阅读说明：本技术 用于加速度计的去耦结构 (Decoupling structure for accelerometer ) 是由 S.贡塞斯 R.布里森 J.莫瑟尔 于 2018-05-07 设计创作，主要内容包括：一种加速度计,包括去耦结构,用于通过支承用于测量加速度的MEMS传感器芯片而将加速度计固定在封装上。MEMS传感器芯片包括半导体材料的第一传感器晶片层。去耦结构形成用于将去耦结构固定在封装上的底部部分和被固定到第一传感器晶片层的顶部部分。顶部部分在第一平面方向上的宽度小于底部部分的宽度。去耦结构由与第一传感器晶片层相同的半导体材料制成。顶部部分和底部部分是由同一晶片层制造的。顶部部分在第一平面方向上的中心点被布置在底部部分的中心区中。MEMS传感器芯片包括密闭地封闭的腔体,其包括MEMS传感器芯片的振动质量部。(An accelerometer includes a decoupling structure for securing the accelerometer to a package by supporting a MEMS sensor chip for measuring acceleration. The MEMS sensor chip comprises a first sensor wafer layer of semiconductor material. The decoupling structure forms a bottom portion for securing the decoupling structure on the package and a top portion secured to the first sensor wafer layer. The top portion has a width in the first planar direction that is less than a width of the bottom portion. The decoupling structure is made of the same semiconductor material as the first sensor wafer layer. The top portion and the bottom portion are fabricated from the same wafer layer. The center point of the top portion in the first planar direction is arranged in the center area of the bottom portion. The MEMS sensor chip comprises a hermetically closed cavity comprising the vibrating mass of the MEMS sensor chip.)

1. An accelerometer configured for attachment on a base surface (20), comprising:

A decoupling structure (3) for fixing the accelerometer to a base surface (20); and

A MEMS sensor chip (10) for measuring acceleration, wherein the MEMS sensor chip (10) is supported by the decoupling structure (3) and comprises a first sensor wafer layer (11) of semiconductor material;

Wherein the decoupling structure (3) forms a bottom part (30) and a top part (31), the bottom part (30) being used for fixing the decoupling structure (3) on the substrate surface, the top part (31) being fixed to the first sensor wafer layer (11) such that the MEMS sensor chip (10) is arranged above the decoupling structure (3);

Wherein the width (w 2) of the top portion (31) in the first planar direction (41) is smaller than the width (w 1) of the bottom portion (30) in the first planar direction (41);

Wherein the top portion (31) and the bottom portion (30) are fabricated from the same wafer layer;

Wherein a center point (C) of the top portion (31) in the first planar direction (41) is arranged in a center area (cr) of the bottom portion (30) in the first planar direction (41);

Wherein the decoupling structure (3) is made of the same semiconductor material as the first sensor wafer layer (11); and

wherein the MEMS sensor chip (10) comprises a hermetically closed cavity (16), the hermetically closed cavity (16) comprising a vibrating mass portion (14) of the MEMS sensor chip (10).

2. The accelerometer of claim 1, wherein the width (w 2) of the top portion (31) in the first planar direction (41) is less than fifty percent of the width (w 1) of the bottom portion (30) in the first planar direction (41) and/or the width (w 1) of the first sensor wafer layer in the first planar direction (41).

3. An accelerometer according to claim 1 or 2, wherein the central region (cr) comprises fifty percent of the centre of the width (w 1) of the first sensor wafer layer (11) in the first planar direction (41) and/or the width (w 1) of the bottom portion (30) in the first planar direction (41).

4. An accelerometer according to any of the preceding claims, wherein the width of the top portion (31) in the second planar direction (42) is smaller than the width of the bottom portion (30) in the second planar direction (42) and/or the width of the first sensor wafer layer (11) in the second planar direction (42).

5. An accelerometer according to any one of the preceding claims, wherein the width (w 1) of the bottom portion (31) in the first planar direction (41) is equal to the width of the first sensor wafer layer (11) in the first planar direction (41).

6. An accelerometer according to the preceding claim, wherein the width of the bottom portion (31) in the second planar direction (42) is equal to the width of the first sensor wafer layer (11) in the second planar direction (42), wherein the second planar direction (42) is a planar direction perpendicular to the first planar direction (41).

7. The accelerometer according to any of the preceding claims, wherein the MEMS sensor chip (10) comprises at least one further sensor wafer layer (12, 13) on the first sensor wafer layer (11), wherein the first wafer layer and the at least one further wafer layer (12, 13) form a hermetically closed cavity (16), preferably the at least one further sensor wafer layer (12, 13) comprises a second sensor wafer layer (12) on the first sensor wafer layer and a third sensor wafer layer (13) on the second sensor wafer layer (12), and preferably the first, second and third sensor wafer layers (11, 12, 13) form a hermetically closed cavity (16).

8. An accelerometer according to the preceding claim, wherein the at least one further sensor wafer layer (12, 13), preferably the second sensor wafer layer (12), comprises a vibrating mass (14).

9. The accelerometer according to the preceding claim, wherein the MEMS sensor chip (10) is an out-of-plane detector configured such that a movement of the vibrating mass part (14) is detected perpendicular to the second sensor wafer layer (12) of the vibrating mass part (14), wherein the two sensor wafer layers (11, 13), preferably the first sensor wafer layer (11) and the third sensor wafer layer (13), below and above the sensor wafer layer (12) comprising the vibrating mass part (14) each form or comprise a capacitor plate (15) in order to detect a movement of the vibrating mass part (14) between the two capacitor plates (15).

10. an accelerometer according to any of the preceding claims, wherein the top portion (31) and the first sensor wafer layer (11) are conductively connected.

11. An accelerometer according to any of the preceding claims, wherein the top portion (31) and the first sensor wafer layer (11) are fixed by direct bonding, preferably by silicon fusion bonding.

12. The accelerometer according to any of the preceding claims, wherein the bottom part (30) comprises a recess (32) arranged substantially around the top part (31), wherein the recess (32) extends from a first point to a second point, wherein the first decoupling area (35) is defined as the area enclosed by the recess (32) and a connecting line (33) between the first point and the second point, wherein the top part (31) is arranged in the first decoupling area (35), wherein the second decoupling area (36) is defined as the transition area of the first decoupling area (35) minus: the transition region is enclosed by a recess (32), a connecting line (33), a line (34 a) extending from a first point in a direction perpendicular to the connecting line (33), and a line (34 b) extending from a second point in a direction perpendicular to the connecting line (33), wherein the top portion (31) is arranged in a second decoupling region (36).

13. The accelerometer according to the preceding claim, wherein the bottom portion (30) comprises at least one additional recess (38) located outside the first decoupling zone (35).

14. An accelerometer according to claim 12 or 13, wherein the recess (32) is a continuous cut-out extending through the entire thickness of the bottom portion (30).

15. The accelerometer of any of the preceding claims, wherein the thickness of the bottom portion (30) of the decoupling structure (3) is smaller than the width (w 1) of the bottom portion (30) in the first planar direction (41) minus the width (w 2) of the top portion (31) in the first planar direction (41).

16. The accelerometer of the preceding claim, wherein the thickness of the bottom portion (30) of the decoupling structure (3) is less than thirty percent of a difference calculated by subtracting the width (w 1) of the top portion (31) in the first planar direction (41) from the width (w 2) of the bottom portion (30) in the first planar direction (41).

17. The accelerometer of the preceding claim, wherein the thickness of the bottom portion (30) of the decoupling structure (3) is less than thirty percent of a difference calculated by subtracting the width (w 1) of the top portion (31) in the first planar direction (41) from the width (w 2) of the bottom portion (30) in the first planar direction (41).

18. The accelerometer of any one of the preceding claims, wherein the bottom portion (30) is configured to act as a spring for decoupling the stress of the base surface (20) from the MEMS sensor chip (10).

19. An assembly, comprising: a base surface (20), preferably flat, and an accelerometer according to any of the preceding claims, wherein the decoupling portion (3) of the accelerometer is glued or otherwise fixed to the base surface (20) with an attachment (21), the attachment (21) being arranged on the bottom surface of the bottom portion (30) in the first planar direction (41) relative to the sides of the bottom portion (30).

20. Assembly according to the preceding claim, wherein the decoupling structure (3) is designed such that the fundamental resonance frequency of the MEMS sensor chip (10) is between 3kHz and 30 kHz.

Technical Field

The present invention relates to an accelerometer with a decoupling structure.

Background

MEMS (micro-electromechanical systems) accelerometers are routinely used in automotive and automotive applications. They are also increasingly frequently selected for use in high-end market segments such as aerospace and defense, where they must meet particularly stringent stability requirements.

MEMS accelerometers are typically made primarily of materials such as silicon or glass. They are manufactured by lithography-based wafer processing techniques.

MEMS accelerometers are inherently sensitive to mechanical constraints. Fig. 1a shows a prior art example of a MEMS sensor chip 10, which is glued or otherwise fixed by means of attachments 21 to a base surface 20 of a component, such as a package, a printed circuit board or other kind of component, for example. The stresses applied to the component are transmitted to the MEMS chip sensor 10 via the base surface 20 and the attachments 21 and, as shown in fig. 1b, cause a deformation of the chip sensor 10, the effect of which is essentially indistinguishable from the effect of the acceleration to be measured. Therefore, the stress transmitted from the substrate surface 20 to the MEMS sensor chip 10 causes measurement errors. Several approaches have been applied to alleviate this problem.

One approach is to design the sensor in a symmetrical manner so that the stress induced deformations cancel each other out. This approach is inherently superior, but severely constrains the design of the sensor.

Another approach is to make the sensor itself more rigid. Its disadvantage is that it has only limited effect and potentially adds limiting design constraints.

A third approach is to mechanically decouple the MEMS sensor chip 10 from the components attached to the assembly or substrate. One form of this approach is to build a frame around the MEMS sensor chip 10, as described for example in EP 0599174. This approach is powerful, but has the disadvantage that the outer frame significantly increases the size of the device. In wafer processing technologies such as those used to build silicon MEMS, this large size translates directly into higher material requirements and higher manufacturing costs.

US2001/047688 discloses an accelerometer having a bottom cover with a central mounting base on which is supported an internal frame that supports an external mass.

US2017/0107098 discloses an accelerometer connected to a carrier with a single adhesive or solder bump.

In the field of pressure sensors, for example in DE102009046692, it is further known to place a pressure sensor on a base in order to decouple the pressure sensor from stresses from the substrate surface.

In US4800758 a silicon base forms part of the pressure sensor. The susceptor expands its width relative to the substrate surface and encloses a cavity with the substrate surface. A passage directs a reference pressure in the cavity to the pressure sensor through a passage in the socket.

In addition to mechanical stress decoupling, other features are also particularly advantageous for high performance MEMS accelerometers.

First, it is advantageous that the system formed by the vibrating mass, the spring and the electrodes is enclosed in a closed cavity. A first advantage of a hermetically sealed cavity is that it provides protection against dust and other particles from the environment that may penetrate between adjacent surfaces (which typically form electrodes in the case of so-called capacitive accelerometers). A second advantage is that it provides the possibility of controlling the properties and pressure of the gas present in the cavity, thus allowing the use of gas damping to optimize the mechanical frequency response of the accelerometer. It is further advantageous to keep the manufacturing costs low for the closed cavity to be created during wafer processing.

Secondly, when integrating a MEMS accelerometer into a system, it is particularly important to control the orientation of the accelerometer with respect to the sensitive axis of the device in which it is installed. The most straightforward way to meet this requirement is to be able to ensure good parallelism between the outer surface of the accelerometer and the surface on which it is mounted. This is naturally achieved by providing a sufficiently large size of the bottom surface of the accelerometer.

In US2017/0107098 and DE102009046692, the base is mounted directly to the substrate surface; therefore, it is also directly subjected to the stresses transmitted by the substrate surface; in addition, it only provides a reduced attachment area that does not benefit from good control of parallelism.

In DE102009046692, US4800758 and US2017/0107098, additional temperature-dependent stresses are generated between the sensor chip, the attachment material and the base material. Still further, the attachment material (glue or solder material) may not be perfectly stable over time and may undergo plastic deformation, which may cause drift in the sensor output over aging.

Finally, the decoupling schemes adopted by US2001/0047688 and by US4800758 are dedicated to their application. The decoupling scheme in US2001/0047688 is specific to accelerometers having a peripheral mass and cannot be applied to accelerometers in which the sensing element is placed in a closed cavity. The form of decoupling solution of US4800758 is specific to the pressure sensor, since a part of the pressure sensor is incorporated in the decoupling structure.

Disclosure of Invention

The aim is to reduce the stress applied to the MEMS sensor chip of the accelerometer and to reduce the drawbacks of the existing solutions.

This object is solved by an accelerometer configured for attachment on a substrate surface, the accelerometer comprising: a decoupling structure for securing the accelerometer to the surface of the substrate; and a MEMS sensor chip for measuring acceleration, wherein the MEMS sensor chip is supported by the decoupling structure and comprises a first sensor wafer layer of semiconductor material. The decoupling structure forms a bottom portion for fixing the decoupling structure on the substrate surface and a top portion fixed to the first sensor wafer layer such that the MEMS sensor chip is arranged above the decoupling structure. The width of the top portion in the first planar direction is less than the width of the bottom portion in the first planar direction. The top portion and the bottom portion are fabricated from the same wafer layer. A center point of the top portion in the first planar direction is arranged at a center area of the bottom portion in the first planar direction. The decoupling structure is made of the same semiconductor material as the first sensor wafer layer. The MEMS sensor chip comprises a hermetically closed cavity comprising the vibrating mass of the MEMS sensor chip.

The invention also has several advantages over known base-based solutions. The reduction in width from the bottom portion to the top portion of the decoupling structure reduces stress on the MEMS sensor chip for two reasons. The small connection width between the top portion and the MEMS sensor chip reduces stress on the MEMS sensor chip compared to the width of the bottom portion. Furthermore, the bottom portion acts as a spring for decoupling the stress of the assembly from the MEMS sensor chip. Furthermore, the increased width of the bottom portion allows for a more robust attachment for the assembly, and a better control with respect to the parallelism between the sensor and the assembly. By using the same semiconductor material for the MEMS sensor chip and in the decoupling structure, further stresses at the interface between the MEMS sensor chip and the top part due to ageing or temperature changes are avoided.

The invention also has advantages over solutions based on decoupling frames, since the accelerometer chip benefits from a smaller footprint. In addition, the manufacturing process for the decoupling structure is typically shorter and simpler than the manufacturing process for the sensing component; as a result, the savings from the benefits in wafer area on all layers of the sensing component tend to outweigh the additional cost of fabricating the decoupling structure.

The dependent claims relate to further alternative embodiments of the invention.

In one embodiment, the top portion of the decoupling structure and the first sensor wafer layer of the MEMS sensor chip are conductively connected. This avoids that possible charges may concentrate on the first sensor wafer layer of the MEMS sensor chip, which may affect the measurement results of the accelerometer.

In one embodiment, the top portion and the first sensor wafer layer are fixed by direct bonding, preferably by silicon fusion bonding. This technique further significantly improves the stress decoupling of the MEMS sensor chip and avoids the occurrence of plastic deformation at the interface between the top portion and the first sensor layer over time.

In one embodiment, the bottom portion includes a recess disposed substantially around the top portion. This improves the function as a bottom part of the spring and further reduces the stress on the MEMS sensor chip.

In one embodiment, the recess is arranged such that the MEMS sensor device will remain substantially parallel to the substrate surface whenever a stress is exerted on the bottom portion by the substrate surface.

In one embodiment, the accelerometer is a planar accelerometer. This solution works particularly well for planar accelerometers, since the first sensor wafer layer is usually the active part of the MEMS sensor chip and is therefore very sensitive to stress.

In an embodiment, the MEMS sensor chip comprises at least one further sensor wafer layer on the first sensor wafer layer. Preferably, the at least one further sensor layer comprises at least two further sensor layers, a second sensor wafer layer on the first sensor wafer layer, preferably comprising a vibrating mass. In particular, for accelerometers having at least two sensor wafer layers, this solution provides significant material savings compared to the decoupled frame solution. Preferably, the first wafer layer and the at least one further wafer layer form a hermetically closed cavity. Preferably, the at least one further sensor wafer layer comprises a vibrating mass portion. Preferably, the second sensor wafer layer comprises a vibrating mass portion.

in one embodiment, the MEMS sensor comprises a second sensor wafer layer on the first sensor wafer layer, preferably comprising the vibrating mass, and a third sensor wafer layer on the second sensor wafer layer forming a closed cavity for the vibrating mass.

In one embodiment, the accelerometer assembly comprises a base surface and an accelerometer as described above, wherein the bottom portion of the decoupling structure is fixed to the base surface at two lateral sides in the first planar direction.

in one embodiment the (flexibility of the) decoupling structure is designed such that the fundamental resonance frequency of the MEMS sensor chip is between 3kHz and 30 kHz. With this flexibility, an optimal decoupling from the substrate surface is achieved.

drawings

The invention will be better understood by means of the description of an embodiment given by way of example and illustrated by the figures, in which:

Fig. 1a shows a MEMS sensor chip attached to a substrate surface according to the prior art.

Fig. 1b shows the MEMS sensor chip of fig. 1a in a stressed state.

Figure 2a shows a first embodiment of an accelerometer.

Fig. 2b shows the first embodiment of fig. 2a in a stressed state.

Fig. 3a shows a first embodiment of a cross-section along the line III-III in fig. 2 a.

Fig. 3b shows a second embodiment of a cross-section along the line III-III in fig. 2 a.

FIG. 4 illustrates an embodiment of an accelerometer for a planar accelerometer.

Figure 5 shows an embodiment of an accelerometer for an in-plane accelerometer.

Figure 6a shows a third embodiment of an accelerometer.

Fig. 6b shows a cross-section along the line V-V in fig. 6 a.

fig. 7a shows a first decoupling region in a third embodiment.

fig. 7b shows a second decoupling region in a third embodiment.

Figure 8a shows a fourth embodiment of an accelerometer.

Fig. 8b shows a cross-section along the line VI-VI in fig. 8 a.

Detailed Description

Figure 2a shows a first embodiment of an accelerometer. The accelerometer is configured to be attached to a base surface 20 of an assembly such as a package, an electronic circuit board, or any other supporting component. Preferably, the assembly provides a substrate having a base surface 20 to which the accelerometer is attached. Any directional reference herein as bottom versus top or below versus above should be interpreted as being in the direction of the normal vector to the base surface 20 and/or in the direction of the normal vector to the wafer layer of the accelerometer and/or perpendicular to the later defined first and second planar directions. Directional references to bottom, below shall refer to the direction towards the base surface 20 of the assembly. Directional references to top, above shall refer to a direction away from the base surface 20 of the assembly. These directional references are generally independent of the arrangement of the accelerometer with respect to gravity.

The accelerometer comprises a decoupling structure 3 and a MEMS sensor chip 10.

the MEMS sensor chip 10 is configured to sense acceleration of the accelerometer. The MEMS sensor chip 10 is also referred to as a sensing component. Fig. 4 and 5 show two exemplary embodiments of a MEMS sensor chip 10. Preferably, the MEMS sensor chip 10 is manufactured from a stack of at least two sensor wafer layers 11 and 12. The first sensor wafer layer 11 is connected to the decoupling structure 3. At least the first sensor wafer layer 11 is made of the same semiconductor material as the decoupling structure to provide a better connection between the MEMS sensor chip 10 and the decoupling structure 3 and to more efficiently reduce the stress on the MEMS sensor chip 10. Preferably, the semiconductor material used is silicon. Preferably, all sensor layers are made of the same semiconductor material as the first sensor wafer layer 11. The MEMS sensor chip 10 comprises a closed cavity comprising a vibrating mass 14. The MEMS sensor chip 10 comprises a first wafer layer 11 and at least one further wafer layer, here a second wafer layer 12 and a third wafer layer 13, arranged on top of the first wafer layer 11. The vibrating mass part 14 is comprised in at least one further wafer layer, preferably in one of the at least one further wafer layer, preferably in the second wafer layer 12. The seismic mass 14 is movably supported in the MEMS sensor chip 10, so that the seismic mass 14 moves as a function of the acceleration of the accelerometer. The movement of the seismic mass 14 is sensed in the MEMS sensor chip 10.

Fig. 4 shows an embodiment of an accelerometer, in particular a MEMS sensor chip 10 as an out-of-plane detector. In this embodiment, the sensor wafer layer 12, which is perpendicular to the vibrating mass part 14, detects the movement of the vibrating mass part 14. In this embodiment, the MEMS sensor chip 10 preferably comprises a third sensor wafer layer 13 on the second sensor wafer layer 12, so that the first sensor wafer layer 11 and the third sensor wafer layer 13 each form or comprise a capacitor plate 15 in order to detect a movement of the seismic mass section 14 between the two capacitor plates 15. In this embodiment, the first, second and third sensor wafer layers 11, 12, 13 preferably form a hermetically closed cavity 16 comprising the vibrating mass portion 14.

Fig. 5 shows an embodiment of an accelerometer, in particular a MEMS sensor chip 10 as an in-plane detector. In this embodiment, the motion of the vibrating mass part 14 is detected in the plane of the wafer layer of the vibrating mass part 14. The first sensor wafer layer 11 here generally serves only as a support plate 17 for the active sensor structures in the second sensor wafer layer 12. The vibrating mass portion 14 is enclosed in a closed cavity 16. The closed cavity 16 is provided by the first wafer layer 11 and the at least one further wafer layer 12, 13. Preferably, the closed cavity 16 is provided by the second wafer layer 12 and the third sensor wafer layer 13. The vibrating mass part 14 is comprised in at least one further wafer layer 12, 13, preferably in the second wafer layer 12.

