阅读说明：本技术 基于发射率迭代的三波长比色红外测温系统、方法及装置 (Three-wavelength colorimetric infrared temperature measurement system, method and device based on emissivity iteration ) 是由 王宪玉 于 2021-08-31 设计创作，主要内容包括：本发明提供了一种基于发射率迭代的三波长比色红外测温系统、方法及装置,包括：透镜模块、分光模块、接收与电流放大转化模块、A/D转换模块和数据处理模块；透镜模块汇聚红外辐射光子,分光模块分割红外辐射信号,使红外辐射信号成为独立的三路信号,三路信号通过不同的滤光片后被三个探测器接收；接收与电流放大转换模块实时接收三个光路的光子流,产生电流,并将电流放大输出至A/D转换模块；A/D转换模块将接收到的电流进行数字转换,数据处理模块处理计算测物的温度值。本发明利用分光镜与反射镜,设置三个波段的波长进行光学检测,并且每个波段的波长相差较大,利用不同波长的不同穿透与检测特性,适应不同检测环境与检测精度要求。(The invention provides a three-wavelength colorimetric infrared temperature measurement system, a three-wavelength colorimetric infrared temperature measurement method and a three-wavelength colorimetric infrared temperature measurement device based on emissivity iteration, wherein the three-wavelength colorimetric infrared temperature measurement system comprises the following steps: the device comprises a lens module, a light splitting module, a receiving and current amplifying and converting module, an A/D (analog/digital) converting module and a data processing module; the lens module converges infrared radiation photons, the light splitting module splits infrared radiation signals to enable the infrared radiation signals to become three independent signals, and the three signals are received by the three detectors after passing through different optical filters; the receiving and current amplification conversion module receives photon streams of the three light paths in real time, generates current and amplifies and outputs the current to the A/D conversion module; the A/D conversion module carries out digital conversion on the received current, and the data processing module processes and calculates the temperature value of the measured object. The invention uses the spectroscope and the reflector to set the wavelength of three wave bands for optical detection, and the wavelength difference of each wave band is larger, and the invention uses the different penetration and detection characteristics of different wavelengths to adapt to different detection environments and detection precision requirements.)

1. A three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration is characterized by comprising: the device comprises a lens module, a light splitting module, a receiving and current amplifying and converting module, an A/D (analog/digital) converting module and a data processing module;

the lens module converges infrared radiation photons emitted by an object to be detected into a photon stream, and then the photon stream reaches the light splitting module;

the light splitting module is used for splitting the converged photon flow to enable the converged photon flow to become three relatively independent signals, and the three signals are received by three same detectors after passing through different optical filters respectively;

the receiving and current amplifying conversion module receives photon streams of three light paths in real time, generates corresponding current and amplifies and outputs the current to the A/D conversion module;

the A/D conversion module carries out digital conversion on the received current, and the current is converted into digital quantity to be used for operation and analysis of the data processing module;

and the data processing module processes the acquired digital quantity to obtain the temperature value of the measured object at the current moment.

2. The emissivity iteration-based three-wavelength colorimetric infrared temperature measurement system according to claim 1, wherein: the lens module comprises a lens, a collimating mirror and a light path protecting shell, wherein the lens and the collimating mirror are both arranged in the light path protecting shell, the lens is used for blocking dust and smoke impurities in the air, and infrared radiation photons emitted by an object to be detected are converged into a photon stream by the collimating mirror to reach the light splitting module.

3. The emissivity iteration-based three-wavelength colorimetric infrared temperature measurement system according to claim 1, wherein: the light splitting module comprises a first light splitting mirror, a second light splitting mirror, a first reflecting mirror, a second reflecting mirror, a first light filter, a second light filter and a third light filter, photon flow emitted by the collimating mirror reaches the first light splitting mirror and then is divided into two paths, one path forms a light path A, and the light path A passes through the first light filter; the other path of light is emitted to a first reflector, passes through the first reflector, reaches a second spectroscope, and is divided into two paths of light again through the second spectroscope, wherein one path of light forms a light path B, and the light path B passes through a second optical filter; and the other path of light is emitted to a second reflector and reflected by the second reflector to form a light path C, and the light path C passes through a third light filter.

4. The iterative emissivity-based three-wavelength colorimetric infrared temperature measurement system according to claim 3, wherein: the first optical filter, the second optical filter and the third optical filter have different central wavelengths and effective bandwidths.

5. The emissivity iteration-based three-wavelength colorimetric infrared temperature measurement system according to claim 1, wherein: and when the data processing module is used for operation and analysis, the incident radiation value of the optical path A is calculated according to half.

6. A three-wavelength colorimetric infrared temperature measurement method based on emissivity iteration, which adopts the three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration of any one of claims 1 to 5, and is characterized by comprising the following steps:

step S1: obtaining a relation between the ratio of spectral radiance of the non-blackbody and the temperature by using a Wien formula, and calculating the temperature T of the colorimetric thermometers of the three light paths according to the pairwise matching principle of the radiant energy with different wavelengths of the light path A, the light path B and the light path C₁ ⁱ、Andand calculating the theoretical calculated temperature TⁱAnd i represents the ith time in the time sequence;

step S2: and modifying the emissivity of the three optical paths according to the difference value between the calculated temperature and the theoretical calculated temperature of the colorimetric thermometers of the three optical paths, recalculating the calculated temperature and the theoretical calculated temperature of the colorimetric thermometers of the three optical paths after modification, finishing iterative calculation when the theoretical calculated temperatures calculated for two consecutive times are less than a set value, and taking the theoretical calculated temperature calculated for the last time as the temperature of the object to be measured, otherwise, continuously modifying the emissivity of the three optical paths.

7. The emissivity iteration-based three-wavelength colorimetric infrared temperature measurement method of claim 6, wherein: the step S2 includes the following sub-steps:

step S2.1: initializing parameters, setting the parameters alpha and beta e (0.01 and 0.1) when i is equal to 1, setting the initial values of the emissivity of the three optical paths, wherein alpha is larger than beta;

step S2.2: calculating theoretical temperature detection values T of three optical paths₁ ⁱ、And calculating the theoretical true temperature Tⁱ，

Step S2.3: if i is greater than or equal to 2 and | Tⁱ-T^i-1If | < 5, the iterative computation is ended, and the object detection temperature is TⁱOtherwise, the step S2.4 is carried out;

step S2.4: calculating theoretical temperature detection values T of three optical paths₁ ⁱ、And theoretical true temperature TⁱThe difference of (A) is respectively recorded asAndand toAndsorting the sizes and recording the maximum valueIntermediate value memoryMinimum value memoryThe corresponding optical path emissivity is expressed asCalculating two difference values

Step S2.5: if it isThenAnd alpha > beta, alpha, beta epsilon (0.01,0.1) otherwise

Step S2.6: will be updatedSubstituting the corresponding optical path to increase the value of i by 1, and returning to step S2.2.

8. The emissivity iteration-based three-wavelength colorimetric infrared thermometry method of claim 7, wherein: the initial values of the emissivity of the three optical paths in the step S2.1 are set as: and

9. the emissivity iteration-based three-wavelength colorimetric infrared temperature measurement method of claim 6, wherein: the three light paths colorimetric thermometers calculate the temperature T₁ ⁱ、Andwhen the difference value is in the set range, the theoretical calculation temperature T is directly calculated without adjusting the emissivity of the optical pathⁱAs the temperature of the object.

10. The utility model provides a three wavelength color comparison infrared temperature measuring device based on emissivity iteration which characterized in that: use of an emissivity iteration based three wavelength colorimetric infrared thermometry system according to any of claims 1-5.

Technical Field

The invention relates to the field of infrared temperature measurement, in particular to a three-wavelength colorimetric infrared temperature measurement system, a three-wavelength colorimetric infrared temperature measurement method and a three-wavelength colorimetric infrared temperature measurement device based on emissivity iteration.

Background

The infrared temperature measuring device is a device for detecting the temperature distribution around the device, but with the development of science and technology, the requirements of people on the temperature measuring device are higher and higher, so that the traditional temperature measuring device cannot meet the use requirements of people;

the existing calibration method for the infrared temperature measuring device mainly comprises the steps that after the infrared temperature measuring device measures the temperature of each object, the temperature measuring device is used manually to accurately measure the temperature of the object and is compared with the temperature detected by a camera, and therefore the error between the temperature detected by the temperature measuring device and the actual object temperature is detected. Particularly, interference such as high temperature, dust, water mist and the like can exist in the metallurgical production process, and the application of the infrared temperature measuring device in the temperature measuring scene is limited.

Many studies attempt to propose a correction method or a compensation method to overcome the influence of environmental factors on the infrared temperature measurement accuracy, such as research on the influence of temperature measurement distance, field angle, atmospheric transmittance and the like on the infrared temperature measurement. The research reduces the error of the infrared temperature measurement method caused by environmental factors to a certain extent, and improves the precision of the infrared temperature measurement method. Dust is a common environmental factor in the industrial production process and has a non-negligible influence on an infrared temperature measurement method. However, there are few reports on how to overcome the influence of dust on infrared temperature measurement, which also limits the application of the infrared temperature measurement device in the temperature measurement scene with dust.

Application No. 201610096695.7 is an infrared temperature detection precision correction method, in which the relation among the measurement angle, the observation distance, the measurement result and the actual temperature value is obtained by comprehensively studying the influence of the observation angle and the observation distance on the actual temperature measurement process of the thermal infrared imager, so that the actual temperature measurement result is corrected, and the temperature measurement precision of the thermal infrared imager is improved. This patent is only to measuring visual angle and observation distance to thermal infrared imager temperature measurement precision's influence, can't be applicable to the temperature measurement scene that has the dust in the light path.

The patent with application number 201910969515.5 discloses an infrared temperature measurement calibration method, an infrared temperature measurement calibration device, an infrared thermal imaging device and a storage device. The method comprises the following steps: measuring gray values of a plurality of temperature points of the black body at an isothermal difference interval by using first to-be-calibrated infrared thermal imaging equipment; and drawing a curve template based on the gray value. And inputting the curve template into a second infrared thermal imaging device to be calibrated, compensating the reference temperature of the second infrared thermal imaging device to be calibrated, and adjusting the parameters of an infrared detector. By the mode, the calibration process period can be shortened, and the process is simple, convenient and efficient. However, since the second to-be-calibrated infrared thermal imaging device is the first to-be-calibrated infrared thermal imaging device or the to-be-calibrated infrared thermal imaging device with the infrared detector of the same type as the first to-be-calibrated infrared thermal imaging device, the adaptive environment of the second to-be-calibrated infrared thermal imaging device is required to be consistent with that of the first representative T-infrared thermal imaging device, and the second to-be-calibrated infrared thermal imaging device does not have wide adaptability to the environment.

In chinese patent publication No. CN111272296B, a calibration method and system for reducing the influence of dust in an optical path on infrared temperature measurement are introduced, in which an original mechanism model is established according to the infrared temperature measurement principle, a dust transmittance is obtained based on the original mechanism model and a reference body under the influence of dust, a mechanism calibration model under the influence of dust is established based on the original mechanism model and the dust transmittance, and an infrared temperature measurement result under the influence of dust is obtained based on the mechanism calibration model.

Disclosure of Invention

Aiming at the defects in the prior art, the invention aims to provide a three-wavelength colorimetric infrared temperature measurement system, a three-wavelength colorimetric infrared temperature measurement method and a three-wavelength colorimetric infrared temperature measurement device based on emissivity iteration.

