阅读说明：本技术 超声探头的故障检测方法及装置 (Fault detection method and device for ultrasonic probe ) 是由 孙世博 邵金华 孙锦 段后利 于 2019-08-27 设计创作，主要内容包括：本发明实施例提供一种超声探头的故障检测方法及装置,该方法包括获取自向超声探头的待测阵列单元充电开始起,至所述待测阵列单元输出的电压达到预定的目标电压所需的实际充电时间；根据所述实际充电时间获得实际参数,并检测所述实际参数与标准参数是否一致,其中,所述标准参数用于表征阵列单元未发生故障,所述实际参数与所述标准参数的类型相同；若所述实际参数和所述标准参数一致,则判定所述待测阵列单元未发生故障,否则,判定所述待测阵列单元发生故障。本发明实施例能够使整个判断过程能够完全实现自动化,避免了人为操作引起的误判或主观性,使故障判断结果更加客观准确。(The embodiment of the invention provides a fault detection method and a fault detection device for an ultrasonic probe, wherein the method comprises the steps of obtaining the actual charging time from the beginning of charging an array unit to be detected of the ultrasonic probe to the time when the voltage output by the array unit to be detected reaches the preset target voltage; obtaining an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter or not, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type; and if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault. The embodiment of the invention can completely realize automation of the whole judging process, avoid misjudgment or subjectivity caused by manual operation and enable the fault judging result to be more objective and accurate.)

1. a method of fault detection for an ultrasonic probe, comprising:

Acquiring actual charging time required from the beginning of charging an array unit to be tested of an ultrasonic probe until the voltage output by the array unit to be tested reaches a preset target voltage;

Obtaining an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter or not, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type;

And if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault.

2. The method according to claim 1, wherein the obtaining of the actual charging time required from the start of charging the array unit under test of the ultrasonic probe to the time when the voltage output by the array unit under test reaches the predetermined target voltage comprises:

Starting timing when an array unit to be tested of an ultrasonic probe starts to charge, and acquiring the current output voltage of the array unit to be tested in real time;

And if the current output voltage of the array unit to be tested reaches the target voltage, taking the current recorded duration of the timing unit as the actual charging time.

3. The method according to claim 2, wherein the step of taking a currently recorded duration of the timing unit as the actual charging time if the currently output voltage of the array unit under test reaches the target voltage comprises:

Comparing the current output voltage of the array unit to be tested with the target voltage;

If the current output voltage of the array unit to be tested is smaller than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and timing is stopped until the current output voltage of the array unit to be tested reaches the target voltage;

And taking the timing result after timing stop as the actual charging time.

4. The method of claim 1, wherein the detecting whether the actual parameter is consistent with a standard parameter comprises:

And detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

5. the method according to any one of claims 1-4, wherein the standard parameter is a standard charging time; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include:

Taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time;

If the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including:

And if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

6. The method according to any one of claims 1 to 4, wherein the standard parameter is a standard capacity value; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include:

Calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time;

Detecting whether the actual capacity value is consistent with the standard capacity value;

if the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including:

and if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

7. a failure detection device of an ultrasonic probe, characterized by comprising:

the device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring the actual charging time from the beginning of charging the array unit to be tested of the ultrasonic probe to the time when the voltage output by the array unit to be tested reaches the preset target voltage;

the detection module is used for obtaining an actual parameter according to the actual charging time and detecting whether the actual parameter is consistent with a standard parameter or not, wherein the standard parameter is used for representing that no fault occurs in the array unit, and the type of the actual parameter is the same as that of the standard parameter;

And the processing module is used for judging that the array unit to be detected has no fault if the actual parameters are consistent with the standard parameters, and otherwise, judging that the array unit to be detected has a fault.

8. The apparatus of claim 7, wherein the obtaining module comprises a comparing unit and a timing unit;

The first input end of the comparison unit is connected with the array unit to be tested and used for acquiring the current output voltage of the array unit to be tested in real time from the start of charging of the array unit to be tested of the ultrasonic probe; the second input end of the comparison unit is used for receiving the target voltage;

The comparison unit is connected with the timing unit and used for comparing the current output voltage of the array unit to be tested with the target voltage; if the current output voltage of the array unit to be tested is smaller than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and the timing unit is instructed to stop timing until the current output voltage of the array unit to be tested reaches the target voltage;

The timing unit is connected with the processing module and used for sending a timing result after timing is stopped to the processing module as the actual charging time.

9. The apparatus of claim 8, wherein the comparison unit is a voltage comparator.

10. the apparatus of claim 7, further comprising: a DC voltage generating module;

The direct-current voltage generation module is connected with the array unit to be tested and used for generating direct-current charging voltage and sending the direct-current charging voltage to the array unit to be tested so as to charge the array unit to be tested.

11. The apparatus of claim 7, further comprising: a band-gap reference circuit and a voltage stabilizing circuit;

The band-gap reference circuit is connected with the voltage stabilizing circuit and used for generating reference voltage;

The voltage stabilizing circuit comprises an operational amplifier and a plurality of resistors and is used for adjusting the reference voltage and generating the target voltage.

