阅读说明：本技术 一种b型套袖相控阵无损检测校准用试块 (B type oversleeve phased array nondestructive test calibration test block ) 是由 芦丹妍 张松 张冬 吴朝利 汪佩佩 于 2021-10-08 设计创作，主要内容包括：本发明公开一种B型套袖相控阵无损检测校准用试块,包括：自上而下依次连接的第一阶梯、第二阶梯以及第三阶梯,第一阶梯与第一顶面相邻的侧面设有第一列缺陷组,第二阶梯的顶面设有第二列缺陷组；第一列缺陷组,包括多个第一缺陷,多个第一缺陷间隔设置且沿第一斜向预设角排列；第二列缺陷组,包括多个第二缺陷,多个第二缺陷间隔设置且沿第二斜向预设角排列；其中,第一列缺陷组与第二列缺陷组错开排列。B型套袖相控阵无损检测校准用试块采用均倾斜设置的第一列缺陷组和第二列缺陷组,不仅可模拟B型套袖焊接接头的各种实际缺陷,同时也避免各个缺陷之间干扰,从而可极大提高超声波相控阵检测的精确度和准确性。(The invention discloses a test block for B-type oversleeve phased array nondestructive testing calibration, which comprises: the first ladder, the second ladder and the third ladder are sequentially connected from top to bottom, a first row of defect groups are arranged on the side face, adjacent to the first top face, of the first ladder, and a second row of defect groups are arranged on the top face of the second ladder; the first row of defect groups comprise a plurality of first defects which are arranged at intervals and arranged along a first oblique preset angle; the second row of defect groups comprise a plurality of second defects which are arranged at intervals and arranged along a second oblique preset angle; wherein the first row of defect groups and the second row of defect groups are staggered. The test block for B-type oversleeve phased array nondestructive testing and calibration adopts the first row of defect groups and the second row of defect groups which are all obliquely arranged, so that various actual defects of a B-type oversleeve welding joint can be simulated, and meanwhile, interference among all the defects is avoided, so that the accuracy and the accuracy of ultrasonic phased array detection can be greatly improved.)

1. A B-type sleevelet phased array nondestructive test calibrates and uses test block which characterized by, includes:

the first ladder, the second ladder and the third ladder are sequentially connected in a staggered manner from top to bottom, the top surface of the second ladder comprises a first top surface and a second top surface, the first ladder is provided with a first side surface, the first top surface is adjacent to the first side surface, the second top surface is connected with the bottom surface of the first ladder, the first side surface is provided with a first row of defect groups, and the first top surface is provided with a second row of defect groups;

the first row of defect groups comprise a plurality of first defects which are arranged at intervals and arranged along a first oblique preset angle;

the second row of defect group comprises a plurality of second defects which are arranged at intervals and arranged along a second oblique preset angle;

wherein the first row of defect groups and the second row of defect groups are staggered.

2. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 1,

the connecting line of the first top surface and the two top surfaces is superposed with the vertical projection of the first side surface;

the second step and the third step are positioned on the same side of the bottom of the first step.

3. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 2,

twice the sum of the thicknesses of the second step and the third step is less than the thickness of the first step.

4. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 1,

the first oblique preset angle and the second oblique preset angle range are between 30 degrees and 60 degrees.

5. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 4,

each first defect in the first column of defect groups is arranged at equal intervals;

each second defect in the second column of defect groups is arranged at equal intervals.

6. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 5,

the first number of defects in the first column of defect groups is different from the second number of defects in the second column of defect groups.

7. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 6,

the number of the first defects in the first row of defect groups is 7, and the number of the second defects in the second row of defect groups is 5.

8. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 7,

the first defect is a first flat bottom hole, and the second defect is a second flat bottom hole;

the first flat bottom hole and the second flat bottom hole are flat bottom holes with the same diameter.

9. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 8,

the hole axis of the first flat bottom hole is perpendicular to the side surface of the first step adjacent to the first top surface;

the hole axis of the second flat bottom hole is perpendicular to the top surface of the second step.

10. The test block for B-type oversleeve phased array nondestructive testing calibration according to claim 9,

the hole depth of the first flat bottom hole is larger than that of the second flat bottom hole;

the thickness of the second step is equal to the depth of the second flat bottom hole.

