Naphthol resin, epoxy resin composition, and cured product thereof

文档序号:213919 发布日期:2021-11-05 浏览:22次 中文

阅读说明:本技术 萘酚树脂、环氧树脂、环氧树脂组合物及其固化物 (Naphthol resin, epoxy resin composition, and cured product thereof ) 是由 和佐野次俊 石原一男 中原和彦 于 2020-03-25 设计创作,主要内容包括:本发明提供赋予高耐热、低介质损耗角正切、低线膨胀系数(CTE)等特征的萘酚树脂、环氧树脂和以萘酚树脂或环氧树脂为必须成分的环氧树脂组合物及它们的固化物。具体地,本发明提供萘酚树脂、以该萘酚树脂为原料的环氧树脂以及含有它们的树脂组合物,所述萘酚树脂由下述式(式中,R~(1)表示氢或碳数1~6的烷基,n表示重复数,为2~10的数)表示,n=6以上的成分以GPC测定的面积比率计为15%以上,n=1的成分以GPC测定的面积比率计为30%以下,且羟基当量为260~400g/eq。(The present invention provides a naphthol resin and an epoxy resin which impart characteristics such as high heat resistance, low dielectric loss tangent and low coefficient of linear expansion (CTE), an epoxy resin composition containing the naphthol resin or the epoxy resin as an essential component, and a cured product thereof. Specifically, the present invention provides a naphthol resin represented by the following formula (wherein R is R), an epoxy resin using the naphthol resin as a raw material, and a resin composition containing the same 1 Represents hydrogen orAn alkyl group having 1 to 6 carbon atoms, wherein n represents a repeating number and is a number of 2 to 10), wherein a component having n of 6 or more is 15% or more by area ratio measured by GPC, a component having n of 1 is 30% or less by area ratio measured by GPC, and a hydroxyl group equivalent is 260 to 400 g/eq.)

1. A naphthol resin represented by the following general formula (1), wherein the content of n-6 or more is 15% or more, the content of n-1 is 30% or less, and the hydroxyl group equivalent weight is 260 to 400g/eq, in terms of an area ratio measured by GPC,

in the formula, R1Represents hydrogen or alkyl having 1 to 6 carbon atoms, and n represents a repetition number of 0 to 20 and an average value of 2.0 to 10.0.

2. A naphthol resin according to claim 1, wherein the softening point is from 100 to 150 ℃ and the melt viscosity at 150 ℃ as measured with an ICI viscometer is from 1.0 to 20.0 Pa-s.

3. A process for producing a naphthol resin according to claim 1 or 2, which comprises reacting a naphthol with a condensing agent represented by the following general formula (3) to obtain a naphthol resin according to claim 1 or 2, wherein the amount of the alcohol refluxed in the reaction system is adjusted to a range of 0.01 to 0.4 mol based on 1mol of the naphthol as the raw material,

R3is an alkyl group having 1 to 6 carbon atoms.

4. An epoxy resin obtained by reacting the naphthol resin according to claim 1 with epichlorohydrin, wherein the epoxy resin is represented by the following general formula (2), and has a content of n-6 or more of 15% or less, a content of n-1 of 30% or less, and an epoxy equivalent of 330 to 450g/eq, in terms of an area ratio measured by GPC,

in the formula, R2And n represents a repeating number of 0 to 20 and an average value of 2.0 to 10.0.

5. The epoxy resin according to claim 4, wherein the melt viscosity at 150 ℃ measured with an ICI viscometer is 1.0 to 20.0 Pa-s at a softening point of 90 to 140 ℃.

6. A curable resin composition comprising the naphthol resin according to claim 1 and a curable resin as essential components.

7. A curable resin composition comprising the epoxy resin according to claim 4 and a curing agent as essential components.

8. A cured product obtained by curing the curable resin composition according to claim 6 or 7.

Technical Field

The present invention relates to naphthol resins and epoxy resins which impart characteristics such as high heat resistance, low dielectric loss tangent and low coefficient of linear expansion (CTE), and epoxy resin compositions containing these naphthol resins and epoxy resins as essential components, and cured products thereof.

Background

Epoxy resin compositions containing an epoxy resin and a curing agent thereof as essential components are widely used for electronic parts such as semiconductor sealing materials and printed circuit boards, from the viewpoint of excellent balance among high heat resistance, high toughness, cost, and the like.

In recent years, with the progress in the field of advanced materials, development of epoxy resins and curing agents with higher performance has been demanded. For example, in the field of electronic parts, as the frequency increases, electronic-part-related materials such as circuit boards are required to have unprecedented low dielectric loss tangents in order to reduce transmission loss. In addition, as represented by mobile devices, communication devices have been rapidly reduced in size and weight, and insulating materials such as circuit boards used for these devices have been increasingly thinner. Therefore, warpage due to heat is likely to occur, and measures for increasing heat resistance and decreasing CTE have been taken. Under such circumstances, the epoxy resin and the curing agent used in the circuit board material are required to satisfy various properties such as low dielectric loss tangent, high heat resistance, and low CTE at the same time.

Generally, the main reason why the dielectric loss tangent of the cured epoxy resin becomes high is due to polar groups occurring during the curing reaction, and therefore, it is advantageous that the concentration of functional groups is low. In this regard, patent document 1 describes a resin composition in which a polyvalent hydroxyl resin having a hydroxyl equivalent optionally adjusted by adding styrene is blended to lower the dielectric constant. Patent document 2 discloses a resin composition in which the functional group concentration is reduced by using a resin obtained by condensing an aromatic compound having an alkoxy group, and patent document 3 discloses a method in which the functional group concentration is reduced by alkoxylating the hydroxyl group of a naphthol resin.

However, a decrease in the concentration of the functional group causes a decrease in the crosslinking density, and thus the heat resistance is extremely decreased. In general, in order to improve heat resistance of a curing agent or an epoxy resin, a method of adjusting a molecular weight distribution to increase a molecular weight is known. In addition, it is effective to reduce the free volume of the cured resin for lowering the CTE, and for example, when a naphthalene structure is introduced, it is known that the CTE is lowered by reducing the free volume by stacking naphthalene rings. However, in the method of patent document 1, since the added styrene inhibits the reaction, it is difficult to improve the heat resistance regardless of the molecular weight, and the added styrene increases the free volume, so that the effect of lowering the CTE is not seen. Patent document 2 describes lowering the dielectric constant and reactivity, but no studies have been made on heat resistance and lowering the CTE. In addition, in the method of patent document 3, although the CTE is reduced because of the naphthol resin containing a naphthalene skeleton, which is effective for lowering the CTE, the alkoxylation is limited to a low molecular weight resin, and therefore, the method cannot be applied to a high molecular weight resin having high heat resistance, and even if the resin obtained by the method is used, the low dielectric loss tangent, the low CTE, and the high heat resistance cannot be achieved.

