阅读说明：本技术 工业质检中的缺陷样本生成方法及装置 (Defect sample generation method and device in industrial quality inspection ) 是由 杨秉恩 郭骏 潘正颐 侯大为 倪文渊 于 2021-11-15 设计创作，主要内容包括：本发明涉及工业质检技术领域,提供一种工业质检中的缺陷样本生成方法及装置,方法包括：根据原始图片集生成工件的3D模型；将3D模型导入3D渲染器；根据光学方案在3D渲染器中生成光学工作室；在3D模型的表面制作材质纹理；根据预设缺陷纹理标签在材质纹理的表面生成缺陷纹理；运用材质图工具将缺陷纹理进行纹理处理；给光学工作室设置动画时间以及输出动画的图片帧数；在光学工作室中进行动画渲染,并根据图片帧数导出输出动画中的每一帧目标缺陷样本图片。由此,通过3D渲染器进行动画制作合成缺陷样本图片,可以扩增缺陷样本图片的数量,还可以使缺陷样本图片多元化,从而有利于提高工业质检的准确度,保证质检效果。(The invention relates to the technical field of industrial quality inspection, and provides a method and a device for generating a defect sample in industrial quality inspection, wherein the method comprises the following steps: generating a 3D model of the workpiece according to the original picture set; importing the 3D model into a 3D renderer; generating an optical studio in the 3D renderer according to the optical scheme; manufacturing material textures on the surface of the 3D model; generating a defect texture on the surface of the material texture according to a preset defect texture label; texture processing is carried out on the defective texture by using a material map tool; setting animation time and picture frame number of output animation for the optical studio; and performing animation rendering in the optical working room, and deriving and outputting a target defect sample picture of each frame in the animation according to the picture frame number. Therefore, animation is carried out through the 3D renderer to synthesize the defect sample pictures, the number of the defect sample pictures can be increased, the defect sample pictures can be diversified, the accuracy of industrial quality inspection can be improved, and the quality inspection effect can be guaranteed.)

1. A method for generating a defect sample in industrial quality inspection is characterized by comprising the following steps:

acquiring an original picture set, and generating a 3D model of a workpiece according to the original picture set;

importing the 3D model into a 3D renderer, wherein the 3D renderer is a KeyShot renderer;

generating an optical studio in the 3D renderer according to an optical scheme;

manufacturing material textures on the surface of the 3D model by using a material map tool in the 3D renderer;

acquiring a preset defect texture label, and generating a defect texture on the surface of the material texture according to the preset defect texture label;

performing texture processing on the defect texture by using the texture map tool so as to enable the defect texture to perform texture change along with time;

setting animation time and picture frame number of output animation for the optical studio;

and performing animation rendering in the optical working chamber, and deriving each frame of target defect sample picture in the output animation according to the picture frame number.

2. The method of claim 1, wherein generating an optical studio in the 3D renderer according to an optical scheme comprises:

adjusting a position of a camera in the 3D renderer according to the optical scheme;

deleting a default light source in the 3D renderer;

a plane is made and light source attributes are added to the plane to obtain an optical studio.

3. The method as claimed in claim 1, wherein the step of generating the defect texture on the surface of the material texture according to the predetermined defect texture label comprises:

calling a working area node battery in the material diagram tool;

and manufacturing a defect texture through combination of node batteries according to the preset defect texture label on the surface of the material texture.

4. The method according to claim 3, wherein the defect texture is a scratch defect texture;

the defect texture is made through combination of node batteries, and comprises the following steps:

connect gradually mar node battery, unsmooth node battery that adds, metal node battery and material battery to generate mar defect texture.

5. The method of claim 1, wherein the texture processing of the defect texture using the texture map tool comprises:

calling a color gradient node battery and a curve fade-out node battery;

and combining the color gradient node battery with the curve fade-out node battery and then connecting the color gradient node battery with the texture of the material.

