Device, system and fault detection instrument for searching for poor contact fault
阅读说明：本技术 一种查找接触不良故障的装置、系统和故障检测仪表 (Device, system and fault detection instrument for searching for poor contact fault ) 是由 陈杰 于 2021-06-29 设计创作，主要内容包括：本发明公开了一种查找接触不良故障的装置、系统和故障检测仪表,该装置包括：数据采集单元、微控制器和LED指示灯单元；所述数据采集单元的数据采集端与所述待测设备连接；所述数据采集单元的数据输出端与所述微控制器的第一接口连接；所述微控制器的第二接口与所述LED指示灯单元连接；所述数据采集单元用于采集待测设备的故障数据；所述微控制器用于通过所述故障数据进行分析,当分析出故障则自锁,并向所述LED指示灯单元发送对应的亮灯信息；所述LED指示灯单元根据所述亮灯信息点亮对应的LED指示灯,通过本方案可以一次性找到故障点,识别结果准确可靠,适用各种大型系统或设备的故障检测。(The invention discloses a device, a system and a fault detection instrument for searching for a fault with poor contact, wherein the device comprises: the system comprises a data acquisition unit, a microcontroller and an LED indicator lamp unit; the data acquisition end of the data acquisition unit is connected with the equipment to be tested; the data output end of the data acquisition unit is connected with a first interface of the microcontroller; the second interface of the microcontroller is connected with the LED indicator lamp unit; the data acquisition unit is used for acquiring fault data of the equipment to be tested; the microcontroller is used for analyzing through the fault data, self-locking when the fault is analyzed, and sending corresponding lighting information to the LED indicator light unit; the LED indicating lamp unit lights the corresponding LED indicating lamp according to the lighting information, the fault point can be found at one time through the scheme, the identification result is accurate and reliable, and the method is suitable for fault detection of various large systems or equipment.)
1. An apparatus for locating a bad contact fault, comprising: the system comprises a data acquisition unit, a microcontroller and an LED indicator lamp unit;
the data acquisition end of the data acquisition unit is connected with the equipment to be tested; the data output end of the data acquisition unit is connected with a first interface of the microcontroller;
the second interface of the microcontroller is connected with the LED indicator lamp unit;
the data acquisition unit is used for acquiring fault data of the equipment to be tested;
the microcontroller is used for analyzing through the fault data, self-locking when the fault is analyzed, and sending corresponding lighting information to the LED indicator light unit;
and the LED indicator light unit lights the corresponding LED indicator light according to the lighting information.
2. The apparatus for searching for the poor contact fault according to claim 1, wherein the data acquisition unit comprises: a voltage transformer and an operational amplifier;
the data acquisition end of the voltage transformer is connected with the equipment to be tested; the output end of the voltage transformer is connected with the input end of the operational amplifier;
the output end of the operational amplifier is connected with a first interface of the microcontroller.
3. The apparatus for searching for the poor contact fault according to claim 1, further comprising: and the sensitivity adjusting module is connected with a third interface of the microcontroller.
4. The apparatus for searching for the poor contact fault according to claim 3, wherein the sensitivity adjusting module comprises: the voltage divider comprises a voltage divider resistor network, a first switch and a second switch;
the voltage division resistor network is connected with a third interface of the microcontroller and is used for setting a fault trigger threshold value by adjusting the adjustable resistor;
the first switch is respectively connected with the voltage-dividing resistor network and the second switch;
the second switch is connected with the divider resistor network.
5. The apparatus for searching for the poor contact fault according to claim 1, further comprising: the device comprises a key, a first resistor and a first capacitor;
one end of the key is sequentially connected with the first resistor, the first capacitor and the ground wire; the other end of the key is connected with a power supply;
a third interface of the microcontroller is connected between the first resistor and the first capacitor.
6. The apparatus for searching for the poor contact fault according to claim 1, further comprising: an LCD display screen;
the LCD display screen is connected with the microcontroller;
the microcontroller is used for sending the acquired sensitivity information to the LCD display screen;
the LCD display screen is used for displaying the sensitivity information.
7. The apparatus for searching for the poor contact fault according to claim 1, further comprising: a dial switch;
the microcontroller is sequentially connected with the dial switch and the ground wire;
the dial switch is used for checking whether the LED indicator light unit is in a normal state or not according to the state of the dial switch.
8. The apparatus for searching for the poor contact fault according to claim 1, further comprising: and each path of data acquisition unit independently acquires data.
