阅读说明：本技术 显示装置 (Display device ) 是由 玄昌镐 张根宁 于 2019-07-12 设计创作，主要内容包括：提供了一种显示装置。所述显示装置包括：显示面板,包括连接到多条数据线以及与多条数据线交叉的多条扫描线的多个像素；数据驱动器,包括通过导电粘合构件与显示面板上的多个垫接触的多个端子,并且被配置为检测多个端子的电阻值；以及时序控制器,被配置为将电阻值传输到外部控制器。(A display device is provided. The display device includes: a display panel including a plurality of pixels connected to a plurality of data lines and a plurality of scan lines crossing the plurality of data lines; a data driver including a plurality of terminals contacting a plurality of pads on the display panel through the conductive adhesive member, and configured to detect resistance values of the plurality of terminals; and a timing controller configured to transmit the resistance value to an external controller.)

1. A display device, the display device comprising:

a display panel including a plurality of pixels connected to a plurality of data lines and a plurality of scan lines crossing the plurality of data lines;

a data driver including a plurality of terminals contacting a plurality of pads on the display panel through a conductive adhesive member, and configured to detect resistance values of the plurality of terminals; and

a timing controller configured to transmit the resistance value to an external controller.

2. The display device according to claim 1, wherein:

the plurality of terminals of the data driver include align electrode terminals arranged on align electrode pads provided on the display panel; and is

The data driver is configured to detect the resistance value of the alignment electrode terminal in contact with the alignment electrode pad.

3. The display device according to claim 1,

the display panel further includes a switching part disposed in an area adjacent to the data driver; and is

The switch part includes:

a switch control line; and

and the switch is connected to the switch control line, the odd fan-out lines and the even fan-out lines adjacent to the odd fan-out lines.

4. The display device according to claim 3, wherein the data driver is configured to supply a switch control signal for turning on the switch to the switch control line, and detect the resistance values of the plurality of terminals when the switching means is turned on.

5. The display device according to claim 3, wherein the switch comprises:

a first switch connected to the switch control line and the odd fanout line and the even fanout line connected to a first group of terminals among the plurality of terminals of the data driver; and

a second switch connected to the switch control line and the odd fanout line and the even fanout line connected with a second group of terminals among the plurality of terminals of the data driver.

6. The display device according to claim 5, wherein the data driver is configured to supply a switch control signal for turning on the switch to the switch control line, and detect the resistance value of the terminal of the first group and the resistance value of the terminal of the second group in response to the switching means being turned on.

7. The display device according to claim 3, wherein the data driver comprises:

an output buffer configured to amplify a data voltage corresponding to image data and output the data voltage to the plurality of data lines; and

an inspection section configured to detect the resistance value.

8. The display device according to claim 7, wherein the inspection means is configured to prevent an operating voltage from being applied to the output buffer in an inspection mode in which the resistance value is detected.

9. The display device according to claim 7, wherein the inspection means is configured to output a test signal to the plurality of data lines in an inspection mode of inspecting whether the plurality of data lines have an electrical defect.

10. The display device according to claim 9, wherein the inspection means is configured to prevent an operating voltage from being applied to the output buffer in the inspection mode.

Technical Field

Exemplary embodiments of the invention relate generally to a display apparatus and a method of inspecting the same, and more particularly, to a display apparatus for inspecting defects by using a data driver and a method of inspecting the same.

Background

Display devices currently in use include Liquid Crystal Display (LCD) devices and Organic Light Emitting Display (OLED) devices. The LCD device includes an LCD panel displaying an image using light transmittance of LC and a backlight assembly disposed under the LCD panel and providing light to the LCD panel. The OLED device includes an OLED panel including an OLED diode emitting light by recombination of electrons and holes. OLED devices have fast response times and low power consumption.

The manufacturing process of these display devices includes various defect inspection processes. The defect inspection process includes an array inspection process in which electrical defects are tested and an illumination inspection process in which illumination defects are tested before the module assembly process.

After the array inspection process and the illumination inspection process, a module assembly process is performed. In the module assembly process, a polarizing plate, a protective film, a driving chip, and a flexible circuit board are attached on an LCD panel or an OLED panel.

After the module assembly process, a bonding inspection process of inspecting bonding defects such as the driving chip and the flexible circuit board, and a reliability inspection process of inspecting reliability defects such as a high temperature test, a life test, and an after image test are performed.

The above information disclosed in the background section is only for background understanding of the inventive concept and therefore it may contain information that does not constitute prior art.

Disclosure of Invention

Exemplary embodiments of the inventive concepts provide a display apparatus for inspecting defects by using a data driver.

Exemplary embodiments of the inventive concepts also provide a method of inspecting a display device.

Additional features of the inventive concept will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by the practice of the inventive concept.

