阅读说明：本技术 表征光学传感器芯片的方法、校准光学传感器芯片的方法、操作光学传感器装置的方法、光学传感器装置和校准系统 (Method of characterizing an optical sensor chip, method of calibrating an optical sensor chip, method of operating an optical sensor device, optical sensor device and calibration system ) 是由 甘特·西斯 朱丽斯·科马 托马斯·霍帕普乐 托马斯·尼姆茨 穆罕默德·贾扎伊里法 于 2019-10-30 设计创作，主要内容包括：提出一种光学传感器领域中的用于校准例如表征和校准光学传感器芯片的装置。为了以高精确度解决传感器数据的复杂性,光学传感器例如光学传感器不作为已校准的单元提供。而是,传感器响应数据可以在限定的或标准化的环境中例如在生产线上被记录并具有高精度。此高标准传感器响应数据能够在每个装置的基础上获得,并因此用明确的芯片标识号(芯片ID)标记。利用专用的校准算法补偿传感器数据,该算法能够量身定制以适合光学传感器或光学传感器芯片。为了检索传感器响应数据和校准算法,例如,两者都能够借助芯片ID而可用。(An apparatus for calibrating, for example characterizing and calibrating, an optical sensor chip in the field of optical sensors is proposed. To address the complexity of sensor data with high accuracy, optical sensors, such as optical sensors, are not provided as calibrated units. Rather, sensor response data can be recorded and with high accuracy in a defined or standardized environment, for example, on a production line. This high standard sensor response data can be obtained on a per device basis and is therefore labeled with an unambiguous chip identification number (chip ID). The sensor data is compensated using a dedicated calibration algorithm that can be tailored to fit the optical sensor or optical sensor chip. To retrieve the sensor response data and the calibration algorithm, for example, both can be made available by means of the chip ID.)