阅读说明：本技术 共焦传感器 (Confocal sensor ) 是由 森野久康 高嶋润 于 2019-11-21 设计创作，主要内容包括：本发明提供一种测定范围更大的共焦传感器。共焦传感器1包括：光源10,射出多个波长的光；衍射透镜130,相对于光沿光轴方向产生色像差,不经由其他透镜使光聚集于对象物200；针孔120,使光之中、在对象物200上聚焦而反射且经衍射透镜130聚集的反射光通过；测定部40,基于反射光的波长,测定自衍射透镜130至对象物200为止的距离；并且,自针孔120至衍射透镜130为止的距离L2为可变。(The invention provides a confocal sensor with a wider measuring range. The confocal sensor 1 includes: a light source 10 that emits light of a plurality of wavelengths; a diffraction lens 130 that generates chromatic aberration in the optical axis direction with respect to light and focuses the light on the object 200 without passing through another lens; a pinhole 120 through which reflected light that is focused and reflected on the object 200 and condensed by the diffraction lens 130, among the light, passes; a measurement unit 40 that measures the distance from the diffraction lens 130 to the object 200 based on the wavelength of the reflected light; the distance L2 between the pinhole 120 and the diffraction lens 130 is variable.)

1. A confocal sensor, comprising:

a light source that emits light of a plurality of wavelengths;

a diffractive lens that generates chromatic aberration in an optical axis direction with respect to the light and focuses the light on an object without passing through another lens;

a pinhole that passes through reflected light that is focused and reflected on the object and is condensed by the diffraction lens, among the light; and

a measurement unit that measures a distance from the diffraction lens to the object based on a wavelength of the reflected light; and is

The distance from the pinhole to the diffraction lens is variable.

2. The confocal sensor of claim 1, wherein further comprising:

and a mechanism for continuously changing a distance from the pinhole to the diffraction lens.

3. The confocal sensor of claim 1, wherein

The plurality of holders for accommodating the diffraction lenses at different positions can be replaced with each other.

4. The confocal sensor of any one of claims 1 to 3, wherein

The measurement unit measures the distance from the diffraction lens to the object in accordance with a nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens to the object.

5. The confocal sensor of claim 4, wherein

When the wavelength of the reflected light is represented by λ, the distance from the diffraction lens to the object is represented by L₁The distance from the pinhole to the diffraction lens is represented as L₂Will be related to the reference wavelength λ₀Of the diffractive lensDistance is expressed as f₀The nonlinear relationship may be expressed as:

[ numerical formula 1]

6. The confocal sensor of claim 4 or 5, wherein

The measurement unit measures the distance from the diffraction lens to the object in accordance with the nonlinear relationship estimated based on the wavelength of the reflected light and an actual measurement value of the distance from the diffraction lens to the object.

7. The confocal sensor of any one of claims 1 to 6, wherein

The measurement unit determines whether or not the object is within a predetermined range based on the wavelength.

8. The confocal sensor of any one of claims 1-7, wherein further comprising:

an input unit that receives an input of a desired wavelength resolution; and

and an output unit that outputs a range of a distance from the diffraction lens to the object and a range of a distance from the pinhole to the diffraction lens, which satisfy the wavelength resolution.

Technical Field

The present disclosure relates to a confocal sensor.

Background

Conventionally, a confocal sensor is used that generates chromatic aberration along an optical axis with respect to light emitted from a light source by a confocal optical system, and measures a distance to an object based on a principle that a wavelength of the collected light changes according to the distance to the object.

Patent document 1 discloses an apparatus including: a unit for generating a polychromatic light beam; and at least one lens for focusing the light of each wavelength to each focal point.

Patent document 2 discloses a confocal height measuring apparatus including a confocal microscope for forming an image of illumination light from a light source on a sample from a disc having a predetermined pattern portion through an objective lens and for obtaining an observation image of the sample by causing the light from the sample to enter an imaging unit again from the objective lens through the disc, wherein the confocal height measuring apparatus corrects height information obtained by the confocal microscope using position correction data in an optical axis direction generated by at least one of an inclination of the disc with respect to an optical axis of the objective lens, an inclination of a stage on which the sample is placed, and a curvature of an image plane of the objective lens.

