阅读说明：本技术 机器人激光器和为了环境收益的真空清洁 (Robotic laser and vacuum cleaning for environmental benefits ) 是由 J·A·波顿 K·D·洪费尔德 于 2020-01-13 设计创作，主要内容包括：本发明涉及机器人激光器和为了环境收益的真空清洁。公开了用于选择性且受控制地从基板外表面(包括基板外表面涂层)的特定区域去除碎屑而对基板外表面没有不利影响并且通过实时将预定轮廓的库与实际基板外表面轮廓进行比较来使包含附连碎屑的实际基板外表面轮廓复原成预定基板外表面轮廓的方法、系统和设备。(The invention relates to a robot laser and vacuum cleaning for environmental benefits. Methods, systems, and apparatus are disclosed for selectively and controllably removing debris from specific areas of a substrate outer surface (including substrate outer surface coatings) without adversely affecting the substrate outer surface and restoring the actual substrate outer surface profile containing the attached debris to the predetermined substrate outer surface profile by comparing a library of predetermined profiles to the actual substrate outer surface profile in real time.)

1. A system (10), the system (10) comprising:

a detector (18) configured to evaluate a characteristic of an actual substrate outer surface (38b) at a specified location on the actual substrate outer surface (38b) of an actual substrate (40a), preferably wherein the detector (18) comprises at least one camera;

a memory (20) comprising characteristics of a predetermined substrate outer surface, said memory being in communication with said detector (18);

a processor (21) configured to retrieve from the memory (20) a characteristic of the predetermined substrate outer surface of a predetermined substrate, the processor (21) in communication with the detector (18) and the memory (20);

at least one controller (16) in communication with said processor (21) and said memory (20);

a positioning mechanism (11, 34) in communication with the controller (16);

an energy source (14) in communication with the controller (16), preferably wherein the energy source (14) comprises a laser;

a vacuum (22, 37) in communication with the controller (16); and is

Wherein the system (10) is configured to remove debris (44) from the actual substrate outer surface (38b) while leaving the actual substrate outer surface (38b) intact.

2. The system (10) in accordance with claim 1, wherein the detector (18) is configured to detect debris (44) located on the actual substrate outer surface (38 b).

3. The system (10) of claim 1, wherein the actual substrate outer surface (38b) further comprises an actual substrate outer surface coating (40 b).

4. The system (10) according to claim 1, wherein the controller (16) is configured to:

controlling the release of a predetermined amount of energy from the energy source (14) for a predetermined duration; and is

Controlling the movement of the positioning mechanism (11, 34).

5. The system (10) of claim 1, wherein the system (10) is configured to direct a predetermined amount of energy to a predetermined location on the actual substrate outer surface (38 b).

6. The system (10) of claim 1, wherein the processor (21) is configured to compare the characteristic of the actual substrate outer surface (38b) to the characteristic of the predetermined substrate outer surface.

7. The system (10) according to any one of claims 1 to 6, wherein the actual substrate outer surface (38b) includes a hybrid layer flow control surface including a plurality of micropores (50).

8. A method (100), the method (100) comprising the steps of:

determining (102) an amount of debris (44) at a particular substrate outer surface location on the substrate outer surface (38 b);

determining (103) an amount of energy required to shed the debris (44) from the particular substrate outer surface location of the substrate outer surface (38 b);

activating (104) an energy source (14);

directing the amount of energy from the energy source (14) to the amount of debris (44) at the particular substrate outer surface location; and is

Causing the amount of debris (44) to be dislodged (106) from the particular substrate outer surface location of the substrate outer surface (38b) to form an amount of dislodged debris.

9. The method (100, 110) of claim 8, the step of determining (102) debris on the substrate outer surface (38b) further comprising the steps of:

acquiring (111) a predetermined substrate outer surface profile;

reading (112) an actual substrate outer surface profile for the particular substrate outer surface location; and is

Comparing (113) the predetermined substrate exterior surface profile for the particular substrate exterior surface location with the actual substrate exterior surface profile for the particular substrate exterior surface location.

10. The method (100) of claim 8 or 9, further comprising, after the step of dislodging the amount of debris (44) from the substrate outer surface (38b), the step of (100):

-suctioning (107) the dislodged debris from the substrate outer surface.

Technical Field

The present disclosure relates generally to the field of restoring a surface profile to an original profile. More particularly, the present disclosure relates to restoring the performance of a substrate surface by restoring the performance of the substrate surface profile (including removing debris from the substrate surface).

Background

Certain substrate surfaces are created to provide a substrate surface having a designed profile that can impart predetermined characteristics to the substrate surface, such as a laminar flow of another material over the substrate surface. Laminar flow is important to the substrate surface in reducing the amount of drag on the substrate surface and otherwise establishing the efficiency with which a substance can contact and bypass the substrate surface. Substances such as, for example, air present in an air stream can adversely affect the efficiency of large objects designed to move through the air. For example, when a large object, such as, for example, an aircraft, includes an exterior surface having a significantly large exterior surface area, any change from an original (e.g., new or "as-manufactured") or "clean" exterior surface substrate profile to a "dirty" exterior substrate surface profile can result in a reduction in aircraft performance and/or maneuverability, and can also affect factors such as, for example, aircraft fuel efficiency.

Deviations from the original profile of the aircraft substrate surface can be caused by factors during use, including, for example, damage caused by object impact during flight and even small amounts of atmospheric debris (e.g., dust, dirt, etc.) that can accumulate on the outer substrate surface. In addition, Hybrid Laminar Flow Control (HLFC) technology has been employed to increase fuel efficiency by advantageously modifying or improving the laminar flow surface of an aircraft. HLFC surfaces, such as, for example, the front portion (e.g., leading edge region, etc.) of an aircraft wing, may include surfaces that are penetrated by a large number (e.g., up to and including millions, etc.) of micro-perforations or "holes" having micron-scale diameters. A predetermined portion of the airflow over such surfaces passes through the perforations such that the airflow over the controllable surface (e.g., airfoil surface, etc.) becomes laminar rather than turbulent. Over time during service, such micropores may become filled with debris or otherwise clogged. These perforations may also beneficially utilize hot air blown through such perforations (e.g., from engine operation, etc.) prior to takeoff, during takeoff, and during landing, thereby potentially reducing the need for manual anti-icing operations in cold weather.

To improve aircraft efficiency, the outer substrate surface of an aircraft, including the HLFC surface, which may include perforations, is often cleaned or otherwise maintained at random or periodic intervals. Such cleaning methods include applying a quantity of liquid including water, solvent, and water mixed with a quantity of solvent. This method is time consuming and inefficient; for example, large amounts of waste water and other waste are produced.