9. A fault detection instrument, comprising: an apparatus for searching for a bad contact fault as claimed in any one of claims 1 to 8.
10. A system for locating a bad contact fault, comprising: the fault equipment that awaits measuring, its characterized in that includes: an apparatus for locating a bad contact fault according to any one of claims 1 to 8, said apparatus being adapted to locate a bad contact fault of said faulty device under test.
Technical Field
The invention relates to the field of detection of bad contact fault points, in particular to a device and a system for searching bad contact faults and a fault detection instrument.
Background
The stopping of high-pressure and high-temperature equipment such as a boiler and the like needs to be gradually stopped in certain steps and time, and sudden stopping of the operation can bring about great potential safety hazards and economic loss. The instrument for searching the poor contact is connected in the circuit, and when the transient instantaneous poor contact fault occurs again, the fault point can be accurately judged. The method avoids the problems that the elimination method is time-consuming and labor-consuming, and can cause the fault outage of equipment for an uncertain number of times, and potential safety hazards and economic losses caused by the fault outage.
The method for searching suspected bad contact fault points comprises the steps of measuring the resistance value of suspected points by using an instrument, judging the fault points by the resistance value which is much larger than a normal value, and being simple and quick. However, some instruments with poor contact have a resistance value which is not much different from a normal value when in measurement, but the instruments can work unstably and have poor contact instantaneously at a certain moment when in operation, and the fault point can not be found by using the measurement method.
Disclosure of Invention
The invention aims to solve the technical problem of the prior art and provides a device, a system and a fault detection instrument for searching for a fault with poor contact.
The technical scheme for solving the technical problems is as follows:
an apparatus for locating a bad contact fault, comprising: the system comprises a data acquisition unit, a microcontroller and an LED indicator lamp unit;
the data acquisition end of the data acquisition unit is connected with the equipment to be tested; the data output end of the data acquisition unit is connected with a first interface of the microcontroller;
the second interface of the microcontroller is connected with the LED indicator lamp unit;
the data acquisition unit is used for acquiring fault data of the equipment to be tested;
the microcontroller is used for analyzing through the fault data, self-locking when the fault is analyzed, and sending corresponding lighting information to the LED indicator light unit;
and the LED indicator light unit lights the corresponding LED indicator light according to the lighting information.
The invention has the beneficial effects that: the method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
Further, the data acquisition unit includes: a voltage transformer and an operational amplifier;
the data acquisition end of the voltage transformer is connected with the equipment to be tested; the output end of the voltage transformer is connected with the input end of the operational amplifier;
the output end of the operational amplifier is connected with a first interface of the microcontroller.
The beneficial effect of adopting the further scheme is that: according to the scheme, the input signal is coupled through the mutual inductor and then is processed and converted through the operational amplifier, and sampling of the single chip microcomputer ADC is facilitated.
Further, still include: and the sensitivity adjusting module is connected with a third interface of the microcontroller.
Further, the sensitivity adjustment module includes: the voltage divider comprises a voltage divider resistor network, a first switch and a second switch;
the voltage division resistor network is connected with a third interface of the microcontroller and is used for setting a fault trigger threshold value by adjusting the adjustable resistor;
the first switch is respectively connected with the voltage-dividing resistor network and the second switch;
the second switch is connected with the divider resistor network.
The beneficial effect of adopting the further scheme is that: this scheme determines what kind of degree contact failure can trigger the instrument warning through adjusting the rheostat in the divider resistance network, prevents that extremely little contact failure has not reported to the police just for reporting to the police or very serious contact failure time, owing to take place contact failure components and parts, for example: the relay contact, the wiring terminal, the wire and the like are diversified, different trigger thresholds can be adjusted through the adjustable divider resistor network, and various components and parts with poor contact can be detected.
Further, still include: the device comprises a key, a first resistor and a first capacitor;
one end of the key is sequentially connected with the first resistor, the first capacitor and the ground wire; the other end of the key is connected with a power supply;
a third interface of the microcontroller is connected between the first resistor and the first capacitor.
The beneficial effect of adopting the further scheme is that: the scheme realizes that the original alarm output state is recovered to the normal initial state.
Further, still include: an LCD display screen;
the LCD display screen is connected with the microcontroller;
the microcontroller is used for sending the acquired sensitivity information to the LCD display screen;
the LCD display screen is used for displaying the sensitivity information.