According to an exemplary embodiment of the inventive concept, there is provided a display apparatus including: a display panel including a plurality of pixels connected to a plurality of data lines and a plurality of scan lines crossing the plurality of data lines; a data driver including a plurality of terminals contacting a plurality of pads on the display panel through the conductive adhesive member, and configured to detect resistance values of the plurality of terminals; and a timing controller configured to transmit the resistance value to an external controller.

The plurality of terminals of the data driver may include alignment electrode terminals arranged in alignment electrode pads provided on the display panel, and the data driver may be configured to detect a resistance value of the alignment electrode terminals contacted to the alignment electrode pads.

The display panel may further include a switching part disposed in an area adjacent to the data driver, the switching part including: a switch control line; and a switch connected to the switch control line, the odd fanout lines, and the even fanout lines adjacent to the odd fanout lines.

The data driver may supply a switch control signal for turning on the switch to the switch control line, and detect resistance values of the plurality of terminals when the switching part is turned on.

The switch may include: a first switch connected to the switch control line and odd and even fanout lines connected to terminals of a first group among the plurality of terminals of the data driver; and a second switch connected to the switch control line and the odd and even fanout lines connected to the terminals of the second group among the plurality of terminals of the data driver.

The data driver may supply a switch control signal for turning on the switch to the switch control line, and detect a resistance value of the terminal of the first group and a resistance value of the terminal of the second group when the switching part is turned on.

The data driver may include: an output buffer configured to amplify a data voltage corresponding to the image data and output the data voltage to the plurality of data lines; and an inspection section configured to detect the resistance value.

The inspection part may prevent the operating voltage from being applied to the output buffer in an inspection mode in which the resistance value is detected.

The inspection part may output a test signal to the plurality of data lines in an inspection mode of inspecting whether the plurality of data lines have an electrical defect.

The inspection part may prevent the operating voltage from being applied to the output buffer in the inspection mode.

According to an exemplary embodiment of the inventive concept, there is provided a method of inspecting a display apparatus, the display apparatus including: a plurality of pixels connected to a plurality of data lines and a plurality of scan lines crossing the plurality of data lines; and a data driver including a plurality of terminals contacting the plurality of pads on the display panel through the conductive adhesive member, the method including detecting resistance values of the plurality of terminals through the data driver and transmitting the resistance values to an external controller.

The plurality of terminals of the data driver may include alignment electrode terminals arranged in alignment electrode pads provided on the display panel, and the data driver may detect a resistance value of the alignment electrode terminals contacted to the alignment electrode pads.

The method may further include turning on switches connected to the odd-numbered fanout lines and the even-numbered fanout lines adjacent to the odd-numbered fanout lines through a data driver, and detecting resistance values of a plurality of terminals of the data driver connected to the odd-numbered fanout lines and the even-numbered fanout lines through the data driver.

The method may further include turning on, by the data driver, a first switch connected to the switch control line and odd-numbered fanout lines and even-numbered fanout lines connected to terminals of a first group among the plurality of terminals; a second switch connected to the switch control line and odd-numbered fanout lines and even-numbered fanout lines connected to terminals of a second group among the plurality of terminals, and turned on by the data driver; and detecting, by the data driver, resistance values of the terminals in the first group and the second group.

The data driver may include an output buffer configured to amplify a data voltage corresponding to the image data and output the data voltage to the plurality of data lines, and the data driver prevents the operating voltage from being applied to the output buffer in a check mode in which the resistance value is detected.

The method may further include outputting a test signal to the plurality of data lines in an inspection mode in which whether the plurality of data lines have an electrical defect is inspected through the data driver.

The method may further include preventing, by the data driver, the operating voltage from being applied to the output buffer in the check mode.

According to the inventive concept, the data driver detects a resistance value of an output terminal coupled on the display panel in the data driver and displays the resistance value on the monitor. Thus, the bonding inspection process may be automated. In addition, the data driver may perform a combination inspection process and an array inspection process, and thus, the inspection process may be accurately performed.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory and are intended to provide further explanation of the invention as claimed.

Drawings

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate exemplary embodiments of the invention and together with the description serve to explain the inventive concept.

Fig. 1 is a block diagram illustrating a display apparatus according to an exemplary embodiment.

Fig. 2 is a conceptual diagram illustrating the data driver in fig. 1.

Fig. 3 is a block diagram illustrating the data driver in fig. 2.

Fig. 4 is a flowchart illustrating a method of inspecting a display device according to an exemplary embodiment.

Fig. 5 is a conceptual diagram illustrating a display panel according to an exemplary embodiment.

Fig. 6 is a block diagram illustrating the data driver in fig. 5.

Fig. 7 is a conceptual diagram illustrating a display panel according to an exemplary embodiment.

Fig. 8 is a flowchart illustrating a method of inspecting a display device according to an exemplary embodiment.