12. the apparatus of claim 7, wherein the detection module is specifically configured to: and detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

13. The apparatus of claim 7, wherein the standard parameter is a standard charging time; the detection module is specifically configured to:

taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time;

and if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

14. The apparatus of claim 7, wherein the standard parameter is a standard tolerance value; the detection module is specifically configured to:

Calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time;

Detecting whether the actual capacity value is consistent with the standard capacity value;

And if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

15. The apparatus according to any one of claims 7-14, further comprising: a multiplexing module;

A plurality of input ends of the multiplexing module are correspondingly connected with the array units to be tested one by one, an output end of the multiplexing module is connected with the acquisition module, and a selection end of the multiplexing module is connected with the processing module;

The multiplexing module is used for receiving the selection control signal sent by the processing module through the selection end, and gating the corresponding input end according to the selection control signal to be connected with the output end, so that the array unit to be tested connected with the gated input end is connected with the acquisition module.

16. The apparatus of claim 15, wherein the multiplexing module comprises: a plurality of switches;

One ends of the switches are connected with the input ends of the multiplexing module in a one-to-one correspondence mode, the other ends of the switches are connected with the output end of the multiplexing module, and the control ends of the switches are connected with the selection end of the multiplexing module.

17. the apparatus of claim 15, further comprising: an isolation module;

The isolation module is connected between the multiplexing module and the acquisition module and used for isolating a high-voltage signal generated by an ultrasonic array of the ultrasonic probe from the acquisition module.

18. The apparatus of claim 17, wherein the isolation module is an optical coupling isolation module, a magnetic coupling isolation module, or a voltage limiting module.

19. An ultrasound probe, comprising: an ultrasound probe body and a failure detection apparatus of an ultrasound probe according to any of claims 7 to 18.

Technical Field

The embodiment of the invention relates to the technical field of instrument detection, in particular to a fault detection method and device of an ultrasonic probe.

Background

The ultrasonic probe is a transducer which transmits and receives ultrasonic waves in the ultrasonic detection process and realizes the conversion of electric energy and sound energy by utilizing the piezoelectric effect of materials. The performance of the probe directly affects the characteristics of the ultrasonic waves and the detection performance of the ultrasonic waves.

In the existing scheme for detecting the function of the ultrasonic probe, a user can judge whether the ultrasonic probe is damaged or not by observing whether the ultrasonic image is abnormal or not, or the user slightly slides along the surface of the ultrasonic probe by using a metal rod (such as a screwdriver) to observe whether the ultrasonic image can slowly move correspondingly with white bright stripes.

However, the above schemes are all manual operations, which are inconvenient and fast, and are easy to cause misjudgment, and the accuracy is low.

Disclosure of Invention

The embodiment of the invention provides a fault detection method and device of an ultrasonic probe, which are used for improving the fault detection accuracy of the ultrasonic probe.

In a first aspect, an embodiment of the present invention provides a method for detecting a fault of an ultrasonic probe, including:

Acquiring actual charging time required from the beginning of charging an array unit to be tested of an ultrasonic probe until the voltage output by the array unit to be tested reaches a preset target voltage;

Obtaining an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter or not, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type;

And if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault.

In one possible design, the obtaining of the actual charging time required from the start of charging the array unit under test of the ultrasonic probe to the time when the voltage output by the array unit under test reaches the predetermined target voltage includes:

Starting timing when an array unit to be tested of an ultrasonic probe starts to charge, and acquiring the current output voltage of the array unit to be tested in real time;

and if the current output voltage of the array unit to be tested reaches the target voltage, taking the current recorded duration of the timing unit as the actual charging time.

In a possible design, if the voltage currently output by the array unit to be tested reaches the target voltage, taking the currently recorded duration of the timing unit as the actual charging time includes:

Comparing the current output voltage of the array unit to be tested with the target voltage;

If the current output voltage of the array unit to be tested is smaller than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and timing is stopped until the current output voltage of the array unit to be tested reaches the target voltage;

and taking the timing result after timing stop as the actual charging time.

in one possible design, the detecting whether the actual parameter is consistent with a standard parameter includes:

and detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

In one possible design, the standard parameter is a standard charging time; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include:

taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time;

If the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including:

And if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

In one possible design, the standard parameter is a standard tolerance value; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include:

calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time;

detecting whether the actual capacity value is consistent with the standard capacity value;

if the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including:

And if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

In a second aspect, an embodiment of the present invention provides a fault detection apparatus for an ultrasonic probe, including:

the device comprises an acquisition module, a control module and a control module, wherein the acquisition module is used for acquiring the actual charging time from the beginning of charging the array unit to be tested of the ultrasonic probe to the time when the voltage output by the array unit to be tested reaches the preset target voltage;

the detection module is used for obtaining an actual parameter according to the actual charging time and detecting whether the actual parameter is consistent with a standard parameter or not, wherein the standard parameter is used for representing that no fault occurs in the array unit, and the type of the actual parameter is the same as that of the standard parameter;

and the processing module is used for judging that the array unit to be detected has no fault if the actual parameters are consistent with the standard parameters, and otherwise, judging that the array unit to be detected has a fault.

in one possible design, the obtaining module includes a comparing unit and a timing unit;

the first input end of the comparison unit is connected with the array unit to be tested and used for acquiring the current output voltage of the array unit to be tested in real time from the start of charging of the array unit to be tested of the ultrasonic probe; the second input end of the comparison unit is used for receiving the target voltage;

the comparison unit is connected with the timing unit and used for comparing the current output voltage of the array unit to be tested with the target voltage; if the current output voltage of the array unit to be tested is smaller than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and the timing unit is instructed to stop timing until the current output voltage of the array unit to be tested reaches the target voltage;

The timing unit is connected with the processing module and used for sending a timing result after timing is stopped to the processing module as the actual charging time.

In one possible embodiment, the comparison unit is a voltage comparator.

In one possible design, the apparatus further includes: a DC voltage generating module;

The direct-current voltage generation module is connected with the array unit to be tested and used for generating direct-current charging voltage and sending the direct-current charging voltage to the array unit to be tested so as to charge the array unit to be tested.

In one possible design, the apparatus further includes: a band-gap reference circuit and a voltage stabilizing circuit;

the band-gap reference circuit is connected with the voltage stabilizing circuit and used for generating reference voltage;

the voltage stabilizing circuit comprises an operational amplifier and a plurality of resistors and is used for adjusting the reference voltage and generating the target voltage.

in one possible design, the detection module is specifically configured to: and detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

in one possible design, the standard parameter is a standard charging time; the detection module is specifically configured to:

taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time;

and if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

In one possible design, the standard parameter is a standard tolerance value; the detection module is specifically configured to:

Calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time;

Detecting whether the actual capacity value is consistent with the standard capacity value;

and if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

In one possible design, the apparatus further includes: a multiplexing module;

a plurality of input ends of the multiplexing module are correspondingly connected with the array units to be tested one by one, an output end of the multiplexing module is connected with the acquisition module, and a selection end of the multiplexing module is connected with the processing module;

The multiplexing module is used for receiving the selection control signal sent by the processing module through the selection end, and gating the corresponding input end according to the selection control signal to be connected with the output end, so that the array unit to be tested connected with the gated input end is connected with the acquisition module.

In one possible design, the multiplexing module includes: a plurality of switches;

one ends of the switches are connected with the input ends of the multiplexing module in a one-to-one correspondence mode, the other ends of the switches are connected with the output end of the multiplexing module, and the control ends of the switches are connected with the selection end of the multiplexing module.

in one possible design, the apparatus further includes: an isolation module;

The isolation module is connected between the multiplexing module and the acquisition module and used for isolating a high-voltage signal generated by an ultrasonic array of the ultrasonic probe from the acquisition module.

In one possible design, the isolation module is an optical coupling isolation module, a magnetic coupling isolation module, or a voltage limiting module.

In a third aspect, an embodiment of the present invention provides an ultrasound probe, including: an ultrasonic probe body and a fault detection device of the ultrasonic probe described in any of the above embodiments.

In the method and the device for detecting the failure of the ultrasonic probe, the capacitance resistance of the array unit to be detected of the ultrasonic probe is utilized, the actual parameters of the array unit to be detected are determined according to the obtained actual charging time from the start of charging to the target voltage of the array unit to be detected, and then whether the array unit to be detected fails or not is judged according to the comparison result of the actual parameters and the standard parameters. The whole judgment process can be completely automated, so that misjudgment or subjectivity caused by manual operation is avoided, and the fault judgment result is more objective and accurate.

drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly introduced below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to these drawings without creative efforts.

fig. 1 is a schematic flow chart of a fault detection method for an ultrasonic probe according to an embodiment of the present invention;

fig. 2 is a schematic flow chart of a fault detection method for an ultrasonic probe according to another embodiment of the present invention;

fig. 3 is a schematic flow chart of a fault detection method for an ultrasonic probe according to another embodiment of the present invention;

Fig. 4 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to a further embodiment of the present invention;

Fig. 5 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to a further embodiment of the present invention;

fig. 6 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to a further embodiment of the present invention;

fig. 7 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to a further embodiment of the present invention;

Fig. 8 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to a further embodiment of the present invention;

fig. 9 is a schematic structural diagram of an ultrasound probe according to yet another embodiment of the present invention.

Detailed Description

in order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Fig. 1 is a schematic flow chart of a fault detection method for an ultrasonic probe according to an embodiment of the present invention. As shown in fig. 1, the method includes:

101. the method comprises the steps of obtaining actual charging time required from the beginning of charging an array unit to be tested of an ultrasonic probe until the voltage output by the array unit to be tested reaches a preset target voltage.

in practical applications, the actual charging time from the start of charging to the predetermined target voltage of the array unit under test can be measured by a voltage detection device, which can be an oscilloscope.

Alternatively, the voltage output by the array unit to be tested may be a voltage generated by the array unit to be tested under the influence of a charging voltage for charging the array unit to be tested, for example, the voltage may be a voltage between an output line of the array unit to be tested and a ground line.

Specifically, the basic structure of the ultrasonic probe may include a piezoelectric wafer, an acoustic damping block, a coupling layer, an acoustic lens, and a wire, where a plurality of piezoelectric wafers are arranged in an array to form an ultrasonic array of the ultrasonic probe, and each piezoelectric wafer is connected to an output wire and receives an excitation voltage through the wire. In addition, each piezoelectric wafer in the ultrasonic array shares a ground. Alternatively, the conducting wire may be used for receiving a charging voltage or as an output terminal of an output voltage of the array unit to be tested.

One possible implementation is that the array unit (piezoelectric wafer) may be connected to one end of the probe detection mode switch and one end of the probe operation mode switch through the wire, the other end of the probe detection mode switch is connected to the device in the probe detection mode, and the other end of the probe operation mode switch is connected to the device in the probe operation mode. Optionally, the probe operation mode switch is turned off and the probe detection mode switch is turned off in the probe operation state, and the probe detection mode switch is turned off and the probe operation mode switch is turned off in the probe detection state.