6. The method of claim 1, further comprising: adjusting a position of the 3D model in the optical studio.

7. The method of claim 1, wherein the texture variation comprises: at least one of a change in texture position, a change in texture shape, a change in texture size, and a change in texture number.

8. A defect sample generation device in industrial quality inspection is characterized by comprising:

the acquisition module is used for acquiring an original picture set and generating a 3D model of a workpiece according to the original picture set;

an importing module, configured to import the 3D model into a 3D renderer, where the 3D renderer is a KeyShot renderer;

a first generation module to generate an optical studio in the 3D renderer according to an optical scheme;

a making module for making texture on the surface of the 3D model by using a texture map tool in the 3D renderer;

the second generation module is used for acquiring a preset defect texture label and generating a defect texture on the surface of the material texture according to the preset defect texture label;

the processing module is used for carrying out texture processing on the defect texture by using the material map tool so as to enable the defect texture to carry out texture change along with time;

the setting module is used for setting animation time and picture frame number of output animation for the optical studio;

and the rendering module is used for rendering the animation in the optical working room and deriving each frame of target defect sample picture in the output animation according to the picture frame number.

9. The apparatus of claim 8, wherein the first generation module comprises:

an adjusting unit for adjusting a position of a camera in the 3D renderer according to the optical scheme;

a deletion unit to delete a default light source in the 3D renderer;

and the manufacturing unit is used for manufacturing a plane and adding light source attributes to the plane to obtain an optical working chamber.

Technical Field

The invention relates to the technical field of industrial quality inspection, in particular to a method and a device for generating a defect sample in industrial quality inspection.

Background

At present, in the field of industrial quality inspection, a target detection model in Artificial Intelligence (AI) is used to detect defects of workpieces, so as to reduce labor cost.

The number of the defect samples is a key problem in the whole AI industrial quality inspection, the number of the defect samples in an industrial field is small, and the small number of the samples causes poor detection effect of the AI model, so that the problems of poor industrial quality inspection effect and low accuracy are caused.

Disclosure of Invention

In order to solve one of the above technical problems, the present invention proposes the following technical solutions.

The embodiment of the first aspect of the invention provides a method for generating a defect sample in industrial quality inspection, which comprises the following steps: acquiring an original picture set, and generating a 3D model of a workpiece according to the original picture set; importing the 3D model into a 3D renderer, wherein the 3D renderer is a KeyShot renderer; generating an optical studio in the 3D renderer according to an optical scheme; manufacturing material textures on the surface of the 3D model by using a material map tool in the 3D renderer; acquiring a preset defect texture label, and generating a defect texture on the surface of the material texture according to the preset defect texture label; performing texture processing on the defect texture by using the texture map tool so as to enable the defect texture to perform texture change along with time; setting animation time and picture frame number of output animation for the optical studio; and performing animation rendering in the optical working chamber, and deriving each frame of target defect sample picture in the output animation according to the picture frame number.

In addition, the method for generating a defect sample in industrial quality inspection according to the above embodiment of the present invention may have the following additional technical features.

According to an embodiment of the invention, generating an optical studio in the 3D renderer according to an optical scheme comprises: adjusting a position of a camera in the 3D renderer according to the optical scheme; deleting a default light source in the 3D renderer; a plane is made and light source attributes are added to the plane to obtain an optical studio.

According to an embodiment of the present invention, generating a defect texture on a surface of the material texture according to the predetermined defect texture label includes: calling a working area node battery in the material diagram tool; and manufacturing a defect texture through combination of node batteries according to the preset defect texture label on the surface of the material texture.

According to one embodiment of the invention, the defect texture is a scratch defect texture; the defect texture is made through combination of node batteries, and comprises the following steps: connect gradually mar node battery, unsmooth node battery that adds, metal node battery and material battery to generate mar defect texture.

According to an embodiment of the present invention, the texture processing of the defect texture using the texture map tool includes: calling a color gradient node battery and a curve fade-out node battery; and combining the color gradient node battery with the curve fade-out node battery and then connecting the color gradient node battery with the texture of the material.

According to an embodiment of the invention, the method for generating the defect sample in the industrial quality inspection further comprises the following steps: adjusting a position of the 3D model in the optical studio.

According to one embodiment of the invention, the texture variation comprises: at least one of a change in texture position, a change in texture shape, a change in texture size, and a change in texture number.

The embodiment of the second aspect of the invention provides a defect sample generating device in industrial quality inspection, comprising: the acquisition module is used for acquiring an original picture set and generating a 3D model of a workpiece according to the original picture set; an importing module, configured to import the 3D model into a 3D renderer, where the 3D renderer is a KeyShot renderer; a first generation module to generate an optical studio in the 3D renderer according to an optical scheme; a making module for making texture on the surface of the 3D model by using a texture map tool in the 3D renderer; the second generation module is used for acquiring a preset defect texture label and generating a defect texture on the surface of the material texture according to the preset defect texture label; the processing module is used for carrying out texture processing on the defect texture by using the material map tool so as to enable the defect texture to carry out texture change along with time; the setting module is used for setting animation time and picture frame number of output animation for the optical studio; and the rendering module is used for rendering the animation in the optical working room and deriving each frame of target defect sample picture in the output animation according to the picture frame number.

In addition, the defect sample generation device in the industrial quality inspection according to the above embodiment of the present invention may further have the following additional technical features.

According to an embodiment of the invention, the first generating module comprises: an adjusting unit for adjusting a position of a camera in the 3D renderer according to the optical scheme; a deletion unit to delete a default light source in the 3D renderer; and the manufacturing unit is used for manufacturing a plane and adding light source attributes to the plane to obtain an optical working chamber.

According to the technical scheme of the embodiment of the invention, the 3D renderer is used for animation production to synthesize the defect sample pictures, so that the number of the defect sample pictures can be increased, and the defect sample pictures can be diversified, thereby being beneficial to improving the accuracy of industrial quality inspection and ensuring the quality inspection effect.

Drawings

Fig. 1 is a flowchart of a defect sample generation method in industrial quality inspection according to an embodiment of the present invention.

Fig. 2 is a flow chart of an example of generating a scratch defect sample in accordance with the present invention.

Fig. 3 is a block diagram of a defect sample generation apparatus in industrial quality inspection according to an embodiment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

In the AI industrial quality test, the shortage of the number of samples is one of the important factors that lead to poor quality test results. A large number of defect sample pictures are needed for AI model training, and the accuracy of AI industrial quality inspection can be ensured due to the large number of defect sample pictures.

Therefore, the invention provides a method and a device for generating a defect sample in industrial quality inspection.

Specific embodiments of the present invention will be described below with reference to the drawings.

Fig. 1 is a flowchart of a defect sample generation method in industrial quality inspection according to an embodiment of the present invention.

It should be noted that the execution subject of the defect sample generation method in the industrial quality inspection according to the embodiment of the present invention may be an electronic device in an industrial field, and specifically, the electronic device may be, but is not limited to, an industrial computer and a mobile terminal. The application scene of the embodiment of the invention can be a scene needing quality inspection on workpieces in an industrial production field and the like.

As shown in fig. 1, the method for generating a defect sample in industrial quality inspection includes the following steps S1 to S8.

And S1, acquiring the original picture set, and generating a 3D model of the workpiece according to the original picture set.

The original picture set can be understood as a set consisting of pictures of a defect-free workpiece, and the 3D model is a 3D model of the defect-free workpiece.

Specifically, any defect-free workpiece on the industrial quality inspection site can be photographed from various angles (for example, right in front of the workpiece, behind the workpiece, to the left of the workpiece, to the right of the workpiece, and the like) to obtain pictures of the workpiece at various angles, which are original pictures, and the 3D model of the workpiece is obtained by appropriately splicing and modeling the original pictures.

And S2, importing the 3D model into a 3D renderer, wherein the 3D renderer is a KeyShot renderer.

The KeyShot renderer can generate a photo-like real 3D rendering image without complex setting, an optical scheme in the field of industrial quality inspection can be simulated, and an image similar to the real image is rendered in software.

Specifically, after the 3D models are obtained, the 3D models in a certain file format may be opened in batch in a toolbar file of the 3D renderer.

S3, generating an optical studio in the 3D renderer according to the optical scheme.

In one example, a method of generating a defect sample in industrial quality inspection further comprises: the position of the 3D model is adjusted in the optical studio.

The optical scheme refers to an optical scheme in actual production, and the optical scheme in actual production refers to a practical optical shooting scheme which is set when sample data needs to be acquired in the link of AI industrial quality inspection. The display effect of the defect is determined by the camera parameters and the light source environment parameters set in the optical scheme.

Specifically, the light source tool in the 3D renderer is used to adjust the light source parameters according to the actual optical scheme, and the light source tool in the 3D renderer is used to adjust the camera parameters, for example, the camera position and light source shape are adjusted according to the geometric graph view in the KeyShot renderer, and the position of the 3D model is adjusted in the optical studio, so as to simulate the optical scheme to produce an optical studio close to the actual optical scheme. The 3D model without any defective texture features would then be shown in white color in the optical studio.

S4, manufacturing texture on the surface of the 3D model by using a texture map tool in the 3D renderer.

Specifically, according to the texture form of the defect picture corresponding to the actual optical scheme, a material texture is manufactured on the surface of the 3D model by using a 'material map tool' in the 3D renderer, so that the optical scheme is simulated on the surface of the 3D model to manufacture the material texture, the material texture is similar to the texture of the picture of the actual optical scheme, and the texture effect of the workpiece shot in the actual optical scheme is achieved on the surface of the 3D model.

And S5, acquiring a preset defect texture label, and generating a defect texture on the surface of the material texture according to the preset defect texture label.

In the embodiment of the invention, some defect texture labels can be manufactured or collected in advance to obtain a defect texture label library.

Specifically, a preset defect texture can be called from a defect texture label library, and then a 'material diagram tool' is used for manufacturing the defect texture corresponding to the preset defect texture label on the surface of the material texture.

And S6, performing texture processing on the defect texture by using a texture map tool so as to enable the defect texture to change the texture with time.

In the related art, data enhancement is often performed on a small sample amount, but diversification of defects cannot be replaced, and generation of defects has strong randomness, so that positions and forms of defects also have strong randomness, and defects with different form changes cannot be obtained through data enhancement. In the embodiment of the invention, through a material map tool in the 3D renderer, defects of different forms can be generated by performing texture processing on the defect texture, for example, changing the noise value of the defect, so that diversified defects can be generated.

Further, the texture variation may include: at least one of texture position change, texture shape change, texture size change and texture quantity change

Specifically, the defect texture is subjected to texture processing by using a "texture map tool", so that the defect texture has animation properties, and the defect texture is subjected to texture change over time, for example, a "curve fading tool" is added to the defect texture in the "texture map tool", so that the defect texture can be subjected to shape and position change over time. That is, the "curve fading tool" can control the position and morphology of the defect texture to change over a period of time.

S7, the animation time and the number of picture frames of the output animation are set to the optical studio.

Specifically, the time for rendering the animation is set for the entire optical studio, and the number of picture frames for outputting the animation is set, and the animation can be generated only when the animation time setting for the studio is successful, because the generation of the animation is controlled by the animation time, the time setting for the studio animation is necessary to combine the time node with the defect texture.

And S8, performing animation rendering in the optical studio, and deriving and outputting a target defect sample picture of each frame in the animation according to the picture frame number.

Specifically, the animation rendering may be clicked, and each frame of picture in the output animation may be derived, where the picture is the target defect sample picture, and in the deriving process, the number of frames of the picture may be adjusted according to specific requirements.

