power chip according to the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1, fig. 1 is a schematic structural diagram of an automatic calibration apparatus for clock signals in a power chip according to a preferred embodiment of the present invention. The automatic calibration device for the clock signal in the power chip comprises a middle test machine table 1, a crystal oscillator 2 to be calibrated, an oscillator 4, a test control module 3, a calibration module 5 and a parameter adjusting module 6; the signal output end of the middle test machine table 1 is connected with the crystal oscillator 2 to be calibrated, the first signal output end of the crystal oscillator 2 to be calibrated is connected with the input end of the oscillator 4, the output end of the oscillator 4 is connected with the input end of the test control module 3, the test control module 3 is connected with the calibration module 5, the output end of the calibration module 5 is connected with the input end of the parameter adjustment module 6, and the output end of the parameter adjustment module 6 is connected with the signal input end of the middle test machine table 1.

Specifically, the signal output end of the intermediate test machine is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjusting module, and the output end of the parameter adjusting module is connected with the signal input end of the intermediate test machine. The calibration module realizes signal intercommunication with the test control module through radio frequency.

In another preferred embodiment, the crystal oscillator 2 to be calibrated is further connected to a processing module 7 and a storage module 8, an input end of the processing module 7 is connected to the second signal output end of the crystal oscillator 2 to be calibrated, and an input end of the storage module 8 is connected to the second signal output end of the crystal oscillator 2 to be calibrated.

Specifically, the crystal oscillator to be calibrated is further connected with a processing module and a storage module, the input end of the processing module is connected with the second signal output end of the crystal oscillator to be calibrated, and the processing module is used for processing and then sending out a clock of the crystal oscillator to be calibrated; the input end of the storage module is connected with the second signal output end of the crystal oscillator to be calibrated, and the storage module is used for storing the clock of the crystal oscillator to be calibrated, so that the situation of sudden power failure is avoided, and data loss is caused.

In another preferred embodiment, the test control module 3 is further connected to a comparison module 9 and a signal transceiver module 11, an input end of the comparison module 9 is connected to an output end of the test control module 3, and an input end of the signal transceiver module 11 is connected to an output end of the test control module 3.

In a further preferred embodiment, the comparison module 9 is further connected with a data storage 10, the data storage 10 is connected with the signal transceiver module 10, and a time module 12 is disposed inside the data storage 10.

Specifically, the test control module is further connected with a comparison module and a signal transceiver module, the input end of the comparison module is connected with the output end of the test control module, and the input end of the signal transceiver module is connected with the output end of the test control module. The comparison module is further connected with a data storage, the data storage is connected with the signal receiving and transmitting module, and a time module is arranged inside the data storage. The data storage is in signal connection with the signal transceiving module through the ECal port. The data to be compared are stored in the data storage, the received data are compared with the data in the data storage through the action of the comparison module, new data are stored if the data are changed, and the comparison result is sent to the calibration module through the signal transceiving module.

In a further preferred embodiment, the calibration module 5 is further connected with a receiving module 13 and an oscillating module 14, an input end of the receiving module 13 is connected with an output end of the calibration module 5, and an input end of the oscillating module 14 is connected with an output end of the calibration module 3.

Preferably, the adjustment frequency of the oscillation module 14 is smaller than the adjustment frequency of the oscillator 4.

Correspondingly, the invention further provides an automatic calibration method of a clock signal in a power chip, which is applied to any one of the automatic calibration devices of the clock signal in the power chip, and the method comprises the following steps:

s1, receiving a test instruction sent by a middle test machine;

s2, self-calibrating a crystal oscillator to be calibrated to enable the frequency of a clock signal in a chip to be the same as that of the crystal oscillator to be calibrated, and sending the clock signal in the chip to a test control module;

s3, testing the frequency of the clock signal in the chip through the test control module, and sending the clock signal passing the test to the calibration module;

s4, the calibration module calibrates the phase of the clock signal passing the test, and sends the calibrated clock signal to the parameter adjustment module;

s5, adjusting parameters influencing the phase of the clock signal through the parameter adjusting module, and sending the adjusted clock signal to a middle test machine;

and S6, adjusting the crystal oscillator to be calibrated according to the adjusted clock signal, and completing automatic calibration of the clock signal in the chip.

