阅读说明：本技术 感光性树脂组合物及玻璃基板的蚀刻方法 (Photosensitive resin composition and method for etching glass substrate ) 是由 植松照博 于 2020-02-25 设计创作，主要内容包括：本发明提供对用于玻璃基板的蚀刻的蚀刻剂具有足够的耐性且能够形成由有机溶剂类的剥离液可进行剥离的蚀刻掩模的感光树脂组合物、与包括使用该感光性树脂组合物形成蚀刻掩模的玻璃基板的蚀刻方法。在对玻璃基板进行蚀刻时的蚀刻掩模的形成中使用的感光性树脂组合物包含：具有酸解离性溶解抑制基团且因酸的作用使碱可溶性增大树脂成分(A)、通过放射线的照射而产生酸的产酸剂(B)、填料(C)与增塑剂(D),或者包含具有酚羟基的树脂成分(A1)、通过与酚羟基反应而赋予酸解离性溶解抑制基团的保护剂(A2)、产酸剂(B)、填料(C)与增塑剂(D)。(The invention provides a photosensitive resin composition which has enough resistance to an etchant for etching a glass substrate and can form an etching mask which can be stripped by a stripping liquid of an organic solvent, and an etching method of the glass substrate which uses the photosensitive resin composition to form the etching mask. The photosensitive resin composition used for forming an etching mask in etching a glass substrate comprises: the resin composition comprises a resin component (A) having an acid dissociable dissolution inhibiting group and having an alkali solubility increased by the action of an acid, an acid generator (B) generating an acid by irradiation with radiation, a filler (C), and a plasticizer (D), or comprises a resin component (A1) having a phenolic hydroxyl group, a protective agent (A2) having an acid dissociable dissolution inhibiting group imparted by reaction with the phenolic hydroxyl group, an acid generator (B), a filler (C), and a plasticizer (D).)

1. A photosensitive resin composition, comprising:

a resin component (A) having an acid dissociable dissolution inhibiting group and having an increased alkali solubility due to the action of an acid; an acid generator (B) which generates an acid by irradiation with radiation; a filler (C); a plasticizer (D) which is a mixture of a plasticizer,

or comprises:

a resin component (A1) having a phenolic hydroxyl group; a protective agent (A2) which imparts an acid dissociable, dissolution inhibiting group by reacting with the phenolic hydroxyl group; the acid generator (B); the filler (C); the plasticizer (D) is a plasticizer for a thermoplastic resin,

the resin component (A) is a novolak resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups are protected by the acid dissociable, dissolution inhibiting group,

the resin component (a1) is a novolac resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups can be protected by the acid dissociable, dissolution inhibiting group.

2. The photosensitive resin composition according to claim 1,

for forming an etching mask on a glass substrate.

3. The photosensitive resin composition according to claim 1 or 2,

in the case where the photosensitive resin composition comprises the resin component (a), the acid generator (B), the filler (C), and the plasticizer (D), the resin component (a) comprises a reactant of the novolac resin or polyhydroxystyrene resin and a compound represented by formula (I),

in the case where the photosensitive resin composition includes the resin component (a1), the protective agent (a2), the acid generator (B), the filler (C), and the plasticizer (D), the protective agent (a2) includes a compound represented by formula (I),

the formula (I) is represented by the following formula:

H₂C＝CH-O-A^a1-O-CH＝CH₂···(I)

in the formula (I), A^a1An alkylene group having 1 to 10 carbon atoms which may have a substituent or may have an ether bond in the main chain, or a group represented by the following formula (II),

-(A^a2)_na-A^a3-(A^a2)_na- ···(II)

in the formula (II), A^a2The number of carbon atoms which may have a substituent is 1 to 10The following alkylene group, A^a3Is cyclohexylene, na is 0 or 1.

4. The photosensitive resin composition according to claim 1 or 2,

the plasticizer (D) contains a polyvinyl alkyl ether.

5. The photosensitive resin composition according to any one of claims 1 to 4,

comprising a solvent (S) comprising a high boiling point solvent having a boiling point of 170 ℃ or higher at atmospheric pressure (S1).

6. A method for etching a glass substrate, comprising:

a coating film forming step of applying the photosensitive resin composition according to any one of claims 1 to 5 to at least one main surface of a glass substrate to form a coating film on the main surface of the glass substrate;

an exposure step of selectively exposing the coating film to light;

an etching mask forming step of forming an etching mask by developing the exposed coating film with a developer;

an etching step of performing etching processing on the glass substrate provided with the etching mask;

and a removing step of removing the etching mask.

7. The method for etching a glass substrate according to claim 6,

the etching is a hole forming process for forming a hole penetrating the glass substrate in a thickness direction.

8. The method for etching a glass substrate according to claim 6 or 7,

forming the etching mask on both main surfaces of the glass substrate,

the etching process is performed on both main surfaces of the glass substrate.

9. Use of the photosensitive resin composition according to any one of claims 1 to 5 for forming an etching mask on a glass substrate.

Technical Field

The present invention relates to a photosensitive resin composition for forming an etching mask on a glass substrate and an etching method for forming an etching mask on a glass substrate using the photosensitive resin composition.

Background

A glass substrate for a display including a glass substrate for a touch panel, a glass substrate for a sealing device, and the like are often subjected to processing such as cutting and hole forming. Conventionally, a physical method has been generally used as such a processing method for a glass substrate. However, in physical processing of a glass substrate, there are problems that cracks are likely to occur in the glass substrate during processing, or that a reduction in yield is caused by a reduction in strength of the glass substrate.

Therefore, in recent years, a chemical method has been proposed in which a glass substrate is etched using a resin pattern obtained by patterning a resist composition as a mask (see, for example, patent document 1). According to such a chemical method, since no physical load is applied during processing, cracks are less likely to occur in the glass substrate.

In such a method for etching a glass substrate, since the resist composition has high resistance to an etchant used for etching a glass substrate and is likely to form an etching mask or the like having excellent adhesion to the glass substrate, a negative photosensitive composition containing a radical polymerizable compound and an epoxy compound is cured by exposure as described in patent document 1, and a patterned etching mask is often formed.

Disclosure of Invention

Technical problem to be solved by the invention

In the glass substrate subjected to etching, a metal wiring is often provided, and a resin layer made of a resin such as polyimide is often provided.

In addition, as described in patent document 1, when a patterned etching mask is formed using a negative-type photosensitive composition, an alkaline stripping solution is generally used when the etching mask is stripped from a glass substrate. However, when an alkaline stripping solution is used, the glass substrate itself or metal wiring and resin materials attached to the glass substrate are easily damaged.

The present invention has been made in view of the above-mentioned problems, and an object of the present invention is to provide a photosensitive resin composition having sufficient resistance to an etchant for etching a glass substrate and capable of forming an etching mask that can be peeled off by an organic solvent-based peeling liquid, and an etching method for a glass substrate including an etching mask formed using the photosensitive resin composition.

Means for solving the technical problem

The present inventors have found that the above-mentioned problems can be solved by using the following photosensitive resin composition for forming an etching mask in etching a glass substrate, and have completed the present invention: the photosensitive resin composition comprises a resin component (A) having an acid dissociable dissolution inhibiting group and having an increased alkali solubility due to the action of an acid, an acid generator (B) which generates an acid upon irradiation with radiation, a filler (C) and a plasticizer (D), or

The resin composition comprises a resin component (A1) having a phenolic hydroxyl group, a protective agent (A2) which imparts an acid dissociable dissolution inhibiting group by reacting with the phenolic hydroxyl group, an acid generator (B), a filler (C), and a plasticizer (D). More specifically, the present invention provides the following aspects.

The photosensitive resin composition according to claim 1 of the present invention comprises:

a resin component (A) having an acid dissociable dissolution inhibiting group and having an increased alkali solubility due to the action of an acid; an acid generator (B) which generates an acid by irradiation with radiation; a filler (C); a plasticizer (D), or comprises:

a resin component (A1) having a phenolic hydroxyl group; a protective agent (A2) which imparts an acid dissociable, dissolution inhibiting group by reacting with a phenolic hydroxyl group; an acid generator (B); a filler (C); a plasticizer (D) which is a mixture of a plasticizer,

the resin component (A) is a novolak resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups are protected by an acid dissociable, dissolution inhibiting group,

the resin component (a1) is a novolac resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups can be protected by an acid dissociable, dissolution inhibiting group.

The photosensitive resin composition according to claim 1 of the present invention preferably comprises:

a resin component (A) having an acid dissociable dissolution inhibiting group and having an increased alkali solubility due to the action of an acid; an acid generator (B) which generates an acid by irradiation with radiation; a filler (C); a plasticizer (D), or comprises:

a resin component (A1) having a phenolic hydroxyl group; a protective agent (A2) which imparts an acid dissociable, dissolution inhibiting group by reacting with a phenolic hydroxyl group; an acid generator (B); a filler (C); a plasticizer (D) which is a mixture of a plasticizer,

the resin component (A) is a novolak resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups are protected by an acid dissociable, dissolution inhibiting group,

the resin component (A1) is a novolak resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups can be protected by an acid dissociable, dissolution inhibiting group,

the photosensitive resin composition is used for forming an etching mask on a glass substrate.