Patent document 4 describes: when a naphthol resin is synthesized using p-xylylene glycol dimethyl ether (p-xylylene glycol dimethyl ether) as a condensing agent, the distillation of methanol generated under normal pressure is delayed, and thus methanol reacts with a naphthol aralkyl resin or naphthol to generate a methoxide, so that the hydroxyl equivalent of the naphthol aralkyl resin is increased. However, under the conditions of normal pressure described in patent document 4, a resin satisfying both the molecular weight distribution and the hydroxyl equivalent weight within the range of the present invention cannot be obtained.

Documents of the prior art

Patent document

Patent document 1: WO2013/157061A1

Patent document 2: japanese patent laid-open publication No. 2006 + 97004

Patent document 3: japanese laid-open patent publication No. 2006-160868

Patent document 4: japanese patent laid-open publication No. 1993 and 155985

Disclosure of Invention

Accordingly, an object of the present invention is to provide a naphthol resin, an epoxy resin, a resin composition thereof, and a cured product thereof, which are capable of realizing a low dielectric loss tangent, a low CTE, a high molecular weight, and a low functional group concentration suitable for a recent high-frequency electronic component-related material without lowering heat resistance after curing.

Namely, the present invention provides a naphthol resin represented by the following general formula (1), wherein the content of n-6 or more is 15% or more, the content of n-1 is 30% or less, and the hydroxyl group equivalent weight is 260 to 400g/eq,

[ solution 1]

(in the formula, R1Represents hydrogen or alkyl having 1 to 6 carbon atoms, and n represents a repetition number of 0 to 20 and an average value of 2.0 to 10.0. ). The softening point of the naphthol resin is 100 to 150 ℃, and the melt viscosity at 150 ℃ measured with an ICI viscometer is 1.0 to 20.0Pa · s.

The present invention is a process for producing a naphthol resin according to claim 1 or 2, which comprises reacting a naphthol with a condensing agent represented by the following general formula (3), wherein the amount of alcohol refluxed in the reaction system is adjusted to a range of 0.01 to 0.4 mol based on the amount of the naphthol as a raw material,

[ solution 2]

(R3An alkyl group having 1 to 6 carbon atoms).

The epoxy resin is obtained by reacting the naphthol resin with epichlorohydrin, and is characterized in that the epoxy resin is represented by the following general formula (2), the component with n of 6 or more is 15% or more, the component with n of 1 is 30% or less, and the epoxy equivalent is 330 to 450g/eq,

[ solution 3]

(in the formula, R2And n represents a repeating number of 0 to 20 and an average value of 2.0 to 10.0. ). The softening point of the epoxy resin is 90-140 ℃, and the melt viscosity at 150 ℃ measured by an ICI viscometer is 1.0-20.0 Pa.s.

The present invention is also a curable resin composition containing the naphthol resin and an epoxy resin or/and a curable resin other than an epoxy resin as essential components. The present invention provides a curable resin composition containing the above epoxy resin and a curing agent as essential components. The present invention provides a cured product obtained by curing the curable resin composition.

A cured product obtained by using the naphthol resin or the epoxy resin of the present invention is excellent in high heat resistance, low dielectric loss tangent and low CTE.

Detailed Description

The present invention will be described in detail below. The naphthol resin of the present invention is represented by the following general formula (1), wherein the component having n of 6 or more is 15% or more, the component having n of 1 is 30% or less, and the hydroxyl group equivalent weight represented by the molecular weight per 1mol of hydroxyl groups is 260 to 400g/eq, in terms of the area ratio measured by GPC.

That is, unlike a typical naphthol resin, the naphthol resin of the present invention has a high molecular weight, but has a high hydroxyl equivalent and a low functional group concentration.

In the general formula (1), R1Is a hydrogen atom or an alkyl group having 1 to 6 carbon atoms. Examples of the alkyl group include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, and a hexyl group. R1The ratio Ar/(Ar + H) of the hydrogen atom (H) to the alkyl group (Ar) in (A) is preferably 10 to 30 mol%, more preferably 12 to 25 mol%And (3) mol%. When the amount is less than 10 mol%, the heat resistance is improved, but it is difficult to achieve a low dielectric loss tangent, and when the amount is more than 30 mol%, the heat resistance is lowered, and it is difficult to maintain the balance of the properties even when the molecular weight distribution is adjusted, although it is possible to achieve a low dielectric loss tangent.

n represents a repetition number and is 2 to 10, preferably 2.5 to 6, on average. The average value can be calculated from the area ratio of each n component measured by GPC. The basic structure of the naphthol resin represented by the general formula (1) is other than OR1Is at least partially glycidylated to OR2Otherwise, since all of them are held in the epoxy resin of the general formula (2) described later, n of the general formula (2) is also substantially the same.

[ solution 4]

The naphthol resin represented by the above general formula (1) can be obtained by reacting a naphthol with a condensing agent represented by the following general formula (3).

[ solution 5]

(R3Is an alkyl group having 1 to 6 carbon atoms. )

Here, as the naphthol, there can be mentioned: 1-naphthol, 2-naphthol. When naphthols are used, a mixture of 1-naphthol and 2-naphthol may be used. By condensing naphthols with a crosslinking agent, a naphthol skeleton can be introduced into a resin, and a low CTE can be achieved.

In the above general formula (3) representing the crosslinking agent, R is3Is an alkyl group having 1 to 6 carbon atoms. Examples of the alkyl group include a methyl group, an ethyl group, a propyl group, a butyl group, a pentyl group, and a hexyl group. Specific examples of particularly preferred crosslinking agents include: 1, 4-dimethoxymethylbenzene and 1, 4-diethoxymethylbenzene.