Detailed Description

In the following description, for purposes of explanation, numerous specific details are set forth in order to provide a thorough understanding of various exemplary embodiments of the invention. "embodiments" as used herein are non-limiting examples of apparatuses or methods that employ one or more of the inventive concepts disclosed herein. It may be evident, however, that the various exemplary embodiments may be practiced without these specific details or with one or more equivalent arrangements. In other instances, well-known structures and devices are shown in block diagram form in order to avoid unnecessarily obscuring the various exemplary embodiments. Moreover, the various exemplary embodiments, although different, are not necessarily exclusive. For example, the particular shapes, configurations and characteristics of the exemplary embodiments can be used or implemented in another exemplary embodiment without departing from the inventive concept.

Unless otherwise indicated, the illustrated exemplary embodiments are to be understood as providing exemplary features of varying detail of some ways in which the inventive concepts may be practiced. Thus, unless otherwise indicated, features, components, modules, layers, films, panels, regions, and/or aspects and the like (hereinafter referred to individually or collectively as "elements" or "elements") of the various embodiments may be otherwise combined, separated, interchanged, and/or rearranged without departing from the inventive concepts.

In the drawings, the size and relative sizes of elements may be exaggerated for clarity and/or description. While example embodiments may be practiced differently, the particular process sequence may be performed differently than described. For example, two consecutively described processes may be performed substantially simultaneously, or may be performed in an order reverse to the order described. In addition, like reference numerals denote like elements.

When an element or layer is referred to as being "on," "connected to" or "coupled to" another element or layer, it may be directly on, connected or coupled to the other element or layer or intervening elements or layers may be present. However, when an element or layer is referred to as being "directly on," "directly connected to," or "directly coupled to" another element or layer, there are no intervening elements or layers present. To this end, the term "connected" may refer to physical, electrical, and/or fluid connections, with or without intervening elements. Further, the D1 axis, the D2 axis, and the D3 axis are not limited to three axes (such as the x-axis, the y-axis, and the z-axis) of a rectangular coordinate system, and may be explained in a broader sense. For example, the D1, D2, and D3 axes may be perpendicular to each other, or may represent different directions that are not perpendicular to each other. For purposes of this disclosure, "at least one of X, Y and Z" and "at least one selected from the group consisting of X, Y and Z" can be construed as any combination of two or more of X only, Y only, Z only, or X, Y and Z, such as XYZ, XYY, YZ, and ZZ, for example. As used herein, the term "and/or" includes any and all combinations of one or more of the associated listed items.

Although the terms first, second, etc. may be used herein to describe various types of elements, these elements should not be limited by these terms. These terms are used to distinguish one element from another. Thus, a first element discussed below could be termed a second element without departing from the teachings of the present disclosure.

Spatially relative terms such as "below … …," "below … …," "below … …," "below," "above … …," "above," "… …," "higher," and "side" (e.g., as in "side wall") may be used herein for descriptive purposes to describe one element's relationship to another element(s) as illustrated in the figures. Spatially relative terms are intended to encompass different orientations of the device in use, operation, and/or manufacture in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements or features described as "below" or "beneath" other elements or features would then be oriented "above" the other elements or features. Thus, the exemplary term "below … …" can encompass both an orientation of above and below. Further, the devices may be otherwise positioned (e.g., rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

The terminology used herein is for the purpose of describing particular embodiments and is not intended to be limiting. As used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. Furthermore, when the terms "comprises" and/or "comprising" and variations thereof are used in this specification, the terms specify the presence of stated features, integers, steps, operations, elements, components, and/or groups thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof. It is also noted that, as used herein, the terms "substantially," "about" and other similar terms are used as terms of approximation and not as terms of degree, and as such are used to interpret the inherent variation in measured, calculated, and/or provided values that would be recognized by one of ordinary skill in the art.

Some exemplary embodiments are described and illustrated in the figures in terms of functional blocks, units and/or modules as is conventional in the art. Those skilled in the art will appreciate that the blocks, units and/or modules are physically implemented using electronic (or optical) circuits, such as logic circuits, discrete components, microprocessors, hardwired circuitry, memory elements, wired connections, etc., which may be formed using semiconductor-based or other manufacturing techniques. Where the blocks, units, and/or modules are implemented by a microprocessor or other similar hardware, they may be programmed and controlled using software (e.g., microcode) to perform the various functions discussed herein, and may optionally be driven by firmware and/or software. It is also contemplated that each block, unit, and/or module may be implemented by dedicated hardware, or as a combination of dedicated hardware for performing some functions and a processor (e.g., one or more programmed microprocessors and associated circuitry) for performing other functions. In addition, each block, unit and/or module of some example embodiments may be physically separated into two or more interacting and discrete blocks, units and/or modules without departing from the scope of the inventive concept. Furthermore, the blocks, units and/or modules of some example embodiments may be physically combined into more complex blocks, units and/or modules without departing from the scope of the inventive concept.

Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this disclosure is a part. Terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein.

Hereinafter, the inventive concept will be explained in detail with reference to the accompanying drawings.

