阅读说明：本技术 对至少一个样品进行光学分析的光谱仪装置 (Spectrometer arrangement for optical analysis of at least one sample ) 是由 S·瓦鲁施 R·森德 于 2020-05-26 设计创作，主要内容包括：公开了一种用于对至少一个样品(112)进行光学分析的光谱仪装置(110)。光谱仪装置(110)包括至少一个外壳(116),其具有至少一个入口窗(118)；至少一个波长选择元件(120),其被配置为将入射光(123)分离成组成波长的光谱,波长选择元件(120)设置在外壳(116)内；至少一个探测器装置(122),其被配置为探测组成波长的至少一部分,探测器装置(122)设置在外壳(116)内；以及至少一个接触传感器装置(126),其用于探测光谱仪装置(110)与样品(112)的接触,其中接触传感器装置(126)包括至少一个光学接触传感器装置(128),其中光学接触传感器装置(128)被配置为探测入口窗(118)与样品(112)的接触,其中光学接触传感器装置(128)包括至少一个光学发射器装置(130)和至少一个光学探测器装置(134),其中至少一个光信号从光学发射器装置(130)传输到所述光学探测器装置(134),其中光学接触传感器装置(128)被配置为探测样品(112)的存在对光信号传输的影响。(A spectrometer arrangement (110) for optical analysis of at least one sample (112) is disclosed. The spectrometer arrangement (110) comprises at least one housing (116) having at least one entrance window (118); at least one wavelength selective element (120) configured to separate incident light (123) into a spectrum of constituent wavelengths, the wavelength selective element (120) disposed within the housing (116); at least one detector device (122) configured to detect at least a portion of the constituent wavelengths, the detector device (122) disposed within the housing (116); and at least one contact sensor device (126) for detecting contact of the spectrometer device (110) with the sample (112), wherein the contact sensor device (126) comprises at least one optical contact sensor device (128), wherein the optical contact sensor device (128) is configured to detect contact of the entrance window (118) with the sample (112), wherein the optical contact sensor device (128) comprises at least one optical emitter device (130) and at least one optical detector device (134), wherein at least one optical signal is transmitted from the optical emitter device (130) to said optical detector device (134), wherein the optical contact sensor device (128) is configured to detect an effect of a presence of the sample (112) on the transmission of the optical signal.)

1. Spectrometer arrangement (110) for optical analysis of at least one sample (112), comprising:

-at least one housing (116) having at least one entrance window (118);

-at least one wavelength selective element (120) configured to separate incident light (123) into a spectrum of constituent wavelengths, the wavelength selective element (120) being arranged within the housing (116);

-at least one detector arrangement (122) configured to detect at least a portion of the constituent wavelengths, the detector arrangement (122) being disposed within the housing (116); and

-at least one contact sensor device (126) for detecting contact of the spectrometer device (110) with the sample (112), wherein the contact sensor device (126) comprises at least one optical contact sensor device (128), wherein the optical contact sensor device (128) is configured to detect contact of the entrance window (118) with the sample (112), wherein the optical contact sensor device (128) comprises at least one optical emitter device (130) and at least one optical detector device (134), wherein at least one optical signal is transmitted from the optical emitter device (130) to the optical detector device (134), wherein the optical contact sensor device (128) is configured to detect an effect of the presence of the sample (112) on the transmission of the optical signal.

2. The spectrometer arrangement (110) according to the preceding claim, wherein the spectrometer arrangement (110) comprises at least one illumination source (138) for illuminating the sample (112).

3. The spectrometer arrangement (110) according to any of the preceding claims, wherein the contact sensor arrangement (126) is configured to detect contact between the entrance window (118) and the sample (112).

4. The spectrometer arrangement (110) according to any of the preceding claims, wherein the spectrometer arrangement (110) comprises at least one spacer element, wherein the contact sensor arrangement (126) is configured to detect contact of the spacer element with the sample (112).

5. The spectrometer arrangement (110) according to any of the preceding claims, wherein the entrance window (118) is completely or partially made of at least one transparent material.

6. The spectrometer arrangement (110) according to any of the preceding claims, wherein the contact sensor arrangement (126) comprises at least one arrangement selected from the group consisting of: an optical contact sensor arrangement (128); an electrical contact sensor arrangement; mechanical contact sensor device, in particular acoustic contact sensor device.

7. The spectrometer arrangement (110) according to any of the preceding claims, wherein the optical contact sensor arrangement (128) is configured to at least partially transmit the optical signal by using the entrance window (118) as a waveguide, wherein the optical contact sensor arrangement (128) is configured such that contact between the sample (112) and the entrance window (118) changes a waveguide characteristic of the entrance window (118).

8. The spectrometer arrangement (110) according to any of the preceding claims, wherein the contact sensor arrangement (126) comprises at least one inertial sensor.

9. The spectrometer arrangement (110) according to the preceding claim, wherein the inertial sensor comprises at least one of a vibration sensor or a motion sensor.

10. The spectrometer device (110) according to any of the two preceding claims, wherein the inertial sensor comprises at least one movable element, wherein one or both of the vibration or motion of the movable element is changed by contact of the spectrometer device (110) with the sample (112).

11. The spectrometer arrangement (110) according to any of the preceding claims, wherein the contact sensor arrangement (126) comprises at least one of a WiFi or a bluetooth module.

12. The spectrometer arrangement (110) according to any of the preceding claims, the spectrometer arrangement (110) comprising a plurality of contact sensor arrangements (126), the spectrometer arrangement (110) further comprising at least one evaluation arrangement (124), the evaluation arrangement (124) being configured to evaluate a combination of sensor signals of the plurality of contact sensor arrangements (126).

13. The spectrometer arrangement (110) according to any of the preceding claims, wherein the spectrometer arrangement (110) is configured to automatically trigger an optical analysis of the at least one sample (112) when the contact sensor arrangement (126) detects contact of the spectrometer arrangement (110) with the sample (112).

14. The spectrometer arrangement (110) according to any of the preceding claims, wherein the spectrometer arrangement (110) is a hand-held spectrometer arrangement (110).

15. A method for optical analysis of at least one sample (112), the method comprising:

i) providing at least one spectrometer arrangement (110) according to any of the preceding claims;

ii) access to at least one sample (112) to be analyzed with the spectrometer arrangement (110);

iii) detecting contact of the spectrometer device (110) with the sample (112) using the contact sensor device (126); and

iv) performing at least one optical analysis of the sample (112) using the spectrometer arrangement (110).

16. Use of the spectrometer arrangement (110) according to any of the preceding claims referring to the spectrometer arrangement (110) for a use purpose selected from the group consisting of: infrared detection applications; (ii) spectroscopic application; an exhaust monitoring application; a combustion process monitoring application; pollution monitoring applications; industrial process monitoring applications; chemical process monitoring applications; monitoring the food processing process; water quality monitoring application; air quality monitoring applications; quality control applications; exhaust gas control applications; gas sensing applications; gas analysis applications; chemical sensing applications.

17. A computer program for use in a spectrometer arrangement (110) according to any of the preceding claims referring to a spectrometer arrangement (110), comprising instructions which, when the computer program is executed by an evaluation arrangement (124) of the spectrometer arrangement (110), cause the evaluation arrangement (124) to evaluate at least one sensor signal provided by the at least one contact sensor arrangement (126) of the spectrometer arrangement (126) and to detect a contact of the spectrometer arrangement (110) with the sample (112).

Technical Field

The present invention relates to a spectrometer arrangement, a method for optical analysis of at least one sample, use of a spectrometer arrangement and a computer program for use in a spectrometer arrangement. Such devices and methods may be used, for example, for investigation or monitoring purposes in general, and in particular in the Infrared (IR) spectral region, and in particular in the Near Infrared (NIR) and mid infrared (MidIR) spectral regions. However, a wider variety of applications are possible.

Background

Various spectrometer devices and systems for studying the Infrared (IR) spectral region, in particular the Near Infrared (NIR) spectral region, are known. These spectrometer devices and systems typically include one or more wavelength selective elements for separating incident light into spectra of constituent wavelengths, and one or more detector devices, such as one or more prisms, gratings, filters, etc., for detecting the constituent wavelengths. In particular, spectrometer arrangements have been proposed which comprise a combination of a Linear Variable Filter (LVF) and a detector array. Here, the LVF is designated for separating light captured from an object (also referred to as a sample) into spectra of constituent wavelength signals, and the detector array includes a plurality of pixels, wherein each of the plurality of pixels is configured to receive at least a portion of the plurality of constituent wavelength signals that provide a power reading for each constituent wavelength. Typically, to achieve that the incident light can be incident on the LVF perpendicular to the LVF receiving surface, a baffle is used for this purpose, however, this typically results in a lower luminous flux and a poorer signal-to-noise ratio.

In US 2018/231415 a1, a closed bench-top analysis device is described, as well as system processes and techniques related thereto. The bench top analytical device may include a housing enclosing the probe and the sample. The compliance component can determine whether one or more compliance rules are satisfied, such as compliance rules associated with closing the enclosure in an operable configuration based on the enclosure cover. If it is determined that the compliance rule is satisfied, the compliance component can enable release of the optical energy to poll the sample via the probe.

Furthermore, EP 1063501 a1 describes a measuring head for an optical measuring device, in particular a spectrometer device, comprising a front unit which is movable and/or compressible and extendable between a starting position and a measuring position, wherein the front unit is biased in the starting position; further comprising a stationary rear unit being a sensor for indicating whether the front unit is in the measuring position, wherein the front unit further comprises at least three carrier points for positioning a sample with respect to the front unit, wherein the at least three carrier points are each provided with a sensor indicating whether the sample is in contact with the respective carrier point.

For field applications, portable spectrometer devices have been developed. Thus, as one of various examples, US 2014/131578 a1 discloses a portable spectrometer device comprising an illumination source for directing a sample and a Tapered Light Pipe (TLP) for capturing light interacting with the sample at a first focal ratio and for delivering the light to the LVF at a second focal ratio lower than the first focal ratio. Furthermore, WO 97/08537 a1 describes that a hand-held device for making infrared reflectance measurements of a sample to identify the sample material is a self-contained portable unit built into the hand-held housing. With respect to other portable spectrometers and spectrometer principles that can also be used in the context of the present invention, reference may be made to "Handhelded spectrometers in 2018and laters: MOEMS, photonics, and smartphones (2018 and later hand-held spectrometers: MOEMS, photoelectricity, and smartphones, Proc. SPIE 10545, < MOEMS and miniaturized systems XVII, < 105450C (2.22.2018); doi: 10.1117/12.2286492)" published by Richard A. Crombe.

Furthermore, US 2004/147984 a1 describes an apparatus that uses at least one low-power optical radiation source in a suitable head that can be held over a treatment area for a considerable period of time or can be moved over the treatment area multiple times during each treatment. The device (handheld Light Emitting Applicator (LEA) or Light Emitting Skin Applicator (LESA)) may be in the form of a brush or roller adapted to move over the surface of the patient's skin when applying radiation to the skin. The skin contacting surface of the LEA or LESA may have protrusions, such as protrusions or bristles that can massage the skin and transmit radiation. Furthermore, an apparatus for delivering optical radiation to a treatment area is disclosed, comprising a retrofit housing adapted to be connected to a skin contact device.