The method for etching a glass substrate according to claim 2 of the present invention comprises:

a coating film forming step of applying the photosensitive resin composition according to claim 1 to at least one main surface of a glass substrate to form a coating film on the main surface of the glass substrate;

an exposure step of exposing the coating film to light with position selectivity;

an etching mask forming step of forming an etching mask by developing the exposed coating film with a developing solution;

an etching step of performing etching processing on the glass substrate provided with the etching mask;

and a removing step of removing the etching mask.

Effects of the invention

According to the present invention, there can be provided a photosensitive resin composition having sufficient resistance to an etchant for etching a glass substrate and capable of forming an etching mask which can be peeled off by an organic solvent-based peeling liquid, and a method for etching a glass substrate including forming an etching mask using the photosensitive resin composition.

Detailed Description

Photosensitive resin composition

The photosensitive resin composition may or may not be a composition for forming an etching mask on a glass substrate, and is preferably a composition for forming an etching mask on a glass substrate.

The photosensitive resin composition comprises a resin component (A) having an acid dissociable dissolution inhibiting group and having an alkali solubility increased by the action of an acid, an acid generator (B) generating an acid by irradiation with radiation, a filler (C), and a plasticizer (D), or

The resin composition comprises a resin component (A1) having a phenolic hydroxyl group, a protective agent (A2) which imparts an acid dissociable dissolution inhibiting group by reacting with the phenolic hydroxyl group, an acid generator (B), a filler (C), and a plasticizer (D).

Hereinafter, the photosensitive resin composition containing the resin component (a), the acid generator (B), the filler (C) and the plasticizer (D) is referred to as a1 st photosensitive resin composition.

The photosensitive resin composition containing the resin component having a phenolic hydroxyl group (a1), the protective agent (a2) which reacts with the phenolic hydroxyl group to form an acid dissociable dissolution inhibiting group, the acid generator (B), the filler (C), and the plasticizer (D) is referred to as a2 nd photosensitive resin composition.

< 1 st photosensitive resin composition >

As described above, the 1 st photosensitive resin composition contains the resin component (a), the acid generator (B), the filler (C), and the plasticizer (D). Hereinafter, essential or optional components of the 1 st photosensitive resin composition will be described.

[ resin component (A) ]

The resin component (a) is a novolac resin or a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups are protected by an acid dissociable dissolution inhibiting group.

By using a resin derived from a novolak resin or a polyhydroxystyrene resin having an aromatic skeleton as the resin component (a), an etching mask formed using the 1 st photosensitive resin composition is excellent in resistance to an etchant such as a hydrofluoric acid aqueous solution.

In particular, since excellent resistance to an etchant for an etching mask and easy releasability from an etching mask by an organic solvent are easily compatible with each other, the resin component (a) preferably contains a reaction product of a novolak resin or a polyhydroxystyrene resin and a divinyl ether compound represented by the formula (i) described later.

In the reaction product of the novolak resin or polyhydroxystyrene resin and a divinyl ether compound represented by formula (i) described later, the molecules of the novolak resin or polyhydroxystyrene resin are crosslinked with a divalent acid dissociable, dissolution inhibiting group by the reaction of the phenolic hydroxyl group with the divinyl ether compound represented by formula (i).

The novolak resin protected by an acid dissociable dissolution inhibiting group and the polyhydroxystyrene resin protected by an acid dissociable dissolution inhibiting group will be described below.

(Novolac resin)

The novolak resin protected by the acid dissociable, dissolution inhibiting group is a novolak resin in which at least a part of the phenolic hydroxyl groups are protected by the acid dissociable, dissolution inhibiting group. The novolak resin having a hydroxyl group protected by an acid dissociable, dissolution inhibiting group is not particularly limited, and can be appropriately selected from known novolak resins.

For example, as the novolak resin protected by the acid dissociable, dissolution inhibiting group, a resin containing a structural unit represented by formula (a1) having a phenolic hydroxyl group protected by the acid dissociable, dissolution inhibiting group can be used.

[ CHEM 1 ]

In the above formula (a1), R^1aRepresents an acid dissociable, dissolution inhibiting group, R^2aAnd R^3aEach independently represents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms.

As the above-mentioned R^1aThe acid dissociable dissolution inhibiting group is preferably a group represented by the following formula (a2) or (a3), a linear, branched or cyclic alkyl group having 1 to 6 carbon atoms, a vinyloxyethyl group, or a tetrahydropyridinyl groupFuryl, tetrahydrofuranyl, or trialkylsilyl.

[ CHEM 2 ]

In the above formulae (a2) and (a3), R^4aAnd R^5aEach independently represents a hydrogen atom or a linear or branched alkyl group having 1 to 6 carbon atoms, R^6aRepresents a linear, branched or cyclic alkyl group having 1 to 10 carbon atoms, R^7aRepresents a linear, branched or cyclic alkyl group having 1 to 6 carbon atoms, and o represents 0 or 1.

Examples of the linear or branched alkyl group include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group. Examples of the cyclic alkyl group include cyclopentyl and cyclohexyl.

Specific examples of the acid dissociable, dissolution inhibiting group represented by formula (a2) include methoxyethyl, ethoxyethyl, n-propoxyethyl, isopropoxyethyl, n-butoxyethyl, isobutoxyethyl, tert-butoxyethyl, cyclohexyloxyethyl, methoxypropyl, ethoxypropyl, 1-methoxy-1-methyl-ethyl, and 1-ethoxy-1-methylethyl. The acid dissociable, dissolution inhibiting group represented by formula (a3) may specifically be a tert-butoxycarbonyl group or a tert-butoxycarbonylmethyl group. Examples of the trialkylsilyl group include groups having 1 to 6 carbon atoms in each alkyl group, such as a trimethylsilyl group and a tri-tert-butyldimethylsilyl group.

As described above, since it is easy to achieve both excellent resistance to an etchant for an etching mask and easy releasability from an etching mask by an organic solvent, a 2-valent acid dissociable dissolution inhibiting group derived from a divinyl ether compound represented by formula (i) is preferable as the acid dissociable dissolution inhibiting group.

H₂C＝CH-O-A^a1-O-CH＝CH₂···(I)

In the formula (I), A^a1An alkylene group having 1 to 10 carbon atoms which may have a substituent and may have an ether bond in the main chain, or a group represented by the following formula (II):

-(A^a2)_na-A^a3-(A^a2)_na-···(Ⅱ)

in the formula (II), A^a2Is an alkylene group having 1 to 10 carbon atoms which may have a substituent, A^a3Is cyclohexylene, na is 0 or 1.

When both ends of the divinyl ether compound represented by the formula (i) are reacted with two of the phenolic hydroxyl groups of the novolac resin, a 2-valent acid dissociable, dissolution inhibiting group derived from the divinyl ether compound represented by the formula (i) is generated.

The 2-valent acid dissociative dissolution inhibiting group derived from the divinyl ether compound represented by the formula (i) is a group represented by the following formula (ia):

-CH(CH₃)-O-A^a1-O-CH(CH₃)-···(Ⅰa)

in addition, when only one end of the divinyl ether compound represented by the formula (i) reacts with a phenolic hydroxyl group of the novolac resin, a 1-valent acid dissociable, dissolution inhibiting group represented by the following formula (ib) is generated:

-CH(CH₃)-O-A^a1-O-CH＝CH₂···(Ⅰb)

a in the formulae (Ia) and (Ib)^a1And A in formula (I)^a1The same is true.

A in formula (I)^a1In the case where the alkylene group is an alkylene group having 1 to 10 carbon atoms which may have a substituent and may have an ether bond in the main chain, examples of the substituent which the alkylene group may have include a halogen atom such as a chlorine atom, a bromine atom and a fluorine atom, and an alkoxy group such as a methoxy group and an ethoxy group.

As A in formula (I)^a1The alkylene group of (1) may have an ether bond (-O-) in its chain.

In A^a1May contain ether bonds in the main chainIn the case of an alkylene group, the number of carbon atoms is 1 to 10, preferably 1 to 8, and more preferably 2 to 6.

As A^a1As a preferred specific example of the alkylene group which may have an ether bond in the main chain, may be mentioned-CH₂CH₂CH₂CH₂-、-CH₂CH₂-O-CH₂CH₂-and-CH₂CH₂-O-CH₂CH₂-O-CH₂CH₂-。

As A^a1Also preferred are 2-valent groups represented by the above formula (II). In the formula (II), A^a3Is cyclohexylene. The cyclohexylene group may be any of cyclohexane-1, 4-diyl, cyclohexane-1, 3-diyl and cyclohexane-1, 2-diyl, and is preferably cyclohexane-1, 4-diyl.

In the formula (II), na is independently 0 or 1.

In the formula (II), A^a2Is an alkylene group having 1 to 10 carbon atoms which may have a substituent. As A^a2The number of carbon atoms of the alkylene group(s) of (a) is preferably 1 to 6, more preferably 1 to 4, and still more preferably 1 or 2. As A^a2Examples of the substituent which the alkylene group(s) may have include a halogen atom such as a chlorine atom, a bromine atom and a fluorine atom, and an alkoxy group such as a methoxy group and an ethoxy group.