Alternatively, the source of the charging voltage for charging the array unit to be tested may be implemented by a new channel, for example, provided by a special dc voltage generating module, or may be implemented by an original channel, for example, provided by an original excitation voltage generating module of the ultrasonic probe.

102. and acquiring an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type.

In practical applications, the main body of the step may be a hardware module such as a comparator. The system can also be a singlechip and realized by software such as computer programs and the like.

Optionally, the detecting whether the actual parameter is consistent with a standard parameter includes: and detecting whether the actual parameter is equal to the standard parameter.

optionally, the detecting whether the actual parameter is consistent with a standard parameter includes: and detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

optionally, the error range includes an upper limit value and a lower limit value, i.e. the actual parameter is considered to be consistent with the standard parameter if the actual parameter is greater than the lower limit value and less than the upper limit value. Based on the error range, the detection of whether the actual parameter is inconsistent with the standard parameter may be implemented by two comparators and a logic circuit, and one possible implementation manner may be: and converting the actual parameters obtained according to the actual charging time into voltage signals, inputting the voltage signals to a non-inverting end of a first comparator and an inverting end of a second comparator, wherein the inverting end of the first comparator is connected with the lower limit value, the non-inverting end of the second comparator is connected with the upper limit value, the output ends of the first comparator and the second comparator are both connected to an AND gate, and when the actual parameters are larger than the lower limit value and smaller than the upper limit value, the AND gate outputs high level to represent that the actual parameters are consistent with the standard parameters, namely no fault occurs. And if the actual parameter is smaller than the lower limit value or larger than the upper limit value, the AND gate outputs a low level to represent that the actual parameter is inconsistent with the standard parameter, and then a fault occurs. The connection relationship between the comparator and the logic circuit and whether the logic circuit specifically adopts an AND gate or an OR gate or other devices are not limited as long as the detection of whether the actual parameter is within the error range can be realized.

103. And if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault.

the main execution body of the step can be a processor such as a single chip microcomputer and the like, and is used for generating a fault signal according to the detection result generated in the step 102 so as to send the fault signal to an alarm device or push the fault signal to a user interface to enable a user to know so as to enable the user to take corresponding measures.

as a possible implementation, the standard parameter may be a standard charging time; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include: and taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time.

if the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including: and if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

optionally, the standard charging time may be set in various manners, and may be set as an empirical value, where the empirical value may be obtained from historical data, or may be an actual value obtained by actually measuring probes of the same type, or may be an average value of actual measurement values of multiple array units in the same probe.

As another possible embodiment, the standard parameter is a standard tolerance value; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include: calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time; and detecting whether the actual capacity value is consistent with the standard capacity value.

optionally, the actual capacitance value of the array unit to be measured may be obtained by calculation according to a relation between the capacitance value and the charging time, where the relation between the capacitance value and the charging time is:

wherein Vc is a preset target voltage, Vs is a charging voltage, t is a charging time corresponding to the reference value, and R is a charging resistance; and C is a capacitance value to be detected.

if the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including: and if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

Alternatively, the standard capacity value may be set in various ways, and may be set as an empirical value, such as a nominal value given by a factory, or may be set as an actual measurement value, such as a value obtained by measuring a normal array unit.

in the method for detecting a fault of an ultrasonic probe provided by this embodiment, by using the capacitance of the array unit to be detected of the ultrasonic probe, the actual parameter of the array unit to be detected is determined according to the obtained actual charging time from the start of charging to the target voltage of the array unit to be detected, and then whether the array unit to be detected is faulty or not is determined according to the comparison result between the actual parameter and the standard parameter. The whole judgment process can be completely automated, so that misjudgment or subjectivity caused by manual operation is avoided, and the fault judgment result is more objective and accurate.

fig. 2 is a schematic flow chart of a method for detecting a fault of an ultrasonic probe according to another embodiment of the present invention, where on the basis of the above-mentioned embodiment, for example, on the basis of the embodiment shown in fig. 1, the present embodiment describes step 101 in detail, and the method includes:

201. Starting timing when the array unit to be tested of the ultrasonic probe starts to charge, and acquiring the current output voltage of the array unit to be tested in real time.

optionally, the starting of timing when the array unit to be tested of the ultrasonic probe starts charging may include: and the processor for implementing the step 103 controls the timing unit to start timing when the excitation loading module connected with the array unit to be tested is controlled to load the charging voltage to the array unit to be tested of the ultrasonic probe. In order to reduce the operation amount of the fault detection device and control the hardware cost of the fault detection device, the processor can be a system processor (a processor of an ultrasonic probe or a processor of an ultrasonic detection instrument), or in order to reduce the control delay or avoid external signal interference, the processor can be a local processor of the fault detection device.

In a possible implementation manner, two wires may be led out from the array unit to be tested, one wire is connected to a charging voltage (excitation voltage), and the other wire is connected to a detection device for detecting an output voltage of the array unit to be tested. Based on this, the voltage currently output by the array unit to be detected can be acquired in real time through the detection device.

202. And if the current output voltage of the array unit to be tested reaches the target voltage, taking the current recorded duration of the timing unit as the actual charging time.