Fig. 1 is a block diagram illustrating a display apparatus according to an exemplary embodiment.

Referring to fig. 1, the inspection system may include a display device 500 and an inspection controller 700.

The display device 500 may include a display panel 100, a data driver 200, and a flexible circuit board 300.

The display panel 100 may include a display portion 110, a peripheral portion 130, and a scan driver 150.

The display part 110 may include a plurality of data lines DL, a plurality of scan lines SL, a plurality of emission lines (not shown), and a plurality of pixels P.

The plurality of data lines DL may extend in the column direction CD and be arranged in the row direction RD.

The plurality of scan lines SL may extend in the row direction RD and be arranged in the column direction CD.

A plurality of transmission lines (not shown) may extend in the row direction RD and be arranged in the column direction CD.

The plurality of pixels P may be arranged in a matrix type including a plurality of pixel columns and a plurality of pixel rows. Each pixel P may include at least one transistor connected to the data line DL and the scan line SL, a storage capacitor, and a display element. The display elements may be LC capacitors or OLED diodes.

The display panel 100 includes a display portion 110 and a peripheral portion 130 surrounding the display portion 110.

The scan driver 150 may be disposed in the peripheral portion 130. The scan driver 150 may be disposed in a portion of the peripheral portion 130 adjacent to an end of the scan line SL. The scan driver 150 may generate a plurality of scan signals and sequentially output the scan signals to the plurality of scan lines SL. The scan driver 150 may be formed in the peripheral portion 130 through substantially the same process as that of forming the transistors in the pixels P.

In an exemplary embodiment, when the display element in the pixel P is an OLED diode, the scan driver 150 may further include an emission scan driver (not shown) generating an emission scan signal for controlling an operation of the OLED diode.

The data driver 200 may be disposed in a portion of the peripheral portion 130 adjacent to the end of the data line DL.

The data driver 200 may be a chip type including a plurality of terminals. The terminals of the data driver 200 include a plurality of input terminals receiving a plurality of input signals and a plurality of output terminals outputting a plurality of output signals. In addition, the terminals of the data driver 200 may include alignment electrode terminals disposed on alignment electrode pads provided in the peripheral portion 130.

A plurality of terminals of the data driver 200 may be electrically and physically contacted to a plurality of pads (or referred to as "pads") in an area in which the data driver 200 is disposed by a conductive adhesive member such as an Anisotropic Conductive Film (ACF).

The plurality of pads in the peripheral portion 130 may include an input pad contacted to an input terminal of the data driver 200 and an output pad contacted to an output terminal of the data driver 200. In addition, the plurality of pads in the peripheral portion 130 may include alignment electrode pads overlapping the alignment electrode terminals of the data driver 200.

The data driver 200 may include a data signal processor 210 and an inspection part 230.

The data signal processor 210 is configured to receive image data in a horizontal period from the timing controller 310, convert the image data into data voltages using gamma voltages, and output the data voltages to the plurality of data lines DL in a display mode in which the display device 500 displays an image.

After the bonding process, the inspection part 230 may be driven based on the control of the inspection controller 700 in a bonding inspection process of inspecting a bonding defect between the data driver 200 and the display panel 100.

The inspection part 230 is configured to detect resistance values of a plurality of terminals of the data driver 200 contacting a plurality of pads in the peripheral portion 130.

For example, the inspection part 230 is configured to detect resistance values of a plurality of terminals of the data driver 200 contacting a plurality of pads in the peripheral portion 130, and output the resistance values of the plurality of terminals of the data driver 200. The inspection part 230 is configured to transmit the resistance value to the inspection controller 700 through the timing controller 310.

The flexible circuit board 300 may be disposed in the peripheral portion 130 corresponding to an edge region of the display panel 100, the edge region being adjacent to the data driver 200.

The timing controller 310 may be disposed on the flexible circuit board 300. Alternatively, although not shown in the drawings, the timing controller 310 may be provided in a printed circuit board connected to the flexible circuit board 300.

The timing controller 310 is configured to generally control the operation of the display apparatus 500. The timing controller 310 may be connected to the inspection controller 700. The timing controller 310 may transmit a detection signal to the inspection controller 700 in an inspection and receive a test control signal from the inspection controller 700.

The inspection controller 700 may provide a test control signal for a defect inspection process to the display device 500. In addition, the inspection controller 700 may receive a detection signal from the display device 500 through the defect inspection process and display the result of the defect inspection process using the detection signal.

For example, the inspection controller 700 may provide a test control signal for a bonding inspection process to the display apparatus 500. The inspection part 230 may detect resistance values of a plurality of terminals in the data driver 200 contacting the plurality of pads based on the test control signal. The timing controller 310 may transmit the resistance value to the inspection controller 700. Accordingly, the inspection controller 700 may display the resistance value on the monitor. The inspector may inspect the display apparatus 500 for the bonding defect through the resistance value displayed on the monitor.