Technical Field

The invention relates to the technical field of ultrasonic phased array detection, in particular to a test block for B-type oversleeve phased array nondestructive testing calibration.

Background

The welding takes place not to fuse very easily between the weldment, for preventing that the welding does not fuse, generally can adopt higher voltage and electric current to carry out high temperature welding, can't adopt high voltage and high current welding between b type oversleeve pipe and the breather pipe, the breather pipe is the gas that has certain flow, the temperature heating is too high in order to take place the potential safety hazard, so adopt the electric current, the less single-deck single pass welding process of voltage, the defect of welding not fusing certainly produces, the type of defect that does not fuse only is in the great crackle of harm, later stage atress easily develops the crackle, therefore the welding does not fuse the detection and is very important.

The ultrasonic phased array is an important detection means for a welding unfused process, the ultrasonic phased array is a combination of ultrasonic probe wafers, a plurality of piezoelectric wafers are distributed and arranged according to a certain rule, then each wafer is excited successively according to a preset delay time, and ultrasonic waves emitted by all the wafers form an integral wave front which can effectively control the shape and the direction of an emitted ultrasonic beam (wave front).

The accuracy of the equivalent size of the welded unfused defect between the B-shaped sleeve and the vent pipe and the applicability of the detection method need a special test block for adjustment and setting so as to reduce the interference between the defects and improve the accuracy and the precision of the detection.

Disclosure of Invention

In view of the above, there is a need to provide a test block for B-type cuff phased array nondestructive testing calibration, which solves the technical problem of mutual interference between adjacent defects during B-type cuff phased array nondestructive testing.

According to one aspect of the present invention, there is provided a test block for B-type sleevelet phased array nondestructive test calibration, comprising:

the first ladder, the second ladder and the third ladder are sequentially connected in a staggered manner from top to bottom, the top surface of the second ladder comprises a first top surface and a second top surface, the first ladder is provided with a first side surface, the first top surface is adjacent to the first side surface, the second top surface is connected with the bottom surface of the first ladder, the first side surface is provided with a first row of defect groups, and the first top surface is provided with a second row of defect groups;

the first row of defect groups comprise a plurality of first defects which are arranged at intervals and arranged along a first oblique preset angle;

the second row of defect group comprises a plurality of second defects which are arranged at intervals and arranged along a second oblique preset angle;

the first step is used for simulating a B-type oversleeve ring layer, the second step is used for simulating welding of a single-layer single-channel unfused layer, the third step is used for simulating a breather layer, and the first row of defect groups and the second row of defect groups are arranged in a staggered mode.

According to some embodiments, a connecting line of the first top surface and the two top surfaces coincides with a perpendicular projection of the first side surface;

the second step and the third step are positioned on the same side of the bottom of the first step.

According to some embodiments, twice the sum of the thicknesses of the second step and the third step is less than the thickness of the first step.

According to some embodiments, the first and second preset oblique angles range from 30 ° to 60 °.

According to some embodiments, each of the first defects in the first column of defect groups is disposed at an equal interval;

each second defect in the second column of defect groups is arranged at equal intervals.

According to some embodiments, a first number of defects in the first column of defect groups is different from a second number of defects in the second column of defect groups.

According to some embodiments, there are 7 first defects in the first column of defect groups and 5 second defects in the second column of defect groups.

According to some embodiments, the first defect is a first flat bottomed hole and the second defect is a second flat bottomed hole;

the first flat bottom hole and the second flat bottom hole are flat bottom holes with the same diameter.

According to some embodiments, the first flat-bottomed hole has a hole axis perpendicular to a side of the first step adjacent the first top face;

the hole axis of the second flat bottom hole is perpendicular to the top surface of the second step.

According to some embodiments, the first flat bottomed hole has a hole depth greater than a hole depth of the second flat bottomed hole;

the thickness of the second step is equal to the depth of the second flat bottom hole.

Compared with the prior art, the invention has the following beneficial effects:

during actual detection, the ultrasonic phased array detection device detects defects on the test block and then compares the defects with the defects in actual workpiece detection, so that the size and the position of the defects detected during actual detection of the ultrasonic phased array detection device are accurately obtained. And the first row of defect groups and the second row of defect groups which are arranged in an inclined mode in a different plane are adopted, so that various actual defects of a B-type oversleeve welding joint can be simulated, interference among the defects is avoided, and the accuracy and the precision of ultrasonic phased array detection can be greatly improved.