Optionally, the current output voltage may be subjected to analog-to-digital conversion through an analog-to-digital converter to obtain a digital signal corresponding to the current output voltage, the digital signal representing the current output voltage is sent to a processor, the digital signal is compared with a digital signal corresponding to a target voltage signal through the processor to determine whether the voltage of the current output end of the array unit to be measured reaches the target voltage, if so, the processor generates a control signal according to a comparison result and sends the control signal to a timing unit, and the timing unit is controlled to send the current timing result to the processor for subsequent calculation processing.

203. and acquiring an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type.

204. and if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault.

Step 203 and step 204 in this embodiment are similar to step 102 and step 103 in the above embodiment, and are not described again here.

According to the fault detection method of the ultrasonic probe, the timing unit is adopted to start timing when the array unit to be detected starts to charge, and the timing unit stops timing when the output voltage of the array unit to be detected reaches the preset target voltage, so that the actual charging time can be accurately and quickly obtained, and the fault judgment accuracy is further improved.

Fig. 3 is a method for detecting a fault of an ultrasonic probe according to another embodiment of the present invention, where step 202 is described in detail based on the embodiment illustrated in fig. 2, and the method includes:

301. Starting timing when the array unit to be tested of the ultrasonic probe starts to charge, and acquiring the current output voltage of the array unit to be tested in real time.

Step 301 in this embodiment is similar to step 201 in the above embodiment, and is not described here again.

302. And comparing the current output voltage of the array unit to be tested with the target voltage.

Optionally, the main body of the step may be a voltage detection device capable of performing voltage comparison, for example: the voltage detection device may be a comparator, and by connecting one input end of the comparator to the array unit to be detected and connecting the other input end of the comparator to the target voltage, whether the current output voltage of the array unit to be detected reaches the target voltage can be known through an output result of the comparator.

303. if the current output voltage of the array unit to be tested is smaller than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and timing is stopped until the current output voltage of the array unit to be tested reaches the target voltage.

304. And taking the timing result after timing stop as the actual charging time.

Optionally, the timing unit may be a timer, the timer includes a start control end and a stop control end, the start control end is configured to receive a start control signal for controlling the timer to start timing, and the stop control end is configured to receive a stop control signal for controlling the timer to stop timing.

optionally, the comparison result between the currently output voltage of the array unit under test and the target voltage may be input to the stop control terminal, so that the timer is stopped when the currently output voltage of the array unit under test reaches the target voltage. The comparison result can be obtained by comparing the current output voltage of the array unit to be tested with the target voltage through a comparator.

305. And acquiring an actual parameter according to the actual charging time, and detecting whether the actual parameter is consistent with a standard parameter, wherein the standard parameter is used for representing that no array unit fails, and the actual parameter and the standard parameter are the same in type.

306. And if the actual parameters are consistent with the standard parameters, judging that the array unit to be detected is not in fault, otherwise, judging that the array unit to be detected is in fault.

Step 305 and step 306 in this embodiment are similar to step 102 and step 103 in the above embodiment, and are not described again here.

According to the fault detection method of the ultrasonic probe, the output voltage of the array unit to be detected is detected in real time, and the output voltage is compared with the target voltage to control whether timing is stopped or not, the process is simple and direct, delay is small, the actual charging time can be accurately obtained, and therefore the fault detection accuracy can be further improved.

fig. 4 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to yet another embodiment of the present invention. The apparatus can implement the fault detection method of the ultrasonic probe provided in any of the above embodiments, as shown in fig. 4, the apparatus includes:

The acquiring module 401 is configured to acquire an actual charging time required from the start of charging the array unit to be tested of the ultrasonic probe until the voltage output by the array unit to be tested reaches a predetermined target voltage.

in practical applications, the obtaining module 401 may be an oscilloscope.

Alternatively, the voltage output by the array unit to be tested may be a voltage generated by the array unit to be tested under the influence of a charging voltage for charging the array unit to be tested, for example, the voltage may be a voltage between an output line of the array unit to be tested and a ground line.

specifically, the basic structure of the ultrasonic probe may include a piezoelectric wafer, an acoustic damping block, a coupling layer, an acoustic lens, and a wire, where a plurality of piezoelectric wafers are arranged in an array to form an ultrasonic array of the ultrasonic probe, and each piezoelectric wafer is connected to an output wire and receives an excitation voltage through the wire. In addition, each piezoelectric wafer in the ultrasonic array shares a ground. Alternatively, the conducting wire may be used for receiving a charging voltage or as an output terminal of an output voltage of the array unit to be tested.

One possible implementation is that the array unit (piezoelectric wafer) may be connected to one end of the probe detection mode switch and one end of the probe operation mode switch through the wire, the other end of the probe detection mode switch is connected to the device in the probe detection mode, and the other end of the probe operation mode switch is connected to the device in the probe operation mode. Optionally, the probe operation mode switch is turned off and the probe detection mode switch is turned off in the probe operation state, and the probe detection mode switch is turned off and the probe operation mode switch is turned off in the probe detection state.

Alternatively, the source of the charging voltage for charging the array unit to be tested may be implemented by a new channel, for example, provided by the special dc voltage generating module 603, or may be implemented by an original channel, for example, provided by an original excitation voltage generating module of the ultrasonic probe.

a detecting module 402, configured to obtain an actual parameter according to the actual charging time, and detect whether the actual parameter is consistent with a standard parameter, where the standard parameter is used to represent that no failure occurs in the array unit, and the actual parameter and the standard parameter are the same in type.

in practical applications, the detecting module 402 may be a hardware module such as a comparator. The system can also be a singlechip and realized by software such as computer programs and the like.