The invention provides a three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration, which comprises: the device comprises a lens module, a light splitting module, a receiving and current amplifying and converting module, an A/D (analog/digital) converting module and a data processing module;

the lens module converges infrared radiation photons emitted by an object to be detected into a photon stream, and then the photon stream reaches the light splitting module;

the light splitting module is used for splitting the converged photon flow to enable the converged photon flow to become three relatively independent signals, and the three signals are received by three same detectors after passing through different optical filters respectively;

the receiving and current amplifying conversion module receives photon streams of three light paths in real time, generates corresponding current and amplifies and outputs the current to the A/D conversion module;

the A/D conversion module carries out digital conversion on the received current, and the current is converted into digital quantity to be used for operation and analysis of the data processing module;

and the data processing module processes the acquired digital quantity to obtain the temperature value of the measured object at the current moment.

Preferably, the lens module includes a lens, a collimating mirror and a light path protecting casing, the lens and the collimating mirror are both disposed in the light path protecting casing, the lens is used for blocking dust and smoke impurities in the air, and the collimating mirror converges infrared radiation photons emitted by an object to be measured into a photon stream to reach the light splitting module;

preferably, the light splitting module includes a first light splitting mirror, a second light splitting mirror, a first reflective mirror, a second reflective mirror, a first optical filter, a second optical filter, and a third optical filter, the photon flow emitted by the collimating mirror reaches the first light splitting mirror and then is divided into two paths, one path constitutes a light path a, and the light path a passes through the first optical filter; the other path of light is emitted to a first reflector, passes through the first reflector, reaches a second spectroscope, and is divided into two paths of light again through the second spectroscope, wherein one path of light forms a light path B, and the light path B passes through a second optical filter; and the other path of light is emitted to a second reflector and reflected by the second reflector to form a light path C, and the light path C passes through a third light filter.

Preferably, the first filter, the second filter and the third filter have different central wavelengths and effective bandwidths.

Preferably, when the data processing module performs operation and analysis, the incident radiation value of the optical path a is calculated according to a half.

The invention provides a three-wavelength colorimetric infrared temperature measurement method based on emissivity iteration, which comprises the following steps of:

step S1: obtaining a relation between the ratio of spectral radiance of the non-blackbody and the temperature by using a Wien formula, and calculating the temperature T of the colorimetric thermometers of the three light paths according to the pairwise matching principle of the radiant energy with different wavelengths of the light path A, the light path B and the light path C₁ ⁱ、Andand calculating the theoretical calculated temperature TⁱAnd i represents the ith time in the time sequence;

step S2: and modifying the emissivity of the three optical paths according to the difference value between the calculated temperature and the theoretical calculated temperature of the colorimetric thermometers of the three optical paths, recalculating the calculated temperature and the theoretical calculated temperature of the colorimetric thermometers of the three optical paths after modification, finishing iterative calculation when the theoretical calculated temperatures calculated for two consecutive times are less than a set value, and taking the theoretical calculated temperature calculated for the last time as the temperature of the object to be measured, otherwise, continuously modifying the emissivity of the three optical paths.

Preferably, the step S2 includes the following sub-steps:

step S2.1: initializing parameters, setting the parameters alpha and beta e (0.01 and 0.1) when i is equal to 1, setting the initial values of the emissivity of the three optical paths, wherein alpha is larger than beta;

step S2.2: calculating theoretical temperature detection values T of three optical paths₁ ⁱ、And calculating the theoretical true temperature Tⁱ，

Step S2.3: if i is greater than or equal to 2 and | Tⁱ-T^i-1If | < 5, the iterative computation is ended, and the object detection temperature is TⁱOtherwise, the step S2.4 is carried out;

step S2.4: calculating theoretical temperature detection values T of three optical paths₁ ⁱ、And theoretical true temperature TⁱThe difference of (A) is respectively recorded asAndand toAndsorting the sizes and recording the maximum valueIntermediate value memoryMinimum value memoryThe corresponding optical path emissivity is expressed asCalculating two difference values

Step S2.5: if it isThenAnd alpha > beta, alpha, beta epsilon (0.01,0.1) otherwise

Step S2.6: will be updatedSubstituting the corresponding optical path to increase the value of i by 1, and returning to step S2.2.

Preferably, the initial values of the emissivity of the three optical paths in the step S2.1 are set as: and

preferably, the three-light-path colorimetric thermometers calculate the temperature T₁ ⁱ、Andwhen the difference value is in the set range, the theoretical calculation temperature T is directly calculated without adjusting the emissivity of the optical pathⁱAs the temperature of the object.