Documents of the prior art

Patent document

Patent document 1: specification of U.S. Pat. No. 4585349

Patent document 2: japanese patent laid-open No. 2004-286608

Disclosure of Invention

Problems to be solved by the invention

By using a conventional confocal sensor, the distance to the object can be measured with a resolution of several nanometers (nm). However, the measurement range of the conventional confocal sensor is limited to a range of several millimeters in front of and behind a point of several tens of millimeters (mm) from the front surface of the sensor head (sensor head).

Therefore, the invention provides a confocal sensor with a wider measuring range.

Means for solving the problems

The confocal sensor of an aspect of the present disclosure includes: a light source that emits light of a plurality of wavelengths; a diffractive lens that generates chromatic aberration in an optical axis direction with respect to light and focuses the light on an object without passing through another lens; a pinhole (pin hole) through which reflected light, which is focused and reflected on an object and condensed by a diffraction lens, among the light passes; a measurement unit that measures the distance from the diffraction lens to the object based on the wavelength of the reflected light; and the distance from the pinhole to the diffraction lens is variable.

According to the above-described aspect, the distance from the pinhole to the diffraction lens is variable, and the range in which the measurement can be performed is variable, so that the distance to the object can be measured in a wider range.

In the above aspect, the optical element may further include a mechanism for continuously changing a distance from the pinhole to the diffraction lens.

According to this embodiment, the measurement range can be continuously changed by continuously changing the distance from the pinhole to the diffraction lens.

In the above-described embodiment, the plurality of holders for accommodating the diffraction lenses at different positions may be replaced with each other.

According to the scheme, by replacing various holders, the assay range can be changed in stages.

In the above-described aspect, the measurement unit may measure the distance from the diffraction lens to the object in accordance with a nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens to the object.

According to the above aspect, the nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens to the object is used, whereby the measurement range can be made larger than that in the case of using the linear relationship.

In the scheme, when the wavelength of the reflected light is expressed as lambda, the reflected light can be self-reflectedThe distance from the diffraction lens to the object is represented as L₁The distance from the pinhole to the diffraction lens is represented as L₂Will be related to the reference wavelength λ₀Is denoted by f₀The nonlinear relationship can also be expressed as:

[ numerical formula 1]

According to the above-described aspect, by changing the distance from the pinhole to the diffraction lens, the nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens to the object can be changed, and the measurement range can be further expanded.

In the above aspect, the measurement unit may measure the distance from the diffraction lens to the object in accordance with a nonlinear relationship estimated based on the wavelength of the reflected light and an actual measurement value of the distance from the diffraction lens to the object.

According to the above aspect, the nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens to the object can be corrected based on the measured value, and the distance from the diffraction lens to the object can be measured more accurately.

In the above-described aspect, the measurement unit may determine whether or not the object is within a predetermined range based on the wavelength.

According to the above arrangement, it is possible to determine whether or not the position of the object is appropriate.

In the scheme, the method can further comprise the following steps: an input unit that receives an input of a desired wavelength resolution; and an output unit that outputs a range of a distance from the diffraction lens to the object and a range of a distance from the pinhole to the diffraction lens, which satisfy a wavelength resolution.

According to the above-described configuration, it is possible to realize the required wavelength resolution, and to grasp the range within which the diffraction lens can be moved, or to change the positional relationship between the object and the sensor head.

ADVANTAGEOUS EFFECTS OF INVENTION

According to the present invention, a confocal sensor having a wider measurement range can be provided.

Drawings

Fig. 1 is a diagram showing an outline of a confocal sensor according to an embodiment of the present invention.

Fig. 2 is a diagram showing a relationship between a distance from the diffraction lens to the object and a wavelength of the reflected light in the confocal sensor according to the present embodiment.

Fig. 3 is a flowchart showing the initial setting process of the confocal sensor according to the present embodiment.

Fig. 4 is a diagram showing an outline of determining whether or not an object is located within a predetermined range by the confocal sensor of the present embodiment.

Fig. 5 is a diagram showing the relationship between the distance from the diffraction lens to the object and the wavelength of the reflected light obtained by the confocal sensor of the present embodiment, and the determination result.

Fig. 6 is a flowchart showing the initial setting process of the confocal sensor according to the present embodiment.

Fig. 7 is a schematic view showing a case where the first holder is attached to the sensor head according to the modification of the present embodiment.