Optionally, the detecting whether the actual parameter is consistent with a standard parameter includes: and detecting whether the actual parameter is equal to the standard parameter.

optionally, the detecting whether the actual parameter is consistent with a standard parameter includes: and detecting whether the actual parameters are in an error range corresponding to standard parameters, if so, the actual parameters are consistent with the standard parameters, otherwise, the actual parameters are inconsistent with the standard parameters.

optionally, the error range includes an upper limit value and a lower limit value, i.e. the actual parameter is considered to be consistent with the standard parameter if the actual parameter is greater than the lower limit value and less than the upper limit value. Based on the error range, the detection of whether the actual parameter is inconsistent with the standard parameter may be implemented by two comparators and a logic circuit, and one possible implementation manner may be: and converting the actual parameters obtained according to the actual charging time into voltage signals, inputting the voltage signals to a non-inverting end of a first comparator and an inverting end of a second comparator, wherein the inverting end of the first comparator is connected with the lower limit value, the non-inverting end of the second comparator is connected with the upper limit value, the output ends of the first comparator and the second comparator are both connected to an AND gate, and when the actual parameters are larger than the lower limit value and smaller than the upper limit value, the AND gate outputs high level to represent that the actual parameters are consistent with the standard parameters, namely no fault occurs. And if the actual parameter is smaller than the lower limit value or larger than the upper limit value, the AND gate outputs a low level to represent that the actual parameter is inconsistent with the standard parameter, and then a fault occurs. The connection relationship between the comparator and the logic circuit and whether the logic circuit specifically adopts an AND gate or an OR gate or other devices are not limited as long as the detection of whether the actual parameter is within the error range can be realized.

And a processing module 403, configured to determine that the array unit to be tested does not fail if the actual parameter is consistent with the standard parameter, and otherwise, determine that the array unit to be tested fails.

The processing module 403 may be a processor such as a single chip microcomputer, and is configured to generate a fault signal according to the detection result generated in step 102, so as to send the fault signal to an alarm device or push the fault signal to a user interface to enable a user to know so that the user can take corresponding measures.

in practical applications, in order to reduce the operation amount of the fault detection apparatus and control the hardware cost thereof, the processing module 403 may be a system processor (a processor of the ultrasonic probe or a processor of the ultrasonic probe apparatus), or in order to reduce the control delay or avoid external signal interference, the processing module 403 may be a local processor of the fault detection apparatus.

As a possible implementation, the standard parameter may be a standard charging time; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include: and taking the actual charging time as the actual parameter, and detecting whether the actual charging time is consistent with the standard charging time.

If the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including: and if the actual charging time is consistent with the standard charging time, judging that the array unit to be tested does not break down, otherwise, judging that the array unit to be tested breaks down.

Optionally, the standard charging time may be set in various manners, and may be set as an empirical value, where the empirical value may be obtained from historical data, or may be an actual value obtained by actually measuring probes of the same type, or may be an average value of actual measurement values of multiple array units in the same probe.

as another possible embodiment, the standard parameter is a standard tolerance value; the obtaining of the actual parameter according to the actual charging time and the detecting of whether the actual parameter is consistent with the standard parameter include: calculating to obtain an actual capacity value of the array unit to be tested according to the actual charging time; and detecting whether the actual capacity value is consistent with the standard capacity value.

optionally, the actual capacitance value of the array unit to be measured may be obtained by calculation according to a relation between the capacitance value and the charging time, where the relation between the capacitance value and the charging time is:

wherein Vc is a preset target voltage, Vs is a charging voltage, t is a charging time corresponding to the reference value, and R is a charging resistance; and C is a capacitance value to be detected.

If the actual parameter is consistent with the standard parameter, it is determined that the array unit to be tested is not in fault, otherwise, it is determined that the array unit to be tested is in fault, including: and if the actual capacity value is consistent with the standard capacity value, judging that the array unit to be tested does not have a fault, otherwise, judging that the array unit to be tested has a fault.

alternatively, the standard capacity value may be set in various ways, and may be set as an empirical value, such as a nominal value given by a factory, or may be set as an actual measurement value, such as a value obtained by measuring a normal array unit.

The working process of the fault detection device of the ultrasonic probe provided by the embodiment is as follows: the acquisition module 401 acquires an actual charging time required from the start of charging the array unit to be tested of the ultrasonic probe until the voltage output by the array unit to be tested reaches a predetermined target voltage. The detection module 402 obtains an actual parameter according to the actual charging time, and detects whether the actual parameter is consistent with a standard parameter, wherein the standard parameter is used for representing that no fault occurs in the array unit, and the actual parameter and the standard parameter are the same in type. The processing module 403 determines that the array unit to be tested does not fail when the actual parameter is consistent with the standard parameter, and determines that the array unit to be tested fails when the actual parameter is inconsistent with the standard parameter.

in the fault detection apparatus of the ultrasonic probe provided in this embodiment, by using the capacitance of the array unit to be detected of the ultrasonic probe, the detection module 402 determines the actual parameter of the array unit to be detected according to the actual charging time from the start of charging to the target voltage of the array unit to be detected, which is obtained by the obtaining module 401, and further determines whether the actual parameter is consistent with the standard parameter, and determines whether the array unit to be detected is faulty according to the determination result by the processing module 403. The whole judgment process can be completely automated, so that misjudgment or subjectivity caused by manual operation is avoided, and the fault judgment result is more objective and accurate.