In the naphthol resin of the present invention, the component having n of 6 or more is 15% or more, preferably 20% or more, in terms of an area ratio measured by GPC. The content of n-1 is 30% or less, preferably 25% or less. By containing 15% or more of the component having n of 6 or more as a polyfunctional compound, the crosslinking density is increased and the heat resistance can be improved. On the other hand, when the amount of the component n of 1, which cannot form a three-dimensional structure during curing, increases, the heat resistance decreases, and therefore, it is necessary to suppress the amount to 30% or less.

The hydroxyl equivalent weight of the naphthol resin of the invention is 260 to 400g/eq, preferably 280 to 350 g/eq. When the amount is less than 260g/eq, the dielectric loss tangent becomes high, and when it exceeds 400g/eq, the crosslinking density becomes low, resulting in a decrease in heat resistance. Hydroxyl equivalent refers to the mass of the resin containing 1 equivalent (1mol) of hydroxyl groups. I.e. at R1In either case of hydrogen or alkyl, the resin is intended to be a resin containing a hydroxyl group.

In addition, the softening point of the naphthol resin is 100-150 ℃, preferably 102-130 ℃, and more preferably 102-120 ℃. When the softening point is less than 100 ℃, the heat resistance is insufficient in the above-mentioned hydroxyl equivalent range, and when the softening point exceeds 150 ℃, the resin is poor in solvent solubility, which is not preferable.

The naphthol resin of the present invention has a melt viscosity at 150 ℃ of 1.0 to 20.0 pas, preferably 1.5 to 10.0 pas, as measured with an ICI viscometer. When the amount is less than 1.0 pas, the heat resistance of the resulting cured product is poor, and when the amount exceeds 20.0 pas, the viscosity of the resulting varnish is high, and the workability is poor, which is not preferable.

The naphthol resin of the present invention preferably satisfies the above conditions at the same time. The naphthol resin of the present invention can be obtained by the following method.

The naphthol resin of the present invention can be obtained by reacting 1 mole of a naphthol with 0.4 to 0.7 mole of a condensing agent represented by the general formula (3), preferably 0.45 to 0.6 mole of a condensing agent represented by the general formula (3). When the amount is less than 0.4 mol, the content of n-6 or more is less than 15% and the content of n-1 exceeds 30%, so that the resin is poor in heat resistance. When the amount exceeds 0.7 mol, the resin becomes a resin having a high viscosity and is not handleable.

The above condensation reaction is desirably carried out in the presence of an acidic catalyst. The acidic catalyst may be appropriately selected from known inorganic acids and organic acids. Examples of such an acid catalyst include: inorganic acids such as hydrochloric acid, sulfuric acid, and phosphoric acid; organic acids such as formic acid, oxalic acid, trifluoroacetic acid, p-toluenesulfonic acid, dimethyl sulfate, diethyl sulfate, and the like; lewis acids such as zinc chloride, aluminum chloride, ferric chloride, and boron trifluoride; or solid acids such as activated clay, silica-alumina, and zeolite, and p-toluenesulfonic acid is preferred from the viewpoint of good reactivity, cost, and workability.

The amount of the acidic catalyst to be added is preferably 500 to 50000ppm, more preferably 1500 to 10000ppm, based on the total amount of the naphthol used in the reaction and the condensing agent represented by the general formula (3). When the amount is less than 500ppm, the equivalent of the obtained naphthol resin becomes small, so that a naphthol resin having a hydroxyl group equivalent of 250g/eq or more cannot be obtained, and when it exceeds 50000ppm, the catalyst remains in the resin and exerts an adverse effect. The catalyst may be dissolved in a solvent and dropped. The solvent for dissolving the catalyst is preferably an alcohol such as methanol or ethanol, or a polar solvent such as acetone. The catalyst may be added all at once or in portions. Further, it may take a long time to prepare a solution and add it dropwise, but when 6 times the total amount of the condensation agent to be reacted is added, the entire amount of the catalyst needs to be added.

The reaction is carried out by adding a condensing agent represented by the above general formula (3) to the naphthol compound, and the condensing agent is preferably dropped in a long time from the viewpoint of controlling the reaction heat. Specifically, the solvent is preferably added dropwise at 100 to 150 ℃ for 3 to 20 hours, preferably 5 to 15 hours, and the condensing agent may be added in portions. For example, half of the amount of the condensation product may be dropped in several hours, and the remaining half may be dropped in several hours after the heat release. The dropping rate may be changed during the reaction, or may be initially decreased and increased with time. As the reaction proceeds, alcohols are by-produced and the temperature is lowered, so that it is preferable to carry out the reaction while taking out a part of the alcohols. When the total amount of the alcohols is taken out, it is not preferable from the viewpoint of controlling the reaction temperature, and it is not preferable because the naphthol resin having a small hydroxyl group equivalent is obtained. The amount of the alcohol refluxed in the reaction system is in the range of 0.01 to 0.4 mol, preferably 0.05 to 0.3 mol, based on 1mol of the naphthol used as the raw material. The naphthol resin of the present invention having both the hydroxyl equivalent weight range and the molecular weight distribution can be obtained by causing the alcohol to react while refluxing in the above range.

In the above reaction, as a reaction solvent, alcohols such as methanol, ethanol, propanol, butanol, ethylene glycol, methyl cellosolve and ethyl cellosolve, benzene, toluene, chlorobenzene and dichlorobenzene may be used. After the reaction, the aging reaction may be carried out at 110 to 200 ℃.

After the reaction is completed, the catalyst is removed by a method such as neutralization or washing, and if necessary, the residual solvent and the monomer components derived from unreacted naphthol are removed to obtain a naphthol resin. The content of the monomer component derived from unreacted naphthol is usually not more than 3% by weight, preferably not more than 1% by weight. When the equivalent weight is larger than this, the heat resistance of the cured product is lowered.

The epoxy resin of the present invention is represented by the following general formula (2), and can be produced by reacting the naphthol resin of the above general formula (1) with epichlorohydrin.

[ solution 6]

R of the general formula (2)2Is glycidyl or C1-6 alkyl. The hydroxyl group in the general formula (1) is converted into a glycidyl group by reaction with epichlorohydrin, but the alkyl group in the general formula (1) is not modified with epichlorohydrin and remains as it is in the resin represented by the general formula (2).