In addition, conventional cleaning methods also fail to reliably remove debris from substrate surfaces, particularly surfaces containing relatively small depressions, including HLFC surfaces that may include perforations. That is, while the exterior substrate surface of an aircraft may appear "clean" after being subjected to a cleaning protocol designed to achieve a cleaner laminar surface, such aircraft exterior surfaces may retain a certain amount of adhering debris that may or may not be visible to the naked eye and that may still adversely affect, for example, the desired laminar flow at the exterior substrate surface of the aircraft.

Disclosure of Invention

According to one aspect of the invention, a system for removing debris from an outer surface of a substrate without adversely affecting the outer surface of the substrate is disclosed, the system comprising: a detector for evaluating a characteristic of an actual substrate outer surface of a substrate at a specified location on the actual substrate outer surface; a memory including a characteristic of a predetermined substrate outer surface; a processor for retrieving from the memory a characteristic of a predetermined substrate exterior surface of a predetermined substrate, wherein the detector is in communication with the processor, and wherein the processor is configured to compare the characteristic of the actual substrate exterior surface to the characteristic of the predetermined substrate exterior surface.

The system also includes at least one controller, wherein the controller is in communication with the processor and the memory. A positioning mechanism is in communication with the controller and an energy source is in communication with the controller. The system also includes a vacuum in communication with the controller, wherein the system removes debris from the actual substrate outer surface without damage.

According to another aspect, a method is disclosed, comprising the steps of: determining that an amount of debris is present at a particular substrate outer surface location on the substrate outer surface; determining an amount of energy required to cause the debris to fall off the particular substrate surface location of the substrate outer surface; starting an energy source; directing the amount of energy from the energy source to the debris at the particular substrate outer surface location; and causing the debris to fall off of the particular substrate outer surface location of the substrate outer surface to form an amount of fallen debris.

In another aspect, a method is disclosed, the method further comprising the steps of: acquiring the outline of the outer surface of a preset substrate; reading an actual substrate outer surface profile for the particular substrate outer surface location; and comparing the predetermined substrate outer surface profile for the particular substrate outer surface location with the actual substrate outer surface profile for the particular substrate outer surface location.

In another aspect, a method further includes removing shedding debris from the substrate outer surface.

In other aspects, a method further comprises suctioning the dislodged debris from the substrate outer surface.

In another aspect, a method further includes processing the actual substrate outer surface profile to restore the actual substrate outer surface profile to closely approximate the predetermined substrate outer surface profile.

In another aspect, the present application discloses a method of removing debris from a substrate outer surface coating, the method comprising effecting such removal without adversely affecting said substrate outer surface coating, said method comprising the steps of: obtaining a predetermined substrate outer surface profile from a substrate outer surface profile memory; reading an actual substrate outer surface profile at a particular substrate outer surface location; comparing the predetermined substrate outer surface profile for the particular substrate outer surface location to the actual substrate outer surface profile for the particular substrate outer surface location; determining that debris is present at a particular substrate outer surface location on a substrate outer surface coating, wherein the substrate outer surface coating comprises an outer surface coating thickness; determining an amount of energy required to remove the debris from the particular substrate outer surface location of the substrate outer surface coating; starting an energy source; directing the amount of energy from the energy source to the debris at the particular substrate outer surface location; releasing the debris from the particular substrate outer surface location of the substrate outer surface coating to form an amount of released debris; and removing the particulate debris from the substrate outer surface coating.

The features, functions, and advantages that have been discussed can be achieved independently in various aspects or may be combined in yet other aspects, further details of which can be seen with reference to the following description and drawings.

Drawings

Having thus described the disclosed variations in general terms, reference will now be made to the accompanying drawings, which are not necessarily drawn to scale, and wherein:

FIG. 1 is a block diagram illustrating an aspect of the present disclosure;

FIG. 2 is an illustration of an aspect of the present disclosure;

FIG. 3 is an illustration of an aspect of the present disclosure;

FIG. 4 is an illustration of an aspect of the present disclosure;

fig. 5A, 5B, and 5C are cross-sectional illustrations of an outer surface of a substrate being stepwise processed, in accordance with aspects of the present disclosure;

FIG. 5D is an enlarged cross-sectional view of the outer surface of the substrate shown in FIGS. 5A, 5B and 5C;

fig. 6A, 6B, and 6C are illustrations of an outer surface of a substrate being step-wise processed, according to aspects of the present disclosure;

fig. 6D, 6E, and 6F are enlarged illustrations of the substrate shown in fig. 6A, 6B, and 6C;

FIG. 6G is an illustration of an enlarged cross-sectional view of at least the outer surface of the substrate shown in FIG. 6F;

FIG. 7 is a block diagram summarizing methods according to some aspects of the present disclosure;

FIG. 8 is a block diagram summarizing methods according to some aspects of the present disclosure; and

fig. 9 is a block diagram summarizing approaches according to some aspects of the present disclosure.

Detailed Description

According to some aspects of the present invention, systems, methods, and apparatus are disclosed for accurately detecting the presence of an amount of debris at specific and predetermined locations on an outer surface of a substrate, determining the energy required to remove the debris, and removing the detected debris from the outer surface of the substrate at the precise and specific locations when the presence of debris is detected at those locations. According to the present disclosure, the substrate outer surface may be a surface important for laminar flow. The outer substrate surface is contemplated to have an original, manufactured substrate outer surface profile (equivalently referred to herein as a "predetermined substrate outer surface profile" or "predetermined profile") that is specific to a particular part or a particular location on a particular component. The disclosed methods, systems, and apparatus evaluate the condition of an actual substrate outer surface profile at a particular location along the part or component outer surface.

A predetermined substrate exterior surface profile for a corresponding region of the part or component exterior surface is obtained from a library (equivalently referred to as "memory" or "storage") and the obtained predetermined substrate exterior surface profile is then compared to the actual substrate exterior surface profile. When the system and apparatus of the present invention detects a difference between the actual substrate outer surface profile and the ideal substrate outer surface profile, the detected difference indicates that the actual substrate outer surface contains a significant amount of debris at the precise location on the substrate outer surface. According to some aspects of the present invention, the methods, systems, and apparatus of the present invention detect the presence of debris, the amount of debris detected, and the specific location of the detected debris to be removed from a specific area of the substrate outer surface.

According to other aspects, the methods, systems, and apparatus of the present invention also determine the energy that needs to be applied to the outer surface of the substrate to break debris off of the actual outer surface of the substrate. The system and apparatus of the present invention includes an energy source that is activated. An integrated controller controls and/or directs a predetermined energy (the energy determined by the system and apparatus of the present invention to remove or break off detected debris) from the energy source to the area of the substrate outer surface containing detected debris. When the predetermined energy from the energy source is absorbed by the debris, the debris is dislodged from the outer surface of the substrate.

According to some aspects of the invention, the substrate outer surface may include one or more outer surface coatings, for example, these coatings may include an outer coating. In these cases, the coating or coatings present on the substrate, together with the substrate, form the basis of the outer surface profile of the substrate, according to some aspects of the invention. The method, system and apparatus of the present invention selectively shed debris present on the outermost substrate surface to restore the actual substrate outer surface profile to the predetermined substrate outer surface profile. That is, when an overcoat or other coating is present on the outer substrate surface, in the methods, systems, and apparatus described herein, during retrieval of a known and predetermined substrate outer surface profile from memory, the systems, methods, and apparatus of the present invention identify and account for the presence of the coating such that only debris is dislodged and removed from the substrate outer surface (no coating is disturbed or removed).

Where HLFC surfaces and HLFC features are present on the substrate exterior surface (e.g., HLFC features include notches, recesses, holes, etc.), the terms "substrate exterior surface" and "substrate exterior surface profile" include these HLFC features, including where the HLFC features extend a distance or depth into the substrate exterior surface, in accordance with some aspects of the present invention. In such situations where it is desired to remove debris from the HLFC features present on the external surface of the substrate, the predetermined substrate external surface profile for the corresponding region of the part or component external surface comprises HLFC features in a profile stored in memory, the profile stored in memory is retrieved in accordance with the systems, methods and apparatus of the present invention. The obtained predetermined substrate outer surface profile is then compared with the actual substrate outer surface profile. It is presently recognized that removing debris from HLFC features (e.g., HLFC "holes") may require applying different amounts and intensities of energy to the HLFC features to dislodge the debris from these HLFC features. According to some aspects of the present invention, the system of the present invention detects debris at the location of the HLFC feature and the energy required to shed debris from the HLFC feature is directed to the HLFC feature to shed the detected debris, thereby restoring the actual substrate outer surface profile to closely match the predetermined substrate outer surface profile without adversely affecting the substrate outer surface, which may include an overcoat or other coating.

According to the present systems, apparatus, and methods, the term "restoring the actual substrate outer surface profile to the predetermined substrate outer surface profile" means that the predetermined substrate outer surface profile and the actual substrate outer surface profile are the same, substantially the same, or sufficiently close within measurement tolerances that the laminar flow over the actual substrate outer surface in an actual state (actual laminar flow) is very close to the laminar flow over the predetermined substrate outer surface (predetermined laminar flow). More specifically, while not being bound by a particular theory, according to some aspects of the present invention, the "complete" or "substantially complete" removal of debris from the substrate occurs when the identified ideal substrate surface tolerance is re-established. Such surface tolerances may include the actual substrate surface profile reverting to the predetermined substrate surface profile within about +/-0.030 inches. With the ideal laminar flow to the processed substrate surface re-established, in accordance with some aspects of the present invention, the debris removal systems, methods, and apparatus of the present invention are said to "completely" or "substantially completely" remove debris from HLFC features (e.g., HLFC openings, recesses, notches, holes, etc.) when the detected debris is removed from at least about 85% of the HLFC features.

The apparatus, system and method of the present invention detect anomalies on the surface of a part by utilizing known and stored parameters and schematics of the object's exterior surface characteristics, including the substrate's exterior surface profile of the object, by acquiring stored information about a particular part or a particular surface location on a part and forwarding this information to sensors, controllers and/or other system components to compare such stored surface characteristic information, preferably in real time, to an estimated actual substrate exterior surface profile of the same part type or the same location on the same part type. The detected difference (e.g., deviation, etc.) between the predetermined exterior surface characteristic and the actual exterior surface characteristic is equivalent to the presence of debris that is attached, affixed, contained, or otherwise present and present on the actual part exterior surface. Such part outer surface, including the detected debris, is then identified by the apparatus, system, and method of the present invention in real time as requiring processing and debris removal to restore the optimal outer surface profile of the part surface (e.g., such that the processed area of the part-the substrate outer surface of the part-will again closely match the predetermined substrate outer surface profile of the particular part being evaluated at each particular location being evaluated on the substrate outer surface, etc.).

Some aspects of the present invention contemplate accurately positioning the disclosed detection systems and apparatus at a particular location (e.g., a particular location on a particular part or component) relative to an actual particular location on a particular substrate type and enabling real-time image processing based on the requirements and feedback of the characteristics of the actual particular substrate exterior surface at the exact location on the actual substrate exterior surface. The processor and memory in communication with each other of the systems and devices according to the present invention substantially simultaneously (e.g., in real time) estimate and transfer information (e.g., values) regarding surface characteristics of a predetermined or "stored" particular substrate type corresponding to the same location on a predetermined substrate. This information about the properties and values corresponds to unused, "new" parts and parts surfaces, which are then in a "clean" (to be "debris-free") state.

The system and apparatus of the present invention compares the surface property values at the same location on both the actual substrate outer surface and the predetermined substrate outer surface. If the values are different, it is determined that debris is present on the actual substrate outer surface. Accurate positioning, real-time comparison of desired or predetermined values to actual values, and debris detection is followed by automatic selection of the intensity, wavelength, and dwell time of the energy subsequently emitted from the integrated energy source and directed to reside on the outer surface of the substrate. That is, according to some aspects of the present invention, the systems, methods, and apparatus of the present invention also determine, in real-time, an amount of energy required to be directed from an energy source and to a substrate surface (e.g., including HLFC features located on an evaluated substrate outer surface) in order to remove detected debris from the substrate outer surface.

FIG. 1 illustrates a non-limiting representation of a system according to an aspect of the present disclosure. As shown in fig. 1, a system 10 for removing debris from an outer surface of a substrate includes a debris removal device 12 in communication with a positioning mechanism 11. The positioning mechanism 11 may be an automated and/or robotic mechanism that is responsive to signals from a positioning program that may be programmed to move the debris removal device 12, and thus the system 10, relative to a substrate having an outer surface of the substrate. The system 10 may include a housing or other structure (not shown) for housing and positioning the debris removal device 12.

The debris removal device 12 includes an energy source 14 capable of emitting a predetermined amount of energy. The energy source 14 may be a laser or other energy source that emits an energy beam such as energy beam 42 (shown in fig. 5A-5C, 6A, and 6B) that may be directed from the energy source to a target such as, for example, a substrate outer surface (such as upper wing outer surface 38B shown in fig. 5A-6C). Aspects of the present invention contemplate various lasers and laser assemblies capable of generating, emitting, and directing an energy beam having an intensity in a range of about 9W to about 2kW (2000W) to an outer surface of a substrate. An energy beam within this range is selected and directed to a volume of debris on the outer surface of the substrate to sublimate, ablate, and/or otherwise remove a predetermined amount of debris in the outer surface of the substrate. According to other aspects, the energy may be increased if the selected energy does not completely shed a detected amount of debris, or the debris removal device may be repeatedly directed over the debris as needed to effect debris removal.

According to other aspects, the amount of energy provided (e.g., the intensity of the emitted energy beam in concert with the emitted energy beam and the duration or "dwell time" of the emitted energy, etc.) is selected to cause the shedding and/or removal of the amount of debris found to be present on the substrate outer surface without adversely affecting the substrate outer surface, including any substrate outer surface coating that may be present on the substrate outer surface. The debris removal device 12 also includes at least one controller 16 in communication with the energy source 14 and the positioning mechanism 11. The controller 16 may control the activation of the energy source 14, and the controller 16 may also control the movement and intensity of the energy beam emitted from the energy source 14. The controller 16 may be manually operated or may be remotely signaled to operate by means of a unit (not shown) capable of sending signals from the unit to the controller 16 via, for example, a wireless communication link or the like.

The debris removal device 12 also includes at least one detector 18, the detector 18 being capable of detecting the amount and location of debris present on the outer surface of the substrate. The detector 18 may be in communication with a computer (not shown) or may itself contain a microprocessor (e.g., a microprocessor in memory with predetermined substrate outer surface characteristics or in communication with memory, etc.) and estimate the presence of debris, and may estimate the actual contour of the substrate outer surface with the aid of a camera or other photographic device, an X-ray device, etc., and may form a digital or digitized image that may be a 3D image of the actual contour of the substrate outer surface. In particular embodiments, detector 18 includes at least one camera. The detector 18 can also record, construct, or transmit the estimated substrate outer surface actual profile with the substrate outer surface actual profile values to the memory 20 or other information storage device for comparison of the estimated substrate outer surface actual profile and the actual substrate outer surface profile values to predetermined or "stored" substrate outer surface profiles that can be retrieved from the memory 20 (e.g., library, electronic catalog, electronic storage, etc.); wherein the memory 20 provides known and specific predetermined substrate outer surface profiles for known predetermined locations on the substrate outer surfaces, and wherein the predetermined substrate outer surface profiles have predetermined substrate outer surface profile values. In one or more embodiments, the contour of the predetermined substrate outer surface includes at least one depression in the contour of the predetermined substrate outer surface.

In other aspects, the system 10 further includes a processor 21, and the processor 21, alone or with the memory 20, may also be located remotely from the system 10. The memory 20 may itself comprise a processor, or as shown in FIG. 1, the processor 21 and memory 20 may be in communication with the system 10 and integrated into the system 10. In summary, the detector 18, processor 21, memory 20, and controller 16 may be in communication to transmit and/or receive information regarding the actual substrate surface profile, the read or acquired predetermined substrate surface profile, the difference between the actual substrate surface profile and the predetermined substrate surface profile, etc., and also determine a total amount of energy required to shed debris, including an amount of energy required to shed debris from a location on the substrate outer surface (e.g., "total energy" includes an amount and intensity of energy released from the energy source 14 and directed to the substrate surface in conjunction with the debris removal device 12 and the dwell time of the energy beam from the energy source 14 directed to a particular substrate outer surface).

According to other aspects, when the detector 18 senses and otherwise estimates the actual substrate outer surface profile and the processor 21 and memory 20 determine (e.g., detect, sense, etc.) the difference between the actual substrate outer surface profile and the predetermined substrate outer surface profile, the controller 16 is signaled to activate and control the energy source 14 substantially in real time and on demand. As shown in fig. 1, the system 10 also optionally includes an integrated vacuum 22, but according to alternative aspects, the vacuum 22 may be located remotely from the system 10 and operate independently of the system 10. The terms "vacuum" and "suction" include any device and positioning of the device capable of creating a pressure gradient at the outer surface of the substrate in order to remove debris and debris particles from the outer surface of the substrate.

Figures 2, 3 and 4 illustrate the apparatus, method and system of the present invention for dislodging and removing debris from an object in order to detect debris on the actual contour of the outer surface of the substrate and then dislodging and removing this debris in order to restore the outer surface of the substrate to more closely approximate or in fact match the predetermined contour of the outer surface of the substrate. As shown, in a non-limiting manner, in fig. 2, the object is an aircraft 30 having a fuselage portion 31. A plurality of debris removal devices 32 are shown, wherein each debris removal device 32 is attached to or otherwise in communication with a robotic arm 34, wherein both the robotic arm 34 and the debris removal device are in communication with a power cord 35. The debris removal device 32 is an example of the debris removal device 12 (shown in fig. 1), and the robot arm 34 is an example of the positioning mechanism 11 (shown in fig. 1).

As shown in fig. 2, the robot arm 34 includes a portion that is extendable or retractable, or the like. Mechanical arm 34 may be any mechanical device that is movable in response to actuation of the mechanical device. According to some aspects of the present invention, the methods, systems, and apparatus may be automated such that the control and movement of robotic arm 34 may be automated such that, for example, robotic arm 34 includes, without limitation, an "arm" of a robot, a "hand" of a robot, and the like. In addition, the debris removal device itself and the energy source itself may be automatically controlled by means of the incorporated robot and robotic device.

As further shown in fig. 2, the operator compartment 33 is sized to accommodate an operator, and is further in communication with the debris removal device 32 and operable to guide movement and position of the debris removal device 32 relative to a substrate outer surface 36 present on the aircraft 30. Fig. 2 also shows a vacuum hose 37, the vacuum hose 37 being proximate the debris removal device 32 and proximate the substrate outer surface 36 when the debris removal device 32 is directed to a position proximate the substrate outer surface 36. Vacuum hose 37 is an example of vacuum 22 (shown in FIG. 1). As shown in fig. 2, the debris removal device 32 is shown attached to a fixed position mechanism that can be manually or automatically operated or even remotely operated to position the debris removal device 32 proximate to various regions along the fuselage portion 31. The system and device shown in fig. 2 may implement the system and device shown in fig. 1.

According to some aspects of the present invention, although not shown in FIG. 2, the debris removal device may be positioned relative to or proximate to the substrate surface outer surface by any mechanical positioning device capable of accurately positioning and precisely locating the debris removal device in a particular location so as to scan the substrate outer surface to detect the presence of debris on the substrate outer surface. According to other aspects, the positioning mechanism for moving and precisely positioning the integrated apparatus and the means for precisely manipulating and positioning the debris removal device relative to the outer surface of the substrate can include, without limitation, robots and other automated devices that can be controlled in situ or can be controlled remotely using, for example, wireless technology and other technologies including the use of hardware and software necessary to operate the positioning mechanism.

Such mechanical positioning devices may also include, for example, robots or other objects that can be directed to a particular location with a desired amount of precision and that can be operated remotely and/or automatically, and that can be operated and directed using robots (e.g., fully automated systems). These objects may include, for example, one or more Global Positioning Systems (GPS) that cooperate with locators that may, for example, be incorporated into the object in an area targeted for debris removal.

As described herein, to restore the actual substrate outer surface profile to the desired predetermined substrate outer surface profile, the substrate outer surface is first scanned to evaluate and confirm whether the scanned substrate outer surface profile matches or sufficiently approximates the known stored predetermined substrate outer surface profile. The debris removal device of the present disclosure includes scanning, sensing, etc. functions that compare the actual substrate outer surface profile to a predetermined substrate outer surface profile. If a difference between the actual profile and the predetermined profile is detected, the difference confirms the presence of unwanted debris on the outer surface of the substrate. If debris is detected on the substrate outer surface, an energy source integrated into or located proximate to and in communication with the debris removal device is engaged or activated, and a predetermined amount of energy is directed from the energy source to the substrate outer surface in a predetermined amount sufficient to dislodge the detected debris from the substrate outer surface.

According to an aspect of the invention, the integrated vacuum assembly may include the components required to generate the negative pressure, including, for example, motors, hoses, pump housings, components, etc. that typically participate in the vacuum assembly. A vacuum assembly (such as the vacuum 22 shown in fig. 1 and/or the vacuum hose shown in fig. 2-4) is activated during the chip dislodging/removal process to provide a sub-atmospheric region adjacent the outer surface of the substrate where the chips are detected. When the debris is dislodged/removed from the substrate outer surface, the debris will leave the substrate outer surface in the form of particulate debris, flakes of debris (referred to herein equivalently collectively as "particulate debris" or "particles"), etc., and the particulate debris is then drawn into the airflow (which moves in one direction into the open end of the vacuum hose) under the vacuum created by the negative pressure of the vacuum. Particulate debris is directed into the vacuum hose 37 away from both the substrate outer surface and the ambient environment (e.g., including the area and environment immediately adjacent the substrate outer surface, etc.). According to some aspects of the present invention, the inclusion of a vacuum in the systems, apparatus and methods of the present invention ensures that unwanted debris dislodged from the substrate outer surface (e.g., by application of a predetermined amount of energy from an energy source, etc.) will not re-settle or otherwise become re-deposited on the substrate outer surface.

The systems, apparatus and methods of the present invention efficiently and selectively remove a predetermined amount of debris from a particular region of a substrate outer surface of an outer surface of a large object and vehicle (e.g., aircraft, spacecraft, rotorcraft, etc.). According to some aspects of the present invention, the ability to avoid redeposition of debris on the outer surface of a substrate, including for example, a laminar surface of an aircraft, is particularly desirable. Additionally, by applying a vacuum in the area where debris is removed, aspects of the present invention avoid redepositing dislodged debris as well as particulate debris in substrate outer surface depressions (e.g., pitot tube holes, seams, depressions, HLFC features, etc.). Thus, the presently disclosed methods and systems help avoid problems that may otherwise arise if debris dislodged from a clean surface is redeposited in or on critical instrumentation, which could affect, for example, the correct airspeed reading of an aircraft in flight (e.g., from a clogged or plugged pitot tube, a clogged or plugged static pressure port, etc.).

Additionally, in accordance with some aspects of the present invention, where the HLFC features affect the establishment or improvement of laminar flow over the surface, the presence of particulate debris that will fall off from areas proximate to the area of the substrate outer surface is eliminated (the debris has fallen off and been removed from the substrate outer surface), which eliminates or improves the risk of the particulate debris re-settling or otherwise becoming deposited on and within the surface structure (which can contaminate or re-clog the HLFC features (e.g., HLFC pores) and interfere with the performance of components and parts, including, for example, the HLFC features in the substrate outer surface).

Fig. 3 and 4 illustrate another portion of the aircraft 30, showing the wings 38 attached to the fuselage portion 31. As shown in fig. 3, in a non-limiting manner, the debris removal device 32 is now attached to a unit 39 in communication with the robotic arm 34. The power cord 35 is shown in communication with the debris removal device 32 and the unit 39, and the vacuum assembly including the vacuum hose 37 is integrated into the unit 39. According to other aspects, even if the vacuum system is provided separately from the unit 39 to the overall debris removal system, a vacuum assembly including the vacuum hose 37 may be provided to and considered part of the debris removal system. In fig. 3, the debris removal device 32 is shown positioned proximate a portion or area of the lower wing outer surface 38 a.

FIG. 4 shows the robotic arm 34 now extending from the unit 39 to a position to facilitate positioning and positioning the debris removal device 32 proximate to a portion or area of the upper wing outer surface 38 b. The systems and devices shown in fig. 1 and 2 may implement the systems and devices shown in fig. 3 and 4.

Fig. 5A, 5B, and 5C show non-limiting cross-sectional views of upper airfoil outer surface 38B of airfoil 38 (shown in fig. 3 and 4). Fig. 5A, 5B and 5C show an upper airfoil outer surface including an airfoil substrate 40a, on which an organic airfoil coating 40B is deposited. FIG. 5D illustrates an enlarged cross-sectional view of upper wing outer surface area 40 (shown in FIG. 5A) of upper wing outer surface 38 b. According to some aspects of the invention, as shown in detail in FIG. 5D, the wing coating 40b forms an upper wing outer surface 38b with the wing substrate 40 a.

FIG. 5A illustrates the presence of an amount of debris 44 near the leading edge of the upper airfoil outer surface 38 b. According to some aspects of the present invention, the system, method, and apparatus of the present invention are employed to scan (not shown) the outer surface of an upper wing and determine the presence of debris 44, where the debris 44 is likely to be invisible to the human eye. However, the amount of invisible debris present on the outer surface of the upper wing and detected by the systems and methods of the present invention may adversely affect laminar flow (e.g., in terms of increased "drag" and increased fuel consumption of the aircraft in flight, etc.). An energy source (such as the energy source 14 shown in fig. 1) within the debris removal device 32 or in communication with the debris removal device 32 has been activated and emits a predetermined amount of energy at a predetermined intensity from the debris removal device 32 and directs the energy to the upper airfoil outer surface 38b having a quantity of debris 44 attached thereto. The emitted energy is shown as energy beam 42 by a series of dashed lines extending from the debris removal device 32 to the upper airfoil outer surface 38 b. The vacuum hose 37 is shown positioned proximate the debris removal device 32 and the upper wing outer surface 38b and a quantity of debris 44 attached to the upper wing outer surface 38 b.

As shown in fig. 5B, sufficient energy has been directed to the debris 44 attached to the upper wing outer surface 38B to form debris particles 44 a. When the debris particles become dislodged from the upper wing outer surface 38b, the formed debris particles 44a leave the upper wing outer surface 38b or are loosened to the extent deemed to have "sloughed off or" broken off "from the upper wing outer surface 38b without interfering with the overall or desired profile of the upper wing outer surface. As shown in fig. 5B, as the debris particles fall off (or, if desired, before the debris particles fall off), the system of the present invention activates the vacuum to create a pressure gradient in the vicinity of the debris particles 44a that fall off the outer surface of the upper wing such that the debris particles are directed toward and into the vacuum hose 37. This process continues until no debris 44 or debris particles 44a remain near the upper airfoil outer surface 38b, as shown in fig. 5C. At the completion of the debris removal process, the actual profile of the upper wing outer surface has reverted to very closely or completely matching the predetermined profile of the upper wing outer surface because the debris is completely removed. According to some aspects of the present disclosure, a post-process scan of the processed upper wing outer surface may be performed to ensure debris is removed without any undesirable effects or damage to the upper wing outer surface (e.g., substrate outer surface).

Although not visible in fig. 5A, 5B, and 5C, upper wing outer surface 38B includes a plurality of HLFC holes (shown as HLFC holes 50 in the enlarged views of fig. 6D, 6E, 6F, 6G) extending from upper wing outer surface 38B and through the substrate (e.g., upper wing outer surface 38B), wherein the holes are bounded by the substrate such that the substrate forms walls of the HLFC holes. The systems and devices shown in fig. 5A, 5B, 5C, and 5D may implement the systems and devices shown in fig. 3 and 4.

Fig. 6A, 6B, and 6C show non-limiting top views of upper wing outer surface 38B, and also illustrate the step-wise process performed and shown in fig. 5A, 5B, and 5C, respectively. As shown in fig. 6A, 6B, and 6C, according to some aspects of the invention, the debris removal device 32 may be moved to a plurality of positions and locations (e.g., in the direction indicated by arrow "a" in fig. 6A) during and throughout the process of emitting energy in response to a signal sent to the debris removal device from, for example, a controller. That is, when debris is detected at a particular location on the outer surface of the substrate, the energy source is activated to release and direct a predetermined amount of energy required to shed the detected debris. During the release of this energy, the debris removal device itself may move or may remain stationary during the release of the energy, and the emitted energy beam may be directed to move to the particular location desired, so long as a sufficient amount of energy (calculated by the system to break the debris) is applied to the debris so that it breaks off or is removed.

The contour of the substrate outer surface 38b is configured to promote laminar flow over the substrate outer surface 38 b. Fig. 6D, 6E, and 6F are enlarged views of the upper wing outer surface 38B shown in fig. 6A, 6B, and 6C. As shown in fig. 6D, the upper airfoil outer surface 38b includes a hybrid laminar flow control surface. The hybrid layer flow control surface includes a plurality of micropores 50. In this embodiment, upper wing outer surface 38b includes a plurality of HLFC holes 50, which HLFC holes 50 extend a desired distance from upper wing outer surface 38b into wing 38 and, if desired, through the substrate material of wing 38. The HLFC aperture 50 (also equivalently referred to herein as a "micro-aperture" or "HLFC micro-aperture") may extend through a substrate material (e.g., a wing substrate material), with the HLFC aperture 50 being bounded by the wing substrate material.

FIG. 6G is an enlarged cross-sectional view of upper wing outer surface 38 b. FIG. 6G illustrates an enlarged cross-sectional view of upper airfoil outer surface 38b as shown in FIG. 6F and taken across line 6G-6G. According to some aspects of the invention, as shown in detail in fig. 6G, the wing coating 40b forms an upper wing outer surface 38b with the wing substrate 40 a.

As shown in fig. 6G, the HLFC orifice 50 includes a first opening 50a at the upper airfoil outer surface 38b and a second opening 50b at the inner surface of the airfoil substrate 40a, wherein the orifice is "tunneled" through the substrate from the first opening 50a to the second opening 50b (e.g., extending from the first opening to the second opening, and wherein the substrate serves as a wall or the like that defines a boundary of the "tunneled" orifice). The diameter of the HLFC pores may range from about 50 μm to about 100 μm. As shown in fig. 6D, the HLFC pores 50 may accumulate or otherwise contain and/or collect a quantity of debris 44, where the debris 44 is shown "plugging" the openings of the HLFC pores 50 at the upper airfoil outer surface 38 b.

As shown in fig. 6D, 6E, and 6F, the substrate outer surface is illustrated as a representative upper wing outer surface 38 b. Detection of debris is accomplished by a detector, such as detector 18 (shown in FIG. 1), which compares feedback from a particular location on the actual wing surface profile to predetermined substrate outer surface profile values for the same wing component "type" that are obtained from a memory that contains these categorized predetermined substrate outer surface profiles. Once the presence of debris is confirmed as being present at or inside the HLFC aperture, the energy source 14 (shown in fig. 1) within or in communication with the debris removal device 32 (e.g., as shown in fig. 6A and 6B) is activated and emits a predetermined amount of energy at a predetermined intensity from the debris removal device 32 and directed to the upper wing outer surface 38B, where the amount of debris 44 is attached to the upper wing outer surface 38B at the HLFC aperture 50. As described above and shown in fig. 6A and 6B, the emitted energy is shown as energy beam 42 by a series of dashed lines extending from the debris removal device 32 to the upper airfoil outer surface 38B. The vacuum hose 37 is shown positioned proximate the debris removal device 32 and the upper wing outer surface 38b and a quantity of attached debris 44.

As shown in fig. 6E, sufficient energy has been directed to the debris 44 on the upper wing outer surface 38b at the HLFC holes 50 to form debris particles 44a that have fallen out of the HLFC holes 50. As the debris particles 44a become dislodged from the HLFC holes 50 in the upper wing outer surface 38b, the debris particles 44a either leave the HLFC holes 50 in the upper wing outer surface 38b or are loosened to the extent deemed to "fall off" or "break away" from the upper wing outer surface 38b without interfering with the overall or desired profile of the upper wing outer surface 38 b. As shown in fig. 6E, as the debris particles become dislodged (or, if desired, before the debris particles become dislodged), the system of the present invention activates the vacuum to create a pressure gradient near the dislodged debris particles 44 a. As shown in fig. 6F, the debris particles 44a exit the surface of the upper wing outer surface 38b and there are no more debris particles 44a that have been removed from the HLFC holes 50 of the upper wing outer surface 38b and directed into the vacuum hose 37 toward the vacuum hose 37. Fig. 6A-6F may implement the systems, methods, and apparatus shown in fig. 1, 2, 3, 4, 5A, 5B, 5C, and 5D.

According to other aspects, the substrate outer surface can be monitored in real time during energy release, and once debris is dislodged, emission of energy from the debris removal device can be terminated. The debris removal device 32 may remain in a substantially fixed position or may be moved to a desired distance from the outer surface of the substrate while it is moved to a new position relative to the outer surface of the substrate (e.g., in a scan-like manner in response to a signal from a processor to a controller or the like in communication with the debris removal device). The movement control of the debris removal device and the "dwell time" control over the location of the outer surface of the particular substrate (in cooperation with the amount of energy released from the debris removal device) can be calculated to deliver the amount of energy required to dislodge the undesirable debris from the location of the outer surface of the particular substrate without any undesirable effect on or damage to the outer surface of the substrate. That is, according to some aspects of the present invention, the system may be activated and energy release initiated only when debris is detected. In other words, according to some aspects of the present invention, the system of the present invention will not be activated in the absence of detected debris. Additionally, the energy release may be terminated once debris removal occurs. When no other debris is detected on the inspected area of the substrate outer surface, no further energy is released from the system or applied to the substrate outer surface.

FIG. 7 is a flow chart illustrating a non-limiting method in accordance with aspects of the invention. As shown in fig. 7, outlining an exemplary method 100, the method 100 includes determining 102 the presence of debris on an outer surface of a substrate, then determining 103 an amount of energy required to shed the detected debris and activating 104 an energy source. The method 100 further includes directing 105 an amount of energy from an energy source toward the substrate outer surface, and then dislodging 106 the detected debris from the substrate outer surface. The outlined method 100 further comprises optionally suctioning 107 debris dislodged from the outer surface of the substrate.

FIG. 8 is a flow chart illustrating a non-limiting method in accordance with aspects of the invention. As shown in FIG. 8, the exemplary method 110 further describes determining whether debris is present on the outer surface of the substrate, in accordance with aspects of the present invention. The method 110 includes obtaining 111 a predetermined substrate exterior surface profile (e.g., obtained from a memory, storage, library, etc. that contains or facilitates obtaining such a predetermined substrate exterior surface profile corresponding to a particular part exterior surface profile or a particular component exterior surface profile), and reading 112 an actual substrate exterior surface profile of a particular part or component exterior surface. The method 110 also includes comparing 113 the predetermined substrate outer surface profile (e.g., the predetermined profile value, etc.) to the actual substrate outer surface profile (e.g., the actual profile value, etc.).

FIG. 9 is a flow chart illustrating a non-limiting method in accordance with aspects of the invention. As shown in fig. 9, an exemplary method 120 includes obtaining 111 a predetermined substrate exterior surface profile (e.g., obtained from a memory, storage, library, etc. that contains or facilitates obtaining such a predetermined substrate exterior surface profile corresponding to a particular part exterior surface or component exterior surface profile), reading 112 an actual substrate exterior surface profile of the particular part or component exterior surface. The method 120 further includes comparing 113 the predetermined substrate outer surface profile (e.g., ideal profile values, etc.) to the actual substrate outer surface profile (e.g., actual profile values, etc.). The outlined method 120 further comprises determining 114 the presence of debris on the substrate outer surface coating, then determining 103 the amount of energy required to shed the detected debris and activating 104 the energy source. The method 120 further includes directing 115 an amount of energy from an energy source to the substrate outer surface coating, then stripping 118 the detected debris from the substrate outer surface coating, removing 122 the debris from the substrate outer surface coating, and optionally restoring 124 the actual substrate outer surface profile to the predetermined substrate outer surface profile. The methods outlined in fig. 7, 8, and 9 may implement the systems and devices shown in fig. 1, 2, 3, 4, 5A, 5B, 5C, 5D, 6A, 6B, and 6C.

In accordance with the present systems, apparatus, and methods, contemplated energy sources, such as energy source 14 (shown in FIG. 1), include, for example, laser systems that may be adapted to generate one or more laser beams as energy beam 42 (FIGS. 5A-5C, 6A, and 6B) with power in the range of about 9W to 2kW, and particularly in the range of about 60W to about 2kW, and further particularly in the range of about 9W to about 95W. Lasers that emit energy in a range of states include, for example, gas lasers, solid-state lasers, semiconductor lasers, and the like. The energy source may also include a wavelength adjuster that allows the wavelength to be adjusted or "tuned" to a desired wavelength in real time. By tuning the wavelength in conjunction with real-time monitoring of the outer surface of the substrate being processed, the systems and methods according to the present invention can cause debris to be dislodged from the outer surface of the substrate without adversely affecting the outer surface of the substrate and any outer surface coatings of the substrate (e.g., paint layer, primer layer, topcoat).

The systems, methods, and apparatus of the present invention may employ software that may include algorithms that determine the maximum and/or minimum energy power selected for a predetermined substrate outer surface and then applied to a corresponding actual substrate outer surface. According to aspects of the invention, a particular region of the outer surface of the substrate to be processed may not be as resistant to a particular energy intensity of the applied energy as another region, or may require more energy to cause debris to be removed (e.g., completely removed, etc.) from the actual outer surface of the substrate to a desired degree, based on the coating of the composition of the outer surface of the substrate. Also, as explained herein, more energy may be required and transferred to remove debris contained in a Hybrid Layer Flow Control (HLFC) recess (including, for example, HLFC holes, etc.) from the region.

According to other aspects, the positioning mechanism for moving the entire apparatus and the means for manipulating and positioning the debris removal device relative to the outer surface of the substrate may include, without limitation, robots and other automated devices that may be controlled in situ or may be controlled remotely using, for example, wireless technology and other techniques including the use of hardware and software necessary to operate the positioning mechanism.

According to other aspects, these larger structures and objects that may comprise the outer surface of the actual substrate to be processed by the methods, systems and apparatus of the present invention may also include, for example and without limitation, manned and unmanned spacecraft, manned and unmanned aircraft, manned and unmanned hovercraft, manned and unmanned rotorcraft, manned and unmanned land vehicles, manned and unmanned surface vessels, manned and unmanned underwater vessels, manned and unmanned satellites, and the like, and combinations thereof.

Additionally, the present disclosure includes examples in accordance with the following clauses:

clause 1. a system, comprising: a detector configured to evaluate a characteristic of an actual substrate outer surface of an actual substrate at a specified location of the actual substrate outer surface; a memory including a characteristic of a predetermined substrate outer surface, the memory in communication with the detector; a processor configured to retrieve from the memory a characteristic of a predetermined substrate exterior surface of a predetermined substrate, the processor in communication with the detector, and the processor in communication with the memory; at least one controller in communication with the processor and in communication with the memory; a positioning mechanism in communication with the controller; an energy source in communication with the controller; a vacuum in communication with the controller; and wherein the system is configured to remove debris from the actual substrate outer surface while leaving the actual substrate outer surface intact.

Clause 2. the system of clause 1, wherein the detector is configured to detect debris located on the actual substrate outer surface.

Clause 3. the system of clause 1 or 2, wherein the actual substrate outer surface further comprises an actual substrate outer surface coating.

Clause 4. the system of any of clauses 1-3, wherein the energy source comprises a laser.

Clause 5. the system of any one of clauses 1-4, wherein the controller is configured to control the release of a predetermined amount of energy from the energy source for a predetermined duration; and wherein the controller is further configured to control movement of the positioning mechanism.