According to the three-wavelength colorimetric infrared temperature measuring device based on emissivity iteration, the three-wavelength colorimetric infrared temperature measuring system based on emissivity iteration is adopted.

Compared with the prior art, the invention has the following beneficial effects:

1. the spectroscope and the reflector are used for setting the wavelengths of three wave bands for optical detection, and the wavelength difference of each wave band is larger, so that different penetration and detection characteristics of different wavelengths are used, and different detection environments and detection precision requirements are met.

2. The emissivity does not need to be calibrated, the correlation of the time sequence of the detected temperature can be utilized, the temperature of the detected object can not jump in a short adjacent time period, a functional relation between the temperature and the emissivity can be established in a plurality of time periods, the real emissivity under the condition of the current temperature is continuously approximated by an emissivity iteration method, and the detected temperature at the current moment is further obtained.

3. The real detection temperature is fitted by detecting the temperature values through the three wavelengths, so that the detection error caused by the selection of the wavelengths is avoided, and the detection precision is improved.

Drawings

Other features, objects and advantages of the invention will become more apparent upon reading of the detailed description of non-limiting embodiments with reference to the following drawings:

FIG. 1 is a distribution diagram of a three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration according to an embodiment of the invention;

FIG. 2 is a flowchart of a three-wavelength colorimetric infrared temperature measurement method based on emissivity iteration.

Detailed Description

The present invention will be described in detail with reference to specific examples. The following examples will assist those skilled in the art in further understanding the invention, but are not intended to limit the invention in any way. It should be noted that it would be obvious to those skilled in the art that various changes and modifications can be made without departing from the spirit of the invention. All falling within the scope of the present invention.

The invention discloses a three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration, which comprises a lens module, a light splitting module, a receiving and current amplification conversion module, an A/D conversion module and a data processing module, as shown in figure 1.

The lens module comprises a lens, a collimating mirror and a light path protective shell, wherein the light path protective shell is internally provided with the lens and the collimating mirror. The lens blocks impurities such as dust, smoke and the like in the environment, only infrared radiation photons emitted by an object to be detected are allowed to pass through, and the infrared radiation photons are converged into a photon stream by the collimating lens to reach the light splitting module.

The light splitting module utilizes optical devices such as a reflector, a light splitter and the like to separate radiation signals into three relatively independent signals, then the three signals pass through light filters with different wavelengths respectively, and finally the three radiation signals are received by the same three detectors. Because each filter has its own center wavelength and effective bandwidth, the filter also does not completely guarantee the passage of only the desired wavelength of photons. When the central wavelength of the optical filter is relatively close, the detection error is more easily caused.

The light splitting module comprises a first light splitting mirror, a second light splitting mirror, a first reflecting mirror, a second reflecting mirror, a first light filter, a second light filter and a third light filter, photon flow emitted by the collimating mirror reaches the first light splitting mirror and then is divided into two paths, one path forms a light path A, and the light path A passes through the first light filter; the other path of light is emitted to a first reflector, passes through the first reflector, reaches a second spectroscope, and is divided into two paths of light again through the second spectroscope, wherein one path of light forms a light path B, and the light path B passes through a second optical filter; and the other path of light is emitted to a second reflector and reflected by the second reflector to form a light path C, and the light path C passes through a third light filter.

Considering that the optical paths B and C are subjected to secondary light splitting, and the received optical path radiation value is only half of the incident radiation value of the optical path A, when the colorimetric temperature measurement calculation is carried out, the incident radiation value of the optical path A is calculated according to the half of the incident radiation value.

When the receiving and current amplifying conversion module receives photon flows of the three light paths in real time, corresponding current is generated. Since the current is in the order of μ a, the current needs to be amplified and converted into a voltage value in the order of mV for output.

The A/D conversion module carries out digital conversion on the received mV voltage value, and the mV voltage value is converted into digital quantity within a certain range to be used for the data processing module to carry out operation analysis.