In the epoxy resin of the present invention, the component having n of 6 or more is 15% or more, preferably 20% or more, and the component having n of 1 is 30% or less, preferably 25% or less, in terms of an area ratio measured by GPC. When the content of n-6 or more is less than 15% or the content of n-1 is more than 30%, the crosslinking density decreases and the heat resistance is insufficient.

The epoxy equivalent of the epoxy resin is 330-450 g/eq, preferably 340-400 g/eq. When the epoxy equivalent is less than 330g/eq, the dielectric loss tangent increases, and when the epoxy equivalent is more than 450eq/g, the heat resistance decreases.

In addition, the softening point of the epoxy resin is 90-140 ℃, and more preferably 92-110 ℃. When the softening point is less than 90 ℃, the heat resistance is insufficient in the above epoxy equivalent range, and when the softening point exceeds 140 ℃, the resin is poor in solvent solubility, which is not preferable.

The epoxy resin of the present invention has a melt viscosity at 150 ℃ of 1.0 to 20.0 pas, preferably 1.5 to 10.0 pas, as measured with an ICI viscometer. When the amount is less than 1.0 pas, the heat resistance of the resulting cured product is poor, and when the amount exceeds 20.0 pas, the viscosity of the resulting varnish is high, and the workability is poor.

The reaction of the naphthol resin of the present invention with epichlorohydrin may be carried out in the same manner as in the usual epoxidation reaction. For example, the following methods may be mentioned: dissolving the naphthol resin in an excessive amount of epichlorohydrin, and reacting the resulting solution in the presence of an alkali metal hydroxide such as sodium hydroxide or potassium hydroxide at 20 to 150 ℃, preferably 30 to 80 ℃ for 1 to 10 hours. In this case, the amount of the alkali metal hydroxide to be used is 0.8 to 1.2 mol, preferably 0.9 to 1.0 mol, based on 1mol of the hydroxyl group of the naphthol resin. The epichlorohydrin is used in an excess amount to the hydroxyl groups in the naphthol resin, and is usually in the range of 1.5 to 30 moles, preferably 2 to 15 moles, based on 1 mole of the hydroxyl groups in the naphthol resin. After the reaction is completed, the excess epichlorohydrin is distilled off, the residue is dissolved in a solvent such as toluene or methyl isobutyl ketone, and the inorganic salt is removed by filtration and washing with water, and then the solvent is distilled off, whereby the desired epoxy resin can be obtained.

Next, the curable resin composition of the present invention will be described. The curable resin composition of the present invention comprises the naphthol resin (NAR) of the present invention and/or the epoxy resin (NAER) of the present invention, and there are 3 kinds as follows.

Composition 1) a composition comprising NAR as a part or all of the curing agent (in the case where NAER is not contained).

Composition 2) a composition comprising an epoxy resin and NAER incorporated as a part or the whole of the epoxy resin (in the case where NAR is not contained).

Composition 3) a composition in which NAR is used as a part or all of the curing agent and NAER is used as a part or all of the epoxy resin (in the case where both NAR and NAER are contained).

In compositions 1) and 3), NAR is an essential component as a curing agent, and in compositions 2) and 3), NAR is an essential component as an epoxy resin, but other curing agents and/or other epoxy resins may be used in combination as long as they are contained. In addition, in composition 1), NAR as a curing agent, but as long as the main agent used resin and NAR hydroxyl reaction, no limitation. Examples thereof include: epoxy resins, maleimide resins, and the like.

The amount of NAR as a curing agent is usually 10 to 200 parts by weight, preferably 50 to 150 parts by weight, based on 100 parts by weight of the main agent (e.g., epoxy resin). When the amount is less than the above range, the effect of improving the dielectric characteristics and CTE is small, and when the amount is more than the above range, moldability and heat resistance of a cured product are deteriorated. When naphthol resin (NAR) is used as the total amount of the curing agent, the amount of NAR added is usually added in consideration of the equivalent balance between the OH group of NAR and the functional group (epoxy group or the like) in the main agent. The equivalent ratio of the main agent to the curing agent is usually in the range of 0.2 to 5.0, preferably in the range of 0.5 to 2.0. When the amount is more than or less than this range, the curability of the resin composition is lowered, and the heat resistance, mechanical strength, and the like of the cured product are also lowered.

In the curable resin composition of the present invention, other epoxy resins that can be used in combination are not particularly limited, and include: bisphenol a-type epoxy resin, bisphenol F-type epoxy resin, bisphenol S-type epoxy resin, bisphenol AF-type epoxy resin, phenol novolac-type epoxy resin, naphthol novolac-type epoxy resin, dicyclopentadiene-type epoxy resin, phenol aralkyl-type epoxy resin, naphthol phenol-type epoxy resin, naphthol aralkyl-type epoxy resin, naphthalene-type epoxy resin glycidylamine-type epoxy resin, cresol novolac-type epoxy resin, biphenyl-type epoxy resin, tetramethylbiphenyl-type epoxy resin, linear aliphatic epoxy resin, alicyclic epoxy resin, heterocyclic epoxy resin, spiro ring-containing epoxy resin, cyclohexane dimethanol-type epoxy resin, trimethylol-type epoxy resin, halogenated epoxy resin, triphenylmethane-type epoxy resin, tetraphenylethane-type epoxy resin, and the like. These epoxy resins may be used alone or in combination of 2 or more.

The resin composition of the present invention may contain a curable resin other than an epoxy resin. Examples of the curable resin other than the epoxy resin include: radical polymerizable resins such as vinyl ester resins, polyvinyl benzyl resins, unsaturated polyester resins, curable vinyl resins, and maleimide resins, and cyanate ester resins.

In these cases, the amount of the epoxy resin (NAER) in the present invention may be in the range of 50 to 100% by weight, preferably 60 to 100% by weight, based on the whole epoxy resin or the whole curable resin.

In the curable resin composition of the present invention, the curing agent that can be used in combination is not particularly limited, and examples thereof include: phenol curing agent, amine compound, amide compound, acid anhydride compound, naphthol curing agent, active ester curing agent, and benzoAn oxazine-based curing agent, a cyanate-based curing agent, an acid anhydride-based curing agent, and the like. These may be used in 1 kind, or in combination of 2 or more kinds.

In this case, the amount of naphthol resin (NAR) may be 50 to 100% by weight, preferably 60 to 100% by weight, based on the whole curing agent.