Drawings

In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.

FIG. 1 is a schematic perspective view of a B-type sleevelet phased array nondestructive testing calibration test block provided by the invention;

FIG. 2 is a schematic diagram of a size-labeled three-dimensional structure of a test block for nondestructive testing and calibration of a B-type oversleeve phased array provided by the invention;

FIG. 3 is a front view of FIG. 2;

FIG. 4 is a top view of FIG. 2;

FIG. 5 is a grid size view of a B-type sleevelet phased array nondestructive testing calibration test block provided by the invention.

In the figure: the first step 100, the first side surface 110, the first row of defect groups 111, the second step 200, the first top surface 210, the second row of defect groups 211, the second top surface 220, and the third step 300.

Detailed Description

In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

Referring to fig. 1, the invention provides a test block for B-type cuff phased array inspection and calibration, the test block for B-type cuff phased array inspection and calibration comprises a first step 100, a second step 200 and a third step 300 which are sequentially connected in a staggered manner from top to bottom, the top surface of the second step 200 comprises a first top surface 210 and a second top surface 220, the first step 100 has a first side surface 110, the first top surface 210 is adjacent to the first side surface 110, the second top surface 220 is connected with the bottom surface of the first step 100, the first side surface 110 is provided with a first row of defect groups 111, and the first top surface 210 is provided with a first row of defect groups 211. The first defect group 111 includes a plurality of first defects, and the plurality of first defects are disposed at intervals and arranged along a first oblique preset angle. The first row of defect groups 211 includes a plurality of second defects, the plurality of second defects are disposed at intervals and arranged along a second oblique preset angle, and the first row of defect groups 111 and the first row of defect groups 211 are arranged in a staggered manner, or the first defects and the second defects are arranged in a staggered manner in a view of a step surface.

The first row of defect groups 111 and the first row of defect groups 211 are processed on the test block for B-type oversleeve phased array detection and calibration, the defects on the test block are detected by the ultrasonic phased array detection device, and then the defects are compared with the defects in actual workpiece detection, so that the size and the position of the defects detected in the actual detection of the ultrasonic phased array detection device are accurately obtained. And the first row of defect groups 111 and the first row of defect groups 211 which are arranged in an inclined mode in a different plane are adopted, so that various actual defects of a B-type oversleeve welding joint can be simulated, meanwhile, interference among the defects is avoided, and therefore the accuracy and the precision of ultrasonic phased array detection can be greatly improved.

It is noted that the first step 100 is used to simulate a B-type oversleeve collar layer, the second step 200 is used to simulate a welded single-layer single-pass unfused layer, and the third step 300 is used to simulate a breather layer.

As shown in fig. 1, a connecting line of the first top surface 210 and the second top surface 220 coincides with a vertical projection of the first side surface 110, and the second step 200 and the third step 300 are located at the same level with the side surface of the bottom of the first step 100. Twice the sum of the thicknesses of the second step 200 and the third step 300 is less than the thickness of the first step 100.

As shown in FIGS. 2 to 5, the test block for B-type cuff phased array inspection and calibration is obtained by cutting a special low alloy steel forging with a thickness of 76mm, a width of 150mm and a length of 370mm, wherein the first step 100 is 50.5mmmm in thickness, 150mm in width, 250mm in length, the second step 200 is 5mm in thickness, 40mm in width, 150mm in length, the third step 300 is 20mm in thickness, 80mm in width and 150mm in length.

The first row of defect groups 111 includes a plurality of first defects, and the plurality of first defects are arranged at intervals and arranged along a first oblique preset angle. First defect group 211 includes a plurality of second defects, and a plurality of second defect intervals set up and predetermine the angle arrangement along the second slant, and wherein, first defect group 111 and the staggered arrangement of first defect group 211 are listed as to first, can effectively avoid the probe that ultrasonic phased array detected to detect to disturb between two adjacent defect holes of debugging process.