As A^a2Specific preferred examples of (3) include methylene, ethane-1, 2-diyl, ethane-1, 1-diyl, propane-1, 3-diyl and butane-1, 4-diyl.

As a particularly preferred example of the 2-valent group represented by the formula (II), there may be mentioned a group wherein both na's are 1 and A^a3Is cyclohexane-1, 4-diyl, two A^a2All are methylene groups.

From the viewpoint of film properties of the etching mask, the ratio (protection ratio) of the number of hydroxyl groups protected by the acid dissociable, dissolution inhibiting groups derived from the divinyl ether compound represented by formula (i) represented by formula (ia) and/or formula (ib) to the total number of phenolic hydroxyl groups of the novolac resin is preferably in the range of 0.5% to 30%, more preferably 1% to 20%, and still more preferably 2% to 10%. The protection rate can be confirmed by, for example, proton NMR (nuclear magnetic resonance).

[ polyhydroxystyrene resin ]

The polyhydroxystyrene resin protected by the acid dissociable, dissolution inhibiting group is a polyhydroxystyrene resin in which at least a part of phenolic hydroxyl groups are protected by the acid dissociable, dissolution inhibiting group. The polyhydroxystyrene resin in which a hydroxyl group is protected by an acid dissociable, dissolution inhibiting group is not particularly limited, and may be suitably selected from known polyhydroxystyrene resins.

For example, as the polyhydroxystyrene resin protected with an acid dissociable, dissolution inhibiting group, a resin containing a structural unit represented by the following formula (a4) having a phenolic hydroxyl group protected with an acid dissociable, dissolution inhibiting group can be used.

[ CHEM 3 ]

In the above formula (a4), R^8aRepresents a hydrogen atom or an alkyl group having 1 to 6 carbon atoms, R^9aRepresents an acid dissociable, dissolution inhibiting group.

The alkyl group having 1 to 6 carbon atoms is, for example, a linear, branched or cyclic alkyl group having 1 to 6 carbon atoms. Examples of the linear or branched alkyl group include a methyl group, an ethyl group, a propyl group, an isopropyl group, an n-butyl group, an isobutyl group, a tert-butyl group, a pentyl group, an isopentyl group, and a neopentyl group, and examples of the cyclic alkyl group include a cyclopentyl group and a cyclohexyl group.

As with the above-mentioned R^9aAs the acid dissociable, dissolution inhibiting group, the same acid dissociable, dissolution inhibiting groups as exemplified by the above formulae (a2) and (a3) can be used.

In addition, the polyhydroxystyrene resin may contain a structural unit derived from another polymerizable compound for the purpose of appropriately controlling physical and chemical properties. Examples of such polymerizable compounds include known radical polymerizable compounds and anion polymerizable compounds. Examples of the polymerizable compound include monocarboxylic acids such as acrylic acid, methacrylic acid, and crotonic acid; dicarboxylic acids such as maleic acid, fumaric acid, and itaconic acid; methacrylic acid derivatives having a carboxyl group and an ester bond such as 2-methacryloyloxyethylsuccinic acid, 2-methacryloyloxyethylmaleic acid, 2-methacryloyloxyethylphthalic acid, 2-methacryloyloxyethylhexahydrophthalic acid, and the like; alkyl (meth) acrylates such as methyl (meth) acrylate, ethyl (meth) acrylate, and butyl (meth) acrylate; hydroxyalkyl (meth) acrylates such as 2-hydroxyethyl (meth) acrylate and 2-hydroxypropyl (meth) acrylate; aryl (meth) acrylates such as phenyl (meth) acrylate and benzyl (meth) acrylate; dicarboxylic diesters such as diethyl maleate and dibutyl fumarate; vinyl group-containing aromatic compounds such as styrene, α -methylstyrene, chlorostyrene, chloromethylstyrene, vinyltoluene, hydroxystyrene, α -methylhydroxystyrene, and α -ethylhydroxystyrene; vinyl group-containing aliphatic compounds such as vinyl acetate; conjugated dienes such as butadiene and isoprene; nitrile group-containing polymerizable compounds such as acrylonitrile and methacrylonitrile; chlorine-containing polymerizable compounds such as vinyl chloride and vinylidene chloride; and amide bond-containing polymerizable compounds such as acrylamide and methacrylamide.

The mass average molecular weight of the resin component (a) is preferably 1000 to 60000, more preferably 2000 to 50000.

The resin component (A) may be used alone in 1 kind, or may be used in combination with 2 or more kinds.

The content of the resin component (a) is preferably 5% by mass or more and 90% by mass or less, more preferably 15% by mass or more and 80% by mass or less, and further preferably 30% by mass or more and 70% by mass or less, with respect to the solid content (excluding the solvent) of the 1 st radiation-sensitive composition.

[ acid Generator (B) ]

The acid generator (B) is a compound that generates an acid upon irradiation with radiation. The acid generator (B) is not particularly limited as long as it is a compound that directly or indirectly generates an acid by light. As the acid generator (B), the following 1 st to 5 th acid generators are preferable. The 1 st to 5 th acid generators are explained below.

(the 1 st acid generator)

The 1 st acid generator may, for example, be a compound represented by the following formula (b 1).

[ CHEM 4 ]

In the above formula (b1), X^1bRepresents a sulfur atom or an iodine atom having a valence of g, and g is 1 or 2. h represents the number of repeating units of the structure in parentheses. R^1bIs equal to X^1bThe bonded organic group represents an aryl group having 6 to 30 carbon atoms, a heterocyclic group having 4 to 30 carbon atoms, an alkyl group having 1 to 30 carbon atoms, an alkenyl group having 2 to 30 carbon atoms or an alkynyl group having 2 to 30 carbon atoms, and R is^1bOr at least one member selected from the group consisting of alkyl, hydroxy, alkoxy, alkylcarbonyl, arylcarbonyl, alkoxycarbonyl, aryloxycarbonyl, arylthiocarbonyl, acyloxy, arylthio, alkylthio, aryl, heterocycle, aryloxy, alkylsulfinyl, arylsulfinyl, alkylsulfonyl, arylsulfonyl, alkyleneoxy, amino, cyano, nitro and halogen. R^1bThe number of (b) is g + h (g-1) +1, R^1bMay be the same as or different from each other. In addition, 2 or more R^1bCan be directly bonded to each other or through-O-, -S-, -SO₂-、-NH-、-NR^2b-, -CO-, -COO-, -CONH-, an alkylene group having 1 to 3 carbon atoms, or a phenylene group, to form a compound containing X^1bThe ring structure of (a). R^2bAn alkyl group having 1 to 5 carbon atoms or an aryl group having 6 to 10 carbon atoms.

X^2bThe structure is represented by the following formula (b 2).

[ CHEM 5 ]

In the above formula (b2), X^4bX represents a 2-valent group of an alkylene group having 1 to 8 carbon atoms, an arylene group having 6 to 20 carbon atoms, or a heterocyclic compound having 8 to 20 carbon atoms^4bThe alkyl group may be substituted with at least one member selected from the group consisting of an alkyl group having 1 to 8 carbon atoms, an alkoxy group having 1 to 8 carbon atoms, an aryl group having 6 to 10 carbon atoms, a hydroxyl group, a cyano group, a nitro group, and a halogen. X^5brepresents-O-, -S-, -SO-, -SO₂-、-NH-、-NR^2b-, -CO-, -COO-, -CONH-, an alkylene group having 1 to 3 carbon atoms, or a phenylene group. h represents the number of repeating units in the structure in parentheses and is an integer of 0 or more. h + 1X^4bAnd h X^5bMay be the same or different. R^2bAs defined above.

X^3b-Examples of the onium counter ion include a fluoroalkyl fluorophosphate anion represented by the following formula (b9), the following formula (b13), the following formula (b14), and the following formula (b17), and a borate anion represented by the following formula (b18), and an anion represented by the following formula (b9) is preferable from the viewpoint of film characteristics of the etching mask.

[ CHEM 6 ]

R^20bSO₃ ^-(b9)

In the above formula (b9), R^20bIs a group represented by the following formulae (b10), (b11) and (b 12).

[ CHEM 7 ]

In the formula (b10), x represents an integer of 1 to 4. In the formula (b11), R is^21bRepresents a hydrogen atom, a hydroxyl group, a linear or branched alkyl group having 1 to 6 carbon atoms, or a linear alkyl group having 1 to 6 carbon atomsOr a branched alkoxy group, and y represents an integer of 1 to 3. Among them, trifluoromethanesulfonate and perfluorobutanesulfonate are preferable from the viewpoint of safety.

[ CHEM 8 ]

In the above formulae (b13) and (b14), X^bRepresents a linear or branched alkylene group in which at least 1 hydrogen atom is substituted with a fluorine atom, and the alkylene group has 2 to 6 carbon atoms, preferably 3 to 5 carbon atoms, and most preferably 3 carbon atoms. In addition, Y^b、Z^bEach independently represents a linear or branched alkyl group in which at least 1 hydrogen atom is substituted with a fluorine atom, and the alkyl group has 1 to 10 carbon atoms, preferably 1 to 7 carbon atoms, and more preferably 1 to 3 carbon atoms.