The decoupling structure 3 comprises a bottom part 30 and a top part 31.

Fig. 3A shows an exemplary embodiment of a cross-sectional view along the line III-III in fig. 2. The top portion 31 has a width w2 in the first planar direction 41 which is smaller than the width w1 of the bottom portion 30 in the first planar direction 41 and/or smaller than the width of the first sensor wafer layer 11 of the MEMS sensor chip 10 in the first planar direction 41. The planar direction is a direction in the plane of the wafer layer(s) (first, second and/or third). In other words, the planar direction is a direction parallel to the plane of the respective wafer layer(s), i.e. parallel to the main surface of the wafer layer(s) or parallel to the connection surface between the different wafer layer(s). If the accelerometer has a rectangular design, the first planar direction 41 preferably corresponds to one of the longitudinal axes of the rectangle, preferably the longest longitudinal axis. The second planar direction 42 is defined as a planar direction perpendicular to the first planar direction 41. Preferably, the width w2 of the top portion 31 in the first planar direction 41 is less than the width w1 of the bottom portion 30 in the first planar direction 41 and/or fifty percent, preferably forty percent, preferably thirty percent, preferably twenty percent, preferably ten percent of the width of the first sensor wafer layer 11 in the first planar direction 41. The sidewalls of the top portion 31 may be angled for manufacturing reasons. In this case, the width w2 of the top portion 31 should be defined at the boundary surface with the MEMS sensor chip 10. Preferably, a center point C of the top portion 31 in the first planar direction 41 is arranged in the bottom portion 30 and/or the central area cr of the first sensor wafer layer 11. The central region comprises the width w1 of the bottom portion 30 in the first planar direction 41 and/or the center 50%, preferably the center 40%, preferably the center 30%, preferably the center 20%, preferably the center 10% of the width of the first sensor wafer layer 11 in the first planar direction 41.

Preferably, the top portion 31 has a width in the second planar direction 42 which is smaller than the width of the bottom portion 30 in the second planar direction 42 and/or the width of the first sensor wafer layer 11 of the MEMS sensor chip 10 in the second planar direction 42. Preferably, the width of the top portion 31 in the second planar direction 42 is smaller than fifty percent, preferably forty percent, preferably thirty percent, preferably twenty percent, preferably ten percent of the width of the bottom portion 30 in the second planar direction 42 and/or the width of the first sensor wafer layer in the second planar direction 42. Preferably, the center point of the top portion 31 in the second planar direction 42 is arranged in the center area of the bottom portion 30 and/or the first sensor wafer layer 11. The central region comprises the width of the bottom portion 30 in the second planar direction 42 and/or the center 50%, preferably the center 40%, preferably the center 30%, preferably the center 20%, preferably the center 10% of the width of the first sensor wafer layer 11 in the second planar direction 42.

Fig. 3B shows an alternative embodiment, wherein the top portion 31 has the same width as the bottom portion 30 in the second planar direction 42. This may be the case when only stresses on the MEMS sensor chip 10 in the first planar direction 41 are to be expected and/or stresses on the MEMS sensor chip 10 only disturb in the first planar direction 41.

In the illustrated embodiment, the top portion 31 is square or rectangular in shape. However, any other shape of top portion 31. The top portion 31 may have a circular shape (the width in the first planar direction 41 is equal to the width in the second planar direction 42), an elliptical shape (the width in the first planar direction 41 is different from the width in the second planar direction 42), or any other free shape.

The bottom part 30, in particular the bottom part 30 outside the area of the top part 31, is configured to act as a spring reducing the transferred stress. Preferably, the bottom part 30 is flexible, in particular the bottom part 30 outside the area of the top part 31. This may be achieved, for example, by the bottom portion 30, wherein the thickness of the bottom portion 30 (outside the top portion 30) of the decoupling structure 3 is less than (w 1-w 2), preferably less than 30% of (w 1-w 2), preferably less than 10% of (w 1-w 2). The flexibility of the decoupling portion 3 is generally described by its fundamental resonance frequency, which is the frequency of the first resonance mode (0 th harmonic frequency) of the MEMS sensor chip 10 when the accelerometer is induced by a lateral force at the attachment 21 (see the stress plotted in fig. 1 b), in particular by a lateral force at the attachment 21 in the first planar direction 41. The design of the decoupling structure 3, in particular the flexibility of the bottom part 30, allows to define the fundamental resonance frequency. The component, in particular the accelerometer, in particular the decoupling structure 3 is designed such that the fundamental resonance frequency of the MEMS sensor chip 10 is less than 40kHz, preferably less than 35kHz, preferably less than 30kHz and/or greater than 1kHz, preferably greater than 2kHz, preferably greater than 3 kHz.

The MEMS sensor chip 10 and the decoupling part 3 form an accelerometer. The accelerometer may also be referred to as an accelerometer chip.

The assembly comprises at least a base surface 20 and an accelerometer (chip). The component is for example a package, an electronic circuit board, a printed circuit board or any other component. Preferably, the assembly comprises a substrate forming a base surface 20 to which the accelerometer is attached. The decoupling portion 3 of the accelerometer is glued or otherwise fixed to the base surface 20 of the assembly by means of attachments 21, the attachments 21 being arranged on the base surface opposite the sides of the base portion 30. Preferably, the attachment 21 is only in the four corners of the bottom portion 30, as shown in fig. 3A. However, it is also possible to arrange the attachment along the entire side, which extends along the second planar direction 42, as shown in fig. 3B. There are two main reasons for reducing the stress σ from the lower surface of the bottom part 30 to the imaginary boundary surface between the top part 31 and the bottom part 30. First, the reduced width of the imaginary boundary surface results in a reduced first stress compared to the lower surface of the bottom portion 30. This is due to the fact that: the same bending over a shorter distance results in less shear force. Second, the bottom part 30 works between the attachment 21 and the zone in which the top part 30 is arranged, like a spring reducing the transmitted stress. This effect is increased by reducing the thickness of the bottom portion 30. The thickness of the top portion 31 at the boundary surface between the top portion 31 and the MEMS sensor chip 10 further reduces the stress at said imaginary boundary. This is due to the stiffness of the top portion 31. This effect can be enhanced by increasing the thickness of the top portion 31.

The bottom part 30 and the top part 31 are made of the same (decoupled) wafer layer. This may be achieved by removing material from the wafer layers around the top layer 31. This has the following advantages: the bottom part 30 and the top part 31 are made from the same piece of material. Thereby avoiding additional stress at the connecting surface between the top part 31 and the bottom part 30.

Preferably, the decoupling structure 3 is made of the same semiconductor material as the first sensor wafer layer 11 of the MEMS sensor chip 10. This avoids stress at the boundary surface between the top portion 31 and the first sensor wafer layer 11, since differential expansion of the material with temperature changes and ageing is avoided. Preferably, silicon is used as the semiconductor material.

Preferably, the decoupling structure 3 or the top portion 31 is fixed to the MEMS sensor chip 10 or the first sensor wafer layer 11, respectively, by direct bonding. Preferably, silicon fusion bonding is used. This allows a connection to be achieved that acts almost as if it were made from one piece of material and thus results in a minimum of stress.

In the embodiment in fig. 2 to 5, the width of the MEMS sensor chip 10 in the first planar direction 41 is equal to the width w1 of the bottom portion 30 of the decoupling structure 3. This optimizes material usage during manufacturing. Preferably, the width of the MEMS sensor chip 10 in the second planar direction 42 is equal to the width w1 of the bottom portion 30 of the decoupling structure 3. This optimizes material usage during manufacturing and facilitates the manufacturing process. Preferably, the dimensions of the bottom portion 30 in the plane of the sensor wafer layer correspond to the dimensions of the MEMS sensor chip 10 in the plane of the sensor wafer layer. Allowing the bottom portion 30 to have substantially the same width(s) and/or dimensions as the MEMS sensor chip 10 makes the entire accelerometer particularly well suited to be fabricated using wafer processing techniques; in particular, the decoupling structure 3 may be attached to the MEMS sensor chip 10 while the MEMS sensor chip 10 is still in wafer form, without the need for complex, cumbersome and expensive chip-to-chip operations.

Figure 2b shows an example stress situation for the accelerometer of figure 2 a.

Fig. 6a and 6b show an advantageous embodiment for decoupling structures 3. The bottom part 30 additionally comprises a recess 32 for increasing the elasticity in the bottom part 30 between the attachment 21 and the top part 31. The recess 32 extends substantially around the top portion 31 from a first point to a second point. The first and second points are preferably the two end points of the recess 32. Preferably, the recess 32 is a continuous cut-out extending through the entire thickness of the bottom portion 30, such that the first decoupling area within the recess 32 is connected to the rest of the bottom portion 30 (only) via a connection line 33 between the first point and the second point.