Clause 6. the system of any one of clauses 1-5, wherein the system is configured to direct a predetermined amount of energy to a predetermined location on the actual substrate outer surface.

Clause 7. the system of clause 5 or 6, wherein the predetermined amount of energy is in the range of about 9W to about 2 kW.

Clause 8. the system of any of clauses 1-7, wherein the detector comprises at least one camera.

Clause 9. the system of any one of clauses 1-8, wherein the processor is configured to compare the characteristic of the actual substrate outer surface to the characteristic of the predetermined substrate outer surface.

Clause 10. the system of any one of clauses 1-9, wherein the actual substrate exterior surface comprises a mixed layer flow control surface comprising a plurality of micropores.

Clause 11. the system of any of clauses 1-10, wherein the contour of the actual substrate outer surface is configured to promote laminar flow over the actual substrate outer surface.

Clause 12. the system of any one of clauses 1-12, wherein the predetermined substrate outer surface profile comprises at least one depression in the predetermined substrate outer surface profile.

Clause 13. a method, comprising the steps of: determining an amount of debris at a particular substrate outer surface location on the substrate outer surface; determining an amount of energy required to shed the debris from a particular substrate outer surface location on the substrate outer surface; starting an energy source; directing the amount of energy from the energy source to the amount of debris at the particular substrate outer surface location; and causing the amount of debris to be dislodged from the particular substrate outer surface location of the substrate outer surface to form an amount of dislodged debris.

Clause 14. according to the method of clause 13, the step of determining an amount of debris on the outer surface of the substrate further comprises the steps of: acquiring the outline of the outer surface of a preset substrate; reading an actual substrate outer surface profile for the particular substrate outer surface location; and comparing the predetermined substrate outer surface profile for the particular substrate outer surface location with the actual substrate outer surface profile for the particular substrate outer surface location.

Clause 15. the method of clause 13 or 14, further comprising, after the step of dislodging the quantity of debris from the outer surface of the substrate, the step of: suctioning the dislodged debris from the substrate outer surface.

Clause 16. the method of any one of clauses 13-15, wherein the substrate outer surface comprises a substrate outer surface coating.

Clause 17. the method of any one of clauses 13-16, further comprising the steps of: emitting an amount of energy from the energy source, the amount of energy being in a range of about 9W to 2 kW.

Clause 18. the method of clause 14, further comprising the steps of: determining that debris is present at a particular substrate outer surface location on the substrate outer surface coating; directing the amount of energy from the energy source to the debris at a location outside of the particular substrate; stripping the debris from the substrate outer surface coating at the particular substrate outer surface location; and removing the quantity of particulate debris from the substrate outer surface coating.

Clause 19. according to the method of clause 14 or 18, the step of comparing the predetermined substrate outer surface profile to the actual substrate outer surface profile further comprises the steps of: determining a difference between the actual substrate outer surface profile and the predetermined substrate outer surface profile.

Clause 20. the method of clause 18 or 19, wherein, after the step of removing the quantity of particulate debris from the substrate outer surface coating, the method further comprises the steps of: restoring the actual substrate outer surface profile to an actual substrate outer surface profile value substantially equivalent to the predetermined substrate outer surface profile value.

Clause 21. the method of any of clauses 18-20, wherein the substrate outer surface coating comprises a substrate outer surface coating thickness, and wherein, prior to the step of shedding the debris from the substrate outer surface coating, the substrate outer surface coating thickness remains substantially equal to the substrate outer surface coating thickness after the step of shedding the debris from the substrate outer surface coating.

Clause 22. a method, comprising the steps of: obtaining a predetermined substrate outer surface profile from the stored predetermined substrate outer surface profile; reading an actual substrate outer surface profile at a particular substrate outer surface location; comparing the predetermined substrate outer surface profile for the particular substrate outer surface location to the actual substrate outer surface profile for the particular substrate outer surface location; determining the presence of debris at a particular substrate outer surface location on the substrate outer surface coating; determining an amount of energy required to cause the debris to break off the substrate exterior surface coating at the particular substrate exterior surface location; activating an energy source to emit an amount of energy; directing the amount of energy from the energy source to the debris at the particular substrate outer surface location; stripping the debris from the substrate outer surface coating at the particular substrate outer surface location to form a quantity of particulate debris; and removing the quantity of particulate debris from the substrate outer surface coating.

Clause 23. according to the method of clause 22, the step of comparing the predetermined substrate outer surface profile to the actual substrate outer surface profile further comprises the steps of: determining a difference between the actual substrate outer surface profile and the predetermined substrate outer surface profile.

Clause 24. the method of clause 22 or 23, wherein, after the step of removing the quantity of particulate debris from the substrate outer surface coating, the method further comprises the steps of: restoring the actual substrate outer surface profile to an actual substrate outer surface profile value substantially equivalent to the predetermined substrate outer surface profile value.

Clause 25. the method of any one of clauses 22-24, wherein the substrate outer surface coating comprises a substrate outer surface coating thickness; and wherein, prior to the step of dislodging the debris from the substrate outer surface coating, the substrate outer surface coating thickness remains substantially equal to the substrate outer surface coating thickness after the step of dislodging the debris from the substrate outer surface coating.

Clause 26. the method of any of clauses 22-25, wherein the actual substrate outer surface profile is configured to promote laminar flow over the actual substrate outer surface.

Clause 27. the method of any one of clauses 22-26, the predetermined substrate outer surface profile comprising at least one depression in the predetermined substrate outer surface profile.

Clause 28. the method of clause 27, wherein the predetermined substrate exterior surface comprises a mixed layer flow control surface comprising a plurality of pores.

The flowcharts and block diagrams in the different depicted aspects illustrate the architecture, functionality, and operation of some possible implementations of the apparatus, systems, and methods of the illustrative aspects. In this regard, each block in the flowchart or block diagrams may represent a module, a piecewise function, and/or a portion of an operation or step. For example, one or more of the blocks may be implemented as program code, in hardware, or a combination of program code and hardware. When implemented in hardware, the hardware may take the form of integrated circuits, for example, fabricated or configured to perform one or more operations in the flowchart or block diagram.

In some alternative implementations of the illustrative aspects, one or more functions noted in the block of the flowchart or block diagrams may occur out of the order noted in the figures. For example, in some cases, two blocks shown in succession may be executed substantially concurrently, depending upon the functionality involved. Other blocks may be added to the blocks illustrated in the flowchart or block diagrams.

The various aspects of the invention may, of course, be carried out in other ways than those specifically set forth herein without departing from essential characteristics of the invention. The present aspects are to be considered in all respects as illustrative and not restrictive, and all changes coming within the meaning and equivalency range of the appended claims are intended to be embraced therein.