Fig. 8 is a schematic view showing a case where the second holder is attached to the sensor head according to the modification of the present embodiment.

Fig. 9 is a diagram showing the relationship between the wavelength resolution of the confocal sensor of the present embodiment and the distance from the diffraction lens to the object.

Fig. 10 is a flowchart showing a distance calculation process of the confocal sensor according to the present embodiment.

Detailed Description

Hereinafter, an embodiment (hereinafter referred to as "the present embodiment") according to one aspect of the present invention will be described with reference to the drawings. In the drawings, elements denoted by the same reference numerals have the same or similar configurations.

[ constitution examples ]

Fig. 1 is a diagram showing an outline of a confocal sensor 1 according to an embodiment of the present invention. The confocal sensor 1 of the present embodiment is a device for measuring the position of an object 200, and includes a light source 10, a first optical fiber 11, a second optical fiber 12, a third optical fiber 13, an optical coupler (optical coupler)20, a beam splitter 30, a measurement unit 40, and a sensor head 100.

The light source 10 emits light of a plurality of wavelengths. The light source 10 may be a member that emits white light, and outputs the light to the first optical fiber 11. The light source 10 may adjust the light amount of the white light based on the instruction of the measurement unit 40. The first optical fiber 11 may be any optical fiber, and may be, for example, a refractive index profile fiber having a core diameter of 50 μm. The first optical fiber 11 can be connected to a fiber having a smaller core diameter before being connected to the optical coupler 20.

The optical coupler 20 connects the first optical fiber 11, the second optical fiber 12, and the third optical fiber 13, and transmits light from the first optical fiber 11 to the second optical fiber 12, and transmits light from the second optical fiber 12 to the third optical fiber 13.

The sensor head 100 houses a diffraction lens 130, and the diffraction lens 130 is connected to the second optical fiber 12, generates chromatic aberration in the optical axis direction with respect to light, and focuses the light on the object 200 without passing through another lens. In this example, light 210 of a first wavelength having a relatively long focal length and light 220 of a second wavelength having a relatively short focal length are shown. In this example, the light 210 of the first wavelength is focused on the object 200, but the light 220 of the second wavelength is focused on the front side of the object 200.

The light reflected on the surface of the object 200 is collected by the diffraction lens 130 and returned to the pinhole 120 as the core of the second optical fiber 12. The pinhole 120 allows the reflected light, which is focused on the object 200 and reflected, and is condensed by the diffraction lens 130, among the light beams to pass therethrough. Of the reflected light, the light 210 of the first wavelength is focused by the pinhole 120 provided on the end surface of the second optical fiber 12, and therefore most of the light enters the second optical fiber 12, but the light of the other wavelengths is not focused by the pinhole 120 and most of the light does not enter the second optical fiber 12. The reflected light incident on the second optical fiber 12 is transmitted to the third optical fiber 13 via the optical coupler 20, and is input to the optical splitter 30. Further, the reflected light incident on the second optical fiber 12 is also transmitted to the first optical fiber 11 via the optical coupler 20, but is terminated at the light source 10.

The spectroscope 30 is connected to the third optical fiber 13, acquires reflected light reflected by the object 200 and collected by the sensor head 100 through the second optical fiber 12, the optical coupler 20, and the third optical fiber 13, and measures a spectrum (spectrum) of the reflected light. The spectroscope 30 includes: a first lens 31 for condensing the reflected light emitted from the third optical fiber 13; a diffraction grating (diffraction) 32 for splitting the reflected light; a second lens 33 for condensing the reflected light; a light receiving element 34 that receives the reflected light; and a readout circuit 35 for reading out the light reception signal generated by the light reception element 34. The reading circuit 35 reads the wavelength and the light amount of the received light based on the light receiving signal generated by the light receiving element 34.

The measurement unit 40 measures a distance L1 from the diffraction lens 130 to the object 200 based on the wavelength of the reflected light. In this example, the light 210 of the first wavelength is read as a peak (peak) by the reading circuit 35, and the measuring unit 40 calculates a position corresponding to the first wavelength.

In the confocal sensor 1 of the present embodiment, the distance L2 from the pinhole 120 to the diffraction lens 130 is variable. Since the distance L2 from the pinhole 120 to the diffraction lens 130 is fixed and chromatic aberration is linearly corrected by another lens, it is not assumed that the distance L2 is changed, and the measurement range of the confocal sensor 1 cannot be arbitrarily expanded or reduced. According to the confocal sensor 1 of the present embodiment, the distance L2 from the pinhole 120 to the diffraction lens 130 is variable, and the range that can be measured can be changed, so that the distance to the object 200 can be measured in a wider range.

The sense head 100 includes a mechanism for continuously varying the distance L2 from the pinhole 120 to the diffractive lens 130. Specifically, the sensor head 100 includes a variable mechanism 150 that continuously moves the diffraction lens 130 in a direction along the optical axis. The variable mechanism 150 may include means for reading the position of the diffraction lens 130, and may transmit the distance L2 from the pinhole 120 to the diffraction lens 130 or the distance L3 from the diffraction lens 130 to the entire surface of the sensor head 100 to the measurement unit 40. By continuously changing the distance L2 from the pinhole 120 to the diffraction lens 130 by the variable mechanism 150, the measurement range can be continuously changed.

Fig. 2 is a diagram showing a relationship between a distance L1 from the diffraction lens 130 to the object 200 and a wavelength of the reflected light in the confocal sensor 1 according to the present embodiment. In fig. 2, the vertical axis represents the distance L1 from the diffraction lens 130 to the object 200 in mm, and the horizontal axis represents the wavelength of the reflected light in nm. In fig. 2, a case where the distance L2 from the pinhole 120 to the diffraction lens 130 is 36mm is shown by a solid line, a case where L2 is 37mm is shown by a broken line, a case where L2 is 38mm is shown by a dashed line, a case where L2 is 39mm is shown by a two-dot chain line, a case where L2 is 40mm is shown by a dotted line, and a case where L2 is 41mm is shown by a long broken line.

According to fig. 2, it can be read that the longer the wavelength of the reflected light, the shorter the corresponding distance L1. It can be read that the shorter the wavelength of the reflected light is, the larger the change in the distance L1 when the wavelength of the reflected light is changed by one unit is. Further, it can be read that the shorter the distance L2 from the pinhole 120 to the diffraction lens 130, the larger the change in the distance L1 when the wavelength of the reflected light is changed by one unit.

The measurement unit 40 of the confocal sensor 1 according to the present embodiment can measure the distance from the diffraction lens 130 to the object 200 in accordance with the nonlinear relationship between the wavelength of the reflected light and the distance L1 from the diffraction lens 130 to the object 200. Previously, in confocal sensors, there were the following cases: the nonlinear relationship between the wavelength of the reflected light and the distance L1 from the diffraction lens 130 to the object 200 is corrected by the other lens to be a linear relationship. By the correction as described above, the resolution of the distance L1 can be made almost independent of the wavelength. However, when the correspondence between the wavelength of the reflected light and the distance L1 is linear, the measurement range is limited to a small range. The confocal sensor 1 of the present embodiment utilizes the nonlinear relationship between the wavelength of the reflected light and the distance L1, and thereby can enlarge the measurement range in the short wavelength region and enlarge the measurement range of the confocal sensor 1 as compared with the case of utilizing the linear relationship.

More specifically, the wavelength of the reflected light is represented by λ, the distance from the diffraction lens 130 to the object 200 is represented by L1, the distance from the pinhole 120 to the diffraction lens 130 is represented by L2, and the reference wavelength λ is represented by₀Is denoted by f₀In this case, the nonlinearity of the distance L1 from the diffraction lens 130 to the object 200 can be expressed by the following expression (2).

[ numerical formula 2]

As described above, by changing the distance from the pinhole 120 to the diffraction lens 130, the nonlinear relationship between the wavelength λ of the reflected light and the distance L1 from the diffraction lens 130 to the object 200 can be changed, and the measurement range can be further expanded.

Fig. 3 is a flowchart showing the initial setting process of the confocal sensor 1 according to the present embodiment. The processing shown in fig. 3 is performed before the distance is measured by the confocal sensor 1.

First, the position of the object 200 or the diffraction lens 130 is adjusted so that the confocal sensor 1 outputs a distance corresponding to the reference wavelength (or the set reference wavelength at the time of adjustment) (S10). Here, the reference wavelength and the focal length corresponding to the reference wavelength are defined in the design stage.