The depicted recess 32 is realized as a continuous cut-out extending through the entire thickness of the bottom portion 30. However, it is also possible to reduce the stress within the recesses 32 by non-continuous recesses, such as, for example, drill lines (alternating cut-out portions and connecting portions), or by recesses that do not extend through the entire thickness of the bottom portion 30, such as, for example, grooves. In this case, the connected portion 33 may be omitted. The arrangement of the recesses 32 in fig. 6b is a preferred embodiment. However, still other arrangements of the recess 32 are possible. In one embodiment, the recess may cover only a portion of one or more of the four sides of the top portion 31. In one embodiment, the recess 32 may form a plurality of connected portions. Another example may be the following recesses 32: this recess 32, in particular the cut-out, runs around the top portion 31, for example with the same distance from the top portion 31, and comprises two connecting portions at the center of two opposite sides of the recess 32. The two opposite sides preferably extend in the direction of the first planar direction 41. Many other arrangements of the recess 32 around the top portion 31 are possible.

The first decoupling region 35 is defined as the region enclosed by the recess 32 and the connecting line 33, as is shown with the hatched region in fig. 7 a. Preferably, the top portion 31 is arranged in the first decoupling zone 35. Within this first decoupling zone 35, the top portion 31 and the bottom portion 30 are essentially isolated from the stress applied to the bottom portion 30 outside the first decoupling zone 35 in a plane perpendicular to the connection line. Preferably, the connection line 33 is arranged perpendicular to the first planar direction, so that stress in the first planar direction does not affect the top portion 31.

A second decoupling region 36 is defined within the first decoupling region 35, as shown with the hatched region in fig. 7 b. The second decoupling zone 36 is defined as a first decoupling zone 35 without a transition zone as follows: the transition region is enclosed by the recess 32, the connection line 33, a line 34a extending from a first point in a direction perpendicular to the connection line, and a line 34b extending from a second point in a direction perpendicular to the connection line 33. The line(s) 34a and/or 34b preferably extend in a direction within the first decoupling area 35. Within this second decoupling region 36, the top portion 31 and the bottom portion 30 are also essentially isolated from the stress applied to the bottom portion 30 outside the first decoupling region in a plane parallel to the connection line 33. Preferably, the top portion 31 is arranged in the second decoupling zone 36.

Preferably, the recesses 32 are arranged such that the bending of the bottom portion 30 as a result of the stress exerted by the base surface 20 on the attachments 21 causes a simple translation of the top portion 31, thereby keeping the top surface of the top portion 31 substantially parallel to the base surface 20. This is of particular interest for accelerometers, since tilting of the top portion 31 relative to the base surface 20 will cause unwanted so-called trans-axis sensitivity.

The shape of the recesses 32 shown in fig. 6 and 7 is random. Any other shape of the recess 320 may be used.

Since the presence of the recess 32 in the bottom part 30 increases the flexibility of the bottom part 30 in case of stress, the position and shape of the recess 32 will influence the position at which the bending of the bottom part 30 will be maximal and thus the position at which the connection line 33 and the top part 31 should be placed in order to obtain a simple translation situation.

Figures 8a and 8b show a further embodiment of an accelerometer. In this embodiment, the top portion 31 and/or the recess 32 are arranged eccentrically. The bending of the bottom part 30 will no longer be symmetrical, since the recesses 32 significantly increase the local flexibility of the bottom part. Due to this effect, surprisingly, the top portion 31 and/or the first decoupling zone 35 and/or the second decoupling zone 36 are kept more stable (more parallel to the substrate surface) near the corners and/or boundaries than at the center. A further measure for improving the stability of the top portion 31 and/or the first decoupling region 35 and/or the second decoupling region 36 is to introduce, in addition to the recess 32, at least one additional recess 38, which at least one additional recess 38 is arranged in the bottom portion 30 outside the first decoupling region 35. The at least one additional recess 38 is arranged to influence the bending of the bottom part 30 in such a way that: the top surface of the top portion 31 remains substantially parallel to the base surface 20 under stress conditions, or at least more parallel than without the additional recess 38. The additional recess (es) 38 are used to locally adjust the flexibility of the bottom part. Thus, the top portion 31 may be more centrally disposed without increasing instability.