The beneficial effect of adopting the further scheme is that: the scheme can realize the display of the sensitivity value and the port for the multimeter to measure the sensitivity value.
Further, still include: a dial switch;
the microcontroller is sequentially connected with the dial switch and the ground wire;
the dial switch is used for checking whether the LED indicator light unit is in a normal state or not according to the state of the dial switch.
The beneficial effect of adopting the further scheme is that: the scheme realizes that whether the input and output lamps are in the normal illuminable state or not is checked.
Further, still include: and each path of data acquisition unit independently acquires data.
The beneficial effect of adopting the further scheme is that: this scheme can realize detecting a plurality of components and parts that take place contact failure simultaneously.
Another technical solution of the present invention for solving the above technical problems is as follows:
a fault detection instrument comprising: the device for searching the poor contact fault in any scheme.
The invention has the beneficial effects that: the method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
Another technical solution of the present invention for solving the above technical problems is as follows:
a system for locating a bad contact fault, comprising: a device under test for failure comprising: the device for searching the poor contact fault is used for searching the poor contact fault of the to-be-detected fault equipment.
The invention has the beneficial effects that: the method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
Advantages of additional aspects of the invention will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
Drawings
Fig. 1 is a block diagram of an apparatus for searching for a bad contact fault according to an embodiment of the present invention;
FIG. 2 is a schematic circuit diagram of a data acquisition unit according to another embodiment of the present invention;
fig. 3 is a circuit schematic diagram of an LED indicator light unit according to another embodiment of the present invention;
FIG. 4 is a schematic circuit diagram of a microcontroller according to another embodiment of the present invention;
FIG. 5 is a schematic circuit diagram of a sensitivity adjustment module according to another embodiment of the present invention;
FIG. 6 is a schematic diagram of a key reset circuit according to another embodiment of the present invention;
FIG. 7 is a schematic diagram of an LCD display circuit according to another embodiment of the present invention;
FIG. 8 is a schematic circuit diagram of a multi-channel data acquisition unit according to another embodiment of the present invention;
fig. 9 is a schematic diagram of an operational amplifier power supply circuit according to another embodiment of the present invention;
FIG. 10 is a schematic diagram of another power circuit according to another embodiment of the present invention;
FIG. 11 is a schematic view of a PCB of an apparatus for locating a bad contact fault according to other embodiments of the present invention;
fig. 12 is a schematic diagram of a dial switch circuit according to another embodiment of the present invention.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth to illustrate, but are not to be construed to limit the scope of the invention.
As shown in fig. 1, an apparatus for searching for a bad contact fault according to an embodiment of the present invention includes: a data acquisition unit 110, a microcontroller 120 and an LED indicator light unit 130;
the data acquisition end of the data acquisition unit 110 is connected with the equipment to be tested; the data output end of the data acquisition unit 110 is connected with the first interface of the microcontroller 120;
a second interface of the microcontroller 120 is connected with the LED indicator light unit 130;
the data acquisition unit 110 is configured to acquire fault data of the device under test;
the microcontroller 120 is configured to analyze the fault data, perform self-locking when the fault is analyzed, and send corresponding lighting information to the LED indicator unit 130;
the LED lamp unit 130 lights the corresponding LED lamp according to the lighting information.
In one embodiment, two leads are respectively led from two ends of each detected element to be connected into each channel of a device for searching for the bad contact fault to transmit the working voltage in real time, the detection instrument divides the voltage for one time through two resistors after collecting the voltage and performs voltage limiting protection by using a diode to obtain the detection voltage, the detection voltage outputs a switching signal after passing through an overvoltage comparator (the comparison voltage is adjustable), the switching signal enters a single chip microcomputer after being isolated by an optical coupler, and the single chip microcomputer analyzes the state of each switching signal to determine whether the bad contact fault occurs in each path. If a fault occurs, the single chip microcomputer lights the output indicator lamp corresponding to the fault channel at the first time and keeps locking all the input channels at the same time to stop receiving new input signals, namely receiving other poor contact point position signals of the input end.
In one embodiment, as shown in fig. 2, the circuit of the data acquisition unit 110 may be configured such that an input signal is input from J1, coupled through a transformer T1, converted into AC-1.5 to +1.5 voltage AC signals, converted into DC0 to 2.5V signals through processing of an operational amplifier U9A, and sampled by a UA1 to the single chip ADC.