Further, in the epoxy resin composition of the present invention, a curing accelerator may be used as needed. Examples thereof include amines, imidazoles, organophosphines, Lewis acids, and the like. The amount of the epoxy resin is usually in the range of 0.2 to 5 parts by weight based on 100 parts by weight of the epoxy resin.

The curable resin composition of the present invention may contain a filler. Examples of the filler include: the filler added for improving the heat resistance, dimensional stability, or flame retardancy of the cured product of the curable resin composition may be a known filler, and is not particularly limited. Specifically, there may be mentioned: silica such as spherical silica, metal oxides such as alumina, titanium oxide and mica, metal hydroxides such as aluminum hydroxide and magnesium hydroxide, talc, aluminum borate, barium sulfate and calcium carbonate. When a metal hydroxide such as aluminum hydroxide or magnesium hydroxide is used, it functions as a flame retardant aid, and flame retardancy can be secured even when the phosphorus content is small. Among them, silica, mica and talc are preferable, and spherical silica is more preferable. Further, 1 kind of them may be used alone, or 2 or more kinds may be used in combination.

The filler may be used as it is, or may be surface-treated with a silane coupling agent such as epoxy silane type or amino silane type. As the silane coupling agent, from the viewpoint of reactivity with a radical polymerization initiator, vinyl silane type, methacryloxy silane type, acryloxy silane type, and styryl silane type silane coupling agents are preferable. This improves the adhesive strength with the metal foil and the interlayer adhesive strength between the resins. Further, the silane coupling agent may be added by a bulk mixing method without a method of surface-treating the filler in advance.

The content of the filler is preferably 10 to 200 parts by weight, more preferably 30 to 150 parts by weight, based on 100 parts by weight of the total of solid components (including organic components such as resins, excluding solvents) other than the filler.

The curable resin composition of the present invention may contain additives other than those described above. Examples of the additives include: defoaming agents such as silicone defoaming agents and acrylate defoaming agents, heat stabilizers, antistatic agents, ultraviolet absorbers, dyes, pigments, lubricants, wetting dispersants, and the like.

The cured product obtained by curing the curable resin composition of the present invention can be used as a molded article, a laminate, a cast article, an adhesive, a coating film, or a film. For example, the cured product of the semiconductor encapsulating material is a cast or molded product, and as a method for obtaining a cured product for the use, the following methods are exemplified: the curable resin composition is molded by casting, transfer molding, injection molding, or the like, and then heated at 80 to 230 ℃ for 0.5 to 10 hours to obtain a cured product.

The resin composition of the present invention can also be used as a prepreg. In the production of a prepreg, the prepreg can be prepared into a varnish form for the purpose of being impregnated into a base material (fibrous base material) for forming the prepreg or for the purpose of being used as a circuit board material for forming a circuit board, and can be prepared into a resin varnish.

The resin varnish can be applied to circuit boards and used as a varnish for circuit board materials. The use of the circuit board material described herein includes, in particular: printed wiring boards, printed circuit boards, flexible printed wiring boards, multilayer (Build-up) wiring boards, and the like.

The resin varnish is prepared, for example, as follows.

First, each component such as the naphthol resin or the epoxy resin of the present invention is put into an organic solvent and dissolved. In this case, heating may be performed as necessary. Then, if necessary, components insoluble in the organic solvent, such as an inorganic filler, are added and dispersed using a ball mill, a bead mill, a planetary mixer, a roll mill, or the like, thereby preparing a varnish-like curable resin composition. The organic solvent used herein is not particularly limited as long as it dissolves each resin component and the like and does not inhibit the curing reaction. Examples thereof include: ketones such as acetone, methyl ethyl ketone, and methyl isobutyl ketone; esters such as ethyl acetate, propyl acetate, and butyl acetate; polar solvents such as dimethylacetamide and dimethylformamide; aromatic hydrocarbon solvents such as toluene and xylene, and the like, and 1 or a mixture of 2 or more thereof may be used. From the viewpoint of dielectric properties, aromatic hydrocarbons such as benzene, toluene, and xylene are preferable.

The amount of the organic solvent used in the preparation of the resin varnish is preferably 5 to 900 parts by weight, more preferably 10 to 700 parts by weight, and particularly preferably 20 to 500 parts by weight, based on 100 parts by weight of the curable resin composition of the present invention. When the curable resin composition of the present invention is a solution of a resin varnish or the like, the amount of the organic solvent is not included in the calculation of the composition.

As the base material for producing the prepreg, known materials can be used, and for example, base materials such as glass fiber, carbon fiber, polyester fiber, polyamide fiber, alumina fiber, paper and the like can be used alone or in combination of 2 or more. Of these substrates, a coupling agent may be used as necessary to improve the adhesion at the interface of the resin and the substrate. As the coupling agent, a general coupling agent such as a silane coupling agent, a titanate coupling agent, an aluminum-based coupling agent, or an aluminum zirconium coupling agent (zirconia coupling agent) can be used.

The prepreg of the present invention can be obtained by a method comprising impregnating a substrate with the resin varnish and drying the impregnated substrate. Impregnation is performed by dipping (spreading), coating, or the like. The impregnation may be repeated as many times as necessary, and in this case, the impregnation may be repeated using a plurality of solutions having different compositions and/or concentrations to adjust the resin composition and the resin amount to the final desired values. After impregnation, the prepreg can be obtained by heating and drying at 100 to 180 ℃ for 1 to 30 minutes. The amount of the resin in the prepreg is preferably 30 to 80 wt% based on the resin component.

The resin composition of the present invention can also be used as a laminate. When a laminate is formed using prepregs, one or more prepregs are stacked, a metal foil is disposed on one side or both sides to form a laminate, and the laminate is heated and pressurized to be integrally stacked. Here, as the metal foil, a metal foil of an alloy or a composite of copper, aluminum, brass, nickel, or the like can be used alone. The conditions for heating and pressing the laminate may be appropriately adjusted under the conditions for curing the curable resin composition, but if the pressure for pressing is too low, bubbles may remain in the interior of the resulting laminate, and the electrical characteristics may be degraded, so that it is preferable to press the laminate under conditions satisfying moldability. For example, the temperature and pressure may be set to 180-230 ℃ and 49.0-490.3N/cm, respectively2(5~50kgf/cm2) The heating and pressurizing time is 40-240 minutes. Further, a multilayer board can be produced by using the single-layer laminated board thus obtained as an inner layer material. At this time, firstAn electric circuit is formed on the laminate by an additive method, a subtractive method, or the like, and the surface of the formed electric circuit is treated with an acid solution to perform blackening treatment, thereby obtaining an inner layer material. The multilayer board is formed by forming an insulating layer on one or both circuit-forming surfaces of the inner layer material with a resin sheet, a resin-coated metal foil, or a prepreg, and forming a conductor layer on the surface of the insulating layer.