According to some embodiments, in order to reduce interference between two adjacent defect holes in the probe detection debugging process of ultrasonic phased array detection, the first row of defect groups 111 and the first row of defect groups 211 may be arranged in a staggered manner, and each first defect and each second defect may be arranged in a staggered manner in a view of the direction of the stepped surface of the test block.

In addition, the first preset oblique angle can be obliquely upward or obliquely downward; the second oblique preset angle can be oblique left or oblique right, and the range of the first oblique preset angle and the second oblique preset angle is 30-60 degrees. Each first defect in the first row of defect group 111 is arranged at equal intervals; each of the second defects in the first column defect group 211 is disposed at equal intervals. The first number of defects in the first column defect group 111 is different from the second number of defects in the first column defect group 211. In the present embodiment, the number of the first defects in the first column defect group 111 is set to 7, and the number of the second defects in the first column defect group 211 is set to 5.

In this embodiment, the first defect is a first flat bottom hole, and the second defect is a second flat bottom hole. The first flat bottomed hole has a hole axis perpendicular to the first side face 110. The second flat bottomed hole has a hole axis perpendicular to the first top face 210.

Because the welding process of the B-type oversleeve pipe and the vent pipe adopts a multilayer and multichannel welding process, the welding thickness of each layer of the welding process is 2.5mm +/-0.5 mm, the welding thickness size of each layer needs to be judged in the phased array detection process, the first flat bottom hole and the second flat bottom hole of the B-type oversleeve phased array test block are flat bottom holes with the same aperture, the aperture size is within the range of 2.5mm-3mm, the number of holes punched by 3mm is small when the thickness of the first step 100 is fixed, time and labor are saved during aperture debugging, namely the aperture sizes of the first flat bottom hole and the second flat bottom hole in the embodiment are preferably 3 mm.

In addition, each first defect in the first column defect group 111 is disposed at an equal interval, and each second defect in the first column defect group 211 is disposed at an equal interval. Namely, two adjacent first flat bottom holes are arranged at equal intervals, and two adjacent second flat bottom holes are arranged at equal intervals. When the first oblique preset angle and the second oblique preset angle are both 45 degrees, and the aperture size of the first flat bottom hole and the aperture size of the second flat bottom hole are preferably 3mm, the hole center distance between the first flat bottom hole and the second flat bottom hole is 6 mm. In the ultrasonic phased array debugging and detecting process, the interference between two adjacent flat bottom holes in the probe detecting and debugging process of ultrasonic phased array detection can be effectively avoided.

The first flat bottom hole has a hole depth greater than that of the second flat bottom hole. Ultrasonic phased array detects during the defect hole of discernment test block, generally can be suitable for 5mm deep flat hole, diminishes along with the hole depth, the reflection signal that ultrasonic phased array accepted easily derives from the test block surface to influence precision and accuracy that defect hole detected on the test block, and because the wall thickness of second step 200 and third step 300 is half of first step 100, when the hole depth of second flat bottom hole was 5mm, then the hole depth of first flat bottom hole was 10 mm. And in the present embodiment, the thickness of the second step 200 is set to be the same as the depth of the second flat bottom hole.

Therefore, when in actual detection, the ultrasonic phased array detection device detects the defects on the test block and then compares the defects with the defects in actual workpiece detection, so that the size and the position of the defects detected when the ultrasonic phased array detection device is in actual detection are accurately obtained. And the first row of defect groups 111 and the first row of defect groups 211 which are arranged in an inclined mode in a different plane are adopted, so that various actual defects of a B-type oversleeve welding joint can be simulated, meanwhile, interference among the defects is avoided, and therefore the accuracy and the precision of ultrasonic phased array detection can be greatly improved.

The same or similar reference numerals in the drawings of the present embodiment correspond to the same or similar components; in the description of the present invention, it should be understood that if there is an orientation or positional relationship indicated by the terms "upper", "lower", "left", "right", etc. based on the orientation or positional relationship shown in the drawings, it is only for convenience of describing the present invention and simplifying the description, but it is not intended to indicate or imply that the referred device or element must have a specific orientation, be constructed in a specific orientation, and be operated, and therefore, the terms describing the positional relationship in the drawings are only used for illustrative purposes and are not to be construed as limiting the present patent, and the specific meaning of the terms may be understood by those skilled in the art according to specific circumstances.