Fig. 2 is a conceptual diagram illustrating the data driver shown in fig. 1.

Referring to fig. 1 and 2, in the bonding process, a plurality of terminals of the data driver 200 may be adhered to a plurality of pads disposed in the peripheral portion 130 by a conductive adhesive member.

The data driver 200 may include a plurality of terminals disposed on an adhesion surface contacting the display panel 100, and the plurality of terminals may include a plurality of input terminals 201, a plurality of output terminals 203, and at least two alignment electrode terminals 205 and 206.

After the bonding process is completed, the plurality of terminals 201, 203, 205, and 206 of the data driver 200 may be in electrical and physical contact with the plurality of pads in the peripheral portion 130 through the conductive adhesive member.

According to an exemplary embodiment, the align electrode pads 105 and 106 in the peripheral portion 130 may be disposed in the align electrode terminals 205 and 206 of the data driver 200 and adhered to the align electrode terminals 205 and 206 of the data driver 200 by a conductive adhesive member.

The first alignment electrode terminal 205 may be adhered to the first alignment electrode pad 105, and the second alignment electrode terminal 206 may be adhered to the second alignment electrode pad 106.

For example, as shown in fig. 2, the first alignment electrode pad 105 may have a cross shape. When the first alignment electrode pad 105 has a cross shape, the first alignment electrode terminal 205 may include first, second, third and fourth alignment electrodes 205A, 205B, 205C and 205D corresponding to the cross shape.

The data driver 200 may detect resistance values from the first alignment electrode 205A, the second alignment electrode 205B, the third alignment electrode 205C, and the fourth alignment electrode 205D, and output a detection signal corresponding to the resistance values.

For example, the data driver 200 may detect a resistance value between the first alignment electrode 205A and the third alignment electrode 205C in a first direction and a resistance value between the second alignment electrode 205B and the fourth alignment electrode 205D in a second direction crossing the first direction. Alternatively, the data driver 200 may detect a resistance value between the first alignment electrode 205A and the second alignment electrode 205B and a resistance value between the third alignment electrode 205C and the fourth alignment electrode 205D.

The alignment electrode pads 105 and 106 may have various shapes. The alignment electrode terminals 205 and 206 may include a plurality of alignment electrodes corresponding to the various shapes of the alignment electrode pads 105 and 106.

A power supply voltage for detecting a resistance value between alignment electrodes of the plurality of alignment electrode terminals may be received from the inspection controller 700, or alternatively, the power supply voltage may be generated in the display apparatus 500.

Fig. 3 is a block diagram illustrating the data driver in fig. 2.

Referring to fig. 2 and 3, the data driver 200 may include a data signal processor 210 and an inspection part 230.

The data signal processor 210 may include a shift register 211, a sampling latch 212, a holding latch 213, a gamma voltage generator 214, a digital-to-analog converter 215, and an output buffer 216.

The shift register 211 may receive a shift clock signal and a start pulse signal from the timing controller 310. The shift register 211 may shift the start pulse signal by each shift clock signal and then sequentially generate k sampling signals (where "k" is a natural number).

The sampling latch 212 may sequentially store k image data corresponding to the k sampling signals in response to the k sampling signals.

The holding latch 213 may simultaneously store and output k image data to the digital-to-analog converter 215 in response to the load signal received from the timing controller 310.

The gamma voltage generator 214 may generate a positive polarity gamma voltage or a negative polarity gamma voltage using a plurality of gamma data and polarity control signals. The positive polarity gamma voltage and the negative polarity gamma voltage may be output to the digital-to-analog converter 215.

The digital-to-analog converter 215 may convert the k image data into k positive polarity data voltages or k negative polarity data voltages using the polarity control signal received from the gamma voltage generator 214 and the positive polarity gamma voltage or the negative polarity gamma voltage, and output the k positive polarity data voltages or the k negative polarity data voltages to the output buffer 216.

The output buffer 216 may amplify the k positive polarity data voltages or the k negative polarity data voltages received from the digital-to-analog converter 215 and output the amplified k positive polarity data voltages or k negative polarity data voltages to the k data lines.

As described above, the data signal processor 210 may be driven in a display mode in which the display device 500 displays an image.

The inspection part 230 may perform a bonding inspection process based on a test control signal supplied from the inspection controller 700 through the timing controller 310.

In the bonding inspection process, the inspection controller 700 may provide a test control signal to the timing controller 310, and then the timing controller 310 may control the inspection part 230 based on the test control signal.

The inspection part 230 may detect a resistance value between alignment electrodes of the plurality of terminals adhered to the alignment electrode terminals 205 and 206 of the alignment electrode pads 105 and 106. The checking part 230 may provide the timing controller 310 with a resistance value.

The timing controller 310 may transmit the detected resistance value to the inspection controller 700. The inspection controller 700 may display the detected resistance value on a monitor.