According to the method for generating the defect sample in the industrial quality inspection, the 3D renderer is used for animation production to synthesize the defect sample picture, the number of the defect sample pictures can be increased, the defect sample pictures can be diversified, the accuracy of the industrial quality inspection can be improved, and the quality inspection effect can be guaranteed.

In an embodiment of the present invention, the step S3 may include: adjusting a position of a camera in the 3D renderer according to the optical scheme; deleting a default light source in the 3D renderer; a plane is made, and light source attributes are added to the plane to obtain an optical studio.

Specifically, when the 3D model is loaded into the 3D renderer, the light source form position and the camera form position are set by default, so the camera position can be adjusted by "geometry view" in the 3D renderer according to the actual optical scheme, the default light source is deleted in the 3D renderer, a plane is created, light source attributes are added to the plane, so as to create an optical studio which may be a square plane in shape and in which the position of the 3D model can be adjusted.

In an embodiment of the invention, the generating the defect texture on the surface of the material texture according to the predetermined defect texture label in the step S4 may include: calling a working area node battery in the material diagram tool; and manufacturing the defect texture through combination of the node batteries according to the preset defect texture label on the surface of the material texture.

Further, the defect texture is scratch defect texture; the defect texture is made through combination of node batteries, and the defect texture can comprise: and sequentially connecting the scratch node battery, the concave-convex addition node battery, the metal node battery and the material battery to generate scratch defect textures.

The scratch node battery, the concave-convex adding node battery, the metal node battery and the material battery are all node batteries in the KeyShot renderer, the scratch node battery refers to a node battery with scratch attributes in the KeyShot renderer, the concave-convex adding node battery refers to a node battery with concave-convex adding attributes in the KeyShot renderer, the metal node battery refers to a node battery with metal attributes in the KeyShot renderer, the material battery refers to a node battery with material attributes in the KeyShot renderer, the node battery is an existing technical term in the KeyShot renderer, and the node battery is a carrier.

In an embodiment of the invention, the texture processing on the defect texture by using the texture map tool in the step S5 includes: calling a color gradient node battery and a curve fade-out node battery; and combining the color gradient node battery with the curve fade-out node battery and then connecting the color gradient node battery with the texture of the material.

Specifically, with the texture map tool in the 3D renderer, different forms of product defects can be generated by varying the noise values of the defects. In order to control the change of the noise value, the embodiment of the invention sets a 'curve fading' tool on the defect texture, and the 'curve fading' tool can realize double changes of numerical values and time.

In a specific example of the present invention, when synthesizing scratch defect textures by a KeyShot renderer, as shown in fig. 2, first, 3D models are created or loaded in batch in the KeyShot renderer, a surface light source is created in the KeyShot renderer as an optical working chamber according to an actual optical scheme, a position of the 3D model is adjusted in the optical working chamber, and then texture creation is performed by simulating textures of an optical scheme using a "texture map tool" of the KeyShot renderer according to a texture form of an actual optical scheme picture, and the texture is made to be similar to the texture of the actual optical scheme picture. And then, manufacturing a defect texture on the surface of the material texture by using a working area node battery in the material map tool and taking a preset defect texture label as a basis to obtain the 3D model with the defect texture. Wherein, the defect texture is made by the combination of the node batteries: the scratch defect texture generation method comprises the following steps of sequentially connecting four node batteries, namely a scratch node battery (a preset scratch texture mapping), a concave-convex adding node battery, a metal node battery and a material battery, through attribute adjustment to generate scratch defect textures. Then, in order to combine the time node with the scratch defect texture, a curve fading tool in a tool library in a KeyShot renderer is called, a color gradient tool can also be called, the two node batteries are organically combined according to specific requirements and then connected to the material texture, and therefore the scratch defect texture changes along with time to obtain the scratch defect texture with animation attributes. And finally, by rendering the synthesized animation, the KeyShot renderer can derive single frame pictures in sequence at the moment, and each frame picture is the required target defect sample picture.