In one embodiment, the circuit of the LED indicator light unit 130 may be as shown in fig. 3, and the second interface of the microcontroller 120 is connected to the LED indicator light unit 130; the second interface of the microcontroller 120 may be the 39, 40, 41 or 42 pins of the microcontroller 120 as shown in fig. 4. One pin can be connected with one LED, and the microcontroller 120 can control multiple LED indicator lights through pins 39, 40, 41 or 42.
In one embodiment, the circuit of the microcontroller 120 may be as shown in fig. 4, the model of the microcontroller 120 may be stm32f303R, or may be an ARM M4 core, and the inside of the microcontroller has 4 MCUs with resource requirements such as 12BIT and 4.5MHZ ADC.
The method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
Preferably, in any of the above embodiments, the data acquisition unit 110 comprises: a voltage transformer and an operational amplifier;
the data acquisition end of the voltage transformer is connected with the equipment to be tested; the output end of the voltage transformer is connected with the input end of the operational amplifier;
the output of the operational amplifier is connected to a first interface of the microcontroller 120. The first interface of the microcontroller 120 may be a PA4 pin, a PA5 pin, a PA6 pin, or a PA7 pin of stm32f303R shown in fig. 4, where each pin is connected to one of the data acquisition units.
In one embodiment, as shown in fig. 2, the circuit of the data acquisition unit 110 may be configured such that an input signal is coupled through a transformer, converted into an AC-1.5 to +1.5 voltage alternating current signal, and converted into a DC0 to 2.5V signal through processing of an operational amplifier, so as to facilitate sampling by the single chip ADC.
According to the scheme, the input signal is coupled through the mutual inductor and then is processed and converted through the operational amplifier, and sampling of the single chip microcomputer ADC is facilitated.
Preferably, in any of the above embodiments, further comprising: and the sensitivity adjusting module is connected with the third interface of the microcontroller 120.
The rheostat in the comparison circuit is adjusted to determine the degree of poor contact, so that the instrument alarm can be triggered. The main functions can be as follows: 1, to prevent an alarm in case of an extremely small contact failure or an alarm in case of a very serious contact failure. 2, due to the occurrence of defective contact components, for example: various components such as relay contact, binding post or wire, for example: the length of the conducting wire is different, and the voltages at the two ends are different when the conducting wire works normally. The working principle of the device is that whether the detected element has a transient poor contact fault or not is judged by measuring the voltage at two ends of the detected element and comparing the voltage with a set value (namely the voltage during normal operation). It is necessary to adjust the set value, i.e., the trigger threshold, according to the voltage across each detected element when it is operating normally.
Preferably, in any of the above embodiments, the sensitivity adjustment module comprises: the voltage divider comprises a voltage divider resistor network, a first switch and a second switch;
the divider resistor network is connected to the third interface of the microcontroller 120, and is configured to set the fault trigger threshold by adjusting the adjustable resistor; the third interface of the microcontroller 120 may be a PA interface of the MCU, and specifically may be PA0-PA3 pins.
The first switch is respectively connected with the divider resistance network and the second switch; wherein the first switch may be P2 as shown in fig. 5.
The second switch is connected with the divider resistor network. The second switch may be N1 as shown in fig. 5, and is connected to pin 59 of the microcontroller 120.
In one embodiment, as shown in fig. 5, the circuit of the sensitivity adjustment module may use 4 voltage dividing resistor networks to adjust the adjustable resistors, the divided voltages of the AD1 to AA1 may change, and the ADC converts the voltage to a threshold voltage after sampling. The purpose of using the power switching circuits P2, N1 is: when the threshold voltage is adjusted, the SW is at a high level, and the resistance network supplies power. When the threshold voltage is not adjusted, the resistor network is powered off. The inaccuracy of threshold voltage caused by temperature drift due to long-time power supply of the resistor network when the temperature rises is avoided.
This scheme determines what kind of degree contact failure can trigger the instrument warning through adjusting the rheostat in the divider resistance network, prevents that extremely little contact failure has not reported to the police just for reporting to the police or very serious contact failure time, owing to take place contact failure components and parts, for example: the relay contact, the wiring terminal, the wire and the like are diversified, different trigger thresholds can be adjusted through the adjustable divider resistor network, and various components and parts with poor contact can be detected.
Preferably, in any of the above embodiments, further comprising: the device comprises a key, a first resistor and a first capacitor;
one end of the key is sequentially connected with the first resistor, the first capacitor and the ground wire; the other end of the key is connected with a power supply;
the third interface of the microcontroller 120 is connected between the first resistor and the first capacitor.