Fig. 5 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to an embodiment of the present invention, as shown in fig. 5, in this embodiment, on the basis of the foregoing embodiment, an output of each array unit to be detected of the ultrasonic probe is connected to an acquisition module 401, a detection module 402, and a processing module 403, which correspond to each other, and in this embodiment, data processing speed can be increased by performing parallel processing on output voltages of the array units to be detected, so that a fault detection result can be obtained quickly and accurately.

Fig. 6 is a schematic structural diagram of a failure detection apparatus of an ultrasound probe according to an embodiment of the present invention, which describes the acquisition module 401 in detail based on the above embodiment, and as shown in fig. 6, in the apparatus, the acquisition module 401 includes a comparison unit 4011 and a timing unit 4012. The first input end of the comparison unit 4011 is connected to the array unit to be tested, and is configured to obtain a current output voltage of the array unit to be tested in real time from the start of charging the array unit to be tested of the ultrasonic probe; a second input terminal of the comparing unit 4011 is configured to receive the target voltage. The comparison unit 4011 is connected to the timing unit 4012, and is configured to compare the current output voltage of the array unit to be tested with the target voltage; if the current output voltage of the array unit to be tested is less than the target voltage, the step of comparing the current output voltage of the array unit to be tested with the target voltage is executed again, and the timing unit 4012 is instructed to stop timing until the current output voltage of the array unit to be tested reaches the target voltage. The timing unit 4012 is connected to the processing module 403, and configured to send a timing result obtained after timing is stopped to the processing module 403 as the actual charging time.

Optionally, the comparing unit 4011 is a voltage comparator.

The working process of the fault detection device of the ultrasonic probe provided by the embodiment is as follows: the comparing unit 4011 obtains the current output voltage of the array unit to be measured in real time from the start of charging the array unit to be measured of the ultrasonic probe, compares the output voltage with the received target voltage, compares the current output voltage with the received target voltage again if the current output voltage of the array unit to be measured is less than the received target voltage, instructs the timing unit 4012 to send the current timing result as the actual charging time to the processing module 403 according to the current comparison result if the current output voltage of the array unit to be measured is greater than or equal to the received target voltage (a timing stop control signal may be generated according to the current comparison result, and sends the timing stop control signal to the timing unit 4012, instructs the timing unit 4012 to stop timing, further sends the current timing result of the timing unit 4012 to the processing module 403, and may also generate a timing obtaining control signal according to the current comparison result, and sends the timing acquisition control signal to the timing unit 4012, and instructs the timing unit 4012 to send the current timing result to the processing module 403).

The output voltage of the array unit to be detected and detected in real time is compared with the target voltage through the comparator, the timing unit 4012 is indicated to stop timing according to the comparison result, the whole detection process is simple and direct, the delay is small, the actual charging time can be accurately obtained, and the accuracy of fault detection can be further improved.

As shown in fig. 6, in order to make the structure of the fault detection device more complete and easy to integrate, a fault detection device of an ultrasonic probe according to another embodiment of the present invention further includes: a dc voltage generation module 603; the dc voltage generation module 603 is connected to the array unit to be tested, and configured to generate a dc charging voltage, and send the dc charging voltage to the array unit to be tested, so as to charge the array unit to be tested.

The working process of the fault detection device of the ultrasonic probe provided by the embodiment is as follows: the dc voltage generating module 603 starts charging the array unit under test according to a charging control signal, which may be generated by the local processor or the system processor, and the timing unit 4012 of the obtaining module 401 starts timing according to the charging control signal. Until the array unit to be tested is charged to the target voltage, the timing unit 4012 stops timing, and sends the current timing result as the actual charging time to the processing module 403.

The fault detection device of the ultrasonic probe provided by the embodiment provides the charging voltage for charging the array unit to be detected through the newly added direct-current voltage generation module 603, can reduce the interference from other modules, generates stable charging voltage, and is favorable for further improving the accuracy of a fault detection result.

As shown in fig. 6, in order to further improve the structure of the fault detection apparatus and facilitate the integration of the apparatus, a further embodiment of the present invention provides a fault detection apparatus for an ultrasonic probe, further comprising: a band-gap reference circuit 601 and a voltage stabilizing circuit 602; the band-gap reference circuit 601 is connected with the voltage stabilizing circuit 602 and is used for generating a reference voltage; the voltage stabilizing circuit 602 includes an operational amplifier and a plurality of resistors, and is configured to adjust the reference voltage to generate the target voltage.

optionally, the operational amplifier may be connected to the plurality of resistors, where a non-inverting input terminal of the operational amplifier is connected to an output terminal of the bandgap reference circuit 601, an output terminal of the operational amplifier is connected to a gate of the regulating tube, a drain of the regulating tube is connected to the power supply, a source of the regulating tube is grounded through a resistor string formed by serially connecting the plurality of resistors, an inverting input terminal of the operational amplifier is connected to a voltage dividing node of the resistor string, and specifically, a selection of the connected voltage dividing node is related to a magnitude of the target voltage. The type of the adjusting tube is not limited as long as it is ensured that the feedback formed by the operational amplifier and the plurality of resistors is negative feedback, and optionally the adjusting tube may be an N-Metal-Oxide-Semiconductor (NMOS).

the working process of the fault detection device of the ultrasonic probe provided by the embodiment is as follows: the bandgap reference circuit 601 generates a reference voltage independent of temperature, adjusts the voltage level by the voltage regulator circuit 602, and forms a negative feedback circuit by an operational amplifier and a plurality of resistors to generate a stable output voltage as a target voltage.