The data processing module processes the acquired data by adopting an emissivity iteration method so as to obtain a temperature value of the measured object at the current moment.

The temperature measurement method of the three-wavelength colorimetric infrared temperature measurement system based on emissivity iteration is shown in fig. 2, and specifically includes the following steps:

the infrared temperature measurement is a colorimetric temperature measurement method, also called a bicolor method, which determines a temperature value according to the ratio of radiant energy of two adjacent wavelengths at the same point at the same time, so that the device characteristics can be eliminatedAnd (4) realizing the gray level normalization of image processing under the influence of time-varying factors such as sexual adjustment and lens pollution. The idea is to use two wavelengths lambda₁And λ₂Simultaneously measuring monochromatic radiant energy emitted from the same pointAndafter the monochromatic radiation intensity signal is subjected to computer digital processing, the temperature T of the point can be calculated according to the ratio of the monochromatic radiation intensity signal to the monochromatic radiation intensity signal, and the relational expression between the ratio of the spectral radiation brightness of the non-blackbody and the temperature of the non-blackbody is obtained by using a Wien formula:

wherein C is₂Is the second radiation constant, the emissivity e (lambda) of the object when the actual object is a gray body or close to a gray body₁T) — epsilon (T), the colorimetric temperature of the real object can be considered equal to its true temperature. If the two wavelengths are properly selected, the absorbance is considered to be substantially invariant with wavelength within the allowable range of measurement accuracy. Therefore, the real object can be regarded as 'grey body', and the result measured by a colorimetric measurement formula is used as the real temperature of the object.

Through the structural design, the radiation energy of three light paths under different wavelengths can be obtained by the thermodetector at the same time, and the following relational expression can be established at the same time according to the principle of pairwise pairing:

in the formula, the superscript i represents the ith time in the time series. Fitting a polynomial to obtain

Suppose true temperature is TⁱThen, then

Order toAnd performing Taylor series expansion on the above formula

After further finishing, the product can be obtained

Obviously, A + B + C is 0

Can obtain the product

Since the wavelengths of the three optical paths are greatly different from each other, epsilon cannot be simply regarded asⁱ(λ₁,T)≈εⁱ(λ₂,T)≈εⁱ(λ₃T) and should be considered asⁱ(λ₁,T)≠εⁱ(λ₂,T)≠εⁱ(λ₃T). Meanwhile, since the temperature is measured at the same time, the temperature detection value should be calculated as

Suppose thatNamely, the difference between the temperature value calculated by adopting the optical path A and the true value is the largest, the optical path is divided into B times, and the calculation error of the optical path C is the smallest. In this case, the emission rate of the optical path A can be properly reducedAnd the emissivity of the optical path C is properly increased. The specific adjusting method comprises the following steps:

step 1: initializing parameters, setting i to 1

Step 2: calculating theoretical temperature detection values T of the three light paths through a colorimetric temperature measurement calculation formula (2)₁ ⁱ、Calculating theoretical true temperature Tⁱ。

And step 3: if i is greater than or equal to 2, | Tⁱ-T^i-1If | < 5, the iterative computation is ended, and the object detection temperature is Tⁱ。

And step 3: computingAndaccording to big to small pairsAndsorting and recording the maximum valueIntermediate value memoryMinimum value memoryThe corresponding optical path emissivity is expressed as Calculating two difference values

And 4, step 4: if it isThenAnd alpha > beta, alpha, beta epsilon (0.01,0.1) otherwise

And 5: will be updatedAnd substituting the corresponding optical path, i equals to i +1, and returning to the step 2.

It is considered that the temperature change of the detection object is continuous and slow. Therefore, it can be assumed that the temperature change is very small in adjacent two unit intervals. Then in the next unit time

Thus, the emissivity at the next moment may be replaced with the emissivity at the previous moment, when T₁ ⁱ、The difference value between the two can be obtained according to a formula without adjusting the emissivity within a certain range.

The present invention is further illustrated below with reference to specific parameters.