Accordingly, the inspector may inspect the display apparatus 500 for the bonding defect through the detected resistance value displayed on the monitor. For example, the inspector may determine that the bonding defect occurs when the detected resistance value is greater than the reference value.

Fig. 4 is a flowchart illustrating a method of inspecting a display device according to an exemplary embodiment.

Referring to fig. 1, 2, 3 and 4, when the display panel 100 is completed, the data driver 200 and the flexible circuit board 300 are adhered to the display panel 100 by a conductive adhesive member. In addition, at least one film member such as a polarizing plate, a protective plate, or the like may be attached on the display panel 100. As described above, the display device 500 may be completed through a module assembly process (step S110).

In an exemplary embodiment, the alignment electrode terminals 205 and 206 of the data driver 200 are arranged in the alignment electrode pads 105 and 106 in the peripheral portion 130, and the alignment electrode terminals 205 and 206 of the data driver 200 are adhered to the alignment electrode pads 105 and 106 by a conductive adhesive member.

As shown in fig. 2, the first alignment electrode terminal 205 may include a first alignment electrode 205A, a second alignment electrode 205B, a third alignment electrode 205C, and a fourth alignment electrode 205D corresponding to the first alignment electrode pad 105.

Then, the inspection controller 700 is connected to the display device 500 to enable communication between the inspection controller 700 and the timing controller 310.

Inspection controller 700 may begin the bonding inspection process.

The inspection controller 700 may transmit a test control signal to the timing controller 310 to perform a bonding inspection process, and the timing controller 310 may control the inspection part 230.

The inspection part 230 may detect a resistance value between the alignment electrodes adhered to the alignment electrode terminals 205 and 206 of the alignment electrode pads 105 and 106 (step S130).

The inspection part 230 may transmit the resistance value to the inspection controller 700 through the timing controller 310. The inspection controller 700 may display the resistance value on the monitor (step S150).

Accordingly, the inspector may inspect the display apparatus 500 for the bonding defect through the detected resistance value displayed on the monitor.

Fig. 5 is a conceptual diagram illustrating a display panel according to an exemplary embodiment.

Referring to fig. 1 and 5, the display panel 100 according to an exemplary embodiment may further include a switching part 170, compared to the previous exemplary embodiment.

The switching part 170 may be disposed between the data driver 200 and the display part 110, the data driver 200 being disposed on the display panel 100.

The switching part 170 may include a switch control line SCL and a plurality of switches SW1 and SW 2.

The switch control line SCL may receive a switch control signal from the data driver 200.

Each of the plurality of switches SW1 and SW2 may be connected to an odd fanout line connected to an odd data line and an even fanout line connected to an even data line.

For example, the first switch SW1 includes a control electrode connected to the switch control line SCL, a first electrode connected to the first fanout line FL1 as an odd fanout line, and a second electrode connected to the second fanout line FL2 as an even fanout line.

The first fanout line FL1 is connected to the first output terminal 203a of the data driver 200, and the second fanout line FL2 is connected to the second output terminal 203b of the data driver 200.

According to an exemplary embodiment, the bonding defect of the display apparatus 500 may be checked using the data driver 200 provided in the display apparatus 500.

For example, when the switch control line SCL receives a switch control signal for turning on the plurality of switches SW1 and SW2, the first fanout line FL1 and the second fanout line FL2 may form a closed loop state by the turned-on first switch SW 1.

In the closed loop state, the data driver 200 may detect a resistance value between the first output terminal 203a and the second output terminal 203 b.

In a state in which the switching part 170 is turned on, the data driver 200 may detect a resistance value between odd and even output terminals of the data driver 200 adhered to the plurality of pads of the display panel 100.

However, when the switch control line SCL receives a switch control signal for turning off the plurality of switches SW1 and SW2, the first switch SW1 is turned off, and then the first fanout line FL1 and the second fanout line FL2 are electrically opened from each other. Accordingly, the odd and even data lines may be electrically opened from each other.

Fig. 6 is a block diagram illustrating the data driver in fig. 5.

Referring to fig. 5 and 6, the data driver 200 may include a data signal processor 210 and an inspection part 230A.

The data signal processor 210 may include a shift register 211, a sampling latch 212, a holding latch 213, a gamma voltage generator 214, a digital-to-analog converter 215, and an output buffer 216.

The data signal processor 210 may include the same or similar components as those described in the previous exemplary embodiment with reference to fig. 2, and the same detailed explanation is not repeated unless necessary.

The inspection part 230A may perform a bonding inspection process of inspecting the bonding defect and an array inspection process of inspecting the electrical defect of the signal line based on the control of the timing controller 310.

The inspection part 230A is configured to generate an output control signal OCS to block an operating voltage applied to the output buffer 216 in the bonding inspection process, the output buffer 216 being the last driving block in the data signal processor 210.