In the embodiment, the stable target voltage irrelevant to temperature is generated through the band-gap reference circuit 601 and the voltage stabilizing circuit 602, the comparison result between the output voltage of the array unit to be detected and the target voltage can be further obtained, and more accurate actual charging time can be further obtained, so that the fault detection accuracy is improved.

Fig. 7 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to yet another embodiment of the present invention, and in order to further save hardware cost and simplify the structure of the fault detection apparatus, on the basis of the foregoing embodiment, as shown in fig. 7, the fault detection apparatus of an ultrasonic probe according to this embodiment further includes: a multiplexing module 404; a plurality of input ends of the multiplexing module 404 are connected with a plurality of array units to be tested in a one-to-one correspondence manner, an output end of the multiplexing module is connected with the obtaining module 401, and a selection end of the multiplexing module is connected with the processing module 403; the multiplexing module 404 is configured to receive the selection control signal sent by the processing module 403 through the selection end, and gate a corresponding input end according to the selection control signal to connect with the output end, so that the array unit to be tested connected with the gated input end is connected with the obtaining module 401.

In one possible implementation, the multiplexing module 404 includes: a plurality of switches;

One end of each of the switches is connected to a corresponding one of the input ends of the multiplexing module 404, the other end of each of the switches is connected to the output end of the multiplexing module 404, and the control ends of the switches are connected to the selection end of the multiplexing module 404.

The working process of the fault detection device of the ultrasonic probe provided by the embodiment is as follows: the multiplexing module 404 gates the corresponding input terminal to be connected to the output terminal according to the selection control signal sent by the processing module 403, so that the array unit to be tested corresponding to the input terminal is connected to the obtaining module 401, so that the obtaining module 401 obtains the output voltage of the gated array unit to be tested, and determines whether the output voltage reaches the target voltage, if so, the timing unit 4012 is instructed to send the current timing result to the processing module 403 as the actual charging time, so that the processing module 403 determines whether a fault occurs according to the actual charging time (specifically, the determination may be made according to the comparison result between the actual charging time and the standard charging time, and the determination may be made according to the comparison result between the actual charging time and the standard capacity value, so as to obtain the actual capacity value corresponding to the array unit to be tested according to the actual charging time, and determine whether a fault occurs according.

The embodiment is realized by arranging the multiplexing module 404, and a plurality of array units to be tested share one acquiring module 401 and one detecting module 402, so that the structure of the device can be simplified, the space can be saved, and the cost can be saved.

Fig. 8 is a schematic structural diagram of a fault detection apparatus of an ultrasonic probe according to another embodiment of the present invention, in order to avoid interference and even damage of a high-voltage signal generated in an original structure of the ultrasonic probe to the fault detection apparatus, as shown in fig. 8, the fault detection apparatus of the ultrasonic probe according to this embodiment further includes: an isolation module 404; the isolation module 404 is connected between the multiplexing module 404 and the acquisition module 401, and is configured to isolate a high-voltage signal generated by an ultrasonic array of an ultrasonic probe from the acquisition module 401.

optionally, the isolation module 404 is an optical coupling isolation module, a magnetic coupling isolation module, or a voltage amplitude limiting module. Alternatively, the isolation module 404 may be of various types, such as TX 810.

In the embodiment, the isolation module 404 is arranged between the array unit to be detected and the acquisition module 401, so that a high-voltage signal generated by an ultrasonic array of the ultrasonic probe can be isolated from the acquisition module 401, and the fault detection device is prevented from being damaged.

fig. 9 is a schematic structural diagram of an ultrasound probe according to another embodiment of the present invention, and as shown in fig. 9, an ultrasound probe according to another embodiment of the present invention includes: an ultrasonic probe body and a failure detection device of an ultrasonic probe according to any one of the above.

The ultrasonic probe provided by the embodiment of the invention can be used for executing the method embodiment, the implementation principle and the technical effect are similar, and the embodiment is not described again.

According to the ultrasonic probe provided by the embodiment of the invention, the capacitance resistance of the array unit to be detected of the ultrasonic probe is utilized, the actual parameter of the array unit to be detected is determined according to the obtained actual charging time from the start of charging to the target voltage of the array unit to be detected, and then whether the array unit to be detected fails or not is judged according to the comparison result of the actual parameter and the standard parameter. The whole judgment process can be completely automated, so that misjudgment or subjectivity caused by manual operation is avoided, and the fault judgment result is more objective and accurate.

finally, it should be noted that: the above embodiments are only used to illustrate the technical solution of the present invention, and not to limit the same; while the invention has been described in detail and with reference to the foregoing embodiments, it will be understood by those skilled in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some or all of the technical features may be equivalently replaced; and the modifications or the substitutions do not make the essence of the corresponding technical solutions depart from the scope of the technical solutions of the embodiments of the present invention.