X^bThe number of carbon atoms of the alkylene group of (2), or Y^b、Z^bThe smaller the number of carbon atoms of the alkyl group (b) is, the better the solubility in an organic solvent is, and therefore, the lower the number of carbon atoms is, the better the solubility in an organic solvent is.

In addition, in X^bAlkylene or Y of^b、Z^bThe alkyl group of (3) is preferable because the acid strength becomes stronger as the number of hydrogen atoms substituted with fluorine atoms increases. The proportion of fluorine atoms in the alkylene group or alkyl group, that is, the fluorination rate, is preferably 70% to 100%, more preferably 90% to 100%, and most preferably a perfluoroalkylene group or perfluoroalkyl group in which all hydrogen atoms are replaced with fluorine atoms.

[ CHEM 9 ]

[(R^3b)_jPF_6-j]^-(b17)

In the above formula (b17), R^3bRepresents an alkyl group in which 80% or more of hydrogen atoms are substituted with fluorine atoms. j represents R^3bThe number of (b) is an integer of 1 to 5 inclusive. j R^3bMay be the same or different.

[ CHEM 10 ]

In the above formula (b18), R^4b～R^7bEach independently represents a fluorine atom or a phenyl group, and a part or all of hydrogen atoms of the phenyl group may be substituted by at least 1 selected from the group consisting of a fluorine atom and a trifluoromethyl group.

Examples of the onium ion in the compound represented by the formula (b1) include triphenylsulfonium, tri-p-tolylsulfonium, 4- (phenylthio) phenyldiphenylsulfonium, bis [4- (diphenylsulfonium) phenyl ] sulfide, bis [4- { bis [4- (2-hydroxyethoxy) phenyl ] sulfonium } phenyl ] sulfide, bis {4- [ bis (4-fluorophenyl) sulfonium ] phenyl } sulfide, 4- (4-benzoyl-2-chlorophenylthio) phenyl bis (4-fluorophenyl) sulfonium, 7-isopropyl-9-oxo-10-thio-9, 10-dihydroanthracen-2-yl-p-tolylsulfonium, 7-isopropyl-9-oxo-10-thio-9, 10-dihydroanthracen-2-yl-diphenylsulfonium, lithium chloride, lithium, 2- [ (diphenyl) sulfonyl ] thioxanthone, 4- [4- (4-t-butylbenzoyl) phenylthio ] phenyl di-p-tolylsulfonium, 4- (4-benzoylphenylthio) phenyldiphenylsulfonium, diphenylbenzoylsulfonium, 4-hydroxyphenylmethylbenzylsulfonium, 2-naphthylmethyl (1-ethoxycarbonyl) ethylsulfonium, 4-hydroxyphenylmethylbenzoylsulfonium, phenyl [4- (4-biphenylthio) phenyl ] 4-biphenylsulfonium, phenyl [4- (4-biphenylthio) phenyl ] 3-biphenylsulfonium, [4- (4-acetylphenylthio) phenyl ] diphenylsulfonium, octadecylmethylbenzoylsulfonium, diphenyliodonium, di-p-tolyliodonium, bis (4-dodecylphenyl) iodonium, lithium iron oxide, Bis (4-methoxyphenyl) iodonium, (4-octyloxyphenyl) phenyliodonium, bis (4-decyloxy) phenyliodonium, 4- (2-hydroxytetradecyloxy) phenylphenyliodonium, 4-isopropylphenyl (p-tolyl) iodonium, or 4-isobutylphenyl (p-tolyl) iodonium, and the like.

In the fluoroalkyl fluorophosphate anion represented by the above formula (b17), R^3bThe alkyl group substituted with a fluorine atom preferably has 1 to 8 carbon atoms, and more preferably has 1 to 4 carbon atoms. Specific examples of the alkyl group include: linear alkyl groups such as methyl, ethyl, propyl, butyl, pentyl, and octyl; branched alkyl groups such as isopropyl, isobutyl, sec-butyl, and tert-butyl; and further cyclopropyl, cyclobutyl, cycloA cycloalkyl group such as a pentyl group or a cyclohexyl group, and the like, and the proportion of the hydrogen atom of the alkyl group substituted by a fluorine atom is usually 80% or more, preferably 90% or more, and more preferably 100%. When the substitution rate of fluorine atoms is less than 80%, the acid strength of the fluoroalkyl fluorophosphoric acid salt represented by the above formula (b1) is lowered.

Particularly preferred R^3bA linear or branched perfluoroalkyl group having 1 to 4 carbon atoms and a fluorine atom substitution rate of 100%, and specific examples thereof include CF₃、CF₃CF₂、(CF₃)₂CF、CF₃CF₂CF₂、CF₃CF₂CF₂CF₂、(CF₃)₂CFCF₂、CF₃CF₂(CF₃)CF、(CF₃)₃C。R^3bThe number j of (a) is an integer of 1 to 5, preferably 2 to 4, and particularly preferably 2 or 3.

Specific examples of the preferred fluoroalkyl fluorophosphate anion include [ (CF)₃CF₂)₂PF₄]^-、[(CF₃CF₂)₃PF₃]^-、[((CF₃)₂CF)₂PF₄]^-、[((CF₃)₂CF)₃PF₃]^-、[(CF₃CF₂CF₂)₂PF₄]^-、[(CF₃CF₂CF₂)₃PF₃]^-、[((CF₃)₂CFCF₂)₂PF₄]^-、[((CF₃)₂CFCF₂)₃PF₃]^-、[(CF₃CF₂CF₂CF₂)₂PF₄]^-Or [ (CF)₃CF₂CF₂)₃PF₃]^-Among them, [ (CF) is particularly preferable₃CF₂)₃PF₃]^-、[(CF₃CF₂CF₂)₃PF₃]^-、[((CF₃)₂CF)₃PF₃]^-、[((CF₃)₂CF)₂PF₄]^-、[((CF₃)₂CFCF₂)₃PF₃]^-Or [ ((CF)₃)₂CFCF₂)₂PF₄]^-。

A preferable specific example of the borate anion represented by the formula (B18) includes tetrakis (pentafluorophenyl) borate ([ B (C) ]₆F₅)₄]^-) Tetra [ (trifluoromethyl) phenyl group]Borate ([ B (C) ]₆H₄CF₃)₄]^-) Difluoro bis (pentafluorophenyl) borate ([ (C)₆F₅)₂BF₂]^-) Trifluoro-pentafluorophenyl borate ([ (C)₆F₅)BF₃]^-) Tetrakis (difluorophenyl) borate ([ B (C))₆H₃F₂)₄]^-). Among these, tetrakis (pentafluorophenyl) borate ([ B (C) is particularly preferable₆F₅)₄]^-)。

(2 nd acid generator)

Examples of the 2 nd acid generator include 2, 4-bis (trichloromethyl) -6-piperonyl-1, 3, 5-triazine, 2, 4-bis (trichloromethyl) -6- [2- (2-furyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (5-methyl-2-furyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (5-ethyl-2-furyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (5-propyl-2-furyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3, 5-dimethoxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3, 5-diethoxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3, 5-dipropoxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3-methoxy-5-ethoxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3-methoxy-5-propoxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- [2- (3, 4-methylenedioxyphenyl) vinyl ] s-triazine, 2, 4-bis (trichloromethyl) -6- (3, 4-methylenedioxyphenyl) s-triazine, 2, 4-bis-trichloromethyl-6- (3-bromo-4-methoxy) phenyl s-triazine, 2, 4-bis-trichloromethyl-6- (2-bromo-4-methoxy) styrylphenyl s-triazine, 2, 4-bis-trichloromethyl-6- (3-bromo-4-methoxy) styrylphenyl s-triazine, 2- (4-methoxyphenyl) -4, 6-bis (trichloromethyl) -1,3, 5-triazine, 2- (4-methoxynaphthyl) -4, 6-bis (trichloromethyl) -1,3, 5-triazine, 2- [2- (2-furyl) vinyl ] -4, 6-bis (trichloromethyl) -1,3, 5-triazine, 2- [2- (5-methyl-2-furyl) vinyl ] -4, 6-bis (trichloromethyl) -1,3, 5-triazine, 2- [2- (3, 5-dimethoxyphenyl) vinyl ] -4, 6-bis (trichloromethyl) -1,3, 5-triazine, 2- [2- (3, 4-dimethoxyphenyl) vinyl ] -4, 6-bis (trichloromethyl) -1, halogen-containing triazine compounds such as 3, 5-triazine, 2- (3, 4-methylenedioxyphenyl) -4, 6-bis (trichloromethyl) -1,3, 5-triazine, tris (1, 3-dibromopropyl) -1,3, 5-triazine, tris (2, 3-dibromopropyl) -1,3, 5-triazine and the like, and halogen-containing triazine compounds represented by the following formula (b3) such as tris (2, 3-dibromopropyl) isocyanurate and the like.

[ CHEM 11 ]

In the above formula (b3), R^9b、R^10b、R^11bEach independently represents a haloalkyl group.

(3 rd acid generator)

Examples of the 3 rd acid generator include α - (p-toluenesulfonyloxyimino) phenylacetonitrile, α - (benzenesulfonyloxyimino) -2, 4-dichlorophenylacetonitrile, α - (benzenesulfonyloxyimino) -2, 6-dichlorophenylacetonitrile, α - (2-chlorobenzenesulfonyloxyimino) -4-methoxyphenylacetonitrile, α - (ethylsulfonyloxyimino) -1-cyclopentenylacetonitrile, and a compound represented by the following formula (b4) containing a hydroxamato group.

[ CHEM 12 ]

In the above formula (b4), R^12bRepresents a 1-, 2-or 3-valent organic group, R^13bRepresents a substituted or unsubstituted saturated hydrocarbon group, unsaturated hydrocarbon group or aromatic group, and n represents the number of repeating units of the structure in parentheses.

In the above formula (b4), the aromatic group may, for example, be an aryl group such as a phenyl group or a naphthyl group, or a heteroaryl group such as a furyl group or a thienyl group. They may have 1 or more suitable substituents on the ring, such as halogen atoms, alkyl groups, alkoxy groups, nitro groups, and the like. In addition, R^13bThe alkyl group having 1 to 6 carbon atoms is particularly preferred, and examples thereof include a methyl group, an ethyl group, a propyl group and a butyl group. Particular preference is given to R^12bIs an aromatic radical, R^13bIs a compound which is an alkyl group having 1 to 4 carbon atoms.

As the acid generator represented by the above formula (b4), when n is 1, R is^12bIs any one of phenyl, methylphenyl and methoxyphenyl, R^13bSpecific examples of the compound which is a methyl group include α - (methylsulfonoxyimino) -1-phenylacetonitrile, α - (methylsulfonoxyimino) -1- (p-methylphenyl) acetonitrile, α - (methylsulfonoxyimino) -1- (p-methoxyphenyl) acetonitrile, [2- (propylsulfonyloxyimino) -2, 3-dihydroxythiophen-3-ylidene ] (o-tolyl) acetonitrile, and when n is 2, specific examples of the acid generator represented by the above formula (b4) include acid generators represented by the following formulae.

[ CHEM 13 ]

(4 th acid generator)

Examples of the 4 th acid generator include bissulfonyldiazomethanes such as bis (p-toluenesulfonyl) diazomethane, bis (1, 1-dimethylethylsulfonyl) diazomethane, bis (cyclohexylsulfonyl) diazomethane, and bis (2, 4-dimethylphenylsulfonyl) diazomethane; nitrobenzyl derivatives such as 2-nitrobenzyl p-toluenesulfonate, 2, 6-dinitrobenzyl p-toluenesulfonate, nitrobenzyl toluenesulfonate, dinitrobenzyl toluenesulfonate, nitrobenzyl sulfonate, nitrobenzyl carbonate and dinitrobenzyl carbonate; sulfonic acid esters such as pyrogallol trifluoromethanesulfonate, pyrogallol trimetapholate, benzyl tosylate, benzyl sulfonate, N-methylsulfonyloxy succinimide, N-trichloromethylsulfonyloxy succinimide, N-phenylsulfonyloxy maleimide and N-methylsulfonyloxy phthalimide; trifluoromethanesulfonic acid esters such as N- (trifluoromethanesulfonyloxy) phthalimide, N- (trifluoromethanesulfonyloxy) -1, 8-naphthalimide, and N- (trifluoromethanesulfonyloxy) -4-butyl-1, 8-naphthalimide; onium salts such as diphenyliodonium hexafluorophosphate, (4-methoxyphenyl) phenyliodonium trifluoromethanesulfonate, bis (p-tert-butylphenyl) iodonium trifluoromethanesulfonate, triphenylsulfonium hexafluorophosphate, (4-methoxyphenyl) diphenylsulfonium trifluoromethanesulfonate, (p-tert-butylphenyl) diphenylsulfonium trifluoromethanesulfonate and the like; benzoin tosylates such as benzoin tosylate and α -methylbenzoin tosylate; other diphenyliodonium salts, triphenylsulfonium salts, phenyldiazonium salts, benzyl carbonate, and the like.

The acid generator (B) may be used alone or in combination of 2 or more. The content of the acid generator (B) is preferably 0.1 to 30 parts by mass, and particularly preferably 1 to 20 parts by mass, based on 100 parts by mass of the component (a) in the photosensitive resin composition. When the amount of the acid generator (B) is in the above range, a uniform solution having good sensitivity can be obtained, and a photosensitive resin composition having excellent storage stability can be easily prepared.

When two or more acid generators (B) are combined, it is preferable to combine the 1 st acid generator with one or more acid generators selected from the 2 nd to 4 th acid generators, more preferably to combine the 1 st acid generator with one acid generator selected from the 2 nd to 4 th acid generators, and preferably to combine the 1 st acid generator with the 3 rd acid generator, from the viewpoint of film characteristics of the etching mask.

In the component (B), the ratio (mass ratio) of the amount of the 1 st acid generator to the amount of the other acid generators (one or more acid generators selected from the 2 nd to 4 th acid generators) is preferably (1 st acid generator): (other acid generators) ═ 99: 1-1: within the range of 99, more preferably (1 st acid generator): (other acid generators) ═ 5: 95-50: 50, more preferably (1 st acid generator): (other acid generators) ═ 10: 90-40: 60, adding a solvent to the mixture; most preferably (1 st acid generator): (other acid generators) ═ 10: 90-30: 70.

[ Filler (C) ]

The photosensitive resin composition contains a filler (C). By including the filler (C) in the photosensitive resin composition, an etching mask excellent in hardness, mechanical properties, heat resistance, and the like can be easily formed using the photosensitive resin composition. The filler (C) may be an inorganic filler or an organic filler, and is preferably an inorganic filler.

The filler (C) may, for example, be mica, talc, clay, bentonite, montmorillonite, kaolin, wollastonite, alumina, aluminum hydroxide, barium sulfate, barium titanate or potassium titanate, because of its high resistance to an etchant such as hydrofluoric acid.

The content of the filler (C) in the photosensitive resin composition is not particularly limited within a range not to impair the object of the present invention. The content of the filler (C) in the photosensitive resin composition is appropriately determined by considering the film thickness of an etching mask to be formed or the depth of etching into glass by etching.

For example, the content of the filler (C) in the photosensitive resin composition is preferably 30 parts by mass or more and 70 parts by mass or less, and more preferably 35 parts by mass or more and 60 parts by mass or less, based on 100 parts by mass of the total of the mass of the resin component (a) and the mass of the acid generator (B).

In particular, when the depth of the etching into the glass substrate by etching is 300 μm or more, the content of the filler (C) is preferably within the above range.

In the case where the depth of the etching into the glass substrate by etching is less than 300 μm, the content of the filler (C) in the photosensitive resin composition may be 1 part by mass or more and less than 30 parts by mass with respect to 100 parts by mass of the total of the mass of the resin component (a) and the mass of the acid generator (B).

[ plasticizer (D) ]

The photosensitive resin composition contains a plasticizer (D). By including the plasticizer in the photosensitive resin composition, the occurrence of cracks in an etching mask formed using the photosensitive resin composition can be suppressed. The etching mask without cracks has excellent resistance to an etchant used for etching of a glass substrate.

Specific examples of the plasticizer (D) include polyvinyl chloride, polystyrene, polyhydroxystyrene, polyvinyl acetate, polyvinyl benzoic acid, polyvinyl alkyl ether, polyvinyl alcohol, polyvinyl pyrrolidone, polyvinyl phenol, and copolymers thereof. Among them, polyvinyl alkyl ether is preferable because an etching mask excellent in resistance to an etchant is easily formed.

The number of carbon atoms of the alkyl moiety of the polyvinyl alkyl ether is preferably 1 to 5, and more preferably 1 or 2. That is, as the polyvinyl alkyl ether, polyvinyl methyl ether and polyvinyl ethyl ether are preferable.

The mass average molecular weight of the polyvinyl alkyl ether is not particularly limited. The mass average molecular weight of the polyvinyl alkyl ether is preferably 10000 to 200000, more preferably 50000 to 100000.

The content of the plasticizer (D) in the photosensitive resin composition is not particularly limited as long as the desired effect by the use of the plasticizer (D) can be obtained. The content of the plasticizer (D) in the photosensitive resin composition is preferably 10 parts by mass or more and 100 parts by mass or less, more preferably 20 parts by mass or more and 80 parts by mass or less, and further preferably 30 parts by mass or more and 60 parts by mass or less, with respect to 100 parts by mass of the resin component (a).

[ solvent (S) ]

In general, the photosensitive resin composition preferably contains a solvent (S) for the purpose of adjusting coatability. The type of the solvent (S) is not particularly limited as long as the object of the present invention is not impaired, and can be appropriately selected from solvents conventionally used for positive photosensitive resin compositions.