In JP S60241260A, a small-sized contact sensor is described in which a contact state is always detected with high accuracy. A pair of piezoelectric elements are provided on the vibrator, one of which is used for the vibrator to be vibrated, while detection means for detecting a force generated on the other piezoelectric element due to the vibration is also provided. When the sample contacts the vibrator and the vibration of the vibrator is restricted, the contact state of the sample is detected by the detecting means.

Furthermore, EP 1240617 a2 a1, published as WO 01/48684 a2, describes a method and apparatus for calculating information relating to contact on a contact sensitive device using bending wave vibrations. The method comprises the following steps: providing a member capable of supporting bending waves in a contact sensitive device, thereby providing a means attached to the member for measuring bending wave propagation in the member to determine a measured bending wave signal, and processing the measured bending wave signal to calculate information relating to the contact.

However, the application of especially handheld spectrometer devices in the field may lead to challenges in measurement accuracy. Thus, in many cases, a spectrometer operating in reflection mode is required to have a well-defined contact with the sample. Typically, the entrance window or mechanical spacer of the spectrometer device will contact the sample. For example, it may be necessary to dip the inlet window into the oil to be analyzed, or it may be necessary for a mechanical spacer to contact the surface of the wood to be analyzed. If the spectrometer device is in insufficient or not well defined contact with the sample, the light attenuation from the sample may be erroneously estimated.

Problems to be solved

It is therefore desirable to provide an apparatus and method that addresses the above challenges and disadvantages of known spectrometer apparatus. In particular, devices and methods should be proposed that enable highly reproducible spectrometer measurements to be made in the field, even under harsh environmental conditions.

Disclosure of Invention

This problem is solved by a spectrometer arrangement, a method for optical analysis of at least one sample, a use of a spectrometer arrangement and a computer program for use in a spectrometer arrangement with the features of the independent claims. Advantageous embodiments which can be realized individually or in any combination are set forth in the dependent claims.

As used hereinafter, the terms "having," "including," or any grammatical variations thereof, are used in a non-exclusive manner. Thus, these terms may refer to the absence of other features in the entities described in the context, in addition to the features introduced by these terms, as well as the presence of one or more other features. For example, the expressions "a has B", "a contains B" and "a includes B" may refer to both the case where no other element is present in a than B (i.e., the case where a contains only B), and also to the case where one or more other elements, such as elements C, and D, or even other elements, are present in entity a than B.

Furthermore, it should be noted that the terms "at least one," "one or more," or similar language indicating that a feature or element may occur or be present more than once is typically used only once when introducing the corresponding feature. In the following, in most cases, the expression "at least one" or "one or more" will not be repeated when referring to corresponding features or elements, although corresponding features or elements may occur one or more than one time.

Furthermore, as used hereinafter, the terms "preferably," "more preferably," "particularly," "more particularly," "specifically," "more specifically," or similar terms are used in conjunction with the optional features, without limiting the possibilities of substitution. Thus, the features introduced by these terms are optional features and are not intended to limit the scope of the claims in any way. Those skilled in the art will recognize that the invention may be implemented using alternate features. Similarly, features introduced by "in embodiments of the invention" or similar expressions are intended to be optional features, do not set any limit on the alternative embodiments of the invention, do not set any limit on the scope of the invention, and do not set any limit on the possibilities of combinations of features introduced in this way with other optional or non-optional features of the invention.

In a first aspect of the invention, a spectrometer arrangement for optical analysis of at least one sample is presented. The spectrometer arrangement comprises:

-at least one housing having at least one access window;

-at least one wavelength selective element configured to separate incident light into a spectrum of constituent wavelengths, the wavelength selective element being disposed within the housing;

-at least one detector arrangement configured to detect at least a portion of the constituent wavelengths, the detector arrangement being disposed within the housing; and

-at least one contact sensor device for detecting contact of the spectrometer device with the sample.

The term "spectrometer device" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly, but not exclusively, refer to a device capable of performing an optical analysis of at least one sample, thereby generating at least one information about at least one spectral characteristic of the sample. In particular, the term may refer to a device capable of recording signal intensities with respect to respective wavelengths of a spectrum or a partition thereof (e.g. a wavelength interval), wherein the signal intensities may preferably be provided as electrical signals for further evaluation. Additionally or alternatively, the spectrometer arrangement may also be embodied wholly or partly as a fourier transform spectrometer arrangement. The spectrometer arrangement may typically be operated in a reflective mode and/or may be operated in a transmissive mode, for example.

The spectrometer device may particularly be a handheld spectrometer device. The term "handheld" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art without being limited to a special or customized meaning. The term may particularly refer, but not exclusively, to the characteristic of a device that is capable of being moved and/or displaced by a human user, particularly of being carried by a human user, in particular by a single hand of a human user. In particular, the handheld device may be dimensioned to be carried by a human user, for example extending no more than 500mm, in particular no more than 300mm, in any dimension. Additionally or alternatively, the weight of the handheld device carried by the human user does not exceed 5kg, in particular does not exceed 3kg, or even does not exceed 0.5 kg.

The term "analyze" or the term "analyze" is a broad term and is given its ordinary and customary meaning to one of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly refer, but is not limited to, a process of deriving at least one item of information about a property of a sample. Thus, the term "optical analysis" or "optical analysis" refers to a process of analysis or analysis by using optical means (e.g., spectroscopic means). In particular, the spectrometer arrangement may be configured to derive at least one information about at least one spectral characteristic of the sample. As an example, the spectrometer arrangement may be configured to derive at least one item of spectral information about the sample, such as at least one intensity distribution over a spectral range of a reflection spectrum and/or a transmission spectrum. Additionally or alternatively, the analysis may be or may include fourier transform spectroscopy. However, other examples are possible. The handheld spectrometer device may be specifically configured to provide at least one item of electronic information, such as analog and/or digital signals, representative of the at least one item of spectral information.

The term "sample" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly refer to, but is not limited to, any number of materials, elements or devices to be analyzed. In particular, the sample may be a quantity of material, such as a quantity of one or more of a liquid, a powder, a pellet, a granule, or a gas. For example, the sample may comprise a solid bulk material, such as grain. Alternatively, however, the sample may also be or may comprise a solid item, such as a fruit or vegetable. Other examples are possible. Specific examples of samples and applications are given in more detail below.

The term "housing" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly refer to, but is not limited to, an element or a combination of elements configured to completely or partially surround and/or provide mechanical coverage to one or more other elements. Thus, as an example, the housing may be or may comprise at least one rigid housing, for example made of at least one of a plastic material or a metal. The edge may in particular be configured to engage with the housing by one or more of a form-fit connection, a press-fit connection or a material-bonded connection. Thus, as an example, as will be outlined in more detail below, the rim may be or may provide one or more connection elements and/or may provide a flexible frame and/or a sealing frame that completely or partially surrounds the front surface of the spectrometer device.

The term "portal window" is a broad term and is given its ordinary and customary meaning to one of ordinary skill in the art, and is not limited to a special or customized meaning. The term may particularly refer to, but is not limited to, any element, such as an optically transparent element made of one or more of glass, quartz, sapphire or a plastic material, or an opening of a handheld spectrometer device that allows light to enter the housing. Thus, as an example, the entrance window may be or may comprise an opening in the housing. The opening may be empty or may be completely or partially filled with one or more transparent elements, for example one or more transparent elements selected from glass elements, quartz elements or plastic elements.

The term "wavelength selective element" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly refer, but is not limited to, any element or combination of elements adapted to perform one or more of transmitting, reflecting, deflecting or scattering light in a wavelength dependent manner. As an example, the wavelength selective element may be or may comprise at least one element selected from the group consisting of: a grating; an optical prism; wavelength selective optical filters, in particular length variable filters; wavelength selective micro-optical devices, particularly micro-opto-electro-mechanical (MOEM) devices dedicated to fourier transform spectrometers.

The term "detector device" is a broad term and is given its ordinary and customary meaning to a person of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly, but not exclusively, refer to any device or combination of devices capable of monitoring and/or recording at least one physical, chemical or biological parameter. In particular, the detector arrangement may comprise at least one optical detector arrangement, e.g. an arrangement configured for recording and/or monitoring incident light. The detector arrangement may be sensitive in one or more of the visible, ultraviolet or infrared spectral range, in particular the near infrared spectral range (NIR). Thus, the detector device may particularly be or may comprise an optical detector element, such as at least one optical sensor, e.g. an optical semiconductor sensor. As an example, in particular in case the detector arrangement is sensitive in the infrared spectral range, for example in the near infrared spectral range, the semiconductor sensor may be or may comprise at least one semiconductor sensor comprising at least one material selected from the group consisting of PbS, PbSe, InGaAs and extended InGaAs. As an example, the detector arrangement may comprise at least one photodetector, such as at least one CCD or CMOS arrangement. The detector arrangement may particularly comprise at least one detector array comprising a plurality of pixelated sensors, wherein each pixelated sensor is configured to detect at least a part of at least one of the constituent wavelengths. However, additionally or alternatively, the detector arrangement may also comprise at least one single-pixel detector arrangement, in particular at least one single-pixel optical detector element. The latter may particularly be used in case the spectrometer arrangement is fully or partially embodied as a single-pixel spectrometer arrangement, e.g. a single-pixel fourier transform spectrometer arrangement.

The term "touch sensor device" is a broad term and is given its ordinary and customary meaning to one of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly refer to, but is not limited to, any device configured to detect or sense contact between the device and another element or material. Thus, as will be outlined in more detail below, the contact sensor device may particularly be configured to generate at least one signal, in particular an electrical signal, which is indicative of a contact or non-contact between the contact sensor device and another element or material. Wherein direct physical contact may be detected and/or proximity of other elements or materials may be detected, for example proximity within a predetermined distance. Thus, the contact sensor device may be in direct contact with the element or material to be detected, or may be in indirect contact with the element or material to be detected, e.g. via at least one or more intermediate elements or layers, e.g. one or more cover layers covering the contact sensor device.

The spectrometer arrangement may particularly be configured to operate in a reflection mode. As used herein, a reflection mode is a mode of operation of a spectrometer device, wherein the spectrometer device is configured to analyze light reflected or scattered by a sample. Wherein the light reflected or scattered by the sample may be ambient light and/or may be light generated by and/or directed onto the sample by the spectrometer arrangement and subsequently reflected or scattered by the sample, wherein at least a portion of the reflected or scattered light may be analyzed by the spectrometer arrangement.

In particular, the spectrometer arrangement may comprise at least one illumination source for illuminating the sample. The illumination source may in particular comprise at least one element selected from the group consisting of: an LED; a laser; an incandescent lamp, in particular an incandescent lamp comprising at least one resistive heating element, more particularly a resistive heating element comprising silicon carbide (more particularly a silicon rod). The at least one illumination source, also referred to as light source, may be located completely or partially inside the housing of the spectrometer arrangement and/or may be located completely or partially outside the housing of the spectrometer arrangement and/or may also be completely or partially integrated into the housing of the spectrometer arrangement. In case at least one illumination source is located inside the housing, the illumination of the sample may be performed completely or partially through the entrance window of the housing and/or may be performed completely or partially through at least one separate illumination opening.

The contact sensor device may particularly be configured to detect contact between the entrance window and the sample. Thus, contact between the entrance window and the sample may be detected in various ways, e.g. by detecting pressure on the entrance window, by optically detecting contact between the entrance window and the sample or by other detection means, e.g. by detecting a change in a vibrational characteristic of the entrance window or the like, etc. In general, as an example, the contact sensor device may comprise at least one of an optical contact sensor device, an electrical contact sensor device, or a mechanical contact sensor device, including the option of an acoustic contact sensor device.

Additionally or alternatively, the spectrometer arrangement may comprise at least one spacer element. As used herein, the term "spacer element" may particularly refer to a spacer element configured to place or keep a sample at a predetermined distance to a spectrometer device, a housing of a spectrometer device, an entrance window or any other element of a spectrometer device. Thus, as an example, the spacer element may comprise at least one spacer rod, at least one spacer ring or the like.

In case the spectrometer arrangement comprises at least one spacer element, the contact sensor arrangement may further be configured to fully or partially detect the contact of the spacer element with the sample. In addition, various sensing principles may be used to detect contact of the spacer element with the sample, for example using one or more of optical contact sensor means, mechanical contact sensor means, electrical contact sensor means.

As mentioned above, the entrance window may be made completely or partially of at least one transparent material. For example, the transparent material may be made entirely or partially of one or more of an organic transparent material or an inorganic transparent material, for example of at least one of a transparent plastic material, glass or quartz or sapphire.

As described above, in general, exemplary touch sensor devices may include at least one device selected from the group consisting of: an optical contact sensor device; an electrical contact sensor arrangement; a mechanical contact sensor device, in particular one or more buttons; an acoustic contact sensor device.

Thus, the contact sensor device may comprise at least one optical contact sensor device. The optical contact sensor device may be configured to detect contact of the entrance window with the sample. As an example, the optical contact sensor device may comprise at least one optical emitter device and at least one optical detector device, wherein at least one optical signal is transmitted from the optical emitter device to the optical detector device. The optical contact sensor device is configured to detect the effect of the presence of a sample on the transmission of an optical signal. As an example, the optical emitter device may comprise at least one light emitting diode and/or at least another type of light source located at the edge of the entrance window. As an example, the optical detector arrangement may comprise at least one photodiode and/or another type of photosensitive element and may be positioned at opposite edges of the entrance window. In general, the optical contact sensor apparatus may be configured to transmit an optical signal at least partially with the entrance window as a waveguide. The optical contact sensor device may be configured such that contact between the sample and the entrance window changes a waveguide characteristic of the entrance window. Thus, in general, once a component or material contacts an optical waveguide, the waveguide characteristics of the waveguide may change, for example due to a change in the refractive index ratio at the interface between the waveguide and the component or material. For example, in the case where a liquid, transparent material contacts the waveguide, light outcoupling may occur, and the waveguide characteristics of the waveguide may deteriorate. In general, optical contact sensor devices can detect these changes by analyzing the transmitted signal, for example by detecting a deterioration in the signal transmission and a deterioration in the waveguide characteristics.

Additionally or alternatively, the contact sensor arrangement comprises at least one inertial sensor. The term "inertial sensor" is a broad term and is given its ordinary and customary meaning to one of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly, but not exclusively, refer to a sensor configured to detect a change in inertia of at least one element. Thus, as an example, the inertial sensor may be or may comprise at least one vibration sensor and/or at least one motion sensor. As an example, the vibration sensor may comprise at least one vibrating mass, for example at least one vibrating surface or membrane, the vibration characteristics of which depend on the contact between the vibrating mass and the surrounding environment and/or on the covering of the vibrating element by at least one material. Thus, by detecting a change in a vibrational characteristic of the vibrating mass, for example by detecting a change in the resonant frequency of the vibrating mass, an inertial change in the vibrating mass, for example in damped contact with a material such as a sample, can be detected. For example, once the diaphragm is in contact with the sample, the vibration of the diaphragm is typically damped. Similarly, other types of motion may be damped when the moving element is in contact with the sample. These changes in inertial properties can be detected, for example electronically. The inertial sensor may generally comprise at least one movable element, wherein one or both of the vibration or motion of the movable element may be altered by contact of the spectrometer device, in particular the inertial sensor, with the sample. The inertial sensor may additionally or alternatively comprise at least one oscillatory member, wherein contact of the spectrometer device with the sample changes at least one oscillatory characteristic of the oscillatory member.

As mentioned above, the at least one contact sensor device may also be or may comprise at least one electronic contact sensor device. Wherein the at least one electronic contact sensor device may comprise at least one electromagnetic emitter, as an example. In particular, the electromagnetic emitter may be configured to emit electromagnetic waves in a wavelength range of at least 1 micrometer, such as at least 1 millimeter, even at least 1 meter. As an example, the contact sensor device may include at least one of a WiFi or bluetooth module. Thus, as an example, the contact sensor device may detect a change in reflection and/or transmission of WiFi and/or bluetooth signals due to the presence of the sample.

In general, the contact sensor device may comprise at least one proximity sensor device. The term "proximity sensor" is a broad term and is given its ordinary and customary meaning to one of ordinary skill in the art, and is not limited to a specific or customized meaning. The term may particularly, but not exclusively, refer to any sensor or sensor arrangement configured to detect the proximity of an element or object, for example within a predetermined range. For inductive proximity, various sensor principles are well known, such as electronic proximity sensors, e.g. inductive proximity sensors. In particular, the touch sensor device may comprise at least one capacitive proximity sensor device. As an example, a capacitive proximity sensor device may include at least one capacitor whose capacitance changes as an object or element approaches. Thus, the proximity of the sample may change the capacitance of the capacitive proximity sensor apparatus. A change in capacitance can be detected.

The spectrometer arrangement may comprise a single contact sensor arrangement or a plurality of contact sensor arrangements. Where multiple contact sensor devices are included, each of the contact sensor devices may provide a sensor signal. The spectrometer arrangement may comprise at least one evaluation device, for example at least one evaluation device with at least one processing unit or processor. The evaluation device may generally be configured to evaluate a combination of sensor signals of a plurality of contact sensor devices. Thus, as an example, the evaluation device may comprise at least one data processing unit, wherein the data processing unit may be configured by programming to evaluate the sensor signal. In particular, the data processing unit may be configured to apply a mathematical algorithm to the sensor signals of the plurality of contact sensor devices. As an example, the evaluation device may be configured to apply a kalman filter to the sensor signal. By applying a kalman filter to the sensor signal, an estimate of the measurement data may be generated and/or errors in the sensor signal may be reduced, thereby generating more reliable information about the proximity of the sample and/or the environment of the sample and spectrometer arrangement.

The spectrometer device may in particular be configured to automatically trigger an optical analysis of said at least one sample when said contact sensor device detects contact of said spectrometer device with said sample. Thus, as an example, the evaluation means may generally control the spectrometer arrangement and/or may cooperate with the control means of the spectrometer arrangement. The evaluation means and/or the control means may trigger the emission of a light beam from the spectrometer means onto the sample and/or may trigger the detector means to detect light, i.e. detect at least a part of the constituent wavelengths, once the at least one sensor signal of the at least one contact sensor means indicates contact of the spectrometer means with the sample and/or indicates proximity of the sample (e.g. within a predetermined range).

In another aspect of the invention, a method for optical analysis of at least one sample, in particular at least one liquid sample, is disclosed. The method comprises the following method steps. In particular, the method steps may be performed in the given order. However, different sequences are also possible, including the option of performing one or more method steps completely or partially simultaneously. Furthermore, one or more method steps may be performed in an iterative manner. The method may include additional steps not listed. The method comprises the following steps:

i) providing at least one spectrometer arrangement according to any of the preceding claims;

ii) access to at least one sample to be analyzed with the spectrometer device;

iii) detecting contact of the spectrometer device with the sample using the contact sensor device; and

iv) performing at least one optical analysis of the sample using the spectrometer device.

In another aspect, a use of a spectrometer arrangement according to the invention, e.g. according to any of the embodiments disclosed above and/or according to any of the embodiments disclosed in further detail below, for a use purpose selected from the group consisting of: infrared detection applications; (ii) spectroscopic application; an exhaust monitoring application; a combustion process monitoring application; pollution monitoring applications; industrial process monitoring applications; chemical process monitoring applications; monitoring the food processing process; water quality monitoring application; air quality monitoring applications; quality control applications; exhaust gas control applications; gas sensing applications; gas analysis applications; chemical sensing applications.

A computer program for use in a spectrometer arrangement according to the invention is further disclosed and presented herein. The computer program comprises instructions which, when executed by an evaluation device of the spectrometer device, cause the evaluation device to evaluate at least one sensor signal provided by at least one contact sensor device of the spectrometer device and detect contact of the spectrometer device with the sample. The instructions may in particular cause the evaluation device to evaluate a combination of sensor signals of a plurality of the contact sensor devices.

Further disclosed and proposed herein is a computer program comprising computer executable instructions for performing the method according to the invention in one or more embodiments contained herein, when said program is executed on a computer or a computer network. In particular, the computer program may be stored on a computer readable data carrier and/or on a computer readable data storage means. Thus, in particular, one, more than one, even all of the above-mentioned method steps iii) or iv) may be performed using a computer or a network of computers, preferably using a computer program.

Further disclosed and proposed herein is a computer program product having program code means for performing the method according to the invention in one or more of the embodiments contained herein, when said program is executed on a computer or a network of computers. In particular, the program code means may be stored on a computer readable data carrier and/or a computer readable data storage means.

Further disclosed and proposed herein is a data carrier or computer-readable data storage device on which a data structure may be stored, which data structure, after being loaded into a computer or computer network, for example into a working memory or a main memory of the computer or computer network, may carry out the method according to one or more embodiments disclosed herein.

Further disclosed and proposed herein is a computer program product having program code means stored on a machine readable carrier and/or a computer readable data storage means for performing a method according to one or more embodiments disclosed herein, when said program is executed on a computer or a computer network. As used herein, a computer program product refers to a program that is a tradable product. The product can generally be present in any format, for example in a paper format, or on a computer-readable data carrier. In particular, the computer program product may be distributed over a data network.

Finally, there is disclosed and proposed herein a modulated data signal containing instructions readable by a computer system or computer network for performing a method according to one or more embodiments disclosed herein.

With reference to computer-implemented aspects of the invention, one or more, or even all, of the method steps of a method according to one or more embodiments disclosed herein may be performed or supported using a computer or network of computers. Thus, in general, any method steps including the provision and/or manipulation of data may be performed using a computer or a network of computers. In general, these method steps may include any method steps, usually in addition to those that require manual work, such as providing a sample and/or performing some aspect of an actual measurement.

The spectrometer apparatus and method provide a number of advantages over such known apparatus and methods. In particular, therefore, the spectrometer arrangement and method solves the above technical challenges. In particular, the spectrometer arrangement may be applied in the field under harsh conditions and may still provide well-defined and repeatable measurement settings. The spectrometer device itself may detect contact with the sample, in particular whether the entrance window or the spacer is in contact with the sample. Thus, the light attenuation from the sample can always be correctly estimated, and therefore the reproducibility of the measurement can be significantly increased.