Thereafter, the object 200 is moved by a known amount while the diffraction lens 130 is held fixed (S11). The confocal sensor 1 stores the relationship between the wavelength and the distance of the reflected light detected at this time (S12). Here, the distance to the object 200 is calculated by adding (or subtracting) the distance to move the object 200 to the distance corresponding to the reference wavelength.

Then, it is determined whether or not the relationship between the wavelength and the distance of the reflected light detected by the confocal sensor 1 has been measured in the predetermined wavelength range (S13). For example, whether or not the measurement is completed may be determined by moving the object 200 by a predetermined plurality of known amounts.

When the measurement is not completed for the predetermined wavelength range (S13: NO), the following processing is repeated: the object 200 is moved by a known amount (S11), and the relationship between the wavelength and the distance of the detected reflected light is stored (S12). On the other hand, when aiming atWhen the measurement of the predetermined wavelength range is completed (YES in S13), a parameter for specifying the nonlinear relationship between the wavelength and the distance is determined (S14). That is, parameters (L2, λ) specifying the nonlinear relationship between the wavelength λ of the reflected light and the distance L1 from the diffraction lens 130 to the object 200, which are expressed by the numerical expression (2), are determined₀、f₀)。

The above-described process may be repeated while changing the distance L2 from the pinhole 120 to the diffraction lens 130. As described above, the process for initial setting ends.

By performing the above processing, the measurement unit 40 may measure the distance from the diffraction lens 130 to the object 200 in accordance with a nonlinear relationship estimated based on the wavelength of the reflected light and the actual measurement value of the distance from the diffraction lens 130 to the object 200. This makes it possible to correct the nonlinear relationship between the wavelength of the reflected light and the distance from the diffraction lens 130 to the object 200 based on the measured value, and to more accurately measure the distance from the diffraction lens 130 to the object 200.

Fig. 4 is a diagram showing an outline of determining whether or not the object 200 is located within a predetermined range by the confocal sensor 1 of the present embodiment. In fig. 4, the following is shown: whether or not the workpiece transferred by the conveyor (conveyor)300 is within a predetermined range is determined by the sensor head 100. In fig. 4, seven workpieces transferred by the conveyor 300 are illustrated. For the workpiece, numerals from 0 to 6 are sequentially given from the downstream of the conveyor 300. The "predetermined range" in this example is a range indicated as "OK" in fig. 4, and is a central belt of the conveyor 300. On the other hand, the range corresponding to the side belt of the conveyor 300 indicated as "No Good (NG)" in fig. 4 is out of the "predetermined range".

When determining whether or not the workpiece is within the predetermined range, the distance L2 from the pinhole 120 to the diffraction lens 130 of the confocal sensor 1 is adjusted so that at least the range indicated as "pass" is included in the measurement range. Then, after the initial setting described later, the measurement unit 40 of the confocal sensor 1 determines whether or not the object is within a predetermined range based on the wavelength of the reflected light.

Fig. 5 is a diagram showing the relationship between the distance L1 from the diffraction lens 130 to the object 200 and the wavelength of the reflected light obtained by the confocal sensor 1 of the present embodiment, and the determination result. In fig. 5, the vertical axis represents the distance L1 from the diffraction lens 130 to the object 200 in mm, and the horizontal axis represents the wavelength of the reflected light in nm.

In fig. 5, workpieces assigned with numerals from 0 to 6 are shown in the order from the downstream of the conveyor 300, from the measurement point p0 to the measurement point p 6. In fig. 5, a wavelength range corresponding to a range indicated as "pass" and a wavelength range corresponding to a range indicated as "fail" are shown.

From fig. 5, the workpieces corresponding to measurement point p0, measurement point p3, measurement point p4, and measurement point p6 are located within a predetermined range. On the other hand, the workpieces corresponding to measurement point p1, measurement point p2, and measurement point p5 are not within the predetermined range.

The measurement unit 40 can compare the measured wavelength with the upper limit and the lower limit of the wavelength range corresponding to the predetermined range, and determine whether the object is within the predetermined range. As described above, it is possible to determine whether or not the position of the object is appropriate.

Fig. 6 is a flowchart showing the initial setting process of the confocal sensor 1 according to the present embodiment. The processing shown in fig. 6 is performed before determining whether or not the object is within the predetermined range.