Specific examples of the solvent (S) include ketones such as acetone, methyl ethyl ketone, cyclohexanone, methyl isoamyl ketone and 2-heptanone; ethylene glycols such as ethylene glycol, diethylene glycol, triethylene glycol, propylene glycol, dipropylene glycol, tripropylene glycol, 1, 3-butanediol, and hexylene glycol; polyhydric alcohols such as glycerin; monohydric alcohols such as benzyl alcohol and terpineol; ethylene glycol monoacetates such as ethylene glycol monoacetate, diethylene glycol monoacetate, triethylene glycol monoacetate, propylene glycol monoacetate, dipropylene glycol monoacetate, tripropylene glycol monoacetate, and 1, 3-butanediol monoacetate; ethylene glycol diacetate esters such as ethylene glycol diacetate, diethylene glycol diacetate, triethylene glycol diacetate, propylene glycol diacetate, dipropylene glycol diacetate, tripropylene glycol diacetate, and 1, 3-butanediol diacetate; ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol monopropyl ether, ethylene glycol monobutyl ether, ethylene glycol monophenyl ether, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monophenyl ether, triethylene glycol monomethyl ether, triethylene glycol monoethyl ether, triethylene glycol monobutyl ether, triethylene glycol monophenyl ether, propylene glycol monomethyl ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monobutyl ether, propylene glycol monophenyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether, dipropylene glycol monopropyl ether, dipropylene glycol monobutyl ether, dipropylene glycol monophenyl ether, tripropylene glycol monomethyl ether, tripropylene glycol monoethyl ether, tripropylene glycol monopropyl ether, tripropylene glycol monobutyl ether, tripropylene glycol monophenyl ether, 1, 3-butylene glycol monomethyl ether, 1, 3-butylene glycol monoethyl ether, Ethylene glycol monoethers such as 1, 3-butanediol monopropyl ether, 1, 3-butanediol monobutyl ether, and 1, 3-butanediol monophenyl ether; ethylene glycol monomethyl ether acetate, ethylene glycol monoethyl ether acetate, ethylene glycol monopropyl ether acetate, ethylene glycol monobutyl ether acetate, ethylene glycol monophenyl ether acetate, diethylene glycol monomethyl ether acetate, diethylene glycol monoethyl ether acetate, diethylene glycol monopropyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monophenyl ether acetate, triethylene glycol monomethyl ether acetate, triethylene glycol monoethyl ether acetate, triethylene glycol monobutyl ether acetate, triethylene glycol monophenyl ether acetate, propylene glycol monomethyl ether acetate, propylene glycol monoethyl ether acetate, propylene glycol monopropyl ether acetate, propylene glycol monobutyl ether acetate, propylene glycol monophenyl ether acetate, dipropylene glycol monomethyl ether acetate, dipropylene glycol monopropyl ether acetate, dipropylene glycol monobutyl ether acetate, dipropylene glycol monopropyl ether acetate, dipropylene glycol monophenyl ether acetate, ethylene glycol monopropyl ether acetate, ethylene glycol monophenyl ether acetate, ethylene glycol, Tripropylene glycol monomethyl ether acetate, tripropylene glycol monoethyl ether acetate, tripropylene glycol monopropyl ether acetate, tripropylene glycol monobutyl ether acetate, tripropylene glycol monophenyl ether acetate, 1, 3-butanediol monomethyl ether acetate (butyl 3-methoxyacetate), 1, 3-butanediol monoethyl ether acetate, 1, 3-butanediol monopropyl ether acetate, 1, 3-butanediol monobutyl ether acetate, 1, 3-butanediol monophenyl ether acetate, 3-methyl-3-methoxybutyl acetate, 3-ethyl-3-methoxybutyl acetate, 2-methoxypentyl acetate, 3-methoxypentyl acetate, 4-methoxypentyl acetate, 2-methyl-3-methoxypentyl acetate, 3-methyl-3-methoxypentyl acetate, tripropylene glycol monobutyl ether acetate, tripropylene glycol monopropyl ether acetate, 1, 3-butanediol monopropyl ether acetate, ethylene glycol monoether acetates such as 3-methyl-4-methoxypentyl acetate and 4-methyl-4-methoxypentyl acetate; ethylene glycol dimethyl ether, ethylene glycol diethyl ether, ethylene glycol dipropylene ether, ethylene glycol dibutyl ether, ethylene glycol diphenyl ether, diethylene glycol dimethyl ether, diethylene glycol diethyl ether, diethylene glycol dipropyl ether, diethylene glycol dibutyl ether, diethylene glycol diphenyl ether, triethylene glycol dimethyl ether, triethylene glycol diethyl ether, triethylene glycol dipropyl ether, triethylene glycol dibutyl ether, triethylene glycol diphenyl ether, propylene glycol dimethyl ether, propylene glycol diethyl ether, propylene glycol dipropyl ether, propylene glycol dibutyl ether, propylene glycol diphenyl ether, dipropylene glycol dimethyl ether, dipropylene glycol diethyl ether, dipropylene glycol dipropyl ether, dipropylene glycol dibutyl ether, dipropylene glycol diphenyl ether, tripropylene glycol dimethyl ether, tripropylene glycol diethyl ether, tripropylene glycol dipropyl ether, tripropylene glycol dibutyl ether, tripropylene glycol diphenyl ether, 1, 3-butanediol dimethyl ether, 1, 3-butanediol diethyl ether, 1, ethylene glycol ethers such as 3-butanediol dipropyl ether, 1, 3-butanediol dibutyl ether and 1, 3-butanediol diphenyl ether; ethers such as dioxane and dihexyl ether; esters such as ethyl formate, methyl lactate, ethyl lactate, methyl acetate, ethyl acetate, butyl acetate, benzyl acetate, ethyl benzoate, methyl pyruvate, methyl acetoacetate, ethyl pyruvate, ethyl ethoxyacetate, methyl methoxypropionate, ethyl ethoxypropionate, methyl 2-hydroxypropionate, ethyl 2-hydroxy-2-methylpropionate, methyl 2-hydroxy-3-methylbutyrate, diethyl maleate, cyclohexanol acetate, and γ -butyrolactone; aromatic hydrocarbons such as toluene and xylene. These may be used alone, or 2 or more of them may be used in combination.

When the photosensitive resin composition is coated on a glass substrate, it is preferable that the photosensitive resin composition contains a high boiling point solvent having a boiling point of 170 ℃ or higher under atmospheric pressure, from the viewpoint of easily forming a coating film having a uniform film thickness (S1).

Preferred examples of the high boiling point solvent (S1) among the specific examples of the solvent (S) include ethylene glycol, diethylene glycol, dipropylene glycol, hexylene glycol, glycerin, benzyl alcohol, terpineol, propylene glycol diacetate, 1, 3-butylene glycol diacetate, diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol monopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monophenyl ether, dipropylene glycol monomethyl ether, tripropylene glycol monomethyl ether, ethylene glycol monobutyl ether acetate, ethylene glycol monophenyl ether acetate, diethylene glycol monomethyl ether acetate, diethylene glycol monoethyl ether acetate, diethylene glycol monopropyl ether acetate, diethylene glycol monobutyl ether acetate, diethylene glycol monophenyl ether acetate, dipropylene glycol monomethyl ether acetate, and the like in view of the favorable solubility and ready availability of each component contained in the photosensitive resin composition, 1, 3-butanediol monomethyl ether acetate (butyl 3-methoxyacetate), 3-methyl-3-methoxybutyl acetate, 3-ethyl-3-methoxybutyl acetate, 2-methoxypentyl acetate, 3-methoxypentyl acetate, 4-methoxypentyl acetate, 2-methyl-3-methoxypentyl acetate, 3-methyl-4-methoxypentyl acetate and 4-methyl-4-methoxypentyl acetate, diethylene glycol diethyl ether, dipropylene glycol dimethyl ether, benzyl dihexyl ether acetate, ethyl benzoate, diethyl maleate, cyclohexyl acetate, γ -butyrolactone, etc.

In the photosensitive resin composition, the content of the high boiling point solvent (S1) is not particularly limited as long as the desired effect is obtained by using the high boiling point solvent (S1). The content of the high-boiling solvent (S1) in the photosensitive resin composition is preferably 1 part by mass or more and less than 50 parts by mass, more preferably 1 part by mass or more and 20 parts by mass or less, when the total mass of the solvents (S) in the photosensitive resin composition is 100 parts by mass, from the viewpoint of coatability.

The content of the high-boiling solvent (S1) in the photosensitive resin composition is preferably 0.5 mass% or more and 20 mass% or less, more preferably 1 mass% or more and 15 mass% or less, and particularly preferably 2 mass% or more and 10 mass% or less, based on the total mass of the photosensitive resin composition.

The content of the solvent (S) in the photosensitive resin composition is not particularly limited as long as an etching mask having a desired film thickness can be formed. For example, the solid content concentration of the photosensitive resin composition of the solvent (S) is preferably 40 mass% or more and 70 mass% or less, and more preferably 50 mass% or more and 65 mass% or less from the viewpoint of the production process such as the margin of etching.

In the step of applying the photosensitive resin composition from the vertically upper side to the vertically lower side of both main surfaces of the glass substrate, which will be described later, by using a contact type application device, the viscosity of the photosensitive resin composition is preferably adjusted to 1000cp or more, more preferably 1400cp or more, and still more preferably 2000cp or more. The upper limit is not particularly limited as long as the photosensitive resin composition has fluidity. For example, 30000 or less and 10000 or less can be mentioned.

[ other Components ]

The photosensitive resin composition may contain various components which have been conventionally blended in a positive photosensitive resin composition.

For example, the photosensitive resin composition may further contain a surfactant for improving coatability, defoaming property, leveling property, and the like. As the surfactant, for example, a fluorine-based surfactant or a silicone-based surfactant is preferably used.

Specific examples of the fluorine-based surfactant include, but are not limited to, commercially available fluorine-based surfactants such as BM-1000, BM-1100 (all manufactured by BM chemical Co., Ltd.), MEGAFAC F142D, MEGAFAC F172, MEGAFAC F173, MEGAFAC F183 (all manufactured by Dainippon ink chemical industries Co., Ltd.), Fluorad FC-135, Fluorad FC-170C, Fluorad FC-430, Fluorad FC-431 (all manufactured by Sumitomo 3M Co., Ltd.), Surflon S-112, Surflon S-113, Surflon S-131, Surflon S-141, Surflon S-145 (all manufactured by Asahi Nippon Co., Ltd.), SH-28PA, SH-190, SH-193, SZ-6032, and SF-8428 (all manufactured by Toray silicone Co., Ltd.).

As the silicone surfactant, an unmodified silicone surfactant, a polyether-modified silicone surfactant, a polyester-modified silicone surfactant, an alkyl-modified silicone surfactant, an aralkyl-modified silicone surfactant, a reactive silicone surfactant, and the like can be preferably used.

As the silicone surfactant, commercially available silicone surfactants can be used. Specific examples of commercially available silicone surfactants include Paintad M (manufactured by Tolydakaning Co., Ltd.), トピカ K1000, トピカ K2000, トピカ K5000 (manufactured by Gakkai industries Co., Ltd.), XL-121 (polyether modified silicone surfactant, manufactured by Clariant Co., Ltd.), BYK-088 (silicone defoaming agent, manufactured by Biker chemical Co., Ltd.), BYK-310 (polyester modified silicone surfactant, manufactured by Biker chemical Co., Ltd.), and the like.

In addition, the photosensitive resin composition may further contain an acid or an acid anhydride in order to finely adjust the solubility of the developer.

Specific examples of the acid and the acid anhydride include: monocarboxylic acids such as acetic acid, propionic acid, n-butyric acid, isobutyric acid, n-valeric acid, isovaleric acid, benzoic acid, and cinnamic acid; hydroxy monocarboxylic acids such as lactic acid, 2-hydroxybutyric acid, 3-hydroxybutyric acid, salicylic acid, m-hydroxybenzoic acid, p-hydroxybenzoic acid, 2-hydroxycinnamic acid, 3-hydroxycinnamic acid, 4-hydroxycinnamic acid, 5-hydroxyisophthalic acid, and syringic acid; polycarboxylic acids such as oxalic acid, succinic acid, glutaric acid, adipic acid, maleic acid, itaconic acid, hexahydrophthalic acid, phthalic acid, isophthalic acid, terephthalic acid, 1, 2-cyclohexanedicarboxylic acid, 1,2, 4-cyclohexanetricarboxylic acid, butanetetracarboxylic acid, trimellitic acid, pyromellitic acid, cyclopentanetetracarboxylic acid, butanetetracarboxylic acid, and 1,2, 5, 8-naphthalenetetracarboxylic acid; itaconic anhydride, succinic anhydride, citraconic anhydride, dodecenylsuccinic anhydride, tricarballylic anhydride, maleic anhydride, hexahydrophthalic anhydride, methyltetrahydrophthalic anhydride, nadic anhydride, 1,2, 3, 4-butanetetracarboxylic anhydride, cyclopentanetetracarboxylic dianhydride, phthalic anhydride, pyromellitic anhydride, trimellitic anhydride, benzophenone tetracarboxylic anhydride, ethylene glycol bistrimellitic ester, glycerol tristrimellitic ester, and the like.

The above-described components were uniformly mixed at a desired ratio to obtain a1 st photosensitive resin composition.

< 2 nd photosensitive resin composition >

As described above, the 2 nd photosensitive resin composition contains the resin component (a1) having a phenolic hydroxyl group, the protective agent (a2) that imparts an acid dissociable, dissolution inhibiting group by reacting with the phenolic hydroxyl group, the acid generator (B), the filler (C), and the plasticizer (D).

The acid generator (B), filler (C), plasticizer (D) and other components are the same as those of the photosensitive resin composition 1.

Next, with respect to the 2 nd photosensitive resin composition, a resin component (a1) having a phenolic hydroxyl group and a protective agent (a2) which is reacted with the phenolic hydroxyl group to impart an acid dissociable, dissolution inhibiting group will be described.

[ resin component having phenolic hydroxyl group (A1) ]

The resin component (a1) having a phenolic hydroxyl group is a novolak resin or a polyhydroxystyrene resin in which at least a part of the phenolic hydroxyl group can be protected by the acid dissociable, dissolution inhibiting group. The novolak resin or polyhydroxystyrene resin having a phenolic hydroxyl group and at least a part of the phenolic hydroxyl group is protected by the acid dissociable, dissolution inhibiting group is the same as the resin component (a) described for the photosensitive resin composition 1. As the novolak resin and the polyhydroxystyrene resin, in the resin component (a) described for the photosensitive resin composition 1, a novolak resin and a polyhydroxystyrene resin in a deprotected state can be used after the phenolic hydroxyl group has been protected by an acid dissociative dissolution inhibiting group.

The mass average molecular weight of the resin component (a1) is preferably 1000 to 60000, more preferably 2000 to 50000.

The resin component (a1) may be used alone in 1 kind, or may be used in combination with 2 or more kinds.

The content of the resin component (a1) is preferably 5 mass% to 90 mass%, more preferably 15 mass% to 80 mass%, and still more preferably 30 mass% to 70 mass% with respect to the solid content (excluding the solvent) of the 2 nd radiation-sensitive composition.

[ protective agent (A2) ]

The protective agent (a2) is a compound that imparts an acid dissociable, dissolution inhibiting group by reacting with a phenolic hydroxyl group.

The protective agent (a2) is not particularly limited as long as it is a compound that can impart an acid dissociable, dissolution inhibiting group such as methoxyethyl, ethoxyethyl, n-propoxyethyl, isopropoxyethyl, n-butoxyethyl, isobutoxyethyl, t-butoxyethyl, cyclohexyloxyethyl, methoxypropyl, ethoxypropyl, 1-methoxy-1-methyl-ethyl, 1-ethoxy-1-methylethyl, t-butoxycarbonyl, t-butoxycarbonylmethyl, trimethylsilyl, or tri-t-butyldimethylsilyl group, which is described for the 1 st photosensitive resin composition, by reaction with a phenolic hydroxyl group.

In particular, the divinyl ether compound represented by the formula (i) is preferable as the protective agent because excellent resistance to an etchant for an etching mask and easy releasability from an etching mask using an organic solvent can be easily achieved at the same time.

The amount of the protective agent (a2) used is preferably in the range of 0.5 to 30 parts by mass, more preferably 1 to 20 parts by mass, and still more preferably 2 to 10 parts by mass, based on 100 parts by mass of the phenolic hydroxyl group-containing resin component (a1), from the viewpoint of the film properties of the etching mask.

The above-described components are uniformly mixed at a desired ratio to obtain a2 nd photosensitive resin composition.

Method for etching glass substrate

The etching method of the glass substrate comprises the following steps:

a coating film forming step of applying the photosensitive resin composition to at least one main surface of a glass substrate to form a coating film on the main surface of the glass substrate;

an exposure step of exposing the coating film with position selectivity;

an etching mask forming step of forming an etching mask by developing the exposed coating film with a developer;

an etching step of performing etching processing on the glass substrate provided with the etching mask;

and a removing step of removing the etching mask.

The following describes the respective steps related to etching of the glass substrate.

< coating film Forming step >

In the coating film forming step, the photosensitive resin composition is applied to at least one main surface of a glass substrate to be etched, and a coating film is formed on the main surface of the glass substrate.

The type of the glass substrate is not particularly limited, and examples thereof include alkali-free glass, borosilicate glass, tempered glass, and quartz. In addition, the type of the shape of the glass substrate is not particularly limited. The glass substrate may have a concave-convex shape or a shape having a through hole.

The depth of the etching into the glass substrate by the etching process is not particularly limited. In the case of performing etching processing from both main surfaces of the glass substrate, the etching depth of the glass substrate is the total of the depths etched by the etching performed on each of the both main surfaces of the glass substrate.

The depth of the etching into the glass substrate in the etching process can be as deep as about 2000 μm, for example, by forming an etching mask using the photosensitive resin composition of the present invention. The numerical value on the lower limit side in the processing range of the etching depth can be set as appropriate.