To summarize and not to exclude other possible embodiments, the following embodiments may be envisaged:

example 1: a spectrometer arrangement for optical analysis of at least one sample, comprising:

-at least one housing having at least one access window;

-at least one wavelength selective element configured to separate incident light into a spectrum of constituent wavelengths, the wavelength selective element being disposed within the housing;

-at least one detector arrangement configured to detect at least a portion of the constituent wavelengths, the detector arrangement being disposed within the housing; and

-at least one contact sensor device for detecting contact of the spectrometer device with the sample.

Example 2: the spectrometer arrangement according to the previous embodiment, wherein the spectrometer arrangement comprises a sensor configured to operate in a reflective mode.

Example 3: the spectrometer arrangement according to any of the preceding embodiments, wherein the spectrometer arrangement comprises at least one illumination source for illuminating the sample.

Example 4: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement is configured to detect contact between the entrance window and the sample.

Example 5: the spectrometer arrangement according to any of the preceding embodiments, wherein the spectrometer arrangement comprises at least one spacer element, wherein the contact sensor arrangement is configured to detect contact of the spacer element with the sample.

Example 6: the spectrometer arrangement according to any of the preceding embodiments, wherein the entrance window is made completely or partially of at least one transparent material.

Example 7: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement comprises at least one arrangement selected from the group consisting of: an optical contact sensor device; an electrical contact sensor arrangement; mechanical contact sensor device, in particular acoustic contact sensor device.

Example 8: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement comprises at least one optical contact sensor arrangement.

Example 9: the spectrometer arrangement according to the previous embodiment, wherein the optical contact sensor arrangement is configured to detect contact of the entrance window with the sample.

Example 10: the spectrometer arrangement according to any of the two preceding embodiments, wherein the optical contact sensor arrangement comprises at least one optical emitter arrangement and at least one optical detector arrangement, wherein at least one optical signal is transmitted from the optical emitter arrangement to the optical detector arrangement, wherein the optical contact sensor arrangement is configured to detect the effect of the presence of the sample on the transmission of the optical signal.

Example 11: the spectrometer arrangement according to the previous embodiment, wherein the optical contact sensor arrangement is configured to at least partially transmit the optical signal by using the entrance window as a waveguide.

Example 12: the spectrometer arrangement according to the previous embodiment, wherein the optical contact sensor arrangement is configured such that contact between the sample and the entrance window changes a waveguide characteristic of the entrance window.

Example 13: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement comprises at least one inertial sensor.

Example 14: the spectrometer apparatus according to the previous embodiment, wherein the inertial sensor comprises at least one of a vibration sensor or a motion sensor.

Example 15: the spectrometer device according to any of the two preceding embodiments, wherein the inertial sensor comprises at least one movable element, wherein one or both of the vibration or motion of the movable element is altered by contact of the spectrometer device with the sample.

Example 16: the spectrometer device according to any of the three preceding embodiments, wherein said inertial sensor comprises at least one oscillatory member, wherein contact of said spectrometer device with said sample changes at least one oscillatory characteristic of said oscillatory member.

Example 17: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement comprises at least one electromagnetic emitter.

Example 18: the spectrometer apparatus of any of the preceding embodiments, wherein the contact sensor apparatus comprises at least one of a WiFi or bluetooth module.

Example 19: the spectrometer arrangement according to any of the preceding embodiments, wherein the contact sensor arrangement comprises at least one proximity sensor arrangement.

Example 20: the spectrometer arrangement according to any of the preceding embodiments, wherein said contact sensor arrangement comprises at least one capacitive proximity sensor arrangement.

Example 21: the spectrometer arrangement according to any of the preceding embodiments, comprising a plurality of contact sensor arrangements, the spectrometer arrangement further comprising at least one evaluation arrangement configured to evaluate a combination of sensor signals of the plurality of contact sensor arrangements.

Example 22: the spectrometer arrangement according to the previous embodiment, wherein said evaluation arrangement comprises at least one data processing unit, wherein said data processing unit is programmatically configured to apply a mathematical algorithm to the sensor signals of said plurality of contact sensor arrangements.

Example 23: the spectrometer arrangement according to any of the two preceding embodiments, wherein the evaluation arrangement is configured to apply a kalman filter to the sensor signal.

Example 24: the spectrometer device according to any of the preceding embodiments, wherein the spectrometer device is configured to automatically trigger the optical analysis of the at least one sample when the contact sensor device detects contact of the spectrometer device with the sample.

Example 25: the spectrometer arrangement according to any of the preceding embodiments, wherein the spectrometer arrangement is a handheld spectrometer arrangement.

Example 26: a method for optically analyzing at least one sample, the method comprising:

i) providing at least one spectrometer arrangement according to any of the preceding embodiments;

ii) access to at least one sample to be analyzed with the spectrometer device;

iii) detecting contact of the spectrometer device with the sample using the contact sensor device; and

iv) performing at least one optical analysis of the sample using the spectrometer device.

Example 27: use of the spectrometer arrangement according to any of the preceding embodiment claims referring to a spectrometer arrangement for a purpose of use selected from the group consisting of: infrared detection applications; (ii) spectroscopic application; an exhaust monitoring application; a combustion process monitoring application; pollution monitoring applications; industrial process monitoring applications; chemical process monitoring applications; monitoring the food processing process; water quality monitoring application; air quality monitoring applications; quality control applications; a motion control application; exhaust gas control applications; gas sensing applications; gas analysis applications; chemical sensing applications.