In one embodiment, the key reset circuit is shown in fig. 6, the first resistor may be R14, the first capacitor may be C17, and the key may be S2; in one embodiment, the keying circuit can be multi-path, and single-path or multi-path keying circuits are selected according to the actual reset function requirement.
The scheme realizes that the original alarm output state is recovered to the normal initial state.
Preferably, in any of the above embodiments, further comprising: an LCD display screen;
the LCD display screen is connected with the microcontroller 120;
the microcontroller 120 is used for sending the acquired sensitivity information to the LCD display screen;
the LCD display screen is used to display sensitivity information. In one embodiment, the connection circuit of the LCD to the microcontroller 120 is shown in FIG. 7.
The scheme can realize the display of the sensitivity value and the port for the multimeter to measure the sensitivity value.
Preferably, in any of the above embodiments, further comprising: a dial switch;
the microcontroller 120 is connected with the dial switch and the ground wire in sequence;
the dial switch is used to check whether the LED indicator lamp unit 130 is in a normal state through the dial switch state. In one embodiment, the dip switch circuit is shown in FIG. 12.
The scheme realizes that whether the input and output lamps are in the normal illuminable state or not is checked.
Preferably, in any of the above embodiments, further comprising: and each data acquisition unit independently acquires data.
In one embodiment, the multi-channel data acquisition unit circuit is shown in fig. 8, and the multi-channel data acquisition unit circuit may include 4 channels as shown in the figure, and may be increased or decreased according to the actual acquisition requirement.
This scheme can realize detecting a plurality of components and parts that take place contact failure simultaneously.
In one embodiment, the method further comprises: as shown in FIG. 9, in the operational amplifier power supply circuit, U12 provides a reference voltage of 1.25V for TL432, and a negative voltage of-5V is generated for ICL7660 to supply power to the operational amplifier, U14 provides a reference voltage of 1.25V for TL432, and a reference voltage of 0.625 is generated by dividing voltage of R65 and R70, so that the voltage range of an alternating current signal is 0-2.5, and ADC sampling is facilitated.
The power supply circuit can also comprise other power supply circuits, as shown in fig. 10, a switch voltage reduction chip MC34063 is adopted to convert the input DC 12-24V voltage into +5V voltage, and the +5V is used for supplying power to the negative voltage generating circuit and the operational amplifier circuit. The MCU was powered using ASM1117S3.3 LDO to reduce the 5V voltage to 3.3.
In one embodiment, as shown in fig. 11, a PCB diagram of a poor contact fault device is searched, and parameters and models of various components of the device can be shown in table 1:
TABLE 1
In one embodiment, a fault detection instrument includes: the device for searching for the poor contact fault in any embodiment.
The method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
A system for locating a bad contact fault, comprising: a device under test for failure comprising: the device for searching for the poor contact fault in any embodiment is used for searching for the poor contact fault of the equipment to be tested.
The method can find the fault point at one time, has accurate and reliable identification result, and is suitable for fault detection of various large systems or equipment. The method can also be used for detecting that the difference between the resistance value and the normal value is not much when some instruments are in poor contact, but the instruments can work unstably and instantaneously in poor contact at a certain operating moment, the fault point can not be found by the existing measuring method, and the components with poor contact can be accurately detected by the scheme.
For example, the operation of high-pressure and high-temperature equipment such as chemical systems and boilers needs to be stopped step by step in a certain step and time, and sudden stop of operation brings about great potential safety hazard and economic loss. When the device is connected in a circuit, a fault point can be accurately judged once when a transient instantaneous poor contact fault occurs, and the safe and normal production is ensured.
It is understood that some or all of the alternative embodiments described above may be included in some embodiments.
It should be noted that the above embodiments are product embodiments corresponding to the previous method embodiments, and for the description of each optional implementation in the product embodiments, reference may be made to corresponding descriptions in the above method embodiments, and details are not described here again.
The reader should understand that in the description of this specification, reference to the description of the terms "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., means that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described method embodiments are merely illustrative, and for example, the division of steps into only one logical functional division may be implemented in practice in another way, for example, multiple steps may be combined or integrated into another step, or some features may be omitted, or not implemented.
The above method, if implemented in the form of software functional units and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention essentially or partially contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product stored in a storage medium and including instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a removable hard disk, a Read-only memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
While the invention has been described with reference to specific embodiments, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.