In another preferred embodiment, the S2, self-calibrating the crystal oscillator to be calibrated to make the frequency of the on-chip clock signal the same as that of the crystal oscillator to be calibrated, and sending the on-chip clock signal to the test control module, further includes:

and if the frequency of the crystal oscillator to be calibrated and the frequency of the clock signal in the chip are deviated, carrying out oscillation correction on the frequency of the clock signal in the chip through an oscillator.

In a further preferred embodiment, the S3, testing, by the test control module, the frequency of the on-chip clock signal, and sending the clock signal passing the test to the calibration module, further includes:

comparing the clock signal in the chip with the correct time of the time module;

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is adjusted through an oscillation module in the calibration module;

and if the deviation does not exist between the clock signal in the chip and the correct time of the time module, sending the clock signal in the chip to a calibration module.

As a preferred scheme, if there is a deviation between the on-chip clock signal and the correct time of the time module, the on-chip clock signal is adjusted by an oscillation module in the calibration module, specifically:

if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is sent to a receiving module in the calibration module through a signal receiving and sending module;

and after the clock signal in the chip is received, adjusting the clock signal in the chip through an oscillation module in the calibration module.

Specifically, the intermediate test machine station sends a test instruction after receiving a signal sent from the outside, self-calibrates the crystal oscillator to be calibrated to enable the frequency of the clock signal in the chip to be the same as that of the crystal oscillator to be calibrated, and if the frequency of the crystal oscillator to be calibrated and the frequency of the clock signal in the chip deviate, the oscillator performs oscillation correction on the frequency of the clock signal in the chip and sends the clock signal in the chip to the test control module. And testing the frequency of the clock signal in the chip through the test control module, and sending the clock signal passing the test to the calibration module. Comparing the clock signal in the chip with the correct time of the time module; if the clock signal in the chip is deviated from the correct time of the time module, the clock signal in the chip is sent to a receiving module in the calibration module through a signal receiving and sending module; after the clock signal in the chip is received, the clock signal in the chip is adjusted through an oscillation module in the calibration module; and if the deviation does not exist between the clock signal in the chip and the correct time of the time module, sending the clock signal in the chip to a calibration module. And calibrating the phase of the clock signal passing the test through the calibration module, and sending the calibrated clock signal to the parameter adjustment module. And adjusting parameters influencing the phase of the clock signal through the parameter adjusting module, and sending the adjusted clock signal to the middle test machine. And adjusting the crystal oscillator to be calibrated according to the adjusted clock signal, thus completing the automatic calibration of the clock signal in the chip.

The embodiment of the invention provides an automatic calibration device and a method for a clock signal in an electric power chip, wherein the automatic calibration device comprises a middle test machine, a crystal oscillator to be calibrated, an oscillator, a test control module, a calibration module and a parameter adjustment module; the signal output end of the middle test machine platform is connected with the crystal oscillator to be calibrated, the first signal output end of the crystal oscillator to be calibrated is connected with the input end of the oscillator, the output end of the oscillator is connected with the input end of the test control module, the test control module is connected with the calibration module, the output end of the calibration module is connected with the input end of the parameter adjustment module, and the output end of the parameter adjustment module is connected with the signal input end of the middle test machine platform. According to the embodiment of the invention, through the matching of the test control module, the calibration module and the parameter adjusting module, the automatic calibration of the clock signal in the power chip can be realized; and the calibration accuracy is further improved by double adjustment of the frequency and the phase of the clock signal in the power chip.

It should be noted that the above-described system embodiments are merely illustrative, where the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. In addition, in the drawings of the embodiment of the system provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, and may be specifically implemented as one or more communication buses or signal lines. One of ordinary skill in the art can understand and implement it without inventive effort.

While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention.