Device and method for measuring bending moments at a mechanical element

文档序号:1539439 发布日期:2020-02-14 浏览:33次 中文

阅读说明:本技术 用于测量在机械元件处的弯矩的装置和方法 (Device and method for measuring bending moments at a mechanical element ) 是由 斯特凡·诺伊舍费尔-鲁贝 于 2018-05-17 设计创作,主要内容包括:本发明涉及一种用于利用逆磁致伸缩效应来测量在沿轴线(03)延伸的机械元件(01)处的弯矩(M<Sub>b</Sub>)的装置。机械元件(01)具有空腔(07)和至少一个在环周上围绕轴线(03)延伸的、用于磁化的磁化区域(04)。所述装置还包括至少一个设置在空腔(07)中的磁场传感器(08),所述磁场传感器构成用于测量通过磁化和通过弯矩(M<Sub>b</Sub>)引起的磁场的至少一个单个方向分量(09)。根据本发明,磁场传感器(08)与垂直相交于轴线(03)的且平行于方向分量(09)定向的直线间隔开地设置。磁场传感器(08)也同垂直相交于轴线(03)且垂直于方向分量(09)定向的直线间隔开地设置。本发明还涉及一种用于借助于根据本发明的装置来测量弯矩(M<Sub>b</Sub>)的方法。(The invention relates to a method for measuring a bending moment (M) at a mechanical element (01) extending along an axis (03) using the inverse magnetostrictive effect b ) The apparatus of (1). The mechanical element (01) has a cavity (07) and at least one magnetization region (04) extending circumferentially around the axis (03) for magnetization. The device also comprises at least one magnetic field sensor (08) arranged in the cavity (07), which is designed to measure the passing magnetization and the passing bending moment (M) b ) At least one single directional component (09) of the induced magnetic field. According to the invention, the magnetic field sensor (08) is arranged at a distance from a straight line which intersects the axis (03) perpendicularly and is oriented parallel to the direction component (09). Magnetic field transmissionThe sensor (08) is also arranged at a distance from a straight line which intersects the axis (03) perpendicularly and is oriented perpendicularly to the direction component (09). The invention also relates to a device for measuring a bending moment (M) by means of the device according to the invention b ) The method of (1).)

1. A device for measuring a bending moment (M) at a mechanical element (01) extending along an axis (03)b) The apparatus of (1); wherein the mechanical element (01) has a cavity (07) and at least one magnetization region (04) extending circumferentially around the axis (03) for magnetization; and it isThe device also comprises at least one magnetic field sensor (08) arranged in the cavity (07), which is designed to measure the passing magnetization and the passing bending moment (M)b) At least one individual directional component (09) of the induced magnetic field, wherein the magnetic field sensor (08) is arranged at a distance from a straight line which perpendicularly intersects the axis (03) and which is parallel to the magnetization-passing and bending moment (M)b) The direction component (09) of the induced magnetic field that is measurable by means of the magnetic field sensor (08) is oriented, and the magnetic field sensor (08) is arranged at a distance from a straight line that perpendicularly intersects the axis (03) and is perpendicular to the direction of the magnetization and bending moment (M)b) The direction component (09) of the induced magnetic field that is measurable by means of the magnetic field sensor (08) is oriented.

2. The apparatus of claim 1, wherein the first and second electrodes are disposed on opposite sides of the housing,

it is characterized in that the preparation method is characterized in that,

at least one magnetic field sensor (08) is arranged in the cavity (07) at a distance from the axis (03).

3. The apparatus of claim 1 or 2,

it is characterized in that the preparation method is characterized in that,

at least one of the magnetic field sensors (08) is arranged at an axial position in which the magnetized region (04) is formed.

4. The device according to any one of claims 1 to 3,

it is characterized in that the preparation method is characterized in that,

at least one of the directional components (09) lies in a plane perpendicular to the axis (03).

5. The device of any one of claims 1 to 4,

it is characterized in that the preparation method is characterized in that,

the device comprises exactly one magnetic field sensor (08) which is designed to measure the passing magnetization and the passing bending moment (M)b) Cause toOf the magnetic field (09).

6. The device of any one of claims 1 to 4,

it is characterized in that the preparation method is characterized in that,

the device comprises exactly one magnetic field sensor (08) which is designed to measure the passing magnetization and the passing bending moment (M)b) Exactly two directional components (09) of the magnetic field are induced, wherein the two directional components are oriented perpendicular to each other.

7. The device of any one of claims 1 to 4,

it is characterized in that the preparation method is characterized in that,

the device comprises two magnetic field sensors (08) which are each designed to measure the passage magnetization and the passage bending moment (M)b) A single directional component (09) of the induced magnetic field, wherein the directional component (09) measurable by means of one of the two magnetic field sensors (08) and the directional component (09) measurable by means of the other of the two magnetic field sensors (08) are oriented perpendicular to one another.

8. Device for measuring bending moments (M) by means of a device according to one of claims 1 to 7b) The method of (2), said method comprising the steps of:

-receiving at least one measurement signal of at least one magnetic field sensor; and is

-determining the bending moment (M) from the measurement signalb)。

9. The method of claim 8, wherein the first and second light sources are selected from the group consisting of,

it is characterized in that the preparation method is characterized in that,

the method is designed for measuring a bending moment (M) by means of a device according to claim 6b) And comprises the following steps:

-receiving a first measurement signal and a second measurement signal of a magnetic field sensor (08) for measuring two directional components (09);

-determining the bending moment (M) from the first measurement signalb) Of (M) is a first direction component (M)bx) (ii) a And is

-determining the bending moment (M) from the second measurement signalb) Of (M) is a second direction component (M)by)。

10. The method of claim 8, wherein the first and second light sources are selected from the group consisting of,

it is characterized in that the preparation method is characterized in that,

the method is designed for measuring a bending moment (M) by means of a device according to claim 7b) And comprises the following steps:

-receive a first measurement signal of a first of the two magnetic field sensors (08);

-receive a second measurement signal of a second of the two magnetic field sensors (08);

-determining the bending moment (M) from the first measurement signalb) Of (M) is a first direction component (M)bx) (ii) a And is

-determining the bending moment (M) from the second measurement signalb) Of (M) is a second direction component (M)by)。

Technical Field

The invention relates firstly to a device for measuring a bending moment at a mechanical element extending along an axis using the inverse magnetostrictive effect. The mechanical element has at least one magnetized region extending circumferentially around the axis for magnetization. The invention also relates to a method for measuring bending moments by means of the device according to the invention.

Background

WO 2011/085400a1 shows a magnetoelastic force sensor, by means of which the mechanical loading of an element can be measured. The element has a tangentially encircling magnetization and is loaded with a bending moment. There is a magnetic field sensor in the mid-plane. According to the diagram in fig. 1(b) of WO 2011/085400a1, the magnetic field sensor may be located in the element.

DE 102015202240B 3 shows a device for measuring forces and/or moments at a mechanical element extending along an axis using the inverse magnetostrictive effect. The device comprises at least three magnetic field sensors, which may also be located within the cavity of the mechanical element.

DE 69936138T 2 shows a magnetic force sensor in which a magnetized material is subjected to a bending moment, wherein the external magnetic field of the magnetized material can be determined by means of a sensor device.

DE 102014219336B 3 teaches a device and a method for measuring forces and/or moments at a mechanical element extending along an axis using the inverse magnetostrictive effect. Some embodiments of the device enable the simultaneous measurement of bending and torsion moments and transverse forces. The device comprises at least two magnetic field sensors, which may also be located within the cavity of the mechanical element.

DE 102015202239 a1 shows a device for measuring forces or moments at a mechanical element using the inverse magnetostrictive effect. The mechanical element has a cavity in which at least two magnetic field sensors are present.

US 2014/0360282 a1 teaches a magnetoelastic sensor having a wave-shaped element extending in a longitudinal direction. The wave-shaped element is subjected to a mechanical load and has an active region of magnetoelasticity, into which the mechanical load is transferred such that the active region is helically shaped. The magnetic field sensor device is arranged close to the magnetoelastic region and is designed to determine a shear stress and/or a tensile stress or a compressive stress. In particular, the sensor device comprises at least one direction-sensitive magnetic field sensor which is arranged in a predetermined spatial orientation with respect to the wave element. The magnetic field sensor is located in the cavity of the corrugated element.

Disclosure of Invention

The object of the present invention is to reduce the effort required for measuring the bending moment acting on a machine element by the inverse magnetostrictive effect.

The mentioned objects are achieved by a device according to the appended claim 1 and by a method according to the appended, side-by-side claim 8.

The device according to the invention is used for measuring bending moments at a mechanical element extending in the direction of an axis. Bending moments act on the mechanical element, whereby mechanical stresses occur and the mechanical element is usually deformed slightly. The axis preferably forms the axis of rotation of the mechanical element. The axes define a radial direction, a tangential direction or a circumferential direction and an axial direction, which are oriented perpendicularly to one another.

The bending moment has a bending moment axis, which is the axis of rotation of the bending moment. The bending moment axis is preferably arranged perpendicular to the axis of the mechanical element. The bending moment axis preferably intersects the axis of the mechanical element.

The mechanical element has a cavity such that it is hollow. The cavity preferably also extends in the direction of the axis. The axis is preferably arranged at least in sections in the cavity.

The mechanical element has at least one magnetized region extending circumferentially around the axis for magnetization formed in the mechanical element. This therefore relates to a magnetized region which surrounds an axis, that is to say a circumferential magnetized region, wherein the axis itself preferably does not form part of the magnetized region. The magnetized regions have a tangential orientation with respect to a surface of the mechanical element extending around the axis. The magnetized regions preferably have only a tangential orientation with respect to the surface of the mechanical element extending around the axis. The magnetized regions preferably extend along a closed path around the axis, wherein the magnetized regions are allowed to have a short gap. The magnetized regions are preferably formed in an axial section of the mechanical element. The magnetized area forms the primary sensor for determining the bending moment.

The device further comprises at least one magnetic field sensor forming a secondary sensor for determining the bending moment. The primary sensor, that is to say the at least one magnetized region, serves to convert the bending moment to be measured into a corresponding magnetic field, while the secondary sensor enables the magnetic field to be converted into an electrical signal.

The at least one magnetic field sensor is designed to measure at least one individual directional component of the magnetic field caused by the magnetization and by the bending moment. The mentioned magnetic field is generated due to the inverse magnetostrictive effect. The measurement carried out with the device according to the invention is thus based on the inverse magnetostrictive effect.

At least one magnetic field sensor is arranged in the cavity of the mechanical element. Thereby, the at least one magnetic field sensor is arranged opposite to the inner surface in the interior of the mechanical element.

According to the invention, the magnetic field sensor is arranged such that it is spaced apart from a line which intersects the coaxial line perpendicularly and is oriented in the radial direction and which is oriented parallel to the direction component of the magnetic field caused by the magnetization and by the bending moment, which can be measured by means of the magnetic field sensor. Furthermore, the magnetic field sensor is arranged such that it is spaced apart from a straight line which intersects the coaxial line perpendicularly and is oriented in the radial direction, said straight line being oriented perpendicularly to the direction component of the magnetic field caused by the magnetization and by the bending moment, which component can be measured by means of the magnetic field sensor. At least one magnetic field sensor is preferably arranged in the cavity at a distance from the axis. Since the at least one magnetic field sensor according to the invention can be arranged at any desired position in the cavity, the magnetic field sensor is preferably arranged at a position at which its mounting can be realized with little effort. This may for example be a position close to the inner surface of the mechanical element, clearly spaced from the axis.

A particular advantage of the device according to the invention is that at least one magnetic field sensor can be arranged at any position in the cavity of the mechanical element and enables the measurement of bending moments.

The at least one magnetic field sensor is preferably arranged at an axial position in which a magnetized region is also formed. The at least one magnetic field sensor is preferably arranged axially at an axial position in the middle of the magnetized region.

In a preferred embodiment of the device according to the invention, the at least one magnetic field sensor is designed to measure at least one individual directional component of the magnetic field caused by the magnetization and by the bending moment, wherein the at least one directional component lies in a plane perpendicular to the axis. The direction component is thus at least parallel to a straight line oriented in the radial direction, that is to say at least parallel to a radius from the axis.

In a preferred embodiment of the device according to the invention, the at least one magnetic field sensor is designed to measure at least one individual directional component of the magnetic field caused by the magnetization and by the bending moment, wherein the at least one directional component is oriented parallel to the bending moment axis of the bending moment.

In a particularly preferred embodiment of the device according to the invention, the at least one magnetic field sensor is designed to measure at least one individual directional component of the magnetic field caused by the magnetization and by the bending moment, wherein the at least one directional component lies in a plane perpendicular to the axis, and wherein the at least one directional component is oriented parallel to the bending moment axis of the bending moment.

In a first preferred embodiment, the device comprises exactly one magnetic field sensor, which is designed to measure exactly one individual directional component of the magnetic field caused by the magnetization and by the bending moment. The directional component lies in a plane perpendicular to the axis and is oriented parallel to the bending moment axis of the bending moment. The magnetic field sensor is disposed in the cavity spaced from the axis.

In a second preferred embodiment, the device comprises exactly one magnetic field sensor, which is designed to measure exactly two individual directional components of the magnetic field caused by the magnetization and by the bending moment, wherein the two directional components are oriented perpendicular to one another. The directional component lies in a plane perpendicular to the axis, wherein preferably one of the two directional components is oriented parallel to the bending moment axis of the bending moment. The magnetic field sensor is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented parallel to the first of the two direction components. The magnetic field sensor is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented parallel to the second of the two direction components. The magnetic field sensors are arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented perpendicularly to the first of the two direction components. The magnetic field sensor is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented perpendicularly to the second of the two direction components. The magnetic field sensor is disposed in the cavity spaced from the axis.

In a third preferred embodiment, the device comprises two of the magnetic field sensors, which are each designed to measure a single directional component of the magnetic field caused by magnetization and by bending moments, wherein the directional component that can be measured by means of the first of the two magnetic field sensors and the directional component that can be measured by means of the second of the two magnetic field sensors are oriented perpendicular to one another. The two directional components lie in a plane perpendicular to the axis, wherein preferably one of the two directional components is oriented parallel to the bending moment axis of the bending moment. The first of the two magnetic field sensors is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented parallel to the direction component which can be measured by means of the first magnetic field sensor. The first magnetic field sensor is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented perpendicularly to the direction component which can be measured by means of the first magnetic field sensor. The second of the two magnetic field sensors is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented parallel to the direction component which can be measured by means of the second magnetic field sensor. The second magnetic field sensor is arranged at a distance from a straight line which intersects the coaxial line perpendicularly and which is oriented perpendicularly to the direction component which can be measured by means of the second magnetic field sensor. The magnetic field sensor is disposed in the cavity spaced from the axis. The two magnetic field sensors preferably have the same axial position.

In a further preferred embodiment of the device according to the invention, the mechanical element has at least two magnetization regions extending circumferentially around the axis, each for magnetization. The magnetization of at least two magnetized regions extending around the axis preferably has alternating polarity, that is to say the polarities have mutually opposite directions of rotation. The magnetized regions are preferably of the same composition, except for their polarity. The mechanical element preferably also has at least one magnetically neutral section which is arranged axially between two adjacent of the magnetized regions.

The at least one magnetized region may be permanently or temporarily magnetized. In a preferred embodiment of the device according to the invention, the at least one magnetized area is permanently magnetized, so that the magnetization is formed by permanent magnetization. In an alternative preferred embodiment of the device according to the invention, the device also has at least one magnet for the magnetization of at least one magnetized region, so that the magnetization of the magnetized region is in principle temporary. The at least one magnet may be formed by at least one permanent magnet or preferably by an electromagnet.

The at least one permanently or temporarily magnetized region is preferably magnetically neutral in the state in which the mechanical element is not subjected to forces or torque loads, toward the outside of the magnetized region, so that no technically important magnetic field is measurable outside of the magnetized region.

The at least one permanently or temporarily magnetized region is preferably formed in a magnetoelastically formed section of the mechanical element. In the magnetoelastically formed section of the mechanical element, the mechanical element is preferably formed from a magnetostrictive material. At least one of the magnetized regions preferably has a high magnetostriction ratio. Preferably, the mechanical element itself is not only magnetoelastically formed, but rather only the segment. In this case, the mechanical element is made of magnetostrictive material, in particular magnetostrictive steel.

The at least one magnetized area is part of the volume of the mechanical element. The magnetized region is preferably formed in a ring shape, wherein the axis of the mechanical element also forms the central axis of the ring. Particularly preferably, the magnetized area has the shape of a hollow cylinder coaxial with the axis of the mechanical element.

The mechanical element preferably has the shape of a hollow prism or a hollow cylinder, wherein the hollow prism or the hollow cylinder is arranged coaxially to the axis. The hollow prisms or hollow columns are preferably straight. Particularly preferably, the mechanical element has the shape of a straight hollow cylinder, which is arranged coaxially to the axis. In a special embodiment, the hollow prism or hollow cylinder is conically formed.

The mechanical element is preferably formed by a hollow shaft, by a hollow shift fork, by a sleeve or by a hollow flange. The hollow shaft, hollow shift fork, sleeve or hollow flange can be designed for the application of different force and torque loads and is, for example, a sensor pedal-mounted component, a roll stabilizer or a component of a fertilizer applicator. In principle, the mechanical element can also be formed by a completely different type of hollow mechanical element.

The at least one magnetic field sensor is preferably formed by a semiconductor sensor. The at least one magnetic field sensor is alternatively preferably formed by a hall sensor, by a coil, by a foster probe or by a fluxgate magnetometer. In principle, other sensor types can also be used, as long as they are suitable for individually measuring the directional component of the magnetic field caused by the inverse magnetostrictive effect.

The method according to the invention is used for measuring a bending moment acting on a mechanical element of the device according to the invention. In one step of the method, a measurement signal of at least one magnetic field sensor is received. In a further step, the bending moment to be measured is determined from the measurement signal. The correlation can be determined in advance, for example, by the measurement sequence.

The method according to the invention is preferably used for measuring a bending moment acting on a mechanical element of one of the described preferred embodiments of the device according to the invention. Furthermore, the method according to the invention preferably also has the features set forth in connection with the device according to the invention.

The method according to the invention is preferably used for measuring bending moments acting on the mechanical element of the above-described second preferred embodiment of the device according to the invention. In one step, a first measurement signal and a second measurement signal of a magnetic field sensor for measuring two directional components of a magnetic field caused by magnetization and by bending moment are received. Furthermore, a first directional component of the bending moment is determined from the first measurement signal. Furthermore, a second directional component of the bending moment is determined from the second measurement signal. The two directional components of the bending moment are perpendicular to each other. Thereby, for example, the angular position of the bending moment can be determined.

The method according to the invention is preferably used for measuring a bending moment acting on the mechanical element of the above-described third preferred embodiment of the device according to the invention. In one step, a first measurement signal of a first of the two magnetic field sensors is received. In a further step, a second measurement signal of a second of the two magnetic field sensors is received. Furthermore, a first directional component of the bending moment is determined from the first measurement signal. Furthermore, a second directional component of the bending moment is determined from the second measurement signal. These two directional components of the bending moment are perpendicular to each other. Thereby, for example, the angular position of the bending moment can be determined.

Drawings

Further details, advantages and improvements of the invention emerge from the following description of a preferred embodiment of the invention with reference to the drawings. The figures show:

FIG. 1 shows a first preferred embodiment of the device according to the invention for uniaxial measurement of bending moments;

FIG. 2 shows a second preferred embodiment of the device according to the invention for measuring bending moments biaxially;

fig. 3 shows a third preferred embodiment of the device according to the invention for measuring bending moments biaxially.

Detailed Description

Fig. 1 to 3 each show a device according to the invention in two views. The left part of the drawing comprises a cross-sectional view of the device according to the invention, respectively, and the right part of the drawing comprises a top view of the device according to the invention, respectively.

FIG. 1 shows a first preferred embodiment of the device according to the invention for the uniaxial measurement of bending moments Mb. The device comprises firstly a mechanical element in the form of a hollow flange 01, which is fixed to the base body 02. The hollow flange 01 has the shape of a hollow cylinder. The hollow flange 01 extends along an axis 03, which also forms the central axis of the hollow cylinder of the hollow flange 01. Hollow flange 01 is particularly subjected to a bending moment MbThe resulting curvature. The hollow flange 01 consists of a magnetoelastic material, which has an inverse magnetostrictive effect.

A permanently magnetized region 04, which extends circumferentially around the axis 03, is formed in an axial section of the hollow flange 01; that is to say a permanent magnetized section having a circumferential shape with the direction 06 illustrated by the arrow. Axially on both sides of the permanently magnetized region 04, the hollow flange 01 is not magnetized.

Since the hollow flange 01 is hollow, it has a cavity 07. The cavity 07 has the shape of a cylinder, which is arranged coaxially with the axis 03. In the cavity 07 there is a magnetic field sensor 08, which has the same axial position as the permanently magnetized region 04. The magnetic field sensor 08 is arranged at a distance from the axis 03, since it can be arranged according to the invention at any desired point in the cavity 07. The magnetic field sensor 08 is designed to individually measure the permanent magnetization due to the inverse magnetostrictive effect through the permanently magnetized regions 04 and the bending moment MbThe direction component 09 of the induced magnetic field is illustrated by the arrow. The direction component 09 lies in a plane oriented perpendicularly to the axis 03.

The direction component 09 is also parallel to the bending moment MbIs oriented.

Fig. 2 shows a second preferred embodiment of the device according to the invention, which is identical to the embodiment shown in fig. 1. In contrast to the embodiment shown in fig. 1, the magnetic field sensor 08 is designed to measure two direction components 09, each indicated by an arrow, individually, which are oriented perpendicular to one another. Thus, the bending moment M can be determined individuallybDirection component M ofbxAnd bending moment MbDirection component M ofby

Fig. 3 shows a third preferred embodiment of the device according to the invention, which is identical to the embodiment shown in fig. 1. In contrast to the embodiment shown in fig. 1, the embodiment shown in fig. 3 comprises two magnetic field sensors 08, in which the permanent magnetization is produced by the permanently magnetized regions 04 and by the bending moment M due to the inverse magnetostrictive effectbThe directional components 09 of the induced magnetic field, which can be measured individually by the two magnetic field sensors 08, are oriented perpendicular to one another. Thus, as in the embodiment shown in fig. 2, the bending moment M can be determined individuallybDirection component M ofbxAnd bending moment MbDirection component M ofby

List of reference numerals

01 hollow flange

02 basic body

03 axis

04 permanently magnetized region

05 -

06 direction

07 hollow cavity

08 magnetic field sensor

09 directional component

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