Examples of the method for producing a multilayer film (stacked film) from the resin composition of the present invention include: a method of forming a film-like insulating layer by applying the resin varnish on a support film and drying the applied resin varnish. The film-like insulating layer thus formed is useful as a multilayer film for a multilayer printed wiring board.

The drying step is preferably performed such that the content of the organic solvent in the layer of the multilayer film resin composition is 10% by mass or less, preferably 5% by mass or less. The drying conditions vary depending on the kind of the organic solvent and the amount of the organic solvent in the varnish, and the varnish can be dried at 50 to 160 ℃ for about 3 to 20 minutes.

The thickness of the multilayer film formed on the support is usually equal to or greater than the thickness of the conductor layer. The thickness of the conductor layer of the circuit board is usually in the range of 5 to 70 μm, and therefore the thickness of the resin composition layer is preferably 10 to 100 μm.

The multilayer film formed from the resin composition of the present invention is preferably protected by a protective film in view of preventing scratches, dust, and the like from adhering to the surface.

Examples of the support film and the protective film include: polyolefins such as polyethylene, polypropylene, and polyvinyl chloride, polyesters such as polyethylene terephthalate and polyethylene naphthalate, polycarbonates and polyimides, release papers, and metal foils such as copper foil and aluminum foil. The support film and the protective film may be subjected to a slurry (mud) treatment, a corona treatment, or a release treatment.

The thickness of the support film is not particularly limited, but is usually 10 to 150 μm, and preferably 25 to 50 μm. The thickness of the protective film is preferably 1 to 40 μm.

The resin composition (resin varnish) of the present invention is peeled off after being laminated on a support film or after being cured by heating to form a film-like insulating layer. If the support film is peeled off after the heat curing, the curing inhibition by oxygen in the curing step can be prevented, and further the adhesion of dust and the like can be prevented. In the case of peeling after curing, the support film is usually subjected to a release treatment in advance.

Examples

The present invention will be described below with reference to examples, but the present invention is not limited to these examples. The parts in each example are parts by weight.

The physical properties were measured under the following conditions.

1) Area ratio of GPC measurement

< GPC measurement Condition >

A measuring device: HLC-8320GPC, manufactured by Tosoh corporation "

Column: TSKgel G4000H, G3000H, G2000 manufactured by Tosoh corporation

A detector: RI (differential refractometer)

Data processing: "GPC WorkStation EcoSEC-WorkStation" manufactured by Tosoh corporation "

The measurement conditions were as follows: column temperature 40 deg.C

Developing solvent: tetrahydrofuran (THF)

Flow rate: 1.0 ml/min

Sample preparation: about 1.0% tetrahydrofuran solution of sample

2) Determination of softening Point

Measured by the ring and ball method according to JIS K-6911.

3) Measurement of melt viscosity at 150 deg.C

Measured by an ICI cone and plate viscometer.

4) Determination of hydroxyl equivalent

About 6mg/eq of a sample was accurately weighed in a 100mL stoppered flask, 3mL of a reagent mixed with acetic anhydride/pyridine (3/1 (capacity ratio) was added, a condenser tube was attached, heating and refluxing were performed for 5 minutes by a heating plate, and after cooling for 5 minutes, 1mL of water was added. The liquid was subjected to potentiometric titration with 0.5mol/L KOH/MeOH solution, whereby the hydroxyl equivalent weight was calculated.

5) Determination of epoxy equivalent

Using a potentiometric titrator, using chloroform as a solvent, a tetraethylammonium bromide acetic acid solution was added, and the measurement was performed using a 0.1mol/L perchloric acid-acetic acid solution by the potentiometric titrator.

Example 1

In a 1.0L four-necked separable flask equipped with a stirrer, a condenser, a nitrogen-introducing tube and a dropping funnel, 200g of 1-naphthol was charged and dissolved by heating to 110 ℃ while introducing nitrogen. Then, 0.16g of p-toluenesulfonic acid was added, the temperature was raised to 130 ℃ with stirring, 44g of p-xylylene glycol dimethyl ether (p-xylylene glycol dimethyl ether) was dropped from the dropping funnel over 3 hours, 2.02g of p-toluenesulfonic acid was added thereto, and 67g of p-xylylene glycol dimethyl ether was dropped to react for 5 hours while confirming that no heat was released. During this period, methanol produced by the reaction was discharged to the outside of the system at a rate at which the reaction temperature was not 120 ℃ or lower. Then, the catalyst was removed by washing with water, and the temperature was raised to 230 ℃ under reduced pressure to remove unreacted monomer components, thereby obtaining 218g of a naphthol resin (naphthol resin A). From the GPC measurement result of the obtained naphthol resin a, it was found that the component having n of 6 or more was 18.3%, and the component having n of 1 was 27.5%. The melt viscosity at 101 ℃ and 150 ℃ was 1.2 pas and the hydroxyl group equivalent was 320 g/eq.

Example 2

In a 1.0L four-necked separable flask equipped with a stirrer, a condenser, a nitrogen-introducing tube and a dropping funnel, 200g of 1-naphthol was charged and dissolved by heating to 110 ℃ while introducing nitrogen. Then, 0.67g of p-toluenesulfonic acid was added thereto, the temperature was raised to 130 ℃ with stirring, and 134g of terephthalyl dimethyl ether was dropped from the dropping funnel over 10 hours. During this period, methanol produced by the reaction was discharged to the outside of the system at a rate at which the reaction temperature was not 120 ℃ or lower. Then, the catalyst was removed by washing with water, and the temperature was raised to 230 ℃ under reduced pressure to remove unreacted monomer components, thereby obtaining 230g of a naphthol resin (naphthol resin B). From the GPC measurement result of the obtained naphthol resin B, it was found that the component having n of 6 or more was 29.9%, and the component having n of 1 was 18.5%. The melt viscosity at a softening point of 114 ℃ and 150 ℃ was 6.9 pas and the hydroxyl group equivalent was 274 g/eq.