Example 28: a computer program for use in a spectrometer arrangement according to any of the preceding embodiments referring to a spectrometer arrangement, comprising instructions which, when executed by an evaluation device of the spectrometer arrangement, cause the evaluation device to evaluate at least one sensor signal provided by the at least one contact sensor device of the spectrometer arrangement and to detect contact of the spectrometer arrangement with the sample.

Example 29: the computer program according to the preceding embodiment, wherein the instructions cause the evaluation device to evaluate a combination of sensor signals of the plurality of contact sensor devices.

Drawings

Further optional features and embodiments will be disclosed in the subsequent description of embodiments, preferably in more detail in connection with the dependent claims. Wherein the various optional features may be implemented in isolation and in any arbitrary feasible combination, as the skilled person will appreciate. The scope of the invention is not limited by the preferred embodiments. This embodiment is schematically depicted in the figures.

In the drawings:

fig. 1 shows an exemplary embodiment of a spectrometer arrangement comprising a contact sensor arrangement.

Detailed Description

In fig. 1, an exemplary embodiment of a spectrometer arrangement 110 is shown. In a particular example, the spectrometer arrangement 110 may specifically be embodied as a mobile or handheld spectrometer arrangement. The spectrometer arrangement 110 is shown in cross-section in fig. 1. Spectrometer arrangement 110 is configured to analyze at least one sample 112. For example, in FIG. 1, a liquid sample 112 is shown. Nevertheless, the spectrometer arrangement 110 may also be applied to other types of samples 112, such as solid samples, e.g. grains, fruits or vegetables. Other examples are possible. In the arrangement of fig. 1, spectrometer device 110 is shown in physical contact with sample 112, for example by dipping front end 114 of spectrometer device 110 into sample 112.

The spectrometer arrangement 110 includes a housing 116. The housing 116 has at least one access window 118. The spectrometer arrangement 110 further comprises at least one wavelength selective element 120 disposed within the housing 116, configured to separate the incident light 123 into spectra of constituent wavelengths. The spectrometer arrangement 110 further comprises at least one detector arrangement 122 disposed within the housing 116, the detector arrangement 122 being configured to detect at least a portion of the constituent wavelengths. The spectrometer arrangement 110 may further comprise at least one evaluation device 124, e.g. an evaluation device 124 with at least one processor, wherein the evaluation device 124 may e.g. be configured to evaluate the detector signals of the at least one detector arrangement 122.

The spectrometer device 110 also includes at least one contact sensor device 126 configured to detect contact of the spectrometer device 110 with the sample 112. As an example, the contact sensor device 126 may be configured to detect contact between the entrance window 118 and the sample 112. Thus, as an example, the contact sensor device 126 may be or may include an optical contact sensor device 128. By way of example, the optical contact sensor device 128 may include at least one optical emitter device 130, and by way of example, the optical emitter device 130 may be located at an edge 132 of the entrance window 118. The entrance window 118 may be made completely or partially of an optically transparent material with wave guiding properties. Thus, the optical contact sensor device 128 may further comprise at least one optical detector device 134, e.g. the optical detector device 134 being located at an opposite edge 136 of the entrance window 118. The optical emitter device 130 may emit light into the entrance window 118. In the entrance window 118, the light is guided due to the waveguiding properties of the entrance window 118 to the opposite edge 136 and the optical detector device 134. However, the waveguide properties of the entrance window 118 will change when in contact with the sample 112. Thus, once contact with the sample 112 is established, the signal transmitted from the optical emitter device 130 to the optical detector device 134 changes. This change in signal can be used to detect contact between the spectrometer device 110 and the sample 112. For example, the optical contact sensor device 128 may be controlled by the evaluation device 124 and/or by a separate control or evaluation device.

The spectrometer arrangement 110 may specifically be operated in a reflection mode. To this end, the spectrometer arrangement 110 may include one or more illumination sources 138. As an example, the at least one illumination source 138 may be located entirely or partially inside the housing 116 and/or outside the housing 116.

In the arrangement of fig. 1, an optical contact sensor device 128 is shown, as an example. Still other types of touch sensor devices 126 may be used. Thus, as described above, electrical and/or mechanical contact sensor arrangements may additionally or alternatively be used. For example, vibration or motion changes using an inertial measurement unit may be used. For example, once contact between spectrometer device 110 and sample 112 is established, vibration and/or motion is reduced. This measurement principle can be used even if the spectrometer arrangement 110 is a hand-held spectrometer arrangement 110. Additionally or alternatively, as an example, electrical measurement principles may be used for the contact sensor device 126. Thus, as an example, a WiFi and/or bluetooth module may be implemented. Wherein signal attenuation due to contact with the sample 112 can be detected, especially if the module is in the vicinity of the sample 112. These exemplary embodiments show that, in addition to the use of the optical contact sensor device 128, other measurement principles are possible.

Even one or more of these detection means may be combined, as each measurement principle typically gives an indication about contact with the sample 112. Thus, as an example, a signal may be provided to the evaluation device 128. Where the signals may be combined in a mathematical model, which is monitored by a kalman filter, as an example.

List of reference numerals

110 spectrometer device

112 sample

114 front end

116 outer casing

118 entrance window

120 wavelength selective element

122 detector device

123 light

124 evaluation device

126 contact sensor device

128 optical contact sensor device

130 optical emitter device

132 edge

134 optical detector device

136 opposite edge

138 source of radiation

Reference to

US 2014/131578 A1

"Handhelded spectrometers in 2018and later: MOEMS, photonics, and smartphones" published by Richard A.Crombe (2018 and later: MOEMS, photoelectricity, and smartphones, Proc.SPIE 10545, MOEMS and miniaturisation systems XVII, 105450C (2018, 2, 22 days old); doi: 10.1117/12.2286492