First, the distance L2 from the pinhole 120 to the diffraction lens 130 is adjusted so that the OK range becomes the measurement range, and the diffraction lens 130 is fixed (S20). The conveyor 300 is then activated to cause the sample workpiece to flow. The sample workpiece is placed in a range indicated as "pass" (pass range) or in a range indicated as "fail" (fail range) in fig. 4. The samples placed in the acceptable range are referred to as acceptable samples, and the samples placed in the unacceptable range are referred to as unacceptable samples.

The confocal sensor 1 stores the wavelength at which a good sample was measured (S21), and stores the wavelength at which a bad sample was measured (S22).

Then, it is determined whether or not the correspondence between the wavelength of the reflected light detected by the confocal sensor 1 and the pass or fail is complete for the predetermined wavelength range (S23). For example, whether the measurement is completed may be determined based on whether the measurement has been completed for a predetermined plurality of samples.

When the measurement is not completed for the predetermined wavelength range (S23: NO), the following processing is repeated: a step (S21) of storing the wavelength at which a non-defective sample is measured; and a process (S22) for storing the wavelength at which the defective sample is measured. On the other hand, when the measurement is completed for the predetermined wavelength range (S23: YES), a parameter for determining whether or not the object is within the acceptable range is determined based on the wavelength. As described above, the process for initial setting ends.

Fig. 7 is a schematic view showing a case where the first holder 160a is attached to the sensor head 100a according to the modification of the present embodiment. Fig. 8 is a schematic diagram showing a case where the second holder 160b is attached to the sensor head 100a according to the modification of the present embodiment. The sensor head 100a according to the modification may be replaced with a plurality of holders (the first holder 160a and the second holder 160b) that hold the diffraction lens 130 at different positions.

When the first holder 160a is attached to the sensor head 100a, the distance from the diffraction lens 130 to the object 200 is L1a, and the distance from the pinhole 120 to the diffraction lens 130 is L2 a. Here, the distance L2a from the pinhole 120 to the diffraction lens 130 is known as a design value of the first holder 160 a. The measurement unit 40 calculates the distance L1a from the diffraction lens 130 to the object 200, based on the numerical expression (2) when the distance from the pinhole 120 to the diffraction lens 130 is L2 a. In calculating the distance from the front surface of the sensor head 100a to the object 200, the distance L3a from the diffraction lens 130 to the front surface of the sensor head 100a may be subtracted from the distance L1a from the diffraction lens 130 to the object 200. Here, the distance L3a from the diffraction lens 130 to the front surface of the sensor head 100a is obtained by subtracting the distance L2a from the pinhole 120 to the diffraction lens 130 from the entire length L of the sensor head 100 a.

When the second holder 160b is attached to the sensor head 100a, the distance from the diffraction lens 130 to the object 200 is L1b, and the distance from the pinhole 120 to the diffraction lens 130 is L2 b. Here, the distance L2b from the pinhole 120 to the diffraction lens 130 is known as a design value of the first holder 160 a. The measurement unit 40 calculates the distance L1b from the diffraction lens 130 to the object 200, based on the numerical expression (2) when the distance from the pinhole 120 to the diffraction lens 130 is L2 b. In calculating the distance from the front surface of the sensor head 100a to the object 200, the distance L3b from the diffraction lens 130 to the front surface of the sensor head 100a may be subtracted from the distance L1b from the diffraction lens 130 to the object 200.

As described above, by replacing a plurality of holders, the assay range can be changed in stages. In this example, since L2a < L2b, the measurement range is larger when the first holder 160a is attached than when the second holder 160b is attached. On the other hand, in the case where the second holder 160b is mounted, the measurement accuracy is higher in the low wavelength region than in the case where the first holder 160a is mounted.

Fig. 9 is a diagram showing the relationship between the wavelength resolution of the confocal sensor 1 according to the present embodiment and the distance L1 from the diffraction lens 130 to the object 200. In fig. 9, the vertical axis shows the wavelength resolution in mm/nm, and the horizontal axis shows the distance L1 from the diffraction lens 130 to the object 200 in mm. In fig. 9, a case where the distance L2 from the pinhole 120 to the diffraction lens 130 is 36mm is shown by a solid line, a case where L2 is 37mm is shown by a broken line, a case where L2 is 38mm is shown by a dashed line, a case where L2 is 39mm is shown by a two-dot chain line, a case where L2 is 40mm is shown by a dotted line, and a case where L2 is 41mm is shown by a long-dashed line. The wavelength resolution means that the distance to the object 200 can be measured with higher accuracy as the resolution is better.