Example 3

212g of a naphthol resin C was obtained in the same manner as in example 2 except that 0.56g of p-toluenesulfonic acid and 111g of terephthalyl dimethyl ether were used. From the GPC measurement result of the obtained naphthol resin C, it was found that the component having n of 6 or more was 18.3%, and the component having n of 1 was 25.4%. The melt viscosity at 100 ℃ and 150 ℃ was 1.1 pas and the hydroxyl group equivalent was 270 g/eq.

Example 4

In a 1.0L four-necked separable flask equipped with a stirrer, a condenser, a nitrogen-introducing tube and a dropping funnel, 200g of 1-naphthol was charged and dissolved by heating to 110 ℃ while introducing nitrogen. Then, 0.16g of p-toluenesulfonic acid was added thereto, the temperature was raised to 130 ℃ with stirring, and 42g of terephthalyl dimethyl ether was added dropwise from the dropping funnel over 3 hours. Then, no heat generation was confirmed, and 1.47g of p-toluenesulfonic acid was added thereto, and 42g of p-xylylene glycol dimethyl ether was added dropwise over 3 hours. During this period, methanol produced by the reaction was discharged out of the system at a rate at which the reaction temperature did not become 120 ℃ or lower. Then, after confirming that the reaction temperature was stable, 42g of terephthalyl dimethyl ether was further added dropwise over 3 hours. The catalyst was removed by washing with water, and the temperature was raised to 230 ℃ under reduced pressure to remove unreacted monomer components, thereby obtaining 230g of a naphthol resin D. From the GPC measurement result of the obtained naphthol resin D, it was found that the component having n of 6 or more was 25.0%, and the component having n of 1 was 22.0%. The melt viscosity at a softening point of 108 ℃ and 150 ℃ was 2.3 pas and the hydroxyl group equivalent was 320 g/eq.

Example 5

A naphthol resin E222 g was obtained in the same manner as in example 2 except that p-toluenesulfonic acid 0.68g and terephthalyl dimethyl ether 125g were used. From the GPC measurement result of the obtained naphthol resin E, it was found that the component having n of 6 or more was 22.0%, and the component having n of 1 was 24.2%. The melt viscosity at 105 ℃ and 150 ℃ was 1.6 pas and the hydroxyl group equivalent was 290 g/eq.

Example 6

A naphthol resin F222 g was obtained in the same manner as in example 2 except that 2.80g of p-toluenesulfonic acid and 150g of terephthalyl dimethyl ether were used. From the GPC measurement result of the obtained naphthol resin F, it was found that the component having n of 6 or more was 31.2%, and the component having n of 1 was 16.5%. The melt viscosity at a softening point of 122 ℃ and a temperature of 150 ℃ was 10.9 pas and the hydroxyl group equivalent was 348g/eq.

Comparative example 1

Naphthol resin G was obtained in the same manner as in example 2 except that 0.07G of p-toluenesulfonic acid and 129G of terephthalyl dimethyl ether were added dropwise over 3 hours and all of the methanol produced in the reaction was discharged. From the GPC measurement result of the obtained naphthol resin G, it was found that the component having n of 6 or more was 25.0%, the component having n of 1 was 21.8%, the hydroxyl group equivalent was 223G/eq, and the melt viscosity at a softening point of 109 ℃ and 150 ℃ was 2.4Pa · s.

Comparative example 2

Naphthol resin H was obtained in the same manner as in example 2, except that 1.35g of p-toluenesulfonic acid and 69g of p-xylylene glycol dimethyl ether were used as replacements. From the GPC measurement result of the obtained naphthol resin H, it was found that the component having n of 6 or more was 2.4%, the component having n of 1 was 49.9%, the hydroxyl group equivalent was 265g/eq, and the melt viscosity at a softening point of 85 ℃ and 150 ℃ was 0.2Pa · s.

Comparative example 3

220g of a naphthol resin precursor was obtained in the same manner as in example 2 except that 0.10g of p-toluenesulfonic acid and 125g of terephthalyl dimethyl ether were used. From the GPC measurement result of the obtained naphthol resin precursor, it was found that the component having n of 6 or more was 24.8%, the component having n of 1 was 19.9%, the hydroxyl group equivalent was 223g/eq, and the melt viscosity at a softening point of 106 ℃ and 150 ℃ was 1.9Pa · s. 220g of the obtained naphthol resin precursor was charged into a 1.0L four-neck separable flask equipped with a stirrer, a condenser, a nitrogen-introducing tube and a dropping funnel, and 24.4g of toluene was added thereto and dissolved by heating to 130 ℃ while introducing nitrogen. Then, 1.53g of p-toluenesulfonic acid was added thereto, and 20g of methanol was added dropwise over 10 hours, followed by further reaction for 5 hours. Then, the catalyst was removed by washing with water to obtain 200g of a naphthol resin I. From the GPC measurement result of the obtained naphthol resin I, it was found that the component having n of 6 or more was 25.2%, the component having n of 1 was 19.3%, the hydroxyl equivalent was 250g/eq, and the melt viscosity at a softening point of 106 ℃ and 150 ℃ was 2.0Pa · s.

Next, examples and comparative examples of epoxy resins using naphthol resins are shown.

Example 7

100g of the naphthol resin A obtained in example 1 was dissolved in 181g of epichlorohydrin and 27g of diglyme, and 29g of a 48% aqueous sodium hydroxide solution was added dropwise thereto under reduced pressure at 60 ℃ over 4 hours. During this time, the produced water was discharged out of the system by azeotropy with epichlorohydrin, and the distilled epichlorohydrin was returned to the system. After completion of the dropwise addition, the reaction was continued for 1 hour. Then, epichlorohydrin and diglyme were distilled off under reduced pressure and dissolved in 220g of methyl isobutyl ketone, and 68g of water was added thereto to remove the salt formed by liquid separation. Then, 4.8g of a 48% aqueous potassium hydroxide solution was added thereto, and the mixture was reacted at 85 ℃ for 2 hours. After the reaction, the reaction mixture was washed with water, and methyl isobutyl ketone as a solvent was distilled off under reduced pressure to obtain 103g of a brown epoxy resin (epoxy resin a). The obtained epoxy resin a had a component content of n 6 or more of 19.1%, a component content of n 1 or less of 26.4%, an epoxy equivalent of 380g/eq, and a melt viscosity at a softening point of 91 ℃ and 150 ℃ of 1.1Pa · s as measured by GPC.