The checking component 230A is configured to provide the output control signal OCS to the output buffer 216. The output buffer 216 may prevent the operating voltage from being applied to the output buffer 216 in response to the output control signal OCS. Therefore, in the bonding inspection process, the data signal processor 210 does not output an output signal to the inspection part 230A.

In the bonding inspection process, the inspection part 230A is configured to generate the switching control signal SCS for turning on the switching part 170. In addition, the inspection part 230A is configured to generate a reference signal to detect a resistance value between the odd output terminal and the even output terminal of the data driver 200. The reference signal may be a voltage or a current.

The switching control signal SCS is output through the switching control line SCL of the display panel 100. The reference signal is output through an output terminal of the data driver 200.

The switching part 170 is turned on in response to a switching control signal SCS supplied from a switching control line SCL.

When the switching member 170 is turned on, the odd fanout line (e.g., FL1) and the even fanout line (e.g., FL2) may form a closed loop state by the turned-on switching member 170.

In a state in which the switching part 170 is turned on, the inspection part 230A may detect a resistance value between the odd output terminal and the even output terminal of the data driver 200 adhered to the plurality of pads of the display panel 100.

In the array inspection mode of inspecting electrical defects, the inspection part 230A is configured to provide the output control signal OCS to the output buffer 216. The output buffer 216 is configured to prevent the operating voltage from being applied to the output buffer 216 in response to the output control signal OCS. Therefore, in the array inspection mode, the data signal processor 210 does not output an output signal to the inspection section 230A.

The checking part 230A is configured to generate a switching control signal SCS for turning off the switching part 170 in the array checking mode. The switching control signal SCS is output through the switching control line SCL of the display panel 100.

When the switching part 170 is turned off, the odd fan-out line (e.g., FL1) and the even fan-out line (e.g., FL2) are electrically opened from each other.

The inspection section 230A is configured to output test signals to the plurality of data lines DL in the array inspection mode.

The test signal may be output to the plurality of data lines DL through the output terminal of the data driver 200. The test signal may be a predetermined gray scale voltage such as a white gray scale voltage or a black gray scale voltage. The test signals are applied to the plurality of data lines DL of the display part 110.

However, in the array inspection mode, the timing controller 310 may supply the scan driving signal to the scan driver 150. The scan driving signal may include a start pulse signal and a plurality of clock signals. The scan driver 150 may output a plurality of scan signals to a plurality of scan lines of the display portion 110 based on the scan driving signal.

In the array inspection mode, the plurality of pixels P of the display panel 100 may display a predetermined gray level corresponding to the test signal. Accordingly, the electrical defect of the data line can be checked by the pixel not displaying the predetermined gray level. In addition, electrical defects of the scan lines may be checked by the pixel rows not displaying a predetermined gray level.

As described above, in the array inspection mode, the inspection part may inspect the plurality of data lines and the plurality of scan lines for electrical defects (e.g., open circuits and short circuits).

Fig. 7 is a conceptual diagram illustrating a display panel according to an exemplary embodiment.

Referring to fig. 1 and 7, the display panel 100 according to the exemplary embodiment includes a switching part 170A different from the switching part 170 of the previous exemplary embodiment referring to fig. 5.

The switching part 170A may be disposed between the data driver 200 and the display part 110, the data driver 200 being disposed on the display panel 100.

The switch section 170A may include a plurality of switches SWa, SWb, and SWc corresponding to a plurality of groups A, B and C, respectively, which selectively sample a plurality of output terminals in the data driver 200.

For example, the first switch SWa is connected to a plurality of fanout lines connected to the output terminals of the first group a. Each of the first switches SWa includes a control electrode connected to the switch control line SCL, a first electrode connected to the odd-numbered fanout lines, and a second electrode connected to the even-numbered fanout lines.

The second switch SWb is connected to a plurality of fanout lines connected to output terminals of the second group B. Each of the second switches SWb includes a control electrode connected to the switch control line SCL, a first electrode connected to the odd-numbered fanout lines, and a second electrode connected to the even-numbered fanout lines.

The third switch SWc is connected to a plurality of fanout lines connected to output terminals of the third group C. Each of the third switches SWc includes a control electrode connected to the switch control line SCL, a first electrode connected to the odd-numbered fanout lines, and a second electrode connected to the even-numbered fanout lines.

Referring to fig. 6 and 7, in the bonding inspection process, the inspection part 230A is configured to provide the switching control signal SCS to the switching part 170A through the switching control line SCL. In addition, the inspection part 230A is configured to output a reference signal for detecting a resistance value to an output terminal of the data driver 200.

The switching part 170A is turned on in response to the switching control signal SCS applied to the switching control line SCL.

When the switching part 170A is turned on, the odd and even fanout lines connected to the output terminals of the first, second, and third groups a, B, and C may form a closed loop state, respectively.

The checking part 230A may detect resistance values of output terminals of the first, second, and third groups a, B, and C among the plurality of output terminals of the data driver 200.