In summary, the embodiment of the present invention derives a large number of frame pictures close to real defects by rendering the derived frame pictures through the animation in the 3D renderer, and can ensure that the defect forms of each frame picture are different, so that a large number of sample data required for the AI industrial quality inspection can be obtained. The problem that data samples are not abundant in the AI industrial quality inspection is solved. The method for generating the samples through the 3D renderer can guarantee the quality of the defective sample pictures and the diversity of defects, can generate the defective sample pictures in large batch, and effectively solves the problem that AI industrial quality inspection sample data are insufficient.

Corresponding to the method for generating a defect sample in industrial quality inspection in the above embodiment, the invention also provides a device for generating a defect sample in industrial quality inspection.

Fig. 3 is a block diagram of a defect sample generation apparatus in industrial quality inspection according to an embodiment of the present invention.

As shown in fig. 3, the defect sample generation apparatus 100 for industrial quality inspection includes: an acquisition module 10, an import module 20, a first generation module 30, a fabrication module 40, a second generation module 50, a processing module 60, a setup module 70, and a rendering module 80.

The acquisition module 10 is configured to acquire an original image set and generate a 3D model of a workpiece according to the original image set; the importing module 20 is configured to import the 3D model into a 3D renderer, where the 3D renderer is a KeyShot renderer; a first generation module 30 for generating an optical studio in the 3D renderer according to an optical scheme; the making module 40 is configured to apply a texture map tool in the 3D renderer to make texture textures on the surface of the 3D model; the second generating module 50 is configured to obtain a preset defect texture label, and generate a defect texture on the surface of the material texture according to the preset defect texture label; the processing module 60 is configured to perform texture processing on the defect texture by using the texture map tool, so that the defect texture performs texture change over time; the setting module 70 is used for setting animation time and picture frame number of output animation for the optical studio; and the rendering module 80 is used for rendering the animation in the optical studio, and deriving and outputting each frame of target defect sample picture in the animation according to the picture frame number.

In one embodiment of the present invention, the first generation module 30 may include: an adjusting unit for adjusting a position of a camera in the 3D renderer according to the optical scheme; a deletion unit to delete a default light source in the 3D renderer; the first manufacturing unit is used for manufacturing a plane and adding light source attributes to the plane to obtain an optical working chamber.

In one embodiment of the present invention, the second generation module 50 includes: the first calling unit is used for calling a working area node battery in the material diagram tool; and the second manufacturing unit is used for manufacturing the defect texture through combination of the node batteries according to the preset defect texture label on the surface of the material texture.

In an embodiment of the invention, the defect texture is a scratch defect texture, and the second manufacturing unit is specifically configured to: connect gradually mar node battery, unsmooth node battery that adds, metal node battery and material battery to generate mar defect texture.

In one embodiment of the invention, the processing module 60 may include: the second calling unit is used for calling the color gradient node battery and the curve fade-out node battery; and the combination unit is used for combining the color gradient node battery with the curve fade-out node battery and then connecting the combined color gradient node battery with the texture of the material.

In an embodiment of the present invention, the apparatus 100 for generating a defect sample in industrial quality inspection may further include: a position adjustment module to adjust a position of the 3D model in the optical studio.

It should be noted that, for the specific implementation and implementation principle of the defect sample generation apparatus in the industrial quality inspection, reference may be made to the specific implementation of the defect sample generation method in the industrial quality inspection, and details are not described here for avoiding redundancy.

According to the defect sample generation device in the industrial quality inspection, the 3D renderer is used for animation production to synthesize the defect sample pictures, the number of the defect sample pictures can be increased, the defect sample pictures can be diversified, the accuracy of the industrial quality inspection can be improved, and the quality inspection effect can be guaranteed.

In the description of the present invention, the terms "first" and "second" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implying any number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. The meaning of "plurality" is two or more unless specifically limited otherwise.

In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.

Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing specific logical functions or steps of the process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.

It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. For example, if implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.

It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments. In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.

Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.