In consideration of the above-mentioned depth of etching, the thickness of the glass substrate is preferably 10 μm or more, more preferably 200 μm or more and 3000 μm or less, still more preferably 250 μm or more and 2300 μm or less, and particularly preferably 300 μm or more and 2000 μm or less.

The thickness of the etching mask is not particularly limited as long as the etching process can be smoothly performed. Typically, the film thickness of the etching mask is preferably 5 μm to 200 μm, more preferably 10 μm to 150 μm, still more preferably 30 μm to 100 μm, and particularly preferably 50 μm to 80 μm.

Further, in the case of coating on both sides, it is more preferably 5 μm to 200 μm. The thickness of the etching mask is preferably 0.08 to 0.25 times, more preferably 0.1 to 0.2 times the depth of the etching process performed on the glass substrate.

In the coating film forming step, the photosensitive resin composition can be coated on a glass substrate to form a coating film using a contact transfer type coating device such as a roll coater, a reverse coater, or a bar coater, or a non-contact type coating device such as a spin coater, a curtain flow coater, or a slit coater. The formed coating film may be heated (prebaked) as necessary.

The prebaking conditions vary depending on the kind, blending ratio, coating film thickness and the like of each component in the photosensitive resin composition, but are usually from 70 ℃ to 200 ℃ and preferably from 80 ℃ to 150 ℃ for about 2 minutes to 120 minutes.

For example, when a glass substrate having a thickness of 200 μm or more is cut by etching or a through hole is formed in a glass substrate having a thickness of 200 μm or more by etching, it is preferable to perform etching by bringing an etchant into contact with both main surfaces of the glass substrate because the etching time can be shortened and damage to the etching mask can be suppressed.

When etching is performed by bringing an etchant into contact with both main surfaces of a glass substrate, etching masks are formed on both main surfaces of the glass substrate.

In the case of applying the photosensitive resin composition to both main surfaces of the glass substrate, since a coating film having a uniform film thickness can be efficiently formed, it is preferable to apply the photosensitive resin composition from the vertically upper side toward the vertically lower side using a contact type application device on both main surfaces of the glass substrate in a state where the glass substrate is disposed such that the main surface of the glass substrate is perpendicular or substantially perpendicular to the vertical direction.

In addition, in a state where the glass substrate is disposed such that the plane direction of the main surface of the glass substrate is the horizontal direction or substantially the horizontal direction, the photosensitive resin composition can be applied to both main surfaces of the glass substrate by a contact type application device.

In the case of performing the above-described both-side coating, the coating may be performed by moving the contact type coating device in a state where the position of the glass substrate is fixed, or the coating may be performed by moving the glass substrate in a state where the position of the contact type coating device is fixed.

In the case of performing the above-described both-side coating, a contact transfer type coating apparatus such as a roll coater, a reverse coater, or a bar coater is preferably used as the coating apparatus, and a roll coater is more preferably used.

< Exposure Process >

In the exposure step, the coating film on the glass substrate is selectively exposed depending on the shape and position of the etching mask to be formed.

Specifically, the coating film is selectively irradiated (exposed) with active light or radiation, for example, ultraviolet light or visible light having a wavelength of 300nm to 500nm, through a mask having a predetermined pattern.

As a radiation source, a low-pressure mercury lamp, a high-pressure mercury lamp, an ultrahigh-pressure mercury lamp, a metal halide lamp, an argon laser, or the like can be used. The radiation includes microwaves, infrared rays, visible rays, ultraviolet rays, X rays, γ rays, electron rays, proton rays, neutron rays, ion rays, and the like. The amount of radiation irradiation varies depending on the composition of the photosensitive resin composition, the film thickness of the photosensitive layer, and the like, and is, for example, 100mJ/cm in the case of using an ultra-high pressure mercury lamp²Above 10000mJ/cm²The following.

After exposure, the coating film is heated by a known method to promote diffusion of an acid, and the solubility of the coating film in a developer such as an alkaline developer changes in the exposed portion of the coating film.

< etching mask Forming Process >

In the etching mask forming step, the coating film after exposure is developed with a developer to form an etching mask.

Examples of the developer include aqueous alkali solutions such as sodium hydroxide, potassium hydroxide, sodium carbonate, sodium silicate, sodium methyl silicate, aqueous ammonia, ethylamine, n-propylamine, diethylamine, di-n-propylamine, triethylamine, methyldiethylamine, dimethylethanolamine, triethanolamine, tetramethylammonium hydroxide, tetraethylammonium hydroxide, pyrrole, piperidine, 1, 8-diazabicyclo [5, 4, 0] -7-undecene, and 1, 5-diazabicyclo [4, 3, 0] -5-nonane. In addition, an aqueous solution in which a suitable amount of a water-soluble organic solvent such as methanol or ethanol or a surfactant is added to the alkali aqueous solution can be used as the developer.

The developing time varies depending on the composition of the photosensitive resin composition, the film thickness of the coating film, and the like, but is usually a time period of 1 minute to 30 minutes. The developing method may be any of a liquid method, a dipping method, a static (paddle) developing method, a spray developing method, and the like.

After development, the resultant is washed with running water for a period of time of 30 to 90 seconds as necessary, and dried using an air gun, an oven, or the like. In this manner, a patterned resist pattern is formed in a desired shape on the glass substrate.

< etching Process >

In the etching step, the glass substrate provided with the etching mask is subjected to etching processing.

The etching process may be a process of cutting the glass substrate or forming a hole penetrating the glass substrate in the thickness direction, or may be a process of forming a groove or a trench in the glass substrate.

The etching method is not particularly limited as long as the etching solution can be brought into contact with the glass substrate. As the etching method, there can be mentioned wet etching in which an etching solution is sprayed on a glass substrate or the glass substrate is immersed in the etching solution.

The etching may be performed by bringing the etchant into contact with only one main surface of the glass substrate, or may be performed by bringing the etching substrate into contact with both main surfaces of the glass substrate.

When the etchant is brought into contact with only one main surface of the glass substrate, the main surface of the glass substrate which is not in contact with the etchant is preferably covered with a protective film. The protective film is not particularly limited as long as it has resistance to an etchant.

The protective film may be formed by attaching a sheet made of a material having resistance to an etchant to a glass substrate, or may be formed by applying the photosensitive resin composition and then heating the applied film.

As described above, when a glass substrate having a thickness of 200 μm or more is cut by etching or a through hole is formed in a glass substrate having a thickness of 200 μm or more by etching, it is preferable to perform etching by bringing an etchant into contact with both main surfaces of the glass substrate because the etching time can be shortened and damage to the etching mask can be suppressed.

The etching solution may, for example, be hydrofluoric acid alone, a mixed acid of hydrofluoric acid and ammonium fluoride, or hydrofluoric acid and another acid (hydrochloric acid, sulfuric acid, phosphoric acid, nitric acid, or the like). The etching treatment time is not particularly limited, and is, for example, about 10 minutes to 10 hours. The etching solution may be heated to a temperature of about 25 ℃ to 60 ℃. The concentration of the etching treatment liquid may be appropriately adjusted in consideration of the etching rate and the treatment time, and for example, the concentration of hydrofluoric acid is preferably 1 mass% or more and 20 mass% or less, and more preferably 5 mass% or more and 10 mass% or less. The concentration of the other acid is preferably 1 to 40 mass%, more preferably 1 to 20 mass%.

< removal step >

After the etching process, the etching mask is removed from the glass substrate in a removal step.

The method for removing the etching mask is not particularly limited, and since it is difficult to damage the glass substrate, the metal wiring attached to the glass substrate, or the resin material, a method of bringing an organic solvent into contact with the etching mask is preferable. The method of bringing the organic solvent into contact with the etching mask is not particularly limited. For example, the etching mask may be sprayed with an organic solvent, or the glass substrate provided with the etching mask may be immersed in an organic solvent.

The organic solvent is not particularly limited as long as the etching mask can be removed, and may be appropriately selected from the above-mentioned solvents (S). In terms of the process after the removal step, the organic solvent is preferably a polar solvent (particularly, a ketone or glycol monoether in the solvent (S)). From the viewpoint of the margin of the removal step, aprotic polar organic solvents such as N-methylformamide, N-dimethylformamide, N-methylformanilide, N-methylacetamide, N-dimethylacetamide, N-methyl-2-pyrrolidone, and dimethylsulfoxide can be more preferably exemplified. These organic solvents may be used in combination of 2 or more.

The temperature of the organic solvent used for the stripping of the etching mask is not particularly limited, and heating may be used to improve the stripping property. The temperature of the organic solvent is, for example, preferably 5 ℃ to 80 ℃, more preferably 10 ℃ to 50 ℃, and further preferably 20 ℃ to 25 ℃ in consideration of the influence on the glass substrate, the metal wiring attached to the glass substrate, or the resin material.

The contact time between the etching mask and the organic solvent is not particularly limited as long as the etching mask can be satisfactorily peeled off. The contact time is, for example, preferably 1 minute to 60 minutes, and more preferably 1 minute to 15 minutes.