However, in the array inspection mode, a method of driving the inspection part 230A may be the same as that described in the previous exemplary embodiment with reference to fig. 6, and the same detailed explanation is not repeated unless necessary.

Fig. 8 is a flowchart illustrating a method of inspecting a display device according to an exemplary embodiment.

Referring to fig. 1, 5, 6, and 8, when the display panel 100 is completed, the data driver 200 and the flexible circuit board 300 are adhered to the display panel 100 by a conductive adhesive member. In addition, at least one film member such as a polarizing plate, a protective plate, or the like may be attached on the display panel 100. As described above, the display device 500 may be completed through a module assembly process (step S210).

For example, as shown in fig. 5, the data driver 200 is adhered to a plurality of pads on the display panel 100 by a conductive adhesive member.

Then, the inspection controller 700 is connected to the display device 500 to enable communication between the inspection controller 700 and the timing controller 310.

Inspection controller 700 may begin the bonding inspection process.

The inspection controller 700 may transmit a test control signal to the timing controller 310 to perform a bonding inspection process (step S230).

The inspection part 230A of the data driver 200 is configured to generate the output control signal OCS for performing the bonding inspection process and the switching control signal SCS having the ON voltage based ON the control of the timing controller 310.

The checking component 230A is configured to provide the output control signal OCS to the output buffer 216, and the output buffer 216 is configured to prevent the operating voltage from being applied to the output buffer 216 in response to the output control signal OCS.

The checking part 230A is configured to output the switching control signal SCS having the ON voltage to the switching control line SCL of the display panel 100.

Referring to fig. 5, according to an exemplary embodiment, the switching part 170 is turned ON in response to the switching control signal SCS having an ON voltage applied to the switching control line SCL.

When the switch member 170 is turned on, the odd fan-out lines and the even fan-out lines form a closed loop state by the turned-on switch member 170.

In a state in which the switching part 170 is turned on, the inspection part 230A may detect a resistance value between the odd output terminal and the even output terminal of the data driver 200 adhered to the plurality of pads of the display panel 100.

In addition, referring to fig. 7, according to an exemplary embodiment, the switching part 170A is turned ON in response to the switching control signal SCS having an ON voltage applied to the switching control line SCL.

When the switching part 170A is turned on, the odd and even fanout lines connected to the output terminals of the first, second, and third groups a, B, and C may form a closed loop state, respectively.

The checking part 230A may detect resistance values of output terminals of the first, second, and third groups a, B, and C among the plurality of output terminals of the data driver 200.

As described above, the inspection part 230A transmits the resistance value to the inspection controller 700 through the timing controller 310. The inspection controller 700 displays the resistance value on the monitor to complete the bonding inspection process (step S230).

Then, the inspection controller 700 may perform an array inspection process.

The inspection part 230A of the data driver 200 is configured to generate an output control signal OCS for performing an array inspection process and a switching control signal SCS having an OFF voltage based on the control of the timing controller 310.

The output buffer 216 is configured to prevent the operating voltage from being applied to the output buffer 216 in response to the output control signal OCS.

The switching part 170A is turned OFF in response to the switching control signal SCS having the OFF voltage. The odd and even fanout lines of the display panel 100 are electrically open-circuited to each other.

The inspection part 230A is configured to generate a test signal and output the test signal to a plurality of data lines of the display part 110 through output terminals of the data driver 200.

The scan driver 150 is configured to output a plurality of scan signals to a plurality of scan lines of the display portion 110 in synchronization with the output timing of the test signal.

As described above, in the array inspection mode, the inspection part 230A may inspect the plurality of data lines and the plurality of scan lines for electrical defects (e.g., open and short circuits) (step S250).

According to an exemplary embodiment, a combination inspection process and an array inspection process of a display device may be performed using a data driver in the display device.

According to an exemplary embodiment, the data driver detects a resistance value of an output terminal coupled on the display panel in the data driver and displays the resistance value on the monitor, and thus, a coupling inspection process may be automated. In addition, the data driver may perform a combination inspection process and an array inspection process, and thus, the inspection process may be accurately performed.

The inventive concept can be applied to a display device and an electronic apparatus having the same. For example, the inventive concept may be applied to a computer monitor, a laptop computer, a digital camera, a cellular phone, a smart tablet, a television, a Personal Digital Assistant (PDA), a Portable Multimedia Player (PMP), an MP3 player, a navigation system, a game machine, a video phone, and the like.

Although certain exemplary embodiments have been described herein, other embodiments and modifications will be apparent from the description. In the claims, means-plus-function (means-plus-function) are intended to cover the structures described herein as performing the recited function and not only structural equivalents but also equivalent structures. Accordingly, the inventive concept is not limited to such embodiments, but is to be defined by the following claims, along with their full scope of various modifications and equivalent arrangements, which will be apparent to those skilled in the art.