Emissivity parameter for three wavelengthsFor the determination, the three central wavelengths of the infrared light selected in this embodiment are 850nm, 990nm, and 1250nm, respectively. The photon flow detector is a high-precision silicon photodiode, the chip size is 10mm multiplied by 10mm, and the response time is 8 mus. The spectroscope is a plane non-polarizing spectroscope with the splitting ratio of 50R/50T. The central wavelength of the optical filter is three infrared light set wavelengths, and the half bandwidth of the optical filter is 10 nm. The current amplification module is a high-precision IV conversion module, and the dark current of the current amplification module can reach the pA level. The A/D conversion module adopts an ADS1256 module, and the detection precision can reach 24 bits. The digital processing unit adopts a stm32 data processing module, the inner core of the data processing module is an ARM 32-bit Cortex-M3 CPU, the highest working frequency is 72MHz, and the highest working frequency is 1.25 DMIPS/MHz. The infrared detection device signal is connected to the computer through the network cable. The infrared radiator of the measured target is a Fluke infrared blackbody source.

And placing the infrared blackbody source 3 meters in front of the detection device, fixing the infrared detection device on the triangular support, setting the temperature of the infrared blackbody source to be constant at 1100 ℃ in the experimental process, and measuring the current radiation intensity of the photon flow by using three light paths of the infrared thermal imaging device respectively.

The received radiant energy of the optical path a needs to be calculated by half its energy when performing the calculation. Through the conversion between the receiving device and the IV conversion amplifying device, the output voltages of the optical path A, B, C can be obtained to be 3.65V, 3.74V, and 3.2V, respectively, before the a/D conversion.

At the time of initial calculation, it is possible to setThe measured experimental data are calculated by using the formula (2), and T can be obtained₁ ¹＝1090.34℃、T₁ ¹＝1188.21℃、T₁ ¹1142.98 ℃. The theoretical real temperature T can be calculated by the formula (6)¹There is a large error in the calculation when 1140.51 c is measured and the actual true temperature is 1100 c.

Calculating temperature T according to three light paths colorimetric temperature measurement₁ ¹、And calculating the temperature T theoretically¹Can respectively calculate the detection errors of the three light pathsAndat this time

Further, can obtain

Due to the fact thatTherefore, the temperature of the molten metal is controlled,

and at the next moment, substituting the updated three light path emissivity into the three light path emissivity to calculate again. After three iterations, T₁ ⁴＝1080.3℃，Theoretical calculation of temperature T⁴1101.22 ℃, the theoretical calculated temperature is T since the last iteration was calculated³＝1102.32℃，|T⁴-T³And | < 5 ℃, the iterative computation ending condition is met, the computation is ended, and the system output detection temperature is 1102.32 ℃.

In conclusion, the device establishes the light path channels with three wavelengths, continuously approaches the real emissivity by iteratively calculating the emissivity of each light path, and further obtains the real temperature of the surface of the measured object.

Those skilled in the art will appreciate that, in addition to implementing the system and its various devices, modules, units provided by the present invention as pure computer readable program code, the system and its various devices, modules, units provided by the present invention can be fully implemented by logically programming method steps in the form of logic gates, switches, application specific integrated circuits, programmable logic controllers, embedded microcontrollers and the like. Therefore, the system and various devices, modules and units thereof provided by the invention can be regarded as a hardware component, and the devices, modules and units included in the system for realizing various functions can also be regarded as structures in the hardware component; means, modules, units for performing the various functions may also be regarded as structures within both software modules and hardware components for performing the method.

In the description of the present application, it is to be understood that the terms "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", and the like indicate orientations or positional relationships based on those shown in the drawings, and are only for convenience in describing the present application and simplifying the description, but do not indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and thus, should not be construed as limiting the present application.

The foregoing description of specific embodiments of the present invention has been presented. It is to be understood that the present invention is not limited to the specific embodiments described above, and that various changes or modifications may be made by one skilled in the art within the scope of the appended claims without departing from the spirit of the invention. The embodiments and features of the embodiments of the present application may be combined with each other arbitrarily without conflict.