According to fig. 9, it can be read that the longer the distance L1 from the diffraction lens 130 to the object 200, the larger the value of the wavelength resolution (the lower the resolution). Further, it can be read that, when the distance L1 from the diffraction lens 130 to the object 200 is fixed, the longer the distance L2 from the pinhole 120 to the diffraction lens 130, the smaller the value of the wavelength resolution (the higher the resolution).

The confocal sensor 1 may further include: an input unit for receiving an input of a wavelength resolution required by a user; and an output unit that outputs a range of a distance L1 from the diffraction lens 130 to the object 200 and a distance L2 from the pinhole 120 to the diffraction lens 130, which satisfy the required wavelength resolution. The input portion may include, for example, a button, and the output portion may include, for example, a seven-segment display portion or a liquid crystal display device. The confocal sensor 1 can store the relationship shown in fig. 9 in the storage unit, and calculate the range of the distance L1 from the diffraction lens 130 to the object 200 and the distance L2 from the pinhole 120 to the diffraction lens 130 that satisfy the required wavelength resolution. This makes it possible to realize the required wavelength resolution, to grasp the range within which the diffraction lens 130 can be moved, and to change the positional relationship between the object 200 and the sensor head 100.

The confocal sensor 1 receives an input of a wavelength resolution required by a user and an input of a linearity required by the user, and outputs a range of a distance L1 from the diffraction lens 130 to the object 200 and a range of a distance L2 from the pinhole 120 to the diffraction lens 130, which satisfy the required wavelength resolution and the required linearity. The confocal sensor 1 can store the relationship shown in fig. 9 in the storage unit, and calculate the ranges of the distance L1 from the diffraction lens 130 to the object 200 and the distance L2 from the pinhole 120 to the diffraction lens 130, which satisfy the required wavelength resolution and the required linearity. This makes it possible to realize the required wavelength resolution and the required linearity, to grasp within which range the diffraction lens 130 can be moved, and to change the positional relationship between the object 200 and the sensor head 100.

The user refers to the output values of L1 and L2, adjusts the distance L1 from the diffraction lens 130 to the object 200 and the distance L2 from the pinhole 120 to the diffraction lens 130, and measures the distance to the object 200. Thus, for example, when the sensor head 100 is controlled so as to be gradually brought closer to the object 200, adjustment from rough adjustment to high accuracy can be performed.

Fig. 10 is a flowchart showing a distance calculation process of the confocal sensor 1 according to the present embodiment. First, the confocal sensor 1 receives an input of a wavelength resolution required by the user (S30). The confocal sensor 1 receives the linearity input requested by the user (S31).

Then, the confocal sensor 1 calculates a range of a distance L1 from the diffraction lens 130 to the object 200 and a distance L2 from the pinhole 120 to the diffraction lens 130, which satisfy the required wavelength resolution and the required linearity (S32). Finally, the confocal sensor 1 outputs the calculated range of the distance L1 from the diffraction lens 130 to the object 200 and the distance L2 from the pinhole 120 to the diffraction lens 130 (S33). As described above, the distance calculation processing ends.

The embodiments described above are intended to facilitate understanding of the present invention, and are not intended to limit the present invention. The members included in the embodiments and their arrangement, materials, conditions, shapes, dimensions, and the like are not limited to the examples, and may be appropriately changed. Further, the configurations shown in the different embodiments may be partially replaced or combined with each other.

[ additional notes 1]

A confocal sensor (1), comprising:

a light source (10) that emits light of a plurality of wavelengths;

a diffraction lens (130) that generates chromatic aberration in the optical axis direction with respect to the light and focuses the light on an object (200) without passing through another lens;

a pinhole (120) through which reflected light, which is focused and reflected on the object (200) and is condensed by the diffraction lens (130), among the light passes; and

a measurement unit (40) that measures the distance from the diffraction lens (130) to the object (200) on the basis of the wavelength of the reflected light; and is

The distance from the pinhole (120) to the diffraction lens (130) is variable.