Example 8

Epoxy resin B97 g was obtained in the same manner as in example 7, except that naphthol resin B was used, 167g of epichlorohydrin, 25g of diglyme and 25g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin B, the component having n of 6 or more was 32.6%, the component having n of 1 was 18.3%, the epoxy equivalent was 334g/eq, and the melt viscosity at a softening point of 103 ℃ and 150 ℃ was 4.7Pa · s.

Example 9

Epoxy resin C95 g was obtained in the same manner as in example 7, except that naphthol resin C was used, and 206g of epichlorohydrin, 31g of diglyme and 34g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin C, the component having n of 6 or more was 19.2%, the component having n of 1 was 24.4%, the epoxy equivalent was 332g/eq., and the melt viscosity at a softening point of 91 ℃ and 150 ℃ was 1.6Pa · s.

Example 10

90g of an epoxy resin D was obtained in the same manner as in example 7 except that the naphthol resin D was used. According to the GPC measurement result of the epoxy resin D, the component having n of 6 or more was 24.9%, the component having n of 1 was 20.8%, the epoxy equivalent was 378g/eq., and the melt viscosity at a softening point of 101 ℃ and 150 ℃ was 2.2Pa · s.

Example 11

Epoxy resin E85 g was obtained in the same manner as in example 7, except that naphthol resin E was used, 191g of epichlorohydrin, 29g of diglyme, and 32g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin E, 23.2% of the component having n of 6 or more, 23.1% of the component having n of 1, 348g/eq of epoxy equivalent, and 1.5Pa · s of melt viscosity at a softening point of 96 ℃ and 150 ℃.

Example 12

Epoxy resin F90 g was obtained in the same manner as in example 7, except that naphthol resin F was used, 160g of epichlorohydrin, 24g of diglyme and 26g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin F, the component having n of 6 or more was 31.5%, the component having n of 1 was 15.0%, the epoxy equivalent was 405g/eq., and the melt viscosity at a softening point of 114 ℃ and 150 ℃ was 9.2Pa · s.

Comparative example 4

Epoxy resin G101G was obtained in the same manner as in example 7, except that naphthol resin G was used, and 249G of epichlorohydrin, 38G of diglyme and 41G of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin G, the component having n of 6 or more was 24.9%, the component having n of 1 was 13.0%, the epoxy equivalent was 283G/eq, and the melt viscosity at a softening point of 99 ℃ and 150 ℃ was 2.2Pa · s.

Comparative example 5

Epoxy resin H103 g was obtained in the same manner as in example 7, except that naphthol resin H was used, 210g of epichlorohydrin, 32g of diglyme and 34g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin H, the component having n of 6 or more was 4.9%, the component having n of 1 was 46.0%, the epoxy equivalent was 327g/eq., and the melt viscosity at a softening point of 75 ℃ and 150 ℃ was 0.35Pa · s.

Comparative example 6

Epoxy resin I (103 g) was obtained in the same manner as in example 7, except that naphthol resin I was used, 222g of epichlorohydrin, 33g of diglyme and 37g of 48% sodium hydroxide were used. According to the GPC measurement result of the epoxy resin I, the component having n of 6 or more was 32.6%, the component having n of 1 was 18.0%, the epoxy equivalent was 315g/eq., and the melt viscosity at a softening point of 103 ℃ and 150 ℃ was 2.1Pa · s.

Examples 13 to 18 and comparative examples 7 to 9

ESN-475V (Naphthol aralkyl type epoxy resin manufactured by Nippon iron King chemical Co., Ltd., epoxy equivalent: 325G/eq) was used as an epoxy resin component, the naphthol resins A to F obtained in examples 1 to 6 and the naphthol resins G to I obtained in comparative examples 1 to 3 were used as curing agent components, and 2E4MZ (manufactured by Sikko chemical Co., Ltd.) was used as a curing accelerator, and epoxy resin compositions were obtained in the formulation shown in Table 1. Further, the resulting mixture was molded at 190 ℃ and heated at 200 ℃ for 5 hours to obtain a cured product.

Examples 19 to 24 and comparative examples 10 to 12

Epoxy resin compositions were obtained by using the naphthol-based epoxy resins a to F obtained in examples 7 to 12 and the naphthol-based epoxy resins G to I obtained in comparative examples 4 to 6 as epoxy resins, using a phenol novolac resin (PN: BRG-557: showa electric) as a curing agent, and using 2E4MZ (made by seiko chemical corporation) as a curing accelerator, in the proportions shown in table 2. Further, the resulting mixture was molded at 190 ℃ and heated at 200 ℃ for 5 hours to obtain a cured product.

The cured product of the obtained composition was measured for each physical property by the following method.

1) Determination of glass transition temperature (Tg) and Low coefficient of Linear expansion (CTE)

The glass transition temperature (Tg) and CTE were measured by using a thermomechanical measuring apparatus at a temperature rising rate of 10 ℃ per minute. The glass transition temperature (Tg) was determined from the inflection point of the CTE curve, and the CTE was evaluated at 2 points of 70 ℃ to 100 ℃ (CTE: 70 ℃ to 100 ℃) and 200 ℃ to 230 ℃ (CTE: 200 ℃ to 230 ℃) which is not less than Tg.

2) Measurement of relative dielectric constant (Dk) and dielectric loss tangent (Df)

The dielectric loss tangent was evaluated by measuring the relative dielectric constant (Dk) and the dielectric loss tangent (Df) at 1GHz by a capacitance method in an environment of 25 ℃ and a humidity of 60% using an impedance material analyzer (E4991A) manufactured by Agilent.

From the results of the evaluation (tables 3 and 4), it was confirmed that the cured product of the curable resin composition containing the naphthol resin or the epoxy resin of the present invention was excellent in low dielectric loss tangent, heat resistance and low CTE.

Industrial applicability

The naphthol resin or the epoxy resin of the present invention can be suitably used for a circuit board material which is compatible with a high frequency and a package board material which requires a low warpage.

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